Cypress CY7C0430BV User Manual

CY7C0430BV

CY7C0430CV

10 Gb/s 3.3V QuadPort™ DSE Family

• DualChip Enables on all ports for easydepth expansion

• Separate upper-byte and lower-byte controls on all

ports

Features

• QuadPort™ datapath switching element (DSE) family

allows four independent ports of access for data path

management and switching

• Simple array partitioning

— Internal mask register controls counter wrap-around

— Counter-Interrupt flags to indicate wrap-around

— Counter and mask registers readback on address

• High-bandwidth data throughput up to 10 Gb/s

[1]

• 133-MHz port speed x 18-bit-wide interface × 4 ports

• High-speed clock to data access 4.2 ns (max.)

• Synchronous pipelined device

• 272-ball BGA package (27-mm × 27-mm × 1.27-mm ball

pitch)

— 1-Mb (64K × 18) switch array

• Commercial and industrial temperature ranges

• 3.3V low operating power

• 0.25-micron CMOS for optimum speed/power

• IEEE 1149.1 JTAG boundary scan

• Width and depth expansion capabilities

• BIST (Built-In Self-Test) controller

— Active = 750 mA (maximum)

— Standby = 15 mA (maximum

QuadPort DSE Family Applications

PORT 1

PORT 3

PORT 4

PORT 2

BUFFERED SWITCH

PORT 2

PORT 3

PORT 4

PORT 1

REDUNDANT DATA MIRROR

Note:

1. f

for commercial is 135 MHz and for industrial is 133 MHz.

MAX2

Cypress Semiconductor Corporation

Document #: 38-06027 Rev. *B

•

198 Champion Court

•

San Jose, CA 95134-1709

•

408-943-2600

Revised May 23, 2006

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CY7C0430BV

CY7C0430CV

counter is loaded with an external address when the port’s

Counter Load pin (CNTLD) is asserted LOW. When the port’s

Counter Increment pin (CNTINC) is asserted, the address

counter will increment on each subsequent LOW-to- HIGH

transition of that port’s clock signal. This will read/write one

word from/into each successive address location until

CNTINC is deasserted. The counter can address the entire

switch array and will loop back to the start. Counter Reset

(CNTRST) is used to reset the burst counter. A counter-mask

mask register operations are described in more details in the

following sections.

The counter or mask register values can be read back on the

bidirectional address lines by activating MKRD or CNTRD,

respectively.

The new features included for the QuadPort DSE family

include: readback of burst-counter internal address value on

address lines, counter-mask registers to control the counter

wrap-around, readback of mask register value on address

lines, interrupt flags for message passing, BIST, JTAG for

boundary scan, and asynchronous Master Reset.

Top Level Logic Block Diagram

[2]

Port 1 Operation-control Logic Blocks

Reset

MRST

Logic

R/W

Port-1

Control

Logic

TMS

JTAG

TCK

Controller

TDO

TDI

0P1

1P1

CLKBIST

BIST

CLK

Port 1

I/O

I/O - I/O

0P1

17P1

[3]

Port 4 Logic Blocks

CLK

–A

0P1

15P1

Port 1

64K × 18

Port 4

Port 1

Counter/

Mask Reg/

Address

Decode

MKLD

CNTLD

CNTINC

CNTRD

QuadPort DSE

Array

MKRD

CNTRST

INT

CNTINT

Port 2

Port 3

[3]

Port 2 Logic Blocks

Port 3 Logic Blocks

Notes:

2. Port 1 Control Logic Block is detailed on page 4.

3. Port 2, Port 3, and Port 4 Logic Blocks are similar to Port 1 Logic Blocks.

Document #: 38-06027 Rev. *B

Page 3 of 37

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Port 1 Operation-Control Logic Block Diagram

(Address Readback is independent of CEs)

R/W

0P1

1P1

I/O –I/O

9P1

17P1

Port-1

I/O

Control

I/O –I/O

0P1

8P1

Addr.

Read

Port 1

Readback

MRST

–A

0P1

15P1

Port 1

Mask Register

CNTRD

Port 1

Priority

64K × 18

QuadPort

DSE Array

MKRD

MKLD

Address

Decode

Decision

Logic

Port 1

Counter/

Address

CNTINC

CNTLD

CNTRST

CLK

Port 1

Interrupt

Logic

R/W

MRST

CNTINT

0P1

1P1

INT

CLK

MRST

Document #: 38-06027 Rev. *B

Page 4 of 37

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CY7C0430CV

Pin Configuration

272-ball Grid Array (BGA)

Top View

I/O17

I/O15

I/O13

I/O11

I/O9

I/O16

I/O14

I/O12

I/O10

I/O12

I/O14

I/O16

I/O9

I/O11

I/O13

I/O15

I/O17

VDD1

I/O16

I/O14

I/O12

I/O10

I/O17

I/O13

I/O11

TMS

TCK

VSS

TDI

TDO

VSS

I/O11

I/O13

I/O17

I/O10

I/O12

I/O14

I/O16

VDD1

A14

A15

CE1

CE0

R/W

I/O15

VSS2

VDD2

I/O9

VSS2

VDD2

VSS2

I/O15

R/W

CE0

CE1

A15

A14

VSS1

A12

A13

VDD2

VSS2

VDD

VSS2

VDD2

A13

A12

VSS1

A10

A11

MKRD

CNTRD

CNTRD MKRD

A11

A10

CNTINT

VSS1

CNTINC

VSS1

MKLD

CNTLD

MKLD

VDD1

VDD

GND^[4]

VDD

VDD1

INT

CNTRST

CLK

CNTRST

INT

CNTRST

VSS

CNTRST

INT

VDD1

CLK

VDD1

MKLD

CNTLD

MKLD

VSS1

CNTINC

VSS1

CNTINT

A10

A11

MKRD

CNTRD

CNTRD MKRD

A11

A10

VSS1

A12

A13

VDD2

VSS2

VDD2

VSS2

VDD

VSS

VDD

VDD2

VSS2

VDD2

A13

A12

VSS1

A14

A15

CE1

CE0

R/W

I/O6

I/O0

I/O6

R/W

CE0

CE1

A15

A14

VDD1

I/O7

I/O5

I/O3

I/O1

I/O8

I/O4

I/O2

MRST CLKBIST

I/O2

I/O4

I/O8

I/O1

I/O3

I/O5

I/O7

VDD1

I/O8

I/O6

I/O4

I/O2

I/O0

1/O7

I/O5

I/O3

I/O1

I/O3

I/O5

I/O7

I/O0

I/O2

I/O4

I/O6

I/O8

Note:

4. Central Leads are for thermal dissipation only. They are connected to device V

Document #: 38-06027 Rev. *B

Page 5 of 37

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Selection Guide

CY7C0430CV

–133

CY7C0430CV

–100

Unit

MHz

[1]

133

100

5.0

600

150

MAX2

Max Access Time (Clock to Data)

Max Operating Current I

4.2

750

200

Max Standby Current for I

(All ports TTL Level)

SB1

SB3

(All ports CMOS Level)

Pin Definitions

Port 1

–A

Port 2

–A

Port 3

Port 4

–A

15P4

Description

–A

Address Input/Output.

0P1

15P1

0P2

15P2

0P3

15P3

0P4

I/O –I/O

17P4

Data Bus Input/Output.

Clock Input. This input can be free running or strobed.

Maximum clock input rate is f

0P1

17P1

0P2

17P2

0P3

17P3

0P4

CLK

MAX

Lower Byte Select Input. Asserting this signal LOW

enables read and write operations to the lower byte. For

read operations both the LB and OE signals must be

asserted to drive output data on the lower byte of the data

pins.

Upper Byte Select Input. Same function as LB, but to the

upper byte.

CE ,CE

Chip Enable Input. To select any port, both CE AND

0P1

1P1

0P2

1P2

0P3

1P3

0P4

1P4

CE must be asserted to their active states (CE ≤ V and

CE ≥ V ).

Output Enable Input. This signal must be asserted LOW

to enable the I/O data lines during read operations. OE is

asynchronous input.

R/W

Read/Write Enable Input. This signal is asserted LOW

to write to the dual port memory array. For read opera-

tions, assert this pin HIGH.

MRST

Master Reset Input. This is one signal for All Ports.

