CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
36-Mbit QDR™-II SRAM 2-Word
Burst Architecture
Features
Configurations
■ Separate independent read and write data ports
❐ Supports concurrent transactions
CY7C1410JV18 – 4M x 8
CY7C1425JV18 – 4M x 9
CY7C1412JV18 – 2M x 18
CY7C1414JV18 – 1M x 36
■ 267 MHz clock for high bandwidth
■ 2-word burst on all accesses
Functional Description
■ DoubleDataRate(DDR)interfacesonbothreadandwriteports
(data transferred at 534 MHz) at 267 MHz
The CY7C1410JV18, CY7C1425JV18, CY7C1412JV18, and
CY7C1414JV18 are 1.8V Synchronous Pipelined SRAMs,
equipped with QDR-II architecture. QDR-II architecture consists
of two separate ports: the read port and the write port to access
the memory array. The read port has data outputs to support read
operations and the write port has data inputs to support write
operations. QDR-II architecture has separate data inputs and
data outputs to completely eliminate the need to “turn-around”
the data bus required with common IO devices. Access to each
port is accomplished through a common address bus. The read
address is latched on the rising edge of the K clock and the write
address is latched on the rising edge of the K clock. Accesses to
the QDR-II read and write ports are completely independent of
one another. To maximize data throughput, both read and write
ports are provided with DDR interfaces. Each address location
is associated with two 8-bit words (CY7C1410JV18), 9-bit words
(CY7C1425JV18), 18-bit words (CY7C1412JV18), or 36-bit
words (CY7C1414JV18) that burst sequentially into or out of the
device. Because data can be transferred into and out of the
device on every rising edge of both input clocks (K and K and C
and C), memory bandwidth is maximized while simplifying
system design by eliminating bus “turn-arounds”.
■ Two input clocks (K and K) for precise DDR timing
❐ SRAM uses rising edges only
■ Two input clocks for output data (C and C) to minimize clock
skew and flight time mismatches
■ Echo clocks (CQ and CQ) simplify data capture in high-speed
systems
■ Single multiplexed address input bus latches address inputs
for both read and write ports
■ Separate port selects for depth expansion
■ Synchronous internally self-timed writes
■ QDR™-IIoperateswith1.5cyclereadlatencywhenDelayLock
Loop (DLL) is enabled
■ Operates like a QDR-I device with 1 cycle read latency in DLL
off mode
■ Available in x8, x9, x18, and x36 configurations
■ Full data coherency, providing most current data
■ Core V = 1.8V (±0.1V); IO V
= 1.4V to V
DD
DD
DDQ
Depth expansion is accomplished with port selects, which
enables each port to operate independently.
■ Available in 165-Ball FBGA package (15 x 17 x 1.4 mm)
■ Offered in both Pb-free and non Pb-free packages
■ Variable drive HSTL output buffers
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the C or C (or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
■ JTAG 1149.1 compatible test access port
■ Delay Lock Loop (DLL) for accurate data placement
Selection Guide
Description
Maximum Operating Frequency
Maximum Operating Current
267 MHz
267
250 MHz
250
Unit
MHz
mA
x8
x9
1330
1330
1370
1460
1200
1200
1230
1290
x18
x36
Cypress Semiconductor Corporation
Document #: 001-12561 Rev. *D
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised March 10, 2007
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Logic Block Diagram (CY7C1412JV18)
18
D
[17:0]
Write
Reg
Write
Reg
20
Address
Register
A
(19:0)
20
Address
Register
A
(19:0)
RPS
K
K
Control
Logic
CLK
Gen.
C
C
DOFF
Read Data Reg.
CQ
CQ
36
18
V
REF
18
18
Reg.
Reg.
Reg.
Control
Logic
WPS
BWS
18
18
Q
[17:0]
[1:0]
Logic Block Diagram (CY7C1414JV18)
36
D
[35:0]
Write
Reg
Write
Reg
19
Address
Register
A
(18:0)
19
Address
Register
A
(18:0)
RPS
K
K
Control
Logic
CLK
Gen.
C
C
DOFF
Read Data Reg.
CQ
CQ
72
36
V
REF
36
36
Reg.
Reg.
Reg.
Control
Logic
WPS
BWS
36
36
Q
[35:0]
[3:0]
Document #: 001-12561 Rev. *D
Page 3 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Pin Configuration
[1]
The pin configuration for CY7C1410JV18, CY7C1412JV18, and CY7C1414JV18 follow.
165-Ball FBGA (15 x 17 x 1.4 mm) Pinout
CY7C1410JV18 (4M x 8)
1
CQ
NC
NC
NC
NC
NC
NC
DOFF
NC
NC
NC
NC
NC
NC
TDO
2
NC/72M
NC
3
4
WPS
A
5
6
K
K
A
7
8
RPS
A
9
10
A
11
CQ
Q3
D3
NC
Q2
NC
NC
ZQ
D1
NC
Q0
D0
NC
NC
TDI
A
B
C
D
E
F
A
NWS
NC/144M
A
1
NC
NC
NC
Q4
NC
Q5
NC/288M
A
NWS
A
NC
NC
NC
NC
NC
NC
NC
NC
NC
D2
NC
NC
0
NC
V
V
V
V
SS
SS
SS
SS
D4
V
V
V
V
V
SS
SS
DD
DD
DD
DD
DD
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
DD
DD
DD
DD
DD
NC
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
NC
V
V
V
V
V
V
V
V
V
V
G
H
J
D5
V
V
V
V
REF
REF
DDQ
DDQ
NC
NC
Q6
NC
NC
Q1
K
L
NC
D6
NC
NC
Q7
A
NC
NC
NC
NC
NC
A
NC
NC
V
V
V
V
SS
SS
SS
SS
M
N
P
R
NC
D7
V
V
NC
SS
SS
SS
V
A
A
A
A
C
C
A
A
A
V
NC
SS
NC
TCK
A
A
A
A
NC
TMS
CY7C1425JV18 (4M x 9)
1
CQ
NC
NC
NC
NC
NC
NC
DOFF
NC
NC
NC
NC
NC
NC
TDO
2
NC/72M
NC
3
4
5
NC
6
K
K
A
7
8
9
10
A
11
CQ
Q4
D4
NC
Q3
NC
NC
ZQ
D2
NC
Q1
D1
NC
Q0
TDI
A
B
C
D
E
F
A
WPS
A
NC/144M
RPS
A
A
NC
NC
NC
Q5
NC
Q6
NC/288M
A
BWS
A
NC
NC
NC
NC
NC
NC
NC
NC
NC
D3
NC
NC
0
NC
V
V
V
V
SS
SS
SS
SS
D5
V
V
V
V
V
SS
SS
DD
DD
DD
DD
DD
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
DD
DD
DD
DD
DD
NC
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
NC
V
V
V
V
V
V
V
V
V
V
G
H
J
D6
V
V
V
V
REF
REF
DDQ
DDQ
NC
NC
Q7
NC
NC
Q2
NC
NC
NC
NC
D0
K
L
NC
D7
NC
NC
Q8
A
NC
NC
NC
NC
NC
A
V
V
SS
SS
SS
SS
M
N
P
R
NC
D8
V
V
V
V
SS
SS
SS
V
A
A
A
A
C
C
A
A
A
V
SS
NC
TCK
A
A
A
A
TMS
Note
1. NC/72M, NC/144M and NC/288M are not connected to the die and can be tied to any voltage level.
Document #: 001-12561 Rev. *D
Page 4 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Pin Configuration
[1]
The pin configuration for CY7C1410JV18, CY7C1412JV18, and CY7C1414JV18 follow.
