HP 8517B
S-Parameter Test Set
Operating and
Service Manual
Printed in USA
12 August 1998
HP part number 08517-90054
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What You’ll Find in This Manual…
HP 8517B S-Parameter Test Set
Chapters 1 and 2 • Test set description and installation information
Chapters 3 and 4 • Principles of operation and specifications
Chapters 5, 6, and 7 • Troubleshooting, replacement procedures, and replaceable parts
information
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Warranty
Certification
Warranty
Hewlett-Packard Company certifies that this product met its published
specifications at the time of shipment from the factory. Hewlett-Packard
further certifies that its calibration measurements are traceable to the
United States National Institute of Standards and Technology (NIST,
formerly NBS), to the extent allowed by the Institute’s calibration facility,
and to the calibration facilities of other International Standards
Organization members.
This Hewlett-Packard system product is warranted against defects in
materials and workmanship for a period corresponding to the individual
warranty periods of its component products. Instruments are warranted for a
period of one year. During the warranty period, Hewlett-Packard Company
will, at its option, either repair or replace products that prove to be defective.
Warranty service for products installed by HP and certain other products
designated by HP will be performed at Buyer’s facility at no charge within
HP service travel areas. Outside HP service travel areas, warranty service
will be performed at Buyer’s facility only upon HP’s prior agreement and
Buyer shall pay HP’s round trip travel expenses. In all other areas, products
must be returned to a service facility designated by HP.
For products returned to HP for warranty service, Buyer shall prepay
shipping charges to HP and HP shall pay shipping charges to return the
product to Buyer. However, Buyer shall pay all shipping charges, duties, and
taxes for products returned to HP from another country.
HP warrants that its software and firmware designated by HP for use with an
instrument will execute its programming instructions when properly
installed on that instrument. HP does not warrant that the operation of the
instrument, or software, or firmware will be uninterrupted or error free.
LIMITATION OF WARRANTY. The foregoing warranty shall not apply
to defects resulting from improper or inadequate maintenance by Buyer,
Buyer-supplied software or interfacing, unauthorized modification or
misuse, operation outside of the environmental specifications for the
product, or improper site preparation or maintenance.
NO OTHER WARRANTY IS EXPRESSED OR IMPLIED. HP
SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OR
MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE.
EXCLUSIVE REMEDIES. THE REMEDIES PROVIDED HEREIN ARE
BUYER’S SOLE AND EXCLUSIVE REMEDIES. HP SHALL NOT BE
LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL, INCIDENTAL, OR
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CONSEQUENTIAL DAMAGES, WHETHER BASED ON CONTRACT,
TORT, OR ANY OTHER LEGAL THEORY.
Assistance
Product maintenance agreements and other customer assistance agreements
are available for Hewlett-Packard products.
For assistance, call your local Hewlett-Packard Sales and Service Office
HP 8517B S-Parameter Test Set Manual
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Service and Support
Any adjustment, maintenance, or repair of this product must be performed
by qualified personnel. Contact your customer engineer through your local
HP Service Center. You can find a list of HP Service Centers on the web at
http://www.hp.com/go/tmdir.
If you do not have access to the Internet, one of these HP centers can direct
you to your nearest HP representative:
United States:
Hewlett-Packard Company
Test and Measurement Call Center
PO Box 4026
Englewood, CO 80155-4026
(800) 452 4844 (toll-free in US)
Canada:
Europe:
Hewlett-Packard Canada Ltd.
5150 Spectrum Way
Mississauga, Ontario L4W 5G1
(905) 206 4725
Hewlett-Packard European Marketing Centre
Postbox 999
1180 AZ Amstelveen
The Netherlands
(31 20) 547 9900
Japan:
Hewlett-Packard Ltd.
Measurement Assistance Center
9-1, Takakura-Cho, Hachioji-Shi
Tokyo 192, Japan
(81) 426 56 7832
(81) 426 56 7840 (FAX)
Latin America:
Hewlett-Packard Latin American Region Headquarters
5200 Blue Lagoon Drive, 9th Floor
Miami, Florida 33126, U.S.A.
(305) 267 4245, (305) 267-4220
(305) 267 4288 (FAX)
Australia/New Zealand:
Hewlett-Packard Australia Ltd.
31-41 Joseph Street
Blackburn, Victoria 3130
Australia
1 800 629 485 (Australia)
0800 738 378 (New Zealand)
(61 3) 9210 5489 (FAX)
Asia-Pacific:
Hewlett-Packard Asia Pacific Ltd.
17-21/F Shell Tower, Times Square
1 Matheson Street, Causeway Bay
Hong Kong
(852) 2599 7777
(852) 2506 9285 (FAX)
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Safety and Regulatory Information
Review this product and related documentation to familiarize yourself with
safety markings and instructions before you operate the instrument. This
product has been designed and tested in accordance with international
standards.
WARNING
CAUTION
The WARNING notice denotes a hazard. It calls attention to a procedure,
practice, or the like, that, if not correctly performed or adhered to, could result
in personal injury. Do not proceed beyond a WARNING notice until the
indicated conditions are fully understood and met.
The CAUTION notice denotes a hazard. It calls attention to an operating
procedure, practice, or the like, which, if not correctly performed or adhered
to, could result in damage to the product or loss of important data. Do not
proceed beyond a CAUTION notice until the indicated conditions are fully
understood and met.
Instrument Markings
When you see this symbol on your instrument, you should refer to the instrument’s
instruction manual for important information.
!
This symbol indicates hazardous voltages.
The laser radiation symbol is marked on products that have a laser output.
This symbol indicates that the instrument requires alternating current (ac) input.
The CE mark is a registered trademark of the European Community. If it is
accompanied by a year, it indicates the year the design was proven.
The CSA mark is a registered trademark of the Canadian Standards Association.
1SM1-A
This text indicates that the instrument is an Industrial Scientific and Medical Group 1
Class A product (CISPER 11, Clause 4).
This symbol indicates that the power line switch is ON.
This symbol indicates that the power line switch is OFF or in STANDBY position.
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Safety Earth
Ground
This is a Safety Class I product (provided with a protective earthing
terminal). An uninterruptible safety earth ground must be provided from the
main power source to the product input wiring terminals, power cord, or
supplied power cord set. Whenever it is likely that the protection has been
impaired, the product must be made inoperative and secured against any
unintended operation.
Before Applying Power Verify that the product is configured to match the available main power
source as described in the input power configuration instructions in this
manual. If this product is to be powered by auto-transformer, make sure the
common terminal is connected to the neutral (grounded) side of the ac power
supply.
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Typeface Conventions
Not all of the following conventions may appear within this manual,
however, refer to this listing whenever you encounter on of the special font
characters.
Italics • Used to emphasize important information:
Use this software only with the HP 8517B Test Set.
• Used for the title of a publication:
Refer to the HP 8517B S-Parameter Test Set Manual
• Used to indicate a variable:
Type LOAD BIN filename.
Instrument Display
• Used to show on-screen prompts and messages that you will see on the
display of an instrument:
The HP 8517B will display the message CAL1 SAVED.
Keycap
• Used for labeled keys on the front panel of an instrument or on a
computer keyboard:
Press [Return].
Softkey
• Used for simulated keys that appear on an instrument display:
Press {Prior Menu}.
User Entry
• Used to indicate text that you will enter using the computer keyboard;
text shown in this typeface must be typed exactly as printed:
Type LOAD PARMFILE
• Used for examples of programming code:
#endif // ifndef NO_CLASS
Path Name
• Used for a subdirectory name or file path:
Edit the file usr/local/bin/sample.txt
Computer Display
• Used to show messages, prompts, and window labels that appear on a
computer monitor:
The Edit Parameters window will appear on the screen.
• Used for menus, lists, dialog boxes, and button boxes on a computer
monitor from which you make selections using the mouse or keyboard:
Double-click EXIT to quit the program.
