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Determining FCC Class
The Federal Communications Commission (FCC) has rules to protect wireless communications from interference. The FCC
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or Class B (for use in residential or commercial locations). All National Instruments (NI) products are FCC Class A products.
Depending on where it is operated, this Class A product could be subject to restrictions in the FCC rules. (In Canada, the
Department of Communications (DOC), of Industry Canada, regulates wireless interference in much the same way.) Digital
electronics emit weak signals during normal operation that can affect radio, television, or other wireless products.
All Class A products display a simple warning statement of one paragraph in length regarding interference and undesired
operation. The FCC rules have restrictions regarding the locations where FCC Class A products can be operated.
Consult the FCC Web site at www.fcc.govfor more information.
FCC/DOC Warnings
This equipment generates and uses radio frequency energy and, if not installed and used in strict accordance with the instructions
in this manual and the CE marking Declaration of Conformity*, may cause interference to radio and television reception.
Classification requirements are the same for the Federal Communications Commission (FCC) and the Canadian Department
of Communications (DOC).
Changes or modifications not expressly approved by NI could void the user’s authority to operate the equipment under the
FCC Rules.
Class A
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This equipment has been tested and found to comply with the limits for a Class A digital device, pursuant to part 15 of the FCC
Rules. These limits are designed to provide reasonable protection against harmful interference when the equipment is operated
in a commercial environment. This equipment generates, uses, and can radiate radio frequency energy and, if not installed and
used in accordance with the instruction manual, may cause harmful interference to radio communications. Operation of this
equipment in a residential area is likely to cause harmful interference in which case the user is required to correct the interference
at their own expense.
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This Class A digital apparatus meets all requirements of the Canadian Interference-Causing Equipment Regulations.
Cet appareil numérique de la classe A respecte toutes les exigences du Règlement sur le matériel brouilleur du Canada.
Compliance with EU Directives
Users in the European Union (EU) should refer to the Declaration of Conformity (DoC) for information* pertaining to the
CE marking. Refer to the Declaration of Conformity (DoC) for this product for any additional regulatory compliance
information. To obtain the DoC for this product, visit ni.com/certification, search by model number or product line,
and click the appropriate link in the Certification column.
*
The CE marking Declaration of Conformity contains important supplementary information and instructions for the user or
installer.
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About This Manual
NI-DAQmx Base.............................................................................................xvii
Measurement Studio........................................................................................xviii
Device Documentation and Specifications......................................................xix
Chapter 1
Getting Started
Installing NI-DAQmx....................................................................................................1-1
Device Pinouts ...............................................................................................................1-1
Chapter 2
DAQ Hardware..............................................................................................................2-1
DAQ-STC2......................................................................................................2-2
Calibration Circuitry........................................................................................2-3
Sensors and Transducers................................................................................................2-3
Cables and Accessories..................................................................................................2-4
Custom Cabling...............................................................................................2-4
Programming Devices in Software................................................................................2-5
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Contents
Chapter 3
Chapter 4
Analog Input
Multichannel Scanning Considerations......................................................................... 4-6
Use Low Impedance Sources.......................................................................... 4-6
Example 1......................................................................................... 4-9
Example 2......................................................................................... 4-9
Hardware-Timed Acquisitions........................................................................ 4-10
Buffered............................................................................................ 4-10
Connecting Analog Voltage Input Signals.................................................................... 4-11
Types of Signal Sources................................................................................................ 4-12
Ground-Referenced Signal Sources................................................................ 4-13
Differential Connection Considerations.......................................................... 4-13
Single-Ended Connection Considerations ...................................................... 4-16
Single-Ended Connections for Floating or
Grounded Signal Sources............................................................... 4-17
Field Wiring Considerations.......................................................................................... 4-18
Analog Input Timing Signals ........................................................................................ 4-19
AI Sample Clock Signal.................................................................................. 4-22
Using an Internal Source .................................................................. 4-23
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AI Start Trigger Signal....................................................................................4-28
Using a Digital Source ......................................................................4-30
AI Pause Trigger Signal ..................................................................................4-30
Using a Digital Source ......................................................................4-31
Chapter 5
Minimizing Glitches on the Output Signal....................................................................5-2
Non-Buffered ....................................................................................5-3
Analog Output Timing Signals......................................................................................5-5
AO Start Trigger Signal...................................................................................5-6
Using a Digital Source ......................................................................5-6
Routing AO Start Trigger Signal to an Output Terminal..................5-7
AO Pause Trigger Signal.................................................................................5-7
Using a Digital Source ......................................................................5-8
Routing AO Pause Trigger Signal to an Output Terminal................5-8
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Contents
Using an Internal Source .................................................................. 5-9
Routing AO Sample Clock Signal to an Output Terminal ............... 5-9
Other Timing Requirements ............................................................. 5-9
AO Sample Clock Timebase Signal................................................................ 5-10
Getting Started with AO Applications in Software....................................................... 5-10
Chapter 6
Programmable Power-Up States.................................................................................... 6-1
Connecting Digital I/O Signals ..................................................................................... 6-2
Chapter 7
Counters
Counting Edges............................................................................................... 7-3
Pulse-Width Measurement.............................................................................. 7-6
Buffered Period Measurement.......................................................... 7-8
Semi-Period Measurement.............................................................................. 7-9
Buffered Semi-Period Measurement ................................................ 7-10
Frequency Measurement................................................................................. 7-10
Method 1b—Measure Low Frequency with
One Counter (Averaged)................................................................ 7-11
Method 2—Measure High Frequency with Two Counters .............. 7-12
Method 3—Measure Large Range of Frequencies Using
Two Counters................................................................................. 7-13
Choosing a Method for Measuring Frequency................................. 7-14
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Counter Output Applications.........................................................................................7-21
Pulse Train Generation....................................................................................7-23
Counter Timing Signals.................................................................................................7-26
Counter n Aux Signal......................................................................................7-28
Counter n HW Arm Signal..............................................................................7-30
Counter Triggering ........................................................................................................7-32
Arm Start Trigger ............................................................................................7-32
Start Trigger.....................................................................................................7-32
Pause Trigger...................................................................................................7-33
Other Counter Features..................................................................................................7-33
Cascading Counters.........................................................................................7-33
Counter Filters.................................................................................................7-33
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Contents
Prescaling........................................................................................................ 7-34
Duplicate Count Prevention............................................................................ 7-35
When To Use Duplicate Count Prevention ...................................... 7-38
Synchronization Modes................................................................................... 7-38
80 MHz Source Mode....................................................................... 7-39
Chapter 8
PFI
Exporting Timing Output Signals Using PFI Terminals............................................... 8-3
Using PFI Terminals as Static Digital Inputs and Outputs............................................ 8-3
PFI Filters...................................................................................................................... 8-4
I/O Protection ................................................................................................................ 8-5
Chapter 9
Digital Isolation............................................................................................................. 9-2
Benefits of an Isolated DAQ Device............................................................................. 9-2
80 MHz Timebase........................................................................................... 10-2
20 MHz Timebase........................................................................................... 10-2
External Reference Clock ............................................................................... 10-2
10 MHz Reference Clock................................................................................ 10-3
Synchronizing Multiple Devices ................................................................................... 10-3
Real-Time System Integration Bus (RTSI)................................................................... 10-3
RTSI Connector Pinout................................................................................... 10-4
Using RTSI as Outputs ................................................................................... 10-5
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RTSI Filters .....................................................................................................10-6
PXI Clock and Trigger Signals......................................................................................10-8
PXI_CLK10.....................................................................................................10-8
PXI Triggers....................................................................................................10-8
PXI Considerations........................................................................................................11-2
Using PXI with CompactPCI ..........................................................................11-3
Direct Memory Access (DMA).......................................................................11-3
Interrupt Request (IRQ)...................................................................................11-4
Programmed I/O..............................................................................................11-4
Changing Data Transfer Methods between DMA and IRQ ............................11-4
Triggering
Appendix A
Appendix B
Technical Support and Professional Services
Glossary
Index
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About This Manual
The NI 6232/6233 User Manual contains information about using the
National Instruments 6232/6233 M Series data acquisition (DAQ) devices
with NI-DAQmx 8.0 and later. NI 6232/6233 devices feature eight analog
input (AI) channels, four analog output (AO) channels, two counters, six
lines of digital input (DI), and four lines of digital output (DO).
Conventions
The following conventions are used in this manual:
<>
Angle brackets that contain numbers separated by an ellipsis represent
a range of values associated with a bit or signal name—for example,
AO <3..0>.
[ ]
Square brackets enclose optional items—for example, [response].
»
The » symbol leads you through nested menu items and dialog box options
to a final action. The sequence File»Page Setup»Options directs you to
pull down the File menu, select the Page Setup item, and select Options
from the last dialog box.
This icon denotes a note, which alerts you to important information.
This icon denotes a caution, which advises you of precautions to take to
avoid injury, data loss, or a system crash. When this symbol is marked on a
product, refer to the NI 6232/6233 Specifcations for information about
precautions to take.
When symbol is marked on a product, it denotes a warning advising you to
take precautions to avoid electrical shock.
When symbol is marked on a product, it denotes a component that may be
hot. Touching this component may result in bodily injury.
bold
Bold text denotes items that you must select or click in the software, such
as menu items and dialog box options. Bold text also denotes parameter
names.
italic
Italic text denotes variables, emphasis, a cross-reference, or an introduction
to a key concept. Italic text also denotes text that is a placeholder for a word
or value that you must supply.
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About This Manual
monospace
Text in this font denotes text or characters that you should enter from the
keyboard, sections of code, programming examples, and syntax examples.
This font is also used for the proper names of disk drives, paths, directories,
programs, subprograms, subroutines, device names, functions, operations,
variables, filenames, and extensions.
Related Documentation
Each application software package and driver includes information about
writing applications for taking measurements and controlling measurement
devices. The following references to documents assume you have
NI-DAQmx 8.0 or later, and where applicable, version 7.0 or later of the NI
application software.
NI-DAQ
The DAQ Getting Started Guide describes how to install your NI-DAQmx
for Windows software, your NI-DAQmx-supported DAQ device, and how
to confirm that your device is operating properly. Select Start»All
Programs»National Instruments»NI-DAQ»DAQ Getting Started
Guide.
The NI-DAQ Readme lists which devices are supported by this version of
NI-DAQ. Select Start»All Programs»National Instruments»NI-DAQ»
NI-DAQ Readme.
The NI-DAQmx Help contains general information about measurement
concepts, key NI-DAQmx concepts, and common applications that are
applicable to all programming environments. Select Start»All Programs»
National Instruments»NI-DAQ»NI-DAQmx Help.
NI-DAQmx for Linux
The DAQ Getting Started Guide describes how to install your
NI-DAQmx-supported DAQ device and confirm that your device is
operating properly.
The NI-DAQ Readme for Linux lists supported devices and includes
software installation instructions, frequently asked questions, and known
issues.
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The NI-DAQmx for Linux Configuration Guide provides configuration
instructions, templates, and instructions for using test panels.
Note All NI-DAQmx documentation for Linux is installed at /usr/local/
natinst/nidaqmx/docs.
NI-DAQmx Base
The NI-DAQmx Base Getting Started Guide describes how to install your
NI-DAQmx Base software, your NI-DAQmx Base-supported DAQ device,
and how to confirm that your device is operating properly. Select Start»All
Programs»National Instruments»NI-DAQmx Base»Documentation»
Getting Started Guide.
The NI-DAQmx Base Readme lists which devices are supported by this
version of NI-DAQmx Base. Select Start»All Programs»National
Instruments»NI-DAQmx Base»Documentation»Readme.
The NI-DAQmx Base VI Reference Help contains VI reference and general
information about measurement concepts. In LabVIEW, select Help»
NI-DAQmx Base VI Reference Help.
The NI-DAQmx Base C Reference Help contains C reference and general
information about measurement concepts. Select Start»All Programs»
National Instruments»NI-DAQmx Base»Documentation»C Function
Reference Manual.
LabVIEW
If you are a new user, use the Getting Started with LabVIEW manual to
familiarize yourself with the LabVIEW graphical programming
environment and the basic LabVIEW features you use to build data
acquisition and instrument control applications. Open the Getting Started
with LabVIEW manual by selecting Start»All Programs»National
Instruments»LabVIEW»LabVIEW Manuals or by navigating to the
labview\manuals directoryand opening
LV_Getting_Started.pdf.
Use the LabVIEW Help, available by selecting Help»Search the
LabVIEW Help in LabVIEW, to access information about LabVIEW
programming concepts, step-by-step instructions for using LabVIEW, and
reference information about LabVIEW VIs, functions, palettes, menus, and
tools. Refer to the following locations on the Contents tab of the LabVIEW
Help for information about NI-DAQmx:
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About This Manual
•
Getting Started»Getting Started with DAQ—Includes overview
information and a tutorial to learn how to take an NI-DAQmx
measurement in LabVIEW using the DAQ Assistant.
•
•
VI and Function Reference»Measurement I/O VIs and
Functions—Describes the LabVIEW NI-DAQmx VIs and properties.
Taking Measurements—Contains the conceptual and how-to
information you need to acquire and analyze measurement data in
LabVIEW, including common measurements, measurement
fundamentals, NI-DAQmx key concepts, and device considerations.
LabWindows™/CVI™
The Data Acquisition book of the LabWindows/CVI Help contains
measurement concepts for NI-DAQmx. This book also contains Taking an
NI-DAQmx Measurement in LabWindows/CVI, which includes
step-by-step instructions about creating a measurement task using the DAQ
Assistant. In LabWindows/CVI, select Help»Contents, then select Using
LabWindows/CVI»Data Acquisition.
The NI-DAQmx Library book of the LabWindows/CVI Help contains API
overviews and function reference for NI-DAQmx. Select Library
Reference»NI-DAQmx Library in the LabWindows/CVI Help.
Measurement Studio
The NI Measurement Studio Help contains function reference,
measurement concepts, and a walkthrough for using the Measurement
Studio NI-DAQmx .NET and Visual C++ class libraries. This help
collection is integrated into the Microsoft Visual Studio .NET
documentation. In Visual Studio .NET, select Help»Contents.
Note You must have Visual Studio .NET installed to view the NI Measurement Studio
Help.
ANSI C without NI Application Software
The NI-DAQmx Help contains API overviews and general information
about measurement concepts. Select Start»All Programs»National
Instruments»NI-DAQmx Help.
.NET Languages without NI Application Software
The NI Measurement Studio Help contains function reference and
measurement concepts for using the Measurement Studio NI-DAQmx
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.NET and Visual C++ class libraries. This help collection is integrated into
the Visual Studio .NET documentation. In Visual Studio .NET, select
Help»Contents.
Note You must have Visual Studio .NET installed to view the NI Measurement Studio
Help.
Device Documentation and Specifications
The NI 6232/6233 Specifications contains all specifications for
NI 6232/6233 M Series devices.
NI-DAQ 7.0 and later includes the Device Document Browser, which
contains online documentation for supported DAQ, SCXI, and switch
devices, such as help files describing device pinouts, features, and
operation, and PDF files of the printed device documents. You can find,
view, and/or print the documents for each device using the Device
Document Browser at any time by inserting the CD. After installing the
Device Document Browser, device documents are accessible from Start»
All Programs»National Instruments»NI-DAQ»Browse Device
Documentation.
Training Courses
If you need more help getting started developing an application with NI
products, NI offers training courses. To enroll in a course or obtain a
detailed course outline, refer to ni.com/training.
Technical Support on the Web
For additional support, refer to ni.com/supportor zone.ni.com.
Note You can download these documents at ni.com/manuals.
DAQ specifications and some DAQ manuals are available as PDFs. You
must have Adobe Acrobat Reader with Search and Accessibility 5.0.5 or
later installed to view the PDFs. Refer to the Adobe Systems Incorporated
Web site at www.adobe.comto download Acrobat Reader. Refer to the
National Instruments Product Manuals Library at ni.com/manualsfor
updated documentation resources.
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1
Getting Started
M Series NI 6232/6233 devices feature sixteen analog input (AI) channels,
two analog output (AO) channels, two counters, six lines of digital input
(DI), and four lines of digital output (DO). If you have not already installed
your device, refer to the DAQ Getting Started Guide. For NI 6232/6233
device specifications, refer to the NI 6232/6233 Specifications on
ni.com/manuals.
Before installing your DAQ device, you must install the software you plan
to use with the device.
Installing NI-DAQmx
The DAQ Getting Started Guide, which you can download at
ni.com/manuals, offers NI-DAQmx users step-by-step instructions for
installing software and hardware, configuring channels and tasks, and
getting started developing an application.
Installing Other Software
If you are using other software, refer to the installation instructions that
accompany your software.
Installing the Hardware
The DAQ Getting Started Guide contains non-software-specific
and cables.
Device Pinouts
Refer to Appendix A, Device-Specific Information, for the NI 6232/6233
device pinout.
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Chapter 1
Getting Started
Device Specifications
Refer to the NI 6232/6233 Specifications, available on the NI-DAQ Device
Document Browser or ni.com/manuals, for more detailed information
on the NI 6232/6233 device.
Device Accessories and Cables
NI offers a variety of accessories and cables to use with your DAQ device.
Refer to Appendix A, Device-Specific Information, or ni.comfor more
information.
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2
DAQ System Overview
Figure 2-1 shows a typical DAQ system, which includes sensors,
transducers, cables that connect the various devices to the accessories, the
M Series device, programming software, and a PC. The following sections
cover the components of a typical DAQ system.
Sensors and
Transducers
Cables and
Accessories
DAQ
Hardware
DAQ
Software
Personal
Computer
Figure 2-1. Components of a Typical DAQ System
DAQ Hardware
DAQ hardware digitizes signals, performs D/A conversions to generate
analog output signals, and measures and controls digital I/O signals.
Figure 2-2 features the components of the NI 6232/6233 device.
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Chapter 2
DAQ System Overview
A
Isolation
Barrier
Analog Input
AI GND
A
Digital
Routing
and Clock
Generation
Analog Output
Bus
Interface
A
Bus
AO GND
Digital
Isolators
Counters
RTSI
PFI/Static DI
P0
P1
P0.GND
P1.GND
PFI/Static DO
Figure 2-2. General NI 6232/6233 Block Diagram
DAQ-STC2
The DAQ-STC2 implements a high-performance digital engine for
NI 6232/6233 data acquisition hardware. Some key features of this engine
include the following:
•
•
•
•
Flexible AI and AO sample and convert timing
Many triggering modes
Independent AI and AO FIFOs
Generation and routing of RTSI signals for multi-device
synchronization
•
•
•
•
•
Generation and routing of internal and external timing signals
Two flexible 32-bit counter/timer modules with hardware gating
Static DIO signals
PLL for clock synchronization
PCI/PXI interface
Independent scatter-gather DMA controllers for all acquisition and
generation functions
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Chapter 2
DAQ System Overview
Calibration Circuitry
The M Series analog inputs and outputs have calibration circuitry to correct
gain and offset errors. You can calibrate the device to minimize AI and AO
errors caused by time and temperature drift at run time. No external
circuitry is necessary; an internal reference ensures high accuracy and
stability over time and temperature changes.
Factory-calibration constants are permanently stored in an onboard
EEPROM and cannot be modified. When you self-calibrate the device,
software stores new constants in a user-modifiable section of the EEPROM.
To return a device to its initial factory calibration settings, software can
copy the factory-calibration constants to the user-modifiable section of the
EEPROM. Refer to the NI-DAQmx Help or the LabVIEW 8.x Help for more
information on using calibration constants.
Sensors and Transducers
Sensors can generate electrical signals to measure physical phenomena,
such as temperature, force, sound, or light. Some commonly used sensors
are strain gauges, thermocouples, thermistors, angular encoders, linear
encoders, and resistance temperature detectors (RTDs).
To measure signals from these various transducers, you must convert them
into a form that a DAQ device can accept. For example, the output voltage
of most thermocouples is very small and susceptible to noise. Therefore,
you may need to amplify or filter the thermocouple output before digitizing
it, or use the smallest measurement range available within the DAQ device.
For more information about sensors, refer to the following documents.
•
•
For general information about sensors, visit ni.com/sensors.
If you are using LabVIEW, refer to the LabVIEW Help by selecting
Help»Search the LabVIEW Help in LabVIEW, and then navigate to
the Taking Measurements book on the Contents tab.
•
If you are using other application software, refer to Common Sensors
in the NI-DAQmx Help, which can be accessed from Start»All
Programs»National Instruments»NI-DAQ»NI-DAQmx Help.
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DAQ System Overview
Cables and Accessories
NI offers a variety of products to use with NI 6232/6233 devices, including
cables, connector blocks, and other accessories, as follows:
•
Cables and cable assemblies
–
–
Shielded
Unshielded ribbon
For more specific information about these products, refer to ni.com.
Refer to the Custom Cabling section of this chapter, the Field Wiring
Considerations section of Chapter 4, Analog Input, and Appendix A,
Device-Specific Information, for information on how to select accessories
for your M Series device.
Custom Cabling
NI offers cables and accessories for many applications. However, if you
want to develop your own cable, the following kits can assist you:
•
•
TB-37F-37SC—37-pin solder cup terminals, shell with strain relief
TB-37F-37CP—37-pin crimp & poke terminals, shell with strain
relief
Also, adhere to the following guidelines for best results:
•
For AI signals, use shielded, twisted-pair wires for each AI pair of
differential inputs. Connect the shield for each signal pair to the ground
reference at the source.
•
•
Route the analog lines separately from the digital lines.
When using a cable shield, use separate shields for the analog and
digital sections of the cable. Failure to do so results in noise coupling
into the analog signals from transient digital signals.
For more information on the connectors used for DAQ devices, refer to the
KnowledgeBase document, Specifications and Manufacturers for Board
Mating Connectors, by going to ni.com/infoand entering the info code
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Programming Devices in Software
National Instruments measurement devices are packaged with NI-DAQ
driver software, an extensive library of functions and VIs you can call from
your application software, such as LabVIEW or LabWindows/CVI, to
program all the features of your NI measurement devices. Driver software
has an application programming interface (API), which is a library of VIs,
functions, classes, attributes, and properties for creating applications for
your device.
NI-DAQ includes two NI-DAQ drivers, Traditional NI-DAQ (Legacy) and
NI-DAQmx. M Series devices use the NI-DAQmx driver. Each driver has
its own API, hardware configuration, and software configuration. Refer to
the DAQ Getting Started Guide for more information about the two drivers.
NI-DAQmx includes a collection of programming examples to help you get
started developing an application. You can modify example code and save
it in an application. You can use examples to develop a new application or
add example code to an existing application.
To locate LabVIEW and LabWindows/CVI examples, open the National
Instruments Example Finder.
•
•
In LabVIEW, select Help»Find Examples.
In LabWindows/CVI, select Help»NI Example Finder.
Measurement Studio, Visual Basic, and ANSI C examples are located in the
following directories:
•
NI-DAQmx examples for Measurement Studio-supported languages
are in the following directories:
– MeasurementStudio\VCNET\Examples\NIDaq
– MeasurementStudio\DotNET\Examples\NIDaq
•
NI-DAQmx examples for ANSI C are in the
NI-DAQ\Examples\DAQmx ANSI C Devdirectory
For additional examples, refer to zone.ni.com.
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The I/O Connector Signal Descriptions and RTSI Connector Pinout
sections contain information on M Series connectors. Refer to
pinouts.
I/O Connector Signal Descriptions
Table 3-1 describes the signals found on the I/O connectors. Not all signals
are available on all devices.
Table 3-1. I/O Connector Signals
Signal Name
AI GND
Reference
Direction
Description
—
—
Analog Input Ground—These terminals are the input bias
current return point. AI GND and AO GND are connected on
the device.
Note: AI GND and AO GND are isolated from earth ground,
chassis ground, P0.GND, and P1.GND.
AI <0..15>
AI GND
Input
Analog Input Channels 0 to 15—For single-ended
measurements, each signal is an analog input voltage channel.
In RSE mode, AI GND is the reference for these signals.
For differential measurements, AI 0 and AI 8 are the positive
and negative inputs of differential analog input channel 0.
Similarly, the following signal pairs also form differential
input channels:
<AI 1, AI 9>, <AI 2, AI 10>, <AI 3, AI 11>, <AI 4, AI 12>,
<AI 5, AI 13>, <AI 6, AI 14>, <AI 7, AI 15>
Also refer to the Analog Input Ground-Reference Settings
section of Chapter 4, Analog Input.
Note: AI <0..15> are isolated from earth ground and chassis
ground.
AO <0..1>
AO GND
Output
Analog Output Channels 0 to 1—These terminals supply the
voltage output of AO channels 0 to 1.
Note: AO <0..1> are isolated from earth ground and chassis
ground.
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Table 3-1. I/O Connector Signals (Continued)
Signal Name
AO GND
Reference
Direction
Description
—
—
Analog Output Ground—AO GND is the reference for
AO <0..1>. AI GND and AO GND are connected on the
device.
Note: AI GND and AO GND are isolated from earth ground,
chassis ground, P0.GND, and P1.GND.
PFI <0..5>/P0.<0..5>
P0.GND
Input
Programmable Function Interface or Static Digital Input
Channels 0 to 5—Each of these terminals can be individually
configured as an input directional PFI terminal or a digital
input terminal.
As an input, each input PFI terminal can be used to supply an
external source for AI or AO timing signals or counter/timer
inputs.
Note: PFI <0..5>/P0.<0..5> are isolated from earth ground,
chassis ground, AI GND, AO GND, and P1.GND.
PFI <6..9>/P1.<0..3>
P1.GND
Output
Programmable Function Interface or Static Digital
Output Channels 6 to 9—Each of these terminals can be
individually configured as an output directional PFI terminal
or a digital output terminal.
As a PFI output, you can route many different internal AI or
AO timing signals to each PFI terminal. You also can route the
counter/timer outputs to each PFI terminal.
Note: PFI <6..9>/P1.<0..3> are isolated from earth ground,
chassis ground, AI GND, AO GND, and P0.GND.
NC
—
—
—
No connect—Do not connect signals to these terminals.
P0.GND
—
—
—
Digital Input Ground—P0.GND supplies the reference for
input PFI <0..5>/P0.<0..5>.
