Cypress CY7C1362C User Manual

CY7C1360C

CY7C1362C

9-Mbit (256K x 36/512K x 18) Pipelined SRAM

Features

Functional Description^[1]

• Supports bus operation up to 250 MHz

The CY7C1360C/CY7C1362C SRAM integrates 256K x 36

and 512K x 18 SRAM cells with advanced synchronous

peripheral circuitry and a two-bit counter for internal burst

operation. All synchronous inputs are gated by registers

controlled by a positive-edge-triggered Clock Input (CLK). The

synchronous inputs include all addresses, all data inputs,

• Available speed grades are 250, 200, and 166 MHz

• Registered inputs and outputs for pipelined operation

• 3.3V core power supply (V

)

• 2.5V/3.3V I/O operation (V

)

DDQ

address-pipelining Chip Enable (CE ), depth-expansion Chip

• Fast clock-to-output times

[2]

Enables (CE and CE ), Burst Control inputs (ADSC, ADSP,

ADV), Write Enables (BW , and BWE), and Global Write

(GW). Asynchronous inputs include the Output Enable (OE)

and the ZZ pin.

and

— 2.8 ns (for 250-MHz device)

• Provide high-performance 3-1-1-1 access rate

• User-selectable burst counter supporting Intel

Addresses and chip enables are registered at rising edge of

clock when either Address Strobe Processor (ADSP) or

Address Strobe Controller (ADSC) are active. Subsequent

burst addresses can be internally generated as controlled by

the Advance pin (ADV).

Pentium interleaved or linear burst sequences

• Separate processor and controller address strobes

• Synchronous self-timed writes

• Asynchronous output enable

Address, data inputs, and write controls are registered on-chip

to initiate a self-timed Write cycle.This part supports Byte Write

operations (see Pin Descriptions and Truth Table for further

details). Write cycles can be one to two or four bytes wide as

controlled by the Byte Write control inputs. GW when active

• Single Cycle Chip Deselect

• Available in lead-free 100-Pin TQFP package, lead-free

and non lead-free 119-Ball BGA package and 165-Ball

FBGA package

LOW cause

s all bytes to be written.

• TQFP Available with 3-Chip Enable and 2-Chip Enable

• IEEE 1149.1 JTAG-Compatible Boundary Scan

The CY7C1360C/CY7C1362C operates from a +3.3V core

power supply while all outputs may operate with either a +2.5

or +3.3V supply. All inputs and outputs are JEDEC-standard

JESD8-5-compatible.

Logic Block Diagram – CY7C1362C (512K x 18)

ADDRESS

A0, A1, A

A[1:0]

MODE

ADV

CLK

BURST

COUNTER AND

LOGIC

CLR

ADSC

ADSP

DQB,DQPB

WRITE REGISTER

WRITE DRIVER

OUTPUT

BUFFERS

BWB

DQs

DQP^A

DQPB

OUTPUT

REGISTERS

SENSE

AMPS

MEMORY

ARRAY

DQA,DQPA

WRITE REGISTER

WRITE DRIVER

BWA

BWE

INPUT

REGISTERS

ENABLE

CE1

CE2

PIPELINED

ENABLE

CE3

SLEEP

CONTROL

Notes:

1. For best-practices recommendations, please refer to the Cypress application note System Design Guidelines on www.cypress.com.

2. CE is for A version of TQFP (3 Chip Enable option) and 165 FBGA package only. 119 BGA is offered only in 2 Chip Enable.

Cypress Semiconductor Corporation

Document #: 38-05540 Rev. *H

•

198 Champion Court

•

San Jose, CA 95134-1709

•

408-943-2600

Revised September 14, 2006

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CY7C1360C

CY7C1362C

Pin Configurations

100-Pin TQFP Pinout (3 Chip Enables) (A Version)

DQP_C

DQPB

DQB

V_DDQ

V_SSQ

DQB

V_SSQ

V_DDQ

DQB

V_SS

V_DDQ

V_SSQ

V_DDQ

V_SSQ

DQPA

DQA

V_SSQ

V_DDQ

DQA

V_SS

DQC

DQc

V_DDQ

V_SSQ

DQC

DQB

V_SSQ

V_DDQ

DQB

V_DD

V_SS

DQB

V_DDQ

V_SSQ

DQB

DQPB

DQC

V_SSQ

V_DDQ

DQC

V_DD

CY7C1362C

(512K x 18)

CY7C1360C

(256K X 36)

V_DD

V_SS

DQD

DQA

V_DDQ

V_SSQ

DQA

V_SSQ

V_DDQ

DQA

DQPA

DQA

V_DDQ

V_SSQ

DQA

DQD

V_DDQ

V_SSQ

DQD

V_SSQ

V_DDQ

DQD

V_SSQ

V_DDQ

V_SSQ

V_DDQ

DQPD

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CY7C1360C

CY7C1362C

Pin Configurations (continued)

100-Pin TQFP Pinout (2 Chip Enables) (AJ Version)

DQPC

DQC

V_DDQ

V_SSQ

DQC

V_SSQ

V_DDQ

DQC

DQPB

DQB

V_DDQ

V_SSQ

DQB

V_SSQ

V_DDQ

DQB

V_SS

V_DDQ

V_SSQ

V_DDQ

V_SSQ

DQPA

DQA

V_SSQ

V_DDQ

DQA

V_SS

DQB

V_SSQ

V_DDQ

DQB

V_DD

V_SS

DQB

V_DDQ

V_SSQ

DQB

DQPB

V_DD

V_SS

V_DD

CY7C1362C

(512K x 18)

CY7C1360C

(256K X 36)

V_DD

DQD

V_DDQ

V_SSQ

DQD

V_SSQ

V_DDQ

DQD

DQPD

DQA

V_DDQ

V_SSQ

DQA

V_SSQ

V_DDQ

DQA

DQPA

DQA

V_DDQ

V_SSQ

DQA

V_SSQ

V_DDQ

V_SSQ

V_DDQ

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CY7C1360C

CY7C1362C

Pin Configurations (continued)

119-Ball BGA Pinout (2 Chip Enables with JTAG)

CY7C1360C (256K x 36)

DDQ

ADSP

ADSC

DDQ

NC/288M

NC/144M

NC/576M

NC/1G

DQP

DDQ

ADV

DDQ

CLK

DDQ

BWE

DDQ

DQP

MODE

NC/72M

TMS

NC/36M

TDI

TCK

TDO

DDQ

CY7C1362C (512K x 18)

DDQ

ADSP

ADSC

DDQ

NC/288M

NC/576M

NC/144M

NC/1G

DQP

ADV

DDQ

CLK

DDQ

BWE

DDQ

DQP

MODE

NC/72M

NC/36M

TCK

TMS

TDI

TDO

DDQ

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CY7C1360C

CY7C1362C

Pin Configurations (continued)

165-Ball FBGA Pinout (3 Chip Enable with JTAG)

CY7C1360C (256K x 36)

NC/288M

NC/144M

DQP_C

CE₁

BW_C

BW_D

V_SS

V_DD

BW_B

BW_A

V_SS

ADSC

BWE

V_SS

ADV

ADSP

V_DDQ

CE2

V_DDQ

CLK

V_SS

NC/576M

DQP_B

DQ_B

V_SS

V_DD

NC/1G

DQ_B

DQ_C

V_SS

V_DDQ

V_DD

V_SS

V_DD

V_DDQ

DQ_B

DQ_D

V_DDQ

DQ_A

DQ_D

DQP_D

DQ_D

V_DDQ

V_DD

V_SS

NC/18M

V_SS

V_DD

V_SS

V_DDQ

DQ_A

DQP_A

NC/72M

TDI

TDO

MODE NC/36M

TMS

TCK

CY7C1362C (512K x 18)