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x
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Contents
Notice . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ii
Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iv
Certification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iv
Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iv
Assistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . v
Service and Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . vi
Safety Earth Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . viii
Typeface Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ix
How to Use This Manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1
Test Set Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-2
Verifying Test Set Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-5
Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-10
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Initial Inspection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-2
Storing the Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-2
Packaging the Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-7
Front-Panel Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-1
Rear-Panel Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-2
Selecting a Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-5
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Performance Verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-14
Mechanical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-1
Supplemental Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-1
Theory of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-2
The Test Signal Path . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-3
11
21
Troubleshooting Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-5
Troubleshooting Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-7
Fuse Location . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-9
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Performance Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Adjustments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Initial Precautions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5
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7-14
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1
Getting Started
This is the operating and service manual for the HP 8517B S-parameter test
set. It is to be used in conjunction with the HP 8510C Network Analyzer
Operating and Service Manual. Together, these manuals provide
information needed to configure the system and make measurements.
How to Use This Manual
Step 1.
learn about:
•
•
•
•
•
•
Using this test set
Using options of the test set
Preparing the site for operation
Understanding safety considerations
Unpacking the instrument and checking it for shipment damages
Configuring the HP 8517B test set with the HP 8510C Network Analyzer
Step 2.
Step 3.
Insert the contents of this manual into the HP 8510C Test Sets and Accessories
binder behind the tab labeled “Test Sets.”
Review the Connector Care Quick Reference Card (HP part number 08510-90360)
supplied with the HP 8510C manuals set.
Refer to the calibration kit documentation for complete information about care,
cleaning, gaging, and connecting precision devices. Knowledge and application of
proper connector care is essential to achieving good connections and maintaining
maximum performance quality with your precision calibration devices.
Step 4.
Step 5.
Read Chapter 3, “Operation,” to learn about test set front- and rear-panel features.
This chapter also has information about controlling multiple test sets, measuring
high power devices, using the anti-rotation clamps on the cables, and connecting
devices to the test set.
Refer to Chapters 4 through 7 for reference information about specifications,
troubleshooting, replacement procedures, and replacement parts information.
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Getting Started
Test Set Description
Test Set Description
The HP 8517B test set configured with an HP 8510B/C network analyzer
and an HP 8360 series source, creates a system capable of making
S-parameter measurements from 45 MHz to 50 GHz. The system is
particularly suited for making two-port device measurements. You can
measure all four S-parameters without physically reversing the DUT (device
under test).
The system is also designed for making measurements on non-reciprocal
devices or components like transistors, amplifiers or isolators where S
measurements are required.
12
Two directional couplers are used for signal separation. The configuration is
illustrated in the following figures:
For active-device measurements, two bias tees apply external DC bias to
both test port center conductors.
Figure 1-1 Standard HP 8517B Test Set Block Diagram
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Getting Started
HP 8517B Test Set Options
HP 8517B Test Set Options
Table 1-1 HP 8517B Options and Descriptions
Options
HP 8517B Test Set Option Description
Option 001
Adds IF switching capability for up to four test set connections to the HP 8510C Network
Analyzer.
The test set used is selected from the network analyzer. Refer to “Controlling Multiple Test
Sets” in Chapter 3, “Operation” of this manual for more information.
Option 002
Option 004
Deletes the programmable attenuators and bias tees.
Note: If bias is required but attenuation is not, the bias can be applied externally by using an
HP 11612B bias tee.
Moves Port 2 attenuator in front of the b2 sampler, allowing devices with output power up to 30
dBm (1 W) to be measured. Adds a 3 dB attenuator which protects the switch splitter from high
power into Port 2.
Option 007
Option 908
Adds five amplifiers, two 10 dB attenuators, two 6 dB attenuators, and two tapered attenuators.
These components increase the available power and dynamic range of the test set.
Supplies the hardware required for rack mounting the test set when its handles are removed.
Refer to Chapter 2, “Installation” for more information.
Option 910
Option 913
Adds a duplicate copy of this manual to the shipment.
Supplies the hardware required for rack mounting the test set with its handles attached. Refer
to Chapter 2, “Installation” for more information.
Option 002 “plus” 007
Option 004 “plus” 007
Removes the bias tee, and retains the high dynamic range capability in the test set.
Adds high-dynamic range and high power measurement capability to Port 2.
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Getting Started
Verifying Test Set Operation
Verifying Test Set Operation
The test set is designed to operate with an HP 8510C network analyzer. You
can verify its operation by:
Table 1-2 Test Set Operation Verification
Checking System Operation
Checking Specifications
Perform a system calibration as described in the HP 8510C Operating and
Programming Manual. A successful calibration indicates that the system, and
therefore the test set, are operating properly.
Specifications for the test set, and the system, can be determined by running
the specification and performance verification software described in the HP
8510C On-Site Service Manual, Chapter 8, “Specification and Performance
Verification”. Additional mechanical specifications and supplemental
characteristics are in Chapter 4, “Specifications” of this manual.
Troubleshooting the Test Set
To troubleshoot the test set, refer to the HP 8510C On-Site Service Manual.
Use the information in that manual to determine if the test set is at fault. If the
test set is at fault, refer to Chapter 5, “Troubleshooting the Test Set” in this
manual to isolate the trouble.
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Getting Started
Maintaining Measurement Accuracy
Maintaining Measurement Accuracy
Precision measurements rely on a precision calibration of the network
analyzer. As a general rule, the shorter the time lapse between a calibration
and a device measurement, the more precise the measurement results will be
(within the limitations of your system).
Hewlett-Packard recommends calibrating your system every few hours, or at
least re-verifying your system’s calibration this frequently. Doing so helps
retain measurement precision.
The frequency of calibrations is determined by both the location of the
system and the ambient temperature stability in its operating area.
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Getting Started
Instruments Supported by This Manual
Instruments Supported by This Manual
A serial number label is attached to the rear panel of the test set. There are
read the following descriptions:
• The prefix includes the first four digits of the serial number, plus the
letter. The contents of this manual apply directly to test sets with the
same serial number prefix as the one(s) on the title page.
• The suffix includes the last five digits of the serial number, which is
sequential and unique to each test set. You will need this part of the
number to report test-set problems to an HP sales and service engineer.
serial.tif
Figure 1-4 Instrument Serial-Number Label Example
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Getting Started
Instrument Firmware Compatibility
Instrument Firmware Compatibility
To use the HP 8517B test set at frequencies up to 50 GHz, use an
HP 83650B or HP 83651B source.
If your network analyzer or source do not meet the required frequency
ranges for your measurement needs, you need to upgrade your system.
Please contact an HP Sales and Service representative for information. These
manual
Table 1-3 Source Firmware Revision Compatibility Matrix
Compatible With HP
8340 Series
Sources?
Compatible With
HP 8350 Series
Sources?
Instrument Model
Number and Name
Compatible With Model:
Firmware Revision
HP 8517B Test Set
HP 8510B Network Analyzer
HP 8510C Network Analyzer
B.06.00 and higher
C.06.00 and higher
Yes, up to the higher
frequency limits.
Yes, up to the higher
frequency limits.
HP 8517B,
HP 8510C Network Analyzer
7.0 or higher, only
Yes, up to the higher
frequency limits.
No, not compatible
Option 007 Test Set
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Getting Started
Service and Support Options Available
Service and Support Options Available
A variety of service and support products are available for coverage of
repair, calibration, and verification issues. Contact your HP sales and service
engineer for details. Their office addresses and phone numbers are listed in
the front of this document.
The purchase of an HP 8517B includes a one year on-site service warranty.
In the event of failure, Hewlett-Packard provides service for the system.
NOTE
System installation is not included.
Table 1-4 Service and Support Options
Option Number
Option Description
Option W30
Adds a three year customer return-repair coverage warranty to the instrument.
Customers may return the instrument to HP within that three year period for repair.
Option W31
Adds a three year on-site repair coverage warranty for next-day on-site repair of the
instrument. Customers may return the instrument to HP within that three year period for
repair and get next-day service on their instrument.