Note: P0.GND is isolated from earth ground, chassis ground,
AI GND, AO GND, and P1.GND.
P1.GND
P1.VCC
—
—
Digital Output Ground—P1.GND supplies the reference for
output PFI <6..9>/P1.<0..3>.
Note: P1.GND is isolated from earth ground, chassis ground,
AI GND, AO GND, and P0.GND.
Digital Output Power—P1.VCC supplies the power for
digital output lines. The actual power consumed depends on
the load connected between the digital output and P1.GND.
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RTSI Connector Pinout
Refer to the RTSI Connector Pinout section of Chapter 10, Digital Routing
and Clock Generation, for information on the RTSI connector.
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4
Analog Input
Figure 4-1 shows the analog input circuitry of NI 6232/6233 devices.
Isolation
Barrier
AI <0..n>
Mux
DIFF,
RSE,
or NRSE
Digital
Isolators
AI FIFO
NI-PGIA
ADC
AI Data
Input Range
Selection
AI GND
AI Terminal
Configuration
Selection
Figure 4-1. NI 6232/6233 Analog Input Circuitry
Analog Input Circuitry
I/O Connector
You can connect analog input signals to the M Series device through the I/O
connector. The proper way to connect analog input signals depends on the
analog input ground-reference settings, described in the Analog Input
Ground-Reference Settings section. Also refer to Appendix A,
Device-Specific Information, for device I/O connector pinouts.
MUX
Each M Series device has one analog-to-digital converter (ADC). The
multiplexers (MUX) route one AI channel at a time to the ADC through the
NI-PGIA.
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Ground-Reference Settings
The analog input ground-reference settings circuitry selects between
differential and referenced single-ended modes. Each AI channel can use a
different mode.
Instrumentation Amplifier (NI-PGIA)
The NI programmable gain instrumentation amplifier (PGIA) is a
measurement and instrument class amplifier that minimizes settling times
for all input ranges. The NI-PGIA can amplify or attenuate an AI signal to
ensure that you use the maximum resolution of the ADC.
M Series devices use the NI-PGIA to deliver high accuracy even when
sampling multiple channels with small input ranges at fast rates. M Series
devices can sample channels in any order at the maximum conversion rate,
and you can individually program each channel in a sample with a different
input range.
A/D Converter
The analog-to-digital converter (ADC) digitizes the AI signal by converting
the analog voltage into a digital number.
Isolation Barrier and Digital Isolators
The digital isolators across the isolation barrier provide a ground break
between the isolated analog front end and the earth/chassis/building
ground.
AI FIFO
M Series devices can perform both single and multiple A/D conversions of
a fixed or infinite number of samples. A large first-in-first-out (FIFO)
buffer holds data during AI acquisitions to ensure that no data is lost.
M Series devices can handle multiple A/D conversion operations with
DMA, interrupts, or programmed I/O.
Analog Input Range
Input range refers to the set of input voltages that an analog input channel
can digitize with the specified accuracy. The NI-PGIA amplifies or
attenuates the AI signal depending on the input range. You can individually
program the input range of each AI channel on your M Series device.
The input range affects the resolution of the M Series device for an AI
channel. Resolution refers to the voltage of one ADC code. For example, a
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16-bit ADC converts analog inputs into one of 65,536 (= 216) codes—that
is, one of 65,536 possible digital values. These values are spread fairly
evenly across the input range. So, for an input range of –10 V to 10 V, the
voltage of each code of a 16-bit ADC is:
(10 V – (–10 V))
= 305 mV
216
M Series devices use a calibration method that requires some codes
(typically about 5% of the codes) to lie outside of the specified range. This
calibration method improves absolute accuracy, but it increases the nominal
resolution of input ranges by about 5% over what the formula shown above
would indicate.
Choose an input range that matches the expected input range of your signal.
A large input range can accommodate a large signal variation, but reduces
resolution, but may result in the input signal going out of range.
For more information on programming these settings, refer to the
NI-DAQmx Help or the LabVIEW 8.x Help.
Table 4-1 shows the input ranges and resolutions supported by the
NI 6232/6233 device.
Table 4-1. Input Ranges for NI 6232/6233
Nominal Resolution Assuming
Input Range
–10 V to 10 V
–5 V to 5 V
5% Over Range
320 μV
160 μV
–1 V to 1 V
32 μV
–200 mV to 200 mV
6.4 μV
Analog Input Ground-Reference Settings
NI 6232/6233 devices support the analog input ground-reference settings
shown in Table 4-2.
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Table 4-2. Analog Input Ground-Reference Settings
AI Ground-Reference
Settings
Description
DIFF
In differential (DIFF) mode, the NI 6232/6233 device measures the
difference in voltage between two AI signals. AI GND is the bias
current return point for DIFF mode.
RSE
In referenced single-ended (RSE) mode, the NI 6232/6233 device
measures the voltage of an AI signal relative to AI GND, which is
isolated from earth/chassis ground. The ground reference point is
provided by the user through AI GND.
NRSE
Non-referenced single-ended (NRSE) mode is identical to RSE mode
on NI 6232/6233 devices.
The AI ground-reference setting determines how you should connect your
AI signals to the NI 6232/6233 device. Refer to the Connecting Analog
Voltage Input Signals section for more information.
Ground-reference settings are programmed on a per-channel basis. For
example, you might configure the device to scan five channels—two
differentially-configured channels and three single-ended channels.
NI 6232/6233 devices implement the different analog input
ground-reference settings by routing different signals to the PGIA. The
PGIA is a differential amplifier. That is, the PGIA amplifies (or attenuates)
the difference in voltage between its two inputs. The PGIA drives the ADC
with this amplified voltage. The amount of amplification (the gain), is
determined by the analog input range, as shown in Figure 4-2.
Instrumentation
Amplifier
V
V
in+
+
PGIA
Measured
V
m
in–
Voltage
–
V
= [V
in+
– V ] × Gain
in–
m
Figure 4-2. PGIA
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Table 4-3 shows how signals are routed to the NI-PGIA.
Table 4-3. Signals Routed to the NI-PGIA
Signals Routed to the Positive Signals Routed to the Negative
AI Ground-Reference
Settings
Input of the NI-PGIA (Vin+
)
Input of the NI-PGIA (Vin–
)
RSE and NRSE
DIFF
AI <0..15>
AI GND
AI <0..7>
AI <8..15>
For differential measurements, AI 0 and AI 8 are the positive and negative
inputs of differential analog input channel 0. For a complete list of signal
pairs that form differential input channels, refer to the I/O Connector Signal
Descriptions section of Chapter 3, Connector Information.
Caution The maximum input voltages rating of AI signals with respect to AI GND (and
for differential signals with respect to each other) and earth/chassis ground are listed in the
Maximum Working Voltage section of the NI 6232/6233 Specifications. Exceeding the
maximum input voltage or maximum working voltage of AI signals distorts the
measurement results. Exceeding the maximum input voltage or maximum working voltage
rating also can damage the device and the computer. Exceeding the maximum input voltage
can cause injury and harm the user. NI is not liable for any damage or injuries resulting
from such signal connections.
AI ground-reference setting is sometimes referred to as AI terminal
configuration.
Configuring AI Ground-Reference Settings in
Software
ground references.
To enable multimode scanning in LabVIEW, use NI-DAQmx Create
Virtual Channel.viof the NI-DAQmx API. You must use a new VI for
each channel or group of channels configured in a different input mode. In
Figure 4-3, channel 0 is configured in differential mode, and channel 1 is
configured in RSE mode.
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Figure 4-3. Enabling Multimode Scanning in LabVIEW
Multichannel Scanning Considerations
M Series devices can scan multiple channels at high rates and digitize the
signals accurately. However, you should consider several issues when
designing your measurement system to ensure the high accuracy of your
measurements.
In multichannel scanning applications, accuracy is affected by settling
time. When your M Series device switches from one AI channel to another
AI channel, the device configures the NI-PGIA with the input range of the
new channel. The NI-PGIA then amplifies the input signal with the gain for
the new input range. Settling time refers to the time it takes the NI-PGIA to
amplify the input signal to the desired accuracy before it is sampled by the
ADC. The NI 6232/6233 Specifications shows the device settling time.
M Series devices are designed to have fast settling times. However several
factors can increase the settling time which decreases the accuracy of your
measurements. To ensure fast settling times, you should do the following
(in order of importance):
•
•
•
•
Use low impedance sources
Use short high-quality cabling
Carefully choose the channel scanning order
Avoid scanning faster than necessary
Refer to the following sections for more information on these factors.
Use Low Impedance Sources
To ensure fast settling times, your signal sources should have an impedance
and so decrease the accuracy at fast scanning rates.
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Settling times increase when scanning high-impedance signals due to a
phenomenon called charge injection. Multiplexers contain switches,
usually made of switched capacitors. When one of the channels, for
example channel 0, is selected in a multiplexer, those capacitors
accumulate charge. When the next channel, for example channel 1, is
selected, the accumulated charge leaks backward through channel 1. If the
output impedance of the source connected to channel 1 is high enough, the
resulting reading of channel 1 can be partially affected by the voltage on
channel 0. This effect is referred to as ghosting.
If your source impedance is high, you can decrease the scan rate to allow
the PGIA more time to settle. Another option is to use a voltage follower
circuit external to your DAQ device to decrease the impedance seen by the
DAQ device. Refer to the KnowledgeBase document, How Do I Create a
Buffer to Decrease the Source Impedance of My Analog Input Signal?, by
going to ni.com/infoand entering the info code rdbbis.
Use Short High-Quality Cabling
accuracy including crosstalk, transmission line effects, and noise. The
capacitance of the cable also can increase the settling time.
National Instruments recommends using individually shielded,
twisted-pair wires that are 2 m or less to connect AI signals to the device.
Refer to the Connecting Analog Voltage Input Signals section for more
information.
Carefully Choose the Channel Scanning Order
Avoid Switching from a Large to a Small Input Range
Switching from a channel with a large input range to a channel with a small
input range can greatly increase the settling time.
Suppose a 4 V signal is connected to channel 0 and a 1 mV signal is
connected to channel 1. The input range for channel 0 is –10 V to 10 V and
the input range of channel 1 is –200 mV to 200 mV.
When the multiplexer switches from channel 0 to channel 1, the input to the
PGIA switches from 4 V to 1 mV. The approximately 4 V step from 4 V to
1 mV is 1,000% of the new full-scale range. For a 16-bit device to settle
within 0.0015% (15 ppm or 1 LSB) of the 200 mV full-scale range on
channel 1, the input circuitry must settle to within 0.000031% (0.31 ppm or
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1/50 LSB) of the 10 V range. Some devices can take many microseconds
for the circuitry to settle this much.
To avoid this effect, you should arrange your channel scanning order so that
transitions from large to small input ranges are infrequent.
In general, you do not need this extra settling time when the PGIA is
switching from a small input range to a larger input range.
Insert Grounded Channel between Signal Channels
Another technique to improve settling time is to connect an input channel
to ground. Then insert this channel in the scan list between two of your
signal channels. The input range of the grounded channel should match the
input range of the signal after the grounded channel in the scan list.
Consider again the example above where a 4 V signal is connected to
channel 0 and a 1 mV signal is connected to channel 1. Suppose the input
range for channel 0 is –10 V to 10 V and the input range of channel 1 is
–200 mV to 200 mV.
You can connect channel 2 to AI GND (or you can use the internal ground
signal; refer to Internal Channels in the NI-DAQmx Help or the
LabVIEW 8.x Help). Set the input range of channel 2 to –200 mV to
200 mV to match channel 1. Then scan channels in the order: 0, 2, 1.
Inserting a grounded channel between signal channels improves settling
time because the NI-PGIA adjusts to the new input range setting faster
when the input is grounded.
Minimize Voltage Step between Adjacent Channels
When scanning between channels that have the same input range, the
settling time increases with the voltage step between the channels. If you
know the expected input range of your signals, you can group signals with
similar expected ranges together in your scan list.
For example, suppose all channels in a system use a –5 to 5 V input range.
The signals on channels 0, 2, and 4 vary between 4.3 V and 5 V. The signals
on channels 1, 3, and 5 vary between –4 V and 0 V. Scanning channels in
the order 0, 2, 4, 1, 3, 5 will produce more accurate results than scanning
channels in the order 0, 1, 2, 3, 4, 5.
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Avoid Scanning Faster Than Necessary
Designing your system to scan at slower speeds gives the PGIA more time
to settle to a more accurate level. Here are two examples to consider.
Example 1
Averaging many AI samples can increase the accuracy of the reading by
decreasing noise effects. In general, the more points you average, the more
accurate the final result will be. However, you may choose to decrease the
number of points you average and slow down the scanning rate.
Suppose you want to sample 10 channels over a period of 20 ms and
average the results. You could acquire 500 points from each channel at a
scan rate of 250 kS/s. Another method would be to acquire 1,000 points
from each channel at a scan rate of 500 kS/s. Both methods take the same
amount of time. Doubling the number of samples averaged (from 500 to
1,000) decreases the effect of noise by a factor of 1.4 (the square root of 2).
However, doubling the number of samples (in this example) decreases the
time the PGIA has to settle from 4 µs to 2 µs. In some cases, the slower scan
rate system returns more accurate results.
Example 2
If the time relationship between channels is not critical, you can sample
from the same channel multiple times and scan less frequently. For
example, suppose an application requires averaging 100 points from
channel 0 and averaging 100 points from channel 1. You could alternate
reading between channels—that is, read one point from channel 0, and then
one point from channel 1, and so on. You also could read all 100 points
from channel 0 then read 100 points from channel 1. The second method
switches between channels much less often and is affected much less by
settling time.
Analog Input Data Acquisition Methods
When performing analog input measurements, you either can perform
software-timed or hardware-timed acquisitions. Hardware-timed
acquisitions can be buffered or non-buffered.
Software-Timed Acquisitions
With a software-timed acquisition, software controls the rate of the
acquisition. Software sends a separate command to the hardware to initiate
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each ADC conversion. In NI-DAQmx, software-timed acquisitions are
referred to as having on-demand timing. Software-timed acquisitions are
also referred to as immediate or static acquisitions and are typically used
for reading a single sample of data.
Hardware-Timed Acquisitions
With hardware-timed acquisitions, a digital hardware signal
(ai/SampleClock) controls the rate of the acquisition. This signal can be
generated internally on your device or provided externally.
Hardware-timed acquisitions have several advantages over software-timed
acquisitions.
•
•
•
The time between samples can be much shorter.
The timing between samples is deterministic.
Hardware-timed acquisitions can use hardware triggering.
Hardware-timed operations can be buffered or non-buffered. A buffer is a
temporary storage in computer memory for to-be-generated samples.
Buffered
In a buffered acquisition, data is moved from the onboard FIFO memory of
a DAQ device to a PC buffer using DMA or interrupts before it is
transferred to application memory. Buffered acquisitions typically allow
for much faster transfer rates than non-buffered acquisitions because data
is moved in large blocks, rather than one point at a time.
One property of buffered I/O operations is the sample mode. The sample
mode can be either finite or continuous.
Finite sample mode acquisition refers to the acquisition of a specific,
predetermined number of data samples. When the specified number of
samples has been written out, the generation stops. If you use a reference
trigger, you must use finite sample mode.
Continuous acquisition refers to the acquisition of an unspecified number
of samples. Instead of acquiring a set number of data samples and stopping,
a continuous acquisition continues until you stop the operation. Continuous
acquisition is also referred to as double-buffered or circular-buffered
If data cannot be transferred across the bus fast enough, the FIFO will
become full. New acquisitions will overwrite data in the FIFO before it can
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be transferred to host memory. The device generates an error in this case.
With continuous operations, if the user program does not read data out of
the PC buffer fast enough to keep up with the data transfer, the buffer could
reach an overflow condition, causing an error to be generated.
Non-Buffered
In non-buffered acquisitions, data is read directly from the FIFO on the
device. Typically, hardware-timed, non-buffered operations are used to
read single samples with known time increments between them and good
latency.
Analog Input Triggering
•
•
•
Start trigger
Reference trigger
Pause trigger
Refer to the AI Start Trigger Signal, AI Reference Trigger Signal, and AI
Pause Trigger Signal sections for information on these triggers.
digital triggering, but do not support analog triggering.
Connecting Analog Voltage Input Signals
Table 4-4 summarizes the recommended input configuration for both types
of signal sources.
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Table 4-4. Analog Input Configuration
Floating Signal Sources (Not
Connected to Building Ground)
Ground-Referenced Signal Sources
Examples:
Example:
•
•
Ungrounded thermocouples
•
Plug-in instruments with
non-isolated outputs
Signal conditioning with isolated
outputs
Input
•
Battery devices
Differential
(DIFF)
Isolation
Barrier
Isolation
Barrier
AI +
AI +
AI –
+
+
+
–
+
–
AI –
–
–
AI GND
AI GND
Referenced
Single-Ended
(RSE)
Isolation
Barrier
Isolation
Barrier
AI +
AI
+
–
+
+
–
+
–
AI GND
AI GND
Refer to the Analog Input Ground-Reference Settings section for
descriptions of DIFF and RSE modes.
Types of Signal Sources
When configuring the input channels and making signal connections, first
determine whether the signal sources are floating or ground-referenced. For
isolated measurement products, the front ends are isolated from the
building ground system, breaking any electrical connection between the
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two reference planes. Isolated front ends require a ground-reference point
to the signal that is being measured.
Floating Signal Sources
A floating signal source is not connected to the building ground system
(earth or chassis ground), but has an isolated ground-reference point. Some
examples of floating signal sources are outputs of transformers,
thermocouples, battery-powered devices, optical isolators, and isolation
amplifiers. An instrument or device that has an isolated output is a floating
signal source. You must connect the ground reference of a floating signal
to the AI ground of the device to establish a local or onboard reference for
the signal. Otherwise, the measured input signal varies as the source floats
outside the common-mode input range.
Ground-Referenced Signal Sources
A ground-referenced signal source is connected to the building system
ground (earth or chassis ground), so you must connect the ground-reference
to AI GND to establish a local or onboard reference to the signal.
Non-isolated outputs of instruments and devices that plug into the building
power system fall into this category.
The difference in ground potential between an instrument and your PC
connected to the same building power system is typically between 1 and
100 mV, but the difference can be much higher if power distribution circuits
are improperly connected. If a grounded signal source is incorrectly
measured, this difference can appear as measurement error. The
NI 6232/6233 isolates the ground of the instrument from the PC to help
eliminate this error.
Differential Connection Considerations
A DIFF connection is one in which the AI signal has its own reference
signal or signal return path. These connections are available when the
selected channel is configured in DIFF input mode. The input signal is
connected to the positive input of the PGIA, and its reference signal, or
return, is connected to the negative input of the PGIA.
When you configure a channel for DIFF input, each signal uses two
multiplexer inputs—one for the signal and one for its reference signal.
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Use DIFF input connections for any channel that meets any of the following
conditions:
•
•
The input signal is low level (less than 1 V).
The leads connecting the signal to the device are greater than 3 m
(10 ft).
•
•
The input signal requires a separate ground-reference point or return
signal.
The signal leads travel through noisy environments.
noise rejection. DIFF signal connections also allow input signals to float
within the common-mode limits of the PGIA.
Differential Connections for Ground-Referenced Signal Sources
Figure 4-4 shows how to connect a ground-referenced signal source to a
channel on the device configured in DIFF mode.
AI +
Isolation
Barrier
Ground-
Referenced
Signal
+
–
Instrumentation
Amplifier
V
s
+
–
Source
+
PGIA
Digital
Isolators
AI –
Measured
Voltage
V
m
–
Common-
Mode
+
Noise and
Ground
Potential
V
cm
–
Input Multiplexers
AI GND
I/O Connector
M Series Isolated Device Configured in DIFF Mode
Figure 4-4. Differential Connections for Ground-Referenced Signal Sources
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With this type of connection, the PGIA rejects both the common-mode
noise in the signal and the ground potential difference between the signal
source and the device ground, shown as Vcm in the figure. Refer to the
NI 6232/6233 Specifications for the usable range of Vcm.
Common-Mode Signal Rejection Considerations
For signal sources that are already referenced to some ground point with
respect to the device, the PGIA can reject any voltage caused by ground
potential differences between the signal source and the device. In addition,
with DIFF input connections, the PGIA can reject common-mode noise
can reject common-mode signals as long as AI+ and AI– (input signals) are
both within 11 V of AI GND.
Differential Input Biasing
Figure 4-4 shows AI GND connected to the negative lead of the signal
source. If you do not connect AI GND, the source is not likely to remain
within the common-mode signal range of the PGIA due to the floating
source or the isolation barrier. The PGIA then saturates, causing erroneous
readings.
You must reference the source to AI GND. The easiest way to make this
reference is to connect the positive side of the signal to the positive input of
the PGIA and connect the negative side of the signal to AI GND as well as
to the negative input of the PGIA, without using resistors.
Differential Connections for Non-Referenced or Floating Signal Sources
Figure 4-5 shows how to connect a floating signal source to a channel
configured in DIFF mode.
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AI +
Isolation
Barrier
+
Floating
Signal
Source
Instrumentation
Amplifier
V
s
+
–
–
+
PGIA
Digital
AI –
Isolators
Measured
Voltage
V
m
–
Input Multiplexers
AI GND
I/O Connector
M Series Isolated Device Configured in DIFF Mode
Figure 4-5. Differential Connections for Floating Signal Sources
This figure shows AI GND connected to the ground reference point for the
floating signal source. If you do not connect AI GND, the source is not
likely to remain within the common-mode signal range of the PGIA due to
the floating source or the isolation barrier. The PGIA then saturates,
causing erroneous readings.
You must reference the source to AI GND. The easiest way to make this
reference is to connect the positive side of the signal to the positive input of
the PGIA and connect the negative side of the signal to AI GND as well as
to the negative input of the PGIA, without using resistors.
A single-ended connection is one in which the device AI signal is
referenced to a ground that it can share with other input signals. The input
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signal connects to the positive input of the PGIA, and the ground connects
to the negative input of the PGIA.
You should only use single-ended input connections if the input signal
meets the following conditions.
•
•
•
The input signal is high-level (greater than 1 V).
The leads connecting the signal to the device are less than 3 m (10 ft).
The input signal can share a common reference point with other
signals.
DIFF input connections are recommended for greater signal integrity for
any input signal that does not meet the preceding conditions.
For single-ended measurements, there is one ground-reference point for all
analog input signals, but the reference ground plane is floating, requiring
the user to provide a reference ground. An isolated device protects users
against ground loops in their measurement, as well as allowing the user to
provide a reference ground that is not electrically connected to earth,
system, or building ground.
In the single-ended modes, more electrostatic and magnetic noise couples
into the signal connections than in DIFF configurations. The coupling is the
result of differences in the signal path. Magnetic coupling is proportional
function of how much the electric field differs between the two conductors.
Single-Ended Connections for Floating or Grounded
Signal Sources
Figure 4-6 shows how to connect a floating or grounded signal source to a
channel configured for RSE mode.
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Chapter 4
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Isolation
Barrier
AI <0..n>
Programmable Gain
Instrumentation
Amplifier
Floating or
Grounded
Signal
+
Vs
+
–
Digital
Isolators
+
PGIA
Measured
Voltage
–
Vm
Source
Input Multiplexers
–
AI GND
I/O Connector
Vcm
Selected Channel in RSE or NRSE Configuration
Figure 4-6. Single-Ended Connections for Floating Signal Sources (RSE
Configuration)
Refer to the NI 6232/6233 Specifications for the usable range of Vcm.
Common-Mode Signal Rejection Considerations
For signal sources that are already referenced to some ground point with
respect to the device, the PGIA can reject any voltage caused by ground
potential differences between the signal source and the device. In addition,
with DIFF input connections, the PGIA can reject common-mode noise
pickup in the leads connecting the signal sources to the device. The PGIA
can reject common-mode signals as long as AI x (input signal) is within
11 V of AI GND.
Field Wiring Considerations
Environmental noise can seriously affect the measurement accuracy of the
device if you do not take proper care when running signal wires between
signal sources and the device. The following recommendations apply
mainly to AI signal routing to the device, although they also apply to signal
routing in general.
Minimize noise pickup and maximize measurement accuracy by taking the
•
Use DIFF AI connections to reject common-mode noise.
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•
Use individually shielded, twisted-pair wires to connect AI signals to
the device. With this type of wire, the signals attached to the positive
and negative input channels are twisted together and then covered with
a shield. You then connect this shield only at one point to the signal
source ground. This kind of connection is required for signals traveling
through areas with large magnetic fields or high electromagnetic
interference.
Refer to the NI Developer Zone document, Field Wiring and Noise
Considerations for Analog Signals, for more information. To access this
document, go to ni.com/infoand enter the info code rdfwn3.
In order to provide all of the timing functionality described throughout this
section, NI 6232/6233 devices have a flexible timing engine. Figure 4-7
summarizes all of the timing options provided by the analog input timing
engine. Also refer to the Clock Routing section of Chapter 10, Digital
Routing and Clock Generation.
PFI, RTSI
PXI_STAR
ai/Sample
PFI, RTSI
PXI_STAR
Ctr n Internal Output
SW Pulse
ai/Sample
Clock
Timebase
Clock
Programmable
20 MHz Timebase
100 kHz Timebase
PXI_CLK10
Clock
Divider
PFI, RTSI
PXI_STAR
ai/Convert
Clock
ai/Convert
Clock
Ctr n Internal Output
Timebase Programmable
Clock
Divider
Figure 4-7. Analog Input Timing Options
M Series devices use ai/SampleClock and ai/ConvertClock to perform
interval sampling. As Figure 4-8 shows, ai/SampleClock controls the
sample period, which is determined by the following equation:
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1/Sample Period = Sample Rate
Channel 0
Channel 1
Convert Period
Sample Period
Figure 4-8. Interval Sampling
ai/ConvertClock controls the Convert Period, which is determined by the
following equation:
1/Convert Period = Convert Rate
By default, the NI-DAQmx driver chooses the fastest Channel Clock rate
possible while still allowing extra time for adequate amplifier settling time.