(continued)
165-Ball FBGA (15 x 17 x 1.4 mm) Pinout
CY7C1412JV18 (2M x 18)
1
CQ
NC
NC
NC
NC
NC
NC
DOFF
NC
NC
NC
NC
NC
NC
TDO
2
NC/144M
Q9
3
4
WPS
A
5
BWS
NC
A
6
K
K
A
7
8
9
10
NC/72M
NC
11
CQ
Q8
D8
D7
Q6
Q5
D5
ZQ
D4
Q3
Q2
D2
D1
Q0
TDI
A
B
C
D
E
F
A
NC/288M
RPS
A
1
D9
BWS
A
A
NC
NC
NC
NC
NC
NC
0
NC
D10
Q10
Q11
D12
Q13
V
V
V
Q7
SS
SS
SS
SS
D11
V
V
V
V
V
V
NC
SS
SS
DD
DD
DD
DD
DD
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
DD
DD
DD
DD
DD
NC
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
D6
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
Q12
D13
V
V
V
V
V
V
V
V
V
V
NC
G
H
J
NC
V
V
V
V
REF
REF
DDQ
DDQ
NC
NC
D14
NC
Q4
D3
K
L
Q14
D15
D16
Q16
Q17
A
NC
NC
NC
NC
NC
A
Q15
NC
V
V
V
V
NC
Q1
SS
SS
SS
SS
M
N
P
R
V
V
SS
SS
SS
D17
NC
V
A
A
A
A
C
C
A
A
A
V
NC
D0
SS
A
A
A
A
TCK
TMS
CY7C1414JV18 (1M x 36)
1
2
3
4
5
BWS
BWS
A
6
K
K
A
7
BWS
BWS
A
8
9
10
NC/144M
Q17
11
CQ
Q8
D8
D7
Q6
Q5
D5
ZQ
D4
Q3
Q2
D2
D1
Q0
TDI
A
B
C
D
E
F
CQ
NC/288M NC/72M
WPS
A
RPS
A
A
2
3
1
0
Q27
D27
D28
Q29
Q30
D30
DOFF
D31
Q32
Q33
D33
D34
Q35
TDO
Q18
Q28
D20
D29
Q21
D22
D18
D19
Q19
Q20
D21
Q22
D17
D16
Q16
Q15
D14
Q13
V
V
V
V
Q7
SS
SS
SS
SS
V
V
V
V
V
D15
SS
SS
DD
DD
DD
DD
DD
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
DD
DD
DD
DD
DD
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
D6
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
V
V
V
V
V
V
V
V
V
V
Q14
G
H
J
D13
V
V
V
V
REF
REF
DDQ
DDQ
Q31
D23
D12
Q4
D3
K
L
D32
Q24
Q34
D26
D35
TCK
Q23
D24
D25
Q25
Q26
A
Q12
D11
D10
Q10
Q9
V
V
Q11
Q1
SS
SS
SS
SS
M
N
P
R
V
V
V
V
SS
SS
SS
V
A
A
A
A
C
C
A
A
A
V
D9
SS
A
A
A
A
D0
A
TMS
Document #: 001-12561 Rev. *D
Page 5 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Pin Definitions
Pin Name
IO
Pin Description
D
Input-
Synchronous
Data Input Signals. Sampled on the rising edge of K and K clocks during valid write operations.
[x:0]
CY7C1410JV18 - D
[7:0]
CY7C1425JV18 - D
CY7C1412JV18 - D
CY7C1414JV18 - D
[8:0]
[17:0]
[35:0]
WPS
Input-
Synchronous
Write Port Select − Active LOW. Sampled on the rising edge of the K clock. When asserted active, a
write operation is initiated. Deasserting deselects the write port. Deselecting the write port ignores D
.
[x:0]
NWS ,
Nibble Write Select 0, 1 − Active LOW (CY7C1410JV18 Only). Sampled on the rising edge of the K
and K clocks during Write operations. Used to select which nibble is written into the device during the
0
NWS
1
current portion of the Write operations.Nibbles not written remain unaltered. NWS controls D
and
0
[3:0]
NWS controls D
.
1
[7:4]
All Nibble Write Selects are sampled on the same edge as the data. Deselecting a Nibble Write Select
ignores the corresponding nibble of data and it is not written into the device.
BWS ,
Input-
Synchronous
Byte Write Select 0, 1, 2, and 3 − Active LOW. Sampled on the rising edge of the K and K clocks during
write operations. Used to select which byte is written into the device during the current portion of the write
operations. Bytes not written remain unaltered.
0
BWS ,
1
BWS ,
2
CY7C1425JV18 − BWS controls D
BWS
0
[8:0]
3
CY7C1412JV18 − BWS controls D
, BWS controls D
, BWS controls D
.
[17:9]
0
[8:0]
1
CY7C1414JV18 − BWS controls D
[35:27].
,BWS controls D
and BWS controls
0
[8:0]
1
[17:9]
2
[26:18]
3
D
All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write Select
ignores the corresponding byte of data and it is not written into the device.
A
Input-
Synchronous
Address Inputs. Sampled on the rising edge of the K (Read address) and K (Write address) clocks during
active read and write operations. These address inputs are multiplexed for both read and write operations.
Internally, the device is organized as 4M x 8 (2 arrays each of 2M x 8) for CY7C1410JV18, 4M x 9 (2
arrays each of 2M x 9) for CY7C1425JV18, 2M x 18 (2 arrays each of 1M x 18) for CY7C1412JV18 and
1M x 36 (2 arrays each of 512K x 36) for CY7C1414JV18. Therefore, only 21 address inputs are needed
to access the entire memory array of CY7C1410JV18 and CY7C1425JV18, 20 address inputs for
CY7C1412JV18 and 19 address inputs for CY7C1414JV18. These inputs are ignored when the appro-
priate port is deselected.
Q
Outputs-
Synchronous
Data Output Signals. These pins drive out the requested data during a read operation. Valid data is
driven out on the rising edge of both the C and C clocks during read operations, or K and K when in single
[x:0]
clock mode. When the read port is deselected, Q
are automatically tri-stated.
[x:0]
CY7C1410JV18 − Q
[7:0]
CY7C1425JV18 − Q
[8:0]
CY7C1412JV18 − Q
[17:0]
CY7C1414JV18 − Q
[35:0]
RPS
C
Input-
Synchronous
Read Port Select − Active LOW. Sampled on the rising edge of positive input clock (K). When active, a
read operation is initiated. Deasserting deselects the read port. When deselected, the pending access is
allowed to complete and the output drivers are automatically tri-stated following the next rising edge of
the C clock. Each read access consists of a burst of two sequential transfers.
Input Clock Positive Input Clock for Output Data. C is used in conjunction with C to clock out the read data from
the device. C and C can be used together to deskew the flight times of various devices on the board back
C
K
K
Input Clock Negative Input Clock for Output Data. C is used in conjunction with C to clock out the read data from
the device. C and C can be used together to deskew the flight times of various devices on the board back
Input Clock Positive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device
and to drive out data through Q
edge of K.
when in single clock mode. All accesses are initiated on the rising
[x:0]
Input Clock Negative Input Clock Input. K is used to capture synchronous inputs being presented to the device and
to drive out data through Q when in single clock mode.
[x:0]
Document #: 001-12561 Rev. *D
Page 6 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Pin Definitions (continued)
Pin Name
IO
Pin Description
CQ
Echo Clock CQ is Referenced with Respect to C. This is a free - running clock and is synchronized to the Input
clock for output data (C) of the QDR-II. In the single clock mode, CQ is generated with respect to K. The
CQ
ZQ
Echo Clock CQ is Referenced with Respect to C. This is a free - running clock and is synchronized to the Input
clock for output data (C) of the QDR-II. In the single clock mode, CQ is generated with respect to K. The
Input
Output Impedance Matching Input. This input is used to tune the device outputs to the system data bus
impedance. CQ, CQ, and Q output impedance are set to 0.2 x RQ, where RQ is a resistor connected
[x:0]
between ZQ and ground. Alternatively, this pin can be connected directly to V
, which enables the
DDQ
minimum impedance mode. This pin cannot be connected directly to GND or left unconnected.
