Seagate Pulsar2 ST200FM0002 User Manual

Product Manual  
®
Pulsar .2 SAS  
Standard Models  
Self-Encrypting Drive Models  
ST800FM0002  
ST800FM0032  
ST400FM0002  
ST400FM0042  
ST200FM0002  
ST200FM0042  
ST100FM0002  
ST100FM0052  
ST800FM0012  
ST800FM0042  
SED FIPS140-2 Models  
ST800FM0022  
100666271  
Rev. C  
March 2013  
CONTENTS  
5.3.6  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
I
CONTENTS  
10.2  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
II  
CONTENTS  
11.7  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
III  
FIGURES  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
IV  
Seagate Technology Support Services  
For information regarding online support and services, visit http://www.seagate.com/about/contact-us/technical-support/  
Available services include:  
Presales & Technical support  
Global Support Services telephone numbers & business hours  
Authorized Service Centers  
Warranty terms will vary based on type of warranty chosen: “Managed Life” or “Usage Based”. Consult your Seagate sales  
representative for warranty terms and conditions.  
For information regarding data recovery services, visit http://www.seagate.com/services-software/data-recovery-services/  
For Seagate OEM and Distribution partner portal, visit http://www.seagate.com/partners  
Pulsar.2 SAS Product Manual, Rev. C  
1
 
1.0 SCOPE  
®
This manual describes Seagate Technology® LLC, Pulsar .2 SAS (Serial Attached SCSI) drives.  
Pulsar.2 drives support the SAS Protocol specifications to the extent described in this manual. The SAS Interface Manual (part number  
100293071) describes the general SAS characteristics of this and other Seagate SAS drives. The Self-Encrypting Drive Reference  
Manual, part number 100515636, describes the interface, general operation, and security features available on Self-Encrypting Drive  
models.  
Product data communicated in this manual is specific only to the model numbers listed in this manual. The data listed in this manual may  
not be predictive of future generation specifications or requirements. If you are designing a system which will use one of the models listed  
or future generation products and need further assistance, please contact your Field Applications Engineer (FAE) or our global support  
Unless otherwise stated, the information in this manual applies to standard and Self-Encrypting Drive models.  
Standard models  
Standard SED models  
FIPS 140-2 LEVEL 2  
ST800FM0002  
ST800FM0032  
ST400FM0002  
ST400FM0042  
ST200FM0002  
ST200FM0042  
ST100FM0002  
ST100FM0052  
ST800FM0012  
ST800FM0042  
ST800FM0022  
Note. Previous generations of Seagate Self-Encrypting Drive models were called Full Disk Encryption (FDE) models before a differ-  
entiation between drive-based encryption and other forms of encryption was necessary.  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
2
   
2.0  
APPLICABLE STANDARDS AND REFERENCE DOCUMENTATION  
The drives documented in this manual have been developed as system peripherals to the highest standards of design and construction.  
The drives depend on host equipment to provide adequate power and environment for optimum performance and compliance with  
applicable industry and governmental regulations. Special attention must be given in the areas of safety, power distribution, shielding,  
audible noise control, and temperature regulation. In particular, the drives must be securely mounted to guarantee the specified  
2.1  
STANDARDS  
The Pulsar.2 family complies with Seagate standards as noted in the appropriate sections of this manual and the Seagate SAS Interface  
Manual, part number 100293071.  
The drives are recognized in accordance with UL 60950 and CSA 60950 as tested by UL(CSA) and EN60950 as tested by TUV.  
The security features of Self-Encrypting Drive models are based on the “TCG Storage Architecture Core Specification” and the “TCG  
Storage Workgroup Security Subsystem Class: Enterprise_A” specification with additional vendor-unique features as noted in this product  
manual.  
2.1.1  
Electromagnetic compatibility  
The drive, as delivered, is designed for system integration and installation into a suitable enclosure prior to use. The drive is supplied as a  
subassembly and is not subject to Subpart B of Part 15 of the FCC Rules and Regulations nor the Radio Interference Regulations of the  
Canadian Department of Communications.  
The design characteristics of the drive serve to minimize radiation when installed in an enclosure that provides reasonable shielding. The  
drive is capable of meeting the Class B limits of the FCC Rules and Regulations of the Canadian Department of Communications when  
properly packaged; however, it is the user’s responsibility to assure that the drive meets the appropriate EMI requirements in their system.  
Shielded I/O cables may be required if the enclosure does not provide adequate shielding. If the I/O cables are external to the enclosure,  
shielded cables should be used, with the shields grounded to the enclosure and to the host controller.  
2.1.1.1  
Electromagnetic susceptibility  
As a component assembly, the drive is not required to meet any susceptibility performance requirements. It is the responsibility of those  
integrating the drive within their systems to perform those tests required and design their system to ensure that equipment operating in the  
same system as the drive or external to the system does not adversely affect the performance of the drive. See Tables 10 through 12, DC  
power requirements.  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
3
                                 
2.1.2  
Electromagnetic compliance  
Seagate uses an independent laboratory to confirm compliance with the directives/standards for CE Marking and C-Tick Marking. The  
drive was tested in a representative system for typical applications. The selected system represents the most popular characteristics for  
test platforms. The system configurations include:  
• Typical current use microprocessor  
• Keyboard  
• Monitor/display  
• Printer  
• Mouse  
Although the test system with this Seagate model complies with the directives/standards, we cannot guarantee that all systems will comply.  
The computer manufacturer or system integrator shall confirm EMC compliance and provide the appropriate marking for their product.  
Electromagnetic compliance for the European Union  
If this model has the CE Marking it complies with the European Union requirements of the Electromagnetic Compatibility Directive 2004/  
108/EC as put into place on 20 July 2007.  
Australian C-Tick  
If this model has the C-Tick Marking it complies with the Australia/New Zealand Standard AS/NZ CISPR22 and meets the Electromagnetic  
Compatibility (EMC) Framework requirements of Australia’s Spectrum Management Agency (SMA).  
Korean KCC  
If these drives have the Korean Communications Commission (KCC) logo, they comply with KN22 and KN61000.  
Taiwanese BSMI  
If this model has the Taiwanese certification mark then it complies with Chinese National Standard, CNS13438.  
2.1.3  
European Union Restriction of Hazardous Substances (RoHS)  
The European Union Restriction of Hazardous Substances (RoHS) Directive restricts the presence of chemical substances, including Lead  
(Pb), in electronic products effective July 2006.  
A number of parts and materials in Seagate products are procured from external suppliers. We rely on the representations of our suppliers  
regarding the presence of RoHS substances in these parts and materials. Our supplier contracts require compliance with our chemical  
substance restrictions, and our suppliers document their compliance with our requirements by providing material content declarations for  
all parts and materials for the drives documented in this publication. Current supplier declarations include disclosure of the inclusion of any  
RoHS-regulated substance in such parts or materials.  