NC/288M

NC/144M

BW_B

CE₁

CE2

BWE

V_SS

ADSC

ADV

ADSP

V_DDQ

BW_A

V_SS

CLK

V_SS

NC/576M

DQP_A

DQ_A

V_DDQ

V_SS

V_DD

V_SS

NC/1G

DQ_B

V_DD

DQ_B

V_SS

V_DDQ

V_DD

V_SS

V_DD

V_DDQ

DQ_A

DQ_B

V_DDQ

DQ_A

DQ_B

DQP_B

V_DDQ

V_DD

V_SS

NC/18M

V_SS

V_DD

V_SS

V_DDQ

DQ_A

NC/72M

TDI

TDO

MODE NC/36M

TMS

TCK

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CY7C1360C

CY7C1362C

Pin Definitions

Name

I/O

Description

Address Inputs used to select one of the address locations. Sampled at the rising edge of

A , A , A

Input-

[2]

Synchronous the CLK if ADSP or ADSC is active LOW, and CE , CE , and CE are sampled active. A , A

are fed to the two-bit counter.

BW , BW

Input-

Byte Write Select Inputs, active LOW. Qualified with BWE to conduct Byte Writes to the

BW , BW

Synchronous SRAM. Sampled on the rising edge of CLK.

Input- Global Write Enable Input, active LOW. When asserted LOW on the rising edge of CLK, a

Synchronous global Write is conducted (ALL bytes are written, regardless of the values on BW and BWE).

BWE

CLK

Input-

Byte Write Enable Input, active LOW. Sampled on the rising edge of CLK. This signal must

Synchronous be asserted LOW to conduct a Byte Write.

Input-

Clock

Clock Input. Used to capture all synchronous inputs to the device. Also used to increment the

burst counter when ADV is asserted LOW, during a burst operation.

Input-

Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction

[2]

Synchronous with CE and CE

to select/deselect the device. ADSP is ignored if CE is HIGH. CE is

sampled only when a new external address is loaded.

Input-

Synchronous with CE and CE

Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction

[2]

to select/deselect the device. CE is sampled only when a new external

address is loaded.

Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction

Synchronous with CE and CE to select/deselect the device. Not available for AJ package version. Not

[2]

Input-

[2]

connected for BGA. Where referenced, CE

is assumed active throughout this document for

BGA. CE is sampled only when a new external address is loaded.

Input-

Output Enable, asynchronous input, active LOW. Controls the direction of the I/O pins.

Asynchronous When LOW, the I/O pins behave as outputs. When deasserted HIGH, I/O pins are tri-stated,

and act as input data pins. OE is masked during the first clock of a read cycle when emerging

from a deselected state.

ADV

Input-

Advance Input signal, sampled on the rising edge of CLK, active LOW. When asserted, it

Synchronous automatically increments the address in a burst cycle.

ADSP

Input- Address Strobe from Processor, sampled on the rising edge of CLK, active LOW. When

Synchronous asserted LOW, addresses presented to the device are captured in the address registers. A ,

A are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP

is recognized. ASDP is ignored when CE is deasserted HIGH.

ADSC

Input-

Address Strobe from Controller, sampled on the rising edge of CLK, active LOW. When

Synchronous asserted LOW, addresses presented to the device are captured in the address registers. A ,

A are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP

is recognized.

Input-

ZZ “Sleep” Input, active HIGH. When asserted HIGH places the device in a non-time-critical

Asynchronous “sleep” condition with data integrity preserved. For normal operation, this pin has to be LOW or

left floating. ZZ pin has an internal pull-down.

I/O-

Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered

DQs, DQP

Synchronous by the rising edge of CLK. As outputs, they deliver the data contained in the memory location

specified by the addresses presented during the previous clock rise of the read cycle. The

direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs.

When HIGH, DQs and DQP are placed in a tri-state condition.

Power Supply Power supply inputs to the core of the device.

Ground

Ground for the core of the device.

I/O Ground

Ground for the I/O circuitry.

SSQ

DDQ

I/O Power Supply Power supply for the I/O circuitry.

MODE

Input-

Static

Selects Burst Order. When tied to GND selects linear burst sequence. When tied to V or

left floating selects interleaved burst sequence. This is a strap pin and should remain static

during device operation. Mode pin has an internal pull-up.

TDO

JTAG serial

output

Synchronous

Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK. If the JTAG

feature is not being utilized, this pin should be disconnected. This pin is not available on TQFP

packages.

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CY7C1360C

CY7C1362C

Pin Definitions (continued)

Name

TDI

I/O

Description

JTAG serial input Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is

Synchronous not being utilized, this pin can be disconnected or connected to V . This pin is not available

on TQFP packages.

TMS

JTAG serial input Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is

Synchronous not being utilized, this pin can be disconnected or connected to V . This pin is not available

on TQFP packages.

TCK

JTAG-

Clock

Clock input to the JTAG circuitry. If the JTAG feature is not being utilized, this pin must be

connected to V . This pin is not available on TQFP packages.

–

No Connects. Not internally connected to the die

NC (18,36,

72, 144, 288,

576, 1G)

These pins are not connected. They will be used for expansion to the 18M, 36M, 72M, 144M

288M, 576M, and 1G densities.

access. After the first cycle of the access, the outputs are

controlled by the OE signal. Consecutive single Read cycles

are supported. Once the SRAM is deselected at clock rise by

the chip select and either ADSP or ADSC signals, its output

will tri-state immediately.

Functional Overview

All synchronous inputs pass through input registers controlled

by the rising edge of the clock. All data outputs pass through

output registers controlled by the rising edge of the clock.

Maximum access delay from the clock rise (t ) is 2.8 ns

(250-MHz device).

Single Write Accesses Initiated by ADSP

This access is initiated when both of the following conditions

The CY7C1360C/CY7C1362C supports secondary cache in

systems utilizing either a linear or interleaved burst sequence.

The interleaved burst order supports Pentium and i486™

processors. The linear burst sequence is suited for processors

that utilize a linear burst sequence. The burst order is user

selectable, and is determined by sampling the MODE input.

Accesses can be initiated with either the Processor Address

Strobe (ADSP) or the Controller Address Strobe (ADSC).

Address advancement through the burst sequence is

controlled by the ADV input. A two-bit on-chip wraparound

burst counter captures the first address in a burst sequence

and automatically increments the address for the rest of the

burst access.

are satisfied at clock rise: (1) ADSP is asserted LOW, and

[2]

(2) CE , CE , CE

are all asserted active. The address

presented to A is loaded into the address register and the

address advancement logic while being delivered to the

memory array. The Write signals (GW, BWE, and BW ) and

ADV inputs are ignored during this first cycle.

ADSP-triggered Write accesses require two clock cycles to

complete. If GW is asserted LOW on the second clock rise, the

data presented to the DQs inputs is written into the corre-

sponding address location in the memory array. If GW is HIGH,

then the Write operation is controlled by BWE and BW

signals. The CY7C1360C/CY7C1362C provides Byte Write

capability that is described in the Write Cycle Descriptions

table. Asserting the Byte Write Enable input (BWE) with the

Byte Write operations are qualified with the Byte Write Enable

(BWE) and Byte Write Select (BW ) inputs. A Global Write

selected Byte Write (BW ) input, will selectively write to only

Enable (GW) overrides all Byte Write inputs and writes data to

all four bytes. All writes are simplified with on-chip

synchronous self-timed Write circuitry.