DOFF
Input
DLL Turn Off − Active LOW. Connecting this pin to ground turns off the DLL inside the device. The timing
in the DLL turned off operation differs from those listed in this data sheet. For normal operation, this pin
can be connected to a pull up through a 10-Kohm or less pull up resistor. The device behaves in DDR-I
mode when the DLL is turned off. In this mode, the device can be operated at a frequency of up to 167
MHz with QDR-I timing.
TDO
Output
Input
Input
Input
N/A
TDO for JTAG.
TCK
TCK Pin for JTAG.
TDI
TDI Pin for JTAG.
TMS
TMS Pin for JTAG.
NC
Not Connected to the Die. Can be tied to any voltage level.
Not Connected to the Die. Can be tied to any voltage level.
Not Connected to the Die. Can be tied to any voltage level.
Not Connected to the Die. Can be tied to any voltage level.
NC/72M
NC/144M
NC/288M
N/A
N/A
N/A
V
Input-
Reference
Reference Voltage Input. Static input used to set the reference level for HSTL inputs, outputs, and AC
measurement points.
REF
V
V
V
Power Supply Power Supply Inputs to the Core of the Device.
Ground Ground for the Device.
Power Supply Power Supply Inputs for the Outputs of the Device.
DD
SS
DDQ
Document #: 001-12561 Rev. *D
Page 7 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Write Operations
Functional Overview
Write operations are initiated by asserting WPS active at the
rising edge of the positive input clock (K). On the same K clock
The CY7C1410JV18, CY7C1425JV18, CY7C1412JV18, and
CY7C1414JV18 are synchronous pipelined Burst SRAMs with a
read port and a write port. The read port is dedicated to read
operations and the write port is dedicated to write operations.
Data flows into the SRAM through the write port and flows out
through the read port. These devices multiplex the address
inputs to minimize the number of address pins required. By
having separate read and write ports, the QDR-II completely
eliminates the need to “turn-around” the data bus and avoids any
possible data contention, thereby simplifying system design.
Each access consists of two 8-bit data transfers in the case of
CY7C1410JV18, two 9-bit data transfers in the case of
CY7C1425JV18, two 18-bit data transfers in the case of
CY7C1412JV18, and two 36-bit data transfers in the case of
CY7C1414JV18 in one clock cycle.
rise, the data presented to D
is latched and stored into the
[17:0]
lower 18-bit write data register, provided BWS
are both
[1:0]
asserted active. On the subsequent rising edge of the negative
input clock (K), the address is latched and the information
presented to D
is stored into the write data register, provided
[17:0]
BWS
are both asserted active. The 36 bits of data are then
[1:0]
written into the memory array at the specified location. When
deselected, the write port ignores all inputs after completion of
pending write operations.
Byte Write Operations
Byte write operations are supported by the CY7C1412JV18. A
write operation is initiated as described in the Write Operations
section. The bytes that are written are determined by BWS and
0
This device operates with a read latency of one and half cycles
when DOFF pin is tied HIGH. When DOFF pin is set LOW or
BWS , which are sampled with each 18-bit data word. Asserting
1
the byte write select input during the data portion of a write
latches the data being presented and writes it into the device.
Deasserting the byte write select input during the data portion of
a write allows the data stored in the device for that byte to remain
unaltered. This feature can be used to simplify read, modify, or
write operations to a byte write operation.
connected to V then the device behaves in QDR-I mode with
SS
a read latency of one clock cycle.
Accesses for both ports are initiated on the rising edge of the
positive input clock (K). All synchronous input timing is
referenced from the rising edge of the input clocks (K and K) and
all output timing is referenced to the rising edge of the output
clocks (C and C, or K and K when in single clock mode).
Single Clock Mode
The CY7C1412JV18 can be used with a single clock that
controls both the input and output registers. In this mode, the
device recognizes only a single pair of input clocks (K and K) that
control both the input and output registers. This operation is
identical to the operation if the device had zero skew between
the K/K and C/C clocks. All timing parameters remain the same
in this mode. To use this mode of operation, the user must tie C
and C HIGH at power on. This function is a strap option and not
alterable during device operation.
All synchronous data inputs (D
) pass through input registers
[x:0]
controlled by the input clocks (K and K). All synchronous data
outputs (Q ) pass through output registers controlled by the
[x:0]
rising edge of the output clocks (C and C, or K and K when in
single clock mode).
All synchronous control (RPS, WPS, BWS
through input registers controlled by the rising edge of the input
clocks (K and K).
) inputs pass
[x:0]
CY7C1412JV18 is described in the following sections. The same
basic descriptions apply to CY7C1410JV18, CY7C1425JV18,
and CY7C1414JV18.
Concurrent Transactions
The read and write ports on the CY7C1412JV18 operate
independently of one another. As each port latches the address
inputs on different clock edges, the user can read or write to any
location, regardless of the transaction on the other port. The user
can start reads and writes in the same clock cycle. If the ports
access the same location at the same time, the SRAM delivers
the most recent information associated with the specified
address location. This includes forwarding data from a write
cycle that was initiated on the previous K clock rise.
Read Operations
The CY7C1412JV18 is organized internally as two arrays of 1M
x 18. Accesses are completed in a burst of two sequential 18-bit
data words. Read operations are initiated by asserting RPS
active at the rising edge of the positive input clock (K). The
address is latched on the rising edge of the K clock. The address
presented to the address inputs is stored in the read address
register. Following the next K clock rise the corresponding lowest
Depth Expansion
order 18-bit word of data is driven onto the Q
using C as the
[17:0]
The CY7C1412JV18 has a port select input for each port. This
enables for easy depth expansion. Both port selects are sampled
on the rising edge of the positive input clock only (K). Each port
select input can deselect the specified port. Deselecting a port
does not affect the other port. All pending transactions (read and
write) are completed prior to the device being deselected.
output timing reference. On the subsequent rising edge of C, the
next 18-bit data word is driven onto the Q . The requested
data is valid 0.45 ns from the rising edge of the output clock (C
and C or K and K when in single clock mode).
[17:0]
Synchronous internal circuitry automatically tri-states the outputs
following the next rising edge of the output clocks (C/C). This
allows for a seamless transition between devices without the
insertion of wait states in a depth expanded memory.
Document #: 001-12561 Rev. *D
Page 8 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
clock mode, CQ is generated with respect to K and CQ is
generated with respect to K. The timing for the echo clocks is
Programmable Impedance
An external resistor, RQ, must be connected between the ZQ pin
on the SRAM and V to allow the SRAM to adjust its output
SS
driver impedance. The value of RQ must be 5x the value of the
intended line impedance driven by the SRAM. The allowable
range of RQ to guarantee impedance matching with a tolerance
DLL
These chips utilize a Delay Lock Loop (DLL) that is designed to
function between 120 MHz and the specified maximum clock
frequency. During power up, when the DOFF is tied HIGH, the
DLL is locked after 1024 cycles of stable clock. The DLL can also
be reset by slowing or stopping the input clock K and K for a
minimum of 30 ns. However, it is not necessary to reset the DLL
to lock to the desired frequency. The DLL automatically locks
1024 clock cycles after a stable clock is presented. The DLL may
be disabled by applying ground to the DOFF pin. When the DLL
is turned off, the device behaves in QDR-I mode (with one cycle
latency and a longer access time). For information refer to the
application note DLL Considerations in QDRII/DDRII.
of ±15% is between 175Ω and 350Ω, with V
= 1.5V. The
DDQ
output impedance is adjusted every 1024 cycles upon power up
to account for drifts in supply voltage and temperature.