Seagate also has internal systems in place to ensure ongoing compliance with the RoHS Directive and all laws and regulations which  
restrict chemical content in electronic products. These systems include standard operating procedures that ensure that restricted  
substances are not utilized in our manufacturing operations, laboratory analytical validation testing, and an internal auditing process to  
ensure that all standard operating procedures are complied with.  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
4
         
2.1.4  
China Restriction of Hazardous Substances (RoHS) Directive  
This product has an Environmental Protection Use Period (EPUP) of 20 years. The following table contains information  
mandated by China's "Marking Requirements for Control of Pollution Caused by Electronic Information Products" Standard.  
"O" indicates the hazardous and toxic substance content of the part (at the homogenous material level) is lower than the threshold defined  
by the China RoHS MCV Standard.  
"X" indicates the hazardous and toxic substance content of the part (at the homogenous material level) is over the threshold defined by the  
China RoHS MCV Standard.  
2.2  
REFERENCE DOCUMENTS  
SCSI Commands Reference Manual  
Seagate part number: 100293068  
SAS Interface Manual  
ANSI SAS Documents  
Seagate part number: 100293071  
SFF-82232.5” Drive Form Factor with Serial Connector  
SFF-8460HSS Backplane Design Guidelines  
SFF-8470Multi Lane Copper Connector  
SFF-8482SAS Plug Connector  
ANSI INCITS.xxx Serial Attached SCSI (SAS-2) Standard (T10/1760-D)  
ISO/IEC 14776-xxxSCSI Architecture Model-3 (SAM-4) Standard (T10/1683-D)  
ISO/IEC 14776-xxxSCSI Primary Commands-3 (SPC-4) Standard (T10/1731-D)  
ISO/IEC 14776-xxxSCSI Block Commands-3 (SBC-3) Standard (T10/1799-D)  
ANSI Small Computer System Interface (SCSI) Documents  
X3.270-1996(SCSI-3) Architecture Model  
Trusted Computing Group (TCG) Documents (apply to Self-Encrypting Drive models only)  
TCG Storage Architecture Core Specification, Rev. 1.0  
TCG Storage Security Subsystem Class Enterprise Specification, Rev. 1.0  
Self-Encrypting Drives Reference Manual  
JEDEC Standards  
Seagate part number: 100515636  
JESD218 - Solid-State Drive (SSD) Requirements and Endurance Test Method  
JESD219 - Solid-State Drive (SSD) Endurance Workloads  
In case of conflict between this document and any referenced document, this document takes precedence.  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
5
               
3.0  
GENERAL DESCRIPTION  
Pulsar.2 drives provide high performance, high capacity data storage for a variety of systems with a Serial Attached SCSI (SAS) interface.  
The Serial Attached SCSI interface is designed to meet next-generation computing demands for performance, scalability, flexibility and  
high-density storage requirements.  
Pulsar.2 drives are random access storage devices designed to support the Serial Attached SCSI Protocol as described in the ANSI  
specifications, this document, and the SAS Interface Manual (part number 100293071) which describes the general interface  
characteristics of this drive. Pulsar.2 drives are classified as intelligent peripherals and provide level 2 conformance (highest level) with the  
ANSI SCSI-1 standard. The SAS connectors, cables and electrical interface are compatible with Serial ATA (SATA), giving future users the  
choice of populating their systems with either SAS or SATA drives. This allows users to continue to leverage existing investment in SCSI  
while gaining a 6Gb/s serial data transfer rate.  
The Self-Encrypting Drive models indicated on the cover of this product manual have provisions for “Security of Data at Rest” based on the  
standards defined by the Trusted Computing Group (see www.trustedcomputinggroup.org).  
Note. Never disassemble and do not attempt to service items in the enclosure. The drive does not contain user-replaceable parts.  
Opening for any reason voids the drive warranty.  
3.1  
STANDARD FEATURES  
Pulsar.2 SAS drives have the following standard features:  
• 1.5 / 3.0 / 6.0 Gb Serial Attached SCSI (SAS) interface  
• Integrated dual port SAS controller supporting the SCSI protocol  
• Support for SAS expanders and fanout adapters  
• Firmware downloadable using the SAS interface  
• 128 - deep task set (queue)  
• Supports up to 32 initiators  
• Jumperless configuration  
• User-selectable logical block size (512, 520, 524, 528, 4096, 4160, 4192, or 4224 bytes per logical block)  
• Industry standard SFF 2.5-inch dimensions  
• ECC maximum burst correction length of 96 bits  
• No preventive maintenance or adjustments required  
• Self diagnostics performed when power is applied to the drive  
• Vertical, horizontal, or top down mounting  
• Drive Self Test (DST)  
• Background Media Scan (BMS)  
• Parallel flash access channels  
• Power loss data protection  
• Thin Provisioning with Block Unmap Support  
• Silent operation  
• Lifetime Endurance Management (available on certain models)  
Pulsar.2 SAS Self-Encrypting Drive models have the following additional features:  
• Automatic data encryption/decryption  
• Controlled access  
• Random number generator  
• Drive locking  
• 16 independent data bands  
• Cryptographic erase of user data for a drive that will be repurposed or scrapped  
• Authenticated firmware download  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
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3.2  
MEDIA DESCRIPTION  
The media used on the drive consists of Multi Layer Cell (MLC) NAND Flash for improved reliability and performance.  
3.3  
PERFORMANCE  
• Programmable multi-segmentable cache buffer  
• 600MB/s maximum instantaneous data transfers.  
• Background processing of queue  
• Non-Volatile Write Cache  
Note. There is no significant performance difference between Self-Encrypting Drive and standard (non-Self-Encrypting Drive) mod-  
els.  
3.4  
RELIABILITY  
• Annualized Failure Rate (AFR) of 0.44%  
• Mean time between failures (MTBF) of 2,000,000 hours  
• Incorporates industry-standard Self-Monitoring Analysis and Reporting Technology (S.M.A.R.T.)  
• "Managed Life" or "Usage Based" warranty options [1]  
[1]  
Warranty terms will vary based on type of warranty chosen: “Managed Life” or “Usage Based” Consult your Seagate sales representative for war-  
ranty terms and conditions.  
3.5  
FORMATTED CAPACITIES  
Standard OEM models are formatted to 512 bytes per block. The block size is selectable at format time and must be a multiple of 4 bytes.  
Users having the necessary equipment may modify the data block size before issuing a FORMAT UNIT command and obtain different  
formatted capacities than those listed.  
