HP Hewlett Packard Network Router HP 8517B User Manual
HP 8517B  
S-Parameter Test Set  
Operating and  
Service Manual  
Printed in USA  
12 August 1998  
HP part number 08517-90054  
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What You’ll Find in This Manual…  
HP 8517B S-Parameter Test Set  
Chapters 1 and 2 • Test set description and installation information  
Chapters 3 and 4 • Principles of operation and specifications  
Chapters 5, 6, and 7 • Troubleshooting, replacement procedures, and replaceable parts  
information  
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Warranty  
Certification  
Warranty  
Hewlett-Packard Company certifies that this product met its published  
specifications at the time of shipment from the factory. Hewlett-Packard  
further certifies that its calibration measurements are traceable to the  
United States National Institute of Standards and Technology (NIST,  
formerly NBS), to the extent allowed by the Institute’s calibration facility,  
and to the calibration facilities of other International Standards  
Organization members.  
This Hewlett-Packard system product is warranted against defects in  
materials and workmanship for a period corresponding to the individual  
warranty periods of its component products. Instruments are warranted for a  
period of one year. During the warranty period, Hewlett-Packard Company  
will, at its option, either repair or replace products that prove to be defective.  
Warranty service for products installed by HP and certain other products  
designated by HP will be performed at Buyer’s facility at no charge within  
HP service travel areas. Outside HP service travel areas, warranty service  
will be performed at Buyer’s facility only upon HP’s prior agreement and  
Buyer shall pay HP’s round trip travel expenses. In all other areas, products  
must be returned to a service facility designated by HP.  
For products returned to HP for warranty service, Buyer shall prepay  
shipping charges to HP and HP shall pay shipping charges to return the  
product to Buyer. However, Buyer shall pay all shipping charges, duties, and  
taxes for products returned to HP from another country.  
HP warrants that its software and firmware designated by HP for use with an  
instrument will execute its programming instructions when properly  
installed on that instrument. HP does not warrant that the operation of the  
instrument, or software, or firmware will be uninterrupted or error free.  
LIMITATION OF WARRANTY. The foregoing warranty shall not apply  
to defects resulting from improper or inadequate maintenance by Buyer,  
Buyer-supplied software or interfacing, unauthorized modification or  
misuse, operation outside of the environmental specifications for the  
product, or improper site preparation or maintenance.  
NO OTHER WARRANTY IS EXPRESSED OR IMPLIED. HP  
SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OR  
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE.  
EXCLUSIVE REMEDIES. THE REMEDIES PROVIDED HEREIN ARE  
BUYER’S SOLE AND EXCLUSIVE REMEDIES. HP SHALL NOT BE  
LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL, INCIDENTAL, OR  
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CONSEQUENTIAL DAMAGES, WHETHER BASED ON CONTRACT,  
TORT, OR ANY OTHER LEGAL THEORY.  
Assistance  
Product maintenance agreements and other customer assistance agreements  
are available for Hewlett-Packard products.  
For assistance, call your local Hewlett-Packard Sales and Service Office  
(refer to “Service and Support”).  
HP 8517B S-Parameter Test Set Manual  
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Service and Support  
Any adjustment, maintenance, or repair of this product must be performed  
by qualified personnel. Contact your customer engineer through your local  
HP Service Center. You can find a list of HP Service Centers on the web at  
http://www.hp.com/go/tmdir.  
If you do not have access to the Internet, one of these HP centers can direct  
you to your nearest HP representative:  
United States:  
Hewlett-Packard Company  
Test and Measurement Call Center  
PO Box 4026  
Englewood, CO 80155-4026  
(800) 452 4844 (toll-free in US)  
Canada:  
Europe:  
Hewlett-Packard Canada Ltd.  
5150 Spectrum Way  
Mississauga, Ontario L4W 5G1  
(905) 206 4725  
Hewlett-Packard European Marketing Centre  
Postbox 999  
1180 AZ Amstelveen  
The Netherlands  
(31 20) 547 9900  
Japan:  
Hewlett-Packard Ltd.  
Measurement Assistance Center  
9-1, Takakura-Cho, Hachioji-Shi  
Tokyo 192, Japan  
(81) 426 56 7832  
(81) 426 56 7840 (FAX)  
Latin America:  
Hewlett-Packard Latin American Region Headquarters  
5200 Blue Lagoon Drive, 9th Floor  
Miami, Florida 33126, U.S.A.  
(305) 267 4245, (305) 267-4220  
(305) 267 4288 (FAX)  
Australia/New Zealand:  
Hewlett-Packard Australia Ltd.  
31-41 Joseph Street  
Blackburn, Victoria 3130  
Australia  
1 800 629 485 (Australia)  
0800 738 378 (New Zealand)  
(61 3) 9210 5489 (FAX)  
Asia-Pacific:  
Hewlett-Packard Asia Pacific Ltd.  
17-21/F Shell Tower, Times Square  
1 Matheson Street, Causeway Bay  
Hong Kong  
(852) 2599 7777  
(852) 2506 9285 (FAX)  
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Safety and Regulatory Information  
Review this product and related documentation to familiarize yourself with  
safety markings and instructions before you operate the instrument. This  
product has been designed and tested in accordance with international  
standards.  
WARNING  
CAUTION  
The WARNING notice denotes a hazard. It calls attention to a procedure,  
practice, or the like, that, if not correctly performed or adhered to, could result  
in personal injury. Do not proceed beyond a WARNING notice until the  
indicated conditions are fully understood and met.  
The CAUTION notice denotes a hazard. It calls attention to an operating  
procedure, practice, or the like, which, if not correctly performed or adhered  
to, could result in damage to the product or loss of important data. Do not  
proceed beyond a CAUTION notice until the indicated conditions are fully  
understood and met.  
Instrument Markings  
When you see this symbol on your instrument, you should refer to the instrument’s  
instruction manual for important information.  
!
This symbol indicates hazardous voltages.  
The laser radiation symbol is marked on products that have a laser output.  
This symbol indicates that the instrument requires alternating current (ac) input.  
The CE mark is a registered trademark of the European Community. If it is  
accompanied by a year, it indicates the year the design was proven.  
The CSA mark is a registered trademark of the Canadian Standards Association.  
1SM1-A  
This text indicates that the instrument is an Industrial Scientific and Medical Group 1  
Class A product (CISPER 11, Clause 4).  
This symbol indicates that the power line switch is ON.  
This symbol indicates that the power line switch is OFF or in STANDBY position.  
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Safety Earth  
Ground  
This is a Safety Class I product (provided with a protective earthing  
terminal). An uninterruptible safety earth ground must be provided from the  
main power source to the product input wiring terminals, power cord, or  
supplied power cord set. Whenever it is likely that the protection has been  
impaired, the product must be made inoperative and secured against any  
unintended operation.  
Before Applying Power Verify that the product is configured to match the available main power  
source as described in the input power configuration instructions in this  
manual. If this product is to be powered by auto-transformer, make sure the  
common terminal is connected to the neutral (grounded) side of the ac power  
supply.  
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Typeface Conventions  
Not all of the following conventions may appear within this manual,  
however, refer to this listing whenever you encounter on of the special font  
characters.  
Italics • Used to emphasize important information:  
Use this software only with the HP 8517B Test Set.  
• Used for the title of a publication:  
Refer to the HP 8517B S-Parameter Test Set Manual  
• Used to indicate a variable:  
Type LOAD BIN filename.  
Instrument Display  
• Used to show on-screen prompts and messages that you will see on the  
display of an instrument:  
The HP 8517B will display the message CAL1 SAVED.  
Keycap  
• Used for labeled keys on the front panel of an instrument or on a  
computer keyboard:  
Press [Return].  
Softkey  
• Used for simulated keys that appear on an instrument display:  
Press {Prior Menu}.  
User Entry  
• Used to indicate text that you will enter using the computer keyboard;  
text shown in this typeface must be typed exactly as printed:  
Type LOAD PARMFILE  
• Used for examples of programming code:  
#endif // ifndef NO_CLASS  
Path Name  
• Used for a subdirectory name or file path:  
Edit the file usr/local/bin/sample.txt  
Computer Display  
• Used to show messages, prompts, and window labels that appear on a  
computer monitor:  
The Edit Parameters window will appear on the screen.  
• Used for menus, lists, dialog boxes, and button boxes on a computer  
monitor from which you make selections using the mouse or keyboard:  
Double-click EXIT to quit the program.  
HP 8517B S-Parameter Test Set Manual ix  
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x
HP 8517B S-Parameter Test Set Manual  
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Contents  
Notice . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ii  
Restricted Rights Legend . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ii  
What You’ll Find in This Manual… . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iii  
HP 8517B S-Parameter Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . iii  
Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iv  
Certification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iv  
Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iv  
Assistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . v  
Service and Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . vi  
Safety and Regulatory Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . vii  
Safety Earth Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . viii  
Before Applying Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . viii  
Typeface Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ix  
1.  
Getting Started  
How to Use This Manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1  
Test Set Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-2  
Figure 1-1. Standard HP 8517B Test Set Block Diagram . . . . . . . . . 1-2  
Figure 1-2. Option 004, HP 8517B Test Set Block Diagram . . . . . . . 1-3  
Figure 1-3. Option 007, HP 8517B Test Set Block Diagram . . . . . . . 1-3  
HP 8517B Test Set Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-4  
Table 1-1. HP 8517B Options and Descriptions . . . . . . . . . . . . . . . . 1-4  
Verifying Test Set Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-5  
Table 1-2. Test Set Operation Verification . . . . . . . . . . . . . . . . . . . . . 1-5  
Checking System Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-5  
Checking Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-5  
Troubleshooting the Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-5  
Maintaining Measurement Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-6  
Instruments Supported by This Manual . . . . . . . . . . . . . . . . . . . . . . . . . . 1-7  
Figure 1-4. Instrument Serial-Number Label Example . . . . . . . . . . . 1-7  
Instrument Firmware Compatibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-8  
Table 1-3. Source Firmware Revision Compatibility Matrix . . . . . . . 1-8  
Service and Support Options Available . . . . . . . . . . . . . . . . . . . . . . . . . . 1-9  
Table 1-4. Service and Support Options . . . . . . . . . . . . . . . . . . . . . . 1-9  
Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-10  
Recommended Test Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-12  
Table 1-6. Recommended Test Equipment . . . . . . . . . . . . . . . . . . . . 1-12  
Operating and Safety Precautions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-13  
Table 1-7. Maximum Input Power Levels . . . . . . . . . . . . . . . . . . . . 1-13  
Safety Precautions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-13  
HP 8517B S-Parameter Test Set Manual Contents-1  
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2.  
Installation  
Initial Inspection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-2  
Operating Environment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-2  
Storing the Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-2  
Accessories Supplied . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-2  
Figure 2-1. Accessories Supplied with the HP 8517B Test Set . . . . 2-3  
Table 2-1. Accessories in Figure 2-1 . . . . . . . . . . . . . . . . . . . . . . . . 2-3  
Installing the Test Set Into a System Rack . . . . . . . . . . . . . . . . . . . . . . . 2-4  
Installing the Test Set on a Bench . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-4  
Figure 2-2. Recommended Static-Free Workstation Configuration . 2-4  
Configuring the Test Set in a System . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-5  
Figure 2-3. Configuring an HP 8517B Test Set in a System . . . . . . 2-5  
Connecting the System Cables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-6  
Table 2-2. Connection Instructions and Connector Descriptions . . 2-6  
Connect System Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-6  
and Control Cables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-6  
Signal Path Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-6  
Test Port Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-6  
Anti-Rotation Clamp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-6  
Replacing O-Rings in Anti-Rotation Clamps . . . . . . . . . . . . . . . . . . 2-6  
Packaging the Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-7  
3.  
Operating the HP 8517B Test Set  
Front-Panel Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-1  
Figure 3-1. Front-Panel Features of the HP 8517B Test Set . . . . . . 3-1  
Table 3-1. Front-Panel Description . . . . . . . . . . . . . . . . . . . . . . . . . 3-1  
Rear-Panel Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-2  
Figure 3-2. Rear-Panel Features of the HP 8517B Test Set . . . . . . . 3-2  
Table 3-2. Rear-Panel Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . 3-2  
Controlling Multiple Test Sets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-3  
Figure 3-3. RF and IF Switching with Two Test Sets . . . . . . . . . . . . 3-4  
Table 3-3. RF and IF Switch Settings in Figure 3-3, Above . . . . . . . 3-4  
Multiple Test-Set Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-5  
Initialization at Power-Up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-5  
Selecting a Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-5  
Table 3-4. Selecting a Test Set When Multiple Units are Configured 3-6  
Test Set IF Switching . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-6  
Test Set Addressing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-6  
RF Switch Driver Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-6  
Figure 3-4. RF and IF Switching with Four Test Sets . . . . . . . . 3-7  
Table 3-5. Coaxial Switch Settings for Figure 3-4, Above . . . . . . . . 3-7  
Measurement Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-8  
Measuring High-Power Devices with Option 004 . . . . . . . . . . . . . . . . . 3-9  
Changing Signal Path States After System Calibration . . . . . . . . . . . . . 3-10  
Changing the Test Port Attenuators . . . . . . . . . . . . . . . . . . . . . . . . 3-10  
Storing Trace Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-11  
Viewing Normalized Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-11  
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Making Operational Checks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-13  
Performance Verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-14  
Using Anti-Rotation Clamps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-15  
Attach the first clamp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-15  
Figure 3-5. Using a Torque Wrench Correctly . . . . . . . . . . . . . . . . 3-16  
Positioning the thumb-screw . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-16  
Figure 3-6. Visually Aligning Clamp and Nut Flats . . . . . . . . . . . . 3-17  
Positioning the connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-17  
Figure 3-7. Mating the Clamp and Nut Flats . . . . . . . . . . . . . . . . . 3-17  
Aligning the thumb-screw . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-18  
Figure 3-8. Aligning the Thumbscrew With the Counter-Sink Hole 3-18  
Attaching the second clamp . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-18  
4.  
5.  
Specifications  
Mechanical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-1  
Supplemental Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-1  
Table 4-1. HP 8510/HP 8517B Mechanical Specifications . . . . . . . 4-1  
Table 4-2. HP 8510/HP 8517B Supplemental Characteristics . . . . . 4-1  
Troubleshooting the Test Set  
Theory of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-2  
Figure 5-1. Standard HP 8517B RF Block Diagram . . . . . . . . . . . . 5-2  
The RF Source Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-2  
The Reference Signal Path . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-3  
The Test Signal Path . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-3  
The S and S Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-3  
11  
21  
The Sampler Control Switching . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-3  
The LO Signal Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-4  
Troubleshooting Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-5  
Figure 5-2. Troubleshooting Flowchart . . . . . . . . . . . . . . . . . . . . . . 5-5  
Equipment Needed But Not Supplied . . . . . . . . . . . . . . . . . . . . . . . . 5-6  
Table 5-1. Equipment Required, But Not Supplied . . . . . . . . . . . . . . 5-6  
Troubleshooting Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-7  
Table 5-2. Power Supply Voltages to A15 . . . . . . . . . . . . . . . . . . . . . 5-7  
Table 5-3. Power Supply Voltages to A27 . . . . . . . . . . . . . . . . . . . . . 5-7  
Figure 5-3. Power Supply Fuses and Test Points . . . . . . . . . . . . . . . 5-8  
HP-IB Address Switch . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-8  
Figure 5-4. Instrument HP-IB Switch Setting . . . . . . . . . . . . . . . . . . 5-9  
Fuse Location . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-9  
Figure 5-5. Fuse and Voltage Cam Location . . . . . . . . . . . . . . . . . . . 5-9  
Figure 5-6. The ACTIVE LED Location . . . . . . . . . . . . . . . . . . . . . 5-10  
If the Self-Test Fails to Run Properly . . . . . . . . . . . . . . . . . . . . 5-10  
Figure 5-7. HP 8518B Test Set, A4 Board Assembly LEDs . . . . . . . 5-11  
Table 5-4. Instrument Self-Test Indicator State Definitions . . . . . . 5-11  
Figure 5-8. Service Adapter Connections . . . . . . . . . . . . . . . . . . . . 5-12  
Using the Service Adapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-12  
Service Adapter Conclusions . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-13  
Table 5-5. Results Observations . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-13  
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Unratioed Power Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14  
Figure 5-9. Diagram of IF Signal Path . . . . . . . . . . . . . . . . . . . . . 5-14  
Isolating Signal Path Problems . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14  
Testing Signal Paths 1-4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14  
Testing Paths 5 and 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-16  
Figure 5-10. RF Path 1 and Path 2, HP 8517B Standard Test Set . 5-17  
Figure 5-11. RF Path 3 and Path 4, HP 8517B Standard Test Set . 5-18  
Figure 5-12. RF Path 5 and Path 6, HP 8517B Standard Test Set . 5-19  
Figure 5-13. RF Path 1 through Path 4,  
HP 8517B Option 007 Test Set . . . . . . . . . . . . . . . . . . . . . . . . . 5-20  
Figure 5-14. RF Signal for Path 1 through Path 4,  
HP 8517B Option 007 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-21  
Figure 5-15. RF Path 5 and Path 6, HP 8517B Option 007 . . . . . . 5-22  
Table 5-6. Test Results for Path 1 through Path 6 . . . . . . . . . . . . . 5-23  
Sample Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-23  
Table 5-7. Most Probable Failures  
(B indicates Bad; — indicates Good) . . . . . . . . . . . . . . . . . . . . 5-23  
6.  