At slower scan rates, 10 μs of delay is added to the fastest possible channel
conversion rate of the device, which is the same as the maximum scan rate,
to derive the Channel Clock.
As the scan rate increases, there eventually will not be enough time to have
a full 10 μs of additional delay time between channel conversions and to
finish acquiring all channels before the next edge of the Scan Clock. At this
point, NI-DAQmx uses round robin channel sampling, evenly dividing the
time between scans by the number of channels being acquired to obtain the
interchannel delay. In this case, you can calculate the Channel Clock by
multiplying the scan rate by the number of channels being acquired.
For example, the NI 623x M Series device has a maximum sampling rate of
250 kS/s. At a slower acquisition rate, such as 10 kHz with 2 channels, the
Convert Clock would be set to 71428.6 Hz. This rate is determined by
taking the fastest channel conversion rate for the device and adding 10 μs,
4 μs (1/250000) + 10 μs, which results in 14 μs or 71428.6 Hz.
When this calculation results in the sampling rate exceeding 35 kHz, there
is not enough time between samples to acquire both channels and still add
a 10 μs delay per channel, so the Convert Clock rate becomes the sampling
rate multiplied by the number of channels being acquired. For example, on
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the PCI-6220 M Series device, a sampling rate of 40 kHz for two channels
would result in a Convert Clock rate of 80 kHz.
Maximum settling time for the amplifier is also very important. For
example, to ensure accuracy to within 1 LSB on an NI 623x M Series
device, the device requires a minimum amplifier settling time of 6 μs even
though the maximum channel conversion rate is 4 μs. Higher source
impedance also increases amplifier settling time.
Note The sampling rate is the fastest you can acquire data on the device and still achieve
sampling rate is aggregate—one channel at 250 kS/s or two channels at 125 kS/s per
channel illustrates the relationship.
Posttriggered data acquisition allows you to view only data that is acquired
after a trigger event is received. A typical posttriggered DAQ sequence is
shown in Figure 4-9. In this example, the DAQ device reads two channels
five times. The sample counter is loaded with the specified number of
posttrigger samples, in this example, five. The value decrements with each
pulse on ai/SampleClock, until the value reaches zero and all desired
samples have been acquired.
ai/StartTrigger
ai/SampleClock
ai/ConvertClock
Sample Counter
4
3
2
1
0
Figure 4-9. Posttriggered Data Acquisition Example
Pretriggered data acquisition allows you to view data that is acquired before
the trigger of interest, in addition to data acquired after the trigger.
Figure 4-10 shows a typical pretriggered DAQ sequence. ai/StartTrigger
can be either a hardware or software signal. If ai/StartTrigger is set up to be
a software start trigger, an output pulse appears on the ai/StartTrigger line
when the acquisition begins. When the ai/StartTrigger pulse occurs, the
sample counter is loaded with the number of pretriggered samples, in this
example, four. The value decrements with each pulse on ai/SampleClock,
until the value reaches zero. The sample counter is then loaded with the
number of posttriggered samples, in this example, three.
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ai/StartTrigger
ai/ReferenceTrigger
ai/SampleClock
ai/ConvertClock
Scan Counter
n/a
3
2
1
0
2
2
2
1
0
Figure 4-10. Pretriggered Data Acquisition Example
If an ai/ReferenceTrigger pulse occurs before the specified number of
when the ai/ReferenceTrigger pulse occurs, the sample counter value
decrements until the specified number of posttrigger samples have been
acquired.
NI 6232/6233 devices feature the following analog input timing signals.
•
•
•
•
•
•
•
•
AI Sample Clock Signal
AI Sample Clock Timebase Signal
AI Convert Clock Signal
AI Convert Clock Timebase Signal
AI Hold Complete Event Signal
AI Start Trigger Signal
AI Reference Trigger Signal
AI Pause Trigger Signal
AI Sample Clock Signal
Use the AI Sample Clock (ai/SampleClock) signal to initiate a set of
measurements. Your M Series device samples the AI signals of every
channel in the task once for every ai/SampleClock. A measurement
acquisition consists of one or more samples.
You can specify an internal or external source for ai/SampleClock. You also
can specify whether the measurement sample begins on the rising edge or
falling edge of ai/SampleClock.
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Using an Internal Source
One of the following internal signals can drive ai/SampleClock.
•
•
•
Counter n Internal Output
AI Sample Clock Timebase (divided down)
A software pulse
A programmable internal counter divides down the sample clock timebase.
Several other internal signals can be routed to ai/SampleClock through
RTSI. Refer to Device Routing in MAX in the NI-DAQmx Help or the
LabVIEW 8.x Help for more information.
Using an External Source
Use one of the following external signals as the source of ai/SampleClock:
•
•
•
Input PFI <0..5>
RTSI <0..7>
PXI_STAR
Routing AI Sample Clock Signal to an Output
Terminal
You can route ai/SampleClock out to any output PFI <6..9> or RTSI <0..7>
terminal. This pulse is always active high.
You can specify the output to have one of two behaviors. With the pulse
behavior, your DAQ device briefly pulses the PFI terminal once for every
occurrence of ai/SampleClock.
With level behavior, your DAQ device drives the PFI terminal high during
the entire sample.
PFI <0..5> terminals are fixed inputs. PFI <6..9> terminals are fixed
outputs.
Other Timing Requirements
Your DAQ device only acquires data during an acquisition. The device
ignores ai/SampleClock when a measurement acquisition is not in progress.
During a measurement acquisition, you can cause your DAQ device to
ignore ai/SampleClock using the ai/PauseTrigger signal.
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A counter on your device internally generates ai/SampleClock unless you
select some external source. ai/StartTrigger starts this counter and either
software or hardware can stop it when a finite acquisition completes. When
using an internally generated ai/SampleClock, you also can specify a
By default, this delay is set to two ticks of the ai/SampleClockTimebase
signal. When using an externally generated ai/SampleClock, you must
of ai/ConvertClock. Failure to do so may result in ai/SampleClock pulses
that are masked off and acquisitions with erratic sampling intervals. Refer
to the AI Convert Clock Signal section for more information on the timing
requirements between ai/ConvertClock and ai/SampleClock.
Figure 4-11 shows the relationship of ai/SampleClock to ai/StartTrigger.
ai/SampleClockTimebase
ai/StartTrigger
ai/SampleClock
Delay
From
Start
Trigger
Figure 4-11. ai/SampleClock and ai/StartTrigger
AI Sample Clock Timebase Signal
You can route any of the following signals to be the AI Sample Clock
Timebase (ai/SampleClockTimebase) signal:
•
•
•
•
•
20 MHz Timebase
100 kHz Timebase
PXI_CLK10
RTSI <0..7>
Input PFI <0..5>
ai/SampleClockTimebase is not available as an output on the I/O connector.
ai/SampleClockTimebase is divided down to provide one of the possible
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sources for ai/SampleClock. You can configure the polarity selection for
ai/SampleClockTimebase as either rising or falling edge.
AI Convert Clock Signal
Use the AI Convert Clock (ai/ConvertClock) signal to initiate a single A/D
conversion on a single channel. A sample, controlled by the AI Sample
Clock, consists of one or more conversions.
You can specify either an internal or external signal as the source of
ai/ConvertClock. You also can specify whether the measurement sample
begins on the rising edge or falling edge of ai/ConvertClock.
With NI-DAQmx, the driver will choose the fastest conversion rate possible
based on the speed of the A/D converter and add 10 µs of padding between
each channel to allow for adequate settling time. This scheme enables the
channels to approximate simultaneous sampling and still allow for
adequate settling time. If the AI Sample Clock rate is too fast to allow for
this 10 µs of padding, NI-DAQmx will choose the conversion rate so that
the AI Convert Clock pulses are evenly spaced throughout the sample.
To explicitly specify the conversion rate, use the AI Convert Clock Rate
DAQmx Timing property node or function.
Caution Setting the conversion rate higher than the maximum rate specified for your
device will result in errors.
Using an Internal Source
One of the following internal signals can drive ai/ConvertClock:
•
•
AI Convert Clock Timebase (divided down)
Counter n Internal Output
A programmable internal counter divides down the AI Convert Clock
Timebase to generate ai/ConvertClock. The counter is started by
ai/SampleClock and continues to count down to zero, produces an
ai/ConvertClock, reloads itself, and repeats the process until the sample is
finished. It then reloads itself in preparation for the next ai/SampleClock
pulse.
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Using an External Source
Use one of the following external signals as the source of ai/ConvertClock:
•
•
•
Input PFI <0..5>
RTSI <0..7>
PXI_STAR
Routing AI Convert Clock Signal to an Output
Terminal
You can route ai/ConvertClock (as an active low signal) out to any output
PFI <6..9> or RTSI <0..7> terminal.
PFI <0..5> terminals are fixed inputs. PFI <6..9> terminals are fixed
outputs.
Using a Delay from Sample Clock to Convert Clock
When using an internally generated ai/ConvertClock, you also can specify
a configurable delay from ai/SampleClock to the first ai/ConvertClock
pulse within the sample. By default, this delay is three ticks of
ai/ConvertClockTimebase.
Figure 4-12 shows the relationship of ai/SampleClock to ai/ConvertClock.
ai/ConvertClockTimebase
ai/SampleClock
ai/ConvertClock
Delay
From
Convert
Period
Sample
Clock
Figure 4-12. ai/SampleClock and ai/ConvertClock
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Other Timing Requirements
The sample and conversion level timing of M Series devices work such that
clock signals are gated off unless the proper timing requirements are met.
For example, the device ignores both ai/SampleClock and ai/ConvertClock
until it receives a valid ai/StartTrigger signal. When the device recognizes
until it receives the correct number of ai/ConvertClock pulses.
Similarly, the device ignores all ai/ConvertClock pulses until it recognizes
an ai/SampleClock pulse. When the device receives the correct number of
ai/ConvertClock pulses, it ignores subsequent ai/ConvertClock pulses until
it receives another ai/SampleClock. Figure 4-13 shows timing sequences
for a four-channel acquisition (using AI channels 0, 1, 2, and 3) and
demonstrates proper and improper sequencing of ai/SampleClock and
ai/ConvertClock.
It is also possible to use a single external signal to drive both
ai/SampleClock and ai/ConvertClock at the same time. In this mode, each
tick of the external clock will cause a conversion on the ADC. Figure 4-13
shows this timing relationship.
ai/SampleClock
ai/ConvertClock
0 1
2
3
0 1 …
0 1
2
3
Channel Measured
Sample #1 Sample #2 Sample #3
One External Signal Driving Both Clocks
Figure 4-13. Single External Signal Driving ai/SampleClock and ai/ConvertClock
Simultaneously
AI Convert Clock Timebase Signal
The AI Convert Clock Timebase (ai/ConvertClockTimebase) signal is
divided down to provide on of the possible sources for ai/ConvertClock.
Use one of the following signals as the source of
ai/ConvertClockTimebase:
•
•
ai/SampleClockTimebase
20 MHz Timebase
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ai/ConvertClockTimebase is not available as an output on the I/O
connector.
AI Hold Complete Event Signal
The AI Hold Complete Event (ai/HoldCompleteEvent) signal generates a
pulse after each A/D conversion begins. You can route
ai/HoldCompleteEvent out to any output PFI <6..9> or RTSI <0..7>
terminal.
The polarity of ai/HoldCompleteEvent is software-selectable, but is
typically configured so that a low-to-high leading edge can clock external
AI multiplexers indicating when the input signal has been sampled and can
be removed.
AI Start Trigger Signal
Use the AI Start Trigger (ai/StartTrigger) signal to begin a measurement
acquisition. A measurement acquisition consists of one or more samples. If
you do not use triggers, begin a measurement with a software command.
When the acquisition begins, configure the acquisition to stop under the
following conditions:
•
•
•
When a certain number of points are sampled (in finite mode)
After a hardware reference trigger (in finite mode)
With a software command (in continuous mode)
An acquisition that uses a start trigger (but not a reference trigger) is
sometimes referred to as a posttriggered acquisition.
Using a Digital Source
To use ai/StartTrigger with a digital source, specify a source and an edge.
The source can be any of the following signals:
•
•
•
•
Input PFI <0..5>
RTSI <0..7>
Counter n Internal Output
PXI_STAR
The source also can be one of several other internal signals on your DAQ
LabVIEW 8.x Help for more information.
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You also can specify whether the measurement acquisition begins on the
rising edge or falling edge of ai/StartTrigger.
Routing AI Start Trigger to an Output Terminal
You can route ai/StartTrigger out to any output PFI <6..9> or RTSI <0..7>
terminal.
The output is an active high pulse.
The device also uses ai/StartTrigger to initiate pretriggered DAQ
operations. In most pretriggered applications, a software trigger generates
ai/StartTrigger. Refer to the AI Reference Trigger Signal section for a
complete description of the use of ai/StartTrigger and ai/ReferenceTrigger
in a pretriggered DAQ operation.
AI Reference Trigger Signal
Use a reference trigger (ai/ReferenceTrigger) signal to stop a measurement
acquisition. To use a reference trigger, specify a buffer of finite size and a
number of pretrigger samples (samples that occur before the reference
trigger). The number of posttrigger samples (samples that occur after the
reference trigger) desired is the buffer size minus the number of pretrigger
samples.
When the acquisition begins, the DAQ device writes samples to the buffer.
After the DAQ device captures the specified number of pretrigger samples,
the DAQ device begins to look for the reference trigger condition. If the
reference trigger condition occurs before the DAQ device captures the
specified number of pretrigger samples, the DAQ device ignores the
condition.
If the buffer becomes full, the DAQ device continuously discards the oldest
samples in the buffer to make space for the next sample. This data can be
accessed (with some limitations) before the DAQ device discards it. Refer
Continuous?, for more information. To access this KnowledgeBase, go to
ni.com/infoand enter the info code rdcanq.
When the reference trigger occurs, the DAQ device continues to write
samples to the buffer until the buffer contains the number of posttrigger
samples desired. Figure 4-14 shows the final buffer.
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Analog Input
Reference Trigger
Pretrigger Samples
Posttrigger Samples
Complete Buffer
Figure 4-14. Reference Trigger Final Buffer
Using a Digital Source
To use ai/ReferenceTrigger with a digital source, specify a source and an
edge. The source can be any of the following signals:
•
•
•
Input PFI <0..5>
RTSI <0..7>
PXI_STAR
The source also can be one of several internal signals on your DAQ device.
Refer to Device Routing in MAX in the NI-DAQmx Help or the
LabVIEW 8.x Help for more information.
You also can specify whether the measurement acquisition stops on the
rising edge or falling edge of ai/ReferenceTrigger.
Routing AI Reference Trigger Signal to an Output
Terminal
You can route ai/ReferenceTrigger out to any output PFI <6..9> or
RTSI <0..7> terminal.
AI Pause Trigger Signal
You can use the AI Pause Trigger (ai/PauseTrigger) signal to pause and
resume a measurement acquisition. The internal sample clock pauses while
the external trigger signal is active and resumes when the signal is inactive.
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Using a Digital Source
To use ai/SampleClock, specify a source and a polarity. The source can be
any of the following signals:
•
•
•
Input PFI <0..5>
RTSI <0..7>
PXI_STAR
The source also can be one of several other internal signals on your DAQ
device. Refer to Device Routing in MAX in the NI-DAQmx Help or the
LabVIEW 8.x Help for more information.
Routing AI Pause Trigger Signal to an Output
Terminal
You can route ai/PauseTrigger out to RTSI <0..7>.
Note Pause triggers are only sensitive to the level of the source, not the edge.
Getting Started with AI Applications in Software
You can use the M Series device in the following analog input applications.
•
•
•
Single-point analog input
Finite analog input
Continuous analog input
You can perform these applications through DMA, interrupt, or
programmed I/O data transfer mechanisms. Some of the applications also
use start, reference, and pause triggers.
Note For more information about programming analog input applications and triggers in
software, refer to the NI-DAQmx Help or the LabVIEW 8.x Help.
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5
Analog Output
NI 6232/6233 devices have two AO channels that are controlled by a single
clock and are capable of waveform generation.
Figure 5-1 shows the analog output circuitry of NI 6232/6233 devices.
Isolation
Barrier
AO 0
AO 1
DAC0
Digital
Isolators
AO FIFO
AO Data
DAC1
AO Sample Clock
Figure 5-1. NI 6232/6233 Analog Output Circuitry
Analog Output Circuitry
DACs
Digital-to-analog converters (DACs) convert digital codes to analog
voltages.
AO FIFO
The AO FIFO enables analog output waveform generation. It is a
first-in-first-out (FIFO) memory buffer between the computer and the
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Chapter 5
Analog Output
DACs. It allows you to download the points of a waveform to your M Series
device without host computer interaction.
AO Sample Clock
The AO Sample Clock signal reads a sample from the DAC FIFO and
generates the AO voltage.
Isolation Barrier and Digital Isolators
The digital isolators across the isolation barrier provide a ground break
between the isolated analog front end and the earth/chassis/building
ground.
Minimizing Glitches on the Output Signal
When you use a DAC to generate a waveform, you may observe glitches on
the output signal. These glitches are normal; when a DAC switches from
one voltage to another, it produces glitches due to released charges (usually
worst at mid-scale transitions). The largest glitches occur when the most
significant bit of the DAC code changes. You can build a lowpass
deglitching filter to remove some of these glitches, depending on the
frequency and nature of the output signal. Visit ni.com/supportfor more
information on minimizing glitches.
Analog Output Data Generation Methods
When performing an analog output operation, you either can perform
software-timed or hardware-timed generations. Hardware-timed
generations can be non-buffered or buffered.
Software-Timed Generations
With a software-timed generation, software controls the rate at which data
is generated. Software sends a separate command to the hardware to initiate
each DAC conversion. In NI-DAQmx, software-timed generations are
referred to as on-demand timing. Software-timed generations are also
referred to as immediate or static operations. They are typically used for
writing a single value out, such as a constant DC voltage.
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Analog Output
Hardware-Timed Generations
With a hardware-timed generation, a digital hardware signal controls the
rate of the generation. This signal can be generated internally on your
device or provided externally.
Hardware-timed generations have several advantages over software-timed
acquisitions:
•
•
•
The time between samples can be much shorter.
The timing between samples can be deterministic.
Hardware-timed acquisitions can use hardware triggering.
Hardware-timed operations can be buffered or non-buffered. A buffer is a
temporary storage in computer memory for to-be-generated samples.
Non-Buffered
In non-buffered acquisitions, data is written directly to the DACs on the
device. Typically, hardware-timed, non-buffered operations are used to
write single samples with known time increments between them and good
latency.
Buffered
In a buffered acquisition, data is moved from a PC buffer to the onboard
FIFO of the DAQ device using DMA or interrupts before it is written to the
DACs one sample at a time. Buffered acquisitions typically allow for much
faster transfer rates than non-buffered acquisitions because data is moved
in large blocks, rather than one point at a time.
One property of buffered I/O operations is the sample mode. The sample
mode can be either finite or continuous.
Finite sample mode generation refers to the generation of a specific,
predetermined number of data samples. When the specified number of
samples has been written out, the generation stops.
Continuous generation refers to the generation of an unspecified number of
samples. Instead of generating a set number of data samples and stopping,
a continuous generation continues until you stop the operation. There are
several different methods of continuous generation that control what data is
written. These methods are regeneration, FIFO regeneration, and
non-regeneration modes.
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Regeneration is the repetition of the data that is already in the buffer.
Standard regeneration is when data from the PC buffer is continually
downloaded to the FIFO to be written out. New data can be written to the
PC buffer at any time without disrupting the output.
With FIFO regeneration, the entire buffer is downloaded to the FIFO and
regenerated from there. When the data is downloaded, new data cannot be
written to the FIFO. To use FIFO regeneration, the entire buffer must fit
within the FIFO size. The advantage of using FIFO regeneration is that it
does not require communication with the main host memory when the
operation is started, thereby preventing any problems that may occur due to
excessive bus traffic.
With non-regeneration, old data will not be repeated. New data must be
continually written to the buffer. If the program does not write new data to
the buffer at a fast enough rate to keep up with the generation, the buffer
will underflow and cause an error.
Analog Output Triggering
Analog output supports two different triggering actions:
Start trigger
Pause trigger
•
•
A digital trigger can initiate these actions. NI 6232/6233 devices support
digital triggering, but do not support analog triggering. Refer to the AO
Start Trigger Signal and AO Pause Trigger Signal sections for more
information on these triggering actions.
Connecting Analog Voltage Output Signals
AO <0..3> are the voltage output signals for AO channels 0, 1, 2, and 3.
AO GND is the ground reference for AO <0..3>.
Figure 5-2 shows how to make AO connections to the device.
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Chapter 5
Analog Output
AO 0
+
–
Channel 0
Channel 1
V OUT
V OUT
Load
Load
Digital
Isolators
–
+
Isolation
Barrier
AO 1
I/O Connector
AO GND
Figure 5-2. Analog Output Connections
Analog Output Timing Signals
Figure 5-3 summarizes all of the timing options provided by the analog
output timing engine.
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Chapter 5
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PFI, RTSI
PXI_STAR
PFI, RTSI
PXI_STAR
ao/Sample
Clock
ao/Sample
Clock
Ctr n Internal Output
Timebase
Programmable
Clock
20 MHz Timebase
Divider
100 kHz Timebase
PXI_CLK10
Figure 5-3. Analog Output Timing Options
timing signals.
•
•
•
•
AO Start Trigger Signal
AO Pause Trigger Signal
AO Sample Clock Signal
AO Sample Clock Timebase Signal
AO Start Trigger Signal
Use the AO Start Trigger (ao/StartTrigger) signal to initiate a waveform
generation. If you do not use triggers, you can begin a generation with a
software command.
Using a Digital Source
To use ao/StartTrigger, specify a source and an edge. The source can be one
of the following signals:
•
•
•
•
•
A software pulse
Input PFI <0..5>
RTSI <0..7>
ai/ReferenceTrigger
ai/StartTrigger
PXI_STAR
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The source also can be one of several internal signals on your DAQ device.
Refer to Device Routing in MAX in the NI-DAQmx Help or the
LabVIEW 8.x Help for more information.
You also can specify whether the waveform generation begins on the rising
edge or falling edge of ao/StartTrigger.
Routing AO Start Trigger Signal to an Output
Terminal
You can route ao/StartTrigger out to any output PFI <6..9> or RTSI <0..7>
terminal.
The output is an active high pulse.
PFI <0..5> terminals are fixed inputs. PFI <6..9> terminals are fixed
outputs.
AO Pause Trigger Signal
Use the AO Pause Trigger signal (ao/PauseTrigger) to mask off samples in
a DAQ sequence. That is, when ao/PauseTrigger is active, no samples
occur.
not take effect until the beginning of the next sample.
When you generate analog output signals, the generation pauses as soon as
the pause trigger is asserted. If the source of your sample clock is the
onboard clock, the generation resumes as soon as the pause trigger is
deasserted, as shown in Figure 5-4.
Pause Trigger
Sample Clock
Figure 5-4. ao/PauseTrigger with the Onboard Clock Source
If you are using any signal other than the onboard clock as the source of
your sample clock, the generation resumes as soon as the pause trigger is
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Chapter 5
Analog Output
deasserted and another edge of the sample clock is received, as shown in
Figure 5-5.
Pause Trigger
Sample Clock
Figure 5-5. ao/PauseTrigger with Other Signal Source
Using a Digital Source
To use ao/PauseTrigger, specify a source and a polarity. The source can be
one of the following signals:
•
•
•
Input PFI <0..5>
RTSI <0..7>
PXI_STAR
The source also can be one of several other internal signals on your DAQ
device. Refer to Device Routing in MAX in the NI-DAQmx Help or the
LabVIEW 8.x Help for more information.
You also can specify whether the samples are paused when ao/PauseTrigger
is at a logic high or low level.
Routing AO Pause Trigger Signal to an Output
Terminal
You can route ao/PauseTrigger out to RTSI <0..7>.
AO Sample Clock Signal
Use the AO Sample Clock (ao/SampleClock) signal to initiate AO samples.
Each sample updates the outputs of all of the DACs. You can specify an
internal or external source for ao/SampleClock. You also can specify
whether the DAC update begins on the rising edge or falling edge of
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Using an Internal Source
One of the following internal signals can drive ao/SampleClock.
•
•
AO Sample Clock Timebase (divided down)
Counter n Internal Output
A programmable internal counter divides down the AO Sample Clock
Timebase signal.
Using an External Source
Use one of the following external signals as the source of ao/SampleClock:
•
•
•
Input PFI <0..5>
RTSI <0..7>
PXI_STAR
Routing AO Sample Clock Signal to an Output
Terminal
You can route ao/SampleClock (as an active low signal) out to any output
PFI <6..9> or RTSI <0..7> terminal.
Other Timing Requirements
A counter on your device internally generates ao/SampleClock unless you
software or hardware can stop it when a finite generation completes. When
using an internally generated ao/SampleClock, you also can specify a
configurable delay from ao/StartTrigger to the first ao/SampleClock pulse.
By default, this delay is two ticks of ao/SampleClockTimebase.
Figure 5-6 shows the relationship of ao/SampleClock to ao/StartTrigger.
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ao/SampleClockTimebase
ao/StartTrigger
ao/SampleClock
Delay
From
Start
Trigger
Figure 5-6. ao/SampleClock and ao/StartTrigger
AO Sample Clock Timebase Signal
The AO Sample Clock Timebase (ao/SampleClockTimebase) signal is
divided down to provide a source for ao/SampleClock.
You can route any of the following signals to be the AO Sample Clock
Timebase (ao/SampleClockTimebase) signal:
•
•
•
•
•
•
20 MHz Timebase
100 kHz Timebase
PXI_CLK10
Input PFI <0..5>
RTSI <0..7>
PXI_STAR
ao/SampleClockTimebase is not available as an output on the I/O
connector.
You might use ao/SampleClockTimebase if you want to use an external
sample clock signal, but need to divide the signal down. If you want to use
an external sample clock signal but do not need to divide the signal, then
you should use ao/SampleClock rather than ao/SampleClockTimebase.
Getting Started with AO Applications in Software
You can use an M Series device in the following analog output applications.