To provide a stable target capacity environment and at the same time provide users with flexibility if they choose, Seagate recommends  
product planning in one of two modes:  
Seagate designs specify capacity points at certain block sizes that Seagate guarantees current and future products will meet. We  
recommend customers use this capacity in project planning, as it ensures a stable operating point with backward and forward compatibility  
from generation to generation. The current guaranteed operating points for this product are shown below. The Capacity stated is identical  
when the drive is formatted with or without PI enabled.  
Table 1: Formatted Capacity LBA Count  
CAPACITY (LBAS)  
800GB  
400GB  
200GB  
100GB  
LBA  
SIZE  
DECIMAL  
HEX  
DECIMAL  
HEX  
DECIMAL  
HEX  
DECIMAL  
HEX  
1,562,824,368  
1,529,743,600  
1,509,354,136  
1,487,666,080  
195,353,046  
192,307,693  
190,839,695  
189,393,940  
5D26CEB0h  
781,422,768  
764,871,800  
754,677,072  
743,833,040  
97,677,846  
96,153,847  
95,419,848  
94,696,970  
2E9390B0h  
390,721,968  
382,435,904  
1749F1B0h  
195,371,568  
191,217,952  
BA52230h  
512  
5B2E08F0h  
59F6EA98h  
58ABFBA0h  
BA4D9D6h  
B7661EDh  
B5FFB8Fh  
B49EC14h  
2D970478h  
2CFB7550h  
2C55FDD0h  
5D27216h  
5BB30F7h  
5AFFDC8h  
5A4F60Ah  
16CB8240h  
B65C120h  
520  
524  
377,338,536 167DBAA8h 188,669,272 B3EDD58h  
371,916,520  
48,840,246  
48,076,924  
47,709,924  
47,348,485  
162AFEE8h  
2E93E36h  
2DD987Ch  
2D7FEE4h  
2D27B05h  
185,958,264  
24,421,446  
24,038,462  
23,854,962  
23,674,243  
B157F78h  
174A446h  
16ECC3Eh  
16BFF72h  
1693D83h  
528  
4096  
4160  
4192  
4224  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
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3.6  
PROGRAMMABLE DRIVE CAPACITY  
Using the MODE SELECT command, the drive can change its capacity to something less than maximum. See the MODE SELECT (6)  
parameter list table in the SAS Interface Manual, part number 100293071. A value of zero in the Number of Blocks field indicates that the  
drive will not change the capacity it is currently formatted to have. A number other than zero and less than the maximum number of LBAs  
in the Number of Blocks field changes the total drive capacity to the value in the Number of Blocks field. A value greater than the maximum  
number of LBAs is rounded down to the maximum capacity.  
3.7  
FACTORY-INSTALLED OPTIONS  
OEMs may order the following items which are incorporated at the manufacturing facility during production or packaged before shipping.  
Some of the options available are (not an exhaustive list of possible options):  
• Other capacities can be ordered depending on sparing scheme and LBA size requested.  
• Single-unit shipping pack. The drive is normally shipped in bulk packaging to provide maximum protection against transit damage. Units  
shipped individually require additional protection as provided by the single unit shipping pack. Users planning single unit distribution  
should specify this option.  
• The Safety and Regulatory Agency Specifications, part number 75789512, is usually included with each standard OEM drive shipped,  
but extra copies may be ordered.  
3.8  
THIN PROVISIONING  
3.8.1  
Logical Block Provisioning  
The drive is designed with a feature called Thin Provisioning. Thin Provisioning is a technique which does not require Logical Blocks to be  
associated to Physical Blocks on the storage medium until such a time as needed. The use of Thin Provisioning is a major factor in SSD  
products because it reduces the amount of wear leveling and garbage collection that must be performed. The result is an increase in the  
products endurance. For more details on Logical Block Provisioning and Thin Provisioning, Reference the SBC-3 document provided by  
the T-10 committee.  
3.8.2  
Thin Provisioning capabilities  
The level of Thin Provisioning support may vary by product model. Devices that support Thin Provisioning are allowed to return a default  
data pattern for read requests made to Logical Blocks that have not been mapped to Physical Blocks by a previous WRITE command.  
In order to determine if Thin Provisioning is supported and what features of it are implemented requires the system to send a READ  
CAPACITY 16 (9Eh) command to the drive. Thin Provisioning and the READ CAPACITY 16 (9Eh) command is defined in the Seagate  
SCSI Command Reference 100293068..  
Table 2 Thin Provisioning Product Configuration  
Product Configuration  
Non-SED  
LBPME  
LBPRZ  
Supported  
Supported  
Supported  
Not Supported  
SED  
A logical block provisioning management enabled (LBPME) bit set to one indicates that the logical unit implements logical block  
provisioning management. An LBPME bit set to zero indicates that the logical unit is fully provisioned and does not implement logical block  
provisioning management.  
A logical block provisioning read zeros (LBPRZ) bit set to one indicates that, for an unmapped LBA specified by a read operation, the  
device server sends user data with all bits set to zero to the data-in buffer. An LBPRZ bit set to zero indicates that, for an unmapped LBA  
specified by a read operation, the device server may send user data with all bits set to any value to the data-in buffer.  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
8
                 
3.8.3  
UNMAP  
The UNMAP command requests that the device server break the association of a specific Logical Block address from a Physical Block,  
thereby freeing up the Physical Block from use and no longer requiring it to contain user data. An unmapped block will respond to a READ  
command with data that is determined by the setting of the LBPRZ bit in the READ CAPACITY parameter data.  
3.8.4  
FORMAT UNIT command  
A device which supports Thin Provisioning will be capable of performing a SCSI FORMAT UNIT command which allocates Logical Blocks  
Addresses that are not linked to Physical Block Locations. A FORMAT command will cause all LBAs to become unmapped.  
3.8.5  
Protection Information (PI) and Security (SED)  
The requirements in this section apply to any device which supports LBA unmapping.  
In SCSI devices, umapped LBAs are defined as part of the Thin Provisioning model. Support of the Thin Provisioning model is indicated by  
the LBPME bit having a value of '1' in the READ CAPACITY (16) parameter data.  
When a region of LBA's are erased via cryptographic erase, as part of the erase, the drive shall unmap those LBAs.  
If the host attempts to access an unmapped or trimmed LBA, the drive shall return scrambled data. For a given LBA, the data shall be  
identical from access to access, until that LBA is either updated with actual data from the host or that LBA is cryptographically erased. The  
drive shall report a value of '0' in the LBPRZ field returned in the READ CAPACITY (16) parameter data.  
If the host attempts to access an unmapped LBA on a drive that has been formatted with Protection Information (PI), the drive shall return  
scrambled PI data for that LBA. Depending on the value of the RDPROTECT field in the data-access command CDB, this may result in the  
drive returning a standard PI error to the host.  