MRST is an asynchronous input. Asserting MRST LOW

performs all of the reset functions as described in the text.

A MRST operation is required at power-up.

CNTRST

Counter Reset Input. Asserting this signal LOW resets

the burst address counter of its respective port to zero.

CNTRST is second to MRST in priority with respect to

counter and mask register operations.

MKLD

Mask Register Load Input. Asserting this signal LOW

loads the mask register with the external address

available on the address lines. MKLD operation has

higher priority over CNTLD operation.

CNTLD

Counter Load Input. Asserting this signal LOW loads the

burst counter with the external address present on the

address pins.

CNTINC

Counter Increment Input. Asserting this signal LOW

incrementstheburstaddresscounterofitsrespectiveport

on each rising edge of CLK.

Document #: 38-06027 Rev. *B

Page 6 of 37

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CY7C0430CV

Pin Definitions (continued)

Port 1

CNTRD

Port 2

CNTRD

Port 3

CNTRD

Port 4

CNTRD

Description

Counter Readback Input. When asserted LOW, the

internal address value of the counter will be read back on

the address lines. During CNTRD operation, both CNTLD

and CNTINC must be HIGH. Counter readback operation

has higher priority over mask register readback operation.

Counter readback operation is independent of port chip

enables. If address readback operation occurs with chip

enables active (CE = LOW, CE = HIGH), the data lines

(I/Os) will be three-stated. The readback timing will be

valid after one no-operation cycle plus t

from the rising

CD2

edge of the next cycle.

MKRD

Mask Register Readback Input. When asserted LOW,

the value of the mask register will be readback on address

lines. During mask register readback operation, all

counter and MKLD inputs must be HIGH (see Counter

and Mask Register Operations truth table). Mask register

readback operation is independent of port chip enables.

If address readback operation occurs with chip enables

active (CE = LOW, CE = HIGH), the data lines (I/Os) will

be three-stated. The readback will be valid after one

no-operation cycle plus t

next cycle.

from the rising edge of the

CD2

CNTINT

INTP1

CNTINT

INTP2

CNTINT

INTP3

CNTINT

INTP4

Counter Interrupt Flag Output. Flag is asserted LOW

for one clock cycle when the counter wraps around to

location zero.

Interrupt Flag Output. Interrupt permits communications

between all four ports. The upper four memory locations

can be used for message passing. Example of operation:

INT is asserted LOW when another port writes to the

mailbox location of Port 4. Flag is cleared when Port 4

reads the contents of its mailbox. The same operation is

applicable to ports 1, 2, and 3.

TMS

JTAG Test Mode Select Input. It controls the advance of

JTAG TAP state machine. State machine transitions occur

on the rising edge of TCK.

TCK

TDI

JTAG Test Clock Input. This can be CLK of any port or

an external clock connected to the JTAG TAP.

JTAG Test Data Input. This is the only data input. TDI

inputs will shift data serially in to the selected register.

TDO

JTAG Test Data Output. This is the only data output.

TDO transitions occur on the falling edge of TCK. TDO

normally three-stated except when captured data is

shifted out of the JTAG TAP.

CLKBIST

GND

BIST Clock Input.

Thermal Ground for Heat Dissipation.

Ground Input.

Power Input.

Address Lines Ground Input.

Address Lines Power Input.

Data Lines Ground Input.

Data Lines Power Input.

SS1

DD1

SS2

DD2

Document #: 38-06027 Rev. *B

Page 7 of 37

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Maximum Ratings

(Above which the useful life may be impaired. For user guide-

lines, not tested.)

Output Current into Outputs (LOW)............................. 20 mA

Static Discharge Voltage...........................................> 2200V

Latch-up Current.....................................................> 200 mA

Storage Temperature ................................ –65°C to + 150°C

Ambient Temperature with

Power Applied............................................–55°C to + 125°C

Operating Range

Supply Voltage to Ground Potential.............. –0.5V to + 4.6V

Range

Commercial

Industrial

Ambient Temperature

0°C to +70°C

DC Voltage Applied to

3.3V ± 150 mV

Outputs in High-Z State..........................–0.5V to V + 0.5V

–40°C to +85°C

3.3V ± 150 mV

DC Input Voltage....................................–0.5V to V + 0.5V

Electrical Characteristics Over the Operating Range

Quadport DSE Family

–133

Typ.

–100

Parameter

Description

Output HIGH Voltage

(V = Min., I = –4.0 mA)

Min.

Max.

Min.

Typ.

Max.

Unit

2.4

Output LOW Voltage

(V = Min., I = +4.0 mA)

0.4

Input HIGH Voltage

Input LOW Voltage

2.0

0.8

Output Leakage Current

–10

µA

Operating Current (V = Max., I = 0 mA)

OUT

Outputs Disabled, CE = V , f = f

350

700

300

550

max

Standby Current (four ports toggling at TTL

Levels,0 active)

200

300

150

250

SB1

SB2

CE ≥ V , f = f

1-4

MAX

Standby Current (four ports toggling at TTL

150

125

Levels, 1 active) CE | CE | CE | CE < V ,

f = f

MAX

Standby Current (four ports CMOS Level, 0

active) CE ≥ V , f = 0

1.5

SB3

SB4

1–4

Standby Current (four ports CMOS Level, 1

110

290

240

active and toggling) CE | CE | CE | CE <

V , f = f

MAX

JTAG TAP Electrical Characteristics Over the Operating Range

Parameter

Description

Output HIGH Voltage

Test Conditions

= −4.0 mA

Min.

Max.

Unit

2.4

OH1

OL1

Output LOW Voltage

Input HIGH Voltage

Input LOW Voltage

Input Leakage Current

= 4.0 mA

0.4

2.0

0.8

GND ≤ V ≤ V

–100

100

µA

Capacitance

Parameter

Description

Input Capacitance

Test Conditions

T = 25°C, f = 1 MHz,

Max.

Unit

(All Pins)

= 3.3V

(All Pins)

Output Capacitance

Input Capacitance

OUT

(CLK Pins)

(CLK Pins) Output Capacitance

OUT

Document #: 38-06027 Rev. *B

Page 8 of 37

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CY7C0430CV

AC Test Load

Z₀= 50Ω

C^[5]

R = 50Ω

Z₀= 50Ω

R = 50Ω

OUTPUT

5 pF

= 1.5V

(a) Normal Load

Z₀= 50Ω

R = 50Ω

OUTPUT

5 pF

= 3.3V

1.5V

(b) Three-State Delay

50Ω

TDO

Z =50Ω

C = 10 pF

3.0V

GND

90%

10%

90%

10%

t_R

GND

t_F

All Input Pulses

Note:

5. Test conditions: C = 10 pF.

Document #: 38-06027 Rev. *B

Page 9 of 37

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[6]

Switching Characteristics Over the Industrial Operating Range

CY7C0430BV and CY7C0430CV

–133 –100

Parameter

Description

Min.

Max.

Min.

Max.

Unit

MHz

[7]

Maximum Frequency

Clock Cycle Time

Clock HIGH Time

Clock LOW Time

Clock Rise Time

133

100

MAX2

[7]

7.5

CYC2

CH2

CL2

Clock Fall Time

Address Set-up Time

Address Hold Time

2.3

0.7

2.3

0.7

2.3

0.7

2.3

0.7

2.3

0.7

2.3

0.7

2.3

0.7

2.3

0.7

2.3

0.7

2.3

0.7

2.3

0.7

Chip Enable Set-up Time

Chip Enable Hold Time

R/W Set-up Time

0.7

R/W Hold Time

0.7

Input Data Set-up Time

Input Data Hold Time

Byte Set-up Time

0.7

Byte Hold Time

0.7

CNTLD Set-up Time

CNTLD Hold Time

SCLD

HCLD

SCINC

HCINC

SCRST

HCRST

SCRD

HCRD

SMLD

HMLD

SMRD

HMRD

0.7

CNTINC Set-up Time

CNTINC Hold Time

0.7

CNTRST Set-up Time

CNTRST Hold Time

CNTRD Set-up Time

CNTRD Hold Time

0.7

MKLD Set-up Time

MKLD Hold Time

0.7

MKRD Set-up Time

MKRD Hold Time

0.7

Output Enable to Data Valid

OE to Low-Z

6.5

[8]

OLZ

[8]

OE to High-Z

OHZ

Clock to Data Valid

4.2

4.7

CD2

CA2

CM2

Clock to Counter Address Readback Valid

Clock to Mask Register Readback Valid

Data Output Hold After Clock HIGH

Clock HIGH to Output High-Z

[9]

4.8

6.8

CKHZ

Notes:

6. If data is simultaneously written and read to the same address location and t

remaining in the address is undefined.

is violated, the data read from the address, as well as the subsequent data

CCS

7. f

for commercial is 135 MHz. t

Min. for commercial is 7.4 ns.