Echo Clocks
Echo clocks are provided on the QDR-II to simplify data capture
on high-speed systems. Two echo clocks are generated by the
QDR-II. CQ is referenced with respect to C and CQ is referenced
with respect to C. These are free-running clocks and are
synchronized to the output clock (C/C) of the QDR-II. In single
Application Example
Figure 1 shows two QDR-II used in an application.
Figure 1. Application Example
SRAM #1
R = 250ohms
SRAM #2
R = 250ohms
ZQ
CQ/CQ#
Q
ZQ
CQ/CQ#
Q
R W
B
R W
B
W
S
Vt
P
S
#
P
S
#
W
S
#
P
S
#
P
S
#
D
A
D
A
R
C
C#
K
K#
C
C#
K
K#
#
DATA IN
DATA OUT
Address
Vt
Vt
R
RPS#
BUS
MASTER
(CPU
or
WPS#
BWS#
CLKIN/CLKIN#
Source K
Source K#
ASIC)
Delayed K
Delayed K#
R
R = 50ohms
Vt = Vddq/2
Document #: 001-12561 Rev. *D
Page 9 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Truth Table
The truth table for CY7C1410JV18, CY7C1425JV18, CY7C1412JV18, and CY7C1414JV18 follows.
Operation
K
RPS WPS
DQ
DQ
Write Cycle:
Load address on the rising edge of K;
input write data on K and K rising edges.
L-H
X
L
L
D(A + 0) at K(t) ↑
D(A + 1) at K(t) ↑
Read Cycle:
L-H
X
Q(A + 0) at C(t + 1) ↑ Q(A + 1) at C(t + 2) ↑
Load address on the rising edge of K;
wait one and a half cycle; read data on C and C rising edges.
NOP: No Operation
L-H
H
X
H
X
D = X
Q = High-Z
D = X
Q = High-Z
Standby: Clock Stopped
Stopped
Previous State
Previous State
Write Cycle Descriptions
The write cycle description table for CY7C1410JV18 and CY7C1412JV18 follows.
BWS / BWS /
0
1
K
Comments
K
NWS
NWS
1
0
L
L
L
L
L–H
–
During the data portion of a write sequence:
CY7C1410JV18 − both nibbles (D
) are written into the device.
[7:0]
CY7C1412JV18 − both bytes (D
) are written into the device.
[17:0]
–
L–H
–
L-H During the data portion of a write sequence:
CY7C1410JV18 − both nibbles (D
) are written into the device.
) are written into the device.
[7:0]
CY7C1412JV18 − both bytes (D
[17:0]
L
H
H
L
–
During the data portion of a write sequence:
CY7C1410JV18 − only the lower nibble (D
) is written into the device, D
) is written into the device, D
remains unaltered.
remains unaltered.
[17:9]
[3:0]
[7:4]
CY7C1412JV18 − only the lower byte (D
[8:0]
L
L–H During the data portion of a write sequence:
CY7C1410JV18 − only the lower nibble (D
) is written into the device, D
) is written into the device, D
remains unaltered.
remains unaltered.
[3:0]
[7:4]
CY7C1412JV18 − only the lower byte (D
[8:0]
[17:9]
H
H
L–H
–
–
During the data portion of a write sequence:
CY7C1410JV18 − only the upper nibble (D
) is written into the device, D
) is written into the device, D
remains unaltered.
[3:0]
[7:4]
CY7C1412JV18 − only the upper byte (D
remains unaltered.
[17:9]
[8:0]
L
L–H During the data portion of a write sequence:
CY7C1410JV18 − only the upper nibble (D
) is written into the device, D
) is written into the device, D
remains unaltered.
remains unaltered.
[7:4]
[3:0]
[8:0]
CY7C1412JV18 − only the upper byte (D
[17:9]
H
H
H
H
L–H
–
–
No data is written into the devices during this portion of a write operation.
L–H No data is written into the devices during this portion of a write operation.
Notes
2. X = “Don't Care,” H = Logic HIGH, L = Logic LOW, ↑represents rising edge.
3. Device powers up deselected with the outputs in a tri-state condition.
4. “A” represents address location latched by the devices when transaction was initiated. A + 0, A + 1 represents the internal address sequence in the burst.
5. “t” represents the cycle at which a Read/Write operation is started. t + 1, and t + 2 are the first, and second clock cycles respectively succeeding the “t” clock cycle.
6. Data inputs are registered at K and K rising edges. Data outputs are delivered on C and C rising edges, except when in single clock mode.
7. It is recommended that K = K and C = C = HIGH when clock is stopped. This is not essential, but permits most rapid restart by overcoming transmission line charging
symmetrically.
8. Is based on a write cycle that was initiated in accordance with the Write Cycle Descriptions table. NWS , NWS BWS , BWS BWS and BWS can be altered on
0
1,
0
1,
2
3
different portions of a write cycle, as long as the setup and hold requirements are achieved.
Document #: 001-12561 Rev. *D
Page 10 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Write Cycle Descriptions
The write cycle description table for CY7C1425JV18 follows.
BWS
K
L–H
–
K
Comments
0
L
L
–
During the Data portion of a write sequence, the single byte (D
) is written into the device.
) is written into the device.
[8:0]
L–H During the Data portion of a write sequence, the single byte (D
[8:0]
H
H
L–H
–
–
No data is written into the device during this portion of a write operation.
L–H No data is written into the device during this portion of a write operation.
Write Cycle Descriptions
The write cycle description table for CY7C1414JV18 follows.
BWS
BWS
BWS
BWS
3
K
K
Comments
0
1
2
L
L
L
L
L–H
–
During the Data portion of a write sequence, all four bytes (D
the device.
) are written into
) are written into
[35:0]
L
L
L
H
H
L
L
H
H
H
H
L
L
H
H
H
H
H
H
L
–
L–H
–
L–H During the Data portion of a write sequence, all four bytes (D
the device.
[35:0]
–
During the Data portion of a write sequence, only the lower byte (D
) is written
) is written
[8:0]
into the device. D
remains unaltered.
[35:9]
L
L–H During the Data portion of a write sequence, only the lower byte (D
into the device. D remains unaltered.
[8:0]
[35:9]
H
H
H
H
H
H
L–H
–
–
During the Data portion of a write sequence, only the byte (D
) is written into
[17:9]
the device. D
and D
remains unaltered.
[8:0]
[35:18]
L
L–H During the Data portion of a write sequence, only the byte (D
the device. D and D remains unaltered.
) is written into
[17:9]
[8:0]
[35:18]
H
H
H
H
L–H
–
–
During the Data portion of a write sequence, only the byte (D
) is written into
) is written into
) is written into
) is written into
[26:18]
[26:18]
[35:27]
[35:27]
the device. D
and D
remains unaltered.
[17:0]
[35:27]
L
L–H During the Data portion of a write sequence, only the byte (D
the device. D and D remains unaltered.
[17:0]
[35:27]
H
H
L–H
–
–
During the Data portion of a write sequence, only the byte (D
the device. D remains unaltered.
[26:0]
L
L–H During the Data portion of a write sequence, only the byte (D
the device. D remains unaltered.
[26:0]
H
H
H
H
H
H
H
H
L–H
–
–
No data is written into the device during this portion of a write operation.
L–H No data is written into the device during this portion of a write operation.
Document #: 001-12561 Rev. *D
Page 11 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Instruction Register
IEEE 1149.1 Serial Boundary Scan (JTAG)
Three-bit instructions can be serially loaded into the instruction
register. This register is loaded when it is placed between the TDI
page 15. Upon power up, the instruction register is loaded with
the IDCODE instruction. It is also loaded with the IDCODE
instruction if the controller is placed in a reset state, as described
in the previous section.
These SRAMs incorporate a serial boundary scan Test Access
Port (TAP) in the FBGA package. This part is fully compliant with
IEEE Standard #1149.1-2001. The TAP operates using JEDEC
standard 1.8V IO logic levels.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, TCK must be tied LOW
When the TAP controller is in the Capture-IR state, the two least
significant bits are loaded with a binary “01” pattern to allow for
fault isolation of the board level serial test path.