HP 8517B Test Set Replacement Procedures  
Figure 6-1. ESD-Safe Workstation Configuration . . . . . . . . . . . . . . 6-2  
Performance Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2  
Adjustments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2  
Equipment Needed But Not Supplied . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-3  
Table 6-1. Replacement-Procedure Tools Needed . . . . . . . . . . . . . . 6-3  
Figure 6-2. HP 8517B Major Assembly Location Diagram . . . . . . 6-4  
Assembly Replacement Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5  
Initial Precautions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5  
Switch/Splitter Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5  
A18 Switch/Splitter Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5  
Frequency Converter Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5  
A14, A10 to A13 Frequency Converter Assembly . . . . . . . . . . 6-5  
Regulator Board Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-6  
A15 Regulator Board Assembly . . . . . . . . . . . . . . . . . . . . . . . . . 6-6  
Filter Capacitor Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-6  
C1 to C4 Filter Capacitors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-6  
Test Port Connector Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-7  
2.4 mm Test Port Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-7  
Figure 6-3. Diagram of 2.4 mm Test Port Connector . . . . . . . . . . . . 6-7  
Fan Assembly Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-8  
B1 Fan Assembly . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-8  
Power Transformer Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-8  
T1 Power Transformer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-8  
Figure 6-4. Wire Connections to FL1 Line Module . . . . . . . . . . . . . 6-9  
O-Ring Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-10  
Figure 6-5. Positioning the O-Ring Within the Clamp . . . . . . . . . . 6-10  
Front Panel and Interface Board Replacement . . . . . . . . . . . . . . . . 6-10  
A1 Front Panel and Interface Board Assembly . . . . . . . . . . . . 6-10  
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Bias Tees Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-11  
A7 and A9 Bias Tees . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-11  
Test Port Coupler Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-11  
A6 and A8 Test Port Couplers . . . . . . . . . . . . . . . . . . . . . . . . . . 6-11  
Test Port Attenuator Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . 6-11  
A16 or A17 Port Attenuators . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-11  
Input Amplifier Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-12  
A22 Input Amplifier Assembly . . . . . . . . . . . . . . . . . . . . . . . . . 6-12  
Buffer Amplifier Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-12  
A23 to A26 Buffer Amplifiers . . . . . . . . . . . . . . . . . . . . . . . . . . 6-12  
Post Regulator Board Replacement . . . . . . . . . . . . . . . . . . . . . . . . . 6-13  
A27 Post Regulator Board Assembly . . . . . . . . . . . . . . . . . . . . 6-13  
7.  
HP 8517B Replaceable Parts  
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-1  
Rebuilt-Exchange Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-1  
Replaceable Parts List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-1  
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-2  
To Order Parts . . . . Fast! . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-2  
Table 7-1. Reference Designation Abbreviations . . . . . . . . . . . . . . 7-2  
Table 7-2. Manufacturer Names and Addresses . . . . . . . . . . . . . . . . 7-3  
Table 7-3. Standard Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 7-4  
Table 7-4. Multipliers, Abbreviation and Description . . . . . . . . . . . 7-10  
Figure 7-1. Power Cable and Plug Part Numbers . . . . . . . . . . . . . . 7-11  
Table 7-5. Instrument Fuses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-12  
Figure 7-2. The Low Cost Rebuilt-Exchange Procedure . . . . . . . . . 7-13  
Table 7-6. Major Assembly Reference Designator and Parts Information  
7-14  
Figure 7-3. Major Assembly Locations in the Standard  
HP 8517B Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-15  
Table 7-7. Semi-Rigid Cable Assemblies in the Standard  
HP 8517B Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-16  
Table 7-8. Flexible Cable Assemblies in the Standard  
HP 8517B Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-17  
Table 7-9. Miscellaneous Parts, Front Panel HP 8517B Test Set . . 7-19  
Table 7-10. Test Port Connector Assembly Components . . . . . . . . . 7-20  
Table 7-11. Miscellaneous Parts, Rear Panel HP 8517B Test Set . . 7-21  
Figure 7-4. Detailed Views of Hardware Stack-Ups . . . . . . . . . . . . 7-23  
Table 7-12. Miscellaneous Parts, Top Internal View . . . . . . . . . . . . 7-24  
Table 7-13. Miscellaneous Parts, Motherboard . . . . . . . . . . . . . . . 7-25  
Table 7-14. Parts Unique to HP 8517B Option 001 Test Set . . . . . . 7-27  
Table 7-15. Parts Unique to HP 8417B Option 002 Test Set . . . . . . 7-29  
Table 7-16. Parts Unique to HP 8517B Option 004 Test Set . . . . . . 7-30  
Table 7-17. Parts Unique to HP 8517B Option 007 Test Set . . . . . . 7-31  
Table 7-18. Parts Unique to Option 002 “plus” Option 007 . . . . . 7-33  
Table 7-19. Parts Unique to Option 004 “plus” Option 007 . . . . . 7-34  
Table 7-20. Instrument Chassis Replaceable Parts . . . . . . . . . . . . . 7-35  
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1
Getting Started  
This is the operating and service manual for the HP 8517B S-parameter test  
set. It is to be used in conjunction with the HP 8510C Network Analyzer  
Operating and Service Manual. Together, these manuals provide  
information needed to configure the system and make measurements.  
How to Use This Manual  
Step 1.  
Review Chapter 1, “Getting Started” and Chapter 2, “Installation” of this manual to  
learn about:  
•
•
•
•
•
•
Using this test set  
Using options of the test set  
Preparing the site for operation  
Understanding safety considerations  
Unpacking the instrument and checking it for shipment damages  
Configuring the HP 8517B test set with the HP 8510C Network Analyzer  
Step 2.  
Step 3.  
Insert the contents of this manual into the HP 8510C Test Sets and Accessories  
binder behind the tab labeled “Test Sets.”  
Review the Connector Care Quick Reference Card (HP part number 08510-90360)  
supplied with the HP 8510C manuals set.  
Refer to the calibration kit documentation for complete information about care,  
cleaning, gaging, and connecting precision devices. Knowledge and application of  
proper connector care is essential to achieving good connections and maintaining  
maximum performance quality with your precision calibration devices.  
Step 4.  
Step 5.  
Read Chapter 3, “Operation,” to learn about test set front- and rear-panel features.  
This chapter also has information about controlling multiple test sets, measuring  
high power devices, using the anti-rotation clamps on the cables, and connecting  
devices to the test set.  
Refer to Chapters 4 through 7 for reference information about specifications,  
troubleshooting, replacement procedures, and replacement parts information.  
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Getting Started  
Test Set Description  
Test Set Description  
The HP 8517B test set configured with an HP 8510B/C network analyzer  
and an HP 8360 series source, creates a system capable of making  
S-parameter measurements from 45 MHz to 50 GHz. The system is  
particularly suited for making two-port device measurements. You can  
measure all four S-parameters without physically reversing the DUT (device  
under test).  
The system is also designed for making measurements on non-reciprocal  
devices or components like transistors, amplifiers or isolators where S  
measurements are required.  
12  
Two directional couplers are used for signal separation. The configuration is  
illustrated in the following figures:  
• Figure 1-1, “Standard HP 8517B Test Set Block Diagram"  
• Figure 1-2, “Option 004, HP 8517B Test Set Block Diagram"  
• Figure 1-3, “Option 007, HP 8517B Test Set Block Diagram"  
For active-device measurements, two bias tees apply external DC bias to  
both test port center conductors.  
Figure 1-1 Standard HP 8517B Test Set Block Diagram  
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Getting Started  
Test Set Description  
Figure 1-2 Option 004, HP 8517B Test Set Block Diagram  
Figure 1-3 Option 007, HP 8517B Test Set Block Diagram  
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Getting Started  
HP 8517B Test Set Options  
HP 8517B Test Set Options  
Options for the HP 8517B test set are described in Table 1-1, below.  
Table 1-1 HP 8517B Options and Descriptions  
Options  
HP 8517B Test Set Option Description  
Option 001  
Adds IF switching capability for up to four test set connections to the HP 8510C Network  
Analyzer.  
The test set used is selected from the network analyzer. Refer to “Controlling Multiple Test  
Sets” in Chapter 3, “Operation” of this manual for more information.  
Option 002  
Option 004  
Deletes the programmable attenuators and bias tees.  
Note: If bias is required but attenuation is not, the bias can be applied externally by using an  
HP 11612B bias tee.  
Moves Port 2 attenuator in front of the b2 sampler, allowing devices with output power up to 30  
dBm (1 W) to be measured. Adds a 3 dB attenuator which protects the switch splitter from high  
power into Port 2.  
Option 007  
Option 908  
Adds five amplifiers, two 10 dB attenuators, two 6 dB attenuators, and two tapered attenuators.  
These components increase the available power and dynamic range of the test set.  
Supplies the hardware required for rack mounting the test set when its handles are removed.  
Refer to Chapter 2, “Installation” for more information.  
Option 910  
Option 913  
Adds a duplicate copy of this manual to the shipment.  
Supplies the hardware required for rack mounting the test set with its handles attached. Refer  
to Chapter 2, “Installation” for more information.  
Option 002 “plus” 007  
Option 004 “plus” 007  
Removes the bias tee, and retains the high dynamic range capability in the test set.  
Adds high-dynamic range and high power measurement capability to Port 2.  
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Getting Started  
Verifying Test Set Operation  
Verifying Test Set Operation  
The test set is designed to operate with an HP 8510C network analyzer. You  
can verify its operation by:  
Table 1-2 Test Set Operation Verification  
Checking System Operation  
Checking Specifications  
Perform a system calibration as described in the HP 8510C Operating and  
Programming Manual. A successful calibration indicates that the system, and  
therefore the test set, are operating properly.  
Specifications for the test set, and the system, can be determined by running  
the specification and performance verification software described in the HP  
8510C On-Site Service Manual, Chapter 8, “Specification and Performance  
Verification”. Additional mechanical specifications and supplemental  
characteristics are in Chapter 4, “Specifications” of this manual.  
Troubleshooting the Test Set  
To troubleshoot the test set, refer to the HP 8510C On-Site Service Manual.  
Use the information in that manual to determine if the test set is at fault. If the  
test set is at fault, refer to Chapter 5, “Troubleshooting the Test Set” in this  
manual to isolate the trouble.  
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Getting Started  
Maintaining Measurement Accuracy  
Maintaining Measurement Accuracy  
Precision measurements rely on a precision calibration of the network  
analyzer. As a general rule, the shorter the time lapse between a calibration  
and a device measurement, the more precise the measurement results will be  
(within the limitations of your system).  
Hewlett-Packard recommends calibrating your system every few hours, or at  
least re-verifying your system’s calibration this frequently. Doing so helps  
retain measurement precision.  
The frequency of calibrations is determined by both the location of the  
system and the ambient temperature stability in its operating area.  
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Getting Started  
Instruments Supported by This Manual  
Instruments Supported by This Manual  
A serial number label is attached to the rear panel of the test set. There are  
two parts to the serial number: a prefix, and a suffix. See Figure 1-4, and  
read the following descriptions:  
• The prefix includes the first four digits of the serial number, plus the  
letter. The contents of this manual apply directly to test sets with the  
same serial number prefix as the one(s) on the title page.  
• The suffix includes the last five digits of the serial number, which is  
sequential and unique to each test set. You will need this part of the  
number to report test-set problems to an HP sales and service engineer.  
serial.tif  
Figure 1-4 Instrument Serial-Number Label Example  
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Getting Started  
Instrument Firmware Compatibility  
Instrument Firmware Compatibility  
To use the HP 8517B test set at frequencies up to 50 GHz, use an  
HP 83650B or HP 83651B source.  
If your network analyzer or source do not meet the required frequency  
ranges for your measurement needs, you need to upgrade your system.  
Please contact an HP Sales and Service representative for information. These  
offices are listed in “Service and Support” on page vi at the front of this  
manual  
Table 1-3 Source Firmware Revision Compatibility Matrix  
Compatible With HP  
8340 Series  
Sources?  
Compatible With  
HP 8350 Series  
Sources?  
Instrument Model  
Number and Name  
Compatible With Model:  
Firmware Revision  
HP 8517B Test Set  
HP 8510B Network Analyzer  
HP 8510C Network Analyzer  
B.06.00 and higher  
C.06.00 and higher  
Yes, up to the higher  
frequency limits.  
Yes, up to the higher  
frequency limits.  
HP 8517B,  
HP 8510C Network Analyzer  
7.0 or higher, only  
Yes, up to the higher  
frequency limits.  
No, not compatible  
Option 007 Test Set  
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Getting Started  
Service and Support Options Available  
Service and Support Options Available  
A variety of service and support products are available for coverage of  
repair, calibration, and verification issues. Contact your HP sales and service  
engineer for details. Their office addresses and phone numbers are listed in  
the front of this document.  
The purchase of an HP 8517B includes a one year on-site service warranty.  
In the event of failure, Hewlett-Packard provides service for the system.  
NOTE  
System installation is not included.  
Table 1-4 Service and Support Options  
Option Number  
Option Description  
Option W30  
Adds a three year customer return-repair coverage warranty to the instrument.  
Customers may return the instrument to HP within that three year period for repair.  
Option W31  
Adds a three year on-site repair coverage warranty for next-day on-site repair of the  
instrument. Customers may return the instrument to HP within that three year period for  
repair and get next-day service on their instrument.  
Option 1BN  
Option 1BP  
Adds to the instrument a MIL-STD 45662A Certificate of Calibration. This option must be  
ordered when the instrument order is placed.  
Adds to the instrument a MIL-STD 45662A Certificate of Calibration and the  
corresponding calibration data. This option must be ordered when the instrument order is  
placed.  
Option UK6  
Adds a certificate of calibration (rather than the MIL-STD certificate) and the  
corresponding calibration data to the instrument. This option must be ordered when the  
instrument order is placed.  
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Getting Started  
Accessories  
Accessories  
The accessories supplied with the test set, including part numbers, are listed  
in “Accessories Supplied” in this section and in the “Replaceable Parts List”  
of this manual.  
Accessories Available  
Table 1-5 describes accessories available for the HP 8517B test set. For  
additional HP 8510C system accessories information, refer to the HP 8510C  
manual set.  
Table 1-5 HP 8517B Test Set Accessories Available  
Accessory Type  
Accessory Model Number  
Contents or Description  
Calibration Kit1  
HP 85056A 2.4 mm Calibration Kit  
Contains open and short circuits  
Fixed and sliding loads (2)  
2.4 mm to 2.4 mm adapters  
2.4 mm connector tools and gauges  
Verification Kit1  
Cables  
HP 85057S 2.4 mm Verification Kit  
Contains precision airline, mismatched airline,  
20 dB and 40 dB attenuators  
HP 85133C 2.4 mm Test Port Return  
Cable  
Used when measuring a 2.4 mm-ported device connected directly to  
Port 1 of the test set. The test port return cable is connected  
between the device under test and Port 2.  
HP 85133D 2.4 mm Test Port Return  
Cable Set  
Used when measuring a 2.4 mm-ported device connected between  
the cable ends.  
HP 85133E 2.4 mm Flexible Test Port  
Return Cable  
Used when measuring a 2.4 mm-ported device connected directly to  
Port 1 of the test set. The test port return cable is connected  
between the device under test and Port 2.  
HP 85133F 2.4 mm Flexible Test Port  
Return Cable Set  
Used when measuring a 2.4 mm-ported device connected between  
the cable ends.  
HP 85134D 3.5 mm Test Port Return  
Cable Set  
Used when measuring a 3.5 mm device under test connected  
between the cable ends.  
HP 85134E 3.5 mm Flexible Test Port  
Return Cable  
Used when measuring one end of a 3.5 mm device connected  
directly to an HP 85130F adapter at Port 1. The test-port return  
cable is connected between the device and Port 2.  
HP 85134F 3.5 mm Flexible Test Port  
Return Cable Set  
Used when measuring a 3.5 mm device connected between the  
cable ends.  
HP 85135C 7 mm Test Port Return  
Cable  
Used when measuring one end of a 7 mm device connected  
directly to an HP 85130E adapter at Port 1. The test port return  
cable is connected between the device and Port 2.  
Cables (Continued)  
HP 85135D 7 mm Test Port Return  
Cable Set  
Used when measuring a 7 mm device connected between the cable  
ends.  
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Getting Started  
Accessories  
Table 1-5 HP 8517B Test Set Accessories Available (Continued)  
Accessory Type  
Accessory Model Number  
Contents or Description  
HP 85135E 7 mm Flexible Test Port  
Return Cable  
Used when measuring one end of a 7 mm device connected directly  
to an HP 85130E adapter at Port 1. The test port return cable is  
connected between the device and Port 2.  
HP 85135F 7 mm Flexible Test Port  
Return Cable Set  
Used when measuring a 7 mm device connected between the cable  
ends.  
Adapters  
HP 85130E Special 2.4 mm to 7 mm  
Adapter Set  
Used to convert special 2.4 mm test set ports into a 7 mm connector  
interface (m or f).  
HP 85130F Special 2.4 mm to 3.5 mm  
Adapter Set  
Used to convert special 2.4 mm ports of the test set into a 3.5 mm  
connector interface (m or f).  
HP 85130G Special 2.4 mm to 2.4 mm  
Adapter Set  
Used to convert special 2.4 mm ports of the test set into a standard  
2.4 mm connector interface (m or f). These adapters function as  
“test port savers.”  
HP 11904S 2.4 mm to K-2.9 mm2  
Adapter Kit  
Used to calibrate the test set using 2.4 mm devices, then to change  
the test ports to 2.92 mm and perform fully error corrected  
measurements. The kit contains (2) 2.4 mm to 2.92 mm (m)  
adapters and (2) 2.4 mm to 2.92 (f) adapters.  
Test Fixture Kit  
HP 85041A Transistor Test Fixture Kit  
(TTF)  
A comprehensive measurement system for testing and  
characterizing stripline packaged microwave transistors. Although  
the fixture contains 7 mm connectors and its frequency limit is  
18 GHz, the kit may be adapted for use with the test set. Use  
HP 85135C or HP 85135E cables with the HP 85130E adapter set.  
Please consult your HP Sales and Service representative for  
recommendations.  