MAX2

CYC2

8. This parameter is guaranteed by design, but it is not production tested.

9. Valid for both address and data outputs.

Document #: 38-06027 Rev. *B

Page 10 of 37

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[6]

Switching Characteristics Over the Industrial Operating Range (continued)

CY7C0430BV and CY7C0430CV

–133 –100

Parameter

Description

Clock HIGH to Output Low-Z

Min.

Max.

Min.

Max.

Unit

[9]

CKLZ

Clock to INT Set Time

7.5

SINT

Clock to INT Reset Time

Clock to CNTINT Set Time

Clock to CNTINT Reset Time

RINT

SCINT

RCINT

Master Reset Timing

Master Reset Pulse Width

7.5

Master Reset Recovery Time

RSR

ROF

Master Reset to Output Flags Reset Time

6.5

Port to Port Delays

[6]

Clock to Clock Set-up Time (time required after a write

before you can read the same address location)

6.5

CCS

JTAG Timing and Switching Waveforms

Quadport DSE Family

–133/–100

Parameter

Description

Maximum JTAG TAP Controller Frequency

TCK Clock Cycle Time

Min.

Max.

Unit

MHz

JTAG

TCYC

100

TCK Clock High Time

TCK Clock Low Time

TMS Set-up to TCK Clock Rise

TMS Hold After TCK Clock Rise

TDI Set-up to TCK Clock Rise

TDI Hold after TCK Clock Rise

TCK Clock Low to TDO Valid

TCK Clock Low to TDO Invalid

Maximum CLKBIST Frequency

CLKBIST High Time

TMSS

TMSH

TDIS

TDIH

TDOV

TDOX

BIST

MHz

CLKBIST Low Time

Document #: 38-06027 Rev. *B

Page 11 of 37

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CY7C0430CV

Test Clock

TCK

TCYC

TMSH

TMSS

Test Mode Select

TMS

TDIS

TDIH

Test Data-In

TDI

Test Data-Out

TDO

TDOX

TDOV

Switching Waveforms

[10]

Master Reset

t_CYC2

t_CH2

t_CL2

CLK

t_RS

MRST

t_RSF

ALL

ADDRESS/

DATA

LINES

t_S

t_RSR

INACTIVE

ALL

OTHER

INPUTS

ACTIVE

[11]

TMS

CNTINT

INT

TDO

Notes:

10. t is the set-up time required for all input control signals.

11. To Reset the test port without resetting the device, TMS must be held low for five clock cycles.

Document #: 38-06027 Rev. *B

Page 12 of 37

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Switching Waveforms (continued)

[12, 13, 14, 15, 16]

Read Cycle

t_CYC2

t_CH2

t_CL2

CLK

t_SC

t_HC

t_SC

t_HC

t_SB

t_HB

R/W

t_SW

t_SA

t_HW

t_HA

ADDRESS

DATA_OUT

A_n

A_n+1

A_n+2

A_n+3

t_DC

1 Latency

t_CD2

Q_n

Q_n+1

Q_n+2

t_OHZ

t_CKLZ

t_OLZ

Notes:

12. OE is asynchronously controlled; all other inputs (excluding MRST) are synchronous to the rising clock edge.

13. CNTLD = V , MKLD = V , CNTINC = x, and MRST = CNTRST = V

14. The output is disabled (high-impedance state) by CE = V following the next rising edge of the clock.

15. Addresses do not have to be accessed sequentially. Note 13 indicates that address is constantly loaded on the rising edge of the CLK. Numbers are for reference

only.

16. CE is internal signal. CE = VIL if CE = V and CE = V .

Document #: 38-06027 Rev. *B

Page 13 of 37

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Switching Waveforms (continued)

[17, 18]

Bank Select Read

t_CYC2

t_CH2

t_CL2

CLK

t_HA

t_SA

A₃

A₄

ADDRESS_(B1)

A₅

A₀

A₁

A₂

t_HC

t_SC

CE_(B1)

t_CD2

t_CKHZ

t_HC

t_CKHZ

t_SC

Q₀

Q₃

Q₁

DATA_OUT(B1)

ADDRESS_(B2)

t_HA

t_SA

t_DC

A₂

t_DC

A₃

t_CKLZ

A₄

A₅

A₀

A₁

t_HC

t_SC

CE_(B2)

t_CD2

t_CKHZ

t_CD2

t_SC

t_HC

DATA_OUT(B2)

Q₄

Q₂

t_CKLZ

[19, 20, 21, 22]

Read-to-Write-to-Read (OE = V )

t_CYC2

t_CH2

t_CL2

CLK

t_SC

t_HC

t_SW

t_HW

R/W

t_SW

t_HW

A_n

A_n+1

A_n+2

t_SDt_HD

D_n+2

A_n+3

A_n+4

ADDRESS

DATA_IN

t_SA

t_HA

t_CD2

t_CKHZ

Q_n

Q_n+3

DATA_OUT

t_CKLZ

Read

No Operation

Write

Notes:

17. In this depth expansion example, B1 represents Bank #1 and B2 is Bank #2; Each bank consists of one QuadPort DSE device from this data sheet.

ADDRESS = ADDRESS

(B2)

(B1)

18. LB = UB = OE = CNTLD = V ; MRST = CNTRST= MKLD = V

19. Output state (HIGH, LOW, or high-impedance) is determined by the previous cycle control signals.

20. LB = UB = CNTLD = V ; MRST = CNTRST = MKLD = V

21. Addresses do not have to be accessed sequentially since CNTLD = V constantly loads the address on the rising edge of the CLK; numbers are for reference only.

22. During “No Operation,” data in memory at the selected address may be corrupted and should be rewritten to ensure data integrity.

Document #: 38-06027 Rev. *B

Page 14 of 37

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Switching Waveforms (continued)

Read-to-Write-to-Read (OE Controlled)

t_CYC2

[19, 20, 21, 22]

t_CH2

t_CL2

CLK

t_SC

t_HC

t_HW

t_SW

R/W

t_SW

t_HW

A_n

A_n+1

A_n+2

A_n+3

A_n+4

A_n+5

ADDRESS

DATA_IN

t_SA

t_HA

t_SDt_HD

D_n+2

D_n+3

t_CD2

DATA_OUT

Q_n

Q_n+4

t_OHZ

t_CKLZ

Read

[23, 24]

Write

Read

Read with Address Counter Advance

t_CYC2

t_CH2

t_CL2

CLK

t_SA

t_HA

ADDRESS

A_n

t_SCLD

t_HCLD

CNTLD

t_SCINC

t_HCINC

CNTINC

t_CD2

DATA_OUT

Q_x–1

Q_x

t_DC

Q_n

Q_n+1

Q_n+2

Q_n+3

Read

Counter Hold

Read with Counter

External

Address

Notes:

23. CE = OE = LB = UB = V ; CE = R/W = CNTRST = MRST = MKLD = MKRD = CNTRD = V .

24. The “Internal Address” is equal to the “External Address” when CNTLD = V .

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Switching Waveforms (continued)

[24, 25]

Write with Address Counter Advance

t_CYC2

t_CH2

t_CL2

CLK

t_SA

t_HA

A_n

ADDRESS

INTERNAL

ADDRESS

A_n

A_n+1

A_n+2

A_n+3

A_n+4

t_SCLD

t_HCLD

CNTLD

CNTINC

DATA_IN

t_SCINC

t_HCINC

D_n

D_n+1

D_n+2

D_n+3

D_n+4

t_SD

t_HD

Write External

Address

Write with

Counter

Write Counter

Hold

Write with Counter

Note:

25. CE = LB = UB = R/W = V ; CE = CNTRST = MRST = MKLD = MKRD = CNTRD = V

IH.