(V ) to prevent clocking of the device. TDI and TMS are inter-
SS
nally pulled up and may be unconnected. They may alternatively
be connected to V through a pull up resistor. TDO must be left
unconnected. Upon power up, the device comes up in a reset
state, which does not interfere with the operation of the device.
Bypass Register
DD
To save time when serially shifting data through registers, it is
sometimes advantageous to skip certain chips. The bypass
register is a single-bit register that can be placed between TDI
and TDO pins. This enables shifting of data through the SRAM
with minimal delay. The bypass register is set LOW (V ) when
the BYPASS instruction is executed.
Test Access Port—Test Clock
The test clock is used only with the TAP controller. All inputs are
captured on the rising edge of TCK. All outputs are driven from
the falling edge of TCK.
SS
Boundary Scan Register
Test Mode Select (TMS)
The boundary scan register is connected to all of the input and
output pins on the SRAM. Several No Connect (NC) pins are also
included in the scan register to reserve pins for higher density
devices.
The TMS input is used to give commands to the TAP controller
and is sampled on the rising edge of TCK. This pin may be left
unconnected if the TAP is not used. The pin is pulled up inter-
nally, resulting in a logic HIGH level.
The boundary scan register is loaded with the contents of the
RAM input and output ring when the TAP controller is in the
Capture-DR state and is then placed between the TDI and TDO
pins when the controller is moved to the Shift-DR state. The
EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions can
be used to capture the contents of the input and output ring.
Test Data-In (TDI)
The TDI pin is used to serially input information into the registers
and can be connected to the input of any of the registers. The
register between TDI and TDO is chosen by the instruction that
is loaded into the TAP instruction register. For information on
loading the instruction register, see the TAP Controller State
unconnected if the TAP is unused in an application. TDI is
connected to the most significant bit (MSB) on any register.
the bits are connected. Each bit corresponds to one of the bumps
on the SRAM package. The MSB of the register is connected to
TDI, and the LSB is connected to TDO.
Identification (ID) Register
Test Data-Out (TDO)
The ID register is loaded with a vendor-specific, 32-bit code
during the Capture-DR state when the IDCODE command is
loaded in the instruction register. The IDCODE is hardwired into
the SRAM and can be shifted out when the TAP controller is in
the Shift-DR state. The ID register has a vendor code and other
The TDO output pin is used to serially clock data out from the
registers. The output is active, depending upon the current state
The output changes on the falling edge of TCK. TDO is
connected to the least significant bit (LSB) of any register.
Performing a TAP Reset
A Reset is performed by forcing TMS HIGH (V ) for five rising
TAP Instruction Set
DD
edges of TCK. This Reset does not affect the operation of the
SRAM and can be performed while the SRAM is operating. At
power up, the TAP is reset internally to ensure that TDO comes
up in a high-Z state.
Eight different instructions are possible with the three-bit
instruction register. All combinations are listed in Instruction
RESERVED and must not be used. The other five instructions
are described in this section in detail.
TAP Registers
Instructions are loaded into the TAP controller during the Shift-IR
state when the instruction register is placed between TDI and
TDO. During this state, instructions are shifted through the
instruction register through the TDI and TDO pins. To execute
the instruction after it is shifted in, the TAP controller must be
moved into the Update-IR state.
Registers are connected between the TDI and TDO pins to scan
the data in and out of the SRAM test circuitry. Only one register
can be selected at a time through the instruction registers. Data
is serially loaded into the TDI pin on the rising edge of TCK. Data
is output on the TDO pin on the falling edge of TCK.
Document #: 001-12561 Rev. *D
Page 12 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
IDCODE
BYPASS
The IDCODE instruction loads a vendor-specific, 32-bit code into
the instruction register. It also places the instruction register
between the TDI and TDO pins and shifts the IDCODE out of the
device when the TAP controller enters the Shift-DR state. The
IDCODE instruction is loaded into the instruction register at
When the BYPASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO pins. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.
power up or whenever the TAP controller is given
Test-Logic-Reset state.
a
EXTEST
The EXTEST instruction drives the preloaded data out through
the system output pins. This instruction also connects the
boundary scan register for serial access between the TDI and
TDO in the Shift-DR controller state.
SAMPLE Z
The SAMPLE Z instruction connects the boundary scan register
between the TDI and TDO pins when the TAP controller is in a
Shift-DR state. The SAMPLE Z command puts the output bus
into a High-Z state until the next command is given during the
Update IR state.
EXTEST OUTPUT BUS TRI-STATE
IEEE Standard 1149.1 mandates that the TAP controller be able
to put the output bus into a tri-state mode.
SAMPLE/PRELOAD
The boundary scan register has a special bit located at bit #108.
When this scan cell, called the “extest output bus tri-state,” is
latched into the preload register during the Update-DR state in
the TAP controller, it directly controls the state of the output
(Q-bus) pins, when the EXTEST is entered as the current
instruction. When HIGH, it enables the output buffers to drive the
output bus. When LOW, this bit places the output bus into a
High-Z condition.
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When
the SAMPLE/PRELOAD instructions are loaded into the
instruction register and the TAP controller is in the Capture-DR
state, a snapshot of data on the input and output pins is captured
in the boundary scan register.
The user must be aware that the TAP controller clock can only
operate at a frequency up to 20 MHz, while the SRAM clock
operates more than an order of magnitude faster. Because there
is a large difference in the clock frequencies, it is possible that
during the Capture-DR state, an input or output undergoes a
transition. The TAP may then try to capture a signal while in
transition (metastable state). This does not harm the device, but
there is no guarantee as to the value that is captured.
Repeatable results may not be possible.
This bit can be set by entering the SAMPLE/PRELOAD or
EXTEST command, and then shifting the desired bit into that cell,
during the Shift-DR state. During Update-DR, the value loaded
into that shift-register cell latches into the preload register. When
the EXTEST instruction is entered, this bit directly controls the
output Q-bus pins. Note that this bit is pre-set LOW to enable the
output when the device is powered up, and also when the TAP
controller is in the Test-Logic-Reset state.
To guarantee that the boundary scan register captures the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the TAP controller's capture setup plus hold
times (t and t ). The SRAM clock input might not be captured
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
CS
CH
correctly if there is no way in a design to stop (or slow) the clock
during a SAMPLE/PRELOAD instruction. If this is an issue, it is
still possible to capture all other signals and simply ignore the
value of the CK and CK captured in the boundary scan register.
After the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.
PRELOAD places an initial data pattern at the latched parallel
outputs of the boundary scan register cells before the selection
of another boundary scan test operation.
The shifting of data for the SAMPLE and PRELOAD phases can
occur concurrently when required, that is, while the data
captured is shifted out, the preloaded data can be shifted in.
Document #: 001-12561 Rev. *D
Page 13 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
TAP Controller State Diagram
The state diagram for the TAP controller follows.
[9]
TEST-LOGIC
1
RESET
0
1
1
1
SELECT
TEST-LOGIC/
SELECT
0
IR-SCAN
IDLE
DR-SCAN
0
0
1
1
CAPTURE-DR
0
CAPTURE-IR
0
0
1
0
1
SHIFT-DR
1
SHIFT-IR
1
EXIT1-DR
0
EXIT1-IR
0
0
0
PAUSE-DR
1
PAUSE-IR
1
0
0
EXIT2-DR
1
EXIT2-IR
1
UPDATE-IR
0
UPDATE-DR
1
1
0
Note
9. The 0/1 next to each state represents the value at TMS at the rising edge of TCK.
Document #: 001-12561 Rev. *D
Page 14 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
TAP Controller Block Diagram
0
Bypass Register
2
1
1
1
0
0
0
Selection
TDI
Selection
Circuitry
TDO
Instruction Register
Circuitry
31 30
29
.