1. NIST traceable data and uncertainties are available.  
2. The K-connector is developed and manufactured by the Wiltron Company (Morgan Hill, California).  
NOTE  
For more information about other 2.4 mm adapters, refer to the “2.4 mm  
Adapters and Calibration Accessories,” Operating Note, (HP part number  
11900-90003).  
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Getting Started  
Recommended Test Equipment  
Recommended Test Equipment  
Additional equipment and accessories required for use with the test set are  
listed in Table 1-6. The table lists which items are required to verify the  
performance of the test set and which are required to operate it. Other  
equipment may be substituted if their specifications meet or exceed those  
listed in the critical specifications column  
Table 1-6 Recommended Test Equipment  
Critical  
Specifications  
Item  
Recommended Model  
Use  
Network Analyzer  
Source  
no substitute  
no substitute  
no substitute  
HP 8510B or HP 8510C  
HP 83651B  
O, P, T  
O, P, T  
N/A  
Controller  
HP 9000 Series 200 or 300 with 3 Mbyte RAM and  
HP BASIC 3.0 or higher or PCC-305 or PC-308  
HP BASIC Controller with 3 Mbyte Basic Language  
Processor RAM  
Disk Drive  
is compatible with the  
controller  
is compatible with the controller  
P
Multimeter  
range: 0 to 50 V  
HP 3456A  
HP 1740A  
T
T
Oscilloscope  
50 MHz bandwidth  
O = Operation; P = Performance Test; T = Troubleshooting  
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Getting Started  
Operating and Safety Precautions  
Operating and Safety Precautions  
CAUTION  
ESD Sensitive Assemblies  
Test set assemblies are very sensitive to damage from electrostatic discharge.  
They may or may not continue to function if subjected to electrostatic  
discharge. Their reliability, however, will be impaired. Handle the  
instrument devices at static-safe work stations, only.  
Operating Precautions  
Observe the following normal precautions when handling and operating the  
test set:  
• Do not exceed the input power levels listed below:  
Table 1-7 Maximum Input Power Levels  
Power Level  
+17 dBm  
Test Port  
Port 1  
+17 dBm  
Port 2  
+30 dBm1  
Port 2 (Option 004, or Option 004 “plus” 007)  
1. This is the maximum input power allowed with HP 8517B Option 004, or  
Option 004 “plus” Option 007, when the attenuator is set to  
attenuation, the maximum input power allowed is +17 dBm.  
≤20 dB. Without  
• Do not exceed +15 dBm into the test set with the source RF input.  
• Never apply a dc voltage to the source RF input of the test set.  
• Do not torque any connection at the test port connectors to more than  
90 N-cm (8 in-lb). The wrench supplied with your accessory kit is  
calibrated for 90 N-cm (8 in-lb) torque.  
• Do not torque any connection to more than 90 N-cm (8 in-lb) at the  
source RF input or on the back of your test set.  
Safety Precautions  
The voltages inside this test set warrant normal caution for operator safety.  
Nevertheless, service should be performed by qualified personnel, only.  
Service strategy, troubleshooting procedures, replaceable parts, and other  
information about the test set are provided in this manual or the HP 8510C  
On-Site Service Manual.  
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Getting Started  
Operating and Safety Precautions  
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2
Installation  
This chapter contains installation information. Topics include initial  
inspection, environmental considerations, test set location when using it with  
the HP 8510C network analyzer, and making connections to the test set.  
Refer to “Installation” in the HP 8510C On-Site Service Manual for  
complete system connection and turn-on instructions.  
Refer to “Packaging the Test Set” for information about shipping the  
instrument.  
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Installation  
Initial Inspection  
Initial Inspection  
Inspect the shipping container and cushioning materials for damage. If there  
is damage, keep the container until you have checked the contents for  
completeness.  
If shipping materials are damaged, complete the performance tests outlined  
in the HP 8510C On-Site Service Manual. If the test set fails the  
performance tests, or is damaged or defective, keep the shipping materials.  
Notify both the carrier and the nearest Hewlett-Packard Sales and Service  
Office (listed in “Service and Support” at the front of this manual).  
The office can arrange for repair or replacement of the test set without  
waiting for the claim settlement.  
Operating  
Environment  
For the HP 8517B to operate within specifications, the ambient temperature  
must remain between 0° C and +55° C. Keep relative humidity to less than  
95% (at 40° C dry bulb temperature, maximum). The instrument can be  
operated at altitudes up to 4,500 meters (15,000 feet).  
Storing the Test Set  
Accessories Supplied  
Acceptable storage temperatures range from –40° C to +75° C, with relative  
humidity ≤90% at +65° C (maximum dry bulb temperature) and at altitudes  
up to 15,240 meters (50,000 feet).  
Figure 2-1 illustrates accessories supplied with the test set. If you did not  
receive one of these accessories with the test set, notify your nearest HP  
Sales and Service Office so that the missing parts can be sent to you.  
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Installation  
Initial Inspection  
Figure 2-1 Accessories Supplied with the HP 8517B Test Set  
Table 2-1 Accessories in Figure 2-1  
(1) Power Cord U.S.A. only  
(6) Female 2.4 mm to Female 2.4 mm Adapter  
(7) 20 mm, 98 N-cm (8 in-lb) Torque Wrench  
(8) 1/2” x 9/16” Open End Wrench  
(2) Test Set Interconnect Cable  
(3) HP-IB Cable  
(4) Specification and Performance Verification Software  
(5) Anti-rotation Clamps  
(9) RF Source Cable, Bench-top Configuration  
(10) RF Source Cable, Rack Configuration  
CAUTION  
CAUTION  
Assemblies in the test set are extremely sensitive to damage by static  
electricity. They may or may not continue to function if subjected to an  
electrostatic discharge. Their reliability, however, will be impaired.  
Always use an anti-static wrist strap when calibrating or verifying the test set  
or while using the test set to measure devices. Never touch test port center  
conductors. Use a wrist strap when connecting the extended center  
conductor of a sliding load termination.  
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Installation  
Installing the Test Set Into a System Rack  
Installing the Test Set Into a System Rack  
The HP 85043C system rack is the recommended model to use. To  
rack-mount the test set into a system configured with the HP 8510C, refer to  
the “Installation” chapter of the HP 8510C On-Site Service Manual and to  
the HP 85043C System Rack Manual.  
Installing the Test Set  
on a Bench  
When installing the test set for use on a bench, place it on a grounded  
anti-static work surface to reduce the chance of ESD damage. The antistatic  
surface should extend far enough in front of the test set to provide effective  
protection for the test ports and cable ends. See Figure 2-2.  
A grounding receptacle is provided on the test set as an alternate grounding  
point for your anti-static wrist-strap.  
Figure 2-2 Recommended Static-Free Workstation Configuration  
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Installation  
Configuring the Test Set in a System  
Configuring the Test Set in a System  
Figure 2-3 illustrates the cable connections for installing an HP 8517B in a  
system. Refer to the information that follows to install the test set.  
Figure 2-3 Configuring an HP 8517B Test Set in a System  
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Installation  
Configuring the Test Set in a System  
Connecting the System  
Cables  
Table 2-2 Connection Instructions and Connector Descriptions  
Connect System Power  
and Control Cables  
Check the test-set line module (see item (1) in Chapter 3, Figure 3-2 of this manual). It must be set for  
the correct voltage in your region. Refer to Chapter 5, “Troubleshooting” of this manual for information  
about changing the voltage selection or replacing the line fuse.  
•
•
•
After setting or confirming the line-voltage module, connect the test set power cord to an electrical  
outlet.  
Attach the HP 8517B IF-interconnect cable from J11 TEST SET INTERCONNECT (on the test set’s  
rear panel) to J1 TEST SET INTERCONNECT on the rear panel of the HP 85102 IF detector.  
Attach the system bus cable from HP 8517B J12 HP 8510 SYSTEM BUS connector to HP 8510C  
INTERCONNECT on the HP 85101 display/processor.  
The test set IF interconnect cable and the system bus cable transmit control signals between the test  
set and the network analyzer.  
Signal Path Connections  
The IF interconnect cable transmits IF signals from the test set to the HP 85102 IF detector.  
•
Attach one end of the 2.4 mm RF cable (item 9 or 10, Figure 2-1) to the RF output on the rear panel  
of the HP 83651 Synthesized Sweeper.  
•
Attach the other end of the RF cable to the RF input on the HP 8517B Test Set.  
Test Port Connectors  
Anti-Rotation Clamps  
Port 1 and Port 2 are male, NMD-2.4 mm connectors, and mate to female 2.4 mm connectors.  
Use the anti-rotation clamps (item 5, Figure 2-1) to stabilize the test port or RF cable at the  
connection, or to stabilize an adapter at the connection.  
•
•
•
Connect test port cables or adapters to the test ports.  
Torque the connections to 90 N-cm (8 in lb).  
Loosen the anti-rotation clamp thumb screw enough to slip the clamp over the cable and up to the  
front panel. The clamp end with the flats should come to rest on the flats of the test port shoulder.  
•
Finger-tighten the thumb screws to prevent further loosening or tightening of the test port/RF cable  
connection. Refer to Chapter 3, “Operation” of this manual for additional information.  
Replacing O-Rings in  
Anti-Rotation Clamps  
The anti-rotation clamp’s internal O-ring is a field-replaceable part. There is  
no need to disassemble the anti-rotation clamp.  
When the O-ring no longer holds the RF cable securely, replace it by  
following the instructions in Chapter 6, “Replacement Procedures.”  
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Installation  
Packaging the Test Set  
Packaging the Test Set  
To repackage the test set, use its original factory packaging.  
Refer to the test set using its complete model and serial numbers in any  
correspondence to an HP Sales and Service Office.  
Containers and materials identical to those used in the original shipment by  
the factory are available through Hewlett-Packard Sales and Service Offices.  
However, commercially available, comparable packaging materials may be  
used, also.  
1. Wrap the test set in heavy paper or anti-static plastic.  
2. If you are shipping the test set to an HP Sales or Service office, complete  
and attach a service tag (located in the HP 8510C manual set).  
3. Use sufficient shock absorbing material on all sides of the test set to  
provide a thick, firm cushion and prevent movement.  
4. Seal the shipping container securely and mark it “FRAGILE.”  
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Installation  
Packaging the Test Set  
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3
Operating the HP 8517B Test Set  
This chapter contains illustrations and descriptions of the HP 8517B front-  
and rear-panel features. Information about operating multiple test sets  
(Option 001) is also provided.  
Front-Panel Features  
Figure 3-1 Front-Panel Features of the HP 8517B Test Set  
Table 3-1 Front-Panel Description  
(1) Line Switch  
This switch turns the test set on or off. When the side of the switch labeled “0” is depressed, the  
test set is OFF; when the side labeled “1” is depressed, the test set is ON.  
(2) Line LED  
This LED is lit when the test set line switch is ON and not lit when the test set line switch is OFF.  
(3) Active LED  
This LED lights about two seconds after power is turned on, following the successful conclusion of  
the self-test. If the test set is used with other test sets (Option 001) and is not addressed by the HP  
8510C, then this light remains off.  
(4) Port 1  
This test port transmits RF energy from the source to the DUT and receives reflected or transmitted  
RF energy from the DUT. The reflected RF energy is coupled to a sampler within the instrument.  
Connections made to this input must be torqued to 90 N-cm (8 in-lb), and no more.  
(5) Bias Fuse  
The fuses that limit bias applied to Port 1 and Port 2 are located in these holders (see the  
instrument front panel or the replaceable parts list for the fuse values).  
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Table 3-1 Front-Panel Description (Continued)  
(6) a1 LED  
(7) a2 LED  
(8) Port 2  
This LED indicates that the test set is internally switched to the S11 or S21 mode and source power  
is switched to Port 1.  
This LED indicates that the test set is internally switched to the S22 or S12 mode and source power  
is switched to Port 2.  
This test port transmits RF energy from the source to the DUT and receives reflected or transmitted  
RF energy from the DUT.  
Rear-Panel Features  
Figure 3-2 Rear-Panel Features of the HP 8517B Test Set  
Table 3-2 Rear-Panel Descriptions  
(1) Line Module  
Houses the line cord connector, line fuse and line voltage selector. Pull out the right side  
of the line module cover to replace or change the fuse or to change the voltage selection.  
Remove the voltage selector drum to rotate it to a different voltage setting. Recommended  
fuse values are printed on the rear panel.  
(2) RF Input  
A 2.4 mm connector that receives RF energy from the source. Connections made to this  
input must be torqued no more than 90 N-cm (8 in-lb).  
(3) J10 Test Set Interconnect  
Used only in test sets with Option 001. It allows connecting another test set to the option  
001 test set. Up to four test sets can be serially connected to the analyzer. The HP 8510C  
system automatically selects the IF output from the chosen test set for processing and  
display. Refer to “Controlling Multiple Test Sets” in this chapter for more information.  
(4) J11 Test Set Interconnect  
Transmits the IF signal from the test set to the HP 85102 IF detector. It also transmits  
control signals bi-directionally.  
(5) HP 8510 System Bus Address Switch  
A five-pole binary-weighted switch sets the test-set’s system bus address. The binary  
weight of each pole is indicated on the rear panel. So are the On and Off positions. The  
default setting is decimal twenty (off-off-on-off-on, from left to right).  
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Table 3-2 Rear-Panel Descriptions (Continued)  
(6) J12 8510 System Bus Connector  
Used for HP-IB communications with the HP 85101 display/processor.  
(7) Port 2 Bias  
A female BNC connector used to supply bias through the center conductor of Port 2 to  
active devices under test.  
(8) Port 1 Bias  
A female BNC connector used to supply bias through the center conductor of Port 1 to  
active devices under test.  
Controlling Multiple Test Sets  
HP 851X Series, Option 001 test sets allow an HP 8510C to alternately  
control up to four test sets connected to it. For example:  
• While a measurement is underway on test set number 1 (equipped with  
Option 001), a test device can be connected to test set number 2 (which  
does not need Option 001).  
• When the measurement on test set number 1 is complete, the HP 8510C  
can then control test set number 2.  
In a standard test set, the 20 MHz IF and control signals are applied directly  
to J11 TEST SET INTERCONNECT, which is attached to the HP 8510C.  
Option 001 adds a set of IF switches, control switches, and the J10 TEST  
SET INTERCONNECT attachment. This configuration allows the selection  
of the 20 MHz test set IF signal.  
As shown in Figure 3-3 on page 3-4, test set number 1 can:  
• apply its IF signal to the HP 8510C, or it can  
• switch to pass the IF signal from test set number 2, through J10 TEST  
SET INTERCONNECT, and into the HP 8510C.  
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Figure 3-3 RF and IF Switching with Two Test Sets  
Table 3-3 RF and IF Switch Settings in Figure 3-3, Above  
New ADDRESS of  
Test Set 1, 2  
Test Set Number  
Selected  
Coaxial Switch Port Selected  
20  
21  
Number 1  
Number 2  
Port 1  
Port 2  
1. Not all system connections are illustrated.  
2. In dual source configurations, the second source may be multiplexed in a similar manner. If only one  
dual source test set is used, the second source may be connected directly to the appropriate test  
set.  
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Multiple Test-Set Connections  
For dual test-set configurations, set each rear panel address switch on each  
test set to the address shown in Figure 3-3. Refer to Figure 3-4 on page 3-7  
for the configuration of two or more test sets.  
• Use the supplied test set interconnect cable to attach test set number 1,  
J11 to the network analyzer.  
• Use the supplied test set interconnect cable to attach test set number 2,  
J11 to test set number 1, J10.  
You may connect up to four test sets in a series if the total length of all test  
set interconnect cables does not exceed 13 meters (about 40 feet). The last  
test set connected in the chain does not require Option 001.  
If the RF coaxial switch is not incorporated into the system, the RF input to  
the test set must be manually switched to the active test set.  
Initialization at  
Power-Up  
At power-up, configure the IF switches so that only one system test set is  
active. To verify which test set is active, use the following steps:  
1. Verify that all system test set LEDs are lit.  
2. View the network analyzer’s test set address by pressing the  
INSTRUMENT STATE, [LOCAL] key, then press {TEST SET}. The HP-IB  
address of the test set is displayed on the screen.  
The address displayed must match the address of the test set selected. If  
not, enter the correct address using the network analyzer’s key pad.  
3. If an unselected test set’s LEDs are lit, deactivate it. Do this by entering  
its address, pressing [x1], then entering the address of the test set desired,  
followed by [x1].  
Selecting a Test Set  
To select another test set, follow the procedure in Table 3-4 on page 3-6 of  
this chapter.  
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Table 3-4 Selecting a Test Set When Multiple Units are Configured  
Test Set IF Switching  
A test set is selected via the built-in capability of the analyzer to generate an addressed  
command to each test set. Each time you change the {HP-IB ADDRESS} {TEST SET}  
function (refer to LOCAL [MENU] in the HP 8510C Operation and Service Manual), the  
network analyzer does the following:  
• switches the IF signal of the previously addressed test set to external  
• switches the IF signal of the newly addressed test set to internal  
• sets the test set’s front panel ACTIVE LED to indicate test-set status  
• applies the active test set’s IF signals directly to J11 TEST SET INTERCONNECT  
• passes the inactive test set’s IF signals at J10 through to J11 and on to the next  
test set or to the network analyzer  
Test Set Addressing  
You can change the test set address via program control, or via the network analyzer front  
panel keys. You must also change the mechanical switches on the test-set’s rear panel.  
Here’s how:  
1. Change the test set address via the network analyzer keys;  
a. On the analyzer’s front panel, press the INSTRUMENT STATE [LOCAL] key, then  
press {TEST SET}. The test set’s address appears on the display.  
b. Using the key pad, enter the desired address for the test set, then press [x1]. The new  
HP-IB address appears on the display.  
