CY7C1318CV18
CY7C1320CV18
18-Mbit DDR II SRAM 2-Word
Burst Architecture
Features
Functional Description
■ 18-Mbit Density (1M x 18, 512K x 36)
■ 267 MHz Clock for high Bandwidth
The CY7C1318CV18, and CY7C1320CV18 are 1.8V
Synchronous Pipelined SRAMs equipped with DDR II archi-
tecture. The DDR II consists of an SRAM core with advanced
synchronous peripheral circuitry and a one-bit burst counter.
Addresses for read and write are latched on alternate rising
edges of the input (K) clock. Write data is registered on the rising
edges of both K and K. Read data is driven on the rising edges
of C and C if provided, or on the rising edge of K and K if C/C are
not provided. For CY7C1318CV18 and CY7C1320CV18, the
burst counter takes in the least significant bit of the external
address and bursts two 18-bit words (in the case of
CY7C1318CV18) of two 36-bit words (in the case of
CY7C1320CV18) sequentially into or out of the device.
■ 2-word Burst for reducing Address Bus Frequency
■ Double Data Rate (DDR) Interfaces
(data transferred at 534 MHz) at 267 MHz
■ Two Input Clocks (K and K) for precise DDR Timing
❐ SRAM uses rising edges only
■ Two Input Clocks for Output Data (C and C) to minimize Clock
Skew and Flight Time mismatches
■ Echo Clocks (CQ and CQ) simplify Data Capture in High Speed
Asynchronous inputs include an output impedance matching
input (ZQ). Synchronous data outputs (Q, sharing the same
physical pins as the data inputs, D) are tightly matched to the two
output echo clocks CQ/CQ, eliminating the need to capture data
separately from each individual DDR SRAM in the system
design. Output data clocks (C/C) enable maximum system
clocking and data synchronization flexibility.
Systems
■ Synchronous internally Self-timed Writes
■ DDR II operates with 1.5 Cycle Read Latency when the DLL is
enabled
■ Operates similar to a DDR I Device with one Cycle Read
Latency in DLL Off Mode
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the C or C (or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
■ 1.8V Core Power Supply with HSTL Inputs and Outputs
■ Variable drive HSTL Output Buffers
■ Expanded HSTL Output Voltage (1.4V–V
)
DD
■ Available in 165-Ball FBGA Package (13 x 15 x 1.4 mm)
■ Offered in both Pb-free and non Pb-free Packages
■ JTAG 1149.1 compatible Test Access Port
■ Delay Lock Loop (DLL) for accurate Data Placement
Configurations
CY7C1318CV18 – 1M x 18
CY7C1320CV18 – 512K x 36
Selection Guide
Description
267 MHz
267
250 MHz
250
200 MHz
200
167 MHz
167
Unit
MHz
mA
Maximum Operating Frequency
Maximum Operating Current
x18
x36
805
730
600
510
855
775
635
540
Cypress Semiconductor Corporation
Document Number: 001-07160 Rev. *F
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised August 24, 2009
CY7C1318CV18
CY7C1320CV18
Pin Configuration
[1]
The pin configuration for CY7C1318CV18 and CY7C1320CV18 follow.
165-Ball FBGA (13 x 15 x 1.4 mm) Pinout
CY7C1318CV18 (1M x 18)
1
CQ
NC
NC
NC
NC
NC
NC
DOFF
NC
NC
NC
NC
NC
NC
TDO
2
NC/72M
DQ9
NC
3
4
R/W
A
5
6
K
7
8
LD
A
9
10
NC/36M
NC
11
CQ
A
B
C
D
E
F
A
BWS
NC/144M
A
1
NC
NC/288M
A
K
BWS
A
NC
NC
NC
NC
NC
NC
DQ8
NC
0
NC
V
V
A0
V
DQ7
NC
SS
SS
SS
SS
NC
DQ10
DQ11
NC
V
V
V
V
V
V
NC
SS
SS
DD
DD
DD
DD
DD
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
DD
DD
DD
DD
DD
NC
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
NC
DQ6
DQ5
NC
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DQ12
NC
V
V
V
V
V
V
V
V
V
V
NC
G
H
J
DQ13
NC
V
V
V
V
REF
ZQ
REF
DDQ
DDQ
NC
NC
NC
DQ14
NC
NC
DQ4
NC
NC
K
L
NC
NC
NC
NC
NC
A
DQ3
DQ2
NC
DQ15
NC
V
V
V
V
NC
SS
SS
SS
SS
M
N
P
R
NC
V
V
DQ1
NC
SS
SS
SS
NC
DQ16
DQ17
A
V
A
A
A
A
C
C
A
A
A
V
NC
SS
NC
A
A
A
A
NC
DQ0
TDI
TCK
TMS
CY7C1320CV18 (512K x 36)
1
CQ
NC
NC
NC
NC
NC
NC
DOFF
NC
NC
NC
NC
NC
NC
TDO
2
3
4
5
BWS
BWS
A
6
K
7
BWS
BWS
A
8
9
10
NC/72M
NC
11
A
B
C
D
E
F
NC/144M NC/36M
R/W
A
LD
A
A
CQ
2
3
1
0
DQ27
NC
DQ18
DQ28
DQ19
DQ20
DQ21
DQ22
K
NC
NC
NC
NC
NC
NC
DQ8
DQ7
DQ16
DQ6
DQ5
DQ14
ZQ
V
V
A0
V
DQ17
NC
SS
SS
SS
SS
DQ29
NC
V
V
V
V
V
V
SS
SS
DD
DD
DD
DD
DD
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
DD
DD
DD
DD
DD
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
DQ15
NC
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
DQ30
DQ31
V
V
V
V
V
V
V
V
V
V
G
H
J
NC
V
V
V
V
REF
REF
DDQ
DDQ
NC
NC
DQ32
DQ23
DQ24
DQ34
DQ25
DQ26
A
NC
DQ13
DQ12
NC
DQ4
DQ3
DQ2
DQ1
DQ10
DQ0
TDI
K
L
NC
NC
NC
NC
NC
A
DQ33
NC
V
V
SS
SS
SS
SS
M
N
P
R
V
V
V
V
DQ11
NC
SS
SS
SS
DQ35
NC
V
A
A
A
A
C
C
A
A
A
V
SS
A
A
A
A
DQ9
TMS
TCK
Note
1. NC/36M, NC/72M, NC/144M, and NC/288M are not connected to the die and can be tied to any voltage level.
Document Number: 001-07160 Rev. *F
Page 3 of 26
CY7C1318CV18
CY7C1320CV18
Pin Definitions
Pin Name
I/O
Pin Description
DQ
Input Output- Data Input Output Signals. Inputs are sampled on the rising edge of K and K clocks during valid write
Synchronous operations. These pins drive out the requested data during a read operation. Valid data is driven out on
the rising edge of both the C and C clocks during read operations or K and K when in single clock mode.
[x:0]
When read access is deselected, Q
are automatically tristated.
[x:0]
CY7C1318CV18 − DQ
CY7C1320CV18 − DQ
[17:0]
[35:0]
LD
Input-
Synchronous Load. This input is brought LOW when a bus cycle sequence is defined. This definition
Synchronous includes address and read/write direction. All transactions operate on a burst of 2 data.