[2]

the desired bytes. Bytes not selected during a Byte Write

operation will remain unaltered. A synchronous self-timed

Write mechanism has been provided to simplify the Write

operations.

Three synchronous Chip Selects (CE , CE , CE ) and an

asynchronous Output Enable (OE) provide for easy bank

Because the CY7C1360C/CY7C1362C is a common I/O

device, the Output Enable (OE) must be deasserted HIGH

before presenting data to the DQs inputs. Doing so will tri-state

the output drivers. As a safety precaution, DQs are automati-

cally tri-stated whenever a Write cycle is detected, regardless

of the state of OE.

selection and output tri-state control. ADSP is ignored if CE

is HIGH.

Single Read Accesses

This access is initiated when the following conditions are

satisfied at clock rise: (1) ADSP or ADSC is asserted LOW, (2)

[2]

CE , CE , CE

are all asserted active, and (3) the Write

Single Write Accesses Initiated by ADSC

signals (GW, BWE) are all deasserted HIGH. ADSP is ignored

ADSC Write accesses are initiated when the following condi-

if CE is HIGH. The address presented to the address inputs

tions are satisfied: (1) ADSC is asserted LOW, (2) ADSP is

(A) is stored into the address advancement logic and the

address register while being presented to the memory array.

The corresponding data is allowed to propagate to the input of

the output registers. At the rising edge of the next clock the

data is allowed to propagate through the output register and

onto the data bus within 2.8 ns (250-MHz device) if OE is

active LOW. The only exception occurs when the SRAM is

emerging from a deselected state to a selected state, its

outputs are always tri-stated during the first cycle of the

[2]

deasserted HIGH, (3) CE , CE , CE

are all asserted active,

and (4) the appropriate combination of the Write inputs (GW,

BWE, and BW ) are asserted active to conduct a Write to the

desired byte(s). ADSC-triggered Write accesses require a

single clock cycle to complete. The address presented to A is

loaded into the address register and the address

advancement logic while being delivered to the memory array.

The ADV input is ignored during this cycle. If a global Write is

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CY7C1360C

CY7C1362C

conducted, the data presented to the DQs is written into the

corresponding address location in the memory core. If a Byte

Write is conducted, only the selected bytes are written. Bytes

not selected during a Byte Write operation will remain

unaltered. A synchronous self-timed Write mechanism has

been provided to simplify the Write operations.

clock cycles are required to enter into or exit from this “sleep”

mode. While in this mode, data integrity is guaranteed.

Accesses pending when entering the “sleep” mode are not

considered valid nor is the completion of the operation

guaranteed. The device must be deselected prior to entering

[2]

the “sleep” mode. CE , CE , CE , ADSP, and ADSC must

remain inactive for the duration of t

returns LOW.

after the ZZ input

ZZREC

Because the CY7C1360C/CY7C1362C is a common I/O

device, the Output Enable (OE) must be deasserted HIGH

before presenting data to the DQs inputs. Doing so will tri-state

the output drivers. As a safety precaution, DQs are automati-

cally tri-stated whenever a Write cycle is detected, regardless

of the state of OE.

Interleaved Burst Address Table

(MODE = Floating or V_DD

)

First

Second

Third

Fourth

Address

Burst Sequences

A , A

The CY7C1360C/CY7C1362C provides a two-bit wraparound

counter, fed by A , A , that implements either an interleaved

or linear burst sequence. The interleaved burst sequence is

designed specifically to support Intel Pentium applications.

The linear burst sequence is designed to support processors

that follow a linear burst sequence. The burst sequence is user

selectable through the MODE input.

Linear Burst Address Table (MODE = GND)

Asserting ADV LOW at clock rise will automatically increment

the burst counter to the next address in the burst sequence.

Both Read and Write burst operations are supported.

First

Second

Third

Fourth

Address

A , A

Sleep Mode

The ZZ input pin is an asynchronous input. Asserting ZZ

places the SRAM in a power conservation “sleep” mode. Two

ZZ Mode Electrical Characteristics

Parameter

Description

Sleep mode standby current

Device operation to ZZ

Test Conditions

ZZ > V – 0.2V

Min.

Max.

Unit

DDZZ

ZZ > V – 0.2V

ZZS

CYC

ZZ recovery time

ZZ < 0.2V

ZZREC

ZZI

CYC

ZZ Active to sleep current

ZZ Inactive to exit sleep current

This parameter is sampled

RZZI

Truth Table^{[3, 4, 5, 6, 7, 8]}

Address

Used

Operation

CE ZZ ADSP ADSC ADV WRITE OE CLK

Deselect Cycle, Power Down

Sleep Mode, Power Down

READ Cycle, Begin Burst

None

L-H

Tri-State

None

External

L-H

Tri-State

WRITE Cycle, Begin Burst

Notes:

3. X = “Don't Care.” H = Logic HIGH, L = Logic LOW.

4. WRITE = L when any one or more Byte Write Enable signals and BWE = L or GW = L. WRITE = H when all Byte Write Enable signals, BWE, GW = H.

5. The DQ pins are controlled by the current cycle and the OE signal. OE is asynchronous and is not sampled with the clock.

6. CE , CE , and CE are available only in the TQFP package. BGA package has only two chip selects CE and CE .

7. The SRAM always initiates a read cycle when ADSP is asserted, regardless of the state of GW, BWE, or BW . Writes may occur only on subsequent clocks

after the ADSP or with the assertion of ADSC. As a result, OE must be driven HIGH prior to the start of the Write cycle to allow the outputs to tri-state. OE is a

don't care for the remainder of the Write cycle.

8. OE is asynchronous and is not sampled with the clock rise. It is masked internally during Write cycles. During a Read cycle all data bits are Tri-State when OE

is inactive or when the device is deselected, and all data bits behave as output when OE is active (LOW).

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CY7C1360C

CY7C1362C

Truth Table^{[3, 4, 5, 6, 7, 8]}(continued)

Address

Operation

Used

External

CE ZZ ADSP ADSC ADV WRITE OE CLK

READ Cycle, Begin Burst

READ Cycle, Continue Burst

WRITE Cycle, Continue Burst

READ Cycle, Suspend Burst

WRITE Cycle, Suspend Burst

L-H

Tri-State

Current

Tri-State

Partial Truth Table for Read/Write^{[5, 9]}

Function (CY7C1360C)

BWE

Read

Write Byte A – (DQ and DQP )

Write Byte B – (DQ and DQP )

Write Bytes B, A

Write Byte C – (DQ and DQP )

Write Bytes C, A

Write Bytes C, B

Write Bytes C, B, A

Write Byte D – (DQ and DQP )

Write Bytes D, A

Write Bytes D, B

Write Bytes D, B, A

Write Bytes D, C

Write Bytes D, C, A

Write Bytes D, C, B

Write All Bytes

Note:

9. Table only lists a partial listing of the byte write combinations. Any combination of BW is valid. Appropriate write will be done based on which byte write is active.

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CY7C1360C

CY7C1362C

Truth Table for Read/Write^{[5, 9]}

Function (CY7C1362C)

BWE

Read

Write Byte A – (DQ and DQP )

Write Byte B – (DQ and DQP )

Write Bytes B, A

Write All Bytes

Test Access Port (TAP)

IEEE 1149.1 Serial Boundary Scan (JTAG)

The CY7C1360C/CY7C1362C incorporates a serial boundary

scan test access port (TAP) in the BGA package only. The

TQFP package does not offer this functionality. This part

operates in accordance with IEEE Standard 1149.1-1900, but

doesn’t have the set of functions required for full 1149.1

compliance. These functions from the IEEE specification are

excluded because their inclusion places an added delay in the

critical speed path of the SRAM. Note the TAP controller

functions in a manner that does not conflict with the operation

of other devices using 1149.1 fully compliant TAPs. The TAP

operates using JEDEC-standard 3.3V or 2.5V I/O logic levels.