2. Change the test set address via the HP-IB command:  
From the controller, enter the HP-IB ADDRESS; command, followed by the  
address value. Refer to the command reference for programming details.  
3. Reset the mechanical switches on the test-set’s rear panel. Set the switches to match the  
new HP-IB address displayed on the network analyzer screen.  
RF Switch Driver Control  
When the {HP-IB ADDRESS} {TEST SET} function is changed, the network analyzer  
generates a code sequence. The code sequence is automatically issued across the  
HP 8510C system bus to the device at the ADDRESS of RF SWITCH .  
In the recommended configuration, the device is an HP 11713A attenuator/switch driver. The  
switch/driver in turn controls one or more coaxial switches. These switches, (shown in a  
Figure 3-3, and Figure 3-4) are used to choose which test set receives the RF output from the  
network analyzer source.  
The exact command issued depends upon the new value of the {HP-IB ADDRESS}  
{TEST SET} value, also shown in shown in a Figure 3-3 and Figure 3-4.  
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Figure 3-4 RF and IF Switching with Four Test Sets  
Table 3-5 Coaxial Switch Settings for Figure 3-4, Above  
New ADDRESS  
of Test Set1, 2, 3  
Test Set Selected1, 2, 3  
Coaxial Port Selected  
with Switch #1  
Coaxial Port Selected  
with Switch #2  
20  
21  
22  
23  
1
2
3
4
Port 1  
Port 1  
Port 2  
Port 2  
Port 1  
Port 2  
Port 1  
Port 2  
1. Not all system connections are shown.  
2. In dual source configurations, the second source can be multiplexed in a similar manner.  
3. If only one dual source test set is used, the second source can be directly connected to the  
appropriate test set.  
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Measurement Calibration  
After selecting the active test set, complete the system calibration procedure  
as usual. When you select a different test set, make sure that you recall the  
cal set that applies to that test set.  
NOTE  
Since the cal-set limited instrument state does not include the number of the  
active test set, a cal set which does not apply to the current test set can be  
turned on without displaying the HP 8510C caution messages. However, this  
causes errors in the data displayed because incorrect error coefficients are  
applied to the measured data.  
For convenience, store a hardware-state file and an instrument-state file for  
each combination of test set to cal set. You may also store your hardware  
state file on a tape or disk for future use.  
To change the configuration, recall the appropriate hardware state file. The  
hardware state file:  
• sets the address of test set  
• issues the RF switch command, then  
• recalls the appropriate instrument state file which  
• recalls the cal set  
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Measuring High-Power Devices with Option 004  
The HP 8517B, Option 004 test set enables devices with output power up to  
30 dBm (1 watt) to be measured at Port 2, without adding external  
attenuators. Reverse dynamic range (S ) degrades by approximately 3 dB.  
12  
When measuring devices having greater than +17 dBm output power, you  
must use the Port 2 step attenuator to decrease the power to ≤+17 dBm.  
The step attenuator has to be set during calibration for the value needed  
during device measurements. However, this setting may cause inadequate  
power level during calibration. Refer to “Changing Signal Path States After  
System Calibration” on page 3-10 for additional information.  
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Changing Signal Path States After System  
Calibration  
Changing an internal attenuator or any external equipment after completing  
the calibration means the measurement results cannot be specified. You must  
use your own estimation of the potential error contribution due to the  
change.  
For example, when the port attenuation is changed with correction ON, the  
message CAUTION: CORRECTION MAY BE INVALID displays. You must judge  
whether the error is tolerable in the particular application and how to  
compensate for the change.  
The application question is: “Does increasing the signal level during  
calibration improve the calibration enough to risk a possible increase in error  
contributions when you change the setup?”  
The only reason for changing an internal attenuator or external equipment  
between calibrations and measurements is to maximize the signal level  
under both conditions, thus minimizing uncertainty due to noise.  
Many factors enter into a setup-change decision, for example:  
• is it more accurate to calibrate at a low signal level without changing the  
setup, or  
• is it more accurate to change the setup to optimize levels for both the  
calibration and measurement  
Changing attenuators at Port 1 or Port 2 does not change the test set  
mismatch, directivity, or isolation characteristics severely. It does change the  
frequency response magnitude and phase, however. The difference between  
frequency response calibration and measurement can be normalized by using  
HP 8510C trace memories.  
Changing the Test Port  
Attenuators  
If only the attenuators at Port 1 or Port 2 are changed, use the following  
procedure to minimize errors:  
1. Connect a short, or a thru, and set Port 1 and Port 2 attenuators for the  
best IF signal levels during calibration.  
2. Perform the appropriate measurement calibration.  
3. Connect the correct calibration standard, set Port 1 and Port 2  
attenuators to the value required for operating the test device.  
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If you view the response of a short circuit, notice that:  
• Changing Port 1 attenuator has negligible effect on S marker reading  
11  
• Changing Port 2 attenuator has negligible effect on S marker reading  
22  
This is due to the way the attenuators are paired. Both the reference and the  
test signal are changed by approximately equal amounts.  
When viewing S or S , however, changing Port 1 or Port 2 attenuators  
21  
12  
offsets the marker reading by the difference value between Port 1 attenuator  
and Port 2 attenuator.  
Storing Trace  
Memories  
To compensate for the main frequency response effects due to changing  
the attenuators, use the HP 8510C trace memories and trace mathematics  
function, as explained below:  
1. Connect the thru used for calibration and set the port attenuators to the  
value used for device measurement.  
2. Recheck the user parameter levels, then press PARAMETER [S21].  
3. Press MENUS [DISPLAY], then {DATA AND MEMORIES}.  
Press DISPLAY: {DATA-->MEMORY n} to store the S trace in default trace  
21  
memory 1. This trace represents the frequency response difference  
between the S signal path calibration and the measurement.  
21  
4. Press PARAMETER [S12], then press the following DISPLAY: menu keys:  
{SELECT DEFAULTS}  
{DEFAULT to MEMORY: 2}  
{DATA-->MEMORY 2}  
The S trace is now stored in trace memory 2. This trace is the  
12  
frequency response difference of the S signal path between calibration  
12  
and measurement.  
Viewing Normalized  
Parameters  
Use the traces stored in memory 1 and memory 2 to normalize the corrected  
data to the new levels after the attenuation is changed. The next example  
uses normalization for S or S only. To view the corrected parameters:  
21  
12,  
1. Press MENUS [DISPLAY], then {DATA AND MEMORIES}  
2. Press PARAMETER [S11] and view the S measurement.  
11  
3. Press PARAMETER [S22] and view the S measurement.  
22  
4. Press PARAMETER [S21], then the following DISPLAY: menu keys:  
{SELECT DEFAULTS}  
{DEFAULT to MEMORY: 1}  
{MATH ( / ) }  
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5. View the S measurement. If the thru is connected, the transmission  
21  
coefficient should be 1 ∠0° .  
6. Press PARAMETER [S12], then press the following DISPLAY: menu keys:  
{SELECT DEFAULTS}  
{DEFAULT to MEMORY: 2}  
7. Press PARAMETER [S12] to view the S measurement. If the thru is  
12  
connected, the transmission coefficient should be 1 ∠0° .  
Normalization is turned OFF for S and S measurements. Then the  
11  
22  
appropriate memory is selected and normalization is turned on to view S  
21  
and S .  
12  
Since these are accurate, repeatable attenuators, this sequence may be  
effective in your application. If other parts of the test must be changed,  
especially components connected to the test ports, this procedure may  
require additional steps to adequately compensate for the changes.  
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Making Operational Checks  
To check the operation of multiple test-set configurations, do the following:  
1. Connect a device with a known response to test set number 1. Press the  
following HP 8510C front-panel keys:  
INSTRUMENT STATE [LOCAL]  
AUXILIARY MENUS [SYSTEM]  
{HP-IB ADDRESSES}  
{TEST SET}  
2. When the message TEST SET HP-IB ADDRESS appears, enter [20], the  
address of test set number 1, then press [x1]. The measurement trace from  
test-set number 1 should display.  
3. Store the trace in memory by pressing the following keys:  
MENU [DISPLAY]  
{DATA AND MEMORIES}  
{DATA --> MEMORY n}  
DISPLAY: {DATA and MEMORY]  
4. Next, enter the HP-IB address of test set number 2, followed by [x1], then  
re-enter the address of test set number 1 followed by [x1].  
5. Repeat the above procedure for each of the other test sets in the system.  
Observe any difference in the response between the stored trace and the  
results trace by switching back and forth between the test sets.  
Any differences in data that you suspect are due to the IF switch (Option  
001) or to RF switching, must be checked out. Refer to Chapter 5,  
“Troubleshooting the Test Set” in this manual.  
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Performance Verification  
Standard system performance verification procedures verify the operation of  
an Option 001 test set used as test set number 1.  
To verify the performance of a different test set in the configuration, enter its  
HP-IB address (as explained in “Making Operational Checks” on page 3-13)  
to select it, then continue with this procedure.  
Refer to the HP 8510C On-Site Service Manual for its performance  
verification procedure.  
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Using Anti-Rotation Clamps  
During the performance verification procedure, use anti-rotation clamps to  
secure RF connections at the test ports of each test set. While installed, each  
clamp stabilizes the connector on RF cable to the large nut on the test set’s  
RF test port. If an adapter is used, the clamp stabilizes the adapter to the  
front panel RF port connector.  
Without these clamps, the test port connections can loosen when a device  
under test is moved. As a result, the loosening can invalidate calibrations and  
measurements.  
NOTE  
These instructions refer to an installation using HP RF cables. However, the  
anti-rotation clamps may also be used with front panel adapters. Adapter  
installations are similar. There are two anti-rotation clamps included in the  
test set accessories box.  
Attach the first clamp  
Remove one anti-rotation clamp from the accessories box. Loosen its  
thumb-screw until it is nearly freed from the counter-sink socket in the  
clamp body. The clamp is shown as item (5) in Figure 2-1, “Accessories  
Supplied with the HP 8517B Test Set.”  
1. Gently push the clamp (round-hole end first) over and past the RF cable  
connector to be used.  
2. Fit the rubber O-ring in the round end of the clamp over the connector.  
NOTE  
If the O-ring is not snug or is damaged, refer to the Chapter 6, “Replacement  
Procedures” for instructions about replacing the internal O-ring.  
3. Wiggle the clamp to ease it over the connector.  
4. Attach the cable to the test port and tighten it as specified in the cable  
manual.  
NOTE  
Do not twist the cable as you attach it to the test port.  
Use the torque wrench supplied with your calibration kit to tighten the cable  
to 90 N-cm (8 in-lb). Do not over-torque the connection. See Figure 3-5.  
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CAUTION  
Important! The test set RF connector becomes loosened easily. Hold the RF  
cable securely throughout the remainder of this procedure. Do not allow the  
cable to rotate.  
Figure 3-5 Using a Torque Wrench Correctly  
Positioning the thumb-screw  
See Figure 3-6. Position the clamp so the thumb-screw is positioned at the  
top of the clamp.  
• Turn the clamp to visually align the clamp flats with the flats on the test  
port connector nut.  
• This positioning minimizes rotating the connector in the procedure step.  
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NOTE  
The flats may actually be in any orientation, with respect to the front panel.  
Figure 3-6 Visually Aligning Clamp and Nut Flats  
Positioning the connector  
See Figure 3-7. Maneuver the clamp over the RF connector and onto the test  
port connector.  
1. Hold the test cable with one hand. Use the other hand to press the clamp  
gently and steadily, as you wiggle it into position straight over the RF  
connector and onto the test port connector nut.  
NOTE  
Be sure to loosen the clamp when you are slipping it over the connector.  
2. Fit the internal flats in the clamp over the flats on the test port connector  
nut.  
3. Avoid rotating the clamp as you position it so the RF connection remains  
tight (remember it loosens easily).  
Figure 3-7 Mating the Clamp and Nut Flats  
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Operating the HP 8517B Test Set  
Using Anti-Rotation Clamps  
Aligning the thumb-screw  
See Figure 3-8. Ensure that the thumb-screw is aligned with the counter-sink  
hole on the clamp’s body.  
1. Push the clamp toward the test set front panel.  
2. Finger-tighten the thumb-screw. The cable cannot be damaged if the  
thumb-screw is tightened too tightly.  
Figure 3-8 Aligning the Thumbscrew With the Counter-Sink Hole  
Attaching the second clamp  
To complete the anti-rotation clamp installation, repeat the steps above,  
beginning at step 1 to attach the second clamp.  
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Specifications  
4
Specifications  
Specifications describe the warranted performance of the instrument. The  
electrical specifications of the test set when used with an HP 8510 network  
analyzer, are defined in the HP 8510C On-Site Service Manual.  
Mechanical Specifications  
Table 4-1 HP 8510/HP 8517B Mechanical Specifications  
Test Port Description  
Specification  
Connector Type:  
2.4 mm1  
Precision, rugged male test-port connector  
Center Pin Recession2  
+0.00254 mm to +0.0178 mm  
+0.0001 inches to +0.007 inches  
1. Precision rugged make test-port connector.  
2. Refer to the calibration kit manual to learn about measuring the pin depth.  
Supplemental Characteristics  
Supplemental characteristics listed in Table 4-2 provide useful information  
by giving typical, but non-warranted, performance parameters.  
Table 4-2 HP 8510/HP 8517B Supplemental Characteristics  
Front Panel Test Ports  
Connector type  
precision 2.4 mm, male  
90 N-cm (8 in-lb), maximum  
50 Ω, nominal  
Connector torque  
Impedance  
Damage-input level  
At Port 1 and Port 2:  
+17 dBm CW, RF  
At Port 2 with Option 004:  
30 dBm CW (1 watt) CW, RF  
DC bias  
500 mA, 40 Vdc, maximum  
Nominal source operating power level  
+2 dBm to –20 dBm,  
with flatness correction off, depending on frequency  
Nominal connector-nut size  
20 mm  
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Specifications  
Table 4-2 HP 8510/HP 8517B Supplemental Characteristics (Continued)  
Rear Panel RF Connectors  
Connector type  
precision 2.4 mm female  
Recommended connection torque  
Damage input level  
90 N-cm (8 in-lb), maximum for precision-2.4 mm hardware  
15 dBm1  
8 mm  
Nominal connector-nut size  
User 1 Power Levels for Reference Channel Phase Lock  
–45 dBm  
Minimum power level  
Maximum power level  
–10 dBm to –20 dBm, depending on frequency  
HP 8517B Power Requirements and Physical Characteristics  
Operating temperature range  
Input Power (AC)  
0
°
C to 55  
°
C
110, 120, 220, or 240 Vac, ±10%  
Line frequency from 47 to 66 Hz  
Dimensions  
Weight  
460 mm (High)  
(18.1 inches H  
×
×
133 mm (Wide)  
5.25 inches W  
×
609 mm (Deep)  
×
24 inches D)  
15 kg (35 lb), net  
1. This must be AC coupled.  
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Specifications  
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5
Troubleshooting the Test Set  
The troubleshooting strategy for the HP 8517B S-Parameter test set is a  
systematic sequence of procedures. The information may be used after  
system-level troubleshooting has identified the test set as the problem  
instrument.  
Use the troubleshooting flowchart in Figure 5-2 to help isolate the faulty  
assembly. Notice procedure numbers within some of the flow diagram  
blocks. These are keyed to troubleshooting procedures. Perform the  
numbered procedure associated with each block as you progress through the  
chart.  
Refer to the block diagrams, located at the end of this section, to help you  
understand the test set’s operation.  
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Troubleshooting the Test Set  
Theory of Operation  
Theory of Operation  
RF paths for Port 1 and Port 2 are similar. This section discusses in detail the  
source power signal, as it is routed via the RF IN connector, through the test  
set, and to Port 1 for S and S measurements.  
11  
21  
Figure 5-1 Standard HP 8517B RF Block Diagram  
The RF Source Power  
• RF source power enters the test set through the rear panel. The RF power  
is applied to the switch/splitter (A18).  
• At the switch/splitter, the power is attenuated by approximately 7 to  
14 dB, depending upon frequency.  
• The switch/splitter receives its control signals from the attenuator/switch  
driver board (A5).  
• The switch part of the switch/splitter, which is a combination of two  
power splitters and a solid-state switch, selects the power splitter to use  
and, therefore, the test port to receive the RF power.  
• LEDs on the front panel and on the attenuator/switch driver board (A5)  
indicate which test port is active.  
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Troubleshooting the Test Set  
Theory of Operation  
The Reference Signal  
Path  
• The reference signal is routed from the switch/splitter through the  
20-7 dB tapered pad (AT1) to attenuate any VTO feed-through signals.  
• The signal is then applied to A10, the a1 sampler assembly, where it is  
down-converted to a 20 MHz IF (intermediate frequency).  
• Because the RF power is being routed to Port 1, the a1 IF signal is used  
to phase lock the network analyzer. Had the RF power been routed to  
Port 2, the a2 IF signal would have been used to phase lock the network  
analyzer.  
The Test Signal Path  
• The test signal is routed from the switch/splitter (A18) to the 60 dB  
programmable attenuator (A16) for Port 1.  
• The signal may then be attenuated in 10 dB steps or passed through  
without attenuation to Port 1 bias tee (A7).  
• A bias supply to provide dc voltage to Port 1 bias tee can be connected  
to J8 on the rear panel of the test set, also.  
• The RF signal rides this dc level which is used to turn active devices on  
(bias ON) so their S-parameters can be measured.  
• Beyond the bias tee, the test signal travels to the directional coupler  
(A6).  
• At the coupler, the incident RF power is applied to the device under test.  
The S and S  
Measurements  
• The signal reflected from the DUT is separated from the signal incident  
11  
21  
to the DUT by the Port 1 coupler (A6).  