BWS ,
Input-
Byte Write Select 0, 1, 2, and 3 − Active LOW. Sampled on the rising edge of the K and K clocks during
0
BWS ,
Synchronous write operations. Used to select which byte is written into the device during the current portion of the Write
1
BWS ,
operations. Bytes not written remain unaltered.
2
BWS
CY7C1318CV18 − BWS controls D
and BWS controls D
[8:0] [17:9].
3
0
1
CY7C1320CV18 − BWS controls D
, BWS controls D
, BWS controls D
and BWS controls
0
[8:0]
1
[17:9]
2
[26:18]
3
D
.
[35:27]
All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write Select
ignores the corresponding byte of data and it is not written into the device.
A, A0
Input-
Address Inputs. These address inputs are multiplexed for both read and write operations. Internally, the
Synchronous device is organized as 1M x 18 (2 arrays each of 512K x 18) for CY7C1318CV18, and 512K x 36 (2 arrays
each of 256K x 36) for CY7C1320CV18.
CY7C1318CV18 – A0 is the input to the burst counter. These are incremented internally in a linear fashion.
20 address inputs are needed to access the entire memory array.
CY7C1320CV18 – A0 is the input to the burst counter. These are incremented internally in a linear fashion.
19 address inputs are needed to access the entire memory array. All the address inputs are ignored when
the appropriate port is deselected.
R/W
C
Input-
Synchronous Read/Write Input. When LD is LOW, this input designates the access type (read when
Synchronous R/W is HIGH, write when R/W is LOW) for the loaded address. R/W must meet the setup and hold times
around the edge of K.
Input Clock Positive Input Clock for Output Data. C is used in conjunction with C to clock out the read data from
the device. C and C can be used together to deskew the flight times of various devices on the board back
C
Input Clock Negative Input Clock for Output Data. C is used in conjunction with C to clock out the read data from
the device. C and C can be used together to deskew the flight times of various devices on the board back
K
Input Clock Positive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device
and to drive out data through Q
edge of K.
when in single clock mode. All accesses are initiated on the rising
[x:0]
K
Input Clock Negative Input Clock Input. K is used to capture synchronous data being presented to the device and
to drive out data through Q when in single clock mode.
[x:0]
CQ
Output Clock CQ Referenced with Respect to C. This is a free running clock and is synchronized to the input clock
for output data (C) of the DDR II. In single clock mode, CQ is generated with respect to K. The timing for
CQ
ZQ
Output Clock CQ Referenced with Respect to C. This is a free running clock and is synchronized to the input clock
for output data (C) of the DDR II. In single clock mode, CQ is generated with respect to K. The timing for
Input
Output Impedance Matching Input. This input is used to tune the device outputs to the system data bus
impedance. CQ, CQ, and Q output impedance are set to 0.2 x RQ, where RQ is a resistor connected
[x:0]
between ZQ and ground. Alternatively, this pin can be connected directly to V
, which enables the
DDQ
minimum impedance mode. This pin cannot be connected directly to GND or left unconnected.
Document Number: 001-07160 Rev. *F
Page 4 of 26
CY7C1318CV18
CY7C1320CV18
Pin Definitions (continued)
Pin Name
I/O
Pin Description
DOFF
Input
DLL Turn Off − Active LOW. Connecting this pin to ground turns off the DLL inside the device. The timing
in the DLL turned off operation is different from that listed in this data sheet. For normal operation, this
pin can be connected to a pull up through a 10 KΩ or less pull up resistor. The device behaves in DDR I
mode when the DLL is turned off. In this mode, the device can be operated at a frequency of up to 167
MHz with DDR I timing.
TDO
Output
Input
Input
Input
N/A
TDO for JTAG.
TCK
TCK Pin for JTAG.
TDI
TDI Pin for JTAG.
TMS
TMS Pin for JTAG.
NC
Not Connected to the Die. Can be tied to any voltage level.
Not Connected to the Die. Can be tied to any voltage level.
Not Connected to the Die. Can be tied to any voltage level.
Not Connected to the Die. Can be tied to any voltage level.
Not Connected to the Die. Can be tied to any voltage level.
Reference Voltage Input. Static input used to set the reference level for HSTL inputs, outputs, and AC
NC/36M
NC/72M
NC/144M
NC/288M
N/A
N/A
N/A
N/A
V
Input-
REF
Reference measurement points.
V
V
V
Power Supply Power Supply Inputs to the Core of the Device.
DD
Ground
Ground for the Device.
SS
Power Supply Power Supply Inputs for the Outputs of the Device.
DDQ
Document Number: 001-07160 Rev. *F
Page 5 of 26
CY7C1318CV18
CY7C1320CV18
subsequent rising edge of the negative input clock (K) the infor-
Functional Overview
mation presented to D
register, provided BWS
is also stored into the write data
are both asserted active. The 36 bits
[17:0]
The CY7C1318CV18, and CY7C1320CV18 are synchronous
pipelined Burst SRAMs equipped with a DDR interface, which
operates with a read latency of one and half cycles when DOFF
pin is tied HIGH. When DOFF pin is set LOW or connected to
[1:0]
of data are then written into the memory array at the specified
location. Write accesses can be initiated on every rising edge of
the positive input clock (K). This pipelines the data flow such that
18 bits of data can be transferred into the device on every rising
edge of the input clocks (K and K).
V
the device behaves in DDR I mode with a read latency of
SS
one clock cycle.
When Write access is deselected, the device ignores all inputs
after the pending write operations are completed.
Accesses are initiated on the rising edge of the positive input
clock (K). All synchronous input timing is referenced from the
rising edge of the input clocks (K and K) and all output timing is
referenced to the rising edge of the output clocks (C/C, or K/K
when in single clock mode).
Byte Write Operations
Byte write operations are supported by the CY7C1318CV18. A
write operation is initiated as described in the Write Operations
All synchronous data inputs (D
) pass through input registers
[x:0]
section. The bytes that are written are determined by BWS and
controlled by the rising edge of the input clocks (K and K). All
synchronous data outputs (Q ) pass through output registers
0
BWS , which are sampled with each set of 18-bit data words.
1
[x:0]
Asserting the appropriate Byte Write Select input during the data
portion of a write latches the data being presented and writes it
into the device. Deasserting the Byte Write Select input during
the data portion of a write enables the data stored in the device
for that byte to remain unaltered. This feature can be used to
simplify read/modify/write operations to a byte write operation.
controlled by the rising edge of the output clocks (C/C, or K/K
when in single-clock mode).
All synchronous control (R/W, LD, BWS
) inputs pass through
[0:X]
input registers controlled by the rising edge of the input clock (K).
CY7C1318CV18 is described in the following sections. The
same basic descriptions apply to CY7C1320CV18.
Single Clock Mode
Read Operations
The CY7C1318CV18 can be used with a single clock that
controls both the input and output registers. In this mode the
device recognizes only a single pair of input clocks (K and K) that
control both the input and output registers. This operation is
identical to the operation if the device had zero skew between
the K/K and C/C clocks. All timing parameters remain the same
in this mode. To use this mode of operation, tie C and C HIGH at
power on. This function is a strap option and not alterable during
device operation.