If the host reduces the addressable capacity of the drive via a MODE SELECT command, the drive shall unmap or trim any LBA within the  
inaccessible region of the device.  
Additionally, an UNMAP command is not permitted on a locked band.  
Table 3 PI and SED Drive Configuration  
DRIVE CONFIGURATION  
Standard  
Enabled  
SED  
PI Setting  
Disabled  
Disabled  
Enabled  
PROT_EN bit  
LBPME bit  
0
1
1
1
1
1
0
1
0
1
1
LBPRZ bit  
0
PI Check Requested  
N/A  
Yes  
No  
N/A  
Yes  
No  
DATA Returned for  
Thin Provisioned LBA  
0x00  
0x00  
0x00  
Random  
None  
None  
None  
Random  
PI Returned for  
Thin Provisioned LBA  
Scrambled  
PI data  
None  
0xFF  
0xFF  
PI Check Performed  
N/A  
No  
No  
No  
No  
No  
N/A  
No  
Yes  
Yes  
No  
No  
Error reported to Host  
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4.0  
PERFORMANCE CHARACTERISTICS  
This section provides detailed information concerning performance-related characteristics and features of Pulsar.2 drives.  
Note. Data provided is based on format at 512-bytes.  
4.1  
INTERNAL DRIVE CHARACTERISTICS  
Drive capacity  
800400  
200100  
GB (formatted, rounded off value)  
Flash Memory Type  
Emulated LBA Size  
Native Programmable  
Page Size  
Default Transfer  
Alignment Offset  
NAND MLC  
512, 520, 524, 528, 4096, 4160, 4192, or 4224  
8192 User Bytes  
0
4.2  
PERFORMANCE CHARACTERISTICS  
See Section 11.4.1, "SAS physical interface" and the SAS Interface Manual (part number 100293071) for additional timing details.  
4.2.1  
Access time  
Access measurements are taken with nominal power at 25°C ambient temperature. All times are measured using drive diagnostics. The  
specifications in the table below are defined as follows:  
Page-to-page access time is an average of all possible page-to-page accesses in both directions for a sequentially preconditioned  
drive.  
Average access time is a true statistical random average of at least 5000 measurements of accesses between programmable  
pages on a randomly preconditioned drive.  
Table 4 Typical Access Time (μsec)  
400, 200, 100 GB 1,2  
1 2  
,
800GB  
READ  
WRITE  
READ  
227  
60  
WRITE  
120  
Average  
293  
62  
137  
136  
3
Page to Page  
Typical  
120  
Average Latency  
273  
206  
1.  
2.  
3.  
Execution time measured from receipt of the Command to the Response.  
Assumes no errors.  
Typical access times are measured under nominal conditions of temperature, voltage, and horizontal orientation as measured on a  
representative sample of drives.  
Note. These drives are designed to provide the highest possible performance under typical conditions.  
However, due to the nature of Flash memory technologies there are many factors that can result in  
values different than those stated in this specification  
2.  
4.2.2  
FORMAT UNIT command execution time for 512-byte LBA’s (minutes)  
The device may be formatted as either a Thin Provisioned device or a Fully Provisioned device. The default format is Thin Provisioned and  
is recommended for most applications. Thin Provisioning provides the most flexibility for the device to manage the flash medium to  
maximize endurance.  
Table 5 Maximum FORMAT UNIT Times (minutes)  
Format Mode  
DCRT Bit IP Bit 800GB 400GB 200GB 100GB  
CONFIGURATION  
Non-SED  
Non-SED  
Non-SED  
Non-SED  
SED  
(Default) Thin Provisioned  
(Default) Thin Provisioned  
Fully Provisioned  
DCRT = 0  
DCRT = 1  
DCRT = 0  
DCRT = 1  
DCRT = 0  
DCRT = 1  
DCRT = 0  
DCRT = 1  
IP = 0  
IP = 0  
IP = 1  
IP = 1  
IP = 0  
IP = 0  
IP = 1  
IP = 1  
5
5
5
5
5
5
5
5
430  
280  
5
130  
100  
N/A  
N/A  
N/A  
N/A  
70  
60  
Fully Provisioned  
50  
30  
(Default) Thin Provisioned  
(Default) Thin Provisioned  
Fully Provisioned  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
SED  
5
SED  
430  
280  
SED  
Fully Provisioned  
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10  
                           
4.2.3  
Performance  
Table 6 Performance (Managed Life Warranty)  
ST800FM00  
02  
ST800FM00  
12  
NOTE  
S
ST400FM00  
02  
ST200FM00  
02  
ST100FM00  
02  
ST800FM00  
22  
600MB/s  
Maximum Burst Transfer Rate  
Peak sequential 128KB read/write  
[1]  
370/200  
370/140  
370/190  
370/35  
data transfer rate (MB/s max)  
Sustained sequential 128KB read/  
[1]  
370/200  
370/70  
write data transfer rate (MB/s)  
Peak 4KB random read/write  
[2]  
48,000/15,000  
48,000/11,000  
48,000/12,000  
48,000/2800  
command rate (IOPs)  
Sustained 4KB random read/write  
[2]  
48,000/15,000  
48,000/5500  
command rate (IOPs)  
Sustainable 4KB Random combined  
[3]  
23,000  
22,000  
IOPS for 5 year Endurance  
(65%/35% R/W, 70% Duty Cycle)  
Table 7 Performance (Usage Based Warranty)  
ST800FM00  
NOTE  
S
32  
ST800FM00  
42  
ST400FM00  
42  
ST200FM00  
42  
ST100FM00  
52  
600MB/s  
Maximum Burst Transfer Rate  
Peak sequential 128KB read/write  
[1]  
370/200  
370/200  
370/190  
370/190  
data transfer rate (MB/s max)  
Sustained sequential 128KB read/  
[1]  
write data transfer rate (MB/s)  
Peak 4KB random read/write  
[2]  
48,000/15,000  
48,000/15,000  
48,000/12,000  
48,000/12,000  
command rate (IOPs)  
Sustained 4KB random read/write  
[2]  
command rate (IOPs)  
Sustainable 4KB Random combined  
[3]  
23,000  
22,000  
IOPS for 5 year Endurance  
(65%/35% R/W, 70% Duty Cycle)  
[1]  
[2]  
[3]  
Testing performed at Queue Depth = 32, Sequentially Preconditioned drive, using IOMeter 2006.7.27.  
Testing performed at Queue Depth = 32, Randomly Preconditioned drive, using IOMeter 2006.7.27.  
Testing performed at Queue Depth = 32, Non-Preconditioned drive, using IOMeter 2006.7.27.  
IOMeter is licensed under the Intel Open Source License and the GNU General Public License. Intel does not endorse any IOM-  
eter results.  