•
Single-point (on-demand) generation
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•
•
•
Finite generation
Continuous generation
Waveform generation
You can perform these generations through programmed I/O, interrupt, or
DMA data transfer mechanisms. Some of the applications also use start
triggers and pause triggers.
Note For more information about programming analog output applications and triggers in
software, refer to the NI-DAQmx Help or the LabVIEW 8.x Help.
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6
Digital Input and Output
NI 6232/6233 devices have six static digital input lines, P0.<0..5>. These
lines also can be used as PFI inputs.
The voltage input and output levels and the current drive level of the DI and
DO lines are listed in the NI 6232/6233 Specifications. Refer to Chapter 8,
PFI, for more information on PFI inputs and outputs.
I/O Protection
Each DI, DO, and PFI signal is protected against ESD events on
NI 6232/6233 devices. Consult the device specifications for details.
However, you should avoid these fault conditions by following these
guidelines.
•
Do not connect any digital output line to any external signal source,
ground signal, or power supply.
•
Understand the current requirements of the load connected to the
digital output lines. Do not exceed the specified current output limits
of the digital outputs. NI has several signal conditioning solutions for
digital applications requiring high current drive.
•
•
Do not drive the digital input lines with voltages or current outside of
its normal operating range.
Treat the DAQ device as you would treat any static sensitive device.
Always properly ground yourself and the equipment when handling the
DAQ device or connecting to it.
Programmable Power-Up States
By default, the digital output lines (P1.<0..3>/PFI <6..9>) are set to 0. They
can be programmed to power up as 0 or 1.
Refer to the NI-DAQmx Help or the LabVIEW 8.x Help for more
information about setting power-up states in NI-DAQmx or MAX.
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Digital Input and Output
The DI signals P0.<0..5> are referenced to P0.GND and DO signals
P1.<0..3> are referenced to P1.GND.
Figures 6-1 and 6-2 show P0.<0..5> and P1.<0..3> on the NI 6232 and the
NI 6233 device, respectively. Digital input and output signals can range
from 0 to 30 V. Refer to the NI 6232/6233 Specifications for more
information.
P1.VCC
P1.0
P1.<0..3>
Digital
Isolators
P1.1
P1.GND
P1.GND
P0.0
P0.GND
P0.GND
Figure 6-1. NI 6232 Digital I/O Connections (DO Source)
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Digital Input and Output
P1.VCC
P1.0
Buffer
P1.GND
P1.1
P1.<0..3>
Digital
Isolators
P1.GND
P1.GND
P0.0
P0.GND
P0.GND
Figure 6-2. NI 6233 Digital I/O Connections (DO Sink)
Caution Exceeding the maximum input voltage or maximum working voltage ratings,
which are listed in the NI 6232/6233 Specifications, can damage the DAQ device and the
Logic Conventions
With NI 6232/6233 devices, logic “0” means that the Darlington output
switch is open, while logic “1” means closed. Table 6-1 summarizes the
expected behavior.
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Table 6-1. NI 6232/6233 Logic Conventions
Device
Logic
0
1
NI 6232 (Source) DO
NI 6233 (Sink) DO
P1.GND
P1.VCC
P1.VCC
P1.GND
Getting Started with DIO Applications in Software
You can use NI 6232/6233 devices in the following digital I/O applications:
•
•
Static digital input
Static digital output
Note For more information about programming digital I/O applications and triggers in
software, refer to the NI-DAQmx Help or the LabVIEW 8.x Help.
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7
Counters
NI 6232/6233 devices have two general-purpose 32-bit counter/timers and
one frequency generator, as shown in Figure 7-1. The general-purpose
counter/timers can be used for many measurement and pulse generation
applications.
Caution When making measurements, take into account the minimum pulse width and
time delay of the digital input and output lines. Refer to the NI 6238/6239 Specifications
for more information.
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Counters
Input Selection Muxes
Counter 0
Counter 0 Source (Counter 0 Timebase)
Counter 0 Gate
Counter 0 Internal Output
Counter 0 Aux
Counter 0 HW Arm
Counter 0 A
Counter 0 TC
Counter 0 B (Counter 0 Up_Down)
Counter 0 Z
Input Selection Muxes
Counter 1
Counter 1 Source (Counter 1 Timebase)
Counter 1 Gate
Counter 0 Internal Output
Counter 1 Aux
Counter 1 HW Arm
Counter 1 A
Counter 0 TC
Counter 1 B (Counter 1 Up_Down)
Counter 1 Z
Input Selection Muxes
Frequency Generator
Frequency Output Timebase
Freq Out
The counters have seven input signals, although in most applications only
a few inputs are used.
For information on connecting counter signals, refer to the Default Counter
Terminals section.
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Counter Input Applications
Counting Edges
In edge counting applications, the counter counts edges on its Source after
the counter is armed. You can configure the counter to count rising or
falling edges on its Source input. You also can control the direction of
counting (up or down).
The counter values can be read on demand or with a sample clock.
Single Point (On-Demand) Edge Counting
With single point (on-demand) edge counting, the counter counts the
number of edges on the Source input after the counter is armed. On-demand
refers to the fact that software can read the counter contents at any time
without disturbing the counting process. Figure 7-2 shows an example of
single point edge counting.
Counter Armed
SOURCE
Counter Value
0
1
2
3
4
5
Figure 7-2. Single Point (On-Demand) Edge Counting
pause trigger is active, the counter ignores edges on its Source input. When
the pause trigger is inactive, the counter counts edges normally.
You can route the pause trigger to the Gate input of the counter. You can
configure the counter to pause counting when the pause trigger is high or
when it is low. Figure 7-3 shows an example of on-demand edge counting
with a pause trigger.
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Counter Armed
Pause Trigger
(Pause When Low)
SOURCE
0
0
1
2
3
4
5
Counter Value
Figure 7-3. Single Point (On-Demand) Edge Counting with Pause Trigger
Buffered (Sample Clock) Edge Counting
With buffered edge counting (edge counting using a sample clock), the
counter counts the number of edges on the Source input after the counter is
armed. The value of the counter is sampled on each active edge of a sample
clock. A DMA controller transfers the sampled values to host memory.
The count values returned are the cumulative counts since the counter
You can route the counter sample clock to the Gate input of the counter. You
can configure the counter to sample on the rising or falling edge of the
sample clock.
Figure 7-4 shows an example of buffered edge counting. Notice that
counting begins when the counter is armed, which occurs before the first
active edge on Gate.
Counter Armed
Sample Clock
(Sample on Rising Edge)
SOURCE
Counter Value
Buffer
0
1
2
3
4
3
5
6
7
3
6
Figure 7-4. Buffered (Sample Clock) Edge Counting
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Non-Cumulative Buffered Edge Counting
Non-cumulative edge counting is similar to buffered (sample clock) edge
counting. However, the counter resets after each active edge of the Sample
Clock. You can route the Sample Clock to the Gate input of the counter.
Figure 7-5 shows an example of non-cumulative buffered edge counting.
Counter
Armed
Sample Clock
(Sample on Rising Edge)
SOURCE
Counter Value
0
1
2
1
2
3
1
2
3
1
2
2
3
2
3
3
Buffer
Figure 7-5. Non-Cumulative Buffered Edge Counting
Notice that the first count interval begins when the counter is armed, which
occurs before the first active edge on Gate.
Notice that if you are using an external signal as the Source, at least one
Source pulse should occur between each active edge of the Gate signal.
This condition ensures that correct values are returned by the counter. If this
condition is not met, consider using duplicate count prevention.
Controlling the Direction of Counting
In edge counting applications, the counter can count up or down. You can
configure the counter to do the following.
•
•
•
Always count up
Always count down
Count up when the Counter n B input is high; count down when it is
low
For information on connecting counter signals, refer to the Default Counter
Terminals section.
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Pulse-Width Measurement
In pulse-width measurements, the counter measures the width of a pulse on
its Gate input signal. You can configure the counter to measure the width of
high pulses or low pulses on the Gate signal.
You can route an internal or external periodic clock signal (with a known
period) to the Source input of the counter. The counter counts the number
of rising (or falling) edges on the Source signal while the pulse on the Gate
signal is active.
You can calculate the pulse width by multiplying the period of the Source
signal by the number of edges returned by the counter.
A pulse-width measurement will be accurate even if the counter is armed
while a pulse train is in progress. If a counter is armed while the pulse is in
the active state, it will wait for the next transition to the active state to begin
the measurement.
Single Pulse-Width Measurement
edges on the Source input while the Gate input remains active. When the
Gate input goes inactive, the counter stores the count in a hardware save
register and ignores other edges on the Gate and Source inputs. Software
then can read the stored count.
Figure 7-6 shows an example of a single pulse-width measurement.
GATE
SOURCE
Counter Value
0
1
2
HW Save Register
2
Figure 7-6. Single Pulse-Width Measurement
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Buffered Pulse-Width Measurement
Buffered pulse-width measurement is similar to single pulse-width
measurement, but buffered pulse-width measurement takes measurements
over multiple pulses.
The counter counts the number of edges on the Source input while the Gate
input remains active. On each trailing edge of the Gate signal, the counter
stores the count in a hardware save register. A DMA controller transfers the
stored values to host memory.
Figure 7-7 shows an example of a buffered pulse-width measurement.
GATE
SOURCE
0
1
2
3
1
2
Counter Value
Buffer
3
3
2
3
2
Figure 7-7. Buffered Pulse-Width Measurement
Note that if you are using an external signal as the Source, at least one
Source pulse should occur between each active edge of the Gate signal.
This condition ensures that correct values are returned by the counter. If this
condition is not met, consider using duplicate count prevention.
For information on connecting counter signals, refer to the Default Counter
Terminals section.
Period Measurement
In period measurements, the counter measures a period on its Gate input
signal after the counter is armed. You can configure the counter to measure
the period between two rising edges or two falling edges of the Gate input
signal.
You can route an internal or external periodic clock signal (with a known
period) to the Source input of the counter. The counter counts the number
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of rising (or falling) edges occurring on the Source input between the two
active edges of the Gate signal.
You can calculate the period of the Gate input by multiplying the period of
the Source signal by the number of edges returned by the counter.
Single Period Measurement
(or falling) edges on the Source input occurring between two active edges
of the Gate input. On the second active edge of the Gate input, the counter
stores the count in a hardware save register and ignores other edges on the
Gate and Source inputs. Software then can read the stored count.
Figure 7-8 shows an example of a single period measurement.
GATE
SOURCE
Counter Value
0
1
2
3
4
5
HW Save Register
5
Figure 7-8. Single Period Measurement
Buffered Period Measurement
Buffered period measurement is similar to single period measurement, but
buffered period measurement measures multiple periods.
The counter counts the number of rising (or falling) edges on the Source
input between each pair of active edges on the Gate input. At the end of
each period on the Gate signal, the counter stores the count in a hardware
save register. A DMA controller transfers the stored values to host memory.
The counter begins when it is armed. The arm usually occurs in the middle
of a period of the Gate input. So the first value stored in the hardware save
register does not reflect a full period of the Gate input. In most applications,
this first point should be discarded.
Figure 7-9 shows an example of a buffered period measurement.
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Counters
Counter Armed
GATE
SOURCE
Counter Value
1
2
1
2
3
1
2
3
1
2
3
3
2 (Discard)
(Discard)
2 (Discard)
3
3
2
3
Buffer
Figure 7-9. Buffered Period Measurement
Note that if you are using an external signal as the Source, at least one
Source pulse should occur between each active edge of the Gate signal.
This condition ensures that correct values are returned by the counter. If this
condition is not met, consider using duplicate count prevention.
For information on connecting counter signals, refer to the Default Counter
Terminals section.
Semi-Period Measurement
In semi-period measurements, the counter measures a semi-period on its
Gate input signal after the counter is armed. A semi-period is the time
between any two consecutive edges on the Gate input.
You can route an internal or external periodic clock signal (with a known
period) to the Source input of the counter. The counter counts the number
of rising (or falling) edges occurring on the Source input between two
edges of the Gate signal.
You can calculate the semi-period of the Gate input by multiplying the
period of the Source signal by the number of edges returned by the counter.
Single Semi-Period Measurement
Single semi-period measurement is equivalent to single pulse-width
measurement.
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Buffered Semi-Period Measurement
In buffered semi-period measurement, on each edge of the Gate signal, the
counter stores the count in a hardware save register. A DMA controller
transfers the stored values to host memory.
The counter begins counting when it is armed. The arm usually occurs
between edges on the Gate input. So the first value stored in the hardware
save register does not reflect a full semi-period of the Gate input. In most
applications, this first point should be discarded.
Figure 7-10 shows an example of a buffered semi-period measurement.
Counter Armed
GATE
SOURCE
Counter Value
Buffer
0
1
2
1
2
3
1
1
2
1
2
3
2
3
1
2
2
3
1
2
2
3
1
2
Figure 7-10. Buffered Semi-Period Measurement
Note that if you are using an external signal as the Source, at least one
Source pulse should occur between each active edge of the Gate signal.
This condition ensures that correct values are returned by the counter. If this
condition is not met, consider using duplicate count prevention.
For information on connecting counter signals, refer to the Default Counter
Terminals section.
Frequency Measurement
You can use the counters to measure frequency in several different ways.
You can choose one of the following methods depending on your
application.
Method 1—Measure Low Frequency with One
In this method, you measure one period of your signal using a known
timebase. This method is good for low frequency signals.
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route a known timebase (Ft) to the Source of the counter. The known
timebase can be 80MHzTimebase. For signals that might be slower than
0.02 Hz, use a slower known timebase.
You can configure the counter to measure one period of the gate signal. The
frequency of F1 is the inverse of the period. Figure 7-11 illustrates this
method.
Interval Measured
F1
F1
Ft
Gate
1
2
3
…
…
N
Source
Ft
N
Single Period
Measurement
Period of F1 =
Ft
Ft
N
Frequency of F1 =
Figure 7-11. Method 1
Method 1b—Measure Low Frequency with One
Counter (Averaged)
In this method, you measure several periods of your signal using a known
timebase. This method is good for low to medium frequency signals.
You can route the signal to measure (F1) to the Gate of a counter. You can
route a known timebase (Ft) to the Source of the counter. The known
timebase can be 80MHzTimebase. For signals that might be slower than
0.02 Hz, use a slower known timebase.
measurements. Recall that the first period measurement in the buffer should
be discarded.
Average the remaining K period measurements to determine the average
period of F1. The frequency of F1 is the inverse of the average period.
Figure 7-12 illustrates this method.
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Intervals Measured
T1
T2
…
TK
F1
Ft
Gate
F1
Ft
12...N11......N2
…
1......NK
Source
Buffered Period
Measurement
N1 + N2 + …NK
1
×
Average Period of F1 =
Frequency of F1 =
K
Ft
K × Ft
N1 + N2 + …NK
Figure 7-12. Method 1b
Method 2—Measure High Frequency with Two
Counters
In this method, you measure one pulse of a known width using your signal
and derive the frequency of your signal from the result. This method is good
for high frequency signals.
In this method, you route a pulse of known duration (T) to the Gate of a
counter. You can generate the pulse using a second counter. You also can
generate the pulse externally and connect it to a PFI or RTSI terminal. You
Route the signal to measure (F1) to the Source of the counter. Configure the
counter for a single pulse-width measurement. Suppose you measure the
width of pulse T to be N periods of F1. Then the frequency of F1 is N/T.
Figure 7-13 illustrates this method. Another option would be to measure
the width of a known period instead of a known pulse.
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Width of Pulse (T)
Pulse
Pulse
F1
Gate
1
2
…
N
Source
F1
N
Pulse-Width
Measurement
Width of
Pulse
T =
F1
N
T
Frequency of F1 =
Figure 7-13. Method 2
Method 3—Measure Large Range of Frequencies
Using Two Counters
By using two counters, you can accurately measure a signal that might be
high or low frequency. This technique is called reciprocal frequency
measure. You then measure the long pulse with a known timebase. The
M Series device can measure this long pulse more accurately than the faster
input signal.
You can route the signal to measure to the Source input of Counter 0, as
shown in Figure 7-14. Assume this signal to measure has frequency F1.
Configure Counter 0 to generate a single pulse that is the width of N periods
of the source input signal.
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Signal to
Measure (F1)
SOURCE
COUNTER 0
OUT
Signal of Known
Frequency (F2)
SOURCE
OUT
COUNTER 1
GATE
2
0
1
3
… N
CTR_0_SOURCE
(Signal to Measure)
CTR_0_OUT
(CTR_1_GATE)
Interval
to Measure
CTR_1_SOURCE
Figure 7-14. Method 3
Then route the Counter 0 Internal Output signal to the Gate input of
Counter 1. You can route a signal of known frequency (F2) to the Counter
1 Source input. F2 can be 80MHzTimebase. For signals that might be
slower than 0.02 Hz, use a slower known timebase. Configure Counter 1 to
perform a single pulse-width measurement. Suppose the result is that the
pulse width is J periods of the F2 clock.
From Counter 0, the length of the pulse is N/F1. From Counter 1, the length
of the same pulse is J/F2. Therefore, the frequency of F1 is given by
F1 = F2 * (N/J).
Choosing a Method for Measuring Frequency
The best method to measure frequency depends on several factors including
the expected frequency of the signal to measure, the desired accuracy, how
many counters are available, and how long the measurement can take.
Method 1 uses only one counter. It is a good method for many
applications. However, the accuracy of the measurement decreases as
the frequency increases.
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Consider a frequency measurement on a 50 kHz signal using an
80 MHz Timebase. This frequency corresponds to 1600 cycles of the
80 MHz Timebase. Your measurement may return 1600 1 cycles
depending on the phase of the signal with respect to the timebase. As
your frequency becomes larger, this error of 1 cycle becomes more
significant. Table 7-1 illustrates this point.
Table 7-1. Frequency Measurement Method 1
Task
Equation
Example 1
50 kHz
Example 2
5 MHz
Actual Frequency to Measure
Timebase Frequency
F1
Ft
80 MHz
1600
80 MHz
16
Actual Number of Timebase
Periods
Ft/F1
Worst Case Measured Number of (Ft/F1) – 1
Timebase Periods
1599
15
Measured Frequency
Error
Ft F1/(Ft – F1)
50.125 kHz
125 kHz
0.06%
5.33 MHz
333 kHz
6.67%
[Ft F1/(Ft – F1)] – F1
[Ft/(Ft – F1)] – 1
Error %
•
•
Method 1b (measuring K periods of F1) improves the accuracy of the
measurement. A disadvantage of Method 1b is that you have to take
K + 1 measurements. These measurements take more time and
consume some of the available PCI or PXI bandwidth.
Method 2 is accurate for high frequency signals. However, the
accuracy decreases as the frequency of the signal to measure
decreases. At very low frequencies, Method 2 may be too inaccurate
for your application. Another disadvantage of Method 2 is that it
known width). An advantage of Method 2 is that the measurement
completes in a known amount of time.
•
Method 3 measures high and low frequency signals accurately.
However, it requires two counters.
Table 7-2 summarizes some of the differences in methods of measuring
frequency.
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Table 7-2. Frequency Measurement Method Comparison
Measures High
Frequency
Signals
Measures Low
Frequency
Signals
Number of
Measurements
Returned
Number of
Counters Used
Method
Accurately
Accurately
1
1b
2
1
1
1
Many
1
Poor
Fair
Good
Good
Poor
1 or 2
2
Good
Good
3
1
Good
For information on connecting counter signals, refer to the Default Counter
Terminals section.
Position Measurement
You can use the counters to perform position measurements with
quadrature encoders or two-pulse encoders. You can measure angular
position with X1, X2, and X4 angular encoders. Linear position can be
measured with two-pulse encoders. You can choose to do either a single
point (on-demand) position measurement or a buffered (sample clock)
position measurement. You must arm a counter to begin position
measurements.
Measurements Using Quadrature Encoders
The counters can perform measurements of quadrature encoders that use
X1, X2, or X4 encoding.
A quadrature encoder can have up to three channels—channels A, B, and Z.
X1 Encoding
When channel A leads channel B in a quadrature cycle, the counter
increments. When channel B leads channel A in a quadrature cycle, the
counter decrements. The amount of increments and decrements per cycle
depends on the type of encoding—X1, X2, or X4.
Figure 7-15 shows a quadrature cycle and the resulting increments and
decrements for X1 encoding. When channel A leads channel B, the
increment occurs on the rising edge of channel A. When channel B leads
channel A, the decrement occurs on the falling edge of channel A.
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Ch A
Ch B
Counter Value
6
7
7
6
5
5
Figure 7-15. X1 Encoding
X2 Encoding
The same behavior holds for X2 encoding except the counter increments or
decrements on each edge of channel A, depending on which channel leads
the other. Each cycle results in two increments or decrements, as shown in
Figure 7-16.
Ch A
Ch B
Counter Value
5
6
7
8
9
9
8
7
6
5
Figure 7-16. X2 Encoding
X4 Encoding
Similarly, the counter increments or decrements on each edge of
channels A and B for X4 encoding. Whether the counter increments or
decrements depends on which channel leads the other. Each cycle results in
four increments or decrements, as shown in Figure 7-17.
Ch A
Ch B
Counter Value
5
6
7
8
9
10 11 12 13 13 12 11 10
9
8
7
6
5
Figure 7-17. X4 Encoding
Channel Z Behavior
Some quadrature encoders have a third channel, channel Z, which is also
referred to as the index channel. A high level on channel Z causes the
counter to be reloaded with a specified value in a specified phase of the
quadrature cycle. You can program this reload to occur in any one of the
four phases in a quadrature cycle.
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Channel Z behavior—when it goes high and how long it stays
high—differs with quadrature encoder designs. You must refer to the
with respect to channels A and B. You must then ensure that channel Z is
high during at least a portion of the phase you specify for reload. For
instance, in Figure 7-18, channel Z is never high when channel A is high
and channel B is low. Thus, the reload must occur in some other phase.
low. The reload occurs when this phase is true and channel Z is high.
Incrementing and decrementing takes priority over reloading. Thus, when
the channel B goes low to enter the reload phase, the increment occurs first.
The reload occurs within one maximum timebase period after the reload
phase becomes true. After the reload occurs, the counter continues to count
as before. Figure 7-18 illustrates channel Z reload with X4 decoding.
Ch A
Ch B
Ch Z
Max Timebase
Counter Value
5
6
7
8
9
0
1
2
3
4
A = 0
B = 0
Z = 1
Figure 7-18. Channel Z Reload with X4 Decoding
Measurements Using Two Pulse Encoders
The counter supports two pulse encoders that have two channels—channels
A and B.
The counter increments on each rising edge of channel A. The counter
decrements on each rising edge of channel B, as shown in Figure 7-19.
Ch A
Ch B
Counter Value 2
3
4
5
4
3
4
Figure 7-19. Measurements Using Two Pulse Encoders
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For information on connecting counter signals, refer to the Default Counter
Terminals section.
Two-Signal Edge-Separation Measurement
Two-signal edge-separation measurement is similar to pulse-width
measurement, except that there are two measurement signals—Aux and
Gate. An active edge on the Aux input starts the counting and an active edge
on the Gate input stops the counting. You must arm a counter to begin a two
edge separation measurement.
After the counter has been armed and an active edge occurs on the Aux
input, the counter counts the number of rising (or falling) edges on the
Source. The counter ignores additional edges on the Aux input.
The counter stops counting upon receiving an active edge on the Gate input.
The counter stores the count in a hardware save register.
You can configure the rising or falling edge of the Aux input to be the active
edge. You can configure the rising or falling edge of the Gate input to be
the active edge.
Use this type of measurement to count events or measure the time that
occurs between edges on two signals. This type of measurement is
sometimes referred to as start/stop trigger measurement, second gate
measurement, or A-to-B measurement.
Single Two-Signal Edge-Separation Measurement
the number of rising (or falling) edges on the Source input occurring
between an active edge of the Gate signal and an active edge of the Aux
signal. The counter then stores the count in a hardware save register and
ignores other edges on its inputs. Software then can read the stored count.
Figure 7-20 shows an example of a single two-signal edge-separation
measurement.
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Counter
Armed
Measured Interval
AUX
GATE
SOURCE
Counter Value
0
0
0
0
1
2
3
4
5
6
7
8
8
8
HW Save Register
8
Figure 7-20. Single Two-Signal Edge-Separation Measurement
Buffered Two-Signal Edge-Separation Measurement
Buffered and single two-signal edge-separation measurements are similar,
but buffered measurement measures multiple intervals.
The counter counts the number of rising (or falling) edges on the Source
input occurring between an active edge of the Gate signal and an active
edge of the Aux signal. The counter then stores the count in a hardware save
register. On the next active edge of the Gate signal, the counter begins
another measurement. A DMA controller transfers the stored values to host
memory.
Figure 7-21 shows an example of a buffered two-signal edge-separation
measurement.
AUX
GATE
SOURCE
Counter Value
1
2
3
1
2
3
1
2
3
3
3
3
3
3
3
Figure 7-21. Buffered Two-Signal Edge-Separation Measurement
For information on connecting counter signals, refer to the Default Counter
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Counter Output Applications
Simple Pulse Generation
Single Pulse Generation
The counter can output a single pulse. The pulse appears on the Counter n
Internal Output signal of the counter.
You can specify a delay from when the counter is armed to the beginning
of the pulse. The delay is measured in terms of a number of active edges of
the Source input.
You can specify a pulse width. The pulse width is also measured in terms
of a number of active edges of the Source input. You also can specify the
active edge of the Source input (rising or falling).
Figure 7-22 shows a generation of a pulse with a pulse delay of four and a
pulse width of three (using the rising edge of Source).
Counter Armed
SOURCE
OUT
Figure 7-22. Single Pulse Generation
Single Pulse Generation with Start Trigger
The counter can output a single pulse in response to one pulse on a
hardware Start Trigger signal. The pulse appears on the Counter n Internal
Output signal of the counter.
You can route the Start Trigger signal to the Gate input of the counter. You
can specify a delay from the Start Trigger to the beginning of the pulse. You
in terms of a number of active edges of the Source input.
After the Start Trigger signal pulses once, the counter ignores the Gate
input.
Figure 7-23 shows a generation of a pulse with a pulse delay of four and a
pulse width of three (using the rising edge of Source).