• The reflected signal exits the coupler and is applied to b1 sampler (A12),  
then is down-converted to a 20 MHz IF signal.  
• The S measurement is the ratio of the two IF signals from a1 and b1  
11  
samplers.  
• The incident signal is transmitted through the DUT, through Port 2  
coupler, then into b2 sampler (A13).  
• The incident signal is down-converted to a 20 MHz IF so S can be  
21  
measured. S is the ratio of the two IF signals from samplers a1 and b2.  
21  
The Sampler Control  
Switching  
• The samplers may be turned on and off, depending upon the parameter  
being measured.  
• Sampler switching is controlled by a microprocessor on the HP-IB board  
assembly (A4). The default condition (test set power ON and no HP-IB  
commands sent by the network analyzer) is for the test set to be active  
with the RF signal applied to Port 1.  
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Troubleshooting the Test Set  
Theory of Operation  
• If the test set is equipped with Option 001 (multiple test set capability),  
its begin state is inactive. That is, rather than using the test set’s internal  
IF, a switch is set in the test set to accept an IF from another test set.  
The LO Signal Control The LO, generated by A14 VTO/driver, is phase locked to the source so the  
desired VTO harmonic is 20 MHz greater than the source frequency.  
The phase-locked loop includes:  
• Portions of the test set, such as the VTO summing-amp board (A3), the  
VTO/driver (A14), and the a1 sampler assembly (A10), and  
• The HP 8510C Network Analyzer  
The VTO summing-amp board (A3) provides control voltages to tune the  
VTO to the correct LO frequency.  
The VTO also has an output LENDRA (Low END of RAnge) which is  
routed via the test set interconnect cable, to the HP 85102.  
The LENDRA provides an indication to the network analyzer about whether  
or not the VTO is operating within its normal frequency range.  
If the VTO exceeds its normal frequency range, the network analyzer  
displays the running error message VTO OVER RANGE.  
CAUTION  
Electrostatic Discharge Sensitive (ESD) Assemblies  
Assemblies you might handle in these troubleshooting procedures are  
extremely sensitive to damage from static electricity. They may or may not  
continue to function if they are subjected to electrostatic discharge. Their  
reliability, however, will be impaired.  
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Troubleshooting the Test Set  
Troubleshooting Sequence  
Troubleshooting Sequence  
Use this troubleshooting flowchart, along with the procedures in the  
following section, to help isolate faulty assemblies.  
Figure 5-2 Troubleshooting Flowchart  
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Troubleshooting the Test Set  
Troubleshooting Sequence  
Equipment Needed  
But Not Supplied  
Gather the equipment listed in Table 5-1 to use for troubleshooting the test  
set (these items are not supplied with the instrument at shipment).  
Table 5-1 Equipment Required, But Not Supplied  
Equipment Type  
HP Part Number  
1-point, Pozidriv screwdriver  
2-point, Pozidriv screwdriver  
Service adapter  
8710-0899  
8710-0900  
85105-60210  
8710-1655  
HP 1740A  
5/16-inch torque wrench  
Oscilloscope  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Troubleshooting Procedures  
The troubleshooting procedures in this chapter are listed below:  
• “A15 Primary Regulator Board Assembly” on page 5-7  
• “A27 Post-Regulator Board Assembly” on page 5-7  
• “Self-Test Indicators” on page 5-9  
• “HP 85102 IF Amplifier Test” on page 5-12  
• “Unratioed Power Test” on page 5-14  
• “HP 8517B, Option 007 Unratioed Power Test” on page 5-20  
• “Finding the Faulty Assembly” on page 5-23  
A15 Primary Regulator  
Board Assembly  
Use a digital voltmeter to check the voltages and an oscilloscope to check for  
a maximum ripple level as listed in Table 5-2.  
Table 5-2 Power Supply Voltages to A15  
Nominal Voltage  
Test Point  
Voltage Range  
Maximum Ripple  
Peak-to-Peak  
+5.05 Vdc  
A15TP1  
+4.75 to +5.25  
–4.90 to –5.50  
+14.10 to +15.60  
–14.10 to –15.60  
2 mv  
2 mv  
2 mv  
2 mv  
–5.20 Vdc  
+14.85 Vdc  
–14.85 Vdc  
A15TP2  
A15TP3  
A15TP6  
A27 Post-Regulator Board  
Assembly  
(Option 007, Only) Use a digital voltmeter to check the voltages and an  
oscilloscope to check for a maximum ripple level as listed in Table 5-3.  
Table 5-3 Power Supply Voltages to A27  
Nominal Voltage  
Test Point  
Voltage Range  
Maximum Ripple  
Peak-to-Peak  
+5.0 Vdc  
–3.50 Vdc  
A27TP1  
A27TP2  
+4.75 to +5.25  
–3.26 to –3.75  
2 mv  
2 mv  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Figure 5-3 Power Supply Fuses and Test Points  
HP-IB Address Switch  
The HP-IB address switch is located on the rear-panel of the instrument. It is  
easy to access, but unnecessary to change unless the error message SYSTEM  
BUS ADDRESS ERROR appears on the system display.  
To set the HP-IB address switch, position the switches as illustrated in  
Figure 5-4 (the LSB is on the left-hand side; the MSB is on the right-hand  
side). The default setting is decimal twenty, or binary 10100 as read from  
right-to-left (on, off, on, off, off). In the drawing, the dark-side is selected.  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Figure 5-4 Instrument HP-IB Switch Setting  
Fuse Location  
The fuse is located inside the line module at the rear panel of the test set. The  
value rating and part number of the fuse is listed in Chapter 7, “Replaceable  
Parts” of this manual. Review the information in Figure 5-5 to replace the  
line fuse or to set the voltage selector cam.  
Figure 5-5 Fuse and Voltage Cam Location  
Self-Test Indicators  
If the front-panel ACTIVE LED (shown in Figure 5-6) fails to light within  
five seconds after turning the power on, or if it lights immediately, the  
instrument has failed self-test.  
To determine the portion of the self-test that failed, note which LEDs on A4  
board assembly are turned on. Figure 5-7 shows the location of the LEDs.  
See Table 5-4 for the condition description of the LED status indicators.  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Figure 5-6 The ACTIVE LED Location  
If the Self-Test Fails to Run Properly  
If the portion of memory holding the self-test program is faulty, the self-test  
will not run properly. If any of the following conditions occur, it indicates  
that the A4 HP-IB board is likely to be faulty.  
• All LEDs flash briefly, then turn off  
• All LEDs flash briefly and stay on  
• The ACTIVE LED turns on too quickly after power on  
• The ACTIVE LED does not turn on at all  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Figure 5-7 HP 8518B Test Set, A4 Board Assembly LEDs  
Table 5-4 Instrument Self-Test Indicator State Definitions  
Self-Test Indication  
PWON  
LSN  
ON  
TLK  
ON  
ON  
SRQ  
ON  
REM  
ON  
Time (Following Power-On)  
0 to 0.5 seconds  
Start ROM Test  
OFF  
ON  
ON  
on briefly (a flash)  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Table 5-4 Instrument Self-Test Indicator State Definitions  
Self-Test Indication  
Pass ROM Test  
Start RAM Test  
Pass RAM Test  
LSN  
OFF  
OFF  
OFF  
TLK  
OFF  
OFF  
OFF  
SRQ  
ON  
REM  
ON  
Time (Following Power-On)  
0.5 to 0.2 seconds  
N/A  
OFF  
OFF  
ON  
OFF  
after 2 seconds  
HP 85102 IF  
Amplifier Test  
The service adapter can substitute as a test set by returning the 20 MHz IF  
signal from the HP 85102 to the amplifier on the HP 85102. Doing this  
determines whether a fault is in the test set or is in the HP 85102.  
Figure 5-8 Service Adapter Connections  
Using the Service Adapter  
1. Connect the service adapter as shown in Figure 5-8. On the network  
analyzer, press:  
INSTRUMENT STATE [PRESET]  
MENUS [MARKER]  
STIMULUS [MENU]  
{STEP}  
PARAMETER [MENU]  
2. Examine each user parameter by pressing the {USER 1 a1} through  
{USER 4 b1} softkeys to observe unratioed power level traces at each  
channel.  
3. The traces should be flat lines, quite close to one another, as indicated by  
the marker value (typically about –28 dB, ±5 dB).  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Service Adapter Conclusions  
Table 5-5 Results Observations  
If all channels look good  
The HP 85102 is working properly. The problem is  
most likely in the source or the test set. Refer to  
Procedure 4, “Unratioed Power Tests” in this chapter.  
If one or more channels look bad  
The problem is most likely in the HP 85102. Refer to  
the HP 8510C On-Site Service Manual for information  
about troubleshooting the HP 85102.  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Unratioed Power Test  
We will examine six RF signal paths in the test set by observing their  
associated IF signals. Figure 5-10 through Figure 5-15 show the test set  
traces (and simplified block diagrams) that are typical for RF paths 1  
through 6.  
Figure 5-9 Diagram of IF Signal Path  
Isolating Signal Path  
Problems  
Determining the RF component in the test set that is most likely the cause of  
a failure can be accomplished within four steps:  
1. Run the signal-path tests on paths 1 through 6 using the procedures on  
the following pages.  
2. Record your test results in Table 5-6 for each path.  
3. Compare the results in Table 5-6 with those in Table 5-7.  
4. Investigate the most probable cause, based on the information in  
Table 5-7.  
Testing Signal Paths 1-4  
1. Set the network analyzer to its factory default settings by pushing the  
front-panel TEST switch.  
2. Set the source for step mode. Press the network analyzer keys:  
INSTRUMENT STATE [PRESET]  
STIMULUS [MENU]  
{STEP}  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
3. To examine each sampler’s IF signal, redefine which port and sampler  
the network analyzer uses for the phase lock. Use the following steps:  
a. Redefining to Port 2, sampler a2, press:  
PARAMETER [MENU]  
{USER 3 a2} then {REDEFINE PARAMETER}  
{DRIVE}  
DRIVE: {PORT 2}  
{PHASE LOCK}  
{a2}  
{REDEFINE DONE}  
Observe the resulting a2 IF trace on the display.  
b. Redefining to Port 2, sampler b2, press:  
{USER 2 b2} then {REDEFINE PARAMETER}  
{DRIVE}  
DRIVE: {PORT 2}  
{PHASE LOCK}  
{a2}  
{REDEFINE DONE}  
Observe the resulting b2 IF trace on the display.  
4. Connect an open (or short) to Port 1 and Port 2. Power is reflected back  
to b1 and b2 samplers through the coupler.  
To check each sampler trace, press:  
{USER 1 a1}  
{USER 2 b2}  
{USER 3 a2}  
{USER 4 b1}  
5. Record your results for paths 1 thru 4 ({USER 1} to {USER 4}) in Table 5-6.  
NOTE  
See Figure 5-10 for an RF signal-path 1 trace example. For Option 007, see  
Figure 5-13.  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Testing Paths 5 and 6  
1. Connect a cable between Port 1 and Port 2.  
2. To observe the b1 power-level trace through path 5, press:  
PARAMETER [MENU]  
{USER 4 b1} then {REDEFINE PARAMETER}  
{DRIVE}  
DRIVE: {PORT 2}  
{PHASE LOCK}  
{a2}  
{REDEFINE DONE}  
The b1 path signal is illustrated in Figure 5-12. Typically, each trace  
should resemble the examples in Figure 5-12, (±5 dB).  
3. Record your results in Figure 5-6.  
4. To observe the b2 power level trace through path 6, press:  
PARAMETER [MENU]  
{USER 2 b2} then {REDEFINE PARAMETER}  
{DRIVE}  
DRIVE: {PORT 1}  
{PHASELOCK}  
{a1}  
{REDEFINE DONE}  
The b2 path signal is illustrated in Figure 5-12. Typically, each trace  
should resemble the examples in Figure 5-12, (±5 dB).  
5. Record your results in Figure 5-6.  
NOTE  
Be sure that you return the parameters to their original conditions for a1, b1,  
a2, and b2. Use the redefine function to achieve this, or push the instrument  
TEST switch to restore factory default conditions.  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Figure 5-10 RF Path 1 and Path 2, HP 8517B Standard Test Set  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Figure 5-11 RF Path 3 and Path 4, HP 8517B Standard Test Set  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Figure 5-12 RF Path 5 and Path 6, HP 8517B Standard Test Set  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
HP 8517B, Option 007  
Unratioed Power Test  
Figure 5-13 through Figure 5-15 illustrate the signal path and trace display  
for the unratioed power tests on HP 8517B, Option 007 model test sets.  
Figure 5-13 RF Path 1 through Path 4, HP 8517B Option 007 Test Set  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Figure 5-14 RF Signal for Path 1 through Path 4, HP 8517B Option 007  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Figure 5-15 RF Path 5 and Path 6, HP 8517B Option 007  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
Finding the Faulty  
Assembly  
Compare the results recorded in Table 5-6 with the matrix in Table 5-7.  
There are 32 possible combinations, twelve of which point to probable  
failures. These are shown in Table 5-7.  
Table 5-6 Test Results for Path 1 through Path 6  
a1  
Path1  
a2  
Path2  
b1  
Path 3  
b2  
Path 4  
b1 thru  
Path5  
b2 thru  
Path6  
Sample Diagnostics  
Suppose you have determined that paths 3 and 5 are bad. Paths 1, 2, 4, and 6  
are good. Refer to Table 5-7. Notice that the most likely cause for the failure  
is the b1 sampler.  
Table 5-7 Most Probable Failures (  
B
indicates Bad;  
—
indicates Good)  
Path  
Most Probable Failure  
a1  
Path1  
a2  
Path2  
b1  
Path 3  
b2  
Path 4  
b1 thru  
Path5  
b2 thru  
Path6  
Assembly, or Description of Condition  
—
B
—
B
—
B
—
B
—
B
—
B
The HP 8517B test set is not the problem  
The source, source cable, VTO, cables from rear  
panel to switch splitter  
—
B
B
—
B
B
—
—
—
—
B
B
—
B
—
B
The switch splitter  
—
—
—
B
The switch splitter  
—
B
B
—
—
—
B
b1 sampler  
—
—
—
B
—
—
—
B
a1 sampler  
—
—
—
—
—
—
a2 sampler  
—
—
—
—
—
b2 sampler  
—
—
B
B
Port 1 connector or directional coupler  
B
B
B
A1, T1  
—
—
B
—
B
A2, T2  
B
B
Port 2 connector or directional coupler  
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Troubleshooting the Test Set  
Troubleshooting Procedures  
5-24 HP 8517B S-Parameter Test Set Manual  
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6
HP 8517B Test Set Replacement Procedures  
The replacement procedures in this chapter are listed below:  
1
2
3
4
5
6
7
8
9
“A18 Switch/Splitter Assembly” on page 6-5  
“A14, A10 to A13 Frequency Converter Assembly” on page 6-5  
“A15 Regulator Board Assembly” on page 6-6  
“C1 to C4 Filter Capacitors” on page 6-6  
“2.4 mm Test Port Connectors” on page 6-7  
“Fan Assembly Replacement” on page 6-8  
“T1 Power Transformer” on page 6-8  
“Anti-Rotation Clamp O-Ring Replacement” on page 6-10  
“A1 Front Panel and Interface Board Assembly” on page 6-10  
10 “A7 and A9 Bias Tees” on page 6-11  
11 “A6 and A8 Test Port Couplers” on page 6-11  
12 “A16 or A17 Port Attenuators” on page 6-11  
13 “A22 Input Amplifier Assembly” on page 6-12  
14 “A23 to A26 Buffer Amplifiers” on page 6-12  
15 “A27 Post Regulator Board Assembly” on page 6-13  
CAUTION  
To prevent electrostatic discharge (ESD) damage, earth ground the work area  
and yourself. Some of the assemblies being handled in the following  
procedures are very sensitive to damage resulting from static discharges.  
Assemblies exposed to ESD may or may not continue to operate properly.  
Their reliability, however, will be degraded. Refer to Figure 6-1 for  
ESD-safe workstation recommendations.  
HP 8517B S-Parameter Test Set Manual 6-1  
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HP 8517B Test Set Replacement Procedures  
Figure 6-1 ESD-Safe Workstation Configuration  
Performance Tests  
Performance test information and procedures are located in Chapter 8 of the  
HP 8510C On-Site Service Manual.  
Note that the HP 8510C performance test software (shipped with the test set)  
is required to test the test set. The results generated during the HP 8517B  
performance-test are based on its operation as part of the HP 8510C system.  
The HP 8510C includes the test set, cables, calibration kit, and so forth.  
Adjustments  
The HP 8517B Test Set has no adjustments. Specifically, no attempt should  
be made to adjust the samplers.  
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HP 8517B Test Set Replacement Procedures  
Equipment Needed But Not Supplied  
Table 6-1 lists the equipment needed to replace the assemblies documented  
in the following procedures. See Figure 6-2 to locate the test set assemblies.  