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Switching Waveforms (continued)

[21, 26, 27]

Counter Reset

t_CYC2

t_CH2

t_CL2

CLK

t_SAt_HA

A_n

A_n+1

ADDRESS

INTERNAL

ADDRESS

A_X

A₀

A₁

A_n

A_n+1

t_SWt_HW

R/W

t_HCLD

t_SCLD

CNTLD

CNTINC

A_n+2

t_SCRST

t_HCRST

CNTRST

DATA_IN

t_SDt_HD

D₀

DATA_OUT

Q₀

Q₁

Q_n

Counter

Reset

Write

Address 0

Read

Address 0

Read

Address 1

Read

Address n

Notes:

26. CE = LB = UB = V ; CE = MRST = MKLD = MKRD = CNTRD = V .

27. No dead cycle exists during counter reset. A Read or Write cycle may be coincidental with the counter reset.

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Switching Waveforms (continued)

[28]

Load and Read Address Counter

t_CYC2

t_CH2

t_CL2

Note 29

t_CKLZ

Note 30

CLK

t_CA2

t_HA

t_SA

t_CKHZ

A₀–A₁₅

[31]

A_n+2

A_n

t_SCLD

t_HCLD

CNTLD

CNTINC

t_SCINC

t_HCINC

t_SCRD

t_HCRD

CNTRD

INTERNAL

ADDRESS

A_n

A_n+1

A_n+2

t_DC

t_CD2

t_CKLZ

t_CKHZ

DATA_OUT

Q_n+2

Q_x–1

Q_x

Q_n

Read Data with Counter

Q_n+1

Q_n+2

Load

Read

External

Address

Internal

Address

Notes:

28. CE = OE = LB = UB = V ; CE = R/W = CNTRST = MRST = MKLD = MKRD = V .

29. Address in output mode. Host must not be driving address bus after time t

in next clock cycle.

CKLZ

30. Address in input mode. Host can drive address bus after t

CKHZ

31. This is the value of the address counter being read out on the address lines.

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Switching Waveforms (continued)

[32]

Load and Read Mask Register

t_CYC2

t_CH2

t_CL2

Note 29

t_CKLZ

Note 30

CLK

t_CA2

t_HA

t_SA

t_CKHZ

A₀–A₁₅

[33]

A_n

t_SMLD

t_HMLD

MKLD

MKRD

t_SMRD

t_HMRD

MASK

INTERNAL

VALUE

A_n

Read

Load

Mask Register

Value

Mask Register

Value

Notes:

32. CE = OE = LB = UB = V ; CE = R/W = CNTRST = MRST = CNTLD = CNTRD = CNTINC =V .

33. This is the value of the Mask Register read out on the address lines.

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Switching Waveforms (continued)

[34, 35, 36]

Port 1 Write to Port 2 Read

t_CYC2

t_CH2

t_CL2

CLK_P1

t_HA

t_SA

PORT-1

ADDRESS

A_n

t_SW

t_HW

R/W_P1

t_CKHZ

t_SD

t_HD

t_CKLZ

PORT-1

DATA_IN

D_n

t_CCS

t_CYC2

t_CL2

CLK_P2

t_CH2

t_SA

t_HA

PORT-2

ADDRESS

A_n

R/W_P2

t_CD2

PORT-2

DATA_OUT

Q_n

t_DC

Notes:

34. CE = OE = LB = UB = CNTLD =V ; CE = CNTRST = MRST = MKLD = MKRD = CNTRD = CNTINC =V .

35. This timing is valid when one port is writing, and one or more of the three other ports is reading the same location at the same time. If t

is violated, indeterminate

CCS

data will be read out.

36. If t

< minimum specified value, then Port 2 will read the most recent data (written by Port 1) only (2*t

+ t

) after the rising edge of Port 2’s clock. If

CCS

CYC2

CD2

> minimum specified value, then Port 2 will read the most recent data (written by Port 1) (t

+ t

) after the rising edge of Port 2’s clock.

CCS

CYC2

CD2

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Switching Waveforms (continued)

[37, 38, 39]

Counter Interrupt

t_CYC2

t_CH2

t_CL2

CLK

EXTERNAL

ADDRESS

007Fh

xx7Dh

t_SMLD

t_HMLD

MKLD

t_SCLD

t_HCLD

CNTLD

t_HCINC

t_SCINC

CNTINC

COUNTER

INTERNAL

ADDRESS

xx7Dh

A_n

xx7Eh

xx7Fh

t_SCINT

xx00h

t_RCINT

xx00h

CNTINT

[40, 41, 42, 43, 44]

Mailbox Interrupt Timing

t_CYC2

t_CL2

t_CH2

CLK_P1

t_SAt_HA

FFFE

PORT-1

ADDRESS

A_n+1

A_n

A_n+2

A_n+3

t_SINT

t_RINT

INT_P2

t_CYC2

t_CH2

t_CL2

CLK_P2

t_SAt_HA

A_m

PORT-2

ADDRESS

FFFE

A_m+1

A_m+3

A_m+4

Notes:

37. CE = OE = LB = UB = V ; CE = R/W = CNTRST = MRST = CNTRD = MKRD = V .

38. CNTINT is always driven.

39. CNTINC goes LOW as the counter address masked portion is incremented from xx7Fh to xx00h. The “x” is “Don’t Care.”

40. CE = OE = LB = UB = CNTLD =V ; CE = CNTRST = MRST = CNTRD = CNTINC = MKRD = MKLD =V

41. Address “FFFE” is the mailbox location for Port 2.

42. Port 1 is configured for Write operation, and Port 2 is configured for Read operation.

43. Port 1 and Port 2 are used for simplicity. All four ports can write to or read from any mailbox.

44. Interrupt flag is set with respect to the rising edge of the write clock, and is reset with respect to the rising edge of the read clock.

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[45, 46, 47]

Table 1. Read/Write and Enable Operation (Any Port)

Inputs

Outputs

CLK

R/W

I/O –I/O

Operation

High-Z

Deselected

Write

High-Z

Read

OUT

High-Z

Outputs Disabled

[45, 48, 49]

Table 2. Address Counter and Counter-Mask Register Control Operation (Any Port)

CLK MRST CNTRST MKLD CNTLD CNTINC CNTRD MKRD Mode

Operation

Master- Counter/Address Register Reset and Mask

Reset

state table)

Reset

Load

Counter/Address Register Reset

Load of Address Lines into Mask Register

LoadofAddressLinesintoCounter/Address

Increment Counter Increment

Readback Readback Counter on Address Lines

Readback Readback Mask Register on Address Lines

Hold

Counter Hold

Notes:

45. “X” = “Don’t Care,” “H” = V , “L” = V .

46. OE is an asynchronous input signal.

47. When CE changes state, deselection and read happen after one cycle of latency.

48. CE = OE = V ; CE = R/W = V

49. Counter operation and mask register operation are independent of Chip Enables.

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the mailbox for Port 1, FFFE is the mailbox for Port 2, FFFD is

the mailbox for Port 3, and FFFC is the mailbox for Port 4.

Master Reset

The QuadPort DSE device undergoes a complete reset by

taking its Master Reset (MRST) input LOW. The Master Reset

input can switch asynchronously to the clocks. A Master Reset

initializes the internal burst counters to zero, and the counter

mask registers to all ones (completely unmasked). A Master

Reset also forces the Mailbox Interrupt (INT) flags and the

Counter Interrupt (CNTINT) flags HIGH, resets the BIST

controller, and takes all registered control signals to a

deselected read state.

on the QuadPort DSE device after power-up.

Table 3 shows that in order to set Port 1 INT flag, a write by

any other port to address FFFF will assert INT LOW. A read

of FFFF location by Port 1 will reset INT HIGH. When one

port writes to the other port’s mailbox, the Interrupt flag (INT)

of the port that the mailbox belongs to is asserted LOW. The

Interrupt is reset when the owner (port) of the mailbox reads

the contents of the mailbox. The interrupt flag is set in a

flow-through mode (i.e., it follows the clock edge of the writing

port). Also, the flag is reset in a flow-through mode (i.e., it

follows the clock edge of the reading port).

[50]

A Master Reset must be performed

Each port can read the other port’s mailbox without resetting

the interrupt. If an application does not require message

passing, INT pins should be treated as no-connect and should

be left floating. When two ports or more write to the same

mailbox at the same time INT will be asserted but the contents

of the mailbox are not guaranteed to be valid.