The CY7C1318CV18 is organized internally as two arrays of
512K x 18. Accesses are completed in a burst of two sequential
18-bit data words. Read operations are initiated by asserting
R/W HIGH and LD LOW at the rising edge of the positive input
clock (K). The address presented to address inputs is stored in
the read address register and the least significant bit of the
address is presented to the burst counter. The burst counter
increments the address in a linear fashion. Following the next K
clock rise, the corresponding 18-bit word of data from this
DDR Operation
address location is driven onto Q
, using C as the output
[17:0]
timing reference. On the subsequent rising edge of C the next
18-bit data word from the address location generated by the
The CY7C1318CV18 enables high-performance operation
through high clock frequencies (achieved through pipelining) and
double data rate mode of operation. The CY7C1318CV18
requires a single No Operation (NOP) cycle when transitioning
from a read to a write cycle. At higher frequencies, some appli-
cations may require a second NOP cycle to avoid contention.
burst counter is driven onto Q
. The requested data is valid
[17:0]
0.45 ns from the rising edge of the output clock (C or C, or K and
K when in single clock mode, 200 MHz and 250 MHz device). To
maintain the internal logic, each read access must be allowed to
complete. Read accesses can be initiated on every rising edge
of the positive input clock (K).
If a read occurs after a write cycle, address and data for the write
are stored in registers. The write information must be stored
because the SRAM cannot perform the last word write to the
array without conflicting with the read. The data stays in this
register until the next write cycle occurs. On the first write cycle
after the read(s), the stored data from the earlier write is written
into the SRAM array. This is called a posted write.
The CY7C1318CV18 first completes the pending read transac-
tions, when read access is deselected. Synchronous internal
circuitry automatically tristates the output following the next rising
edge of the positive output clock (C). This enables a seamless
transition between devices without the insertion of wait states in
a depth expanded memory.
If a read is performed on the same address on which a write is
performed in the previous cycle, the SRAM reads out the most
current data. The SRAM does this by bypassing the memory
array and reading the data from the registers.
Write Operations
Write operations are initiated by asserting R/W LOW and LD
LOW at the rising edge of the positive input clock (K). The
address presented to address inputs is stored in the write
address register and the least significant bit of the address is
presented to the burst counter. The burst counter increments the
address in a linear fashion. On the following K clock rise the data
Depth Expansion
Depth expansion requires replicating the LD control signal for
each bank. All other control signals can be common between
banks as appropriate.
presented to D
is latched and stored into the 18-bit write
[17:0]
data register, provided BWS
are both asserted active. On the
[1:0]
Document Number: 001-07160 Rev. *F
Page 6 of 26
CY7C1318CV18
CY7C1320CV18
Programmable Impedance
DLL
An external resistor, RQ, must be connected between the ZQ pin
These chips use a Delay Lock Loop (DLL) that is designed to
function between 120 MHz and the specified maximum clock
frequency. During power up, when the DOFF is tied HIGH, the
DLL is locked after 1024 cycles of stable clock. The DLL can also
be reset by slowing or stopping the input clocks K and K for a
minimum of 30 ns. However, it is not necessary to reset the DLL
to lock it to the desired frequency. The DLL automatically locks
1024 clock cycles after a stable clock is presented. The DLL may
be disabled by applying ground to the DOFF pin. When the DLL
is turned off, the device behaves in DDR I mode (with one cycle
latency and a longer access time). For information refer to the
application note DLL Considerations in QDRII™/DDRII.
on the SRAM and V to enable the SRAM to adjust its output
SS
driver impedance. The value of RQ must be 5x the value of the
intended line impedance driven by the SRAM. The allowable
range of RQ to guarantee impedance matching with a tolerance
of ±15% is between 175Ω and 350Ω, with V
= 1.5V. The
DDQ
output impedance is adjusted every 1024 cycles at power up to
account for drifts in supply voltage and temperature.
Echo Clocks
Echo clocks are provided on the DDR II to simplify data capture
on high speed systems. Two echo clocks are generated by the
DDR II. CQ is referenced with respect to C and CQ is referenced
with respect to C. These are free running clocks and are synchro-
nized to the output clock of the DDR II. In the single clock mode,
CQ is generated with respect to K and CQ is generated with
Application Example
Figure 1 shows two DDR II used in an application.
Figure 1. Application Example
R = 250ohms
R = 250ohms
SRAM#2
SRAM#1
ZQ
ZQ
DQ
A
DQ
A
CQ/CQ#
LD# R/W# C C# K K#
CQ/CQ#
LD# R/W# C C#
K
K#
DQ
Addresses
Cycle Start#
R/W#
Return CLK
Source CLK
Return CLK#
Source CLK#
BUS
MASTER
(CPU
or
Vterm = 0.75V
R = 50ohms
Vterm = 0.75V
ASIC)
Echo Clock1/Echo Clock#1
Echo Clock2/Echo Clock#2
Document Number: 001-07160 Rev. *F
Page 7 of 26
CY7C1318CV18
CY7C1320CV18
Truth Table
The truth table for the CY7C1318CV18, and CY7C1320CV18 follows.
Operation
K
LD
R/W
DQ
DQ
Write Cycle:
Load address; wait one cycle;
L-H
L
L
D(A1) at K(t + 1) ↑ D(A2) at K(t + 1) ↑
input write data on consecutive K and K rising edges.
Read Cycle:
Load address; wait one and a half cycle;
read data on consecutive C and C rising edges.
L-H
L
H
Q(A1) at C(t + 1)↑ Q(A2) at C(t + 2) ↑
NOP: No Operation
L-H
H
X
X
X
High-Z
High-Z
Standby: Clock Stopped
Stopped
Previous State
Previous State
Burst Address Table
(CY7C1318CV18, CY7C1320CV18)
First Address (External)
Second Address (Internal)
X..X0
X..X1
X..X1
X..X0
Write Cycle Descriptions
The write cycle description table for CY7C1318CV18 follows.
BWS
BWS
K
Comments
During the data portion of a write sequence :
Both bytes (D ) are written into the device.
K
0
1
L
L
L–H
–
[17:0]
L
L
L
H
H
L
–
L–H
–
L-H During the data portion of a write sequence :
Both bytes (D ) are written into the device.
[17:0]
–
During the data portion of a write sequence :
Only the lower byte (D ) is written into the device, D
remains unaltered.
remains unaltered.
remains unaltered.
remains unaltered.
[8:0]
[17:9]
L
L–H During the data portion of a write sequence :
Only the lower byte (D ) is written into the device, D
[8:0]
[17:9]
H
H
L–H
–
–
During the data portion of a write sequence :
Only the upper byte (D ) is written into the device, D
[17:9]
[8:0]
L
L–H During the data portion of a write sequence :
Only the upper byte (D ) is written into the device, D
[17:9]
[8:0]
H
H
H
H
L–H
–
–
No data is written into the devices during this portion of a write operation.
L–H No data is written into the devices during this portion of a write operation.
Notes
2. X = “Don’t Care,” H = Logic HIGH, L = Logic LOW, ↑ represents rising edge.
3. Device powers up deselected with the outputs in a tristate condition.
4. On CY7C1318CV18 and CY7C1320CV18, “A1” represents address location latched by the devices when transaction was initiated and “A2” represents the addresses
sequence in the burst.
5. “t” represents the cycle at which a read/write operation is started. t + 1 and t + 2 are the first and second clock cycles succeeding the “t” clock cycle.
6. Data inputs are registered at K and K rising edges. Data outputs are delivered on C and C rising edges, except when in single clock mode.
7. It is recommended that K = K and C = C = HIGH when clock is stopped. This is not essential, but permits most rapid restart by overcoming transmission line charging
symmetrically.