Option 1BN
Option 1BP
Adds to the instrument a MIL-STD 45662A Certificate of Calibration. This option must be
ordered when the instrument order is placed.
Adds to the instrument a MIL-STD 45662A Certificate of Calibration and the
corresponding calibration data. This option must be ordered when the instrument order is
placed.
Option UK6
Adds a certificate of calibration (rather than the MIL-STD certificate) and the
corresponding calibration data to the instrument. This option must be ordered when the
instrument order is placed.
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Getting Started
Accessories
Accessories
The accessories supplied with the test set, including part numbers, are listed
of this manual.
Accessories Available
Table 1-5 describes accessories available for the HP 8517B test set. For
additional HP 8510C system accessories information, refer to the HP 8510C
manual set.
Table 1-5 HP 8517B Test Set Accessories Available
Accessory Type
Accessory Model Number
Contents or Description
Calibration Kit1
HP 85056A 2.4 mm Calibration Kit
Contains open and short circuits
Fixed and sliding loads (2)
2.4 mm to 2.4 mm adapters
2.4 mm connector tools and gauges
Verification Kit1
Cables
HP 85057S 2.4 mm Verification Kit
Contains precision airline, mismatched airline,
20 dB and 40 dB attenuators
HP 85133C 2.4 mm Test Port Return
Cable
Used when measuring a 2.4 mm-ported device connected directly to
Port 1 of the test set. The test port return cable is connected
between the device under test and Port 2.
HP 85133D 2.4 mm Test Port Return
Cable Set
Used when measuring a 2.4 mm-ported device connected between
the cable ends.
HP 85133E 2.4 mm Flexible Test Port
Return Cable
Used when measuring a 2.4 mm-ported device connected directly to
Port 1 of the test set. The test port return cable is connected
between the device under test and Port 2.
HP 85133F 2.4 mm Flexible Test Port
Return Cable Set
Used when measuring a 2.4 mm-ported device connected between
the cable ends.
HP 85134D 3.5 mm Test Port Return
Cable Set
Used when measuring a 3.5 mm device under test connected
between the cable ends.
HP 85134E 3.5 mm Flexible Test Port
Return Cable
Used when measuring one end of a 3.5 mm device connected
directly to an HP 85130F adapter at Port 1. The test-port return
cable is connected between the device and Port 2.
HP 85134F 3.5 mm Flexible Test Port
Return Cable Set
Used when measuring a 3.5 mm device connected between the
cable ends.
HP 85135C 7 mm Test Port Return
Cable
Used when measuring one end of a 7 mm device connected
directly to an HP 85130E adapter at Port 1. The test port return
cable is connected between the device and Port 2.
Cables (Continued)
HP 85135D 7 mm Test Port Return
Cable Set
Used when measuring a 7 mm device connected between the cable
ends.
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Getting Started
Accessories
Table 1-5 HP 8517B Test Set Accessories Available (Continued)
Accessory Type
Accessory Model Number
Contents or Description
HP 85135E 7 mm Flexible Test Port
Return Cable
Used when measuring one end of a 7 mm device connected directly
to an HP 85130E adapter at Port 1. The test port return cable is
connected between the device and Port 2.
HP 85135F 7 mm Flexible Test Port
Return Cable Set
Used when measuring a 7 mm device connected between the cable
ends.
Adapters
HP 85130E Special 2.4 mm to 7 mm
Adapter Set
Used to convert special 2.4 mm test set ports into a 7 mm connector
interface (m or f).
HP 85130F Special 2.4 mm to 3.5 mm
Adapter Set
Used to convert special 2.4 mm ports of the test set into a 3.5 mm
connector interface (m or f).
HP 85130G Special 2.4 mm to 2.4 mm
Adapter Set
Used to convert special 2.4 mm ports of the test set into a standard
2.4 mm connector interface (m or f). These adapters function as
“test port savers.”
HP 11904S 2.4 mm to K-2.9 mm2
Adapter Kit
Used to calibrate the test set using 2.4 mm devices, then to change
the test ports to 2.92 mm and perform fully error corrected
measurements. The kit contains (2) 2.4 mm to 2.92 mm (m)
adapters and (2) 2.4 mm to 2.92 (f) adapters.
Test Fixture Kit
HP 85041A Transistor Test Fixture Kit
(TTF)
A comprehensive measurement system for testing and
characterizing stripline packaged microwave transistors. Although
the fixture contains 7 mm connectors and its frequency limit is
18 GHz, the kit may be adapted for use with the test set. Use
HP 85135C or HP 85135E cables with the HP 85130E adapter set.
Please consult your HP Sales and Service representative for
recommendations.
1. NIST traceable data and uncertainties are available.
2. The K-connector is developed and manufactured by the Wiltron Company (Morgan Hill, California).
NOTE
For more information about other 2.4 mm adapters, refer to the “2.4 mm
Adapters and Calibration Accessories,” Operating Note, (HP part number
11900-90003).
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Getting Started
Recommended Test Equipment
Recommended Test Equipment
Additional equipment and accessories required for use with the test set are
performance of the test set and which are required to operate it. Other
equipment may be substituted if their specifications meet or exceed those
listed in the critical specifications column
Table 1-6 Recommended Test Equipment
Critical
Specifications
Item
Recommended Model
Use
Network Analyzer
Source
no substitute
no substitute
no substitute
HP 8510B or HP 8510C
HP 83651B
O, P, T
O, P, T
N/A
Controller
HP 9000 Series 200 or 300 with 3 Mbyte RAM and
HP BASIC 3.0 or higher or PCC-305 or PC-308
HP BASIC Controller with 3 Mbyte Basic Language
Processor RAM
Disk Drive
is compatible with the
controller
is compatible with the controller
P
Multimeter
range: 0 to 50 V
HP 3456A
HP 1740A
T
T
Oscilloscope
50 MHz bandwidth
O = Operation; P = Performance Test; T = Troubleshooting
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Getting Started
Operating and Safety Precautions
Operating and Safety Precautions
CAUTION
ESD Sensitive Assemblies
Test set assemblies are very sensitive to damage from electrostatic discharge.
They may or may not continue to function if subjected to electrostatic
discharge. Their reliability, however, will be impaired. Handle the
instrument devices at static-safe work stations, only.
Operating Precautions
Observe the following normal precautions when handling and operating the
test set:
• Do not exceed the input power levels listed below:
Table 1-7 Maximum Input Power Levels
Power Level
+17 dBm
Test Port
Port 1
+17 dBm
Port 2
+30 dBm1
Port 2 (Option 004, or Option 004 “plus” 007)
1. This is the maximum input power allowed with HP 8517B Option 004, or
Option 004 “plus” Option 007, when the attenuator is set to
attenuation, the maximum input power allowed is +17 dBm.
≤20 dB. Without
• Do not exceed +15 dBm into the test set with the source RF input.
• Never apply a dc voltage to the source RF input of the test set.
• Do not torque any connection at the test port connectors to more than
90 N-cm (8 in-lb). The wrench supplied with your accessory kit is
calibrated for 90 N-cm (8 in-lb) torque.
• Do not torque any connection to more than 90 N-cm (8 in-lb) at the
source RF input or on the back of your test set.
Safety Precautions
The voltages inside this test set warrant normal caution for operator safety.
Nevertheless, service should be performed by qualified personnel, only.
Service strategy, troubleshooting procedures, replaceable parts, and other
information about the test set are provided in this manual or the HP 8510C
On-Site Service Manual.
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Getting Started
Operating and Safety Precautions
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2
Installation
This chapter contains installation information. Topics include initial
inspection, environmental considerations, test set location when using it with
the HP 8510C network analyzer, and making connections to the test set.
Refer to “Installation” in the HP 8510C On-Site Service Manual for
complete system connection and turn-on instructions.
instrument.