Interrupts

The upper four memory locations may be used for message

passing and permit communications between ports. Table 3

shows the interrupt operation for all ports. For the 1-Mb

QuadPort DSE device, the highest memory location FFFF is

Table 3. Interrupt Operation Example

Port 1

Port 2

Port 3

Port 4

Function

Set Port 1 INT Flag

INT

0P1–15P1

0P2–15P2

0P3–15P3

0P4–15P4

FFFF

FFFE

FFFF

Reset Port 1 INT Flag

Set Port 2 INT Flag

FFFE

Reset Port 2 INT Flag

FFFE

FFFD

Set Port 3 INT Flag

FFFD

Reset Port 3 INT Flag

FFFD

FFFC

Set Port 4 INT Flag

FFFC

Reset Port 4 INT Flag

FFFC

Note:

50. During Master Reset the control signals will be set to a deselected read state: CE = LBI = UBI = R/WI = MKLDI = MKRDI = CNTRDI = CNTRSTI = CNTLDI =

CNTINCI = V ; CE = V The “I” suffix on all these signals denotes that these are the internal registered equivalent of the associated pin signals.

IL.

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Figure 1 provides a block diagram of the readback operation.

Table 2 lists control signals required for counter operations.

The signals are listed based on their priority. For example,

Master Reset takes precedence over Counter Reset, and

Counter Load has lower priority than Mask Register Load

(described below). All counter operations are independent of

Address Counter Control Operations

Counter enable inputs are provided to stall the operation of the

address input and utilize the internal address generated by the

internal counter for the fast interleaved memory applications.

A port’s burst counter is loaded with the port’s Counter Load

pin (CNTLD). When the port’s Counter Increment (CNTINC) is

asserted, the address counter will increment on each LOW to

HIGH transition of that port’s clock signal. This will read/write

one word from/into each successive address location until

CNTINC is deasserted. Depending on the mask register state,

the counter can address the entire memory array and will loop

back to start. Counter Reset (CNTRST) is used to reset the

Burst Counter (the Mask Register value is unaffected). When

using the counter in readback mode, the internal address

value of the counter will be read back on the address lines

when Counter Readback Signal (CNTRD) is asserted.

Chip Enables (CE and CE ). When the address readback

operation is performed the data I/Os are three-stated (if CEs

are active) and one-clock cycle (no-operation cycle) latency is

experienced. The address will be read at time t

from the

CA2

rising edge of the clock following the no-operation cycle. The

read back address can be either of the burst counter or the

mask register based on the levels of Counter Read signal

(CNTRD) and Mask Register Read signal (MKRD). Both

signals are synchronized to the port's clock as shown in

Table 2. Counter read has a higher priority than mask read.

Readback

CNTRD

MKRD

Addr.

Readback

MKLD = 1

Memory

Array

Mask

Bidirectional

Address Lines

Counter/

Address

CNTINC = 1

CNTLD = 1

CNTRST = 1

CLK

Figure 1. Counter and Mask Register Read Back on Address Lines

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Counter-Mask Register

CNTINT

Example:

Load

Counter-Mask

0’s

15 14

Mask

bit-0

Blocked Address

Counter Address

Load

Address

Counter = 8

X’s

15 14

Address

Counter

bit-0

Max

Address

15 14

Max + 1

Address

15 14

[51]

Figure 2. Programmable Counter-Mask Register Operation

The burst counter has a mask register that controls when and

where the counter wraps. An interrupt flag (CNTINT) is

asserted for one clock cycle when the unmasked portion of the

counter address wraps around from all ones (CNTINC must be

asserted) to all zeros. The example in Figure 2 shows the

counter mask register loaded with a mask value of 003F

unmasking the first 6 bits with bit “0” as the LSB and bit “15”

as the MSB. The maximum value the mask register can be

loaded with is FFFF. Setting the mask register to this value

allows the counter to access the entire memory space. The

address counter is then loaded with an initial value of XXX8.

The “blocked” addresses (in this case, the 6th address through

the 15th address) are loaded with an address but do not

increment once loaded. The counter address will start at

address XXX8. With CNTINC asserted LOW, the counter will

increment its internal address value till it reaches the mask

location XXX0. Therefore, the counter uses the mask-register

to define wrap-around point. The mask register of every port

is loaded when MKLD (mask register load) for that port is

LOW. When MKRD is LOW, the value of the mask register can

be read out on address lines in a manner similar to counter

read back operation (see Table 2 for required conditions).

the counter will increment by two and the address values are

even. If the loaded value for address counter bit 0 is “1,” the

counter will increment by two and the address values are odd.

This operations allows the user to achieve a 36-bit interface

using any two ports, where the counter of one port counts even

addresses and the counter of the other port counts odd

addresses. This even-odd address scheme stores one half of

the 36-bit word in even memory locations, and the other half

in odd memory locations. CNTINT will be asserted when the

unmasked portion of the counter wraps to all zeros. Loading

mask register bit 0 with “1” allows the counter to increment the

address value sequentially.

Table 2 groups the operations of the mask register with the

operations of the address counter. Address counter and mask

Master reset (MRST) is the only asynchronous signal listed on

Table 2. Signals are listed based on their priority going from

left column to right column with MRST being the highest. A

LOW on MRST will reset both counter register to all zeros and

mask register to all ones. On the other hand, a LOW on

CNTRST will only clear the address counter register to zeros

and the mask register will remain intact.

There are four operations for the counter and mask register:

When the burst counter is loaded with an address higher than

the mask register value, the higher addresses will form the

masked portion of the counter address and are called blocked

addresses. The blocked addresses will not be changed or

affected by the counter increment operation. The only

exception is mask register bit 0. It can be masked to allow the

address counter to increment by two. If the mask register bit 0

is loaded with a logic value of “0,” then address counter bit 0

is masked and can not be changed during counter increment

operation. If the loaded value for address counter bit 0 is “0,”

1. Load operation: When CNTLD or MKLD is LOW, the ad-

dress counter or the mask register is loaded with the ad-

dress value presented at the address lines. This value rang-

es from 0 to FFFF (64K). The mask register load operation

has a higher priority over the address counter load opera-

tion.

2. Increment: Once the address counter is loaded with an

external address, the counter can internally increment the

address value by asserting CNTINC LOW. The counter can

Note:

51. The “X” in this diagram represents the counter upper-bits.

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address the entire memory array (depend on the value of

the mask register) and loop back to location 0. The

increment operation is second in priority to load operation.

Test Data-In (TDI)

The TDI pin is used to serially input information into the

registers and can be connected to the input of any of the

registers. The register between TDI and TDO is chosen by the

instruction that is loaded into the TAP instruction register. For

information on loading the instruction register, see the TAP

Controller State Diagram. TDI is internally pulled up and can

be unconnected if the TAP is unused in an application. TDI is

connected to the most significant bit (MSB) on any register.

3. Readback: the internal value of either the burst counter or

themask register can be readout on the addresslines when

CNTRD or MKRD is LOW. Counter readback has higher

priority over mask register readback. A no-operation delay

cycle is experienced when readback operation is

performed. The address will be valid after t

(for counter

CA2

readback) or t

(for mask readback) from the following

CM2

Test Data Out (TDO)

port's clock rising edge. Address readback operation is

independent of the port's chip enables (CE and CE ). If

The TDO output pin is used to serially clock data-out from the

registers. The output is active depending upon the current

state of the TAP state machine (see TAP Controller State

Diagram (FSM)). The output changes on the falling edge of

TCK. TDO is connected to the least significant bit (LSB) of any

address readback occurs while the port is enabled (chip

enables active), the data lines (I/Os) will be three-stated.

4. Hold operation: In order to hold the value of the address

counter at certain address, all signals in Table 2 have to be

HIGH. This operation has the least priority. This operation

is useful in many applications where wait states are needed

or when address is available few cycles ahead of data.

Performing a TAP Reset

A Reset is performed by forcing TMS HIGH (V ) for five rising

The counter and mask register operations are totally

independent of port chip enables.

edges of TCK. This RESET does not affect the operation of

the QuadPort DSE device and may be performed while the

device is operating. At power-up, the TAP is reset internally to

ensure that TDO comes up in a High-Z state.