8. Is based on a write cycle that was initiated in accordance with the Write Cycle Descriptions table. BWS , BWS , BWS , and BWS can be altered on different portions
0
1
2
3
of a write cycle, as long as the setup and hold requirements are achieved.
Document Number: 001-07160 Rev. *F
Page 8 of 26
CY7C1318CV18
CY7C1320CV18
Write Cycle Descriptions
The write cycle description table for CY7C1320CV18 follows.
BWS
BWS
BWS
BWS
3
K
K
Comments
0
1
2
L
L
L
L
L–H
–
During the data portion of a write sequence, all four bytes (D
the device.
) are written into
) are written into
[35:0]
L
L
L
H
H
L
L
H
H
H
H
L
L
H
H
H
H
H
H
L
–
L–H
–
L–H During the data portion of a write sequence, all four bytes (D
the device.
[35:0]
–
During the data portion of a write sequence, only the lower byte (D
) is written
) is written
[8:0]
[8:0]
into the device. D
remains unaltered.
[35:9]
L
L–H During the data portion of a write sequence, only the lower byte (D
into the device. D remains unaltered.
[35:9]
H
H
H
H
H
H
L–H
–
–
During the data portion of a write sequence, only the byte (D
) is written into
) is written into
[17:9]
the device. D
and D
remains unaltered.
[8:0]
[35:18]
L
L–H During the data portion of a write sequence, only the byte (D
the device. D and D remains unaltered.
[17:9]
[8:0]
[35:18]
H
H
H
H
L–H
–
–
During the data portion of a write sequence, only the byte (D
) is written into
) is written into
) is written into
) is written into
[26:18]
[26:18]
[35:27]
[35:27]
the device. D
and D
remains unaltered.
[17:0]
[35:27]
L
L–H During the data portion of a write sequence, only the byte (D
the device. D and D remains unaltered.
[17:0]
[35:27]
H
H
L–H
–
–
During the data portion of a write sequence, only the byte (D
the device. D remains unaltered.
[26:0]
L
L–H During the data portion of a write sequence, only the byte (D
the device. D remains unaltered.
[26:0]
H
H
H
H
H
H
H
H
L–H
–
–
No data is written into the device during this portion of a write operation.
L–H No data is written into the device during this portion of a write operation.
Document Number: 001-07160 Rev. *F
Page 9 of 26
CY7C1318CV18
CY7C1320CV18
Instruction Register
IEEE 1149.1 Serial Boundary Scan (JTAG)
Three-bit instructions can be serially loaded into the instruction
register. This register is loaded when it is placed between the TDI
page 13. Upon power up, the instruction register is loaded with
the IDCODE instruction. It is also loaded with the IDCODE
instruction if the controller is placed in a reset state, as described
in the previous section.
These SRAMs incorporate a serial boundary scan Test Access
Port (TAP) in the FBGA package. This part is fully compliant with
IEEE Standard #1149.1-2001. The TAP operates using JEDEC
standard 1.8V I/O logic levels.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, TCK must be tied LOW
When the TAP controller is in the Capture-IR state, the two least
significant bits are loaded with a binary “01” pattern to allow for
fault isolation of the board level serial test path.
(V ) to prevent clocking of the device. TDI and TMS are inter-
SS
nally pulled up and may be unconnected. They may alternatively
be connected to V through a pull up resistor. TDO must be left
unconnected. Upon power up, the device comes up in a reset
state, which does not interfere with the operation of the device.
Bypass Register
DD
To save time when serially shifting data through registers, it is
sometimes advantageous to skip certain chips. The bypass
register is a single-bit register that can be placed between TDI
and TDO pins. This enables shifting of data through the SRAM
with minimal delay. The bypass register is set LOW (V ) when
the BYPASS instruction is executed.
Test Access Port—Test Clock
The test clock is used only with the TAP controller. All inputs are
captured on the rising edge of TCK. All outputs are driven from
the falling edge of TCK.
SS
Boundary Scan Register
Test Mode Select (TMS)
The boundary scan register is connected to all of the input and
output pins on the SRAM. Several No Connect (NC) pins are also
included in the scan register to reserve pins for higher density
devices.
The TMS input is used to give commands to the TAP controller
and is sampled on the rising edge of TCK. This pin may be left
unconnected if the TAP is not used. The pin is pulled up inter-
nally, resulting in a logic HIGH level.
The boundary scan register is loaded with the contents of the
RAM input and output ring when the TAP controller is in the
Capture-DR state and is then placed between the TDI and TDO
pins when the controller is moved to the Shift-DR state. The
EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions can
be used to capture the contents of the input and output ring.
Test Data-In (TDI)
The TDI pin is used to serially input information into the registers
and can be connected to the input of any of the registers. The
register between TDI and TDO is chosen by the instruction that
is loaded into the TAP instruction register. For information on
loading the instruction register, see the TAP Controller State
unconnected if the TAP is unused in an application. TDI is
connected to the most significant bit (MSB) on any register.
the bits are connected. Each bit corresponds to one of the bumps
on the SRAM package. The MSB of the register is connected to
TDI, and the LSB is connected to TDO.
Identification (ID) Register
Test Data-Out (TDO)
The ID register is loaded with a vendor-specific, 32-bit code
during the Capture-DR state when the IDCODE command is
loaded in the instruction register. The IDCODE is hardwired into
the SRAM and can be shifted out when the TAP controller is in
the Shift-DR state. The ID register has a vendor code and other
The TDO output pin is used to serially clock data out from the
registers. The output is active, depending upon the current state
The output changes on the falling edge of TCK. TDO is
connected to the least significant bit (LSB) of any register.
Performing a TAP Reset
A Reset is performed by forcing TMS HIGH (V ) for five rising
TAP Instruction Set
DD
edges of TCK. This Reset does not affect the operation of the
SRAM and can be performed while the SRAM is operating. At
power up, the TAP is reset internally to ensure that TDO comes
up in a high-Z state.
Eight different instructions are possible with the three-bit
instruction register. All combinations are listed in Instruction
RESERVED and must not be used. The other five instructions
are described in detail below.
TAP Registers
Instructions are loaded into the TAP controller during the Shift-IR
state when the instruction register is placed between TDI and
TDO. During this state, instructions are shifted through the
instruction register through the TDI and TDO pins. To execute
the instruction once it is shifted in, the TAP controller must be
moved into the Update-IR state.
Registers are connected between the TDI and TDO pins to scan
the data in and out of the SRAM test circuitry. Only one register
can be selected at a time through the instruction registers. Data
is serially loaded into the TDI pin on the rising edge of TCK. Data
is output on the TDO pin on the falling edge of TCK.
Document Number: 001-07160 Rev. *F
Page 10 of 26
CY7C1318CV18
CY7C1320CV18
IDCODE
PRELOAD places an initial data pattern at the latched parallel
outputs of the boundary scan register cells before the selection
of another boundary scan test operation.
The IDCODE instruction loads a vendor-specific, 32-bit code into
the instruction register. It also places the instruction register
between the TDI and TDO pins and shifts the IDCODE out of the
device when the TAP controller enters the Shift-DR state. The
IDCODE instruction is loaded into the instruction register at
power up or whenever the TAP controller is supplied a
Test-Logic-Reset state.
The shifting of data for the SAMPLE and PRELOAD phases can
occur concurrently when required, that is, while the data
captured is shifted out, the preloaded data can be shifted in.