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GATE
(Start Trigger)
SOURCE
OUT
Figure 7-23. Single Pulse Generation with Start Trigger
Retriggerable Single Pulse Generation
The counter can output a single pulse in response to each pulse on a
hardware Start Trigger signal. The pulses appear on the Counter n Internal
Output signal of the counter.
You can route the Start Trigger signal to the Gate input of the counter. You
can specify a delay from the Start Trigger to the beginning of each pulse.
You also can specify the pulse width. The delay and pulse width are
measured in terms of a number of active edges of the Source input.
The counter ignores the Gate input while a pulse generation is in progress.
After the pulse generation is finished, the counter waits for another Start
Trigger signal to begin another pulse generation.
Figure 7-24 shows a generation of two pulses with a pulse delay of five and
a pulse width of three (using the rising edge of Source).
GATE
(Start Trigger)
SOURCE
Figure 7-24. Retriggerable Single Pulse Generation
For information on connecting counter signals, refer to the Default Counter
Terminals section.
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Pulse Train Generation
Continuous Pulse Train Generation
This function generates a train of pulses with programmable frequency and
duty cycle. The pulses appear on the Counter n Internal Output signal of the
counter.
You can specify a delay from when the counter is armed to the beginning
of the pulse train. The delay is measured in terms of a number of active
edges of the Source input.
You specify the high and low pulse widths of the output signal. The pulse
widths are also measured in terms of a number of active edges of the Source
input. You also can specify the active edge of the Source input (rising or
falling).
The counter can begin the pulse train generation as soon as the counter is
armed, or in response to a hardware Start Trigger. You can route the Start
You also can use the Gate input of the counter as a Pause Trigger (if it is not
used as a Start Trigger). The counter pauses pulse generation when the
Pause Trigger is active.
Figure 7-25 shows a continuous pulse train generation (using the rising
edge of Source).
SOURCE
OUT
Counter Armed
Figure 7-25. Continuous Pulse Train Generation
If the high and low pulse widths of the output signal are M and N periods,
then the frequency of the Counter n Internal Output signal is equal to the
frequency of the Source input divided by M + N.
For information on connecting counter signals, refer to the Default Counter
Terminals section.
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Frequency Generation
You can generate a frequency by using a counter in pulse train generation
mode or by using the frequency generator circuit.
The frequency generator can output a square wave at many different
frequencies. The frequency generator is independent of the two
general-purpose 32-bit counter/timer modules on M Series devices.
Figure 7-26 shows a block diagram of the frequency generator.
Frequency
Output
Timebase
20 MHz Timebase
100 kHz Timebase
÷ 2
Frequency Generator
Freq Out
Divisor
(1–16)
Figure 7-26. Frequency Generator Block Diagram
The frequency generator generates the Frequency Output signal. The
Frequency Output signal is the Frequency Output Timebase divided by a
number you select from 1 to 16. The Frequency Output Timebase can be
either the 20 MHz Timebase divided by 2 or the 100 kHz Timebase.
The duty cycle of Frequency Output is 50% if the divider is either 1 or an
even number. For an odd divider, suppose the divider is set to D. In this
case, Frequency Output is low for (D + 1)/2 cycles and high for (D – 1)/2
cycles of the Frequency Output Timebase.
Figure 7-27 shows the output waveform of the frequency generator when
the divider is set to 5.
Frequency
Output
Timebase
Freq Out
Figure 7-27. Frequency Generator Output Waveform
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Frequency Output can be routed out to any output PFI <6..9> or
RTSI <0..7> terminal. All PFI terminals are set to high-impedance at
In software, program the frequency generator as you would program one of
the counters for pulse train generation.
For information on connecting counter signals, refer to the Default Counter
Terminals section.
The counters can generate a signal with a frequency that is a fraction of an
input signal. This function is equivalent to continuous pulse train
generation.
For information on connecting counter signals, refer to the Default Counter
Terminals section.
Pulse Generation for ETS
In this application, the counter produces a pulse on the output a specified
delay after an active edge on Gate. After each active edge on Gate, the
counter cumulatively increments the delay between the Gate and the pulse
on the output by a specified amount. Thus, the delay between the Gate and
the pulse produced successively increases.
Note ETS = Equivalent Time Sampling.
The increase in the delay value can be between 0 and 255. For instance, if
you specify the increment to be 10, the delay between the active Gate edge
and the pulse on the output will increase by 10 every time a new pulse is
generated.
Suppose you program your counter to generate pulses with a delay of 100
and pulse width of 200 each time it receives a trigger. Furthermore, suppose
you specify the delay increment to be 10. On the first trigger, your pulse
delay will be 100, on the second it will be 110, on the third it will be 120;
the process will repeat in this manner until the counter is disarmed. The
counter ignores any Gate edge that is received while the pulse triggered by
the previous Gate edge is in progress.
The waveform thus produced at the output of the counter can be used to
provide timing for undersampling applications where a digitizing system
can sample repetitive waveforms that are higher in frequency than the
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Nyquist frequency of the system. Figure 7-28 shows an example of pulse
generation for ETS; the delay from the trigger to the pulse increases after
each subsequent Gate active edge.
GATE
OUT
D1
D2 = D1 + ΔD
D3 = D1 + 2ΔD
Figure 7-28. Pulse Generation for ETS
For information on connecting counter signals, refer to the Default Counter
Terminals section.
Counter Timing Signals
M Series devices feature the following counter timing signals.
•
•
•
•
•
•
•
•
•
•
•
Counter n Source
Counter n Gate
Counter n Aux
Counter n A
Counter n B
Counter n Z
Counter n Up_Down
Counter n HW Arm
Counter n Internal Output
Counter n TC
Frequency Output
In this section, n refers to either Counter 0 or 1. For example, Counter n
Source refers to two signals—Counter 0 Source (the source input to
Counter 0) and Counter 1 Source (the source input to Counter 1).
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Counter n Source Signal
The selected edge of the Counter n Source signal increments and
decrements the counter value depending on the application the counter is
performing. Table 7-3 lists how this terminal is used in various
applications.
Table 7-3. Counter Applications and Counter n Source
Application
Pulse Generation
Purpose of Source Terminal
Counter Timebase
One Counter Time Measurements Counter Timebase
Two Counter Time Measurements Input Terminal
Non-Buffered Edge Counting
Buffered Edge Counting
Two-Edge Separation
Input Terminal
Input Terminal
Counter Timebase
Routing a Signal to Counter n Source
Each counter has independent input selectors for the Counter n Source
signal. Any of the following signals can be routed to the Counter n Source
input.
•
•
•
•
•
•
•
80 MHz Timebase
20 MHz Timebase
100 kHz Timebase
RTSI <0..7>
Input PFI <0..5>
PXI_CLK10
PXI_STAR
In addition, Counter 1 TC or Counter 1 Gate can be routed to
Counter 0 Source. Counter 0 TC or Counter 0 Gate can be routed to
Counter 1 Source.
Some of these options may not be available in some driver software.
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Routing Counter n Source to an Output Terminal
You can route Counter n Source out to any output PFI <6..9> or
RTSI <0..7> terminal. All PFIs are set to high-impedance at startup.
Counter n Gate Signal
The Counter n Gate signal can perform many different operations
depending on the application including starting and stopping the counter,
and saving the counter contents.
Routing a Signal to Counter n Gate
Each counter has independent input selectors for the Counter n Gate signal.
Any of the following signals can be routed to the Counter n Gate input.
•
•
•
•
•
•
•
•
RTSI <0..7>
Input PFI <0..5>
ai/ReferenceTrigger
ai/StartTrigger
ai/SampleClock
ai/ConvertClock
ao/SampleClock
PXI_STAR
In addition, Counter 1 Internal Output or Counter 1 Source can be routed to
Counter 0 Gate. Counter 0 Internal Output or Counter 0 Source can be
routed to Counter 1 Gate.
Some of these options may not be available in some driver software.
Routing Counter n Gate to an Output Terminal
You can route Counter n Gate out to any output PFI <6..9> or RTSI <0..7>
terminal. All PFIs are set to high-impedance at startup.
Counter n Aux Signal
The Counter n Aux signal indicates the first edge in a two-signal
edge-separation measurement.
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Routing a Signal to Counter n Aux
Each counter has independent input selectors for the Counter n Aux signal.
Any of the following signals can be routed to the Counter n Aux input.
•
•
•
•
•
RTSI <0..7>
Input PFI <0..5>
ai/ReferenceTrigger
ai/StartTrigger
PXI_STAR
In addition, Counter 1 Internal Output, Counter 1 Gate, Counter 1 Source,
or Counter 0 Gate can be routed to Counter 0 Aux. Counter 0 Internal
Output, Counter 0 Gate, Counter 0 Source, or Counter 1 Gate can be routed
to Counter 1 Aux.
Some of these options may not be available in some driver software.
Counter n A, Counter n B, and Counter n Z Signals
Counter n B can control the direction of counting in edge counting
applications.
Use the A, B, and Z inputs to each counter when measuring quadrature
encoders or measuring two pulse encoders.
Routing Signals to A, B, and Z Counter Inputs
Each counter has independent input selectors for each of the A, B, and Z
inputs. Any of the following signals can be routed to each input.
•
•
•
RTSI <0..7>
Input PFI <0..5>
PXI_STAR
Routing Counter n Z Signal to an Output Terminal
You can route Counter n Z out to RTSI <0..7>.
Counter n Up_Down Signal
Counter n Up_Down is another name for the Counter n B signal.
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Counter n HW Arm Signal
The Counter n HW Arm signal enables a counter to begin an input or output
function.
To begin any counter input or output function, you must first enable, or arm,
the counter. In some applications, such as buffered semi-period
measurement, the counter begins counting when it is armed. In other
applications, such as single pulse-width measurement, the counter begins
waiting for the Gate signal when it is armed. Counter output operations can
use the arm signal in addition to a start trigger.
Software can arm a counter or configure counters to be armed on a
hardware signal. Software calls this hardware signal the Arm Start Trigger.
Internally, software routes the Arm Start Trigger to the Counter n HW Arm
input of the counter.
Routing Signals to Counter n HW Arm Input
Any of the following signals can be routed to the Counter n HW Arm input.
•
•
•
•
•
RTSI <0..7>
Input PFI <0..5>
ai/ReferenceTrigger
ai/StartTrigger
PXI_STAR
Counter 1 Internal Output can be routed to Counter 0 HW Arm. Counter 0
Internal Output can be routed to Counter 1 HW Arm.
Some of these options may not be available in some driver software.
Counter n Internal Output and Counter n TC Signals
Counter n TC is an internal signal that asserts when the counter value is 0.
The Counter n Internal Output signal changes in response to Counter n TC.
The two software-selectable output options are pulse on TC and toggle
output polarity on TC. The output polarity is software-selectable for both
options.
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Routing Counter n Internal Output to an Output
Terminal
You can route Counter n Internal Output to any output PFI <6..9> or
RTSI <0..7> terminal. All output PFIs are set to high-impedance at startup.
Frequency Output Signal
The Frequency Output (FREQ OUT) signal is the output of the frequency
output generator.
Routing Frequency Output to a Terminal
You can route Frequency Output to any output PFI <6..9> terminal. All
PFIs are set to high-impedance at startup.
Default Counter Terminals
By default, NI-DAQmx routes the counter/timer inputs and outputs to the
PFI pins, shown in Table 7-4.
Table 7-4. NI 6232/6233 Device Default NI-DAQmx Counter/Timer Pins
Counter/Timer Signal
CTR 0 SRC
Default Pin Number (Name)
13 (PFI 0)
Port
P0.0
P0.1
P0.2
P1.0
P0.0
P0.1
P0.2
P0.3
P0.4
P0.5
P1.1
P0.3
P0.4
P0.5
CTR 0 GATE
CTR 0 AUX
CTR 0 OUT
CTR 0 A
32 (PFI 1)
33 (PFI 2)
17 (PFI 6)
13 (PFI 0)
CTR 0 Z
32 (PFI 1)
CTR 0 B
33 (PFI 2)
CTR 1 SRC
CTR 1 GATE
CTR 1 AUX
CTR 1 OUT
CTR 1 A
15 (PFI 3)
34 (PFI 4)
16 (PFI 5)
36 (PFI 7)
15 (PFI 3)
CTR 1 Z
34 (PFI 4)
CTR 1 B
16 (PFI 5)
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You can use these defaults or select other sources and destinations for the
counter/timer signals in NI-DAQmx. Refer to Connecting Counter Signals
in the NI-DAQmx Help or the LabVIEW 8.x Help for more information on
how to connect your signals for common counter measurements and
generations. M Series default PFI lines for counter functions are listed in
Physical Channels in the NI-DAQmx Help or the LabVIEW 8.x Help.
Counter Triggering
Counters support three different triggering actions—arm start, start, and
pause.
Arm Start Trigger
To begin any counter input or output function, you must first enable, or arm,
the counter. Software can arm a counter or configure counters to be armed
on a hardware signal. Software calls this hardware signal the Arm Start
Trigger. Internally, software routes the Arm Start Trigger to the Counter n
HW Arm input of the counter.
For counter output operations, you can use it in addition to the start and
pause triggers. For counter input operations, you can use the arm start
trigger to have start trigger-like behavior. The arm start trigger can be used
for synchronizing multiple counter input and output tasks.
Start Trigger
For counter output operations, a start trigger can be configured to begin a
finite or continuous pulse generation. When a continuous generation has
triggered, the pulses continue to generate until you stop the operation in
software. For finite generations, the specified number of pulses is generated
and the generation stops unless you use the retriggerable attribute. When
you use this attribute, subsequent start triggers cause the generation to
restart.
When using a start trigger, the start trigger source is routed to the Counter
n Gate signal input of the counter.
Counter input operations can use the arm start trigger to have start
trigger-like behavior.
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Pause Trigger
You can use pause triggers in edge counting and continuous pulse
generation applications. For edge counting acquisitions, the counter stops
counting edges while the external trigger signal is low and resumes when
the signal goes high or vice versa. For continuous pulse generations, the
counter stops generating pulses while the external trigger signal is low and
resumes when the signal goes high or vice versa.
When using a pause trigger, the pause trigger source is routed to the
Counter n Gate signal input of the counter.
Other Counter Features
Cascading Counters
signal of each counter to the Gate inputs of the other counter. By cascading
two counters together, you can effectively create a 64-bit counter. By
cascading counters, you also can enable other applications. For example, to
improve the accuracy of frequency measurements, use reciprocal frequency
measurement, as described in the Method 3—Measure Large Range of
Frequencies Using Two Counters section.
Counter Filters
You can enable a programmable debouncing filter on each PFI, RTSI, or
PXI_STAR signal. When the filters are enabled, your device samples the
input on each rising edge of a filter clock. M Series devices use an onboard
oscillator to generate the filter clock with a 40 MHz frequency.
Note NI-DAQmx supports only filters on counter inputs.
The following is an example of low-to-high transitions of the input signal.
High-to-low transitions work similarly.
Assume that an input terminal has been low for a long time. The input
terminal then changes from low-to-high, but glitches several times. When
the filter clock has sampled the signal high on N consecutive edges, the
low-to-high transition is propagated to the rest of the circuit. The value of
N depends on the filter setting; refer to Table 7-5.
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Table 7-5. Filters
N (Filter
Pulse Width
Pulse Width
ClocksNeeded Guaranteedto Guaranteedto
Filter Setting
125 ns
to Pass Signal)
Pass Filter
125 ns
Not Pass Filter
100 ns
5
257
6.425 µs
2.55 ms
6.425 µs
2.55 ms
—
6.400 µs
2.54 ms
—
~101,800
—
Disabled
The filter setting for each input can be configured independently. On power
up, the filters are disabled. Figure 7-29 shows an example of a low-to-high
transition on an input that has its filter set to 125 ns (N = 5).
RTSI, PFI, or
Filtered input goes high
when terminal is sampled
high on five consecutive
filter clocks.
PXI_STAR Terminal
1
1
2
3
4
1
2
3
4
5
Filter Clock
(40 MHz)
Filtered Input
Figure 7-29. Filter Example
Enabling filters introduces jitter on the input signal. For the 125 ns and
6.425 µs filter settings, the jitter is up to 25 ns. On the 2.55 ms setting, the
jitter is up to 10.025 µs.
When a PFI input is routed directly to RTSI, or a RTSI input is routed
directly to PFI, the M Series device does not use the filtered version of the
input signal.
Refer to the KnowledgeBase document, Digital Filtering with M Series
and CompactDAQ, for more information about digital filters and counters.
To access this KnowledgeBase, go to ni.com/infoand enter the info
code rddfms.
Prescaling allows the counter to count a signal that is faster than the
maximum timebase of the counter. M Series devices offer 8X and 2X
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Chapter 7
Counters
prescaling on each counter (prescaling can be disabled). Each prescaler
consists of a small, simple counter that counts to eight (or two) and rolls
over. This counter can run faster than the larger counters, which simply
count the rollovers of this smaller counter. Thus, the prescaler acts as a
frequency divider on the Source and puts out a frequency that is one-eighth
(or one-half) of what it is accepting.
External Signal
Prescaler Rollover
(Used as Source
by Counter)
Counter Value
0
1
Figure 7-30. Prescaling
Prescaling is intended to be used for frequency measurement where the
measurement is made on a continuous, repetitive signal. The prescaling
counter cannot be read; therefore, you cannot determine how many edges
have occurred since the previous rollover. Prescaling can be used for event
counting provided it is acceptable to have an error of up to seven (or one).
Prescaling can be used when the counter Source is an external signal.
Prescaling is not available if the counter Source is one of the internal
timebases (80MHzTimebase, 20MHzTimebase, or 100kHzTimebase).
Duplicate Count Prevention
Duplicate count prevention (or synchronous counting mode) ensures that a
counter returns correct data in applications that use a slow or non-periodic
external source. Duplicate count prevention applies only to buffered
buffered applications, the counter should store the number of times an
external Source pulses between rising edges on the Gate signal.
Duplicate Count Prevention Example
Figure 7-31 shows an external buffered signal as the period measurement
Source.
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Chapter 7
Counters
Rising Edge
of Gate
Counter detects rising edge
of Gate on the next rising
edge of Source.
Gate
Source
Counter Value
Buffer
6
7
1
2
1
7
2
7
Figure 7-31. Duplicate Count Prevention Example
On the first rising edge of the Gate, the current count of 7 is stored. On the
next rising edge of the Gate, the counter stores a 2 since two Source pulses
occurred after the previous rising edge of Gate.
The counter synchronizes or samples the Gate signal with the Source
signal, so the counter does not detect a rising edge in the Gate until the next
Source pulse. In this example, the counter stores the values in the buffer on
the first rising Source edge after the rising edge of Gate. The details of
the synchronization mode. Synchronization modes are described in the
Synchronization Modes section.
Duplicate Count Example
In Figure 7-32, after the first rising edge of Gate, no Source pulses occur.
So the counter does not write the correct data to the buffer.
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Chapter 7
Counters
No Source edge, so no
value written to buffer.
Gate
Source
Counter Value
Buffer
6
7
1
7
Figure 7-32. Duplicate Count Example
Example Application That Prevents Duplicate Count
With duplicate count prevention enabled, the counter synchronizes both the
Source and Gate signals to the 80 MHz Timebase. By synchronizing to the
timebase, the counter detects edges on the Gate even if the Source does not
pulse. This enables the correct current count to be stored in the buffer even
if no Source edges occur between Gate signals, as shown in Figure 7-33.
Counter detects
rising Gate edge.
Counter value
increments only
one time for each
Source pulse.
Gate
Source
80 MHz Timebase
Counter Value
Buffer
6
7
0
1
7
0
7
Figure 7-33. Duplicate Count Prevention Example
Even if the Source pulses are long, the counter increments only once for
each Source pulse.
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Chapter 7
Counters
Normally, the counter value and Counter n Internal Output signals change
synchronously to the Source signal. With duplicate count prevention, the
counter value and Counter n Internal Output signals change synchronously
to the 80 MHz Timebase.
Note that duplicate count prevention should only be used if the frequency
of the Source signal is 20 MHz or less.
When To Use Duplicate Count Prevention
You should use duplicate count prevention if the following conditions are
true.
•
•
You are making a counter measurement
You are using an external signal (such as PFI <0..5>) as the counter
Source
•
•
The frequency of the external source is 20 MHz or less
You can have the counter value and output to change synchronously
with the 80 MHz Timebase
In all other cases, you should not use duplicate count prevention.
Enabling Duplicate Count Prevention in NI-DAQmx
You can enable duplicate count prevention in NI-DAQmx by setting the
Enable Duplicate Count Prevention attribute/property. For specific
information on finding the Enable Duplicate Count Prevention
attribute/property, refer to the help file for the API you are using.
Synchronization Modes
The 32-bit counter counts up or down synchronously with the Source
signal. The Gate signal and other counter inputs are asynchronous to the
Source signal, so M Series devices synchronize these signals before
presenting them to the internal counter.
M Series devices use one of three synchronization methods:
•
•
•
80 MHz source mode
Other internal source mode
External source mode
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In DAQmx, the device uses 80 MHz source mode if the user performs the
following:
•
•
Performs a position measurement
Selects duplicate count prevention
Otherwise, the mode depends on the signal that drives Counter n Source.
Table 7-6 describes the conditions for each mode.
Table 7-6. Synchronization Mode Conditions
Duplicate
Count
Prevention
Enabled
SignalDriving
Counter n
Source
Type of
Measurement
Synchronizati
on Mode
Yes
No
Any
Any
Any
80 MHz Source
80 MHz Source
Position
Measurement
No
No
Any
80 MHz
Timebase
80 MHz Source
All Except
Position
Measurement
20 MHz
Other Internal
Source
Timebase, 100
kHz Timebase,
or PXI_CLK10
No
All Except
Position
Any Other
Signal (such as Source
PFI or RTSI)
External
80 MHz Source Mode
In 80 MHz source mode, the device synchronizes signals on the rising edge
of the source, and counts on the following rising edge of the source, as
shown in Figure 7-34.
Source
Synchronize
Count
Figure 7-34. 80 MHz Source Mode
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Other Internal Source Mode
In other internal source mode, the device synchronizes signals on the
falling edge of the source, and counts on the following rising edge of the
source, as shown in Figure 7-35.
Source
Synchronize
Count
Figure 7-35. Other Internal Source Mode
External Source Mode
In external source mode, the device generates a delayed Source signal by
delaying the Source signal by several nanoseconds. The device
synchronizes signals on the rising edge of the delayed Source signal, and
counts on the following rising edge of the source, as shown in Figure 7-36.
Source
Synchronize
Delayed Source
Count
Figure 7-36. External Source Mode
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8
PFI
NI 6232/6233 devices have 10 Programmable Function Interface (PFI)
signals—six input signals and four output signals.
Each PFI <0..5>/P0.<0..5> can be configured as a timing input signal for
AI or counter/timer functions or a static digital input. Each PFI input also
Caution When making measurements, take into account the minimum pulse width and
time delay of the digital input and output lines. Refer to the NI 6238/6239 Specifications
for more information.
Figure 8-1 shows the circuitry of one PFI input line. Each PFI line is
similar.
Isolation
Barrier
Static DI
Digital
Isolators
PFI <0..5>/P0.<0..5>
I/O Protection
To Input Timing
Signal Selectors
PFI
Filters
Figure 8-1. NI 6232/6233 PFI Input Circuitry
Each PFI <6..9>/P1.<0..3> can be configured as a timing output signal
from AI, AO, or counter/timer functions or a static digital output.
Figure 8-2 shows the circuitry of one PFI output line. Each PFI line is
similar.
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Chapter 8
PFI
Isolation
Barrier
Timing Signals
Digital
I/O Protection
PFI <6..9>/P1.<0..3>
Isolators
Static DO
Buffer
Output
Enable
Note: One output enable is shared
by all digital output signals.
Figure 8-2. NI 6232/6233 PFI Output Circuitry
When a terminal is used as a timing input or output signal, it is called PFI x
(where x is an integer from 0 to 9). When a terminal is used as a static digital
input or output, it is called P0.x or P1.x.
The voltage input and output levels and the current drive levels of the PFI
signals are listed in the NI 6232/6233 Specifications.
Using PFI Terminals as Timing Input Signals
Use PFI <0..5> terminals to route external timing signals to many different
M Series functions. Each input PFI terminal can be routed to any of the
following signals.
•
•
•
•
•
•
•
•
•
•
•
AI Convert Clock
AI Sample Clock
AI Start Trigger
AI Reference Trigger
AI Pause Trigger
AI Sample Clock Timebase
AO Start Trigger
AO Sample Clock
AO Sample Clock Timebase
AO Pause Trigger
Counter input signals for either counter—Source, Gate, Aux,
HW_Arm, A, B, Z
Most functions allow you to configure the polarity of PFI inputs and
whether the input is edge or level sensitive.
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Exporting Timing Output Signals Using PFI Terminals
You can route any of the following timing signals to any PFI <6..9>
terminal.
•
•
•
•
•
•
•
AI Hold Complete Event
Counter n Source
Counter n Gate
Counter n Internal Output
Frequency Output
PXI_STAR
RTSI <0..7>
Note Short pulses on the signal might not be observable by the user or another instrument.
Refer to the Digital Output (Port 1) section of the NI 6232/6233 Specifications for more
information.
Using PFI Terminals as Static Digital Inputs and Outputs
When a terminal is used as a static digital input or output, it is called P0.x
or P1.x. On the I/O connector, each terminal is labeled PFI x/P0.x or
PFI x/P1.x.
Connecting PFI Input Signals
All PFI input connections are referenced to P0.GND. Figure 8-3 shows this
reference, and how to connect an external PFI 0 source and an external
PFI 2 source to two PFI terminals.
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Chapter 8
PFI
I/O Connector
PFI 0
PFI 2
PFI 0
Source
PFI 2
Source
D GND
M Series Device
Figure 8-3. PFI Input Signals Connections
PFI Filters
You can enable a programmable debouncing filter on each PFI, RTSI, or
PXI_STAR signal. When the filters are enabled, your device samples the
input on each rising edge of a filter clock. M Series devices use an onboard
oscillator to generate the filter clock with a 40 MHz frequency.