Table 6-1 Replacement-Procedure Tools Needed  
Tools  
Used for Procedure:  
HP Part Number  
8710-0900  
2 point Pozidriv screwdriver  
all components  
all components  
1 point Pozidriv screwdriver  
8710-0899  
8710-1765  
5/16 inch torque wrench, 90 N-cm (8 in-lb)  
all components and 3.5 mm semi-rigid cables, 2.4/1.85  
mm cables  
5/16 inch torque wrench, 112 N-cm (10 in-lb)  
1/2 inch torque wrench, 280 N-cm (25 in-lb)  
9/16 inch torque wrench, 470 N-cm (42 in-lb)  
20 mm torque wrench, 90 N-cm (8 in-lb)  
2.9 mm gage kit  
HP 8516A 2.4 mm semi-rigid cables  
7 mm, 2.4 mm, 1.85 mm test port connectors  
HP 8517B rear panel 2.4 mm connectors  
2.4 mm and 1.85 mm test port connectors  
port connectors  
8710-1655  
8710-1581  
8710-1580  
8710-1764  
Part of HP 85056A Cal Kit  
9300-0797  
anti-static mat  
all components  
wrist strap  
all components  
9300-1257  
clip lead  
C1-C4 capacitors  
any supplier  
any supplier  
any supplier  
8710-1623  
needle nose pliers  
couplers  
wire cutters  
couplers, B1 fan  
T-10 Torx screwdriver  
all components  
T-15 Torx screwdriver  
all components  
8710-1622  
9/16 inch 50 in-lb torque wrench  
9/16 inch nut driver  
test ports  
8710-1948  
connector repair  
8720-0008  
1/2 inch torque wrench, 280 N-cm (25 in-lb)  
connector repair  
8710-1581  
100  
Ω
, 20 watt resistor  
C1-C4 capacitor removal  
coupler removal and test port connector flange removal  
fan replacement and test port connector removal  
RF input connector  
0819-0019  
1 inch torque wrench, 800 N-cm (72 in-lb)  
5/16 inch open end wrench  
1/2 inch open-end wrench  
MTB 100 72 lb-in E1  
any supplier  
any supplier  
8710-1770  
1/2 x 9/16 inch thin wrench, fixed  
5/16 inch thin wrench  
Test port connector removal  
3.5 mm, 2.4 mm, 1.85 mm semi-rigid connector  
removal  
8710-2079  
1. Order from Mountz Company, 1080 North 11th Street, San Jose, CA 95112, phone (408) 292-2214, or contact Mountz through the  
internet at http://www.mountztorque.com/html/home.htm  
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HP 8517B Test Set Replacement Procedures  
Figure 6-2 HP 8517B Major Assembly Location Diagram  
6-4 HP 8517B S-Parameter Test Set Manual  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
Assembly Replacement Procedures  
Initial Precautions  
Before beginning any of the procedures in this chapter, do the following:  
1. Turn off the HP 8517B test set.  
2. Disconnect the test set’s power cord.  
3. Remove the top- and side-covers, trim strips, and handles.  
4. Do not exceed the maximum torque necessary to secure a connector.  
Refer to Table 6-1 for torque specifications.  
5. Exercise caution with semi-rigid cables; they can be bent very easily.  
6. Reverse an assembly’s removal procedure for reinstallation, unless  
otherwise instructed.  
Switch/Splitter  
Replacement  
A18 Switch/Splitter Assembly  
1. See Table 6-2 for component locations.  
2. Remove the five semi-rigid cables and the three flexible cables from the  
switch/splitter. (Reposition cables as required to ease removal.)  
3. Remove the two fixed attenuators from the switch/splitter (note that  
there are three fixed attenuators in Option 007, and in Option 004 “plus”  
007).  
4. Remove the two screws that attach the switch/splitter to the bracket.  
5. Remove the switch/splitter from the test set.  
Frequency Converter  
Replacement  
A14, A10 to A13 Frequency Converter Assembly  
The frequency converter consists of the A14 VTO (voltage-tuned oscillator)  
assembly and four samplers, A10 through A13. See Figure 6-2 for  
component locations.  
1. Remove the semi-rigid cable attached to each of the four samplers.  
2. Remove the four in-line attenuators from the samplers (only in Options  
007, Option 002 “plus” 007, and Option 004 “plus” 007).  
3. Remove the six flexible cables from the frequency converter by pulling  
gently on the gold connector.  
4. Remove the four frequency converter mounting plate screws and the  
bracket screw that fastens the frequency converter to the chassis.  
5. Unplug the ribbon cable near the front panel.  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
6. Unplug the four harnessed (multi-colored) wire and socket assemblies.  
7. Lift the frequency converter out of the test set.  
8. Remove the frequency converter bracket by removing the two Pozidriv  
screws.  
Regulator Board  
Replacement  
A15 Regulator Board Assembly  
1. See Figure 6-2 for component locations.  
2. Unplug the transformer socket from the regulator board.  
3. Unplug the amplifier socket from the regulator board (only in Options  
007, Option 002 “plus” 007, and Option 004 “plus” 007).  
4. Remove the three mounting screws from the top edge of the regulator  
board.  
5. Remove the regulator board. (You may need to partially back out one of  
the transformer mounting screws for clearance.)  
Filter Capacitor  
Replacement  
C1 to C4 Filter Capacitors  
1. With the test set in an upright position, pull the metal and plastic cover  
off the 4 capacitors. See Figure 6-2 for the location of the filter  
capacitors.  
2. Turn the test set over and remove the bottom cover.  
3. To discharge the capacitors, do the following:  
a. Attach one end of an insulated clip lead to the chassis of the  
instrument.  
b. Attach the other end of the clip lead to a 100 ÞΩ 20-watt resistor.  
c. Use the resistor to discharge each capacitor terminal (the large  
Pozidriv screw on the bottom side of the test set). Each capacitor has  
two terminals.  
d. Discharge all capacitor terminals. It takes approximately six seconds  
per capacitor to discharge.  
4. To remove a capacitor, remove the corresponding pair of screws and pull  
the capacitor out of the test set.  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
Test Port Connector  
Replacement  
2.4 mm Test Port Connectors  
1. Incline the rear of the test set approximately four inches and support it  
with a stable, solid object (such as a thick book).  
2. Using a 9/16-inch open-end wrench, unscrew the test port connector nut.  
3. Pull out the center conductor assembly and replace it with a new  
assembly. Do not touch either end of the new assembly. Part numbers for  
the test port connector components are located on page 7-16.  
4. Replace the test port connector nut and torque it to 562 N-cm (50 in-lb).  
5. Measure the pin depth of each port using a 2.4 mm female pin-depth  
gage. Refer to the connector care information in the calibration kit  
manual for more information about using the gage.  
NOTE  
If the center pin protrudes, or if the depth is less than 0.0001 inch, remove  
the connector assembly and increase or decrease shims to adjust the pin  
depth to between 0.0001 and 0.0007 inch. When measuring the pin depth be  
sure to include the uncertainty calculation of your gage.  
6. If you added or removed shims, regage the test port connector assembly.  
Figure 6-3 Diagram of 2.4 mm Test Port Connector  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
Fan Assembly  
Replacement  
B1 Fan Assembly  
Turn off the test set and disconnect the power cord from the ac-power mains.  
WARNING  
Electrocution can result if ac power remains connected to the test set during  
this procedure. Disconnect the ac power cord before starting.  
To replace the B1 fan assembly, remove T1 transformer to expose the ends of  
the fan wires which must be de-soldered from the line module, FL1. Refer to  
Chapter 7, “Replaceable Parts” in this manual for a detailed view of the fan  
and transformer hardware.  
1. See Figure 6-2 for component locations.  
2. Position the test set on its right-hand side.  
3. Using a 5/16-inch open-end wrench, remove the hard-line cables  
connected between the couplers A7 and A9 and the bulkhead connectors  
J2 and J5.  
4. Unplug the transformer connector at J2 on the A15 regulator board.  
5. Using a large Pozidriv screwdriver, remove the four screws and washers  
that hold the transformer onto the rear panel.  
6. Using a large Pozidriv screwdriver, remove the screw that holds the  
transformer angle bracket to the main deck.  
NOTE  
The transformer wires soldered to the line module are short, so do not pull  
the transformer out too far.  
7. Carefully remove the transformer from the test set and place it on the  
bench near the test set.  
8. Strip the heat shrink tubing off the two fan wires, then de-solder the  
wires from the line module. Cut any cable ties restraining the fan wires.  
9. Using a small Pozidriv screwdriver, remove the screw and lockwasher  
that secure the green/yellow fan ground wire to the top of the rear panel  
frame.  
10. Using a small Pozidriv screwdriver, remove the four screws that hold the  
fan to the rear panel. Remove the fan assembly.  
Power Transformer  
Replacement  
T1 Power Transformer  
Turn off the test set and disconnect the power cord from the mains.  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
WARNING  
Electrocution can result if ac power remains connected to the test set during  
this procedure. Disconnect the ac power cord before starting.  
1. See Figure 6-2 for component locations.  
2. Position the test set onto its right-hand side.  
3. Using a 5/16-inch open-end wrench, remove the hard-line cables  
connected between the coupler A7 and the bulkhead connector J2.  
4. Unplug the transformer connector from J2 on the A15 regulator board.  
5. Using a large Pozidriv screwdriver, remove the four screws and washers  
that hold the transformer onto the rear panel.  
6. Using a large Pozidriv screwdriver, remove the screw that holds the  
transformer angle bracket to the main deck.  
NOTE  
The transformer wires soldered to the line module are short, so do not pull  
the transformer out too far.  
7. Carefully remove the transformer from the test set and place it on the  
bench near the test set.  
8. Strip the heat shrink tubing off the transformer wires that are soldered to  
the line module, and de-solder the wires.  
9. De-solder the transformer ground wire connected to the chassis side rail.  
10. Remove the transformer. When you replace the transformer, refer to  
Figure 6-4 for the location of wires connected to the line module.  
Figure 6-4 Wire Connections to FL1 Line Module  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
O-Ring Replacement  
Anti-Rotation Clamp O-Ring Replacement  
1. Pry the O-ring out of the clamp with fine tweezers or a similar tool.  
2. To insert the new O-ring (HP part number 0900-0007), engage one side  
of the ring in the slot of the phenolic clamp donut (shown in Figure 6-5).  
3. Use your fingers to seat the O-ring into the groove within the clamp.  
Figure 6-5 Positioning the O-Ring Within the Clamp  
Front Panel and  
Interface Board  
Replacement  
A1 Front Panel and Interface Board Assembly  
1. See Figure 6-2 for component locations.  
2. Remove the four semi-rigid cables that connect to the coupler on the  
front panel.  
3. Remove the ten screws that secure the front panel assembly to the front  
frame.  
4. Grasp the test ports and pull the front panel assembly out, tilting the top  
of the assembly toward you.  
5. Unplug the ribbon cable attached to the board assembly on the front  
panel.  
6. Grasp the cable attached to the line switch and carefully pull it toward  
the front of the instrument. This provides enough cable length for you to  
tilt the front panel assembly the rest of the way out of the test set frame.  
7. Carefully remove the front panel assembly.  
8. Lay the front panel assembly face down on the work surface.  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
Bias Tees Replacement  
A7 and A9 Bias Tees  
1. See Figure 6-2 for component locations.  
2. Remove the two semi-rigid cables attached to the bias tee to be replaced.  
3. De-solder the wires attached to the bias tee.  
4. Remove the two screws that secure the bias tee to the bias-tee bracket.  
5. Remove the bias tee.  
NOTE  
This procedure does not apply to Option 002 or Option 002 “plus” 007.  
Test Port Coupler  
Replacement  
A6 and A8 Test Port Couplers  
1. See Figure 6-2 for component locations.  
2. Remove the front panel assembly as described in the procedure “A1  
Front Panel and Interface Board Assembly”.  
3. Remove the test port connector nut with a 1-inch wrench.  
4. Remove the test port washer.  
5. Remove the coupler from the front panel.  
Test Port Attenuator  
Replacement  
A16 or A17 Port Attenuators  
NOTE  
This procedure does not apply to Option 002 or Option 002 “plus” 007.  
1. See Figure 6-2 for component locations.  
2. Remove the two semi-rigid cables attached to the attenuator.  
3. Unplug the ribbon cable from the attenuator.  
4. Remove the two screws that secure the attenuator bracket to the  
amplifier bracket.  
5. Remove the attenuator/attenuator bracket from the instrument.  
6. Remove the two screws that secure the attenuator to the attenuator  
bracket.  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
Input Amplifier  
Replacement  
A22 Input Amplifier Assembly  
NOTE  
This procedure is for Option 007, Option 002 “plus” 007, and Option 004  
“plus” 007, only.  
1. See the figure in Chapter 7, Table 7-17 for the location of the A22  
amplifier.  
2. Without disconnecting AT1 and AT2 fixed attenuators, remove the other  
five semi-rigid cables attached to the A18 switch/splitter.  
3. Remove the W45 semi-rigid cable between the A22 input amplifier and  
J7 rear-panel RF input connector.  
4. Remove the two screws holding the switch/splitter to the amplifier  
mount bracket.  
5. Remove the switch/splitter from the amplifier mount bracket.  
6. Remove the four screws that secure the A22 input amplifier to the  
amplifier-mount bracket.  
Buffer Amplifier  
Replacement  
A23 to A26 Buffer Amplifiers  
NOTE  
This procedure is for Option 007, Option 002 “plus” 007, and Option 004  
“plus” 007, only.  
1. See the figure in Chapter 7, Table 7-17 for the location of the buffer  
amplifiers.  
2. Remove the two semi-rigid cables from the buffer amplifier to be  
replaced.  
3. Remove the four screws securing the buffer amplifier to the amplifier  
mount bracket.  
4. Remove the buffer amplifier.  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
Post Regulator Board  
Replacement  
A27 Post Regulator Board Assembly  
NOTE  
This procedure is for Option 007, Option 002 “plus” 007, and Option 004  
“plus” 007, only.  
1. See the figure in Chapter 7, Table 7-17 for the location of the A22  
amplifier bracket. The A27 board assembly is located beneath the A22  
amplifier bracket.  
2. Without removing the step attenuator from the bracket (this step is not  
applicable to Option 002 “plus” 007), remove the four semi-rigid cables  
attached to the attenuators at Port 1 and Port 2.  
3. Remove the four buffer amplifiers from the bracket (refer to “A23 to  
A26 Buffer Amplifiers”).  
4. Remove the A18 switch/splitter assembly (refer to “A18 Switch/Splitter  
Assembly”).  
5. Remove the A22 input amplifier (refer to “A22 Input Amplifier  
Assembly”).  
6. Remove the four screws attaching the amplifier bracket to the test set.  
7. Flip the amplifier bracket over. Note the A27 board assembly mounted  
to the underside of the bracket.  
8. De-solder the two pins from the regulator to remove the A27 amplifier  
regulator board assembly.  
9. Remove the five screws holding the board assembly to the bracket.  
10. Remove the two screws holding the voltage regulator to the bracket.  
11. Remove the regulator board assembly from the amplifier mount bracket.  
NOTE  
Do not loosen the grommets (HP part number 3050-0003) located on the  
regulator board assembly.  
12. For reassembly, install two grommets on the underside of the mount  
bracket. There are two cut-outs on the sheet metal for these grommet  
insulators.  
HP 8517B S-Parameter Test Set Manual 6-13  
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HP 8517B Test Set Replacement Procedures  
Assembly Replacement Procedures  
6-14 HP 8517B S-Parameter Test Set Manual  
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7
HP 8517B Replaceable Parts  
Introduction  
This section provides information about ordering replacement parts. Parts  
that can be replaced include major assemblies and chassis hardware, but not  
individual pieces of major assemblies. Table 7-1 lists the major assembly  
reference designations and abbreviations used in the parts lists.  
Rebuilt-Exchange  
Assemblies  
Rebuilt-exchange assemblies (R-E assemblies) cost less than new  
assemblies. They are available through the rebuilt-exchange program.  
Factory rebuilt (repaired and tested) assemblies meet all factory  
specifications required of a new assembly. They are available on an  
exchange (trade-in) basis only. Defective assemblies must be returned for  
credit. Figure 7-2 illustrates the rebuilt-exchange procedure. The rest of the  
figures in this chapter provide parts information. If you have any questions,  
contact the HP Sales and Service office in your region.  
Replaceable Parts List  
Use the illustrations in this chapter to help locate and identify HP 8517B  
replaceable parts. Each illustration is accompanied by a replaceable parts list  
that includes the following information:  
• Hewlett-Packard part number.  
• Part quantity as shown in the corresponding figure. (There may or may  
not be more of the same part located elsewhere in the instrument.)  
• Part description, using the abbreviations found in Table 7-3.  
NOTE  
A typical manufacturer of the part is identified by a five-digit code (refer to  
the Manufacturers Code list in Table 7-2) and given only if a part is available  
from an alternate supplier (other than Hewlett-Packard).  
.
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HP 8517B Replaceable Parts  
Ordering Information  
To order parts listed in the replaceable parts table, record the following  
information, then address the order to the nearest Hewlett-Packard Sales and  
Service Office:  
the Hewlett-Packard part number  
the quantity required  
To order parts not listed in the replaceable parts lists, record the following  
information:  
the instrument model number  
the complete instrument serial number  
the description and function of the part, and  
the number of parts required  
Address the order to the nearest Hewlett-Packard Sales and Service Office.  
The office addresses are provided in “Service and Support” of this manual.  
To Order Parts . . . . Fast!  
• Telephone 1-(800) 227-8164  
• Monday through Friday, 6 am to 5 pm (Pacific Standard Time)  
Hewlett-Packard Parts specialists have direct on-line access to replacement  
parts inventory corresponding to the replaceable parts list in this manual.  
There is a charge for one day delivery service. The standard delivery time is  
four days.  
For after hours and holidays, phone (415) 968-2347. The fast-service applies  
to United States customers, only. Outside the United States, contact your  
nearest Hewlett-Packard Sales and Service Office.  