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Installation
Initial Inspection
Initial Inspection
Inspect the shipping container and cushioning materials for damage. If there
is damage, keep the container until you have checked the contents for
completeness.
If shipping materials are damaged, complete the performance tests outlined
in the HP 8510C On-Site Service Manual. If the test set fails the
performance tests, or is damaged or defective, keep the shipping materials.
Notify both the carrier and the nearest Hewlett-Packard Sales and Service
The office can arrange for repair or replacement of the test set without
waiting for the claim settlement.
Operating
Environment
For the HP 8517B to operate within specifications, the ambient temperature
must remain between 0° C and +55° C. Keep relative humidity to less than
95% (at 40° C dry bulb temperature, maximum). The instrument can be
operated at altitudes up to 4,500 meters (15,000 feet).
Storing the Test Set
Accessories Supplied
Acceptable storage temperatures range from –40° C to +75° C, with relative
humidity ≤90% at +65° C (maximum dry bulb temperature) and at altitudes
up to 15,240 meters (50,000 feet).
Figure 2-1 illustrates accessories supplied with the test set. If you did not
receive one of these accessories with the test set, notify your nearest HP
Sales and Service Office so that the missing parts can be sent to you.
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Installation
Initial Inspection
Figure 2-1 Accessories Supplied with the HP 8517B Test Set
(1) Power Cord U.S.A. only
(6) Female 2.4 mm to Female 2.4 mm Adapter
(7) 20 mm, 98 N-cm (8 in-lb) Torque Wrench
(8) 1/2” x 9/16” Open End Wrench
(2) Test Set Interconnect Cable
(3) HP-IB Cable
(4) Specification and Performance Verification Software
(5) Anti-rotation Clamps
(9) RF Source Cable, Bench-top Configuration
(10) RF Source Cable, Rack Configuration
CAUTION
CAUTION
Assemblies in the test set are extremely sensitive to damage by static
electricity. They may or may not continue to function if subjected to an
electrostatic discharge. Their reliability, however, will be impaired.
Always use an anti-static wrist strap when calibrating or verifying the test set
or while using the test set to measure devices. Never touch test port center
conductors. Use a wrist strap when connecting the extended center
conductor of a sliding load termination.
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Installation
Installing the Test Set Into a System Rack
Installing the Test Set Into a System Rack
The HP 85043C system rack is the recommended model to use. To
rack-mount the test set into a system configured with the HP 8510C, refer to
the “Installation” chapter of the HP 8510C On-Site Service Manual and to
the HP 85043C System Rack Manual.
Installing the Test Set
on a Bench
When installing the test set for use on a bench, place it on a grounded
anti-static work surface to reduce the chance of ESD damage. The antistatic
surface should extend far enough in front of the test set to provide effective
A grounding receptacle is provided on the test set as an alternate grounding
point for your anti-static wrist-strap.
Figure 2-2 Recommended Static-Free Workstation Configuration
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Installation
Configuring the Test Set in a System
Configuring the Test Set in a System
Figure 2-3 illustrates the cable connections for installing an HP 8517B in a
system. Refer to the information that follows to install the test set.
Figure 2-3 Configuring an HP 8517B Test Set in a System
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Installation
Configuring the Test Set in a System
Connecting the System
Cables
Table 2-2 Connection Instructions and Connector Descriptions
Connect System Power
and Control Cables
Check the test-set line module (see item (1) in Chapter 3, Figure 3-2 of this manual). It must be set for
the correct voltage in your region. Refer to Chapter 5, “Troubleshooting” of this manual for information
about changing the voltage selection or replacing the line fuse.
•
•
•
After setting or confirming the line-voltage module, connect the test set power cord to an electrical
outlet.
Attach the HP 8517B IF-interconnect cable from J11 TEST SET INTERCONNECT (on the test set’s
rear panel) to J1 TEST SET INTERCONNECT on the rear panel of the HP 85102 IF detector.
Attach the system bus cable from HP 8517B J12 HP 8510 SYSTEM BUS connector to HP 8510C
INTERCONNECT on the HP 85101 display/processor.
The test set IF interconnect cable and the system bus cable transmit control signals between the test
set and the network analyzer.
Signal Path Connections
The IF interconnect cable transmits IF signals from the test set to the HP 85102 IF detector.
•
of the HP 83651 Synthesized Sweeper.
•
Attach the other end of the RF cable to the RF input on the HP 8517B Test Set.
Test Port Connectors
Anti-Rotation Clamps
Port 1 and Port 2 are male, NMD-2.4 mm connectors, and mate to female 2.4 mm connectors.
connection, or to stabilize an adapter at the connection.
•
•
•
Connect test port cables or adapters to the test ports.
Torque the connections to 90 N-cm (8 in lb).
Loosen the anti-rotation clamp thumb screw enough to slip the clamp over the cable and up to the
front panel. The clamp end with the flats should come to rest on the flats of the test port shoulder.
•
Finger-tighten the thumb screws to prevent further loosening or tightening of the test port/RF cable
connection. Refer to Chapter 3, “Operation” of this manual for additional information.
Replacing O-Rings in
Anti-Rotation Clamps
The anti-rotation clamp’s internal O-ring is a field-replaceable part. There is
no need to disassemble the anti-rotation clamp.
When the O-ring no longer holds the RF cable securely, replace it by
following the instructions in Chapter 6, “Replacement Procedures.”
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Installation
Packaging the Test Set
Packaging the Test Set
To repackage the test set, use its original factory packaging.
Refer to the test set using its complete model and serial numbers in any
correspondence to an HP Sales and Service Office.
Containers and materials identical to those used in the original shipment by
the factory are available through Hewlett-Packard Sales and Service Offices.
However, commercially available, comparable packaging materials may be
used, also.
1. Wrap the test set in heavy paper or anti-static plastic.
2. If you are shipping the test set to an HP Sales or Service office, complete
and attach a service tag (located in the HP 8510C manual set).
3. Use sufficient shock absorbing material on all sides of the test set to
provide a thick, firm cushion and prevent movement.
4. Seal the shipping container securely and mark it “FRAGILE.”
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Installation
Packaging the Test Set
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3
Operating the HP 8517B Test Set
This chapter contains illustrations and descriptions of the HP 8517B front-
and rear-panel features. Information about operating multiple test sets
(Option 001) is also provided.
Front-Panel Features
Figure 3-1 Front-Panel Features of the HP 8517B Test Set
Table 3-1 Front-Panel Description
(1) Line Switch
This switch turns the test set on or off. When the side of the switch labeled “0” is depressed, the
test set is OFF; when the side labeled “1” is depressed, the test set is ON.
(2) Line LED
This LED is lit when the test set line switch is ON and not lit when the test set line switch is OFF.
(3) Active LED
This LED lights about two seconds after power is turned on, following the successful conclusion of
the self-test. If the test set is used with other test sets (Option 001) and is not addressed by the HP
8510C, then this light remains off.
(4) Port 1
This test port transmits RF energy from the source to the DUT and receives reflected or transmitted
RF energy from the DUT. The reflected RF energy is coupled to a sampler within the instrument.
Connections made to this input must be torqued to 90 N-cm (8 in-lb), and no more.
(5) Bias Fuse
The fuses that limit bias applied to Port 1 and Port 2 are located in these holders (see the
instrument front panel or the replaceable parts list for the fuse values).
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Table 3-1 Front-Panel Description (Continued)
(6) a1 LED
(7) a2 LED
(8) Port 2
This LED indicates that the test set is internally switched to the S11 or S21 mode and source power
is switched to Port 1.
This LED indicates that the test set is internally switched to the S22 or S12 mode and source power
is switched to Port 2.
This test port transmits RF energy from the source to the DUT and receives reflected or transmitted
RF energy from the DUT.
Rear-Panel Features
Figure 3-2 Rear-Panel Features of the HP 8517B Test Set
Table 3-2 Rear-Panel Descriptions
(1) Line Module
Houses the line cord connector, line fuse and line voltage selector. Pull out the right side
of the line module cover to replace or change the fuse or to change the voltage selection.