.
2
Identification Register
.
108
.
.
.
2
Boundary Scan Register
TCK
TMS
TAP Controller
TAP Electrical Characteristics
Over the Operating Range
Parameter
Description
Output HIGH Voltage
Test Conditions
= −2.0 mA
Min
1.4
1.6
Max
Unit
V
V
V
V
V
V
I
I
I
I
I
V
V
OH1
OH2
OL1
OL2
IH
OH
OH
OL
OL
Output HIGH Voltage
Output LOW Voltage
Output LOW Voltage
Input HIGH Voltage
= −100 μA
= 2.0 mA
0.4
0.2
V
= 100 μA
V
0.65V
V
+ 0.3
V
DD
DD
Input LOW Voltage
–0.3
–5
0.35V
5
V
IL
DD
Input and Output Load Current
GND ≤ V ≤ V
DD
μA
X
I
Notes
10. These characteristics pertain to the TAP inputs (TMS, TCK, TDI and TDO). Parallel load levels are specified in the Electrical Characteristics table.
11. Overshoot: V (AC) < V + 0.85V (Pulse width less than t /2).
/2), Undershoot: V (AC) > −1.5V (Pulse width less than t
IH
DDQ
CYC
IL
CYC
12. All Voltage referenced to Ground.
Document #: 001-12561 Rev. *D
Page 15 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
TAP AC Switching Characteristics
Over the Operating Range
Parameter
Description
Min
Max
Unit
ns
t
t
t
t
TCK Clock Cycle Time
TCK Clock Frequency
TCK Clock HIGH
50
TCYC
TF
20
MHz
ns
20
20
TH
TCK Clock LOW
ns
TL
Setup Times
t
t
t
TMS Setup to TCK Clock Rise
TDI Setup to TCK Clock Rise
Capture Setup to TCK Rise
5
5
5
ns
ns
ns
TMSS
TDIS
CS
Hold Times
t
t
t
TMS Hold after TCK Clock Rise
TDI Hold after Clock Rise
5
5
5
ns
ns
ns
TMSH
TDIH
CH
Capture Hold after Clock Rise
Output Times
t
t
TCK Clock LOW to TDO Valid
TCK Clock LOW to TDO Invalid
10
ns
ns
TDOV
TDOX
0
TAP Timing and Test Conditions
Figure 2 shows the TAP timing and test conditions.
Figure 2. TAP Timing and Test Conditions
0.9V
ALL INPUT PULSES
1.8V
50Ω
0.9V
TDO
0V
Z = 50
Ω
0
C = 20 pF
L
t
t
TH
TL
GND
(a)
Test Clock
TCK
t
TCYC
t
TMSH
t
TMSS
Test Mode Select
TMS
t
TDIS
t
TDIH
Test Data In
TDI
Test Data Out
TDO
t
TDOV
t
TDOX
Notes
13. t and t refer to the setup and hold time requirements of latching data from the boundary scan register.
CS
CH
14. Test conditions are specified using the load in TAP AC Test Conditions. t /t = 1 ns.
R
F
Document #: 001-12561 Rev. *D
Page 16 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Identification Register Definitions
Value
Instruction Field
Description
CY7C1410JV18
CY7C1425JV18
001
CY7C1412JV18
001
CY7C1414JV18
Revision Number
(31:29)
001
001
Version number.
Cypress Device ID 11010011010000111 11010011010001111 11010011010010111 11010011010100111 Defines the type of
(28:12)
SRAM.
Cypress JEDEC ID
(11:1)
00000110100
1
00000110100
1
00000110100
1
00000110100
1
Allows unique
identification of
SRAM vendor.
ID Register
Presence (0)
Indicates the
presence of an ID
register.
Scan Register Sizes
Register Name
Bit Size
Instruction
Bypass
3
1
ID
32
109
Boundary Scan
Instruction Codes
Instruction
EXTEST
Code
000
Description
Captures the input and output ring contents.
IDCODE
001
Loads the ID register with the vendor ID code and places the register between TDI and TDO.
This operation does not affect SRAM operation.
SAMPLE Z
010
Captures the input and output contents. Places the boundary scan register between TDI and
TDO. Forces all SRAM output drivers to a High-Z state.
RESERVED
011
100
Do Not Use: This instruction is reserved for future use.
SAMPLE/PRELOAD
Captures the input and output ring contents. Places the boundary scan register between TDI
and TDO. Does not affect the SRAM operation.
RESERVED
RESERVED
BYPASS
101
110
111
Do Not Use: This instruction is reserved for future use.
Do Not Use: This instruction is reserved for future use.
Places the bypass register between TDI and TDO. This operation does not affect SRAM
operation.
Document #: 001-12561 Rev. *D
Page 17 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Boundary Scan Order
Bit #
0
Bump ID
6R
Bit #
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
Bump ID
10G
9G
Bit #
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
Bump ID
6A
5B
5A
4A
5C
4B
3A
2A
1A
2B
3B
1C
1B
3D
3C
1D
2C
3E
2D
2E
1E
2F
Bit #
84
Bump ID
1J
1
6P
85
2J
2
6N
11F
11G
9F
86
3K
3
7P
87
3J
4
7N
88
2K
5
7R
10F
11E
10E
10D
9E
89
1K
6
8R
90
2L
7
8P
91
3L
8
9R
92
1M
1L
9
11P
10P
10N
9P
93
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
10C
11D
9C
94
3N
95
3M
1N
96
10M
11N
9M
9D
97
2M
3P
11B
11C
9B
98
99
2N
9N
100
101
102
103
104
105
106
107
108
2P
11L
11M
9L
10B
11A
10A
9A
1P
3R
4R
10L
11K
10K
9J
4P
8B
5P
7C
3F
5N
6C
1G
1F
5R
9K
8A
Internal
10J
11J
11H
7A
3G
2G
1H
7B
6B
Document #: 001-12561 Rev. *D
Page 18 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
DLL Constraints
Power Up Sequence in QDR-II SRAM
■ DLL uses K clock as its synchronizing input. The input must
have low phase jitter, which is specified as t
QDR-II SRAMs must be powered up and initialized in a
predefined manner to prevent undefined operations. During
Power Up, when the DOFF is tied HIGH, the DLL gets locked
after 1024 cycles of stable clock.
.
KC Var
■ The DLL functions at frequencies down to 120 MHz.
■ If the input clock is unstable and the DLL is enabled, then the
DLL may lock onto an incorrect frequency, causing unstable
SRAM behavior. To avoid DLL locking provide 1024 cycles
stable clock to relock to the desired clock frequency.
Power Up Sequence
■ Apply power with DOFF tied HIGH (All other inputs can be
HIGH or LOW)
❐ Apply V before V
DD
DDQ
❐ Apply V
before V
or at the same time as V
DDQ
REF REF
■ Provide stable power and clock (K, K) for 1024 cycles to lock
the DLL.