Table 7-1  
Reference Designation Abbreviations  
A
Assembly  
F
Fuse  
Filter  
S
T
Switch  
AT  
Attenuator, Isolator, Limiter,  
Termination  
FL  
Transformer  
B
Fan, Motor  
Battery  
HY Circulator  
TB  
TC  
Terminal Block  
Thermocouple  
BT  
J
Electrical Connector  
(Stationary Portion),  
Jack  
C
Capacitor  
Coupler  
K
L
Relay  
TP  
U
Test Point  
CP  
Coil, Inductor  
Integrated Circuit,  
Microcircuit  
CR  
Diode, Diode Thyristor, Step  
Recovery Diode, Varactor  
M
Meter  
V
Electron Tube  
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HP 8517B Replaceable Parts  
Table 7-1  
Reference Designation Abbreviations (Continued)  
DC  
Directional Coupler  
MP Miscellaneous  
Mechanical Part  
VR  
Breakdown Diode  
(Zener), Voltage  
Regulator  
DL  
DS  
Delay Line  
P
Electrical Connector  
W
X
Cable, Wire, Jumper  
(Movable Portion), Plug  
Annunciator, Lamp, Light  
Emitting Diode (LED),  
Signaling Device (visible)  
Q
Silicon Controlled  
Rectifier (SCR),  
Transistor, Triode  
Thyristor  
Socket  
E
Miscellaneous Electrical Part  
R
Resistor  
Y
Z
Crystal Unit  
(Piezoelectric, Quartz)  
RT Thermistor  
Tuned Cavity, Tuned  
Circuit  
Table 7-2 Manufacturer Names and Addresses  
Manufacturer  
Code  
Manufacturer Name  
Manufacturer Address  
00000  
00853  
24546  
28480  
56289  
Any satisfactory supplier  
N/A  
Sangamo Elec Co. S. Carolina Div  
Corning Glass Works (Bradford)  
Hewlett-Packard Co. Corporate HQ  
Sprague Electric Company  
Pickens, SC 29671  
Bradford, PA 16701  
Palo Alto, CA 94304  
North Adams, MA 01247  
HP 8517B S-Parameter Test Set Manual 7-3  
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HP 8517B Replaceable Parts  
Table 7-3 Standard Abbreviations  
A
A
Across Flats, Acrylic, Air (Dry Method), Ampere  
ADJ  
ANSI  
ASSY  
AWG  
Adjust, Adjustment  
American National Standards Institute (formerly USASI-ASA)  
Assembly  
American Wire Gage  
B
BCD  
BD  
Binary Coded Decimal  
Board, Bundle  
BE-CU  
BNC  
BRG  
BRS  
BSC  
BTN  
Beryllium Copper  
Type of Connector  
Bearing, Boring  
Brass  
Basic  
Button  
C
C
Capacitance, Capacitor, Cold, Center Tapped, Cermet, Compression  
CCP  
Carbon Composition Plastic  
CD  
Cadmium, Card, Cord  
CER  
Ceramic  
CHAM  
CHAR  
CMOS  
CNDCT  
CONT  
CONV  
CPRSN  
CUP-PT  
Chamfer  
Character, Characteristic, Charcoal  
Complementary Metal Oxide Semi-conductor  
Conducting, Conductive, Conductivity, Conductor  
Contact, Continuous, Control, Controller  
Converter  
Compression  
Cup point  
D
Deep, Depletion, Depth, Diameter, Direct Current  
Darlington  
D
DA  
DAP-GL  
DBL  
Diallyl Phthalate Glass  
Double  
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Table 7-3 Standard Abbreviations (Continued)  
DCDR  
DEG  
Decoder  
Degree  
D-HOLE  
DIA  
D-Shaped hole  
Diameter  
DIP  
Dual In-Line Package  
DIP Solder  
DIP-SLDR  
DO  
Package Type Designation  
Deep, Depth, Diametric Pitch, Dip  
Depletion Mode  
DP  
D-MODE  
DP3T  
DPDT  
Double Pole Triple Throw  
Double Pole Double  
Throw  
DWL  
Dowel  
E
E-R  
E-Ring  
EXT  
Extended, Extension, External, Extinguish  
F
F
Fahrenheit, Farad, Female, Fixed, Flange, Frequency, Film (Resistor)  
FC  
Carbon Film/Composition, Edge of Cut-off Frequency, Face  
FDTHRU  
FEM  
FIL-HD  
FL  
Feed-through  
Female  
Fillister Head  
Flash, Flat, Fluid  
FLAT-PT  
FR  
Flat Point  
Front  
RFEQ  
FT  
Frequency  
Current Gain Bandwidth Product (Transition Frequency), Feet, Foot  
FXD  
Fixed  
G
GEN  
GND  
GP  
General, Generator  
Ground  
General Purpose, Group  
H
H
Henry  
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Table 7-3 Standard Abbreviations (Continued)  
HDW  
HEX  
HLCL  
HP  
Hardware  
Hexadecimal, Hexagon, Hexagonal  
Helical  
Hewlett-Packard Company, High Pass  
I
IIC  
ID  
Collector Current, Integrated Circuit  
Identification, Inside Diameter  
IF  
Intermediate Frequency, Forward Current  
IN  
Inch  
INCL  
INT  
Including  
Integral, Intensity, Internal  
J
Junction Field Effect Transistor  
Junction Field Effect Transistor  
K
J-FET  
JFET  
K
Kelvin, Key, Kilo, Potassium  
Knurled  
KNRLD  
KVDC  
Kilovolts Direct Current  
L
LED  
LG  
Light Emitting Diode  
Length, Long  
LIN  
LK  
Linear, Linearity  
Link, Lock  
LKG  
LUM  
Leakage, Locking  
Luminous  
M
M
Male, Maximum, Mega, Mi, Milli, Mode  
Milliampere  
MA  
MACH  
MAX  
MC  
Machined  
Maximum  
Molded Carbon Composition  
Metal, Metallized  
Mega Hertz  
MET  
MHZ  
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Table 7-3 Standard Abbreviations (Continued)  
MINTR  
MIT  
Miniature  
Miter  
MLD  
MM  
Mold, Molded  
Magnetized Material, Millimeter  
Momentary  
MOM  
MTG  
MTLC  
MW  
Mounting  
Metallic  
Milliwatt  
N
N
Nano, None  
N_CHAN  
NH  
N-Channel  
Nano Henry  
NM  
Nanometer, nonmetallic  
Normally Open, Number  
Nominal  
NO  
NOM  
NPN  
NS  
Negative Positive Negative (Transistor)  
Nanosecond, Non-Shorting, Nose  
Numeric  
NUM  
NYL  
Nylon (Polyamide)  
O
OA  
Over-All  
OD  
Outside Diameter  
Operational Amplifier  
Optical, Option, Optional  
P
OP AMP  
Opt  
PA  
Picoampere, Power Amplifier  
Pan Head  
PAN-HD  
PAR  
PB  
Parallel, Parity  
Lead (Metal), Push-button  
Printed Circuit  
PC  
PCB  
P-CHAN  
PD  
Printed Circuit Board  
P-Channel  
Pad, Power Dissipation  
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Table 7-3 Standard Abbreviations (Continued)  
PF  
Pico Farad, Power Factor  
PKG  
PLSTC  
PNL  
Package  
Plastic  
Panel  
PNP  
Positive Negative Positive (Transistor)  
POLYC  
POLYE  
POT  
Polycarbonate  
Polyester  
Potentiometer  
POZI  
PREC  
PRP  
Pozidriv Recess  
Precision  
Purple, Purpose  
PSTN  
PT  
Piston  
Part, Point, Pulse Time  
PW  
Pulse Width  
Q
Q
Figure of Merit  
R
R
Range, Red, Resistance, Resistor, Right, Ring  
REF  
RES  
RF  
Reference  
Resistance, Resistor  
Radio Frequency  
RGD  
RND  
RR  
Rigid  
Round  
Rear  
RVT  
Rivet, Riveted  
S
Surface Acoustic Wave Resonator  
Segment  
SAWR  
SEG  
SGL  
SI  
Single  
Silicon, Square Inch  
Slide Slow  
SL  
SLT  
SMA  
Slot, Slotted  
Subminiature, A-Type (Threaded Connector)  
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HP 8517B Replaceable Parts  
Table 7-3 Standard Abbreviations (Continued)  
SMB  
SMC  
SPCG  
SPDT  
SPST  
SQ  
Subminiature, B-Type (Slip-on Connector)  
Subminiature, C-Type (Threaded Connector)  
Spacing  
Single Pole Double Throw  
Single Pole SIngle Throw  
Square  
SST  
Stainless Steel  
STL  
Steel  
SUBMIN  
SZ  
Subminiature  
Size  
T
T
Teeth, temperature, Thickness, Time, Timed, Tooth, Typical  
TA  
Ambient Temperature, Tantalum  
Temperature Coefficient  
Thread, Threaded  
Thick  
TC  
THD  
THK  
TO  
Package Type Designation  
Tapping  
TPG  
TR-HD  
TRMR  
TRN  
TRSN  
Truss Head  
Trimmer  
Turn, Turns  
Torsion  
U
UCD  
Microcandela  
(or  
µCD)  
UF  
(or  
Micro Farad  
µF)  
UH  
(or  
Micro Henry  
µH)  
UL  
(or  
Microliter, Underwriters’ Laboratories, Inc.  
µCD)  
UNHDND  
Unhardened  
V
Variable, Violet, Volt, Voltage  
Vacuum, Volt—Alternating Current  
V
VAC  
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Table 7-3 Standard Abbreviations (Continued)  
VAR  
VDC  
Variable  
Volts—Direct Current  
W
W
Watt, Wattage, White, Wide, Width  
W/SW  
WW  
With, Switch  
Wire Wound  
X
X
By (as used with dimensions), Reactance  
Y
YIG  
ZNR  
Yttrium-Iron-Garnet  
Z
Zener Diode  
Table 7-4 Multipliers, Abbreviation and Description  
Abbreviation  
Prefix  
Multiple  
T
tera  
1012  
109  
G
M
k
giga  
mega  
kilo  
106  
103  
da  
d
deka  
deci  
centi  
milli  
102  
10-1  
10-2  
10-3  
10-6  
10-9  
10-12  
10-15  
10-18  
c
m
µ
n
micro  
nano  
pico  
femto  
atto  
p
f
a
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HP 8517B Replaceable Parts  
Figure 7-1 Power Cable and Plug Part Numbers  
HP 8517B S-Parameter Test Set Manual 7-11  
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HP 8517B Replaceable Parts  
Table 7-5 Instrument Fuses  
Fuse  
Name  
Location  
Amps for 100 to 120 Vac  
Amps for 220 to 250 Vac  
(part number)  
(part number)  
2110-0002  
2110-0043  
2110-0001  
2110-0043  
2110-0001  
2110-0012  
ac Line  
F1  
Rear Panel  
2.0  
1.5  
1.0  
1.5  
1.0  
0.5  
1.0  
1.5  
1.0  
1.5  
1.0  
0.5  
2110-0001  
2110-0043  
2110-0001  
2110-0043  
2110-0001  
2110-0012  
+5 Vdc  
- 5 Vdc  
+15 Vdc  
- 15 Vdc  
Bias  
F1  
Regulator Board  
Regulator Board  
Regulator Board  
Regulator Board  
Front Panel  
F2  
F3  
F4  
Bias Fuses  
7-12 HP 8517B S-Parameter Test Set Manual  
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HP 8517B Replaceable Parts  
Use this fast, efficient economical  
method to keep your Hewlett-  
Packard instrument in service.  
*Hewlett-Packard pays postage on boxes mailed in the U.S.A.  
Figure 7-2 The Low Cost Rebuilt-Exchange Procedure  
HP 8517B S-Parameter Test Set Manual 7-13  
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HP 8517B Replaceable Parts  
Table 7-6 Major Assembly Reference Designator and Parts Information  
Ref Des  
A1  
HP Part Number  
QTY  
Description  
08513-60005  
1
2
Front Panel Interface Board Assembly  
A6, A8  
5086-7518  
5086-6518  
50 GHz Coupler, (NEW)  
50 GHz Coupler, (R-E)  
A7, A9  
A16, A17  
A18  
5086-7484  
5086-6484  
2
2
1
Bias Tee (NEW)  
Bias Tee (R-E)  
33325-60004  
33325-69004  
60 dB Step Attenuator (NEW)  
60 dB Step Attenuator (R-E)  
5086-7570  
5086-6570  
Switch/Splitter (NEW)  
Switch/Splitter (R-E)  
AT1, AT2  
AT3  
33340-60006  
5063-0691  
2
1
1
20-7 dB Tapered Pad  
DC Return  
A2  
08513-60004  
08513-69004  
IF-MUX Used for Option 001 (NEW) See Table 7-14  
IF-MUX Used for Option 001 (R-E)  
A3  
08517-60002  
08517-69002  
1
VTO Summing Amplifier Board Assembly (NEW)  
VTO Summing Amplifier Board Assembly (R-E)  
A4  
A5  
08517-60003  
08517-60001  
5086-6501  
1
1
4
HP-IB Board Assembly (NEW)  
Attenuator/Switch Driver Board Assembly  
Frequency Converter Assembly  
A10, A11, A12,  
and A13  
A14  
5086-7501  
5086-6501  
1
Frequency Converter 50 GHz (Samplers and VTO) (NEW)  
Frequency Converter 50 GHz (Samplers and VTO) (R-E)  
A15  
A19  
A20  
A27  
B1  
08516-60002  
08513-60001  
08513-60006  
08517-60044  
08513-20031  
9100-4723  
1
1
1
1
1
1
Regulator Board Assembly  
Motherboard Assembly  
HP-IB Interface Board Assembly  
Post Regulator Board Assembly  
Fan-TBAX 34-CFM 115 V 50/60 Hz 1.5kV DIEL  
Power Transformer  
T1  
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HP 8517B Replaceable Parts  
Figure 7-3 Major Assembly Locations in the Standard HP 8517B Test Set  
HP 8517B S-Parameter Test Set Manual 7-15  
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HP 8517B Replaceable Parts  
Table 7-7 Semi-Rigid Cable Assemblies in the Standard HP 8517B Test Set  
*Components not visible  
Ref Des  
W10  
W31  
W32  
W33  
W34  
W35  
W36  
W37  
W38  
W39  
W40  
HP Part Number  
08517-20039  
08517-20042  
08517-20041  
08517-20038  
08517-20038  
08517-20028  
08517-20031  
08517-20027  
08517-20032  
08517-20056  
08517-20040  
Quantity  
Description  
Cable Assembly AT1 to A10J2  
1
1
1
1
1
1
1
1
1
1
1
Cable Assembly A8J3 to A11J2  
Cable Assembly A6J3 to A12J2  
Cable Assembly A8J2 to A9J2  
Cable Assembly A6J2 to A7J2  
Cable Assembly A17J2 to A18J7  
Cable Assembly A7J1 to A16J1  
Cable Assembly A16J2 to A18J1  
Cable Assembly A9J1 to A17J1  
Cable Assembly AT3 to Rear Panel J7  
Cable Assembly AT2 to A13J2  
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HP 8517B Replaceable Parts  
Table 7-8 Flexible Cable Assemblies in the Standard HP 8517B Test Set  
Ref Des  
W1  
HP Part Number  
08513-60121  
08513-60122  
08513-60123  
08513-60124  
08513-60133  
08513-60134  
08513-60136  
08513-60138  
Quantity  
Description  
Cable Assembly A12J3 to A1J11  
1
1
1
1
1
1
1
1
W2  
Cable Assembly A13J3 to A4J11  
Cable Assembly A10J3 to A2J11  
Cable Assembly A11J3 to A3J11  
Cable Assembly A3J1 to A14J1  
Cable Assembly A3J2 to A7J11  
Cable Assembly A3J5 to A5J11  
Cable Assembly A3J7 to A6J11  
W3  
W4  
W13  
W14  
W16  
W18  
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HP 8517B Replaceable Parts  
Table 7-8 Flexible Cable Assemblies in the Standard HP 8517B Test Set (Continued)  
W20  
W21  
W22  
W23  
W28  
W29  
W30  
W42  
W43  
W44  
08513-60140  
08513-60141  
08513-60142  
08513-60143  
08517-60014  
85102-60226  
08513-60014  
08513-60036  
08513-60013  
08517-60015  
1
1
1
1
1
1
1
1
1
1
Cable Assembly A3J4 to A14J2  
Cable Assembly A5J2 to A18J4  
Cable Assembly A5J1 to A18J3  
Cable Assembly A5J3 to A18J6  
Ribbon Cable Assembly A16 through A19  
Cable Assembly Line Switch  
Cable Assembly J10 to J11  
Cable Assembly A4 to A20  
Cable Assembly A1 to A19  
Cable Assembly A17 through A19  
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Table 7-9 Miscellaneous Parts, Front Panel HP 8517B Test Set  