BYPASS
When the BYPASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO pins. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.
SAMPLE Z
The SAMPLE Z instruction connects the boundary scan register
between the TDI and TDO pins when the TAP controller is in a
Shift-DR state. The SAMPLE Z command puts the output bus
into a High-Z state until the next command is supplied during the
Update IR state.
EXTEST
The EXTEST instruction drives the preloaded data out through
the system output pins. This instruction also connects the
boundary scan register for serial access between the TDI and
TDO in the Shift-DR controller state.
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When
the SAMPLE/PRELOAD instructions are loaded into the
instruction register and the TAP controller is in the Capture-DR
state, a snapshot of data on the input and output pins is captured
in the boundary scan register.
EXTEST OUTPUT BUS TRISTATE
IEEE Standard 1149.1 mandates that the TAP controller be able
to put the output bus into a tristate mode.
The user must be aware that the TAP controller clock can only
operate at a frequency up to 20 MHz, while the SRAM clock
operates more than an order of magnitude faster. Because there
is a large difference in the clock frequencies, it is possible that
during the Capture-DR state, an input or output undergoes a
transition. The TAP may then try to capture a signal while in
transition (metastable state). This does not harm the device, but
there is no guarantee as to the value that is captured.
Repeatable results may not be possible.
The boundary scan register has a special bit located at bit #47.
When this scan cell, called the “extest output bus tristate,” is
latched into the preload register during the Update-DR state in
the TAP controller, it directly controls the state of the output
(Q-bus) pins, when the EXTEST is entered as the current
instruction. When HIGH, it enables the output buffers to drive the
output bus. When LOW, this bit places the output bus into a
High-Z condition.
To guarantee that the boundary scan register captures the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the TAP controller's capture setup plus hold
times (t and t ). The SRAM clock input might not be captured
correctly if there is no way in a design to stop (or slow) the clock
during a SAMPLE/PRELOAD instruction. If this is an issue, it is
still possible to capture all other signals and simply ignore the
value of the CK and CK captured in the boundary scan register.
This bit can be set by entering the SAMPLE/PRELOAD or
EXTEST command, and then shifting the desired bit into that cell,
during the Shift-DR state. During Update-DR, the value loaded
into that shift-register cell latches into the preload register. When
the EXTEST instruction is entered, this bit directly controls the
output Q-bus pins. Note that this bit is pre-set HIGH to enable
the output when the device is powered up, and also when the
TAP controller is in the Test-Logic-Reset state.
CS
CH
Once the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
Document Number: 001-07160 Rev. *F
Page 11 of 26
CY7C1318CV18
CY7C1320CV18
TAP Controller State Diagram
The state diagram for the TAP controller follows.
TEST-LOGIC
1
RESET
0
1
1
1
SELECT
TEST-LOGIC/
SELECT
0
IR-SCAN
IDLE
DR-SCAN
0
0
1
1
CAPTURE-DR
0
CAPTURE-IR
0
0
0
SHIFT-DR
1
SHIFT-IR
1
1
0
1
EXIT1-DR
0
EXIT1-IR
0
0
PAUSE-DR
1
PAUSE-IR
1
0
0
EXIT2-DR
1
EXIT2-IR
1
UPDATE-IR
0
UPDATE-DR
1
1
0
Note
9. The 0/1 next to each state represents the value at TMS at the rising edge of TCK.
Document Number: 001-07160 Rev. *F
Page 12 of 26
CY7C1318CV18
CY7C1320CV18
TAP Controller Block Diagram
0
Bypass Register
2
1
1
1
0
0
0
Selection
TDI
Selection
TDO
Instruction Register
Circuitry
Circuitry
31 30
29
.
.
2
Identification Register
.
106
.
.
.
2
Boundary Scan Register
TCK
TMS
TAP Controller
TAP Electrical Characteristics
Over the Operating Range
Parameter
Description
Output HIGH Voltage
Test Conditions
= −2.0 mA
Min
1.4
1.6
Max
Unit
V
V
V
V
V
V
I
I
I
I
I
V
V
OH1
OH2
OL1
OL2
IH
OH
OH
OL
OL
Output HIGH Voltage
Output LOW Voltage
Output LOW Voltage
Input HIGH Voltage
= −100 μA
= 2.0 mA
0.4
0.2
V
= 100 μA
V
0.65V
V
+ 0.3
V
DD
DD
Input LOW Voltage
–0.3
–5
0.35V
5
V
IL
DD
Input and Output Load Current
GND ≤ V ≤ V
DD
μA
X
I
Notes
10. These characteristics pertain to the TAP inputs (TMS, TCK, TDI and TDO). Parallel load levels are specified in the Electrical Characteristics Table.
11. Overshoot: V (AC) < V + 0.85V (Pulse width less than t /2).
/2), Undershoot: V (AC) > −1.5V (Pulse width less than t
IH
DDQ
CYC
IL
CYC
12. All Voltage referenced to Ground.
Document Number: 001-07160 Rev. *F
Page 13 of 26
CY7C1318CV18
CY7C1320CV18
TAP AC Switching Characteristics
Over the Operating Range
Parameter
Description
Min
Max
Unit
ns
t
t
t
t
TCK Clock Cycle Time
TCK Clock Frequency
TCK Clock HIGH
50
TCYC
TF
20
MHz
ns
20
20
TH
TCK Clock LOW
ns
TL
Setup Times
t
t
t
TMS Setup to TCK Clock Rise
TDI Setup to TCK Clock Rise
Capture Setup to TCK Rise
5
5
5
ns
ns
ns
TMSS
TDIS
CS
Hold Times
t
t
t
TMS Hold after TCK Clock Rise
TDI Hold after Clock Rise
5
5
5
ns
ns
ns
TMSH
TDIH
CH
Capture Hold after Clock Rise
Output Times
t
t
TCK Clock LOW to TDO Valid
TCK Clock LOW to TDO Invalid
10
ns
ns
TDOV
TDOX
0
TAP Timing and Test Conditions
Figure 2 shows the TAP timing and test conditions.
Figure 2. TAP Timing and Test Conditions
0.9V
ALL INPUT PULSES
1.8V
50Ω
0.9V
TDO
0V
Z = 50
Ω
0
C = 20 pF
L
t
TL
t
TH
GND
(a)
Test Clock
TCK
t
TCYC
t
TMSH
t
TMSS
Test Mode Select
TMS
t
TDIS
t
TDIH
Test Data In
TDI
Test Data Out
TDO
t
TDOV
t
TDOX
Notes
13. t and t refer to the setup and hold time requirements of latching data from the boundary scan register.
CS
CH
14. Test conditions are specified using the load in TAP AC Test Conditions. t /t = 1 ns.
R
F
Document Number: 001-07160 Rev. *F
Page 14 of 26
CY7C1318CV18
CY7C1320CV18
Identification Register Definitions
Value
Instruction Field
Description
CY7C1318CV18
CY7C1320CV18
000
Revision Number (31:29)
Cypress Device ID (28:12)
Cypress JEDEC ID (11:1)
000
Version number.
11010100010010101
00000110100
11010100010100101
00000110100
Defines the type of SRAM.
Allows unique identification of
SRAM vendor.
ID Register Presence (0)
1
1
Indicates the presence of an
ID register.
Scan Register Sizes
Register Name
Bit Size
Instruction
Bypass
3
1
ID
32
107
Boundary Scan
Instruction Codes
Instruction
EXTEST
Code
000
Description
Captures the input and output ring contents.