Peak performance is defined as the typical best case performance that the product will be able to achieve when the product is  
preconditioned as mentioned and host commands are aligned on 4KB boundaries.  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
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Sustained performance is defined as the worst case performance that the product will be able to achieve when the product is  
preconditioned as mentioned and host commands are aligned on 4KB boundaries. For models that support Lifetime Endurance  
Management, write values also take into account the worst case performance throttling that may occur to ensure the product meets  
specified reliability specifications.  
Due to the nature of Flash memory technologies there are many factors that can result in values different than those stated in this  
specification. Some discrepancies can be caused by bandwidth limitations in the host adapter, operating system, or driver limitations. It is  
not the intent of this manual to cover all possible causes of performance discrepancies.  
When evaluating performance of SSD devices, it is recommended to measure performance of the device in a method that resembles the  
targeted application using real world data and workloads. Test time should also be adequately large to ensure that sustainable metrics and  
measures are obtained.  
4.3  
START/STOP TIME  
The drive accepts the commands listed in the SAS Interface Manual less than 3 seconds after DC power has been applied.  
If the drive receives a NOTIFY (ENABLE SPINUP) primitive through either port and has not received a START STOP UNIT command with  
the START bit equal to 0, the drive becomes ready for normal operations within 15 seconds (excluding the error recovery procedure).  
If the drive receives a START STOP UNIT command with the START bit equal to 0 before receiving a NOTIFY (ENABLE SPINUP)  
primitive, the drive waits for a START STOP UNIT command with the START bit equal to 1. After receiving a START STOP UNIT command  
with the START bit equal to 1, the drive waits for a NOTIFY (ENABLE SPINUP) primitive. After receiving a NOTIFY (ENABLE SPINUP)  
primitive through either port, the drive becomes ready for normal operations within 15 seconds (excluding the error recovery procedure).  
If the drive receives a START STOP UNIT command with the START bit and IMMED bit equal to 1 and does not receive a NOTIFY  
(ENABLE SPINUP) primitive within 5 seconds, the drive fails the START STOP UNIT command.  
The START STOP UNIT command may be used to command the drive to stop. Stop time is 3 seconds (maximum) from removal of DC  
power. SCSI stop time is 3 seconds. There is no power control switch on the drive.  
4.4  
CACHE CONTROL  
All default cache mode parameter values (Mode Page 08h) for standard OEM versions of this drive family are given in Table 20 and 21.  
4.4.1  
Caching write data  
Write caching is a write operation by the drive that makes use of a drive buffer storage area where the data to be written to the medium is  
stored while the drive performs the WRITE command.  
If the number of write data logical blocks exceed the size of the segment being written into, when the end of the segment is reached, the  
data is written into the beginning of the same cache segment, overwriting the data that was written there at the beginning of the operation;  
however, the drive does not overwrite data that has not yet been written to the medium.  
If write caching is enabled (WCE=1), then the drive may return Good status on a WRITE command after the data has been transferred into  
the cache, but before the data has been written to the medium. If an error occurs while writing the data to the medium, and Good status  
has already been returned, a deferred error will be generated.  
Data that has not been written to the medium is protected by a back up power source which provides the ability of the data to be written to  
non-volatile medium in the event of an unexpected power loss.  
The SYNCHRONIZE CACHE command may be used to force the drive to write all cached write data to the medium. Upon completion of a  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
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5.0  
RELIABILITY SPECIFICATIONS  
The following reliability specifications assume correct host and drive operational interface, including all interface timings, power supply  
voltages, environmental requirements and drive mounting constraints.  
1
Read Error Rates  
Unrecovered Data  
Miscorrected Data  
Less than 1 LBA in 1016 bits transferred  
Less than 1 LBA in 1021 bits transferred  
Less than 1 error in 1012 bits transferred  
2,000,000 hours  
Interface error rate:  
Mean Time Between Failure (MTBF):  
Annualized Failure Rate (AFR):  
Preventive maintenance:  
0.44%  
None required  
Typical Data Retention with  
3 months  
2
Power removed (at 40C)  
Endurance Rating:  
Method 1: Full drive writes per day 10  
Method 2: TBW (per JEDEC JESD218 800GB = 17,800 TB  
400GB = 8800 TB  
200GB = 4400 TB  
100GB = 2200 TB  
1. Error rate specified with automatic retries and data correction with ECC enabled and all flaws reallocated.  
2. As NAND Flash devices age with use, the capability of the media to retain a programmed value begins to deteriorate.  
This deterioration is affected by the number of times a particular memory cell is programmed and subsequently erased.  
When a device is new, it has a powered off data retention capability of up to several years. With use the retention ca-  
pability of the device is reduced. Temperature also has an effect on how long a Flash component can retain its pro-  
grammed value with power removed. At high temperature the retention capabilities of the device are reduced. Data  
retention is not an issue with power applied to the SSD. The SSD drive contains firmware and hardware features that  
can monitor and refresh memory cells when power is applied.  
3. Endurance rating is the expected amount of host data that can be written by product when subjected to a specified work-  
load at a specified operating and storage temperature. For the specific workload to achieve this level of endurance,  
please reference JEDEC Specification JESD218. TBW is defined as 1x10^12 Bytes.  
5.1  
ERROR RATES  
The error rates stated in this manual assume the following:  
• The drive is operated in accordance with this manual using DC power as defined in paragraph 6.3, "DC power requirements."  
• Errors caused by host system failures are excluded from error rate computations.  
• Assume random data.  
• Default OEM error recovery settings are applied. This includes AWRE, ARRE, full read retries, full write retries and full retry time.  
5.1.1  
Unrecoverable Errors  
An unrecoverable data error is defined as a failure of the drive to recover data from the media. These errors occur due to read or write  
problems. Unrecoverable data errors are only detected during read operations, but not caused by the read. If an unrecoverable data error  
is detected, a MEDIUM ERROR (03h) in the Sense Key will be reported. Multiple unrecoverable data errors resulting from the same cause  
are treated as 1 error.  
5.1.2  
Interface errors  
An interface error is defined as a failure of the receiver on a port to recover the data as transmitted by the device port connected to the  
receiver. The error may be detected as a running disparity error, illegal code, loss of word sync, or CRC error.  
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5.2  
ENDURANCE MANAGEMENT  
Customer satisfaction with Solid State Drives can be directly related to the internal algorithms which an SSD uses to manage the limited  
number of Program-Erase (PE) cycles that NAND Flash can withstand. These algorithms consist of Wearleveling, Garbage Collection,  
Write Amplification, Unmap, Data Retention, Lifetime Endurance Management.  