Power Up Waveforms
K
K
Unstable Clock
> 1024 Stable clock
Stable)
DDQ
Start Normal
Operation
/
V
Clock Start (Clock Starts after V
DD
Stable (< +/- 0.1V DC per 50ns )
/
/
V
VDDQ
V
VDD
DD
DDQ
Fix High (or tied to V
DDQ
)
DOFF
Document #: 001-12561 Rev. *D
Page 19 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Current into Outputs (LOW) ........................................ 20 mA
Static Discharge Voltage (MIL-STD-883, M. 3015).. > 2001V
Latch-up Current ................................................... > 200 mA
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with Power Applied.... –10°C to +85°C
Operating Range
Ambient
Range
Commercial
Industrial
Temperature (T )
V
V
DDQ
Supply Voltage on V Relative to GND........–0.5V to +2.9V
A
DD
DD
0°C to +70°C
1.8 ± 0.1V
1.4V to
Supply Voltage on V
Relative to GND.......–0.5V to +V
DD
DDQ
V
DD
–40°C to +85°C
DC Applied to Outputs in High-Z ........ –0.5V to V
+ 0.3V
DDQ
DC Input Voltage
.............................. –0.5V to V + 0.3V
DD
Electrical Characteristics
DC Electrical Characteristics
Over the Operating Range
Parameter
Description
Power Supply Voltage
IO Supply Voltage
Test Conditions
Min
1.7
1.4
Typ
Max
Unit
V
1.8
1.5
1.9
V
V
DD
V
V
V
V
V
V
V
I
V
DD
DDQ
OH
Output HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Note 16
Note 17
V
V
/2 – 0.12
/2 – 0.12
– 0.2
V
V
/2 + 0.12
/2 + 0.12
V
DDQ
DDQ
DDQ
V
OL
DDQ
I
I
= −0.1 mA, Nominal Impedance
V
V
V
OH(LOW)
OL(LOW)
IH
OH
OL
DDQ
DDQ
= 0.1 mA, Nominal Impedance
V
0.2
V
SS
V
+ 0.1
V
+ 0.3
V
REF
DDQ
–0.3
V
– 0.1
V
IL
REF
Input Leakage Current
Output Leakage Current
Input Reference Voltage
GND ≤ V ≤ V
−5
−5
5
μA
μA
V
X
I
DDQ
I
GND ≤ V ≤ V
Output Disabled
5
OZ
I
DDQ,
V
Typical Value = 0.75V
0.68
0.75
0.95
1330
1330
1370
1460
1200
1200
1230
1290
375
REF
I
V
Operating Supply
V
= Max,
267MHz (x8)
(x9)
mA
DD
DD
DD
I
= 0 mA,
OUT
f = f
= 1/t
MAX
CYC
(x18)
(x36)
250MHz (x8)
(x9)
mA
mA
mA
(x18)
(x36)
I
Automatic Power down
Current
Max V
,
267MHz (x8)
(x9)
SB1
DD
Both Ports Deselected,
375
V
≥ V or V ≤ V
IN
IH
IN
IL
(x18)
380
f = f
= 1/t
,
MAX
CYC
Inputs Static
(x36)
385
250MHz (x8)
(x9)
345
345
(x18)
350
(x36)
350
Notes
15. Power up: Assumes a linear ramp from 0V to V (min) within 200 ms. During this time V < V and V
< V .
DD
DD
IH
DD
DDQ
16. Output are impedance controlled. I = −(V
/2)/(RQ/5) for values of 175 ohms <= RQ <= 350 ohms.
/2)/(RQ/5) for values of 175 ohms <= RQ <= 350 ohms.
DDQ
OH
DDQ
17. Output are impedance controlled. I = (V
OL
18. V
(min) = 0.68V or 0.46V
, whichever is larger, V
(max) = 0.95V or 0.54V
, whichever is smaller.
REF
DDQ
REF
DDQ
Document #: 001-12561 Rev. *D
Page 20 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
AC Electrical Characteristics
Over the Operating Range
Parameter
Description
Input HIGH Voltage
Input LOW Voltage
Test Conditions
Min
+ 0.2
REF
Typ
–
Max
Unit
V
V
V
–
IH
IL
V
–
–
V
– 0.2
V
REF
Capacitance
Tested initially and after any design or process change that may affect these parameters.
Parameter
Description
Input Capacitance
Test Conditions
Max
Unit
C
T = 25°C, f = 1 MHz, V = 1.8V, V = 1.5V
DDQ
5
4
5
pF
pF
pF
IN
A
DD
C
C
Clock Input Capacitance
Output Capacitance
CLK
O
Thermal Resistance
Tested initially and after any design or process change that may affect these parameters.
165 FBGA
Package
Parameter
Description
Test Conditions
Unit
Θ
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
17.2
°C/W
°C/W
JA
Θ
Thermal Resistance
(Junction to Case)
3.2
JC
AC Test Loads and Waveforms
V
REF = 0.75V
0.75V
VREF
VREF
0.75V
R = 50Ω
OUTPUT
ALL INPUT PULSES
1.25V
Z = 50Ω
0
OUTPUT
Device
R = 50Ω
L
0.75V
Under
Device
Under
0.25V
Test
5 pF
VREF = 0.75V
Slew Rate = 2 V/ns
ZQ
Test
ZQ
RQ =
RQ =
250Ω
250Ω
INCLUDING
JIG AND
SCOPE
(a)
(b)
Note
19. Unless otherwise noted, test conditions are based on signal transition time of 2V/ns, timing reference levels of 0.75V, Vref = 0.75V, RQ = 250Ω, V
= 1.5V, input
DDQ
pulse levels of 0.25V to 1.25V, and output loading of the specified I /I and load capacitance shown in (a) of AC Test Loads and Waveforms.
OL OH
Document #: 001-12561 Rev. *D
Page 21 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Switching Characteristics
Over the Operating Range
267 MHz
250 MHz
Cypress Consortium
Parameter Parameter
Description
Unit
Min Max Min Max
t
t
t
t
t
t
V
(Typical) to the first access
1
1
ms
ns
ns
ns
ns
ns
POWER
CYC
DD
t
t
t
t
t
K Clock and C Clock Cycle Time
Input Clock (K/K and C/C) HIGH
Input Clock (K/K and C/C) LOW
3.75 8.4 4.0 8.4
KHKH
KHKL
KLKH
KHKH
KHCH
1.5
1.5
–
–
1.6
1.6
1.8
0
–
–
KH
KL
K Clock Rise to K Clock Rise and C to C Rise (rising edge to rising edge) 1.68
–
–
KHKH
KHCH
K/K Clock Rise to C/C Clock Rise (rising edge to rising edge)
0
1.68
1.8
Setup Times
t
t
t
t
t
t
t
t
Address Setup to K Clock Rise
0.3
0.3
0.3
0.3
–
–
–
–
0.35
0.35
0.35
0.35
–
–
–
–
ns
ns
ns
ns
SA
AVKH
IVKH
IVKH
DVKH
Control Setup to K Clock Rise (RPS, WPS)
SC
DDR Control Setup to Clock (K/K) Rise (BWS , BWS , BWS , BWS )
SCDDR
SD
0
1
3
4
D
Setup to Clock (K/K) Rise
[X:0]
Hold Times
t
t
t
t
t
t
t
t
Address Hold after K Clock Rise
0.3
0.3
0.3
0.3
–
–
–
–
0.35
0.35
0.35
0.35
–
–
–
–
ns
ns
ns
ns
HA
KHAX
KHIX
KHIX
KHDX
Control Hold after K Clock Rise (RPS, WPS)
HC
DDR Control Hold after Clock (K/K) Rise (BWS , BWS , BWS ,BWS )
HCDDR
HD
0
1
3
4
D
Hold after Clock (K/K) Rise
[X:0]
Output Times
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
C/C Clock Rise (or K/K in Single Clock Mode) to Data Valid
–
0.45
–
–
0.45 ns
ns
0.45 ns
ns
0.30 ns
CO
CHQV
Data Output Hold after Output C/C Clock Rise (Active to Active)
C/C Clock Rise to Echo Clock Valid
–0.45
–
–0.45
–
–
DOH
CHQX
0.45
–
CCQO
CQOH
CQD
CHCQV
CHCQX
CQHQV
CQHQX
CQHCQL
CQHCQH
CHQZ
Echo Clock Hold after C/C Clock Rise
Echo Clock High to Data Valid
–0.45
–
–0.45
–
–
0.27
–
Echo Clock High to Data Invalid
–0.27
1.43
1.43
–
–0.30
1.55
1.55
–
–
–
–
ns
ns
ns
CQDOH
CQH
Output Clock (CQ/CQ) HIGH
–
CQ Clock Rise to CQ Clock Rise
–
(rising edge to rising edge)
CQHCQH
CHZ
Clock (C/C) Rise to High-Z (Active to High-Z)
0.45
–
0.45 ns
ns
Clock (C/C) Rise to Low-Z
–0.45
–0.45
–
CLZ
CHQX1
DLL Timing
t
t
t
t
t
t
Clock Phase Jitter
–
0.20
–
–
0.20 ns
KC Var
KC Var
DLL Lock Time (K, C)
K Static to DLL Reset
1024
30
1024
30
–
–
Cycles
ns
KC lock
KC Reset
KC lock
KC Reset
–
Notes
20. When a part with a maximum frequency above 250 MHz is operating at a lower clock frequency, it requires the input timing of the frequency range in which it is being
operated and outputs data with the output timings of that frequency range.