Note NI-DAQmx supports only filters on counter inputs.
The following is an example of low-to-high transitions of the input signal.
High-to-low transitions work similarly.
Assume that an input terminal has been low for a long time. The input
terminal then changes from low-to-high, but glitches several times. When
the filter clock has sampled the signal high on N consecutive edges, the
low-to-high transition is propagated to the rest of the circuit. The value of
N depends on the filter setting; refer to Table 8-1.
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PFI
Table 8-1. Filters
N (Filter Pulse Width
Pulse Width
ClocksNeeded Guaranteedto Guaranteedto
Filter Setting
125 ns
to Pass Signal)
Pass Filter
Not Pass Filter
5
257
125 ns
100 ns
6.425 µs
2.55 ms
6.425 µs
2.55 ms
—
6.400 µs
2.54 ms
—
~101,800
—
Disabled
The filter setting for each input can be configured independently. On power
up, the filters are disabled. Figure 8-4 shows an example of a low-to-high
transition on an input that has its filter set to 125 ns (N = 5).
RTSI, PFI, or
Filtered input goes high
when terminal is sampled
high on five consecutive
filter clocks.
PXI_STAR Terminal
1
1
2
3
4
1
2
3
4
5
Filter Clock
(40 MHz)
Filtered Input
Figure 8-4. Filter Example
Enabling filters introduces jitter on the input signal. For the 125 ns and
6.425 µs filter settings, the jitter is up to 25 ns. On the 2.55 ms setting, the
jitter is up to 10.025 µs.
When a PFI input is routed directly to RTSI, or a RTSI input is routed
directly to PFI, the M Series device does not use the filtered version of the
input signal.
Refer to the KnowledgeBase document, Digital Filtering with M Series
and CompactDAQ, for more information about digital filters and counters.
To access this KnowledgeBase, go to ni.com/infoand enter the info
code rddfms.
I/O Protection
Each DI, DO, and PFI signal is protected against overvoltage and
undervoltage conditions as well as ESD events on NI 6232/6233 devices.
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Chapter 8
PFI
Consult the device specifications for details. However, you should avoid
these fault conditions by following these guidelines.
•
Do not connect any digital output line to any external signal source,
ground signal, or power supply.
•
Understand the current requirements of the load connected to the
digital output lines. Do not exceed the specified current output limits
of the digital outputs. NI has several signal conditioning solutions for
digital applications requiring high current drive.
•
•
Do not drive the digital input lines with voltages or current outside of
its normal operating range.
Treat the DAQ device as you would treat any static sensitive device.
Always properly ground yourself and the equipment when handling the
DAQ device or connecting to it.
Programmable Power-Up States
By default, the digital output lines (P1.<0..3>/PFI <6..9>) are set to 0. They
can be programmed to power up as 0 or 1.
Refer to the NI-DAQmx Help or the LabVIEW 8.x Help for more
information about setting power-up states in NI-DAQmx or MAX.
The DI signals P0.<0..5> are referenced to P0.GND and DO signals
P1.<0..3> are referenced to P1.GND.
Figures 8-5 and 8-6 show P0.<0..5> and P1.<0..3> on the NI 6232 and the
NI 6233 device, respectively. Digital input and output signals can range
from 0 to 30 V. Refer to the NI 6232/6233 Specifications for more
information.
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PFI
P1.VCC
P1.0
Buffer
P1.GND
P1.1
P1.<0..3>
Digital
Isolators
P1.GND
P1.GND
P0.0
P0.GND
P0.GND
Figure 8-6. NI 6233 Digital I/O Connections (DO Sink)
Caution Exceeding the maximum input voltage or maximum working voltage ratings,
which are listed in the NI 6232/6233 Specifications, can damage the DAQ device and the
computer. NI is not liable for any damage resulting from such signal connections.
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9
NI 6232/6233 devices are isolated data acquisition devices. As shown in
Figure 9-1, the analog input, analog output, counters, and PFI/static DIO
circuitry are referenced to an isolated ground. The bus interface circuitry,
RTSI, digital routing, and clock generation are all referenced to a
non-isolated ground. Refer to Table 9-1 for an example of the symbols for
isolated ground and non-isolated ground.
Table 9-1. Ground Symbols
Isolated Ground
Non-Isolated Ground
A
Isolation
Barrier
Analog Input
AI GND
A
A
Digital
Routing
and Clock
Generation
Analog Output
Bus
Bus
Interface
AO GND
Digital
Isolators
Counters
RTSI
PFI/Static DI
P0
P1
P0.GND
P1.GND
PFI/Static DO
Figure 9-1. General NI 6232/6233 Block Diagram
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Isolation and Digital Isolators
The non-isolated ground is connected to the chassis ground of the PC or
chassis where the device is installed.
The isolated ground is not connected to the chassis ground of the PC or
isolated ground signal.
connect this ground to the ground of system being measured or controlled.
Refer to the Connecting Analog Voltage Input Signals section of Chapter 4,
Analog Input, the Connecting Analog Voltage Output Signals section of
Chapter 5, Analog Output, the Connecting Digital I/O Signals section of
Chapter 6, Digital Input and Output, and the Connecting PFI Input Signals
section of Chapter 8, PFI, for more information.
Digital Isolation
The NI 6232/6233 uses digital isolators. Unlike analog isolators, digital
isolators do not introduce any analog error in the measurements taken by
the device. The A/D converter, used for analog input, is on the isolated side
of the device. The analog inputs are digitized before they are sent across the
isolation barrier. Similarly, the D/A converters, used for analog output, are
on the isolated side of the device.
Benefits of an Isolated DAQ Device
With isolation, engineers can safely measure a small voltage in the presence
of a large common-mode signal. Some advantages of isolation are as
follows:
•
Improved rejection—Isolation increases the ability of the
measurement system to reject common-mode voltages.
Common-mode voltage is the signal that is present or "common" to
both the positive and negative input of a measurement device, but is not
part of the signal to be measured.
•
•
Improved accuracy—Isolation improves measurement accuracy by
physically preventing ground loops. Ground loops, a common source
of error and noise, are the result of a measurement system having
multiple grounds at different potentials.
Improved safety—Isolation creates an insulation barrier so you can
make floating measurements while protecting against large transient
voltage spikes.
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10
Digital Routing and Clock
Generation
The digital routing circuitry has the following three main functions.
•
Manages the flow of data between the bus interface and the
acquisition/generation sub-systems (analog input, analog output,
digital I/O, and the counters). The digital routing circuitry uses FIFOs
(if present) in each sub-system to ensure efficient data movement.
•
Routes timing and control signals. The acquisition/generation
sub-systems use these signals to manage acquisitions and generations.
These signals can come from the following sources.
–
–
–
–
Your M Series device
Other devices in your system through RTSI
User input through the PFI terminals
•
Routes and generates the main clock signals for the M Series device.
Clock Routing
Figure 10-1 shows the clock routing circuitry of an M Series device.
Onboard
80 MHz
Oscillator
10 MHz RefClk
(To RTSI <0..7>
Output Selectors)
÷ 8
External
Reference
80 MHz Timebase
RTSI <0..7>
PXI_CLK10
Clock
PLL
20 MHz Timebase
÷
4
PXI_STAR
÷
200
100 kHz Timebase
Figure 10-1. M Series Clock Routing Circuitry
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80 MHz Timebase
The 80 MHz Timebase can be used as the Source input to the 32-bit
general-purpose counter/timers.
The 80 MHz Timebase can be generated from either of the following.
•
•
Onboard oscillator
External signal (by using the external reference clock)
20 MHz Timebase
100 kHz Timebase
The 20 MHz Timebase normally generates many of the AI and AO timing
signals. The 20 MHz Timebase also can be used as the Source input to the
32-bit general-purpose counter/timers.
Your device generates 20 MHz Timebase by dividing down the 80 MHz
Timebase.
The 100 kHz Timebase can be used to generate many of the AI and AO
timing signals. The 100 kHz Timebase also can be used as the Source input
to the 32-bit general-purpose counter/timers.
The 100 kHz Timebase is generated by dividing down the 20 MHz
Timebase by 200.
External Reference Clock
The external reference clock can be used as a source for the internal
timebases (80 MHz Timebase, 20 MHz Timebase, and 100 kHz Timebase)
on an M Series device. By using the external reference clock, you can
synchronize the internal timebases to an external clock.
The following signals can be routed to drive the external reference clock.
•
•
•
RTSI <0..7>
PXI_CLK10
PXI_STAR
The external reference clock is an input to a Phase-Lock Loop (PLL). The
PLL generates the internal timebases.
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10 MHz Reference Clock
The 10 MHz reference clock can be used to synchronize other devices to
your M Series device. The 10 MHz reference clock can be routed to the
RTSI <0..7> terminals. Other devices connected to the RTSI bus can use
this signal as a clock input.
The 10 MHz reference clock is generated by dividing down the onboard
oscillator.
Synchronizing Multiple Devices
With the RTSI bus and the routing capabilities of M Series devices, there
are several ways to synchronize multiple devices depending on your
application.
To synchronize multiple devices to a common timebase, choose one
device—the initiator—to generate the timebase. The initiator device routes
its 10 MHz reference clock to one of the RTSI <0..7> signals.
All devices (including the initiator device) receive the 10 MHz Reference
Clock from RTSI. This signal becomes the external reference clock. A PLL
on each device generates the internal timebases synchronous to the external
reference clock.
On PXI systems, you also can synchronize devices to PXI_CLK10. In this
application the PXI chassis acts as the initiator. Each PXI module routes
PXI_CLK10 to its external reference clock.
Another option in PXI systems is to use PXI_STAR. The Star Trigger
controller device acts as the initiator and drives PXI_STAR with a clock
signal. Each target device routes PXI_STAR to its external reference clock.
When all of the devices are using or referencing a common timebase, you
can synchronize operations across them by sending a common start trigger
out across the RTSI bus and setting their sample clock rates to the same
value.
Real-Time System Integration Bus (RTSI)
Real-Time System Integration (RTSI) is set of bused signals among devices
that allow you to do the following.
•
Use a common clock (or timebase) to drive the timing engine on
multiple devices
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•
Share trigger signals between devices
Many National Instruments DAQ, motion, vision, and CAN devices
support RTSI.
In a PCI system, the RTSI bus consists of the RTSI bus interface and a
ribbon cable. The bus can route timing and trigger signals between several
functions on as many as five DAQ, vision, motion, or CAN devices in the
computer. In a PXI system, the RTSI bus consists of the RTSI bus interface
and trigger signals between several functions on as many as seven DAQ
devices in the system.
RTSI Connector Pinout
Figure 10-2 shows the RTSI connector pinout and Table 10-1 describes the
RTSI signals. The RTSI signals are referenced to earth/chassis ground; they
are not isolated.
Terminal 34
Terminal 33
Terminal 2
Terminal 1
Figure 10-2. NI 6232/6233 RTSI Pinout
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Table 10-1. RTSI Signal Descriptions
RTSI Bus Signal
Terminal
RTSI 7
RTSI 6
RTSI 5
RTSI 4
RTSI 3
RTSI 2
RTSI 1
RTSI 0
34
32
30
28
26
24
22
20
Not Connected. Do not connect signals
to these terminals.
1–18
GND
19, 21, 23, 25, 27, 29, 31, 33
Note: RTSI <0..7> and GND are earth/chassis ground-referenced. They are not isolated.
Using RTSI as Outputs
RTSI <0..7> are bidirectional terminals. As an output, you can drive any of
the following signals to any RTSI terminal.
•
•
•
•
•
•
•
•
•
•
•
•
ai/StartTrigger
ai/ReferenceTrigger
ai/ConvertClock*
ai/SampleClock
ai/PauseTrigger
ao/SampleClock*
ao/StartTrigger
ao/PauseTrigger
10 MHz Reference Clock
Counter n Source, Gate, Z, Internal Output
FREQ OUT
Input PFI <0..5>
Note Signals with a * are inverted before being driven on the RTSI terminals.
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Using RTSI Terminals as Timing Input Signals
You can use RTSI terminals to route external timing signals to many
different M Series functions. Each RTSI terminal can be routed to any of
the following signals.
•
•
•
•
•
•
•
•
•
•
•
AI Convert Clock
AI Sample Clock
AI Start Trigger
AI Reference Trigger
AI Pause Trigger
AI Sample Clock Timebase
AO Start Trigger
AO Sample Clock
AO Sample Clock Timebase
AO Pause Trigger
Counter input signals for either counter—Source, Gate, Aux,
HW_Arm, A, B, or Z
Most functions allow you to configure the polarity of PFI inputs and
whether the input is edge or level sensitive.
RTSI Filters
You can enable a programmable debouncing filter on each PFI, RTSI, or
PXI_STAR signal. When the filters are enabled, your device samples the
input on each rising edge of a filter clock. M Series devices use an onboard
oscillator to generate the filter clock with a 40 MHz frequency.
Note NI-DAQmx supports only filters on counter inputs.
The following is an example of low-to-high transitions of the input signal.
High-to-low transitions work similarly.
Assume that an input terminal has been low for a long time. The input
terminal then changes from low-to-high, but glitches several times. When
the filter clock has sampled the signal high on N consecutive edges, the
low-to-high transition is propagated to the rest of the circuit. The value of
N depends on the filter setting; refer to Table 10-2.
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Table 10-2. Filters
N (Filter
Pulse Width
Pulse Width
ClocksNeeded Guaranteedto Guaranteedto
Filter Setting
125 ns
to Pass Signal)
Pass Filter
125 ns
Not Pass Filter
100 ns
5
257
6.425 µs
2.55 ms
6.425 µs
2.55 ms
—
6.400 µs
2.54 ms
—
~101,800
—
Disabled
The filter setting for each input can be configured independently. On power
up, the filters are disabled. Figure 10-3 shows an example of a low-to-high
transition on an input that has its filter set to 125 ns (N = 5).
RTSI, PFI, or
Filtered input goes high
when terminal is sampled
high on five consecutive
filter clocks.
PXI_STAR Terminal
1
1
2
3
4
1
2
3
4
5
Filter Clock
(40 MHz)
Filtered Input
Figure 10-3. Filter Example
Enabling filters introduces jitter on the input signal. For the 125 ns and
6.425 µs filter settings, the jitter is up to 25 ns. On the 2.55 ms setting, the
jitter is up to 10.025 µs.
When a PFI input is routed directly to RTSI, or a RTSI input is routed
directly to PFI, the M Series device does not use the filtered version of the
input signal.
Refer to the KnowledgeBase document, Digital Filtering with M Series
and CompactDAQ, for more information about digital filters and counters.
To access this KnowledgeBase, go to ni.com/infoand enter the info
code rddfms.
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PXI Clock and Trigger Signals
Note PXI clock and trigger signals are only available on PXI devices. Other devices use
RTSI.
PXI_CLK10
PXI_CLK10 is a common low-skew 10 MHz clock reference clock for
synchronization of multiple modules in a PXI measurement or control
system. The PXI backplane is responsible for generating PXI_CLK10
independently to each peripheral slot in a PXI chassis.
PXI Triggers
A PXI chassis provides eight bused trigger lines to each module in a
system. Triggers may be passed from one module to another, allowing
precisely timed responses to asynchronous external events that are being
monitored or controlled. Triggers can be used to synchronize the operation
of several different PXI peripheral modules.
On M Series devices, the eight PXI trigger signals are synonymous with
RTSI <0..7>.
Note that in a PXI chassis with more than eight slots, the PXI trigger lines
may be divided into multiple independent buses. Refer to the
documentation for your chassis for details.
PXI_STAR Trigger
In a PXI system, the Star Trigger bus implements a dedicated trigger line
between the first peripheral slot (adjacent to the system slot) and the other
peripheral slots. The Star Trigger can be used to synchronize multiple
devices or to share a common trigger signal among devices.
A Star Trigger controller can be installed in this first peripheral slot to
provide trigger signals to other peripheral modules. Systems that do not
require this functionality can install any standard peripheral module in this
first peripheral slot.
An M Series device receives the Star Trigger signal (PXI_STAR) from a
Star Trigger controller. PXI_STAR can be used as an external source for
many AI, AO, and counter signals.
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An M Series device is not a Star Trigger controller. An M Series device
may be used in the first peripheral slot of a PXI system, but the system will
not be able to use the Star Trigger feature.
PXI_STAR Filters
You can enable a programmable debouncing filter on each PFI, RTSI, or
PXI_STAR signal. When the filters are enabled, your device samples the
input on each rising edge of a filter clock. M Series devices use an onboard
oscillator to generate the filter clock with a 40 MHz frequency.
Note NI-DAQmx supports only filters on counter inputs.
The following is an example of low-to-high transitions of the input signal.
High-to-low transitions work similarly.
Assume that an input terminal has been low for a long time. The input
terminal then changes from low-to-high, but glitches several times. When
the filter clock has sampled the signal high on N consecutive edges, the
low-to-high transition is propagated to the rest of the circuit. The value of
N depends on the filter setting; refer to Table 10-3.
Table 10-3. Filters
N (Filter
Pulse Width
Pulse Width
ClocksNeeded Guaranteedto Guaranteedto
Filter Setting
125 ns
to Pass Signal)
Pass Filter
125 ns
Not Pass Filter
100 ns
5
257
6.425 µs
2.55 ms
6.425 µs
2.55 ms
—
6.400 µs
2.54 ms
—
~101,800
—
Disabled
The filter setting for each input can be configured independently. On power
up, the filters are disabled. Figure 10-4 shows an example of a low-to-high
transition on an input that has its filter set to 125 ns (N = 5).
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RTSI, PFI, or
Filtered input goes high
when terminal is sampled
high on five consecutive
filter clocks.
PXI_STAR Terminal
1
1
2
3
4
1
2
3
4
5
Filter Clock
(40 MHz)
Filtered Input
Figure 10-4. Filter Example
Enabling filters introduces jitter on the input signal. For the 125 ns and
6.425 µs filter settings, the jitter is up to 25 ns. On the 2.55 ms setting, the
jitter is up to 10.025 µs.
When a PFI input is routed directly to RTSI, or a RTSI input is routed
directly to PFI, the M Series device does not use the filtered version of the
input signal.
Refer to the KnowledgeBase document, Digital Filtering with M Series
and CompactDAQ, for more information about digital filters and counters.
To access this KnowledgeBase, go to ni.com/infoand enter the info
code rddfms.
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11
Bus Interface
The bus interface circuitry of NI 6232/6233 devices efficiently moves data
between host memory and the measurement and acquisition circuits.
NI 6232/6233 devices are available for the following platforms.
•
•
PCI
PXI
NI 6232/6233 devices are jumperless for complete plug-and-play
operation. The operating system automatically assigns the base address,
interrupt levels, and other resources.
NI 6232/6233 devices incorporate PCI-MITE technology to implement a
high-performance PCI interface.
DMA Controllers
NI 6232/6233 devices have four fully-independent DMA controllers for
high-performance transfers of data blocks. One DMA controller is
available for each measurement and acquisition block.
•
•
•
•
Analog input
Analog output
Counter 0
Counter 1
Each DMA controller channel contains a FIFO and independent processes
for filling and emptying the FIFO. This allows the buses involved in the
transfer to operate independently for maximum performance. Data is
transferred simultaneously between the ports. The DMA controller
supports burst transfers to and from the FIFO.
Each DMA controller acts as a PCI Master device. The DMA controllers
support scatter-gather operations to and from host memory. Memory
buffers may be used in linear or circular fashion.
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Each DMA controller supports packing and unpacking of data through the
FIFOs to connect different size devices and optimize PCI bus utilization
and automatically handles unaligned memory buffers.
PXI Considerations
PXI Clock and Trigger Signals
Refer to the PXI_CLK10, PXI Triggers, PXI_STAR Trigger, and
PXI_STAR Filters sections of Chapter 10, Digital Routing and Clock
Generation, for more information on PXI clock and trigger signals.
PXI and PXI Express
NI PXI-6232/6233 modules can be installed in any PXI chassis and most
slots of PXI Express chassis.
PXI specifications are developed by the PXI System Alliance
(www.pxisa.org). Using the terminology of the PXI specifications,
NI PXI-6232/6233 devices are 3U Hybrid Slot-Compatible PXI-1
Peripheral Modules.
3U designates devices that are 100 mm tall (as opposed to the taller 6U
modules).
Hybrid slot-compatible defines where the device can be installed.
PXI-6232/6233 devices can be installed in the following chassis and slots:
•
•
PXI chassis—PXI-6232/6233 devices can be installed in any
peripheral slot of a PXI chassis.
PXI Express chassis—PXI-6232/6233 devices can be installed in the
following PXI Express chassis slots:
–
–
PXI-1 slots—Accepts all PXI modules
PXI hybrid slots—Accepts PXI or PXI Express modules.
PXI-1 devices use PCI signaling to communicate to the host controller (as
opposed to PCI Express signaling).
Peripheral devices are installed in peripheral slots and are not system
controllers.
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Using PXI with CompactPCI
Using PXI-compatible products with standard CompactPCI products is an
important feature provided by PXI Hardware Specification Revision 2.1. If
you use a PXI-compatible plug-in module in a standard CompactPCI
chassis, you cannot use PXI-specific functions, but you can still use the
basic plug-in device functions. For example, the RTSI bus on a PXI
M Series device is available in a PXI chassis, but not in a CompactPCI
chassis.
The CompactPCI specification permits vendors to develop sub-buses that
coexist with the basic PCI interface on the CompactPCI bus. Compatible
operation is not guaranteed between CompactPCI devices with different
sub-buses nor between CompactPCI devices with sub-buses and PXI. The
standard implementation for CompactPCI does not include these
sub-buses. The PXI M Series device works in any standard CompactPCI
chassis adhering to the PICMG CompactPCI 2.0 R3.0 core specification.
PXI-specific features are implemented on the J2 connector of the
CompactPCI bus. The PXI device is compatible with any CompactPCI
chassis with a sub-bus that does not drive the lines used by that device. Even
if the sub-bus is capable of driving these lines, the PXI device is still
compatible as long as those terminals on the sub-bus are disabled by default
and never enabled.
Caution Damage can result if these lines are driven by the sub-bus. NI is not liable for any
damage resulting from improper signal connections.
Data Transfer Methods
There are three primary ways to transfer data across the PCI bus—direct
memory access (DMA), interrupt request (IRQ), and programmed I/O.
Direct Memory Access (DMA)
DMA is a method to transfer data between the device and computer
memory without the involvement of the CPU. This method makes DMA
the fastest available data transfer method. National Instruments uses DMA
hardware and software technology to achieve high throughput rates and to
increase system utilization. DMA is the default method of data transfer for
DAQ devices that support it.
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Interrupt Request (IRQ)
IRQ transfers rely on the CPU to service data transfer requests. The device
notifies the CPU when it is ready to transfer data. The data transfer speed
is tightly coupled to the rate at which the CPU can service the interrupt
requests. If you are using interrupts to transfer data at a rate faster than the
rate the CPU can service the interrupts, your systems may start to freeze.
Programmed I/O is a data transfer mechanism where the user's program is
responsible for transferring data. Each read or write call in the program
initiates the transfer of data. Programmed I/O is typically used in
software-timed (on-demand) operations. Refer to the Software-Timed
Generations section of Chapter 5, Analog Output, for more information.
Changing Data Transfer Methods between DMA and IRQ
On PCI or PXI M Series devices, each measurement and acquisition circuit
(that is, AI, AO, and so on) has a dedicated DMA channel. So in most
applications, all data transfers use DMA.
However, NI-DAQmx allows you to disable DMA and use interrupts. To
change your data transfer mechanism between DMA and interrupts in
NI-DAQmx, use the Data Transfer Mechanism property node.
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Triggering
A trigger is a signal that causes an action, such as starting or stopping the
want to produce the trigger and the action you want the trigger to cause.
triggers can perform for each sub-system of the device, refer to the
following sections:
•
•
•
The Analog Input Triggering section of Chapter 4, Analog Input
The Analog Output Triggering section of Chapter 5, Analog Output
The Counter Triggering section of Chapter 7, Counters
Triggering with a Digital Source
Your DAQ device can generate a trigger on a digital signal. You must
specify a source and an edge. The digital source can be any of the PFI,
The edge can be either the rising edge or falling edge of the digital signal.
A rising edge is a transition from a low logic level to a high logic level. A
falling edge is a high-to-low transition.
Figure 12-1 shows a falling-edge trigger.
5 V
Digital Trigger
0 V
Falling Edge Initiates Acquisition
Figure 12-1. Falling-Edge Trigger
You also can program your DAQ device to perform an action in response to
a trigger from a digital source. The action can affect the following.
•
Analog input acquisition
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Triggering
•
•
Analog output generation
Counter behavior
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Device-Specific Information
This appendix contains device pinouts, specifications, cable and accessory
choices, and other information for the NI 6232 and NI 6233 M Series
isolated devices.
To obtain documentation for devices not listed here, refer to
ni.com/manuals.
NI 6232
NI 6232 Pinout
Figure A-1 shows the pinout of the NI 6232.
For a detailed description of each signal, refer to the I/O Connector Signal
Descriptions section of Chapter 3, Connector Information.