Ref Des  
DS1,DS2  
E33,E34  
F1,F2  
J13,J141  
43  
HP Part Number  
1990-0858  
2110-0797  
2110-0012  
–
Quantity  
Description  
LED Lamp 25 MA, Maximum  
2
2
Fuse Holder  
2
Fuse 0.5 A 250 V  
See Table 7-10  
Front Bezel  
1 ea  
1
5021-8747  
1450-0615  
08340-40002  
08517-00002  
08517-00003  
48  
2
Retainer LED  
Mount LED  
65  
2
75  
1
Front Dress Panel  
Front Sub-Panel  
76  
1
1. See Table 7-10 for parts detail.  
HP 8517B S-Parameter Test Set Manual 7-19  
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HP 8517B Replaceable Parts  
Table 7-10 Test Port Connector Assembly Components  
Item  
1
HP Part Number  
Quantity  
Description  
5062-7274  
1
Test Port Connector  
2
5001-3930  
5001-3904  
5001-3905  
5001-3906  
.0002 IN SHIM  
.0005 IN SHIM  
.001 IN SHIM  
.002 IN SHIM  
3
4
5
5062-7276  
5021-3428  
5021-3427  
1
2
2
Test Port Center Conductor  
Test Port Connector Nut  
Test Port Washer  
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HP 8517B Replaceable Parts  
Table 7-11 Miscellaneous Parts, Rear Panel HP 8517B Test Set  
Ref Des  
E10  
FL1  
J10  
J11  
1
HP Part Number  
5062-7243  
9135-0217  
1251-2197  
1251-2204  
0380-0643  
0400-0010  
0380-0926  
1251-7812  
0380-0002  
2510-0322  
2510-0270  
3050-0139  
3050-0152  
3050-0227  
3160-0309  
08517-00001  
2190-0017  
08513-00002  
Quantity  
Description  
1
1
1
1
2
4
4
6
4
4
4
12  
4
4
1
1
4
1
2.4 mm RF Connector Assembly  
Line Module-Filtered  
Connector R&P 24F (Part of W30)  
Connector R&P 24M (Part of W30)  
Standoff-Hex 0.255-IN-LG 6-32 THD  
Grommet-Round 0.188-IN-ID .312-IN-GRV-OD  
Threaded Insert-STDF 6-32 0.188-IN-LG SST  
Connector Jackscrew  
21  
31  
42  
61  
Screw-Mach 6-32 0.625-IN-LG PAN-HD-POZI  
Nut-HEX-W/LKWR 6-32-THD 0.109-IN-THK  
Screw-Mach 8-32 3.25-IN-LG PAN-HD-POZI  
Washer-FL MTLC NO.8 0.172-IN-ID  
Washer-Shoulder NO.8 0.172-IN-ID .438-IN-OD  
Washer-FL MTLC NO.6 0.149-IN-ID  
Finger Guard  
71  
103  
123  
131  
141  
16  
17  
Rear Panel  
213  
361  
Washer-LK INTL NO. 10 0.195-IN-ID  
Transformer Bracket  
HP 8517B S-Parameter Test Set Manual 7-21  
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HP 8517B Replaceable Parts  
Table 7-11 Miscellaneous Parts, Rear Panel HP 8517B Test Set  
49  
50  
5021-0906  
5001-3907  
2190-0016  
2190-0104  
2950-0001  
2950-0132  
7121-2380  
08513-20032  
0590-0663  
14  
2
Teflon™ Cable Sleeve  
Line Module Retainer Clips  
51  
2
Washer-LK INTL T 3/8 IN 0.377-IN-ID  
Washer-LK INTL T 7/16 IN 0.439-IN-ID  
Nut-HEX-DBL-CHAM 3/8-32-THD 0.094-IN-THK  
Nut-HEX-DBL-CHAM 7/16-28-THD 0.094-IN-THK  
Serial Number Label  
52  
1
593  
60  
2
1
61  
1
933  
962  
2
Transformer Support Bracket  
6
Nut-HEX 4/40  
1. See Figure 7-4, item 2 for detail.  
2. See Figure 7-4, item 3 for detail.  
3. See Figure 7-4, item 1 for detail.  
7-22 HP 8517B S-Parameter Test Set Manual  
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HP 8517B Replaceable Parts  
Figure 7-4 Detailed Views of Hardware Stack-Ups  
HP 8517B S-Parameter Test Set Manual 7-23  
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HP 8517B Replaceable Parts  
Table 7-12 Miscellaneous Parts, Top Internal View  
Item  
1
HP Part Number  
0360-0031  
Quantity  
Description  
1
5
1
1
1
1
2
1
–
Terminal Crimp  
Machine Screw  
RFI Gasket  
2
2360-0115  
3
08512-20005  
08513-00001  
08513-00002  
08513-00015  
2200-0109  
4
Top Deck  
5
Transformer Bracket  
Capacitor Plate  
Machine Screw  
Mounting Plate  
6
7
8
08514-00007  
9
See Table 7-13 for all part  
numbers and locations  
C1 through C4 and R1 through R4  
10  
0513-00037  
1
Enclosure Bracket  
7-24 HP 8517B S-Parameter Test Set Manual  
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HP 8517B Replaceable Parts  
Table 7-12 Miscellaneous Parts, Top Internal View  
11  
2200-0107  
3
Machine Screws  
Table 7-13 Miscellaneous Parts, Motherboard  
bottom.pcx  
Ref Des  
HP Part Number  
0180-2671  
Quantity  
4
Description  
Manufacturer  
Code  
Manufacturer Part  
Number  
C1 - C4  
Capacitor-FXD .012F+75-10% 30VDC AL  
00853  
500123U030AC2A  
HP 8517B S-Parameter Test Set Manual 7-25  
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HP 8517B Replaceable Parts  
Table 7-13 Miscellaneous Parts, Motherboard (Continued)  
C5 - C6  
J1  
0160-4834  
1251-574  
2
Capacitor-FXD .047  
µF ±10% 100VDC CER  
Connector 20-PIN M Post Type  
(A19J1) DOES NOT INCLUDE A19MP1 and  
A19MP2  
Ref Des  
HP Part Number  
Quantity  
Description  
Manufacturer  
Code  
Manufacturer Part  
Number  
J2  
J3  
1251-6868  
1251-7939  
4
1
Connector 5-PIN M Post Type  
Connector - Post Type 0.100-PIN-SPCG 14-CONT  
(A19J3 DOES NOT INCLUDE A19MP3)  
J4, J5, and J6  
J7  
1251-6868  
1251-3825  
1200-0508  
0764-0015  
0764-0016  
0757-0394  
1251-7882  
Connector 5-PIN M Post Type  
Connector 5-PIN M Post Type  
Socket - IC 14-CONT DIP-SLDR  
1
J8 and J9  
R1 and R2  
R3 and R4  
R5 and R6  
1 ea.  
1 ea.  
1 ea.  
1 ea.  
1 ea.  
Resistor 560  
Ω
5% 2W MO TC = 0±200  
5% 2W MO TC = 0±200  
1% 0.125W F TC = 0±100  
Resistor 1 k  
Ω
Resistor 51.1  
Ω
24546  
C4-1/8-T0-51R1-F  
XA2, XA3, XA4,  
and XA5  
Connector-PC Edge 2-Rows  
XA6 to XA14  
XA15  
Not Assigned  
1251-7882  
1
Connector-PC Edge 2-Rows  
7-26 HP 8517B S-Parameter Test Set Manual  
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HP 8517B Replaceable Parts  
Table 7-14 Parts Unique to HP 8517B Option 001 Test Set  
Ref Des  
A2  
HP Part Number  
08513-60004  
08513-69004  
Quantity  
1
Description  
Board Assembly, IF Multiplexer (NEW)  
Board Assembly, IF Multiplexer (R-E)  
Cable Assemblies Unique to Option 001  
Cable Assembly, A2J2 to J11A1  
Cable Assembly, A2J8 to J11A4  
Cable Assembly, A2J5 to J11A2  
Cable Assembly, A2J11 to J11A3  
Cable Assembly, A2J3 to J10A1  
W5  
W6  
W7  
W8  
W9  
08513-60125  
08513-60126  
08513-60127  
08513-60128  
08513-60129  
1
1
1
1
1
HP 8517B S-Parameter Test Set Manual 7-27  
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HP 8517B Replaceable Parts  
Table 7-14 Parts Unique to HP 8517B Option 001 Test Set  
W10  
Ref Des  
W11  
W12  
W15  
W17  
W19  
W24  
W25  
W26  
W27  
W45  
W46  
08513-60130  
HP Part Number  
08513-60131  
08513-60132  
08513-60135  
08513-60137  
08513-60139  
08513-60144  
08513-60145  
08513-60146  
08513-60147  
08517-20017  
08517-20018  
1
Cable Assembly, A2J9 to J10A4  
Quantity  
Description  
1
1
1
Cable Assembly, A2J6 to J10A2  
Cable Assembly, A2J12 to J10A3  
Cable Assembly, A3J3 to J10A7  
Cable Assembly, A3J6 to J10A5  
Cable Assembly, A3J8 to J10A6  
Cable Assembly, A12J3 to A2J1  
Cable Assembly, A13J3 to A2J7  
Cable Assembly, A10J3 to A2J4  
Cable Assembly, A11J3 to A2J10  
Cable Assembly, A8 to A18  
1
1
1
1
1
1
1
Cable Assembly, A6 to A18  
7-28 HP 8517B S-Parameter Test Set Manual  
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HP 8517B Replaceable Parts  
Table 7-15 Parts Unique to HP 8417B Option 002 Test Set  
Ref Des  
W59  
HP Part Number  
08517-20743  
08517-20737  
Quantity  
Description  
Cable Assembly, A12J3 to Port 1 J13  
Cable Assembly, A13J3 to Port 2J14  
1
1
W60  
HP 8517B S-Parameter Test Set Manual 7-29  
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HP 8517B Replaceable Parts  
Table 7-16 Parts Unique to HP 8517B Option 004 Test Set  
Ref Des  
W55  
HP Part Number  
08517-20051  
08517-20052  
08517-20050  
08517-60020  
Quantity  
Description  
1
1
1
1
Cable Assembly, AT7 to A9J1  
Cable Assembly, A8J3 to A17J2  
Cable Assembly, A17J1 to A11J2  
3 dB Attenuator  
W57  
W58  
AT7  
7-30 HP 8517B S-Parameter Test Set Manual  
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HP 8517B Replaceable Parts  
Table 7-17 Parts Unique to HP 8517B Option 007 Test Set  
Ref Des  
AT8 and AT9  
A22  
HP Part Number  
08516-60021  
5086-7650  
Quantity  
Description  
2
1
4
3 dB Attenuators  
Input Amplifier  
A23, A24,  
5086-7649  
Buffer Amplifiers  
A25, and A26  
A27  
08517-60045  
1
Post Regulator Board Assembly (Beneath A22 Input Amplifier)  
HP 8517B S-Parameter Test Set Manual 7-31  
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HP 8517B Replaceable Parts  
Table 7-17 Parts Unique to HP 8517B Option 007 Test Set (Continued)  
Ref Des  
HP Part Number  
Quantity  
Description  
Cable Assemblies Unique to Option 007  
Front Panel J7 to A22 Input Amplifier  
A22 Input Amplifier to A18J5  
A6 Coupler to A23  
AT1 to A24  
W45  
W46  
W47  
W48  
W49  
W50  
W51  
W52  
W53  
W54  
AT3  
08517-20023  
08517-20024  
08517-2003  
08517-20061  
08517-20036  
08517-20062  
08517-20034  
08517-20029  
08517-20034  
08517-20030  
33340-60004  
08516-60004  
33340-60004  
08516-60007  
1
1
1
1
1
1
1
1
1
1
1
1
1
1
A8 Coupler to A25  
AT2 to A26  
A23 to AT3  
A24 to AT4  
A25 to AT5  
AT6 to A26  
13 dB to 5 dB Attenuator  
10 dB Attenuator  
AT4  
AT5  
13 dB to 5 dB Attenuator  
10 dB Attenuator  
AT6  
7-32 HP 8517B S-Parameter Test Set Manual  
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HP 8517B Replaceable Parts  
Table 7-18 Parts Unique to Option 002 “plus” Option 007  
There are no unique parts to Option 002 “plus” Option 007. All other parts are included in Option 002 or Option 007.  
HP 8517B S-Parameter Test Set Manual 7-33  
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HP 8517B Replaceable Parts  
Table 7-19 Parts Unique to Option 004 “plus” Option 007  
Ref Des  
W56  
HP Part Number  
08517-20049  
Quantity  
1
Description  
A17J1 to A25  
All other parts are included in Option 004 or Option 007.  
7-34 HP 8517B S-Parameter Test Set Manual  
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HP 8517B Replaceable Parts  
Table 7-20 Instrument Chassis Replaceable Parts  
Item Number  
HP Part Number  
Quantity  
Description  
1
2
3
4
5
6
08513-00040  
08513-00041  
5021-8403  
5062-3747  
5062-3799  
5021-8496  
1
1
1
1
1
1
Top Cover  
Side Cover, Perforated  
Front Frame  
Bottom Cover  
Handle Assembly  
Trim, Front Handle  
HP 8517B S-Parameter Test Set Manual 7-35  
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HP 8517B Replaceable Parts  
Table 7-20 Instrument Chassis Replaceable Parts (Continued)  
7
5041-8821  
5062-3757  
HP Part Number  
5021-5837  
5021-5804  
5041-8802  
5041-8821  
5021-8538  
5021-8540  
4
Bottom Foot  
Side Cover  
8
1
Item Number  
Quantity  
Description  
9
1
1
1
2
1
1
18-inch Corner Strut  
Rear Frame  
Trim Strip  
10  
11  
12  
13  
14  
Back Panel Foot  
Lock Foot  
Lock Foot  
7-36 HP 8517B S-Parameter Test Set Manual  
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Index  
A
E
abbreviations used in parts descriptions, 7-4  
accessories descriptions, 2-3  
active LED location, 3-1  
environmental requirements, 2-2  
equipment requirements for replacing components, 6-3  
ESD information, 6-1  
adapter part numbers, 1-11  
ESD precaution, 1-13  
addressing a test set, 3-6  
altering signal path conditions, 3-10  
attaching anti-rotation clamps, 3-15  
F
fan assembly replacement, 6-8  
features, front panel, 3-1  
B
firmware compatibility matrix, 1-8  
fixture kit part number, 1-11  
frequency converter replacement, 6-5  
front panel boards replacement, 6-10  
front panel test ports, 4-1  
bias supply connector, 3-3  
bias tees replacement, 6-11  
bias tees usage, 1-2  
block diagram, Option 004 HP 8517B, 1-3  
block diagram, Option 007 HP 8517B, 1-3  
block diagram, standard HP 8517B, 1-2  
buffer amplifier replacement, 6-12  
front-panel parts ID, 7-19  
fuse part numbers, 7-12  
H
C
hardware stacking sequence, 7-23  
high-power device measurement, 3-9  
cable assemblies, flexible, 7-17  
cable assemblies, semi-rigid, 7-16  
cable descriptions and part numbers, 1-10  
cabling the test set, 2-5  
calibration cycle frequency, 1-6  
calibration kit part number, 1-10  
calibration procedure, 3-8  
I
IF switching in the test set, 3-6  
initializing a test set, 3-5  
input amplifier replacement, 6-12  
installing anti-rotation clamps, 3-15  
capacitor (filter capacitor) replacement, 6-6  
CAUTION: CORRECTION MAY BE INVALID, 3-10  
characteristics, 4-1, 4-2  
characteristics of test set, 4-1  
checking test set operation, 3-13  
checking test-system operation, 1-5  
checking test-system specifications, 1-5  
choosing a test set from multiple test sets, 3-6  
commands, switch driver, 3-6  
J
J10 and J10 interconnect locations, 3-2  
configuration, 2-5  
connection instructions, 2-6  
L
LED descriptions, 3-2  
line module location, 3-2  
connector-type descriptions, 2-6  
D
M
definitions of prefixes used, 7-10  
description of test set, 1-2  
manufacturer addresses (other than HP), 7-3  
measurement accuracy maintenance, 1-6  
measurement capabilities, 1-2  
mechanical specifications, test set, 4-1  
multiple test set configuration, 3-3, 3-7  
HP 8517B S-Parameter Test Set Manual Index-1  
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N
S
network analyzer compatibility matrix, 1-8  
normalizing parameters, viewing, 3-11  
safety precautions, 1-13  
sales and service internet address, vi  
sales and service office locations, vi  
selecting a test set, 3-5  
serial prefix location and description, 1-7  
service and support options, 1-9  
shipping the test set, 2-7  
source compatibility matrix, 1-8  
static discharge precautions, 6-1  
storage temperature, 2-2  
O
operation precautions, 1-13  
operation verification, 1-5  
option descriptions, 1-4  
options for service and support, 1-9  
ordering information, 7-2  
O-ring replacement, 2-6, 6-10  
switch/splitter replacement, 6-5  
switch-driver control, 3-6  
P
T
parts ID, front panel, 7-19  
temperature and humidity requirements, 2-2  
test equipment model requirements, 1-12  
test port attenuator modifications, 3-10  
test port characteristics, 4-1  
test port couplers replacement, 6-11  
test set, 4-2  
parts ID, instrument chassis, 7-35  
parts ID, internal top view, 7-24  
parts ID, major assemblies, 7-15  
parts ID, motherboard, 7-25  
parts ID, rear panel, 7-21  
parts ID, test port components, 7-20  
parts ID, unique to option 002, 7-27  
parts ID, unique to option 002 "plus" 007, 7-33  
parts ID, unique to option 004, 7-30  
parts ID, unique to option 004 "plus" 007, 7-34  
parts ID, unique to option 007, 7-31  
phase lock, 4-2  
test set accessories identification, 2-3  
test set adapters, 1-11  
test set connections, for two or more, 3-5  
test set options, 1-4  
test set specifications, 4-1  
test set switching, two test sets, 3-4  
test set test-fixture kit, 1-11  
phone-ordering parts, 7-2  
test set troubleshooting, 1-5  
physical characteristics, 4-2  
test-port connector replacement, 6-7  
test-port parts ID, 7-20  
trace memory storage, 3-11  
plug assembly part numbers, 7-11  
port attenuators replacement, 6-11  
post-regulator board replacement, 6-13  
power level input limits, 1-13  
power requirements, 4-2  
U
power transformer replacement, 6-9  
powering up, 3-5  
user 1 power levels for reference channel, 4-2  
using bias tees, 1-2  
using multiple test-set configurations, 3-5  
using the test set at a bench, 2-4  
R
racking the test set, 2-4  
R-E (rebuilt exchange assemblies) defined, 7-1  
R-E process, 7-13  
V
rear panel RF connector, 4-2  
rear-panel parts ID, 7-21  
verification kit part number, 1-10  
verifying test set performance, 3-14  
viewing S11 to S22 parameters, 3-12  
reference channel phase lock power level, 4-2  
reference designation, major assemblies, 7-14  
reference designator abbreviations, 7-2  
regulator board replacement, 6-6  
replacement procedure basics, 6-5  
revision information, 1-8  
W
what to do with damaged shipments, 2-2  
RF input damage level, 4-2  
Index-2 HP 8517B S-Parameter Test Set Manual  
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