21. This part has a voltage regulator internally; t
is the time that the power is supplied above V minimum initially before a read or write operation can be initiated.
DD
POWER
22. These parameters are extrapolated from the input timing parameters (t
- 250 ps, where 250 ps is the internal jitter. An input jitter of 200 ps (t Var) is already
KHKH
KC
included in the t
). These parameters are only guaranteed by design and are not tested in production.
KHKH
23. t
, t
, are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads and Waveforms on page 21. Transition is measured ± 100 mV from steady
CHZ CLZ
state voltage.
24. At any voltage and temperature t
is less than t
and t
less than t
.
CHZ
CLZ
CHZ
CO
Document #: 001-12561 Rev. *D
Page 22 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Switching Waveforms
Figure 3. Read/Write/Deselect Sequence
READ
WRITE
2
READ
3
WRITE
4
WRITE
6
WRITE
8
NOP
9
READ
NOP
7
1
5
10
K
t
t
KHKH
t
t
CYC
KH
KL
K
RPS
t
t
SC
HC
WPS
A
A2
A3
A4
A0
A1
A5
A6
t
t
t
t
SA HA
SA HA
D
Q
D31
t
D10
D11
D30
D50
D51
D60
D61
t
t
t
SD
HD
SD
HD
Q20
CQDOH
Q00
Q01
DOH
Q21
Q40
Q41
t
t
CLZ
t
t
CHZ
t
KHCH
t
t
KL
t
CO
CQD
t
C
C
KH
t
t
KHKH
CYC
t
KHCH
t
CCQO
t
CQOH
t
CQ
CQ
t
t
CCQO
CQHCQH
CQH
t
CQOH
DON’T CARE
UNDEFINED
Notes
25. Q00 refers to output from address A0. Q01 refers to output from the next internal burst address following A0, that is, A0+1.
26. Outputs are disabled (High-Z) one clock cycle after a NOP.
27. In this example, if address A2 = A1, then data Q20 = D10 and Q21 = D11. Write data is forwarded immediately as read results. This note applies to the whole diagram.
Document #: 001-12561 Rev. *D
Page 23 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Ordering Information
Not all of the speed, package and temperature ranges are available. Please contact your local sales representative or
Speed
(MHz)
Package
Diagram
Operating
Range
Ordering Code
Package Type
267 CY7C1410JV18-267BZC
CY7C1425JV18-267BZC
CY7C1412JV18-267BZC
CY7C1414JV18-267BZC
CY7C1410JV18-267BZXC
CY7C1425JV18-267BZXC
CY7C1412JV18-267BZXC
CY7C1414JV18-267BZXC
CY7C1410JV18-267BZI
CY7C1425JV18-267BZI
CY7C1412JV18-267BZI
CY7C1414JV18-267BZI
CY7C1410JV18-267BZXI
CY7C1425JV18-267BZXI
CY7C1412JV18-267BZXI
CY7C1414JV18-267BZXI
250 CY7C1410JV18-250BZC
CY7C1425JV18-250BZC
CY7C1412JV18-250BZC
CY7C1414JV18-250BZC
CY7C1410JV18-250BZXC
CY7C1425JV18-250BZXC
CY7C1412JV18-250BZXC
CY7C1414JV18-250BZXC
CY7C1410JV18-250BZI
CY7C1425JV18-250BZI
CY7C1412JV18-250BZI
CY7C1414JV18-250BZI
CY7C1410JV18-250BZXI
CY7C1425JV18-250BZXI
CY7C1412JV18-250BZXI
CY7C1414JV18-250BZXI
51-85195 165-Ball Fine Pitch Ball Grid Array (15 x 17 x 1.4 mm)
51-85195 165-Ball Fine Pitch Ball Grid Array (15 x 17 x 1.4 mm) Pb-Free
51-85195 165-Ball Fine Pitch Ball Grid Array (15 x 17 x 1.4 mm)
51-85195 165-Ball Fine Pitch Ball Grid Array (15 x 17 x 1.4 mm) Pb-Free
51-85195 165-Ball Fine Pitch Ball Grid Array (15 x 17 x 1.4 mm)
51-85195 165-Ball Fine Pitch Ball Grid Array (15 x 17 x 1.4 mm) Pb-Free
51-85195 165-Ball Fine Pitch Ball Grid Array (15 x 17 x 1.4 mm)
51-85195 165-Ball Fine Pitch Ball Grid Array (15 x 17 x 1.4 mm) Pb-Free
Commercial
Industrial
Commercial
Industrial
Document #: 001-12561 Rev. *D
Page 24 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Package Diagram
Figure 4. 165-ball FBGA (15 x 17 x 1.40 mm), 51-85195
BOTTOM VIEW
TOP VIEW
PIN 1 CORNER
Ø0.05 M C
Ø0.25 M C A B
PIN 1 CORNER
+0.14
Ø0.50 (165X)
-0.06
1
2
3
4
5
6
7
8
9
10
11
11 10
9
8
7
6
5
4
3
2
1
A
B
A
B
C
D
C
D
E
E
F
F
G
G
H
J
H
J
K
K
L
L
M
M
N
P
R
N
P
R
A
1.00
5.00
10.00
B
15.00 0.10
0.15(4X)
NOTES :
SOLDER PAD TYPE : NON SOLDER MASK DEFINED (NSMD)
PACKAGE WEIGHT : 0.65g
JEDEC REFERENCE : MO-216 / DESIGN 4.6C
PACKAGE CODE : BB0AD
SEATING PLANE
C
51-85195-*A
Document #: 001-12561 Rev. *D
Page 25 of 26
CY7C1410JV18, CY7C1425JV18
CY7C1412JV18, CY7C1414JV18
Document History Page
Document Title: CY7C1410JV18/CY7C1425JV18/CY7C1412JV18/CY7C1414JV18, 36-Mbit QDR™-II SRAM 2-Word
Burst Architecture
Document Number: 001-12561
ISSUE
DATE
ORIG. OF
CHANGE
REV. ECN NO.
DESCRIPTION OF CHANGE
**
808457 See ECN
1061960 See ECN
1397384 See ECN
VKN
VKN
VKN
New Data Sheet
*A
*B
*C
Removed 300MHz speed bin
Added 267MHz speed bin
1462587 See ECN VKN/AESA Converted from preliminary to final
Removed 200MHz speed bin
Updated I /I specs
DD SB
Changed DLL minimum operating frequency from 80MHz to 120MHz
Changed t
max spec to 8.4ns for all speed bins
CYC
*D
2189567 See ECN VKN/AESA Minor Change-Moved to the external web
© Cypress Semiconductor Corporation, 2007-2008. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used
for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use
as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support
systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document #: 001-12561 Rev. *D
Revised March 10, 2007
Page 26 of 26
QDR RAMs and Quad Data Rate RAMs comprise a new family of products developed by Cypress, IDT, NEC, Renesas, and Samsung. All product and company names mentioned in this document
are the trademarks of their respective holders.
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