Test Clock (TCK)

The test clock is used only with the TAP controller. All inputs

are captured on the rising edge of TCK. All outputs are driven

from the falling edge of TCK.

Test MODE SELECT (TMS)

The TMS input is used to give commands to the TAP controller

and is sampled on the rising edge of TCK. It is allowable to

leave this ball unconnected if the TAP is not used. The ball is

pulled up internally, resulting in a logic HIGH level.

The CY7C1360C/CY7C1362C contains a TAP controller,

instruction register, boundary scan register, bypass register,

and ID register.

Test Data-In (TDI)

The TDI ball is used to serially input information into the

registers and can be connected to the input of any of the

registers. The register between TDI and TDO is chosen by the

instruction that is loaded into the TAP instruction register. For

information on loading the instruction register, see TAP

Controller State Diagram. TDI is internally pulled up and can

be unconnected if the TAP is unused in an application. TDI is

connected to the most significant bit (MSB) of any register.

(See Tap Controller Block Diagram.)

Disabling the JTAG Feature

It is possible to operate the SRAM without using the JTAG

feature. To disable the TAP controller, TCK must be tied LOW

(V ) to prevent clocking of the device. TDI and TMS are inter-

nally pulled up and may be unconnected. They may alternately

be connected to V through a pull-up resistor. TDO should be

left unconnected. Upon power-up, the device will come up in

a reset state which will not interfere with the operation of the

device.TAP Controller State Diagram

Test Data-Out (TDO)

The 0/1 next to each state represents the value of TMS at the

The TDO output ball is used to serially clock data-out from the

registers. The output is active depending upon the current

state of the TAP state machine. The output changes on the

falling edge of TCK. TDO is connected to the least significant

bit (LSB) of any register. (See Tap Controller State Diagram.)

TEST-LOGIC

RESET

RUN-TEST/

IDLE

SELECT

DR-SCAN

SELECT

IR-SCAN

CAPTURE-DR

CAPTURE-IR

SHIFT-DR

SHIFT-IR

EXIT1-DR

EXIT1-IR

PAUSE-DR

PAUSE-IR

EXIT2-DR

EXIT2-IR

UPDATE-DR

UPDATE-IR

rising edge of TCK.

Document #: 38-05540 Rev. *H

Page 11 of 31

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CY7C1360C

CY7C1362C

Boundary Scan Register

TAP Controller Block Diagram

The boundary scan register is connected to all the input and

bidirectional balls on the SRAM.

Bypass Register

The boundary scan register is loaded with the contents of the

RAM I/O ring when the TAP controller is in the Capture-DR

state and is then placed between the TDI and TDO balls when

the controller is moved to the Shift-DR state. The EXTEST,

SAMPLE/PRELOAD and SAMPLE Z instructions can be used

to capture the contents of the I/O ring.

Selection

Circuitry

Instruction Register

31 30 29

Identification Register

Selection

Circuitry

TDI

TDO

The Boundary Scan Order tables show the order in which the

bits are connected. Each bit corresponds to one of the bumps

on the SRAM package. The MSB of the register is connected

to TDI and the LSB is connected to TDO.

Boundary Scan Register

Identification (ID) Register

The ID register is loaded with a vendor-specific, 32-bit code

during the Capture-DR state when the IDCODE command is

loaded in the instruction register. The IDCODE is hardwired

into the SRAM and can be shifted out when the TAP controller

is in the Shift-DR state. The ID register has a vendor code and

other information described in the Identification Register

Definitions table.

TCK

TMS

TAP CONTROLLER

Performing a TAP Reset

TAP Instruction Set

A RESET is performed by forcing TMS HIGH (V ) for five

Overview

rising edges of TCK. This RESET does not affect the operation

of the SRAM and may be performed while the SRAM is

operating.

Eight different instructions are possible with the three-bit

instruction register. All combinations are listed in the

Instruction Codes table. Three of these instructions are listed

as RESERVED and should not be used. The other five instruc-

tions are described in detail below.

At power-up, the TAP is reset internally to ensure that TDO

comes up in a High-Z state.

TAP Registers

The TAP controller used in this SRAM is not fully compliant to

the 1149.1 convention because some of the mandatory 1149.1

instructions are not fully implemented.

Registers are connected between the TDI and TDO balls and

allow data to be scanned into and out of the SRAM test

circuitry. Only one register can be selected at a time through

the instruction register. Data is serially loaded into the TDI ball

on the rising edge of TCK. Data is output on the TDO ball on

the falling edge of TCK.

The TAP controller cannot be used to load address data or

control signals into the SRAM and cannot preload the I/O

buffers. The SRAM does not implement the 1149.1 commands

EXTEST or INTEST or the PRELOAD portion of

SAMPLE/PRELOAD; rather, it performs a capture of the I/O

ring when these instructions are executed.

Instruction Register

Three-bit instructions can be serially loaded into the instruction

TDI and TDO balls as shown in the Tap Controller Block

Diagram. Upon power-up, the instruction register is loaded

with the IDCODE instruction. It is also loaded with the IDCODE

instruction if the controller is placed in a reset state as

described in the previous section.

Instructions are loaded into the TAP controller during the

Shift-IR state when the instruction register is placed between

TDI and TDO. During this state, instructions are shifted

through the instruction register through the TDI and TDO balls.

To execute the instruction once it is shifted in, the TAP

controller needs to be moved into the Update-IR state.

EXTEST

When the TAP controller is in the Capture-IR state, the two

least significant bits are loaded with a binary “01” pattern to

allow for fault isolation of the board-level serial test data path.

EXTEST is a mandatory 1149.1 instruction which is to be

executed whenever the instruction register is loaded with all

0s. EXTEST is not implemented in this SRAM TAP controller,

and therefore this device is not compliant to 1149.1. The TAP

controller does recognize an all-0 instruction.

Bypass Register

To save time when serially shifting data through registers, it is

sometimes advantageous to skip certain chips. The bypass

TDI and TDO balls. This allows data to be shifted through the

SRAM with minimal delay. The bypass register is set LOW

When an EXTEST instruction is loaded into the instruction

instruction has been loaded. There is one difference between

the two instructions. Unlike the SAMPLE/PRELOAD

instruction, EXTEST places the SRAM outputs in a High-Z

state.

(V ) when the BYPASS instruction is executed.

Document #: 38-05540 Rev. *H

Page 12 of 31

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CY7C1360C

CY7C1362C

IDCODE

To guarantee that the boundary scan register will capture the

correct value of a signal, the SRAM signal must be stabilized

long enough to meet the TAP controller's capture set-up plus

The IDCODE instruction causes a vendor-specific, 32-bit code

to be loaded into the instruction register. It also places the

instruction register between the TDI and TDO balls and allows

the IDCODE to be shifted out of the device when the TAP

controller enters the Shift-DR state.

hold times (t and t ). The SRAM clock input might not be

captured correctly if there is no way in a design to stop (or

slow) the clock during a SAMPLE/PRELOAD instruction. If this

is an issue, it is still possible to capture all other signals and

simply ignore the value of the CK and CK captured in the

boundary scan register.