IDCODE
001
Loads the ID register with the vendor ID code and places the register between TDI and TDO.
This operation does not affect SRAM operation.
SAMPLE Z
010
Captures the input and output contents. Places the boundary scan register between TDI and
TDO. Forces all SRAM output drivers to a High-Z state.
RESERVED
011
100
Do Not Use: This instruction is reserved for future use.
SAMPLE/PRELOAD
Captures the input and output ring contents. Places the boundary scan register between TDI
and TDO. Does not affect the SRAM operation.
RESERVED
RESERVED
BYPASS
101
110
111
Do Not Use: This instruction is reserved for future use.
Do Not Use: This instruction is reserved for future use.
Places the bypass register between TDI and TDO. This operation does not affect SRAM
operation.
Document Number: 001-07160 Rev. *F
Page 15 of 26
CY7C1318CV18
CY7C1320CV18
Boundary Scan Order
Bit #
0
Bump ID
6R
Bit #
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
Bump ID
10G
9G
Bit #
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
Bump ID
6A
5B
5A
4A
5C
4B
3A
1H
1A
2B
3B
1C
1B
3D
3C
1D
2C
3E
2D
2E
1E
2F
Bit #
84
Bump ID
2J
1
6P
85
3K
2
6N
11F
11G
9F
86
3J
3
7P
87
2K
4
7N
88
1K
5
7R
10F
11E
10E
10D
9E
89
2L
6
8R
90
3L
7
8P
91
1M
1L
8
9R
92
9
11P
10P
10N
9P
93
3N
3M
1N
2M
3P
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
10C
11D
9C
94
95
96
10M
11N
9M
9D
97
11B
11C
9B
98
2N
2P
99
9N
100
101
102
103
104
105
106
1P
11L
11M
9L
10B
11A
Internal
9A
3R
4R
4P
10L
11K
10K
9J
5P
8B
5N
5R
7C
3F
6C
1G
1F
9K
8A
10J
11J
11H
7A
3G
2G
1J
7B
6B
Document Number: 001-07160 Rev. *F
Page 16 of 26
CY7C1318CV18
CY7C1320CV18
DLL Constraints
Power Up Sequence in DDR II SRAM
■ DLL uses K clock as its synchronizing input. The input must
have low phase jitter, which is specified as t
DDR II SRAMs must be powered up and initialized in a
predefined manner to prevent undefined operations.
.
KC Var
■ The DLL functions at frequencies down to 120 MHz.
Power Up Sequence
■ If the input clock is unstable and the DLL is enabled, then the
DLL may lock onto an incorrect frequency, causing unstable
SRAM behavior. To avoid this, provide1024 cycles stable clock
to relock to the desired clock frequency.
■ Apply power and drive DOFF either HIGH or LOW (all other
inputs can be HIGH or LOW).
❐ Apply V before V
.
DD
DDQ
❐ Apply V
before V
or at the same time as V
.
DDQ
REF
REF
❐ Drive DOFF HIGH.
■ Provide stable DOFF (HIGH), power, and clock (K, K) for 1024
cycles to lock the DLL.
Figure 3. Power Up Waveforms
K
K
Unstable Clock
> 1024 Stable clock
Stable)
DDQ
Start Normal
Operation
/
V
Clock Start (Clock Starts after V
DD
Stable (< +/- 0.1V DC per 50ns )
/
/
V
VDDQ
V
VDD
DD
DDQ
Fix High (or tie to V
)
DDQ
DOFF
Document Number: 001-07160 Rev. *F
Page 17 of 26
CY7C1318CV18
CY7C1320CV18
Maximum Ratings
Neutron Soft Error Immunity
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Test
Conditions
Parameter Description
Typ Max* Unit
LSBU
LMBU
SEL
Logical
Single-Bit
Upsets
25°C
25°C
85°C
320
368
0.01
0.1
FIT/
Mb
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with Power Applied.. –55°C to +125°C
Supply Voltage on V Relative to GND........–0.5V to +2.9V
DD
Logical
Multi-Bit
Upsets
0
FIT/
Mb
Supply Voltage on V
Relative to GND.......–0.5V to +V
DD
DDQ
DC Applied to Outputs in High-Z .........–0.5V to V
+ 0.3V
DDQ
Single Event
Latch up
0
FIT/
Dev
DC Input Voltage ............................... –0.5V to V + 0.3V
DD
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage (MIL-STD-883, M 3015).... >2001V
Latch up Current..................................................... >200 mA
* No LMBU or SEL events occurred during testing; this column represents a
2
statistical χ , 95% confidence limit calculation. For more details refer to Appli-
cation Note AN 54908 “Accelerated Neutron SER Testing and Calculation of
Terrestrial Failure Rates”
Operating Range
Ambient
Range
Commercial
Industrial
Temperature (T )
V
V
DDQ
A
DD
0°C to +70°C
1.8 ± 0.1V
1.4V to
V
DD
–40°C to +85°C
Electrical Characteristics
DC Electrical Characteristics
Over the Operating Range
Parameter
Description
Power Supply Voltage
I/O Supply Voltage
Test Conditions
Min
1.7
1.4
Typ
1.8
1.5
Max
Unit
V
V
1.9
DD
V
V
V
V
V
V
V
I
V
V
DDQ
OH
DD
Output HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Note 16
Note 17
V
V
/2 – 0.12
/2 – 0.12
– 0.2
V
V
/2 + 0.12
/2 + 0.12
V
DDQ
DDQ
V
OL
DDQ
DDQ
I
I
= −0.1 mA, Nominal Impedance
= 0.1 mA, Nominal Impedance
V
V
V
OH(LOW)
OL(LOW)
IH
OH
OL
DDQ
DDQ
V
0.2
V
SS
V
+ 0.1
V
+ 0.3
V
REF
DDQ
–0.3
V
– 0.1
V
IL
REF
Input Leakage Current
Output Leakage Current
Input Reference Voltage
GND ≤ V ≤ V
−5
−5
0.68
5
μA
μA
V
X
I
DDQ
I
GND ≤ V ≤ V
Output Disabled
5
OZ
I
DDQ,
V
Typical Value = 0.75V
0.75
0.95
805
855
730
775
600
635
510
540
REF
I
V
Operating Supply
V
= Max,
267 MHz (x18)
(x36)
mA
DD
DD
DD
I
= 0 mA,
OUT
f = f
= 1/t
MAX
CYC
250 MHz (x18)
(x36)
200 MHz (x18)
(x36)
167 MHz (x18)
(x36)
Notes
15. Power up: assumes a linear ramp from 0V to V (min) within 200 ms. During this time V < V and V
< V
DD
.
DD
IH
DD
DDQ
16. Outputs are impedance controlled. I = –(V
/2)/(RQ/5) for values of 175Ω < RQ < 350Ω.
OH
DDQ
17. Outputs are impedance controlled. I = (V
/2)/(RQ/5) for values of 175Ω < RQ < 350Ω.
OL
DDQ
18. V
(min) = 0.68V or 0.46V
, whichever is larger, V
(max) = 0.95V or 0.54V
, whichever is smaller.