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Device-Specific Information
1
2
AI 0
AI 8
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
AI 9
AI 1
3
AI GND
AI 10
AI 3
AI 2
4
AI 11
AI GND
AI 12
AI 5
5
6
AI 4
AI 13
NC
7
8
AI 6
9
AI 14
AI 7
NC
AO 0
AO GND
10
11
12
13
14
15
16
17
18
19
AI 15
NC
AO 1
PFI 0/P0.0 (Input)
P0.GND
PFI 1/P0.1 (Input)
PFI 2/P0.2 (Input)
PFI 4/P0.4 (Input)
P1.VCC
PFI 3/P0.3 (Input)
PFI 5/P0.5 (Input)
PFI 6/P1.0 (Output)
PFI 8/P1.2 (Output)
P1.GND
PFI 7/P1.1 (Output)
PFI 8/P1.3 (Output)
NC = No Connect
Figure A-1. NI 6232 Pinout
Table A-1. NI 6232 Device Default NI-DAQmx Counter/Timer Pins
Counter/Timer Signal
CTR 0 SRC
Default Pin Number (Name)
13 (PFI 0)
Port
P0.0
P0.1
P0.2
P1.0
P0.0
P0.1
P0.2
P0.3
P0.4
P0.5
CTR 0 GATE
CTR 0 AUX
CTR 0 OUT
CTR 0 A
32 (PFI 1)
33 (PFI 2)
17 (PFI 6)
13 (PFI 0)
CTR 0 Z
32 (PFI 1)
CTR 0 B
33 (PFI 2)
CTR 1 SRC
CTR 1 GATE
CTR 1 AUX
15 (PFI 3)
34 (PFI 4)
16 (PFI 5)
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Table A-1. NI 6232 Device Default NI-DAQmx Counter/Timer Pins (Continued)
Counter/Timer Signal
CTR 1 OUT
Default Pin Number (Name)
36 (PFI 7)
Port
P1.1
P0.3
P0.4
P0.5
CTR 1 A
CTR 1 Z
CTR 1 B
15 (PFI 3)
34 (PFI 4)
16 (PFI 5)
Note For more information about default NI-DAQmx counter inputs, refer to Connecting
Counter Signals in the NI-DAQmx Help or the LabVIEW 8.x Help.
NI 6232 Specifications
Refer to the NI 6232/6233 Specifications, available on the NI-DAQ Device
Document Browser or ni.com/manuals, for more detailed information
on the NI 6232 device.
NI 6232 Accessory and Cabling Options
This section describes some cable and accessory options for the NI 6232
device. Refer to ni.comfor other accessory options including new devices.
Screw Terminal
National Instruments offers several styles of screw terminal connector
blocks. Use an SH37F-37M cable to connect an NI 6232 device to a
connector block, such as the following:
•
•
•
CB-37F-HVD—37-pin DIN rail screw terminal block, UL
Recognized derated to 30 Vrms, 42.4 Vpk, or 60 VDC
CB-37FH—Horizontal DIN-mountable terminal block with 37 screw
terminals
CB-37FV—Vertical DIN-mountable terminal block with 37 screw
terminals
•
•
CB-37F-LP—Low profile terminal block with 37 screw terminals
TB-2621—37-pin PXI screw terminal block, UL Recognized derated
to 30 Vrms, 42.4 Vpk, or 60 VDC
RTSI
Use RTSI bus cables to connect timing and synchronization signals among
PCI devices, such as M Series, E Series, CAN, and other measurement,
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Device-Specific Information
vision, and motion devices. Since PXI devices use PXI backplane signals
for timing and synchronization, no cables are required.
Cables
In most applications, you can use the following cables:
•
SH37F-37M-x—37-pin female-to-male shielded I/O cable, UL Listed
•
•
R37F-37M-1—37-pin female-to-male ribbon I/O cable
SH37F-P-4—37-pin female-to-pigtails shielded I/O cable
Custom Cabling and Connectivity
Refer to the Custom Cabling section of Chapter 2, DAQ System Overview,
for more information about custom cabling solutions.
NI 6233
NI 6233 Pinout
Figure A-2 shows the pinout of the NI 6233.
For a detailed description of each signal, refer to the I/O Connector Signal
Descriptions section of Chapter 3, Connector Information.
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1
2
AI 0
AI 9
AI 8
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
AI 1
3
AI GND
AI 10
AI 3
AI 2
4
AI 11
AI GND
AI 12
AI 5
5
6
AI 4
AI 13
NC
7
8
AI 6
9
AI 14
AI 7
NC
AO 0
AO GND
10
11
12
13
14
15
16
17
18
19
AI 15
NC
AO 1
PFI 0/P0.0 (Input)
P0.GND
PFI 1/P0.1 (Input)
PFI 2/P0.2 (Input)
PFI 4/P0.4 (Input)
P1.GND
PFI 3/P0.3 (Input)
PFI 5/P0.5 (Input)
PFI 6/P1.0 (Output)
PFI 8/P1.2 (Output)
P1.VCC
PFI 7/P1.1 (Output)
PFI 8/P1.3 (Output)
NC = No Connect
Figure A-2. NI 6233 Pinout
Table A-2. NI 6233 Device Default NI-DAQmx Counter/Timer Pins
Counter/Timer Signal
CTR 0 SRC
Default Pin Number (Name)
13 (PFI 0)
Port
P0.0
P0.1
P0.2
P1.0
P0.0
P0.1
P0.2
P0.3
P0.4
P0.5
CTR 0 GATE
CTR 0 AUX
CTR 0 OUT
CTR 0 A
32 (PFI 1)
33 (PFI 2)
17 (PFI 6)
13 (PFI 0)
CTR 0 Z
32 (PFI 1)
CTR 0 B
33 (PFI 2)
CTR 1 SRC
CTR 1 GATE
CTR 1 AUX
15 (PFI 3)
34 (PFI 4)
16 (PFI 5)
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Device-Specific Information
Table A-2. NI 6233 Device Default NI-DAQmx Counter/Timer Pins (Continued)
Counter/Timer Signal
CTR 1 OUT
Default Pin Number (Name)
36 (PFI 7)
Port
P1.1
P0.3
P0.4
P0.5
CTR 1 A
CTR 1 Z
CTR 1 B
15 (PFI 3)
34 (PFI 4)
16 (PFI 5)
Note For more information about default NI-DAQmx counter inputs, refer to Connecting
Counter Signals in the NI-DAQmx Help or the LabVIEW 8.x Help.
NI 6233 Specifications
Refer to the NI 6233 Specifications, available on the NI-DAQ Device
Document Browser or ni.com/manuals, for more detailed information
on the NI 6233 device.
NI 6233 Accessory and Cabling Options
This section describes some cable and accessory options for the NI 6233
device. Refer to ni.comfor other accessory options including new devices.
Screw Terminal
National Instruments offers several styles of screw terminal connector
blocks. Use an SH37F-37M cable to connect an NI 6233 device to a
connector block, such as the following:
•
•
•
CB-37F-HVD—37-pin DIN rail screw terminal block, UL
Recognized derated to 30 Vrms, 42.4 Vpk, or 60 VDC
CB-37FH—Horizontal DIN-mountable terminal block with 37 screw
terminals
CB-37FV—Vertical DIN-mountable terminal block with 37 screw
terminals
•
•
CB-37F-LP—Low profile terminal block with 37 screw terminals
TB-2621—37-pin PXI screw terminal block, UL Recognized derated
to 30 Vrms, 42.4 Vpk, or 60 VDC
Use RTSI bus cables to connect timing and synchronization signals among
PCI devices, such as M Series, E Series, CAN, and other measurement,
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Device-Specific Information
vision, and motion devices. Since PXI devices use PXI backplane signals
for timing and synchronization, no cables are required.
Cables
In most applications, you can use the following cables:
•
SH37F-37M-x—37-pin female-to-male shielded I/O cable, UL Listed
•
•
R37F-37M-1—37-pin female-to-male ribbon I/O cable
SH37F-P-4—37-pin female-to-pigtails shielded I/O cable
Custom Cabling and Connectivity
Refer to the Custom Cabling section of Chapter 2, DAQ System Overview,
for more information about custom cabling solutions.
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B
Troubleshooting
This section contains some common questions about M Series devices. If
your questions are not answered here, refer to the National Instruments
KnowledgeBase at ni.com/kb. It contains thousands of documents that
answer frequently asked questions about NI products.
Analog Input
I am seeing crosstalk or ghost voltages when sampling multiple
channels. What does this mean?
You may be experiencing a phenomenon called charge injection, which
occurs when you sample a series of high-output impedance sources with a
multiplexer. Multiplexers contain switches, usually made of switched
capacitors. When a channel, for example AI 0, is selected in a multiplexer,
those capacitors accumulate charge. When the next channel, for example
AI 1, is selected, the accumulated current (or charge) leaks backward
through channel 1. If the output impedance of the source connected to AI 1
is high enough, the resulting reading can somewhat affect the voltage in
AI 0. To circumvent this problem, use a voltage follower that has
operational amplifiers (op-amps) with unity gain for each high-impedance
source before connecting to an M Series device. Otherwise, you must
Another common cause of channel crosstalk is due to sampling among
multiple channels at various gains. In this situation, the settling times can
increase. For more information on charge injection and sampling channels
at different gains, refer to the Multichannel Scanning Considerations
section of Chapter 4, Analog Input.
I am using my device in differential analog input ground-reference
mode and I have connected a differential input signal, but my readings
are random and drift rapidly. What is wrong?
In DIFF mode, if the readings from the DAQ device are random and drift
rapidly, you should check the ground-reference connections. The signal can
be referenced to a level that is considered floating with reference to the
device ground reference. Even if you are in DIFF mode, you must still
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Appendix B
reference the signal to the same ground level as the device reference. There
are various methods of achieving this reference while maintaining a high
common-mode rejection ratio (CMRR). These methods are outlined in the
AI GND is an AI common signal that routes directly to the ground
connection point on the devices. You can use this signal if you need a
general analog ground connection point to the device. Refer to the
Differential Connection Considerations section of Chapter 4, Analog
Input, for more information.
How can I use the AI Sample Clock and AI Convert Clock signals on
an M Series device to sample the AI channel(s)?
M Series devices use ai/SampleClock and ai/ConvertClock to perform
interval sampling. As Figure B-1 shows, ai/SampleClock controls the
sample period, which is determined by the following equation:
1/sample period = sample rate
Channel 0
Channel 1
Convert Period
Sample Period
Figure B-1. ai/SampleClock and ai/ConvertClock
ai/ConvertClock controls the convert period, which is determined by the
following equation:
1/convert period = convert rate
This method allows multiple channels to be sampled relatively quickly in
relationship to the overall sample rate, providing a nearly simultaneous
effect with a fixed delay between channels.
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Appendix B
Troubleshooting
Analog Output
Counters
I am seeing glitches on the output signal. How can I minimize it?
When you use a DAC to generate a waveform, you may observe glitches on
the output signal. These glitches are normal; when a DAC switches from
one voltage to another, it produces glitches due to released charges. The
largest glitches occur when the most significant bit of the DAC code
changes. You can build a lowpass deglitching filter to remove some of these
glitches, depending on the frequency and nature of the output signal. Visit
ni.com/supportfor more information on minimizing glitches.
When multiple sample clocks on my buffered counter measurement
occur before consecutive edges on my source, I see weird behavior.
Why?
Duplicate count prevention ensures that the counter returns correct data for
counter measurement in some applications where a slow or non-periodic
external source is used.
Refer to the Duplicate Count Prevention section of Chapter 7, Counters,
for more information.
How do I connect counter signals to my M Series device?
The Default Counter Terminals section of Chapter 7, Counters, has
information on counter signal connections.
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C
Technical Support and
Professional Services
Visit the following sections of the National Instruments Web site at
ni.comfor technical support and professional services:
•
Support—Online technical support resources at ni.com/support
include the following:
–
Self-Help Resources—For answers and solutions, visit the
award-winning National Instruments Web site for software drivers
and updates, a searchable KnowledgeBase, product manuals,
step-by-step troubleshooting wizards, thousands of example
programs, tutorials, application notes, instrument drivers, and
so on.
–
Free Technical Support—All registered users receive free Basic
Service, which includes access to hundreds of Application
Engineers worldwide in the NI Developer Exchange at
ni.com/exchange. National Instruments Application Engineers
make sure every question receives an answer.
For information about other technical support options in your
area, visit ni.com/servicesor contact your local office at
ni.com/contact.
•
•
•
Training and Certification—Visit ni.com/trainingfor
self-paced training, eLearning virtual classrooms, interactive CDs,
and Certification program information. You also can register for
instructor-led, hands-on courses at locations around the world.
System Integration—If you have time constraints, limited in-house
technical resources, or other project challenges, National Instruments
Alliance Partner members can help. To learn more, call your local
NI office or visit ni.com/alliance.
Declaration of Conformity (DoC)—A DoC is our claim of
compliance with the Council of the European Communities using
the manufacturer’s declaration of conformity. This system affords
the user protection for electronic compatibility (EMC) and product
safety. You can obtain the DoC for your product by visiting
ni.com/certification.
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Appendix C
Technical Support and Professional Services
•
Calibration Certificate—If your product supports calibration,
you can obtain the calibration certificate for your product at
ni.com/calibration.
If you searched ni.comand could not find the answers you need, contact
your local office or NI corporate headquarters. Phone numbers for our
worldwide offices are listed at the front of this manual. You also can visit
the Worldwide Offices section of ni.com/niglobalto access the branch
office Web sites, which provide up-to-date contact information, support
phone numbers, email addresses, and current events.
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Glossary
Numbers/Symbols
%
Percent.
+
Positive of, or plus.
Negative of, or minus.
Plus or minus.
Less than.
–
<
>
Greater than.
Less than or equal to.
Greater than or equal to.
Per.
/
º
Degree.
Ω
Ohm.
A
A
Amperes—the unit of electric current.
Analog-to-Digital. Most often used as A/D converter.
Alternating current.
A/D
AC
accuracy
A measure of the capability of an instrument or sensor to faithfully indicate
the value of the measured signal. This term is not related to resolution;
however, the accuracy level can never be better than the resolution of the
instrument.
ADE
Application development environment.
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Glossary
AI
1. Analog input.
2. Analog input channel signal.
AI GND
Analog input ground signal.
AI SENSE
analog
Analog input sense signal.
A signal whose amplitude can have a continuous range of values.
analog input signal
An input signal that varies smoothly over a continuous range of values,
rather than in discrete steps.
analog output signal
analog signal
An output signal that varies smoothly over a continuous range of values,
rather than in discrete steps.
A signal representing a variable that can be observed and represented
continuously.
analog trigger
A trigger that occurs at a user-selected point on an incoming analog signal.
Triggering can be set to occur at a specific level on either an increasing or
a decreasing signal (positive or negative slope). Analog triggering can be
implemented either in software or in hardware. When implemented in
software (LabVIEW), all data is collected, transferred into system memory,
and analyzed for the trigger condition. When analog triggering is
implemented in hardware, no data is transferred to system memory until the
trigger condition has occurred.
AO
Analog output.
AO 0
Analog channel 0 output signal.
Analog channel 1 output signal.
Analog channel 2 output signal.
Analog channel 3 output signal.
Analog output ground signal.
AO 1
AO 2
AO 3
AO GND
application
arm
A software program that creates an end-user function.
The process of getting an instrument ready to perform a function. For
example, the trigger circuitry of a digitizer is armed, meaning that it is
ready to start acquiring data when an appropriate trigger condition is met.
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Glossary
ASIC
Application-specific integrated circuit—A proprietary semiconductor
component designed and manufactured to perform a set of specific
functions for a specific customer.
asynchronous
1. Hardware—A property of an event that occurs at an arbitrary time,
without synchronization to a reference clock.
2. Software—A property of a function that begins an operation and
returns prior to the completion or termination of the operation.
B
b
Bit—One binary digit, either 0 or 1.
B
Byte—Eight related bits of data, an eight-bit binary number. Also used to
denote the amount of memory required to store one byte of data.
block diagram
BNC
A pictorial description or representation of a program or algorithm.
Bayonet-Neill-Concelman—A type of coaxial connector used in situations
requiring shielded cable for signal connections and/or controlled
impedance applications.
buffer
1. Temporary storage for acquired or generated data.
2. A memory device that stores intermediate data between two devices.
bus, buses
The group of electrical conductors that interconnect individual circuitry in
a computer. Typically, a bus is the expansion vehicle to which I/O or other
devices are connected. Examples of PC buses are the PCI, AT(ISA), and
EISA bus.
C
C
Celsius.
calibration
The process of determining the accuracy of an instrument. In a formal
sense, calibration establishes the relationship of an instrument's
measurement to the value provided by a standard. When that relationship is
known, the instrument may then be adjusted (calibrated) for best accuracy.
calibrator
A precise, traceable signal source used to calibrate instruments.
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Glossary
cascading
Process of extending the counting range of a counter chip by connecting to
the next higher counter.
CE
European emissions control standard.
channel
Pin or wire lead to which you apply or from which you read the analog or
digital signal. Analog signals can be single-ended or differential. For digital
signals, you group channels to form ports. Ports usually consist of either
four or eight digital channels.
clock
Hardware component that controls timing for reading from or writing to
groups.
CMOS
CMRR
Complementary metal-oxide semiconductor.
Common-mode rejection ratio—A measure of the ability of a differential
amplifier to reject interference from a common-mode signal, usually
expressed in decibels (dB).
common-mode rejection The ability of an electronic system to cancel any electronic noise pick-up
that is common to both the positive and negative polarities of the input leads
to the instrument front end. Common mode rejection is only a relevant
specification for systems having a balanced or differential input.
common-mode signal
1. Any voltage present at the instrumentation amplifier inputs with
respect to amplifier ground.
2. The signal, relative to the instrument chassis or computer's ground, of
the signals from a differential input. This is often a noise signal, such
as 50 or 60 Hz hum.
connector
1. A device that provides electrical connection.
2. A fixture (either male or female) attached to a cable or chassis for
quickly making and breaking one or more circuits. A symbol that
connects points on a flowchart.
convert rate
count
Reciprocal of the interchannel delay.
The number of events, such as zero crossings, pulses, or cycles.
counter
1. Software. A memory location used to store a count of certain
occurrences.
2. Hardware. A circuit that counts events. When it refers to an instrument,
it refers to a frequency counter.
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Glossary
counter/timer
A circuit that counts external pulses or clock pulses (timing).
D
D GND
Digital ground signal.
A serial connector.
D-SUB connector
DAC
Digital-to-Analog Converter—An electronic device, often an integrated
circuit, that converts a digital number into a corresponding analog voltage
or current.
In the instrumentation world, DACs can be used to generate arbitrary
waveform shapes, defined by the software algorithm that computes the
digital data pattern, which is fed to the DAC.
DAQ
1. Data acquisition—The process of collecting and measuring electrical
signals from sensors, transducers, and test probes or fixtures and
inputting them to a computer for processing.
2. Data acquisition—The process of collecting and measuring the same
kinds of electrical signals with A/D and/or DIO devices plugged into a
computer, and possibly generating control signals with D/A and/or
DIO devices in the same computer.
DAQ device
A device that acquires or generates data and can contain multiple channels
and conversion devices. DAQ devices include plug-in devices, PCMCIA
®
(FireWire ) port. SCXI modules are considered DAQ devices.
DAQ-STC2
Data acquisition system timing controller chip.
data acquisition
The general concept of acquiring data, as in begin data acquisition or data
acquisition and control. See also DAQ.
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Glossary
data transfer
A technique for moving digital data from one system to another.
Options for data transfer are DMA, interrupt, and programmed I/O. For
programmed I/O transfers, the CPU in the PC reads data from the DAQ
device whenever the CPU receives a software signal to acquire a single data
point. Interrupt-based data transfers occur when the DAQ device sends an
interrupt to the CPU, telling the CPU to read the acquired data from the
DAQ device. DMA transfers use a DMA controller, instead of the CPU, to
move acquired data from the device into computer memory. Even though
high-speed data transfers can occur with interrupt and programmed I/O
transfers, they require the use of the CPU to transfer data. DMA transfers
are able to acquire data at high speeds and keep the CPU free for
performing other tasks at the same time.
dB
Decibel—The unit for expressing a logarithmic measure of the ratio of two
signal levels: dB = 20log10 V1/V2, for signals in volts.
DC
Direct current—although the term speaks of current, many different types
of DC measurements are made, including DC Voltage, DC current, and DC
power.
device
A plug-in data acquisition product, card, or pad that can contain multiple
channels and conversion devices. Plug-in products, PCMCIA cards, and
devices such as the DAQPad-1200, which connects to your computer
parallel port, are all examples of DAQ devices. SCXI modules are distinct
from devices, with the exception of the SCXI-1200, which is a hybrid.
DIFF
Differential mode—An analog input mode consisting of two terminals,
both of which are isolated from computer ground, whose difference is
measured.
differential input
An input circuit that actively responds to the difference between two
terminals, rather than the difference between one terminal and ground.
Often associated with balanced input circuitry, but also may be used with
an unbalanced source.
digital I/O
The capability of an instrument to generate and acquire digital signals.
Static digital I/O refers to signals where the values are set and held, or
rarely change. Dynamic digital I/O refers to digital systems where the
signals are continuously changing, often at multi-MHz clock rates.
digital isolator
Provides voltage isolation between its input and output.
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Glossary
digital signal
A representation of information by a set of discrete values according to a
prescribed law. These values are represented by numbers.
digital trigger
DIO
A TTL level signal having two discrete levels—a high and a low level.
Digital input/output.
DMA
Direct Memory Access—A method by which data can be transferred to/
from computer memory from/to a device or memory on the bus while the
processor does something else. DMA is the fastest method of transferring
data to/from computer memory.
DMA controller chip
driver
Performs the transfers between memory and I/O devices independently of
the CPU.
Software unique to the device or type of device, and includes the set of
commands the device accepts.
E
edge detection
A technique that locates an edge of an analog signal, such as the edge of a
square wave.
EEPROM
encoder
Electrically Erasable Programmable Read-Only Memory—ROM that can
be erased with an electrical signal and reprogrammed. Some SCXI modules
contain an EEPROM to store measurement-correction coefficients.
A device that converts linear or rotary displacement into digital or pulse
signals. The most popular type of encoder is the optical encoder, which uses
a rotating disk with alternating opaque areas, a light source, and a
photodetector.
external trigger
EXTREF
A voltage pulse from an external source that causes a DAQ operation to
begin.
External reference signal.
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Glossary
F
FIFO
First-In-First-Out memory buffer—A data buffering technique that
functions like a shift register where the oldest values (first in) come out
first. Many DAQ products and instruments use FIFOs to buffer digital data
from an A/D converter, or to buffer the data before or after bus
transmission.
The first data stored is the first data sent to the acceptor. FIFOs are often
used on DAQ devices to temporarily store incoming or outgoing data until
that data can be retrieved or output. For example, an analog input FIFO
stores the results of A/D conversions until the data can be retrieved into
system memory, a process that requires the servicing of interrupts and often
the programming of the DMA controller. This process can take several
milliseconds in some cases. During this time, data accumulates in the FIFO
for future retrieval. With a larger FIFO, longer latencies can be tolerated. In
the case of analog output, a FIFO permits faster update rates, because the
waveform data can be stored on the FIFO ahead of time. This again reduces
the effect of latencies associated with getting the data from system memory
to the DAQ device.
filter
A physical device or digital algorithm that selectively removes noise from
a signal, or emphasizes certain frequency ranges and de-emphasizes others.
Electronic filters include lowpass, band-pass, and highpass types. Digital
filters can operate on numeric data to perform equivalent operations on
digitized analog data or to enhance video images.
filtering
floating
A type of signal conditioning that allows you to filter unwanted frequency
components from the signal you are trying to measure.
The condition where a common mode voltage exists, or may exist, between
earth ground and the instrument or circuit of interest. Neither the high, nor
the low side of a circuit is at earth potential.
floating signal sources
Signal sources with voltage signals that are not connected to an absolute
reference of system ground. Also called non-referenced signal sources.
Some common examples of floating signal sources are batteries,
transformers, and thermocouples.
FREQ OUT
frequency
ft
Frequency Output signal.
The number of alternating signals that occur per unit time.
Feet.
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Glossary
function
1. A built-in execution element, comparable to an operator, function, or
statement in a conventional language.
2. A set of software instructions executed by a single line of code that may
have input and/or output parameters and returns a value when executed.
G
glitch
GND
ground
An unwanted signal excursion of short duration that is usually unavoidable.
See ground.
1. A pin.
2. An electrically neutral wire that has the same potential as the
surrounding earth. Normally, a noncurrent-carrying circuit intended for
safety.
3. A common reference point for an electrical system.
H
hardware
The physical components of a computer system, such as the circuit boards,
plug-in devices, chassis, enclosures, peripherals, and cables.
hardware triggering
Hz
A form of triggering where you set the start time of an acquisition and
gather data at a known position in time relative to a trigger signal.
1. Hertz—The SI unit for measurement of frequency. One hertz (Hz)
equals one cycle per second.
2. The number of scans read or updates written per second.
I
I/O
Input/Output—The transfer of data to/from a computer system involving
communications channels, operator interface devices, and/or data
acquisition and control interfaces.
impedance
1. The electrical characteristic of a circuit expressed in ohms and/or
capacitance/inductance.
2. Resistance.
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Glossary
in.
Inch or inches.
instrument driver
A set of high-level software functions that controls a specific GPIB, VXI,
or RS232 programmable instrument or a specific plug-in DAQ device.
Instrument drivers are available in several forms, ranging from a function
callable language to a virtual instrument (VI) in LabVIEW.
instrumentation
amplifier
A circuit whose output voltage with respect to ground is proportional to the
difference between the voltages at its two inputs. An instrumentation
amplifier normally has high-impedance differential inputs and high
common-mode rejection.
interchannel delay
Amount of time that passes between sampling consecutive channels in an
AI scan list. The interchannel delay must be short enough to allow sampling
of all the channels in the channel list, within the sample interval. The
greater the interchannel delay, the more time the PGIA is allowed to settle
before the next channel is sampled. The interchannel delay is regulated by
ai/ConvertClock.
interface
Connection between one or more of the following: hardware, software, and
the user. For example, hardware interfaces connect two other pieces of
hardware.
interrupt, interrupt
request line
1. A means for a device to notify another device that an event occurred.
2. A computer signal indicating that the CPU should suspend its current
task to service a designated activity.
I
I
Current, output high.
OH
Current, output low.
OL
IRQ
See interrupt, interrupt request line.
An electrical break between any two signals or planes up to a given voltage.
isolation
isolation barrier
An electrical break between two electrical planes providing a given or set
amount of electrical isolation. Current does not flow or transfer between the
two sides of the isolation barrier.
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Glossary
K
3
kHz
Kilohertz—A unit of frequency; 1 kHz = 10 = 1,000 Hz.
kS
1,000 samples.
L
LabVIEW
A graphical programming language.
LED
Light-Emitting Diode—A semiconductor light source.
lowpass filter
A filter that passes signals below a cutoff frequency while blocking signals
above that frequency.
LSB
Least Significant Bit.
Meter.