The IDCODE instruction is loaded into the instruction register

upon power-up or whenever the TAP controller is given a test

logic reset state.

Once the data is captured, it is possible to shift out the data by

putting the TAP into the Shift-DR state. This places the

boundary scan register between the TDI and TDO pins.

SAMPLE Z

The SAMPLE Z instruction causes the boundary scan register

to be connected between the TDI and TDO balls when the TAP

controller is in a Shift-DR state. It also places all SRAM outputs

into a High-Z state.

PRELOAD allows an initial data pattern to be placed at the

latched parallel outputs of the boundary scan register cells

prior to the selection of another boundary scan test operation.

The shifting of data for the SAMPLE and PRELOAD phases

can occur concurrently when required—that is, while data

captured is shifted out, the preloaded data can be shifted in.

SAMPLE/PRELOAD

SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When

the SAMPLE/PRELOAD instructions are loaded into the

instruction register and the TAP controller is in the Capture-DR

state, a snapshot of data on the inputs and output pins is

captured in the boundary scan register.

BYPASS

When the BYPASS instruction is loaded in the instruction

advantage of the BYPASS instruction is that it shortens the

boundary scan path when multiple devices are connected

together on a board.

The user must be aware that the TAP controller clock can only

operate at a frequency up to 20 MHz, while the SRAM clock

operates more than an order of magnitude faster. Because

there is a large difference in the clock frequencies, it is

possible that during the Capture-DR state, an input or output

will undergo a transition. The TAP may then try to capture a

signal while in transition (metastable state). This will not harm

the device, but there is no guarantee as to the value that will

be captured. Repeatable results may not be possible.

Reserved

These instructions are not implemented but are reserved for

future use. Do not use these instructions.

TAP Timing

Test Clock

(TCK)

CYC

TMSS

TDIS

TMSH

Test Mode Select

(TMS)

TDIH

Test Data-In

(TDI)

TDOV

TDOX

Test Data-Out

(TDO)

DON’T CARE

UNDEFINED

Document #: 38-05540 Rev. *H

Page 13 of 31

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CY7C1360C

CY7C1362C

[10, 11]

TAP AC Switching Characteristics Over the Operating Range

Parameter

Clock

Description

Min.

Max.

Unit

TCK Clock Cycle Time

TCK Clock Frequency

TCK Clock HIGH time

TCK Clock LOW time

MHz

TCYC

Output Times

TCK Clock LOW to TDO Valid

TCK Clock LOW to TDO Invalid

TDOV

TDOX

Set-up Times

TMS Set-up to TCK Clock Rise

TDI Set-up to TCK Clock Rise

Capture Set-up to TCK Rise

TMSS

TDIS

Hold Times

TMS Hold after TCK Clock Rise

TDI Hold after Clock Rise

TMSH

TDIH

Capture Hold after Clock Rise

3.3V TAP AC Test Conditions

2.5V TAP AC Test Conditions

Input pulse levels ................................................ V to 3.3V

Input pulse levels.................................................V to 2.5V

Input rise and fall times................................................... 1 ns

Input timing reference levels...........................................1.5V

Output reference levels...................................................1.5V

Test load termination supply voltage...............................1.5V

Input rise and fall time .....................................................1 ns

Input timing reference levels......................................... 1.25V

Output reference levels ................................................ 1.25V

Test load termination supply voltage ............................ 1.25V

3.3V TAP AC Output Load Equivalent

2.5V TAP AC Output Load Equivalent

1.5V

1.25V

50Ω

TDO

Z_O= 50Ω

20pF

TAP DC Electrical Characteristics And Operating Conditions

[12]

(0°C < T < +70°C; V = 3.3V ±0.165V unless otherwise noted)

Parameter

Description

Conditions

Min.

2.4

2.0

2.9

2.1

Max.

Unit

Output HIGH Voltage

Output LOW Voltage

= –4.0 mA

= –1.0 mA

= –100 µA

= 3.3V

= 2.5V

= 3.3V

= 2.5V

= 3.3V

= 2.5V

OH1

DDQ

OH2

OL1

= 8.0 mA

0.4

Notes:

10. t and t refer to the set-up and hold time requirements of latching data from the boundary scan register.

11. Test conditions are specified using the load in TAP AC test Conditions. t /t = 1 ns.

12. All voltages referenced to V (GND).

Document #: 38-05540 Rev. *H

Page 14 of 31

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CY7C1360C

CY7C1362C

TAP DC Electrical Characteristics And Operating Conditions

[12]

(0°C < T < +70°C; V = 3.3V ±0.165V unless otherwise noted)

(continued)

Parameter

Description

Conditions

Min.

Max.

0.2

Unit

Output LOW Voltage

Input HIGH Voltage

Input LOW Voltage

Input Load Current

= 100 µA

= 3.3V

= 2.5V

= 3.3V

= 2.5V

= 3.3V

= 2.5V

OL2

DDQ

0.2

2.0

1.7

+ 0.3

–0.5

–0.3

–5

0.7

GND < V < V

DDQ

µA

Identification Register Definitions

CY7C1360C

(256KX36)

CY7C1362C

(512KX18)

Instruction Field

Description

Revision Number (31:29)

000

01011

000

Describes the version number

Reserved for Internal Use

[13]

Device Depth (28:24)

01011

Device Width (23:18) 119-BGA

Device Width (23:18) 165- FBGA

Cypress Device ID (17:12)

101000

000000

100110

00000110100

101000

000000

010110

Defines memory type and architecture

Defines width and density

Cypress JEDEC ID Code (11:1)

ID Register Presence Indicator (0)

00000110100 Allows unique identification of SRAM vendor

Indicates the presence of an ID register

Scan Register Sizes

Bit Size (x36)

Bit Size (x18)

Instruction

Bypass

Boundary Scan Order (119-ball BGA package)

Boundary Scan Order (165-ball FBGA package)

Identification Codes

Instruction

EXTEST

Code

Description

000

Captures I/O ring contents. Places the boundary scan register between TDI and TDO.

Forces all SRAM outputs to High-Z state.

IDCODE

001

010

Loads the ID register with the vendor ID code and places the register between TDI and

TDO. This operation does not affect SRAM operations.

SAMPLE Z

Captures I/O ring contents. Places the boundary scan register between TDI and TDO.

Forces all SRAM output drivers to a High-Z state.

RESERVED

011

100

Do Not Use: This instruction is reserved for future use.

SAMPLE/PRELOAD

Captures I/O ring contents. Places the boundary scan register between TDI and TDO.

Does not affect SRAM operation.

RESERVED

BYPASS

101

110

111

Do Not Use: This instruction is reserved for future use.

Places the bypass register between TDI and TDO. This operation does not affect SRAM

operations.