5.2.1  
Wear Leveling  
Wear Leveling is a technique used by the drive to ensure that all Flash cells are written to or exercised as evenly as possible to avoid any  
hot spots where some cells are used up faster than other locations. Wear Leveling is automatically managed by the drive and requires no  
user interaction. The Seagate algorithm is tuned to operate only when needed to ensure reliable product operation.  
5.2.2  
Garbage Collection  
Garbage Collection is a technique used by the drive to consolidate valid user data into a common cell range freeing up unused or obsolete  
locations to be erased and used for future storage needs. Garbage Collection is automatically managed by the drive and requires no user  
interaction. The Seagate algorithm is tuned to operate only when needed to ensure reliable product operation.  
5.2.3  
Write Amplification  
While Write Amplification is not an algorithm, it is a major characteristic of SSD's that must be accounted for by all the algorithms that the  
SSD implements. The Write Amplification Factor of an SSD is defined as the ratio of Host/User data requested to be written to the actual  
amount of data written by the SSD internal to account for the user data and the housekeeping activities such as Wear Leveling and  
Garbage Collection. The Write Amplification Factor of an SSD can also be directly affected by the characteristics of the host data being  
sent to the SSD to write. The best Write Amplification Factor is achieved for data that is written in sequential LBA's that are aligned on 4KB  
boundaries. The worst case Write Amplification Factor typically occurs for randomly written LBA's of transfer sizes that are less than 4KB  
and that originate on LBA's that are not on 4KB boundaries.  
5.2.4  
UNMAP  
A new SCSI command has been added to the SSD as part of the Thin Provisioning feature set. Use of the UNMAP command reduces the  
Write Amplification Factor of the drive during housekeeping tasks such as Wear Leveling and Garbage Collection. This is accomplished  
because the drive does not need to retain data which has been classified by the host as obsolete.  
5.2.5  
Data Retention  
Data Retention is another major characteristic of SSD's that must be accounted for by all the algorithms that the SSD implements. While  
powered up, the Data Retention of SSD cells are monitored and rewritten if the cell levels decay to an unexpected level. Data Retention  
when the drive is powered off is affected by Program and Erase (PE) cycles and the temperature of the drive when stored.  
5.2.6  
Lifetime Endurance Management (Available on select models)  
write workload could be such that the drive experiences a high Write Amplification Factor that could lead to potential wear out prior to the  
drive achieving it's expected field life. Additionally, the Data Retention spec of the SSD needs to be considered to ensure the spec is met  
once the drive is worn out. Seagate has implemented a Lifetime Endurance Management technique which helps OEMS and user to avoid  
early wear out. By monitoring the write workload being sent to the drive, the drive can add additional response time to WRITE commands  
to provide a sustainable level of performance that is capable of being sustained for the life of the drive. Most users may never see this  
added response time in their applications.  
5.2.7  
SSD Percentage Used Endurance Indicator  
An application can interrogate the drive through the host to determine an estimate of the percentage of device life that has been used. To  
accomplish this, issue a LOG SENSE command to log page 0x11. This allows applications to read the contents of the Percentage Used  
Endurance Indicator parameter code. The Percentage Used Endurance Indicator is defined in the T10 document SBC-3 available from the  
T10 committee.  
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5.3  
RELIABILITY AND SERVICE  
Integrators can enhance the reliability of Pulsar.2 drives by ensuring that the drive receives adequate cooling. Section 6.0 provides  
temperature measurements and other information that may be used to enhance the service life of the drive. Section 10.2 provides  
recommended air-flow information.  
5.3.1  
Annualized Failure Rate (AFR) and Mean Time Between Failure (MTBF)  
The production drive shall achieve an AFR of 0.44% (MTBF of 2,000,000 hours) when operated in an environment that ensures the case  
may increase the product AFR (decrease the MTBF). The AFR (MTBF) is a population statistic not relevant to individual units.  
The AFR (MTBF) specification is based on the following assumptions for Enterprise Storage System environments:  
• 8760 power-on hours per year.  
• 250 average on/off cycles per year.  
• Operations at nominal voltages.  
the specifications in Section 6.5 will increase the product AFR and decrease the MTBF.  
5.3.2  
Preventive maintenance  
No routine scheduled preventive maintenance is required.  
5.3.3  
Hot plugging the drive  
When a drive is powered on by switching the power or hot plugged, the drive runs a self test before attempting to communicate on its’  
interfaces. When the self test completes successfully, the drive initiates a Link Reset starting with OOB. An attached device should  
respond to the link reset. If the link reset attempt fails, or any time the drive looses sync, the drive initiated link reset. The drive will initiate  
link reset once per second but alternates between port A and B. Therefore each port will attempt a link reset once per 2 seconds assuming  
both ports are out of sync.  
If the self-test fails, the drive does not respond to link reset on the failing port.  
Note. It is the responsibility of the systems integrator to assure that no temperature, energy, voltage hazard, or ESD potential hazard  
is presented during the hot connect/disconnect operation. Discharge the static electricity from the drive carrier prior to insert-  
ing it into the system.  
5.3.4  
S.M.A.R.T.  
S.M.A.R.T. is an acronym for Self-Monitoring Analysis and Reporting Technology. This technology is intended to recognize conditions that  
indicate imminent drive failure and is designed to provide sufficient warning of a failure to allow administrators to back up the data before  
an actual failure occurs.  
Note. The drive’s firmware monitors specific attributes for degradation over time but can’t predict instantaneous drive failures.  
Each monitored attribute has been selected to monitor a specific set of failure conditions in the operating performance of the drive and the  
thresholds are optimized to minimize “false” and “failed” predictions.  
Controlling S.M.A.R.T.  
The operating mode of S.M.A.R.T. is controlled by the DEXCPT and PERF bits on the Informational Exceptions Control mode page (1Ch).  
Use the DEXCPT bit to enable or disable the S.M.A.R.T. feature. Setting the DEXCPT bit disables all S.M.A.R.T. functions. When enabled,  
S.M.A.R.T. collects on-line data as the drive performs normal read and write operations. When the PERF bit is set, the drive is considered  
to be in “On-line Mode Only” and will not perform off-line functions.  
An application can measure off-line attributes and force the drive to save the data by using the REZERO UNIT command. Forcing  
S.M.A.R.T. resets the timer so that the next scheduled interrupt is in one hour.  
An application can interrogate the drive through the host to determine the time remaining before the next scheduled measurement and  
data logging process occurs. To accomplish this, issue a LOG SENSE command to log page 0x3E. This allows applications to control  
when S.M.A.R.T. interruptions occur. Forcing S.M.A.R.T. with the REZERO UNIT command resets the timer.  