Remove the voltage selector drum to rotate it to a different voltage setting. Recommended
fuse values are printed on the rear panel.
(2) RF Input
A 2.4 mm connector that receives RF energy from the source. Connections made to this
input must be torqued no more than 90 N-cm (8 in-lb).
(3) J10 Test Set Interconnect
Used only in test sets with Option 001. It allows connecting another test set to the option
001 test set. Up to four test sets can be serially connected to the analyzer. The HP 8510C
system automatically selects the IF output from the chosen test set for processing and
display. Refer to “Controlling Multiple Test Sets” in this chapter for more information.
(4) J11 Test Set Interconnect
Transmits the IF signal from the test set to the HP 85102 IF detector. It also transmits
control signals bi-directionally.
(5) HP 8510 System Bus Address Switch
A five-pole binary-weighted switch sets the test-set’s system bus address. The binary
weight of each pole is indicated on the rear panel. So are the On and Off positions. The
default setting is decimal twenty (off-off-on-off-on, from left to right).
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Table 3-2 Rear-Panel Descriptions (Continued)
(6) J12 8510 System Bus Connector
Used for HP-IB communications with the HP 85101 display/processor.
(7) Port 2 Bias
A female BNC connector used to supply bias through the center conductor of Port 2 to
active devices under test.
(8) Port 1 Bias
A female BNC connector used to supply bias through the center conductor of Port 1 to
active devices under test.
Controlling Multiple Test Sets
HP 851X Series, Option 001 test sets allow an HP 8510C to alternately
control up to four test sets connected to it. For example:
• While a measurement is underway on test set number 1 (equipped with
Option 001), a test device can be connected to test set number 2 (which
does not need Option 001).
• When the measurement on test set number 1 is complete, the HP 8510C
can then control test set number 2.
In a standard test set, the 20 MHz IF and control signals are applied directly
to J11 TEST SET INTERCONNECT, which is attached to the HP 8510C.
Option 001 adds a set of IF switches, control switches, and the J10 TEST
SET INTERCONNECT attachment. This configuration allows the selection
of the 20 MHz test set IF signal.
• apply its IF signal to the HP 8510C, or it can
• switch to pass the IF signal from test set number 2, through J10 TEST
SET INTERCONNECT, and into the HP 8510C.
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Figure 3-3 RF and IF Switching with Two Test Sets
New ADDRESS of
Test Set 1, 2
Test Set Number
Selected
Coaxial Switch Port Selected
20
21
Number 1
Number 2
Port 1
Port 2
1. Not all system connections are illustrated.
2. In dual source configurations, the second source may be multiplexed in a similar manner. If only one
dual source test set is used, the second source may be connected directly to the appropriate test
set.
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Multiple Test-Set Connections
For dual test-set configurations, set each rear panel address switch on each
for the configuration of two or more test sets.
• Use the supplied test set interconnect cable to attach test set number 1,
J11 to the network analyzer.
• Use the supplied test set interconnect cable to attach test set number 2,
J11 to test set number 1, J10.
You may connect up to four test sets in a series if the total length of all test
set interconnect cables does not exceed 13 meters (about 40 feet). The last
test set connected in the chain does not require Option 001.
If the RF coaxial switch is not incorporated into the system, the RF input to
the test set must be manually switched to the active test set.
Initialization at
Power-Up
At power-up, configure the IF switches so that only one system test set is
active. To verify which test set is active, use the following steps:
1. Verify that all system test set LEDs are lit.
2. View the network analyzer’s test set address by pressing the
INSTRUMENT STATE, [LOCAL] key, then press {TEST SET}. The HP-IB
address of the test set is displayed on the screen.
The address displayed must match the address of the test set selected. If
not, enter the correct address using the network analyzer’s key pad.
3. If an unselected test set’s LEDs are lit, deactivate it. Do this by entering
its address, pressing [x1], then entering the address of the test set desired,
followed by [x1].
Selecting a Test Set
this chapter.
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Table 3-4 Selecting a Test Set When Multiple Units are Configured
Test Set IF Switching
A test set is selected via the built-in capability of the analyzer to generate an addressed
command to each test set. Each time you change the {HP-IB ADDRESS} {TEST SET}
function (refer to LOCAL [MENU] in the HP 8510C Operation and Service Manual), the
network analyzer does the following:
• switches the IF signal of the previously addressed test set to external
• switches the IF signal of the newly addressed test set to internal
• sets the test set’s front panel ACTIVE LED to indicate test-set status
• applies the active test set’s IF signals directly to J11 TEST SET INTERCONNECT
• passes the inactive test set’s IF signals at J10 through to J11 and on to the next
test set or to the network analyzer
Test Set Addressing
You can change the test set address via program control, or via the network analyzer front
panel keys. You must also change the mechanical switches on the test-set’s rear panel.
Here’s how:
1. Change the test set address via the network analyzer keys;
a. On the analyzer’s front panel, press the INSTRUMENT STATE [LOCAL] key, then
press {TEST SET}. The test set’s address appears on the display.
b. Using the key pad, enter the desired address for the test set, then press [x1]. The new
HP-IB address appears on the display.
2. Change the test set address via the HP-IB command:
From the controller, enter the HP-IB ADDRESS; command, followed by the
address value. Refer to the command reference for programming details.
3. Reset the mechanical switches on the test-set’s rear panel. Set the switches to match the
new HP-IB address displayed on the network analyzer screen.
RF Switch Driver Control
When the {HP-IB ADDRESS} {TEST SET} function is changed, the network analyzer
generates a code sequence. The code sequence is automatically issued across the
HP 8510C system bus to the device at the ADDRESS of RF SWITCH .
In the recommended configuration, the device is an HP 11713A attenuator/switch driver. The
switch/driver in turn controls one or more coaxial switches. These switches, (shown in a
network analyzer source.
The exact command issued depends upon the new value of the {HP-IB ADDRESS}
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Figure 3-4 RF and IF Switching with Four Test Sets
New ADDRESS
of Test Set1, 2, 3
Test Set Selected1, 2, 3
Coaxial Port Selected
with Switch #1
Coaxial Port Selected
with Switch #2
20
21
22
23
1
2
3
4
Port 1
Port 1
Port 2
Port 2
Port 1
Port 2
Port 1
Port 2
1. Not all system connections are shown.
2. In dual source configurations, the second source can be multiplexed in a similar manner.
3. If only one dual source test set is used, the second source can be directly connected to the
appropriate test set.
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Measurement Calibration
After selecting the active test set, complete the system calibration procedure
as usual. When you select a different test set, make sure that you recall the
cal set that applies to that test set.
NOTE
Since the cal-set limited instrument state does not include the number of the
active test set, a cal set which does not apply to the current test set can be
turned on without displaying the HP 8510C caution messages. However, this
causes errors in the data displayed because incorrect error coefficients are
applied to the measured data.
For convenience, store a hardware-state file and an instrument-state file for
each combination of test set to cal set. You may also store your hardware
state file on a tape or disk for future use.
To change the configuration, recall the appropriate hardware state file. The
hardware state file:
• sets the address of test set
• issues the RF switch command, then
• recalls the appropriate instrument state file which
• recalls the cal set
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Measuring High-Power Devices with Option 004
The HP 8517B, Option 004 test set enables devices with output power up to
30 dBm (1 watt) to be measured at Port 2, without adding external
attenuators. Reverse dynamic range (S ) degrades by approximately 3 dB.
12
When measuring devices having greater than +17 dBm output power, you
must use the Port 2 step attenuator to decrease the power to ≤+17 dBm.
The step attenuator has to be set during calibration for the value needed
during device measurements. However, this setting may cause inadequate
power level during calibration. Refer to “Changing Signal Path States After
System Calibration” on page 3-10 for additional information.