Note:

13. Bit #24 is “1” in the Register Definitions for both 2.5V and 3.3V versions of this device.

Document #: 38-05540 Rev. *H

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CY7C1360C

CY7C1362C

165-ball FBGA Boundary Scan Order

CY7C1360C (256K x 36)

CY7C1362C (512K x 18)

Signal

Name

Signal

Name

Signal

Name

Bit#

ball ID

Name

CLK

Bit#

ball ID

Bit#

ball ID

Bit#

ball ID

CLK

BWE

ADSC

ADSP

ADV

ADSC

ADSP

ADV

MODE

Internal

B10

A10

C11

E10

F10

G10

D10

D11

E11

F11

G11

H11

J10

K10

L10

M10

J11

K11

L11

M11

N11

R11

R10

P10

DQP

B10

Internal

A10

DQP

A11

Internal

C11

Internal

DQP

D11

E11

Internal

F11

Internal

G11

H11

J10

K10

L10

Internal

M10

Internal

R11

Internal

DQP

Internal

DQP

Internal

R10

P10

Internal

P11

Document #: 38-05540 Rev. *H

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CY7C1360C

CY7C1362C

119-ball BGA Boundary Scan Order

CY7C1360C (256K x 36)

CY7C1362C (512K x 18)

Signal

Name

Signal

Name

Bit# ball ID

Name

CLK

Bit#

ball ID

Bit#

ball ID

Name

CLK

Bit#

ball ID

BWE

ADSC

ADSP

ADV

ADSC

ADSP

ADV

MODE

Internal

DQP

Internal

DQP

Internal

DQP

Internal

DQP

Internal

DQP

Internal

BWD

Internal

Document #: 38-05540 Rev. *H

Page 17 of 31

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CY7C1360C

CY7C1362C

DC Input Voltage ..................................–0.5V to VDD + 0.5V

Current into Outputs (LOW)......................................... 20 mA

Maximum Ratings

(Above which the useful life may be impaired. For user guide-

lines, not tested.)

Static Discharge Voltage.......................................... > 2001V

(per MIL-STD-883, Method 3015)

Storage Temperature .................................–65°C to +150°C

Latch-up Current.....................................................> 200 mA

Ambient Temperature with

Power Applied.............................................–55°C to +125°C

Operating Range

Supply Voltage on V Relative to GND........ –0.5V to +4.6V

Ambient

Supply Voltage on V

Relative to GND ......–0.5V to +V

Range

Temperature

DDQ

DC Voltage Applied to Outputs

in Tri-State..........................................–0.5V to VDDQ + 0.5V

Commercial 0°C to +70°C

Industrial –40°C to +85°C

3.3V –

5%/+10%

2.5V – 5% to

[14, 15]

Electrical Characteristics Over the Operating Range

Parameter

Description

Power Supply Voltage

I/O Supply Voltage

Test Conditions

Min.

3.135

2.375

2.4

Max.

Unit

3.6

for 3.3V I/O

for 2.5V I/O

DDQ

2.625

Output HIGH Voltage

Output LOW Voltage

for 3.3V I/O, I = –4.0 mA

for 2.5V I/O, I = –1.0 mA

2.0

for 3.3V I/O, I = 8.0 mA

0.4

for 2.5V I/O, I = 1.0 mA

[14]

Input HIGH Voltage

for 3.3V I/O

for 2.5V I/O

for 3.3V I/O

for 2.5V I/O

GND ≤ V ≤ V

2.0

1.7

+ 0.3V

[14]

Input LOW Voltage

–0.3

–5

0.8

0.7

Input Leakage Current

except ZZ and MODE

µA

DDQ

Input Current of MODE Input = V

Input = V

–30

–5

µA

Input Current of ZZ

Input = V

µA

Output Leakage Current GND ≤ V ≤ V

Output Disabled

–5

µA

DDQ,

Operating Supply

f = f

= Max., I

= 0 mA,

4-ns cycle, 250 MHz

5-ns cycle, 200 MHz

6-ns cycle, 166 MHz

4-ns cycle, 250 MHz

5-ns cycle, 200 MHz

6-ns cycle, 166 MHz

250

220

180

130

120

110

OUT

CYC

Current

= 1/t

MAX

Automatic CE

Power-down

Current—TTL Inputs

V = Max, Device Deselected,

SB1

≥ V or V ≤ V

f = f

= 1/t

MAX CYC

Automatic CE

Power-down

Current—CMOS Inputs f = 0

V = Max, Device Deselected, All speeds

SB2

≤ 0.3V or V > V – 0.3V,

DDQ

Automatic CE

Power-down

Current—CMOS Inputs f = f

= Max, Device Deselected, or 4-ns cycle, 250 MHz

120

110

100

SB3

≤ 0.3V or V > V

– 0.3V

DDQ

5-ns cycle, 200 MHz

6-ns cycle, 166 MHz

= 1/t

MAX

CYC

Automatic CE

V = Max, Device Deselected, All Speeds

SB4

Power-down

Current—TTL Inputs

≥ V or V ≤ V , f = 0

IH IN IL

Notes:

14. Overshoot: V (AC) < V +1.5V (Pulse width less than t

/2), undershoot: V (AC) > –2V (Pulse width less than t /2).

CYC

15. T

: Assumes a linear ramp from 0V to V (min.) within 200 ms. During this time V < V and V

< V

Power-up

DDQ

Document #: 38-05540 Rev. *H

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CY7C1360C

CY7C1362C

Capacitance^[16]

100 TQFP

Max.

119 BGA

Max.

165 FBGA

Parameter

Description

Input Capacitance

Test Conditions

T = 25°C, f = 1 MHz,

Max.

Unit

= 3.3V

= 2.5V

Clock Input Capacitance

Input/Output Capacitance

CLK

I/O

DDQ

Thermal Resistance^[16]

100 TQFP

Package

119 BGA

Package

165 FBGA

Package

Parameter

Description

Test Conditions

Unit

Thermal Resistance

(Junction to Ambient) methods and procedures for

Test conditions follow standard test

29.41

34.1

16.8

°C/W

measuring thermal impedance, per

EIA/JESD51.

Thermal Resistance

(Junction to Case)

6.13

14.0

°C/W

AC Test Loads and Waveforms

3.3V I/O Test Load

OUTPUT

R = 317Ω

3.3V

ALL INPUT PULSES

90%

V_DDQ

OUTPUT

90%

10%

Z = 50Ω

R = 50Ω

10%

GND

5 pF

INCLUDING

R = 351Ω

≤ 1 ns

V = 1.5V

(a)

JIG AND

SCOPE

(b)

(c)

2.5V I/O Test Load

R = 1667Ω

2.5V

OUTPUT

R = 50Ω

OUTPUT

ALL INPUT PULSES

90%

V_DDQ

GND

90%

10%

Z = 50Ω

10%

5 pF

R =1538Ω

≤ 1 ns

INCLUDING

V = 1.25V

JIG AND

SCOPE

(a)

(b)

(c)

Note:

16. Tested initially and after any design or process change that may affect these parameters.

Document #: 38-05540 Rev. *H

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CY7C1360C

CY7C1362C

[17, 18]

Switching Characteristics Over the Operating Range

–250

–200

–166

Parameter

Description

Min.

Max.

Min.

Max.

Min.

Max.

Unit

[19]

(Typical) to the First Access

POWER

Clock

Clock Cycle Time

Clock HIGH

4.0

1.8

5.0

2.0

6.0

2.4

CYC

Clock LOW

Output Times

Data Output Valid after CLK Rise

Data Output Hold after CLK Rise

2.8

3.0

3.5

1.25

DOH

CLZ

[20, 21, 22]

Clock to Low-Z

[20, 21, 22]

Clock to High-Z

2.8

3.0

3.5

CHZ

OEV

OELZ

OEHZ

OE LOW to Output Valid

[20, 21, 22]

OE LOW to Output Low-Z

[20, 21, 22]

OE HIGH to Output High-Z

2.8

3.0

3.5

Set-up Times

Address Set-up before CLK Rise

ADSC, ADSP Set-up before CLK Rise

ADV Set-up before CLK Rise

1.4

1.5

ADS

ADVS

WES

GW, BWE, BW Set-up before CLK Rise

Data Input Set-up before CLK Rise

Chip Enable Set-up before CLK Rise

CES

Hold Times

Address Hold after CLK Rise

ADSP, ADSC Hold after CLK Rise

ADV Hold after CLK Rise

0.4

0.5

ADH

ADVH

WEH

GW, BWE, BW Hold after CLK Rise

Data Input Hold after CLK Rise

Chip Enable Hold after CLK Rise

CEH

Notes:

17. Timing reference level is 1.5V when V

= 3.3V and is 1.25V when V

= 2.5V.