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Performance impact  
S.M.A.R.T. attribute data is saved to the media so that the events that caused a predictive failure can be recreated. The drive measures  
and saves parameters once every hour subject to an idle period on the drive interfaces. The process of measuring off-line attribute data  
and saving data to the media is interruptible. The maximum on-line only processing delay is summarized below  
Maximum processing delay  
Fully-enabled delay  
DEXCPT = 0  
S.M.A.R.T. delay times  
75 ms  
Reporting control  
Reporting is controlled by the MRIE bits in the Informational Exceptions Control mode page (1Ch). Subject to the reporting method. For  
example, if the MRIE is set to one, the firmware will issue to the host an 01-5D00 sense code. The FRU field contains the type of predictive  
failure that occurred. The error code is preserved through bus resets and power cycles.  
Determining rate  
S.M.A.R.T. monitors the rate at which errors occur and signals a predictive failure if the rate of degraded errors increases to an  
unacceptable level. To determine rate, error events are logged and compared to the number of total operations for a given attribute. The  
interval defines the number of operations over which to measure the rate. The counter that keeps track of the current number of operations  
is referred to as the Interval Counter.  
S.M.A.R.T. measures error rates. All errors for each monitored attribute are recorded. A counter keeps track of the number of errors for the  
current interval. This counter is referred to as the Failure Counter.  
Error rate is the number of errors per operation. The algorithm that S.M.A.R.T. uses to record rates of error is to set thresholds for the  
number of errors and appropriate interval. If the number of errors exceeds the threshold before the interval expires, the error rate is  
considered to be unacceptable. If the number of errors does not exceed the threshold before the interval expires, the error rate is  
considered to be acceptable. In either case, the interval and failure counters are reset and the process starts over.  
Predictive failures  
S.M.A.R.T. signals predictive failures when the drive is performing unacceptably for a period of time. The firmware keeps a running count  
of the number of times the error rate for each attribute is unacceptable. To accomplish this, a counter is incremented each time the error  
rate is unacceptable and decremented (not to exceed zero) whenever the error rate is acceptable. If the counter continually increments  
such that it reaches the predictive threshold, a predictive failure is signaled. This counter is referred to as the Failure History Counter.  
There is a separate Failure History Counter for each attribute.  
5.3.5  
Thermal monitor  
Pulsar.2 drives implement a temperature warning system which:  
1. Signals the host if the temperature exceeds a value which would threaten the drive.  
2. Signals the host if the temperature exceeds a user-specified value. (i.e., the reference temperature value)  
3. Saves a S.M.A.R.T. data frame on the drive which exceeds the threatening temperature value.  
A temperature sensor monitors the drive temperature and issues a warning over the interface when the temperature exceeds a set  
threshold. The temperature is measured at power-up and then at ten-minute intervals after power-up.  
The thermal monitor system generates a warning code of 01-0B01 when the temperature exceeds the specified limit in compliance with  
the SCSI standard. The drive temperature is reported in the FRU code field of MODE SENSE data. Administrators can use this information  
to determine if the warning is due to the temperature exceeding the drive threatening temperature or the user-specified temperature.  
This feature is controlled by the Enable Warning (EWasc) bit, and the reporting mechanism is controlled by the Method of Reporting  
Informational Exceptions field (MRIE) on the Informational Exceptions Control (IEC) mode page (1Ch).  
The current algorithm implements two temperature trip points. The first trip point is set at the maximum temperature limit according to the  
drive specification. The second trip point is user-selectable using the LOG SELECT command. The reference temperature parameter in  
the temperature log page (see Table 8) can be used to set this trip point. The default value for this drive is listed in the table, however,  
applications can set it to any value in the range defined. If a temperature is specified that is greater than the maximum allowed in this field,  
the temperature is rounded down to the maximum allowed. A sense code is sent to the host to indicate the rounding of the parameter field.  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
16  
 
Table 8 Temperature Log Page (0Dh)  
Parameter Code  
Description  
800/400/200/100GB  
Primary Temperature  
Drive Temperature  
65°C  
0000h  
Default Setting  
Reference Temperature  
0001h  
Changeable Range  
0 to 65°C  
5.3.6  
Drive Self Test (DST)  
Drive Self Test (DST) is a technology designed to recognize drive fault conditions that qualify the drive as a failed unit. DST validates the  
functionality of the drive at a system level.  
There are two test coverage options implemented in DST:  
1. Extended test  
2. Short test  
The most thorough option is the extended test that performs various tests on the drive and scans every logical block address (LBA) of the  
drive. The short test is time-restricted and limited in length—it does not scan the entire media contents, but does some fundamental tests  
and scans portions of the media.  
If DST encounters an error during either of these tests, it reports a "diagnostic failed" condition. If the drive fails the test, remove it from  
service and return it to Seagate for service.  
5.3.6.1  
DST failure definition  
The drive will present a “diagnostic failed” condition through the self-tests results value of the diagnostic log page if a functional failure is  
encountered during DST. The drive parameters are not modified to test the drive more stringently, and the recovery capabilities are not  
reduced. All retries and recovery processes are enabled during the test. If data is recoverable, no failure condition will be reported  
regardless of the recovery processes required to recover the data.  
The following conditions are considered DST failure conditions:  
• Read error after recovery attempts are exhausted  
• Write error after recovery attempts are exhausted  
Recovered errors will not be reported as diagnostic failures.  
5.3.6.2  
Implementation  
This section provides all of the information necessary to implement the DST function on this drive.  
5.3.6.2.1  
State of the drive prior to testing  
The drive must be in a ready state before issuing the SEND DIAGNOSTIC command. There are multiple reasons why a drive may not be  
ready, some of which are valid conditions, and not errors. For example, a drive may be in process of doing a FORMAT UNIT, or another  
DST. It is the responsibility of the host application to determine the “not ready” cause.  
5.3.6.2.2  
Invoking DST  
To invoke DST, submit the SEND DIAGNOSTIC command with the appropriate Function Code (001b for the short test or 010b for the  
extended test) in bytes 1, bits 5, 6, and 7.  
5.3.6.2.3  
Short and extended tests  
DST has two testing options:  
1. short  
2. extended  
These testing options are described in the following two subsections.  
Each test consists of two segments: an electrical test segment and a read/verify scan segment.  
Short test (Function Code: 001b)  
The purpose of the short test is to provide a time-limited test that tests as much of the drive as possible within 120 seconds. The short test  
does not scan the entire media contents, but does some fundamental tests and scans portions of the media. A complete read/verify scan is  
not performed and only factual failures will report a "diagnostic failed" condition. This option provides a quick confidence test of the drive.  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
17  
 
Extended test (Function Code: 010b)  
The objective of the extended test option is to empirically test critical drive components. The read operation tests the media contents. The  
integrity of the media is checked through a read/verify scan of the media.  