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Changing Signal Path States After System
Calibration
Changing an internal attenuator or any external equipment after completing
the calibration means the measurement results cannot be specified. You must
use your own estimation of the potential error contribution due to the
change.
For example, when the port attenuation is changed with correction ON, the
message CAUTION: CORRECTION MAY BE INVALID displays. You must judge
whether the error is tolerable in the particular application and how to
compensate for the change.
The application question is: “Does increasing the signal level during
calibration improve the calibration enough to risk a possible increase in error
contributions when you change the setup?”
The only reason for changing an internal attenuator or external equipment
between calibrations and measurements is to maximize the signal level
under both conditions, thus minimizing uncertainty due to noise.
Many factors enter into a setup-change decision, for example:
• is it more accurate to calibrate at a low signal level without changing the
setup, or
• is it more accurate to change the setup to optimize levels for both the
calibration and measurement
Changing attenuators at Port 1 or Port 2 does not change the test set
mismatch, directivity, or isolation characteristics severely. It does change the
frequency response magnitude and phase, however. The difference between
frequency response calibration and measurement can be normalized by using
HP 8510C trace memories.
Changing the Test Port
Attenuators
If only the attenuators at Port 1 or Port 2 are changed, use the following
procedure to minimize errors:
1. Connect a short, or a thru, and set Port 1 and Port 2 attenuators for the
best IF signal levels during calibration.
2. Perform the appropriate measurement calibration.
3. Connect the correct calibration standard, set Port 1 and Port 2
attenuators to the value required for operating the test device.
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If you view the response of a short circuit, notice that:
• Changing Port 1 attenuator has negligible effect on S marker reading
11
• Changing Port 2 attenuator has negligible effect on S marker reading
22
This is due to the way the attenuators are paired. Both the reference and the
test signal are changed by approximately equal amounts.
When viewing S or S , however, changing Port 1 or Port 2 attenuators
21
12
offsets the marker reading by the difference value between Port 1 attenuator
and Port 2 attenuator.
Storing Trace
Memories
To compensate for the main frequency response effects due to changing
the attenuators, use the HP 8510C trace memories and trace mathematics
function, as explained below:
1. Connect the thru used for calibration and set the port attenuators to the
value used for device measurement.
2. Recheck the user parameter levels, then press PARAMETER [S21].
3. Press MENUS [DISPLAY], then {DATA AND MEMORIES}.
Press DISPLAY: {DATA-->MEMORY n} to store the S trace in default trace
21
memory 1. This trace represents the frequency response difference
between the S signal path calibration and the measurement.
21
4. Press PARAMETER [S12], then press the following DISPLAY: menu keys:
{SELECT DEFAULTS}
{DEFAULT to MEMORY: 2}
{DATA-->MEMORY 2}
The S trace is now stored in trace memory 2. This trace is the
12
frequency response difference of the S signal path between calibration
12
and measurement.
Viewing Normalized
Parameters
Use the traces stored in memory 1 and memory 2 to normalize the corrected
data to the new levels after the attenuation is changed. The next example
uses normalization for S or S only. To view the corrected parameters:
21
12,
1. Press MENUS [DISPLAY], then {DATA AND MEMORIES}
2. Press PARAMETER [S11] and view the S measurement.
11
3. Press PARAMETER [S22] and view the S measurement.
22
4. Press PARAMETER [S21], then the following DISPLAY: menu keys:
{SELECT DEFAULTS}
{DEFAULT to MEMORY: 1}
{MATH ( / ) }
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5. View the S measurement. If the thru is connected, the transmission
21
coefficient should be 1 ∠0° .
6. Press PARAMETER [S12], then press the following DISPLAY: menu keys:
{SELECT DEFAULTS}
{DEFAULT to MEMORY: 2}
7. Press PARAMETER [S12] to view the S measurement. If the thru is
12
connected, the transmission coefficient should be 1 ∠0° .
Normalization is turned OFF for S and S measurements. Then the
11
22
appropriate memory is selected and normalization is turned on to view S
21
and S .
12
Since these are accurate, repeatable attenuators, this sequence may be
effective in your application. If other parts of the test must be changed,
especially components connected to the test ports, this procedure may
require additional steps to adequately compensate for the changes.
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Making Operational Checks
To check the operation of multiple test-set configurations, do the following:
1. Connect a device with a known response to test set number 1. Press the
following HP 8510C front-panel keys:
INSTRUMENT STATE [LOCAL]
AUXILIARY MENUS [SYSTEM]
{HP-IB ADDRESSES}
{TEST SET}
2. When the message TEST SET HP-IB ADDRESS appears, enter [20], the
address of test set number 1, then press [x1]. The measurement trace from
test-set number 1 should display.
3. Store the trace in memory by pressing the following keys:
MENU [DISPLAY]
{DATA AND MEMORIES}
{DATA --> MEMORY n}
DISPLAY: {DATA and MEMORY]
4. Next, enter the HP-IB address of test set number 2, followed by [x1], then
re-enter the address of test set number 1 followed by [x1].
5. Repeat the above procedure for each of the other test sets in the system.
Observe any difference in the response between the stored trace and the
results trace by switching back and forth between the test sets.
Any differences in data that you suspect are due to the IF switch (Option
001) or to RF switching, must be checked out. Refer to Chapter 5,
“Troubleshooting the Test Set” in this manual.
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Performance Verification
Standard system performance verification procedures verify the operation of
an Option 001 test set used as test set number 1.
To verify the performance of a different test set in the configuration, enter its
to select it, then continue with this procedure.
Refer to the HP 8510C On-Site Service Manual for its performance
verification procedure.
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Using Anti-Rotation Clamps
During the performance verification procedure, use anti-rotation clamps to
secure RF connections at the test ports of each test set. While installed, each
clamp stabilizes the connector on RF cable to the large nut on the test set’s
RF test port. If an adapter is used, the clamp stabilizes the adapter to the
front panel RF port connector.
Without these clamps, the test port connections can loosen when a device
under test is moved. As a result, the loosening can invalidate calibrations and
measurements.
NOTE
These instructions refer to an installation using HP RF cables. However, the
anti-rotation clamps may also be used with front panel adapters. Adapter
installations are similar. There are two anti-rotation clamps included in the
test set accessories box.
Attach the first clamp
Remove one anti-rotation clamp from the accessories box. Loosen its
thumb-screw until it is nearly freed from the counter-sink socket in the
clamp body. The clamp is shown as item (5) in Figure 2-1, “Accessories
Supplied with the HP 8517B Test Set.”
1. Gently push the clamp (round-hole end first) over and past the RF cable
connector to be used.
2. Fit the rubber O-ring in the round end of the clamp over the connector.
NOTE
If the O-ring is not snug or is damaged, refer to the Chapter 6, “Replacement
Procedures” for instructions about replacing the internal O-ring.
3. Wiggle the clamp to ease it over the connector.
4. Attach the cable to the test port and tighten it as specified in the cable
manual.
NOTE
Do not twist the cable as you attach it to the test port.
Use the torque wrench supplied with your calibration kit to tighten the cable
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CAUTION
Important! The test set RF connector becomes loosened easily. Hold the RF
cable securely throughout the remainder of this procedure. Do not allow the
cable to rotate.
Figure 3-5 Using a Torque Wrench Correctly
Positioning the thumb-screw
top of the clamp.
• Turn the clamp to visually align the clamp flats with the flats on the test
port connector nut.
• This positioning minimizes rotating the connector in the procedure step.
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NOTE
The flats may actually be in any orientation, with respect to the front panel.
Figure 3-6 Visually Aligning Clamp and Nut Flats
Positioning the connector
port connector.
1. Hold the test cable with one hand. Use the other hand to press the clamp
gently and steadily, as you wiggle it into position straight over the RF
connector and onto the test port connector nut.
NOTE
Be sure to loosen the clamp when you are slipping it over the connector.
2. Fit the internal flats in the clamp over the flats on the test port connector
nut.