IEEE 1149.1 Serial Boundary Scan (JTAG) and

Memory Built-In-Self-Test (MBIST)

TAP Registers

The CY7C0430BV and CY7C0430CV incorporate a serial

boundary scan test access port (TAP). This port is fully

compatible with IEEE Standard 1149.1-2001 . The TAP

Registers are connected between the TDI and TDO pins and

allow data to be scanned into and out of the QuadPort DSE

device test circuitry. Only one register can be selected at a

time through the instruction registers. Data is serially loaded

into the TDI pin on the rising edge of TCK. Data is output on

the TDO pin on the falling edge of TCK.

[52]

operates using JEDEC standard 3.3V I/O logic levels. It is

composed of three input connections and one output

connection required by the test logic defined by the standard.

Memory BIST circuitry will also be controlled through the TAP

interface. All MBIST instructions are compliant to the JTAG

standard. An external clock (CLKBIST) is provided to allow the

user to run BIST at speeds up to 50 MHz. CLKBIST is multi-

plexed internally with the ports clocks during BIST operation.

Instruction Register

Four-bit instructions can be serially loaded into the instruction

TDI and TDO pins as shown in the following JTAG/BIST

Controller diagram. Upon power-up, the instruction register is

loaded with the IDCODE instruction. It is also loaded with the

IDCODE instruction if the controller is placed in a reset state

as described in the previous section.

Disabling the JTAG Feature

It is possible to operate the QuadPort DSE device without

using the JTAG feature. To disable the TAP controller, TCK

must be tied LOW (V ) to prevent clocking of the device. TDI

and TMS are internally pulled up and may be unconnected.

When the TAP controller is in the CaptureIR state, the two least

significant bits are loaded with a binary “01” pattern to allow for

fault isolation of the board level serial test path.

They may alternately be connected to V through a pull-up

resistor. TDO should be left unconnected. CLKBIST must be

tied LOW to disable the MBIST. Upon power-up, the device will

come up in a reset state which will not interfere with the

operation of the device.

Bypass Register

To save time when serially shifting data through registers, it is

sometimes advantageous to skip certain devices. The bypass

and TDO pins. This allows data to be shifted through the

QuadPort DSE device with minimal delay. The bypass register

Test Access Port (TAP)–Test Clock (TCK)

The test clock is used only with the TAP controller. All inputs

are captured on the rising edge of TCK. All outputs are driven

from the falling edge of TCK.

is set LOW (V ) when the BYPASS instruction is executed.

Test Mode Select

Boundary Scan Register

The TMS input is used to give commands to the TAP controller

and is sampled on the rising edge of TCK. It is allowable to

leave this pin unconnected if the TAP is not used. The pin is

pulled up internally, resulting in a logic HIGH level.

The boundary scan register is connected to all the input and

output pins on the QuadPort DSE device. The boundary scan

device Input and Output ring when the TAP controller is in the

Capture-DR state and is then placed between the TDI and

TDO pins when the controller is moved to the Shift-DR state.

Note:

52. Master Reset will reset the JTAG controller.

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The EXTEST, and SAMPLE/PRELOAD instructions can be

used to capture the contents of the Input and Output ring.

The user must be aware that the TAP controller clock can only

operate at a frequency up to 10 MHz, while the QuadPort DSE

device clock operates more than an order of magnitude faster.

Because there is a large difference in the clock frequencies, it

is possible that during the Capture-DR state, an input or output

will undergo a transition. The TAP may then try to capture a

signal while in transition (metastable state). This will not harm

the device, but there is no guarantee as to the value that will

be captured. Repeatable results may not be possible.

Identification (ID) Register

The ID register is loaded with a vendor-specific, 32-bit code

during the Capture-DR state when the IDCODE command is

loaded in the instruction register. The IDCODE is hardwired

into the QuadPort DSE device and can be shifted out when the

TAP controller is in the Shift-DR state. The ID register has a

vendor code and other information described in the Identifi-

cation Register Definitions table.

To guarantee that the boundary scan register will capture the

correct value of a signal, the QuadPort DSE device signal

must be stabilized long enough to meet the TAP controller’s

capture set-up plus hold times. Once the data is captured, it is

possible to shift out the data by putting the TAP into the

Shift-DR state. This places the boundary scan register

between the TDI and TDO pins. If the TAP controller goes into

the Update-DR state, the sampled data will be updated.

TAP Instruction Set

Sixteen different instructions are possible with the 4-bit

instruction register. All combinations are listed in Table 6,

Instruction Codes. Seven of these instructions (codes) are

listed as RESERVED and should not be used. The other nine

instructions are described in detail below.

BYPASS

The TAP controller used in this QuadPort DSE device is fully

[52]

When the BYPASS instruction is loaded in the instruction

advantage of the BYPASS instruction is that it shortens the

boundary scan path when multiple devices are connected

together on a board.

compatible

with the 1149.1 convention. The TAP controller

can be used to load address, data or control signals into the

QuadPort DSE device and can preload the Input or output

buffers. The QuadPort DSE device implements all of the

1149.1 instructions except INTEST. Table 6 lists all instruc-

tions.

Instructions are loaded into the TAP controller during the

Shift-IR state when the instruction register is placed between

TDI and TDO. During this state, instructions are shifted

through the instruction register through the TDI and TDO pins.

To execute the instruction once it is shifted in, the TAP

controller needs to be moved into the Update-IR state.

CLAMP

The optional CLAMP instruction allows the state of the signals

driven from QuadPort DSE device pins to be determined from

the boundary-scan register while the BYPASS register is

selected as the serial path between TDI and TDO. CLAMP

controls boundary cells to 1 or 0.

EXTEST

CYBIST

EXTEST is a mandatory 1149.1 instruction which is to be

executed whenever the instruction register is loaded with all 0s.

EXTEST allows circuitry external to the QuadPort DSE device

package to be tested. Boundary-scan register cells at output pins

are used to apply test stimuli, while those at input pins capture

test results.

CYBIST instruction provides the user with a means of running

a user-accessible self-test function within the QuadPort DSE

device as a result of a single instruction. This permits all

components on a board that offer the CYBIST instruction to

execute their self-tests concurrently, providing a quick check

for the board. The QuadPort DSE device MBIST provides two

modes of operation once the TAP controller is loaded with the

CYBIST instruction:

IDCODE

The IDCODE instruction causes a vendor-specific, 32-bit code

to be loaded into the identification register. It also places the

identification register between the TDI and TDO pins and

allows the IDCODE to be shifted out of the device when the

TAP controller enters the Shift-DR state. The IDCODE

instruction is loaded into the instruction register upon

power-up or whenever the TAP controller is given a test logic

reset state.

Non-Debug Mode (Go-NoGo)

The non-debug mode is a go-nogo test used simply to run

BIST and obtain pass-fail information after the test is run. In

addition to that, the total number of failures encountered can

be obtained. This information is used to aid the debug mode

(explained next) of operation. The pass-fail information and

failure count is scanned out using the JTAG interface. An

MBIST Result Register (MRR) will be used to store the

pass-fail results. The MRR is a 25-bit register that will be

connected between TDI and TDO during the internal scan

(INT_SCAN) operation. The MRR will contain the total number

of fail read cycles of the entire MBIST sequence. MRR[0] (bit

0) is the Pass/Fail bit. A “1” indicates some type of failure

occurred, and a “0” indicates entire memory pass.

High-Z

The High-Z instruction causes the bypass register to be

connected between the TDI and TDO pins when the TAP

controller is in a Shift-DR state. It also places all QuadPort

DSE device outputs into a High-Z state.

SAMPLE/PRELOAD

In order to run BIST in non-debug mode, the two-bit MBIST

Control Register (MCR) is loaded with the default value “00”,

and the TAP controller’s finite state machine (FSM), which is

synchronous to TCK, transitions to Run Test/Idle state. The

entire MBIST test will be performed with a deterministic

SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When

the SAMPLE/PRELOAD instructions loaded into the

instruction register and the TAP controller in the Capture-DR

state, a snapshot of data on the inputs and output pins is

captured in the boundary scan register.