The anticipated length of the Extended test is reported through the Control Mode page.  
5.3.6.2.4  
Log page entries  
When the drive begins DST, it creates a new entry in the Self-test Results Log page. The new entry is created by inserting a new self-test  
parameter block at the beginning of the self-test results log parameter section of the log page. Existing data will be moved to make room  
for the new parameter block. The drive reports 20 parameter blocks in the log page. If there are more than 20 parameter blocks, the least  
recent parameter block will be deleted. The new parameter block will be initialized as follows:  
1. The Function Code field is set to the same value as sent in the DST command  
2. The Self-Test Results Value field is set to Fh  
3. The drive will store the log page to non-volatile memory  
After a self-test is complete or has been aborted, the drive updates the Self-Test Results Value field in its Self-Test Results Log page in  
non-volatile memory. The host may use LOG SENSE to read the results from up to the last 20 self-tests performed by the drive. The self-  
test results value is a 4-bit field that reports the results of the test. If the field is set to zero, the drive passed with no errors detected by the  
DST. If the field is not set to zero, the test failed for the reason reported in the field.  
The drive will report the failure condition and LBA (if applicable) in the Self-test Results Log parameter. The Sense key, ASC, ASCQ, and  
FRU are used to report the failure condition.  
5.3.6.2.5  
Abort  
There are several ways to abort a diagnostic. Applications can use a SCSI Bus Reset or a Bus Device Reset message to abort the  
diagnostic.  
Applications can abort a DST executing in background mode by using the abort code in the DST Function Code field. This will cause a 01  
(self-test aborted by the application client) code to appear in the self-test results values log. All other abort mechanisms will be reported as  
a 02 (self-test routine was interrupted by a reset condition).  
5.3.7  
Product warranty  
Warranty terms will vary based on type of warranty chosen: “Managed Life” or “Usage Based”. Consult your Seagate sales representative  
for warranty terms and conditions.  
Managed Life Warranty  
This warranty is term based and includes the Lifetime Endurance Management feature stated in section 6.2.6.  
Usage Based Warranty  
This warranty is based on the shorter of term and endurance usage of the drive.  
Shipping  
When transporting or shipping a drive, use only a Seagate-approved container. Keep the original box. Seagate approved containers are  
easily identified by the Seagate Approved Package label. Shipping a drive in a non-approved container voids the drive warranty.  
Seagate repair centers may refuse receipt of components improperly packaged or obviously damaged in transit. Contact your authorized  
Seagate distributor to purchase additional boxes. Seagate recommends shipping by an air-ride carrier experienced in handling computer  
equipment.  
Product repair and return information  
Seagate customer service centers are the only facilities authorized to service Seagate drives. Seagate does not sanction any third-party  
repair facilities. Any unauthorized repair or tampering with the factory seal voids the warranty.  
Storage  
The maximum recommended storage period for the drive in a non-operational environment is 90 days. Drives should be stored in the  
original unopened Seagate shipping packaging when ever possible. Once the drive is removed from the Seagate original packaging the  
recommended maximum period between drive operation cycles is 30 days. During any storage period the drive non-operational  
temperature, humidity, wet bulb, atmospheric conditions, shock, vibration, magnetic and electrical field specifications should be followed.  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
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6.0  
PHYSICAL/ELECTRICAL SPECIFICATIONS  
This section provides information relating to the physical and electrical characteristics of the drive.  
6.1  
POWER SPECIFICATIONS  
The drive receives DC power (+5V and +12V) through the standard SAS interface.  
6.1.1  
Power consumption  
Power requirements for the drives are listed in the tables beginning on page 21. Typical power measurements are based on an average of  
drives tested, under nominal conditions, using +5V and +12V input voltage at 60°C ambient temperature.  
• Startup power  
Startup power is measured from the time of power-on to the time that the drive reaches operating condition and can process media  
access commands.  
• Peak operating mode  
During peak operating mode, the drive is tested in various read and write access patterns to simulate the worst-case power consump-  
tion.  
• Idle mode power  
Idle mode power is measured with the drive powered up and ready for media access commands, with no media access commands  
having been received from the host.  
6.2  
AC POWER REQUIREMENTS  
None.  
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6.3  
DC POWER REQUIREMENTS  
Table 9 800GB standard model DC power requirements  
PARAMETER  
Regulation  
Voltage  
800GB (6.0GB)  
±5%  
±5%  
+5V  
+12V  
CURRENT (A)  
CURRENT (A)  
POWER (W)  
DC  
Average idle current  
Maximum starting current  
(peak DC) DC  
0.42  
0.19  
4.38  
3σ  
3σ  
3σ  
0.79  
0.60  
0.45  
0.49  
0.71  
0.20  
(peak AC) AC  
Delayed start (max) DC  
Peak operating current (random read):  
Typical DC  
4.65  
DC  
3σ  
0.49  
0.51  
0.90  
0.29  
0.31  
0.61  
5.93  
6.27  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
0.49  
0.52  
0.95  
0.57  
0.59  
1.13  
9.29  
9.68  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
0.58  
0.62  
1.01  
0.44  
0.46  
0.76  
8.18  
8.62  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
0.48  
0.52  
0.85  
0.51  
0.55  
1.13  
8.52  
9.20  
Maximum DC  
Maximum (peak) DC  
3σ  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
20  
             
Table 10 400GB standard model DC power requirements  
PARAMETER  
Regulation  
Voltage  
400GB (6.0GB)  
±5%  
±5%  
+5V  
+12V  
CURRENT (A)  
CURRENT (A)  
POWER (W)  
DC  
Average idle current  
Maximum starting current  
(peak DC) DC  
0.41  
0.12  
3.49  
3σ  
3σ  
3σ  
0.50  
0.54  
0.45  
0.35  
0.60  
0.13  
(peak AC) AC  
Delayed start (max) DC  
Peak operating current (random read):  
Typical DC  
3.81  
DC  
3σ  
0.47  
0.51  
0.95  
0.20  
0.21  
0.48  
4.75  
5.07  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.52  
0.93  
0.44  
0.46  
1.11  
7.63  
8.12  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
0.55  
0.60  
1.00  
0.31  
0.32  
0.59  
6.47  
6.84  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
0.46  
0.52  
0.91  
0.44  
0.48  
1.14  
7.58  
8.36  
Maximum DC  
Maximum (peak) DC  
3σ  
PULSAR.2 SAS PRODUCT MANUAL, REV. C  
21  
       
Table 11 200GB standard model DC power requirements  
PARAMETER  
Regulation  
Voltage  
200GB (6.0GB)  
±5%  
±5%  
+5V  
+12V  
CURRENT (A)  
CURRENT (A)  
POWER (W)  
DC  
Average idle current  
0.43  
0.11