3. Avoid rotating the clamp as you position it so the RF connection remains
tight (remember it loosens easily).
Figure 3-7 Mating the Clamp and Nut Flats
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Operating the HP 8517B Test Set
Using Anti-Rotation Clamps
Aligning the thumb-screw
hole on the clamp’s body.
1. Push the clamp toward the test set front panel.
2. Finger-tighten the thumb-screw. The cable cannot be damaged if the
thumb-screw is tightened too tightly.
Figure 3-8 Aligning the Thumbscrew With the Counter-Sink Hole
Attaching the second clamp
To complete the anti-rotation clamp installation, repeat the steps above,
beginning at step 1 to attach the second clamp.
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Specifications
4
Specifications
Specifications describe the warranted performance of the instrument. The
electrical specifications of the test set when used with an HP 8510 network
analyzer, are defined in the HP 8510C On-Site Service Manual.
Mechanical Specifications
Table 4-1 HP 8510/HP 8517B Mechanical Specifications
Test Port Description
Specification
Connector Type:
2.4 mm1
Precision, rugged male test-port connector
Center Pin Recession2
+0.00254 mm to +0.0178 mm
+0.0001 inches to +0.007 inches
1. Precision rugged make test-port connector.
2. Refer to the calibration kit manual to learn about measuring the pin depth.
Supplemental Characteristics
by giving typical, but non-warranted, performance parameters.
Table 4-2 HP 8510/HP 8517B Supplemental Characteristics
Front Panel Test Ports
Connector type
precision 2.4 mm, male
90 N-cm (8 in-lb), maximum
50 Ω, nominal
Connector torque
Impedance
Damage-input level
At Port 1 and Port 2:
+17 dBm CW, RF
At Port 2 with Option 004:
30 dBm CW (1 watt) CW, RF
DC bias
500 mA, 40 Vdc, maximum
Nominal source operating power level
+2 dBm to –20 dBm,
with flatness correction off, depending on frequency
Nominal connector-nut size
20 mm
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Specifications
Table 4-2 HP 8510/HP 8517B Supplemental Characteristics (Continued)
Rear Panel RF Connectors
Connector type
precision 2.4 mm female
Recommended connection torque
Damage input level
90 N-cm (8 in-lb), maximum for precision-2.4 mm hardware
15 dBm1
8 mm
Nominal connector-nut size
User 1 Power Levels for Reference Channel Phase Lock
–45 dBm
Minimum power level
Maximum power level
–10 dBm to –20 dBm, depending on frequency
HP 8517B Power Requirements and Physical Characteristics
Operating temperature range
Input Power (AC)
0
°
C to 55
°
C
110, 120, 220, or 240 Vac, ±10%
Line frequency from 47 to 66 Hz
Dimensions
Weight
460 mm (High)
(18.1 inches H
×
×
133 mm (Wide)
5.25 inches W
×
609 mm (Deep)
×
24 inches D)
15 kg (35 lb), net
1. This must be AC coupled.
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Specifications
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5
Troubleshooting the Test Set
The troubleshooting strategy for the HP 8517B S-Parameter test set is a
systematic sequence of procedures. The information may be used after
system-level troubleshooting has identified the test set as the problem
instrument.
assembly. Notice procedure numbers within some of the flow diagram
blocks. These are keyed to troubleshooting procedures. Perform the
numbered procedure associated with each block as you progress through the
chart.
Refer to the block diagrams, located at the end of this section, to help you
understand the test set’s operation.
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Troubleshooting the Test Set
Theory of Operation
Theory of Operation
RF paths for Port 1 and Port 2 are similar. This section discusses in detail the
source power signal, as it is routed via the RF IN connector, through the test
set, and to Port 1 for S and S measurements.
11
21
Figure 5-1 Standard HP 8517B RF Block Diagram
The RF Source Power
• RF source power enters the test set through the rear panel. The RF power
is applied to the switch/splitter (A18).
• At the switch/splitter, the power is attenuated by approximately 7 to
14 dB, depending upon frequency.
• The switch/splitter receives its control signals from the attenuator/switch
driver board (A5).
• The switch part of the switch/splitter, which is a combination of two
power splitters and a solid-state switch, selects the power splitter to use
and, therefore, the test port to receive the RF power.
• LEDs on the front panel and on the attenuator/switch driver board (A5)
indicate which test port is active.
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Troubleshooting the Test Set
Theory of Operation
The Reference Signal
Path
• The reference signal is routed from the switch/splitter through the
20-7 dB tapered pad (AT1) to attenuate any VTO feed-through signals.
• The signal is then applied to A10, the a1 sampler assembly, where it is
down-converted to a 20 MHz IF (intermediate frequency).
• Because the RF power is being routed to Port 1, the a1 IF signal is used
to phase lock the network analyzer. Had the RF power been routed to
Port 2, the a2 IF signal would have been used to phase lock the network
analyzer.
The Test Signal Path
• The test signal is routed from the switch/splitter (A18) to the 60 dB
programmable attenuator (A16) for Port 1.
• The signal may then be attenuated in 10 dB steps or passed through
without attenuation to Port 1 bias tee (A7).
• A bias supply to provide dc voltage to Port 1 bias tee can be connected
to J8 on the rear panel of the test set, also.
• The RF signal rides this dc level which is used to turn active devices on
(bias ON) so their S-parameters can be measured.
• Beyond the bias tee, the test signal travels to the directional coupler
(A6).
• At the coupler, the incident RF power is applied to the device under test.
The S and S
Measurements
• The signal reflected from the DUT is separated from the signal incident
11
21
to the DUT by the Port 1 coupler (A6).
• The reflected signal exits the coupler and is applied to b1 sampler (A12),
then is down-converted to a 20 MHz IF signal.
• The S measurement is the ratio of the two IF signals from a1 and b1
11
samplers.
• The incident signal is transmitted through the DUT, through Port 2
coupler, then into b2 sampler (A13).
• The incident signal is down-converted to a 20 MHz IF so S can be
21
measured. S is the ratio of the two IF signals from samplers a1 and b2.
21
The Sampler Control
Switching
• The samplers may be turned on and off, depending upon the parameter
being measured.
• Sampler switching is controlled by a microprocessor on the HP-IB board
assembly (A4). The default condition (test set power ON and no HP-IB
commands sent by the network analyzer) is for the test set to be active
with the RF signal applied to Port 1.
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Troubleshooting the Test Set
Theory of Operation
• If the test set is equipped with Option 001 (multiple test set capability),
its begin state is inactive. That is, rather than using the test set’s internal
IF, a switch is set in the test set to accept an IF from another test set.
The LO Signal Control The LO, generated by A14 VTO/driver, is phase locked to the source so the
desired VTO harmonic is 20 MHz greater than the source frequency.
The phase-locked loop includes:
• Portions of the test set, such as the VTO summing-amp board (A3), the
VTO/driver (A14), and the a1 sampler assembly (A10), and
• The HP 8510C Network Analyzer
The VTO summing-amp board (A3) provides control voltages to tune the
VTO to the correct LO frequency.
The VTO also has an output LENDRA (Low END of RAnge) which is
routed via the test set interconnect cable, to the HP 85102.
The LENDRA provides an indication to the network analyzer about whether
or not the VTO is operating within its normal frequency range.
If the VTO exceeds its normal frequency range, the network analyzer
displays the running error message VTO OVER RANGE.
CAUTION
Electrostatic Discharge Sensitive (ESD) Assemblies
Assemblies you might handle in these troubleshooting procedures are
extremely sensitive to damage from static electricity. They may or may not
continue to function if they are subjected to electrostatic discharge. Their
reliability, however, will be impaired.
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Troubleshooting the Test Set
Troubleshooting Sequence
Troubleshooting Sequence
Use this troubleshooting flowchart, along with the procedures in the
following section, to help isolate faulty assemblies.