REF
DDQ
REF
DDQ
19. The operation current is calculated with 50% read cycle and 50% write cycle.
Document Number: 001-07160 Rev. *F
Page 18 of 26
CY7C1318CV18
CY7C1320CV18
Electrical Characteristics (continued)
DC Electrical Characteristics
[12]
Over the Operating Range
Parameter
Description
Test Conditions
Min
Typ
Max
315
330
300
320
290
300
285
295
Unit
I
Automatic Power Down
Current
Max V
,
267 MHz (x18)
(x36)
mA
SB1
DD
Both Ports Deselected,
V
≥ V or V ≤ V
IN
IH
IN
IL
250 MHz (x18)
(x36)
f = f
= 1/t
,
MAX
CYC
Inputs Static
200 MHz (x18)
(x36)
167 MHz (x18)
(x36)
AC Electrical Characteristics
Over the Operating Range
Parameter
Description
Input HIGH Voltage
Input LOW Voltage
Test Conditions
Min
+ 0.2
REF
Typ
–
Max
Unit
V
V
V
–
IH
IL
V
–
–
V
– 0.2
V
REF
Capacitance
Tested initially and after any design or process change that may affect these parameters.
Parameter
Description
Input Capacitance
Test Conditions
Max
Unit
C
T = 25°C, f = 1 MHz, V = 1.8V, V = 1.5V
DDQ
5
6
7
pF
pF
pF
IN
A
DD
C
C
Clock Input Capacitance
Output Capacitance
CLK
O
Thermal Resistance
Tested initially and after any design or process change that may affect these parameters.
165 FBGA
Package
Parameter
Description
Test Conditions
Unit
Θ
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
18.7
°C/W
°C/W
JA
Θ
Thermal Resistance
(Junction to Case)
4.5
JC
Figure 4. AC Test Loads and Waveforms
VREF = 0.75V
0.75V
VREF
VREF
0.75V
R = 50
Ω
OUTPUT
ALL INPUT PULSES
1.25V
Z = 50
Ω
0
OUTPUT
Device
Under
Test
R = 50
Ω
L
0.75V
Device
Under
0.25V
5 pF
VREF = 0.75V
Slew Rate = 2 V/ns
ZQ
Test
ZQ
RQ =
RQ =
250Ω
250Ω
INCLUDING
JIG AND
SCOPE
(a)
(b)
Note
20. Unless otherwise noted, test conditions assume signal transition time of 2V/ns, timing reference levels of 0.75V, V
= 0.75V, RQ = 250Ω, V
= 1.5V, input pulse
REF
DDQ
levels of 0.25V to 1.25V, and output loading of the specified I /I and load capacitance shown in (a) of AC Test Loads and Waveforms.
OL OH
Document Number: 001-07160 Rev. *F
Page 19 of 26
CY7C1318CV18
CY7C1320CV18
Switching Characteristics
Over the Operating Range
267 MHz
250 MHz
200 MHz
167 MHz
Cypress Consortium
Parameter Parameter
Description
(Typical) to the First Access
DD
Unit
Min Max Min Max Min Max Min Max
t
t
t
t
t
V
1
–
1
–
1
–
1
–
ms
ns
ns
ns
ns
POWER
CYC
KH
t
t
t
t
K Clock and C Clock Cycle Time
Input Clock (K/K and C/C) HIGH
Input Clock (K/K and C/C) LOW
3.75 8.4 4.0 8.4 5.0 8.4 6.0 8.4
KHKH
KHKL
KLKH
KHKH
1.5
1.5
–
–
–
1.6
1.6
1.8
–
–
–
2.0
2.0
2.2
–
–
–
2.4
2.4
2.7
–
–
–
KL
K Clock Rise to K Clock Rise and C to C Rise
(rising edge to rising edge)
1.68
KHKH
t
t
K/K Clock Rise toC/C Clock Rise
(rising edge to rising edge)
0.00 1.68 0.00 1.8 0.00 2.2 0.00 2.7
ns
KHCH
KHCH
Setup Times
t
t
t
t
t
t
Address Setup to K Clock Rise
0.3
0.3
–
–
–
0.5
0.5
–
–
–
0.6
0.6
0.4
–
–
–
0.7
0.7
0.5
–
–
–
ns
ns
ns
SA
AVKH
IVKH
IVKH
Control Setup to K Clock Rise (LD, R/W)
SC
Double Data Rate Control Setup to Clock (K/K) 0.3
Rise (BWS , BWS , BWS , BWS )
0.35
SCDDR
0
1
2
3
t
t
D Setup to Clock (K and K) Rise
[X:0]
0.3
–
0.35
–
0.4
–
0.5
–
ns
SD
DVKH
Hold Times
t
t
t
t
t
t
Address Hold after K Clock Rise
0.3
0.3
–
–
–
0.5
0.5
–
–
–
0.6
0.6
0.4
–
–
–
0.7
0.7
0.5
–
–
–
ns
ns
ns
HA
KHAX
KHIX
KHIX
Control Hold after K Clock Rise (LD, R/W)
HC
Double Data Rate Control Hold after Clock (K/K) 0.3
Rise (BWS , BWS , BWS , BWS )
0.35
HCDDR
0
1
2
3
t
t
D Hold after Clock (K/K) Rise
[X:0]
0.3
–
0.35
–
0.4
–
0.5
–
ns
HD
KHDX
Notes
21. When a part with a maximum frequency above 167 MHz is operating at a lower clock frequency, it requires the input timings of the frequency range in which it is being
operated and outputs data with the output timings of that frequency range.
22. This part has an internal voltage regulator; t
is the time that the power is supplied above V minimum initially before a read or write operation can be initiated.
DD
POWER
Document Number: 001-07160 Rev. *F
Page 20 of 26
CY7C1318CV18
CY7C1320CV18
Switching Characteristics (continued)
[20, 21]
Over the Operating Range
267 MHz
250 MHz
200 MHz
167 MHz
Cypress Consortium
Parameter Parameter
Description
Unit
Min Max Min Max Min Max Min Max
Output Times
t
t
t
t
C/C Clock Rise (or K/K in single clock mode) to
Data Valid
–
0.45
–
–
0.45
–
–
0.45
–
–
0.50 ns
ns
CO
CHQV
CHQX
Data Output Hold after Output C/C Clock Rise –0.45
(Active to Active)
–0.45
–0.45
–0.50
–
DOH
t
t
t
t
t
t
t
t
t
t
t
t
C/C Clock Rise to Echo Clock Valid
Echo Clock Hold after C/C Clock Rise
Echo Clock High to Data Valid
–
0.45
–
–
0.45
–
–
0.45
–
–
0.50 ns
ns
0.40 ns
CCQO
CQOH
CQD
CHCQV
CHCQX
CQHQV
CQHQX
CQHCQL
CQHCQH
–0.45
–
–0.45
–
–0.45
–
–0.50
–
–
0.27
–
0.30
–
0.35
–
Echo Clock High to Data Invalid
–0.27
1.43
1.43
–0.30
1.55
1.55
–0.35
1.95
1.95
–0.40
2.45
2.45
–
–
–
ns
ns
ns
CQDOH
CQH
Output Clock (CQ/CQ) HIGH
–
–
–
CQ Clock Rise to CQ Clock Rise
–
–
–
CQHCQH
(rising edge to rising edge)
t
t
t
Clock (C/C) Rise to High-Z
(Active to High-Z)
–
0.45
–
–
0.45
–
–
0.45
–
–
0.50 ns
ns
CHZ
CHQZ
t
Clock (C/C) Rise to Low-Z
–0.45
–0.45
–0.45
–0.50
–
CLZ
CHQX1
DLL Timing
t
t
t
t
t
t
Clock Phase Jitter
–
0.20
–
–
0.20
–
–
0.20
–
–
0.20 ns
KC Var
KC Var
DLL Lock Time (K, C)
K Static to DLL Reset
1024
30
1024
30
1024
30
1024
30
–
–
Cycles
ns
KC lock
KC Reset
KC lock
KC Reset
–
–
–
Notes
23. These parameters are extrapolated from the input timing parameters (t
- 250 ps, where 250 ps is the internal jitter. An input jitter of 200 ps (t
) is already
KHKH
KC Var
included in the t
). These parameters are only guaranteed by design and are not tested in production.