Document #: 38-06027 Rev. *B

Page 27 of 37

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number of TCK cycles depending on the TCK and CLKBIST

frequency.

data is from LSB to MSB. MDR[25:10] represent the failing

address (MSB to LSB). The state of the BIST controller is

scanned out using MDR[9:4]. Bit 2 is the Test Done bit. A “0”

in bit 2 means test not complete. The user has to monitor this

bit at every packet to determine if more failure packets need to

be scanned out at the end of the BIST operations. If the value

is “0” then BIST must be repeated to capture the next failing

packet. If it is “1,” it means that the last failing packets have

been scanned out. A trailer similar to the header represents

the end of a packet.

t_CYC[CLKBIST]

--------------------------------------------

× m + SPC

t_CYC

t_CYC[TCK]

is total number of TCK cycles required to run MBIST.

CYC

SPC is the Synchronization Padding Cycles (4–6 cycles).

m is a constant represents the number of read and write opera-

tions required to run MBIST algorithms (31195136).

Once the entire MBIST sequence is completed, supplying

extra TCK or CLKBIST cycles will have no effect on the MBIST

controller state or the pass-fail status.

MCR_SCAN

This instruction will connect the Memory BIST Control

(upon master reset) is “00.” Shift_DR state will allow modifying

the MCR to extend the MBIST functionality.

Debug Mode

With the CYBIST instruction loaded and the MCR loaded with

the value of “01,” and the FSM transitions to RUN_TEST/IDLE

state, the MBIST goes into CYBIST-debug mode. The debug

mode will be used to provide complete failure analysis infor-

mation at the board level. It is recommended that the user runs

the non-debug mode first and then the debug mode in order to

save test time and to set an upper bound on the number of

scan outs that will be needed. The failure data will be scanned

out automatically once a failure occurs using the JTAG TAP

interface. The failure data will be represented by a 100-bit

packet given below. The 100-bit Memory Debug Register

(MDR) will be connected between TDI and TDO, and will be

shifted out on TDO, which is synchronized to TCK.

MBIST Control States

Thirty-five states are listed in Table 7. Four data algorithms are

used in debug mode: moving inversion (MIA), march_2 (M2A),

checkerboard (CBA), and unique address algorithm (UAA).

Only Port 1 can write MIA, M2A, and CBA data to the memory.

All four ports can read any algorithm data from the QuadPort

DSE device memory. Ports 2, 3, and 4 will only write UAA data.

Boundary Scan Cells (BSC)

Table 9 lists all QuadPort DSE family I/Os with their associated

BSC. Note that the cells have even numbers. Every I/O has

two boundary scan cells. Bidirectional signals (address lines,

datalines) require two cells so that one (the odd cell) is used

to control a three-state buffer. Input only and output only

signals have an extra dummy cell (odd cells) that are used to

ease device layout.

Figure 3 is a representation of the 100-bit MDR packet. The

packet follows a two-bit header that has a logic “1” value, and

represents two TCK cycles. MDR[97:26] represent the BIST

comparator values of all four ports (each port has 18 data

lines). A value of “1” indicates a bit failure. The scanned out

P4_IO(17-9)

P3_IO(17-9)

P3_IO(8-0)

P2_IO(17-9)

P2_IO(8-0)

P1_IO(17-9)

P1_IO(8-0)

P4_IO(8-0)

A(15-0)

MBIST_State

P/F

Figure 3. MBIST Debug Register Packet

Document #: 38-06027 Rev. *B

Page 28 of 37

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TAP Controller State Diagram (FSM)^[53]

TEST-LOGIC

RESET

RUN_TEST/

IDLE

SELECT

DR-SCAN

SELECT

IR-SCAN

CAPTURE-DR

CAPTURE-IR

SHIFT-DR

SHIFT-IR

EXIT1-DR

EXIT1-IR

PAUSE-DR

PAUSE-IR

EXIT2-DR

EXIT2-IR

UPDATE-DR

UPDATE-IR

Note:

53. The “0”/”1” next to each state represents the value at TMS at the rising edge of TCK.

Document #: 38-06027 Rev. *B

Page 29 of 37

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JTAG/BIST TAP Controller Block Diagram

Bypass Register (BYR)

MBIST Control Register (MCR)

3 2

Instruction Register (IR)

24 23

Selection

Circuitry

MBIST Result Register (MRR)

TDI

TDO

31 30 29

Identification Register (IDR)

(MUX)

MBIST Debug Register (MDR)

391

Boundary Scan Register (BSR)

BIST

CONTROLLER

TAP

CONTROLLER

TCK

CLKBIST

TMS

MRST

MEMORY

CELL

Table 4. Identification Register Definitions

Instruction Field

Value

Description

Reserved for version number

Defines Cypress part number

Revision Number (31:28)

Cypress Device ID (27:12)

Cypress JEDEC ID (11:1)

ID Register Presence (0)

C000h

34h

Allows unique identification of QuadPort DSE device vendor

Indicate the presence of an ID register

Document #: 38-06027 Rev. *B

Page 30 of 37

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Table 5. Scan Registers Sizes

Bit Size

Instruction (IR)

Bypass (BYR)

Identification (IDR)

MBIST Control (MCR)

MBIST Result (MRR)

MBIST Debug (MDR)

Boundary Scan (BSR)

100

392

Table 6. Instruction Identification Codes

Instruction

EXTEST

Code

Description

0000

Captures the Input/Output ring contents. Places the boundary scan register (BSR)

between the TDI and TDO.

BYPASS

IDCODE

1111

0111

Places the bypass register (BYR) between TDI and TDO.

Loads the ID register (IDR) with the vendor ID code and places the register

between TDI and TDO.

HIGHZ

0110

0101

Places the BYR between TDI and TDO. Forces all QuadPort DSE device output

drivers to a High-Z state.

CLAMP

Controls boundary to 1/0. Uses BYR.

SAMPLE/PRELOAD 0001

Captures the Input/Output ring contents. Places the boundary scan register (BSR)

between TDI and TDO.

CYBIST

1000

0010

Invokes MBIST. Places the MBIST Debug register (MDR) between TDI and TDO.

INT_SCAN

Scans out pass-fail information. Places MBIST Result Register (MRR) between TDI

and TDO.

MCR_SCAN

RESERVED

0011

Presets CYBIST mode. Places MBIST Control Register (MCR) between TDI and TDO.

All other codes Seven combinations are reserved. Do not use other than the above.

Table 7. MBIST Control States

States Code

State Name

Description

000001

movi_zeros

Port 1 write all zeros to the QuadPort DSE device memory using Moving

Inversion Algorithm (MIA).

000011

000010

movi_1_upcnt

Up count from 0 to 64K (depth of QuadPort DSE device). All ports read 0s, then

Port 1 writes 1s to all memory locations using MIA, then all ports read 1s. MIA

read0_write1_read1 (MIA_r0w1r1).

movi_0_upcnt

Up count from 0 to 64K. All ports read 1s, then Port 1 writes 0s, then all ports

read 0s (MIA_r1w0r0).

000110

000111

000101

movi_1_downcnt

movi_0_downcnt

movi_read

Down count from 64K to 0. MIA_r0w1r1.

Down count MIA_r1w0r0.

Read all 0s.

000100

001100

001101

001111

001110

001010

mar2_zeros

Port 1 write all zeros to memory using March2 Algorithm (M2A).

Up count M2A_r0w1r1.

mar2_1_upcnt

mar2_0_upcnt

mar2_1_downcnt

mar2_0_downcnt

mar2_read

Up count M2A_r1w0r0.

Down count M2A_r0w1r1.

Down count M2A_r1w0r0.

Read all 0s.

001011

chkr_w

Port 1 writes topological checkerboard data to memory.

Page 31 of 37

Document #: 38-06027 Rev. *B

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Table 7. MBIST Control States (continued)

States Code

001001

State Name

chkr_r

Description

All ports read topological checkerboard data.

Port 1 write inverse topological checkerboard data.

All ports read inverse topological checkerboard data.

001000

n_chkr_w

n_chkr_r

011000

011001

011011

011010

011110

011111

011101

uaddr_zeros2

uaddr_write2

uaddr_read2

uaddr_ones2

n_uaddr_write2

n_uaddr_read2

Port 2 write all zeros to memory using Unique Address Algorithm (UAA).

Port 2 writes every address value into its memory location (UAA).

All ports read UAA data.

Port 2 writes all ones to memory.