M
m
M Series
An architecture for instrumentation-class, multichannel data acquisition
devices based on the earlier E Series architecture with added new features.
measurement
The quantitative determination of a physical characteristic. In practice,
measurement is the conversion of a physical quantity or observation to a
domain where a human being or computer can determine the value.
measurement device
DAQ devices, such as the M Series multifunction I/O (MIO) devices, SCXI
signal conditioning modules, and switch modules.
6
MHz
Megahertz—A unit of frequency; 1 MHz = 10 Hz = 1,000,000 Hz.
–6
micro (μ)
MIO
The numerical prefix designating 10 .
Multifunction I/O—DAQ module. Designates a family of data acquisition
products that have multiple analog input channels, digital I/O channels,
timing, and optionally, analog output channels. An MIO product can be
considered a miniature mixed signal tester, due to its broad range of signal
types and flexibility. Also known as multifunction DAQ.
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Glossary
MITE
MXI Interface To Everything—A custom ASIC designed by National
Instruments that implements the PCI bus interface. The MITE supports bus
mastering for high-speed data transfers over the PCI bus.
module
A board assembly and its associated mechanical parts, front panel, optional
shields, and so on. A module contains everything required to occupy one or
more slots in a mainframe. SCXI and PXI devices are modules.
monotonicity
multichannel
A characteristic of a DAC in which the analog output always increases as
channel at the same time. The individual channels might contain identical
information, or they might contain different signals.
multifunction DAQ
multiplex
See MIO.
To assign more than one signal to a channel. See also mux.
mux
Multiplexer—A set of semiconductor or electromechanical switches
arranged to select one of many inputs to a single output. The majority of
DAQ cards have a multiplexer on the input, which permits the selection of
one of many channels at a time.
A switching device with multiple inputs that sequentially connects each of
its inputs to its output, typically at high speeds, in order to measure several
signals with a single analog input channel.
N
NI
National Instruments.
NI-DAQ
The driver software needed to use National Instruments DAQ devices and
SCXI components. Some devices use Traditional NI-DAQ (Legacy); others
use NI-DAQmx.
NI-DAQmx
The latest NI-DAQ driver with new VIs, functions, and development tools
for controlling measurement devices. The advantages of NI-DAQmx over
earlier versions of NI-DAQ include the DAQ Assistant for configuring
channels and measurement tasks for your device for use in LabVIEW,
LabWindows/CVI, and Measurement Studio; increased performance such
as faster single-point analog I/O; and a simpler API for creating DAQ
applications using fewer functions and VIs than earlier versions of NI-
DAQ.
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Glossary
NI-PGIA
See instrumentation amplifier.
non-referenced signal
sources
Signal sources with voltage signals that are not connected to an absolute
reference or system ground. Also called floating signal sources. Some
common example of non-referenced signal sources are batteries,
transformers, or thermocouples.
NRSE
Non-Referenced Single-Ended mode—All measurements are made with
respect to a common (NRSE) measurement system reference, but the
voltage at this reference can vary with respect to the measurement system
ground.
O
offset
The unwanted DC voltage due to amplifier offset voltages added to a signal.
P
PCI
Peripheral Component Interconnect—A high-performance expansion bus
architecture originally developed by Intel to replace ISA and EISA. It offers
a theoretical maximum transfer rate of 132 MB/s.
period
The period of a signal, most often measured from one zero crossing to the
next zero crossing of the same slope. The period of a signal is the reciprocal
of its frequency (in Hz). Period is designated by the symbol T.
periods
The number of periods of a signal.
Programmable Function Interface.
Programmable Gain Instrumentation Amplifier.
See channel.
PFI
PGIA
physical channel
Plug and Play devices
Devices that do not require DIP switches or jumpers to configure resources
on the devices. Also called switchless devices port.
1. A communications connection on a computer or a remote controller;
2. A digital port, consisting of four or eight lines of digital input and/or
output.
posttriggering
The technique used on a DAQ device to acquire a programmed number of
samples after trigger conditions are met.
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Glossary
power source
An instrument that provides one or more sources of AC or DC power. Also
known as power supply.
ppm
Parts per million.
pretriggering
The technique used on a DAQ device to keep a continuous buffer filled with
data, so that when the trigger conditions are met, the sample includes the
data leading up to the trigger condition.
pulse
A signal whose amplitude deviates from zero for a short period of time.
The time from the rising to the falling slope of a pulse (at 50% amplitude).
pulse width
PXI
A rugged, open system for modular instrumentation based on CompactPCI,
with special mechanical, electrical, and software features. The PXIbus
standard was originally developed by National Instruments in 1997, and is
now managed by the PXIbus Systems Alliance.
PXI Express
PXI_STAR
PCI Express eXtensions for Instrumentation—The PXI implementation of
PCI Express, a scalable full-simplex serial bus standard that operates at 2.5
Gbps and offers both asynchronous and isochronous data transfers.
A special set of trigger lines in the PXI backplane for high-accuracy device
synchronization with minimal latencies on each PXI slot. Only devices in
the PXI Star controller Slot 2 can set signal on this line. For additional
information concerning PXI star signal specifications and capabilities,
refer to the PXI Specification located at www.pxisa.org/specs.
Q
quadrature encoder
An encoding technique for a rotating device where two tracks of
information are placed on the device, with the signals on the tracks offset
by 90° from each other. This makes it possible to detect the direction of the
motion.
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Glossary
R
range
The maximum and minimum parameters between which a sensor,
instrument, or device operates with a specified set of characteristics. This
may be a voltage range or a frequency range.
real time
1. Displays as it comes in; no delays.
2. A property of an event or system in which data is processed and acted
upon as it is acquired instead of being accumulated and processed at a
later time.
3. Pertaining to the performance of a computation during the actual time
that the related physical process transpires so results of the
computation can be used in guiding the physical process.
RSE
Referenced Single-Ended configuration—All measurements are made with
respect to a common reference measurement system or a ground. Also
called a grounded measurement system.
RTSI
Real-Time System Integration.
RTSI bus
Real-Time System Integration bus—The National Instruments timing bus
that connects DAQ devices directly, by means of connectors on top of the
devices, for precise synchronization of functions.
S
s
Seconds.
Samples.
S
sample counter
The clock that counts the output of the channel clock, in other words, the
number of samples taken. On devices with simultaneous sampling, this
counter counts the output of the scan clock and hence the number of scans.
scan
One or more analog or digital input samples. Typically, the number of input
samples in a scan is equal to the number of channels in the input group. For
example, one pulse from the scan clock produces one scan which acquires
one new sample from every analog input channel in the group.
scan interval
Controls how often a scan is initialized; is regulated by the AI Sample
Clock signal.
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Glossary
scan rate
SCC
Reciprocal of the scan interval.
Signal Conditioning Carriers—A compact, modular form factor for signal
conditioning modules.
SCXI
Signal Conditioning eXtensions for Instrumentation—The National
Instruments product line for conditioning low-level signals within an
external chassis near sensors so that only high-level signals are sent to DAQ
devices in the noisy PC environment.
sensor
A device that responds to a physical stimulus (heat, light, sound, pressure,
motion, flow, and so on), and produces a corresponding electrical signal.
Primary characteristics of sensors are sensitivity, frequency range, and
linearity.
signal conditioning
1. Electronic equipment that makes transducer or other signals suitable in
level and range to be transmitted over a distance, or to interface with
voltage input instruments.
2. The manipulation of signals to prepare them for digitizing.
signal source
signals
A generic term for any instrument in the family of signal generators.
Signals are waveforms containing information. Although physical signals
can be in the form of mechanical, electromagnetic, or other forms, they are
most often converted to electronic form for measurement.
single trigger mode
single-buffered
When the arbitrary waveform generator goes through the staging list only
once.
Describes a device that acquires a specified number of samples from one or
more channels and returns the data when the acquisition is complete.
single-ended input
single-ended output
A circuit that responds to the voltage on one input terminal and ground. See
also differential input.
A circuit whose output signal is present between one output terminal and
ground.
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Glossary
software applications
The programs that run on your computer and perform a specific user-
oriented function, such as accounting, program development,
measurement, or data acquisition. In contrast, operating system functions
basically perform the generic "housekeeping" of the machine, which is
independent of any specific application. Operating system functions
include the saving of data (file system), handling of multiple programs at
the same time (multi-tasking), network interconnection, printing, and
keyboard/user interface interaction.
software triggering
source impedance
A method of triggering in which you simulate an analog trigger using
software. Also called conditional retrieval.
A parameter of signal sources that reflects current-driving ability of voltage
sources (lower is better) and the voltage-driving ability of current sources
(higher is better).
synchronous
1. Hardware—A property of an event that is synchronized to a reference
clock.
2. Software—A property of a function that begins an operation and
returns only when the operation is complete. A synchronous process is,
therefore, locked and no other processes can run during this time.
T
task
In NI-DAQmx, a collection of one or more channels, timing, and triggering
and other properties that apply to the task itself. Conceptually, a task
represents a measurement or generation you want to perform.
TC
See terminal count.
terminal
terminal count
An object or region on a node through which data passes.
The highest value of a counter.
Gate hold time.
t
t
t
gh
Gate setup time.
gsu
gw
Gate pulse width.
Timebase
The reference signals for controlling the basic accuracy of time or
frequency-based measurements. For instruments, timebase refers to the
accuracy of the internal clock.
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Glossary
t
Output delay time.
out
transducer
A device that responds to a physical stimulus (heat, light, sound, pressure,
motion, flow, and so on), and produces a corresponding electrical signal.
See also sensor.
trigger
1. Any event that causes or starts some form of data capture.
2. An external stimulus that initiates one or more instrument functions.
Trigger stimuli include a front panel button, an external input voltage
pulse, or a bus trigger command. The trigger may also be derived from
attributes of the actual signal to be acquired, such as the level and slope
of the signal.
t
t
Source clock period.
Source pulse width.
sc
sp
TTL
Transistor-Transistor Logic—A digital circuit composed of bipolar
transistors wired in a certain manner. A typical medium-speed digital
technology. Nominal TTL logic levels are 0 and 5 V.
U
USB
Universal Serial Bus—A 480 Mbit/s serial bus with up to 12-Mbps
bandwidth for connecting computers to keyboards, printers, and other
peripheral devices. USB 2.0 retains compatibility with the original USB
specification.
V
V
Volts.
V
V
V
V
V
Common-mode voltage.
Ground loop voltage.
Volts, input high.
Volts, input low.
Volts in.
cm
g
IH
IL
in
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Glossary
V
V
V
V
V
Measured voltage.
Volts, output high.
Volts, output low.
Volts out.
m
OH
OL
out
s
Signal source voltage.
See channel.
virtual channel
W
waveform
1. The plot of the instantaneous amplitude of a signal as a function of
time.
2. Multiple voltage readings taken at a specific sampling rate.
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Index
ai/HoldCompleteEvent, 4-28
ai/PauseTrigger, 4-30
ai/ReferenceTrigger, 4-29
ai/SampleClockTimebase, 4-24
ai/StartTrigger, 4-28
Symbols
Numerics
10 MHz reference clock, 10-3
100 kHz Timebase, 10-2
20 MHz Timebase, 10-2
80 MHz Timebase, 10-2
analog input
circuitry, 4-1
channels, B-1
A
differential, troubleshooting, B-1
FIFO, 4-2
getting started with applications in
software, 4-31
A/D converter, 4-2
accessories, 2-4, A-3, A-6
choosing for your device, 1-2
acquisition
ghost voltages when sampling multiple
channels, B-1
ground-reference settings, 4-2, 4-3
instrumentation amplifier, 4-2
MUX, 4-1
circular-buffered, 4-10
acquisitions
double-buffered, 4-10
hardware-timed, 4-10
software-timed, 4-9
AI channels, sampling with AI Sample Clock
and AI Convert Clock, B-2
AI Convert Clock signal, 4-25
AI Convert Clock Timebase signal, 4-27
AI data acquisition methods, 4-9
AI FIFO, 4-2
AI Hold Complete Event signal, 4-28
AI Pause Trigger signal, 4-30
AI Reference Trigger signal, 4-29
AI Sample Clock signal, 4-22
AI Sample Clock Timebase signal, 4-24
AI Start Trigger signal, 4-28
AI timing signals, 4-19
range, 4-2
and AI Convert Clock, B-2
signal sources, 4-12
signals, 4-19
timing signals, 4-19
triggering, 4-11
troubleshooting, B-1
analog output
circuitry, 5-1
connecting voltage signals, 5-4
data generation methods, 5-2
ai/ConvertClock, 4-25
ai/ConvertClockTimebase, 4-27
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Index
getting started with applications in
software, 5-10
glitches on the output signal, 5-2
signals, 5-5
interface, 11-1
RTSI, 10-3
timing signals, 5-5
trigger signals, 5-4
triggering, 5-4
cables, 2-4, A-3, A-6
custom, 2-4
troubleshooting, B-3
cabling
ANSI C documentation, xviii
AO FIFO, 5-1
calibration certificate (NI resources), C-2
calibration circuitry, 2-3
AO Pause Trigger signal, 5-7
AO Sample Clock signal, 5-8
AO Sample Clock Timebase signal, 5-10
AO Start Trigger signal, 5-6
ao/PauseTrigger, 5-7
channel scanning order, 4-7
AI Convert Clock, B-2
charge injection, B-1
ao/SampleClock, 5-8
ao/SampleClockTimebase, 5-10
ao/StartTrigger, 5-6
applications
counter input, 7-3
circular-buffered acquisition, 4-10
clock
counter output, 7-21
edge counting, 7-3
10 MHz reference, 10-3
external reference, 10-2
generation, 10-1
arm start trigger, 7-32
routing, 10-1
configuring, ground-reference settings in
software, 4-3
B
block diagram
PFI input circuitry, 8-1
PFI output circuitry, 8-2
buffered
connecting
analog voltage input signals, 4-11
analog voltage output signals, 5-4
digital I/O signals, 6-2, 8-6
PFI input signals, 8-3
edge counting, 7-4
non-cumulative, 7-5
hardware-timed generations, 5-3
period measurement, 7-8
pulse-width measurement, 7-7
two-signal edge-separation
measurement, 7-20
connections
differential considerations, 4-13
differential for ground-referenced signal
sources, 4-14
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for ground-referenced signal
Counter n Source, 7-27
Counter n TC, 7-30
sources, 4-17
Counter n Up_Down, 7-29
FREQ OUT, 7-31
Frequency Output, 7-31
counter terminals, default, 7-31
counters
cascading, 7-33
single-ended, NRSE configuration, 4-16
single-ended, RSE configuration, 4-16
connector, A-1, A-4
information, 3-1
RTSI, 3-3, 10-4
considerations
duplicate count prevention, 7-35
edge counting, 7-3
filters, 7-33
generation, 7-21
differential connection, 4-13
for field wiring, 4-18
output applications, 7-21
prescaling, 7-34
for multichannel scanning, 4-6
for PXI, 11-2
single-ended connection, 4-16
continuous pulse train generation, 7-23
controllers, DMA, 11-1
pulse train generation, 7-23
trigger, 7-21
synchronization modes, 7-38
timing signals, 7-26
triggering, 7-32
controlling counting direction, 7-3
conventions used in the manual, xv
Counter n A signal, 7-29
Counter n Aux signal, 7-28
Counter n B signal, 7-29
Counter n Gate signal, 7-28
Counter n HW Arm signal, 7-30
Counter n Internal Output signal, 7-30
Counter n Source signal, 7-27
Counter n TC signal, 7-30
Counter n Up_Down signal, 7-29
Counter n Z signal, 7-29
counter output applications, 7-21
counter signals
troubleshooting, B-3
counting edges, 7-3
channels, B-1
custom cabling, 2-4
DACs, 5-1
DAQ hardware, 2-1
DAQ system, 2-1
DAQ-STC2, 2-2
data
Counter n A, 7-29
Counter n Aux, 7-28
Counter n B, 7-29
Counter n Gate, 7-28
acquisition methods, 4-9
generation methods, 5-2
Counter n HW Arm, 7-30
Counter n Internal Output, 7-30
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Index
data transfer methods, 11-3
changing, 11-4
DMA
as a transfer method, 11-3
DMA, 11-3
IRQ, 11-4
changing data transfer methods, 11-4
controllers, 11-1
programmed I/O, 11-4
Declaration of Conformity (NI resources), C-1
default counter terminals, 7-31
device
documentation
conventions used in manual, xv
NI resources, C-1
related documentation, xvi
double-buffered acquisition, 4-10
drivers (NI resources), C-1
duplicate count prevention, 7-35
enabling in NI-DAQmx, 7-38
cabling, 2-4
information, A-1
multiple synchronization, 10-3
specifications, 1-2
diagnostic tools (NI resources), C-1
differential
troubleshooting, B-3
analog input, troubleshooting, B-1
E
edge counting, 7-3
buffered, 7-4
non-cumulative buffered, 7-5
sample clock, 7-4
connections for ground-referenced signal
sources, 4-15
single two-signal, 7-19
NI-DAQmx, 7-38
for floating signal sources, 4-15
for non-referenced signal sources, 4-15
digital
input and output, 6-1
isolation, 9-2
isolators, 9-1
encoders, quadrature, 7-16
encoding
routing, 10-1
X1, 7-16
signals, connecting, 6-2, 8-6
source, triggering, 12-1
digital I/O
X2, 7-17
X4, 7-17
examples (NI resources), C-1
exporting timing output signals using PFI
terminals, 8-3
circuitry, 6-1
getting started with applications in
software, 6-4
external
I/O protection, 6-1, 8-5
triggering, 12-1
reference clock, 10-2
source mode, 7-40
digital isolators, 4-2, 5-2
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connection, 4-17
ground-reference
connections, checking, B-1
settings, analog input, 4-3
ground-referenced
F
features, counter, 7-33
field wiring considerations, 4-18
filters
counter, 7-33
PFI, 8-4
PXI_STAR, 10-9
RTSI, 10-6
signal sources, 4-13
floating signal sources, 4-13
FREQ OUT signal, 7-31
frequency
hardware
division, 7-25
generation, 7-24
generator, 7-24
DAQ, 2-1
installing, 1-1
hardware-timed acquisitions, 4-10
Frequency Output signal, 7-31
G
generations
I/O connector, 3-1
analog output data, 5-2
buffered hardware-timed, 5-3
clock, 10-1
continuous pulse train, 7-23
frequency, 7-24
hardware-timed, 5-3
non-buffered hardware-timed, 5-3
pulse for ETS, 7-25
pulse train, 7-23
retriggerable single pulse, 7-22
simple pulse, 7-21
single pulse, 7-21
single pulse with start trigger, 7-21
software-timed, 5-2
NI 6232 pinout, A-1
NI 6233 pinout, A-4
I/O protection, 6-1, 8-5
input signals
using RTSI terminals as, 10-6
installation
hardware, 1-1
NI-DAQ, 1-1
other software, 1-1
instrument drivers (NI resources), C-1
interface, bus, 11-1
interrupt request, as a transfer method, 11-4
IRQ
as a transfer method, 11-4
changing data transfer methods, 11-4
isolated DAQ devices, 9-1
benefits, 9-2
getting started, 1-1
AI applications in software, 4-31
AO applications in software, 5-10
DIO applications in software, 6-4
ghost voltages when sampling multiple
channels, B-1
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Index
isolation barrier, 4-2, 5-2
isolators, 9-1
measuring
high frequency with two counters, 7-12
counters, 7-13
averaged, 7-11
K
KnowledgeBase, C-1
methods, data transfer, 11-3
minimizing
L
output signal glitches
(troubleshooting), B-3
voltage step between adjacent
channels, 4-8
LabVIEW documentation, xvii
low impedance sources, 4-6
multiple device synchronization, 10-3
M
M Series
information, A-1
specifications, xix
Measurement Studio documentation, xviii
measurements
services, C-1
buffered period, 7-8
NI 6232
buffered pulse-width, 7-7
buffered semi-period, 7-10
buffered two-signal edge-separation, 7-20
frequency, 7-10
accessory options, A-3
cabling options, A-3
information, A-1
pinout, A-1
period, 7-7
specifications, A-3
position, 7-16
NI 6233
pulse-width, 7-6
semi-period, 7-9
single period, 7-8
accessory options, A-6
cabling options, A-6
information, A-1
single pulse-width, 7-6
single semi-period, 7-9
single two-signal edge-separation, 7-19
two-signal edge-separation, 7-19
using quadrature encoders, 7-16
using two pulse encoders, 7-18
pinout, A-4
specifications, A-6
NI support and services, C-1
NI-DAQ documentation, xvi
device documentation browser, xix
NI-DAQmx Base documentation, xvii
NI-DAQmx for Linux documentation, xvi
NI-DAQmx, enabling duplicate count
prevention, 7-38
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non-buffered hardware-timed
acquisitions, 4-11
prescaling, 7-34
programmable function interface, 8-1
programmable power-up states, 6-1, 8-6
programmed I/O, 11-4
programming devices in software, 2-5
programming examples (NI resources), C-1
generations, 5-3
non-cumulative buffered edge counting, 7-5
connections, 4-15
NRSE configuration, 4-16
encoders, measurements using two, 7-18
generation for ETS, 7-25
train generation, 7-23
continuous, 7-23
O
order of channels for scanning, 4-7
other internal source mode, 7-40
other software, 1-1
buffered, 7-7
output signals
single, 7-6
glitches (troubleshooting), B-3
outputs, using RTSI as, 10-5
overview, 2-1
PXI
and PXI Express, 11-2
clock, 11-2
clock and trigger signals, 10-8
considerations, 11-2
trigger signals, 11-2
triggers, 10-8
P
pause trigger, 7-33
period measurement, 7-7
buffered, 7-8
using with CompactPCI, 11-3
PXI Express chassis compatibility, 11-2
PXI_CLK10, 10-8
single, 7-8
PFI, 8-1
filters, 10-9
trigger, 10-8
terminals, 8-3
filters, 8-4
using terminals as timing input
signals, 8-2
pin assignments. See pinouts
pinouts, 1-1
range, analog input, 4-2
real-time system integration bus, 10-3
reciprocal frequency measurement, 7-13
reference clock
device, 1-1
NI 6232, A-1
NI 6233, A-4
RTSI connector, 3-3, 10-4
position measurement, 7-16
power-up states, 6-1, 8-6
10 MHz, 10-3
external, 10-2
related documentation, xvi
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Index
retriggerable single pulse generation, 7-22
routing
AO Sample Clock Timebase, 5-10
AO Start Trigger, 5-6
clock, 10-1
digital, 10-1
RSE configuration, 4-16
RTSI, 10-3
connecting analog voltage input, 4-11
connecting analog voltage output, 5-4
connecting counter, B-3
connecting digital I/O, 6-2, 8-6
connecting PFI input, 8-3
Counter n A, 7-29
connector pinout, 3-3, 10-4
filters, 10-6
using as outputs, 10-5
using terminals as timing input
signals, 10-6
Counter n Aux, 7-28
Counter n B, 7-29
Counter n Gate, 7-28
Counter n HW Arm, 7-30
Counter n Internal Output, 7-30
Counter n Source, 7-27
counter timing, 7-26
counters, 7-26
exporting timing output using PFI
terminals, 8-3
FREQ OUT, 7-31
S
sample clock edge counting, 7-4
scanning speed, 4-9
semi-period measurement, 7-9
buffered, 7-10
single, 7-9
sensors, 2-3
settings, analog input ground-reference, 4-3
short high-quality cabling, 4-7
signal descriptions, 3-1
signal routing, RTSI bus, 10-3
signal sources
Frequency Output, 7-31
minimizing output glitches, B-3
output, minimizing glitches on, 5-2
simple pulse generation, 7-21
floating, 4-13
ground-referenced, 4-13
types, 4-12
period measurement, 7-8
pulse generation, 7-21
retriggerable, 7-22
with start trigger, 7-21
pulse-width measurement, 7-6
two-signal edge-separation
measurement, 7-19
signals
AI Convert Clock, 4-25
AI Convert Clock Timebase, 4-27
AI Hold Complete Event, 4-28
AI Pause Trigger, 4-30
AI Reference Trigger, 4-29
AI Sample Clock, 4-22
AI Sample Clock Timebase, 4-24
AI Start Trigger, 4-28
analog input, 4-19
single-ended
connections considerations, 4-16
connections for floating signal
sources, 4-17
analog output, 5-5
AO Pause Trigger, 5-7
AO Sample Clock, 5-8
connections for grounded signal
sources, 4-17
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triggering, 12-1
software
analog input, 4-11
settings, 4-5
counter, 7-32
with a digital source, 12-1
NI resources, C-1
triggers, 12-1
programming devices, 2-5
timed acquisitions, 4-9
software-timed
acquisitions, 4-9
generations, 5-2
specifications, A-3, A-6
device, 1-2
AI Pause Trigger signal, 4-30
AI Reference Trigger signal, 4-29
AI Start Trigger signal, 4-28
AO Pause Trigger signal, 5-7
AO Start Trigger signal, 5-6
arm start, 7-32
pause, 7-33
start trigger, 7-32
PXI, 10-8
static
PXI_STAR, 10-8
digital input, 6-1
Star Trigger, 10-8
digital output, 6-1
start, 7-32
DIO, using PFI terminals as, 8-3
support
switching from a large to a small input
range, 4-7
synchronization modes, 7-38
80 MHz source, 7-39
external source, 7-40
other internal source, 7-40
synchronizing multiple devices, 10-3
synchronous counting mode, 7-35
analog output, B-3
counters, B-3
NI resources, C-1
two-signal edge-separation
measurement, 7-19
buffered, 7-20
single, 7-19
U
using low impedance sources, 4-6
using PFI terminals
T
technical support, xix, C-1
terminals, default counter, 7-31
Timebase
as static digital I/Os, 8-3
as timing input, 8-2
to export timing output signals, 8-3
using RTSI
100 kHz, 10-2
20 MHz, 10-2
as outputs, 10-5
80 MHz, 10-2
timing output signals, exporting using PFI
terminals, 8-3
terminals as timing input signals, 10-6
using short high-quality cabling, 4-7
training, xix
training and certification (NI resources), C-1
© National Instruments Corporation
I-9
NI 6232/6233 User Manual
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