KHKH
24. t
, t
are specified with a load capacitance of 5 pF as in (b) of AC Test Loads and Waveforms. Transition is measured ±100 mV from steady-state voltage.
CHZ CLZ
25. At any voltage and temperature t
is less than t
and t
less than t
.
CHZ
CLZ
CHZ
CO
Document Number: 001-07160 Rev. *F
Page 21 of 26
CY7C1318CV18
CY7C1320CV18
Switching Waveforms
Figure 5. Read/Write/Deselect Sequence
READ
2
READ
3
NOP
4
NOP
5
WRITE
6
WRITE
7
READ
8
NOP
1
9
10
K
t
t
t
t
KHKH
KH
KL
CYC
K
LD
t
t
SC
HC
R/W
A
A0
A2
A3
A4
A1
t
HD
t
t
t
HD
SA
HA
t
t
SD
SD
DQ
Q00 Q01 Q10 Q11
D21 D30
Q40 Q41
D20
D31
t
CQDOH
t
t
KHCH
CLZ
t
t
CHZ
DOH
t
CO
t
CQD
C
t
t
t
t
t
KHKH
KHCH
KH
KL
CYC
C#
t
CCQO
t
CQOH
CQ
CQ#
t
t
CQH
t
CQHCQH
CCQO
t
CQOH
DON’T CARE
UNDEFINED
Notes
26. Q00 refers to output from address A0. Q01 refers to output from the next internal burst address following A0, that is, A0 + 1.
27. Outputs are disabled (High-Z) one clock cycle after a NOP.
28. In this example, if address A4 = A3, then data Q40 = D30 and Q41 = D31. Write data is forwarded immediately as read results. This note applies to the whole diagram.
Document Number: 001-07160 Rev. *F
Page 22 of 26
CY7C1318CV18
CY7C1320CV18
Ordering Information
The table below contains only the parts that are currently available. If you don’t see what you are looking for, please contact your local
sales representative. For more information, visit the Cypress website at www.cypress.com and refer to the product summary page at
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives and distributors. To find the office
closest to you, visit us at http://www.cypress.com/go/datasheet/offices
Table 1. Ordering Information
Speed
(MHz)
Package
Diagram
Operating
Range
Ordering Code
Package Type
267 CY7C1318CV18-267BZXC
CY7C1320CV18-267BZXC
250 CY7C1318CV18-250BZC
CY7C1320CV18-250BZC
51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free Commercial
51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm)
Commercial
Commercial
CY7C1318CV18-250BZXC
CY7C1320CV18-250BZXC
200 CY7C1320CV18-200BZC
CY7C1318CV18-200BZXC
CY7C1318CV18-200BZI
51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm)
51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm) Pb-Free
51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm)
51-85180 165-Ball Fine Pitch Ball Grid Array (13 x 15 x 1.4 mm)
Industrial
167 CY7C1318CV18-167BZC
CY7C1320CV18-167BZC
Commercial
Document Number: 001-07160 Rev. *F
Page 23 of 26
CY7C1318CV18
CY7C1320CV18
Package Diagram
Figure 6. 165-Ball FBGA (13 x 15 x 1.4 mm), 51-85180
TOP VIEW
BOTTOM VIEW
PIN 1 CORNER
PIN 1 CORNER
Ø0.08 M C
1
2
3
4
5
6
7
8
9
10
11
Ø0.25 M C A B
A
B
-0.06
+0.14
Ø0.50 (165X)
11 10
9
8
7
6
5
4
3
2
1
C
D
A
B
E
C
D
F
G
E
H
J
F
G
K
H
J
L
M
K
N
P
R
L
M
N
P
R
A
A
1.00
5.00
B
13.00 0.10
10.00
13.00 0.10
B
0.15(4X)
NOTES :
SOLDER PAD TYPE : NON-SOLDER MASK DEFINED (NSMD)
PACKAGE WEIGHT : 0.475g
JEDEC REFERENCE : MO-216 / ISSUE E
PACKAGE CODE : BB0AC
SEATING PLANE
C
51-85180-*B
Document Number: 001-07160 Rev. *F
Page 24 of 26
CY7C1318CV18
CY7C1320CV18
Document History Page
Document Title: CY7C1318CV18/CY7C1320CV18, 18-Mbit DDR II SRAM 2-Word Burst Architecture
Document Number: 001-07160
Submission
Date
Orig. of
Change
Rev. ECN No.
Description of Change
**
433284
462615
See ECN
See ECN
NXR
NXR
New data sheet
*A
Changed t and t from 40 ns to 20 ns, changed t
, t
, t , t
, t
, t
TH
TL
TMSS TDIS CS TMSH TDIH CH
from 10 ns to 5 ns and changed t
Characteristics table
from 20 ns to 10 ns in TAP AC Switching
TDOV
Modified Power-Up waveform
*B
503690
See ECN
See ECN
VKN
Minor change: Moved data sheet to web
*C 1523383
VKN/AESA Converted from preliminary to final
Updated Logic Block diagram
Removed 300 MHz and 278 MHz speed bins
Added 267 MHz speed bin
Updated I /I specs
DD SB
Changed DLL minimum operating frequency from 80MHz to 120MHz
Changed t
max spec to 8.4ns
CYC
Modified footnotes 20 and 28
*D 2507747
*E 2518624
See ECN
See ECN
VKN/PYRS Changed Ambient Temperature with Power Applied from “–10°C to +85°C” to “–55°C
to +125°C” in the “Maximum Ratings“ on page 20
Updated power up sequence waveform and its description
Added footnote #19 related to I
DD
Changed Θ spec from 28.51 to 18.7; Changed Θ spec from 5.91 to 4.5
JA
JC
NXR/PYRS Changed JTAG ID (31:29) from 001 to 000
*F
2755838 08/25/2009
VKN/AESA Removed x8 and x9 part number details
Included Soft Error Immunity Data
Modified Ordering Information table by including parts that are available and modified
the disclaimer for the Ordering information.
Document Number: 001-07160 Rev. *F
Page 25 of 26
CY7C1318CV18
CY7C1320CV18
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at cypress.com/sales.
Products
PSoC
psoc.cypress.com
clocks.cypress.com
wireless.cypress.com
memory.cypress.com
image.cypress.com
Clocks & Buffers
Wireless
Memories
Image Sensors
© Cypress Semiconductor Corporation, 2006-2009. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used
for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use
as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support
systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 001-07160 Rev. *F
Revised August 24, 2009
Page 26 of 26
QDR RAMs and Quad Data Rate RAMs comprise a new family of products developed by Cypress, IDT, NEC, Renesas, and Samsung. All product and company names mentioned in this document
are the trademarks of their respective holders.
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