Port 2 writes inverse address value into memory.

All ports read inverse UAA data.

011001

011011

011010

011110

011111

011101

uaddr_zeros3

uaddr_write3

uaddr_read3

uaddr_ones3

n_uaddr_write3

n_uaddr_read3

Port 3 write all zeros to memory using Unique Address Algorithm (UAA).

Port 3 writes every address value into its memory location (UAA).

All ports read UAA data.

Port 3 writes all ones to memory.

Port 3 writes inverse address value into memory.

All ports read inverse UAA data.

011001

011011

011010

011110

011111

011101

uaddr_zeros4

uaddr_write4

uaddr_read4

uaddr_ones4

n_uaddr_write4

n_uaddr_read4

Port 4 write all zeros to memory using Unique Address Algorithm (UAA).

Port 4 writes every address value into its memory location (UAA).

All ports read UAA data.

Port 4 writes all ones to memory.

Port 4 writes inverse address value into memory.

All ports read inverse UAA data.

110010

complete

Test complete.

Table 8. MBIST Control Register (MCR)

MCR[1:0]

Mode

Non-Debug

Debug

Reserved

Document #: 38-06027 Rev. *B

Page 32 of 37

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Table 9. Boundary Scan Order (continued)

Cell # Signal Name Bump (Ball) ID

84 A10_P3

Table 9. Boundary Scan Order

Cell # Signal Name

A0_P4

Bump (Ball) ID

T20

T19

U19

U18

V20

V19

R17

L18

N18

N17

P17

T17

T18

Y20

W19

U17

V16

V18

V17

L19

M17

Y15

W15

Y16

W16

Y17

W17

Y18

W18

Y19

V12

Y11

W12

Y12

W13

Y13

V15

Y14

W14

K20

J19

A11_P3

A12_P3

A13_P3

A14_P3

A15_P3

CNTINT_P3

CNTRST_P3

MKLD_P3

CNTLD_P3

CNTINC_P3

CNTRD_P3

MKRD_P3

LB_P3

A1_P4

A2_P4

J18

A3_P4

H20

H19

G19

G18

F20

F19

F18

E20

E19

D19

D18

C20

C19

F17

K18

H18

H17

G17

E17

E18

A20

B19

D17

C16

C18

C17

K19

K17

L20

M19

M18

N20

N19

P19

P18

R20

R19

R18

A4_P4

A5_P4

A6_P4

A7_P4

100

102

104

106

108

110

112

114

116

118

120

122

124

126

128

130

132

134

136

138

140

142

144

146

148

150

152

154

156

158

160

162

164

A8_P4

A9_P4

A10_P4

A11_P4

A12_P4

A13_P4

A14_P4

A15_P4

CNTINT_P4

CNTRST_P4

MKLD_P4

CNTLD_P4

CNTINC_P4

CNTRD_P4

MKRD_P4

LB_P4

UB_P3

OE_P3

R/W_P3

CE1_P3

CE0_P3

INT_P3

CLK_P3

IO0_P4

IO1_P4

IO2_P4

IO3_P4

UB_P4

IO4_P4

OE_P4

IO5_P4

R/W_P4

CE1_P4

CE0_P4

INT_P4

CLK_P4

A0_P3

IO6_P4

IO7_P4

IO8_P4

IO0_P3

IO1_P3

IO2_P3

A1_P3

IO3_P3

A2_P3

IO4_P3

A3_P3

IO5_P3

A4_P3

IO6_P3

A5_P3

IO7_P3

A6_P3

IO8_P3

A7_P3

IO0_P1

A8_P3

IO1_P1

A9_P3

Document #: 38-06027 Rev. *B

Page 33 of 37

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Table 9. Boundary Scan Order (continued)

Cell # Signal Name Bump (Ball) ID

166 IO2_P1

Table 9. Boundary Scan Order (continued)

Cell # Signal Name Bump (Ball) ID

248 OE_P2

Y10

168

170

172

174

176

178

180

182

184

186

188

190

192

194

196

198

200

202

204

206

208

210

212

214

216

218

220

222

224

226

228

230

232

234

236

238

240

242

244

246

IO3_P1

IO4_P1

IO5_P1

IO6_P1

IO7_P1

IO8_P1

IO0_P2

IO1_P2

IO2_P2

IO3_P2

IO4_P2

IO5_P2

IO6_P2

IO7_P2

IO8_P2

A0_P2

250

252

254

256

258

260

262

264

266

268

270

272

274

276

278

280

282

284

286

288

290

292

294

296

298

300

302

304

306

308

310

312

314

316

318

320

322

324

326

328

R/W_P2

CE1_P2

CE0_P2

INT_P2

CLK_P2

A0_P1

A1_P1

A2_P1

A3_P1

A4_P1

A5_P1

A6_P1

A7_P1

A8_P1

A9_P1

A10_P1

A11_P1

A12_P1

A13_P1

A14_P1

A15_P1

CNTINT_P1

CNTRST_P1

MKLD_P1

CNTLD_P1

CNTINC_P1

CNTRD_P1

MKRD_P1

LB_P1

A1_P2

A2_P2

A3_P2

A4_P2

A5_P2

A6_P2

A7_P2

A8_P2

A9_P2

A10_P2

A11_P2

A12_P2

A13_P2

A14_P2

A15_P2

CNTINT_P2

CNTRST_P2

MKLD_P2

CNTLD_P2

CNTINC_P2

CNTRD_P2

MKRD_P2

LB_P2

UB_P1

OE_P1

R/W_P1

CE1_P1

CE0_P1

INT_P1

CLK_P1

IO9_P2

IO10_P2

IO11_P2

IO12_P2

UB_P2

Document #: 38-06027 Rev. *B

Page 34 of 37

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Table 9. Boundary Scan Order (continued)

Cell # Signal Name Bump (Ball) ID

330 IO13_P2

332

334

336

338

340

342

344

346

348

350

352

354

356

358

360

362

364

366

368

370

372

374

376

378

380

382

384

386

388

390

392

IO14_P2

IO15_P2

IO16_P2

IO17_P2

IO9_P1

IO10_P1

IO11_P1

IO12_P1

IO13_P1

IO14_P1

IO15_P1

IO16_P1

IO17_P1

IO9_P3

A10

A15

B15

A16

B16

A17

B17

A18

B18

A19

C12

A11

B12

A12

B13

A13

C15

A14

B14

IO10_P3

IO11_P3

IO12_P3

IO13_P3

IO14_P3

IO15_P3

IO16_P3

IO17_P3

IO9_P4

IO10_P4

IO11_P4

IO12_P4

IO13_P4

IO14_P4

IO15_P4

IO16_P4

IO17_P4

Ordering Information

10 Gb/s 3.3V QuadPort DSE Family 1 Mb (64K × 18)

Speed

(MHz)

Package

Name

Operating

Range

Ordering Code

CY7C0430BV-133BGI

CY7C0430CV-133BGI

CY7C0430BV-100BGC

CY7C0430BV-100BGI

Package Type

272-ball Grid Array (BGA)

133

BG272

Industrial

Commercial

Industrial

272-ball Grid Array (BGA)

100

Document #: 38-06027 Rev. *B

Page 35 of 37

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Package Diagram

272-Lead PBGA (27 x 27 x 2.33 mm) BG272

51-85130-*A

QuadPort is a trademark of Cypress Semiconductor Corporation. All product and company names mentioned in this document

are the trademarks of their respective holders.

Document #: 38-06027 Rev. *B

Page 36 of 37

of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be

used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its

products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress

products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.

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Document History Page

Document Title: CY7C0430BV, CY7C0430CV 10 Gb/s 3.3V QuadPort DSE Family

Document Number: 38-06027

Issue

Date

Orig. of

Change

REV.

ECN NO.

109906

115042

Description of Change

09/10/01

05/23/02

SZV

FSG

Change from Spec number: 38-01052 to 38-06027

Remove Preliminary, TM from DSE

Change RUNBIST to CYBIST

Updated ISB values

Added notes 7 and 9

Increased commercial prime bin to 135 MHz

464083

SEE ECN

YDT

Part numbers updated to reflect the recent die revisions

Removed 1/2M and 1/4M parts

Changed title of data sheet

Document #: 38-06027 Rev. *B

Page 37 of 37

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