DDQ

18. Test conditions shown in (a) of AC Test Loads unless otherwise noted.

19. This part has a voltage regulator internally; t

is the time that the power needs to be supplied above V (minimum) initially before a Read or Write operation

POWER

can be initiated.

20. t

, t

, and t

are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.

CHZ CLZ OELZ

OEHZ

21. At any given voltage and temperature, t

is less than t

and t

is less than t

to eliminate bus contention between SRAMs when sharing the same

CLZ

OEHZ

OELZ

CHZ

data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed

to achieve High-Z prior to Low-Z under the same system conditions.

22. This parameter is sampled and not 100% tested.

Document #: 38-05540 Rev. *H

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CY7C1360C

CY7C1362C

Switching Waveforms

[23]

Read Cycle Timing

CYC

CLK

ADH

ADS

ADSP

ADSC

ADH

ADS

ADDRESS

Burst continued with

new base address

WEH

WES

GW, BWE,

BWx

Deselect

cycle

CEH

CES

ADVH

ADVS

ADV

suspends

burst.

OEV

OEHZ

CHZ

OELZ

DOH

CLZ

Q(A2)

Q(A2 + 1)

Q(A2 + 2)

Q(A2 + 3)

Q(A2)

Q(A2 + 1)

Q(A1)

Data Out (Q)

High-Z

Burst wraps around

to its initial state

Single READ

BURST READ

DON’T CARE

UNDEFINED

Note:

23. On this diagram, when CE is LOW: CE is LOW, CE is HIGH and CE is LOW. When CE is HIGH: CE is HIGH or CE is LOW or CE is HIGH.

Document #: 38-05540 Rev. *H

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CY7C1360C

CY7C1362C

Switching Waveforms (continued)

[23, 24]

Write Cycle Timing

CYC

CLK

ADH

ADS

ADSP

ADSC extends burst

ADH

ADS

ADH

ADS

ADSC

ADDRESS

Byte write signals are

ignored for first cycle when

ADSP initiates burst

WEH

WES

BWE,

BW^X

WEH

WES

CEH

CES

ADVH

ADVS

ADV

ADV suspends burst

Data In (D)

D(A2)

D(A2 + 1)

D(A2 + 2)

D(A2 + 3)

D(A3)

D(A3 + 1)

D(A3 + 2)

D(A1)

High-Z

OEHZ

Data Out (Q)

BURST READ

Single WRITE

BURST WRITE

Extended BURST WRITE

DON’T CARE

UNDEFINED

Note:

24.

Full width Write can be initiated by either GW LOW; or by GW HIGH, BWE LOW and BW LOW.

Document #: 38-05540 Rev. *H

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CY7C1360C

CY7C1362C

Switching Waveforms (continued)

[23, 25, 26]

Read/Write Cycle Timing

CYC

CLK

ADH

ADS

ADSP

ADSC

ADDRESS

WEH

WES

BWE,

BWX

CEH

CES

ADV

OELZ

Data In (D)

High-Z

D(A3)

D(A5)

D(A6)

OEHZ

CLZ

Data Out (Q)

Q(A1)

Q(A2)

Q(A4)

Q(A4+1)

Q(A4+2)

Q(A4+3)

Back-to-Back READs

Single WRITE

BURST READ

Back-to-Back

WRITEs

DON’T CARE

UNDEFINED

Notes:

25. The data bus (Q) remains in high-Z following a Write cycle, unless a new Read access is initiated by ADSP or ADSC.

26. GW is HIGH.

Document #: 38-05540 Rev. *H

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CY7C1360C

CY7C1362C

Switching Waveforms (continued)

[27, 28]

ZZ Mode Timing

CLK

ZZREC

ZZI

SUPPLY

DDZZ

RZZI

ALL INPUTS

(except ZZ)

DESELECT or READ Only

Outputs (Q)

High-Z

DON’T CARE

Notes:

27. Device must be deselected when entering ZZ mode. See Cycle Descriptions table for all possible signal conditions to deselect the device.

28. DQs are in High-Z when exiting ZZ sleep mode.

Document #: 38-05540 Rev. *H

Page 24 of 31

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CY7C1360C

CY7C1362C

Ordering Information

Not all of the speed, package and temperature ranges are available. Please contact your local sales representative or

visit www.cypress.com for actual products offered.

Speed

(MHz)

Package

Diagram

Operating

Range

Ordering Code

CY7C1360C-166AXC

CY7C1362C-166AXC

Part and Package Type

166

51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(3 Chip Enable)

Commercial

CY7C1360C-166AJXC 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(2 Chip Enable)

CY7C1362C-166AJXC

CY7C1360C-166BGC

CY7C1362C-166BGC

51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm)

CY7C1360C-166BGXC 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Lead-Free

CY7C1362C-166BGXC

CY7C1360C-166BZC

CY7C1362C-166BZC

51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm)

CY7C1360C-166BZXC 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Lead-Free

CY7C1362C-166BZXC

CY7C1360C-166AXI

CY7C1362C-166AXI

CY7C1360C-166AJXI

CY7C1362C-166AJXI

CY7C1360C-166BGI

CY7C1362C-166BGI

51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(3 Chip Enable)

Industrial

51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(2 Chip Enable)

51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm)

CY7C1360C-166BGXI 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Lead-Free

CY7C1362C-166BGXI

CY7C1360C-166BZI

CY7C1362C-166BZI

CY7C1360C-166BZXI

CY7C1362C-166BZXI

51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm)

51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Lead-Free

Document #: 38-05540 Rev. *H

Page 25 of 31

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CY7C1360C

CY7C1362C

Ordering Information (continued)

Not all of the speed, package and temperature ranges are available. Please contact your local sales representative or

visit www.cypress.com for actual products offered.

200

CY7C1360C-200AXC

CY7C1362C-200AXC

51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(3 Chip Enable)

Commercial

CY7C1360C-200AJXC 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(2 Chip Enable)

CY7C1362C-200AJXC

CY7C1360C-200BGC

CY7C1362C-200BGC

51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm)

CY7C1360C-200BGXC 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Lead-Free

CY7C1362C-200BGXC

CY7C1360C-200BZC

CY7C1362C-200BZC

51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm)

CY7C1360C-200BZXC 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Lead-Free

CY7C1362C-200BZXC

CY7C1360C-200AXI

CY7C1362C-200AXI

CY7C1360C-200AJXI

CY7C1362C-200AJXI

CY7C1360C-200BGI

CY7C1362C-200BGI

51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(3 Chip Enable)

Industrial

51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(2 Chip Enable)

51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm)

CY7C1360C-200BGXI 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Lead-Free

CY7C1362C-200BGXI

CY7C1360C-200BZI

CY7C1362C-200BZI

CY7C1360C-200BZXI

CY7C1362C-200BZXI

51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm)

51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Lead-Free

Document #: 38-05540 Rev. *H

Page 26 of 31

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CY7C1360C

CY7C1362C

Ordering Information (continued)

Not all of the speed, package and temperature ranges are available. Please contact your local sales representative or

visit www.cypress.com for actual products offered.

250

CY7C1360C-250AXC

CY7C1362C-250AXC

51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(3 Chip Enable)

Commercial

CY7C1360C-250AJXC 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(2 Chip Enable)

CY7C1362C-250AJXC

CY7C1360C-250BGC

CY7C1362C-250BGC

51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm)

CY7C1360C-250BGXC 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Lead-Free

CY7C1362C-250BGXC

CY7C1360C-250BZC

CY7C1362C-250BZC

51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm)

CY7C1360C-250BZXC 51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Lead-Free

CY7C1362C-250BZXC

CY7C1360C-250AXI

CY7C1362C-250AXI

CY7C1360C-250AJXI

CY7C1362C-250AJXI

CY7C1360C-250BGI

CY7C1362C-250BGI

51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(3 Chip Enable)

Industrial

51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Lead-Free

(2 Chip Enable)

51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm)

CY7C1360C-250BGXI 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) Lead-Free

CY7C1362C-250BGXI

CY7C1360C-250BZI

CY7C1362C-250BZI

CY7C1360C-250BZXI

CY7C1362C-250BZXI

51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm)

51-85180 165-ball Fine-Pitch Ball Grid Array (13 x 15 x 1.4 mm) Lead-Free

Document #: 38-05540 Rev. *H

Page 27 of 31

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CY7C1360C

CY7C1362C

Package Diagrams

100-Pin Thin Plastic Quad Flatpack (14 x 20 x 1.4 mm) (51-85050)

16.00 0.20

14.00 0.10

1.40 0.05

100

0.30 0.08

0.65

TYP.

12° 1°

(8X)

SEE DETAIL

0.20 MAX.

1.60 MAX.

R 0.08 MIN.

0.20 MAX.

0° MIN.

SEATING PLANE

STAND-OFF

0.05 MIN.

0.15 MAX.

NOTE:

1. JEDEC STD REF MS-026

0.25

GAUGE PLANE

2. BODY LENGTH DIMENSION DOES NOT INCLUDE MOLD PROTRUSION/END FLASH

MOLD PROTRUSION/END FLASH SHALL NOT EXCEED 0.0098 in (0.25 mm) PER SIDE

R 0.08 MIN.

0.20 MAX.

BODY LENGTH DIMENSIONS ARE MAX PLASTIC BODY SIZE INCLUDING MOLD MISMATCH

3. DIMENSIONS IN MILLIMETERS

0°-7°

0.60 0.15

0.20 MIN.

51-85050-*B

1.00 REF.

DETAIL

Document #: 38-05540 Rev. *H

Page 28 of 31

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CY7C1360C

CY7C1362C

Package Diagrams (continued)

119-Ball PBGA (14 x 22 x 2.4 mm) (51-85115)

Ø0.05 M C

Ø0.25 M C A B

A1 CORNER

Ø0.75 0.15(119X)

Ø1.00(3X) REF.

1.27

0.70 REF.

3.81

12.00

7.62

14.00 0.20

0.15(4X)

30° TYP.

51-85115-*B

SEATING PLANE

Document #: 38-05540 Rev. *H

Page 29 of 31

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CY7C1360C

CY7C1362C

Package Diagrams (continued)

165 FBGA 13 x 15 x 1.40 MM BB165D/BW165D

165-Ball FBGA (13 x 15 x 1.4 mm) (51-85180)

BOTTOM VIEW

PIN 1 CORNER

TOP VIEW

Ø0.05 M C

Ø0.25 M C A B

PIN 1 CORNER

-0Ø.060.25 M C A B

Ø0.50 (165X)

+0.14

-0.06

Ø0.50₃

(165X)

11 10

+0.14

11 10

1.00

5.00

1.00

5.00

10.00

13.00 0.10

0.15(4X)

NOTES :

SOLDER PAD TYPE : NON-SOLDER MASK DEFINED (NSMD)

PACKAGE WEIGHT : 0.475g

SOLDER PAD TYPE : NON-SOLDER MASK DEFINED (NSMD)

JEDEC REFERENCE : MO-216 / DESIGN 4.6C

PACKAGE WEIGHT : 0.475g

PACKAJEGDEECCORDEEFE:RBEBN0ACEC: MO-216 / DESIGN 4.6C

PACKAGE CODE : BB0AC

SEATING PLANE

51-85180-*A

i486 is a trademark, and Intel and Pentium are registered trademarks of Intel Corporation. PowerPC is a trademark of IBM

Corporation. All product and company names mentioned in this document are the trademarks of their respective holders.

Document #: 38-05540 Rev. *H

Page 30 of 31

of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be

used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its

products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress

products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.

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CY7C1360C

CY7C1362C

Document History Page

Document Title: CY7C1360C/CY7C1362C 9-Mbit (256K x 36/512K x 18) Pipelined SRAM

Document Number: 38-05540

Orig. of

REV.

ECN NO. Issue Date Change

Description of Change

241690

278130

See ECN

RKF

New data sheet

Changed Boundary Scan order to match the B rev of these devices

Changed TQFP pkg to Lead-free TQFP in Ordering Information section

Added comment of Lead-free BG and BZ packages availability

248929

323636

See ECN

VBL

PCI

Changed ISB1 and ISB3 from DC Characteristics table as follows:

ISB1: 225 MHz -> 130 mA, 200 MHz -> 120 mA, 167 MHz -> 110 mA

ISB3: 225 MHz -> 120 mA, 200 MHz -> 110 mA, 167 MHz -> 100 mA

Changed IDDZZ to 50 mA

Added BG and BZ pkg lead-free part numbers to ordering info section

Changed frequency of 225 MHz into 250 MHz

Added t

of 4.0 ns for 250 MHz

CYC

Changed Θ and Θ for TQFP Package from 25 and 9 °C/W to 29.41 and

6.13 °C/W respectively

Changed Θ and Θ for BGA Package from 25 and 6 °C/W to 34.1 and

14.0 °C/W respectively

Changed Θ and Θ for FBGA Package from 27 and 6 °C/W to 16.8 and

3.0 °C/W respectively

Modified address expansion as per JEDEC Standard

Removed comment of Lead-free BG and BZ packages availability

332879

357258

See ECN

PCI

Unshaded 200 and 166 MHz speed bins in the AC/DC Table and Selection

Guide

Added Address Expansion pins in the Pin Definition Table

Changed Device Width (23:18) for 119-BGA from 000000 to 101000

Added separate row for 165 -FBGA Device Width (23:18)

Modified V , V test conditions

Updated Ordering Information Table

Changed from Preliminary to Final

Removed Shading on 250MHz Speed Bin in Selection Guide and AC/DC

Table

Changed I

from 30 to 40 mA

SB2

Updated Ordering Information Table

377095

408298

See ECN

PCI

Modified test condition in note# 16 from V

< V to V

≤ V

DDQ

DDQ DD

RXU

Changed address of Cypress Semiconductor Corporation on Page# 1 from

“3901 North First Street” to “198 Champion Court”

Changed three-state to tri-state on page# 9 & page# 10

Modified “Input Load” to “Input Leakage Current except ZZ and MODE” in

the Electrical Characteristics Table

Replaced Package Name column with Package Diagram in the Ordering

Information table

Updated Ordering Information Table

501793

See ECN

VKN

Added the Maximum Rating for Supply Voltage on V

Relative to GND

DDQ

Changed t , t from 25 ns to 20 ns and t

from 5 ns to 10 ns in TAP

TH TL

TDOV

AC Switching Characteristics table.

Updated the Ordering Information table.

Document #: 38-05540 Rev. *H

Page 31 of 31

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