Figure 5-2 Troubleshooting Flowchart
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Troubleshooting the Test Set
Troubleshooting Sequence
Equipment Needed
But Not Supplied
set (these items are not supplied with the instrument at shipment).
Table 5-1 Equipment Required, But Not Supplied
Equipment Type
HP Part Number
1-point, Pozidriv screwdriver
2-point, Pozidriv screwdriver
Service adapter
8710-0899
8710-0900
85105-60210
8710-1655
HP 1740A
5/16-inch torque wrench
Oscilloscope
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Troubleshooting the Test Set
Troubleshooting Procedures
Troubleshooting Procedures
The troubleshooting procedures in this chapter are listed below:
A15 Primary Regulator
Board Assembly
Use a digital voltmeter to check the voltages and an oscilloscope to check for
Table 5-2 Power Supply Voltages to A15
Nominal Voltage
Test Point
Voltage Range
Maximum Ripple
Peak-to-Peak
+5.05 Vdc
A15TP1
+4.75 to +5.25
–4.90 to –5.50
+14.10 to +15.60
–14.10 to –15.60
2 mv
2 mv
2 mv
2 mv
–5.20 Vdc
+14.85 Vdc
–14.85 Vdc
A15TP2
A15TP3
A15TP6
A27 Post-Regulator Board
Assembly
(Option 007, Only) Use a digital voltmeter to check the voltages and an
oscilloscope to check for a maximum ripple level as listed in Table 5-3.
Table 5-3 Power Supply Voltages to A27
Nominal Voltage
Test Point
Voltage Range
Maximum Ripple
Peak-to-Peak
+5.0 Vdc
–3.50 Vdc
A27TP1
A27TP2
+4.75 to +5.25
–3.26 to –3.75
2 mv
2 mv
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Troubleshooting the Test Set
Troubleshooting Procedures
Figure 5-3 Power Supply Fuses and Test Points
HP-IB Address Switch
The HP-IB address switch is located on the rear-panel of the instrument. It is
easy to access, but unnecessary to change unless the error message SYSTEM
BUS ADDRESS ERROR appears on the system display.
To set the HP-IB address switch, position the switches as illustrated in
Figure 5-4 (the LSB is on the left-hand side; the MSB is on the right-hand
side). The default setting is decimal twenty, or binary 10100 as read from
right-to-left (on, off, on, off, off). In the drawing, the dark-side is selected.
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Troubleshooting the Test Set
Troubleshooting Procedures
Figure 5-4 Instrument HP-IB Switch Setting
Fuse Location
The fuse is located inside the line module at the rear panel of the test set. The
value rating and part number of the fuse is listed in Chapter 7, “Replaceable
line fuse or to set the voltage selector cam.
Figure 5-5 Fuse and Voltage Cam Location
Self-Test Indicators
five seconds after turning the power on, or if it lights immediately, the
instrument has failed self-test.
To determine the portion of the self-test that failed, note which LEDs on A4
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Troubleshooting the Test Set
Troubleshooting Procedures
Figure 5-6 The ACTIVE LED Location
If the Self-Test Fails to Run Properly
If the portion of memory holding the self-test program is faulty, the self-test
will not run properly. If any of the following conditions occur, it indicates
that the A4 HP-IB board is likely to be faulty.
• All LEDs flash briefly, then turn off
• All LEDs flash briefly and stay on
• The ACTIVE LED turns on too quickly after power on
• The ACTIVE LED does not turn on at all
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Troubleshooting the Test Set
Troubleshooting Procedures
Figure 5-7 HP 8518B Test Set, A4 Board Assembly LEDs
Table 5-4 Instrument Self-Test Indicator State Definitions
Self-Test Indication
PWON
LSN
ON
TLK
ON
ON
SRQ
ON
REM
ON
Time (Following Power-On)
0 to 0.5 seconds
Start ROM Test
OFF
ON
ON
on briefly (a flash)
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Troubleshooting the Test Set
Troubleshooting Procedures
Table 5-4 Instrument Self-Test Indicator State Definitions
Self-Test Indication
Pass ROM Test
Start RAM Test
Pass RAM Test
LSN
OFF
OFF
OFF
TLK
OFF
OFF
OFF
SRQ
ON
REM
ON
Time (Following Power-On)
0.5 to 0.2 seconds
N/A
OFF
OFF
ON
OFF
after 2 seconds
HP 85102 IF
Amplifier Test
The service adapter can substitute as a test set by returning the 20 MHz IF
signal from the HP 85102 to the amplifier on the HP 85102. Doing this
determines whether a fault is in the test set or is in the HP 85102.
Figure 5-8 Service Adapter Connections
Using the Service Adapter
analyzer, press:
INSTRUMENT STATE [PRESET]
MENUS [MARKER]
STIMULUS [MENU]
{STEP}
PARAMETER [MENU]
2. Examine each user parameter by pressing the {USER 1 a1} through
{USER 4 b1} softkeys to observe unratioed power level traces at each
channel.
3. The traces should be flat lines, quite close to one another, as indicated by
the marker value (typically about –28 dB, ±5 dB).
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Troubleshooting the Test Set
Troubleshooting Procedures
Service Adapter Conclusions
Table 5-5 Results Observations
If all channels look good
The HP 85102 is working properly. The problem is
most likely in the source or the test set. Refer to
Procedure 4, “Unratioed Power Tests” in this chapter.
If one or more channels look bad
The problem is most likely in the HP 85102. Refer to
the HP 8510C On-Site Service Manual for information
about troubleshooting the HP 85102.
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Troubleshooting the Test Set
Troubleshooting Procedures
Unratioed Power Test
We will examine six RF signal paths in the test set by observing their
traces (and simplified block diagrams) that are typical for RF paths 1
through 6.
Figure 5-9 Diagram of IF Signal Path
Isolating Signal Path
Problems
Determining the RF component in the test set that is most likely the cause of
a failure can be accomplished within four steps:
1. Run the signal-path tests on paths 1 through 6 using the procedures on
the following pages.
4. Investigate the most probable cause, based on the information in
Testing Signal Paths 1-4
1. Set the network analyzer to its factory default settings by pushing the
front-panel TEST switch.
2. Set the source for step mode. Press the network analyzer keys:
INSTRUMENT STATE [PRESET]
STIMULUS [MENU]
{STEP}
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Troubleshooting the Test Set
Troubleshooting Procedures
3. To examine each sampler’s IF signal, redefine which port and sampler
the network analyzer uses for the phase lock. Use the following steps:
a. Redefining to Port 2, sampler a2, press:
PARAMETER [MENU]
{USER 3 a2} then {REDEFINE PARAMETER}
{DRIVE}
DRIVE: {PORT 2}
{PHASE LOCK}
{a2}
{REDEFINE DONE}
Observe the resulting a2 IF trace on the display.
b. Redefining to Port 2, sampler b2, press:
{USER 2 b2} then {REDEFINE PARAMETER}
{DRIVE}
DRIVE: {PORT 2}
{PHASE LOCK}
{a2}
{REDEFINE DONE}
Observe the resulting b2 IF trace on the display.
4. Connect an open (or short) to Port 1 and Port 2. Power is reflected back
to b1 and b2 samplers through the coupler.
To check each sampler trace, press:
{USER 1 a1}
{USER 2 b2}
{USER 3 a2}
{USER 4 b1}
NOTE
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Troubleshooting the Test Set
Troubleshooting Procedures
Testing Paths 5 and 6
1. Connect a cable between Port 1 and Port 2.
2. To observe the b1 power-level trace through path 5, press:
PARAMETER [MENU]
{USER 4 b1} then {REDEFINE PARAMETER}
{DRIVE}
DRIVE: {PORT 2}
{PHASE LOCK}
{a2}
{REDEFINE DONE}
4. To observe the b2 power level trace through path 6, press:
PARAMETER [MENU]
{USER 2 b2} then {REDEFINE PARAMETER}
{DRIVE}
DRIVE: {PORT 1}
{PHASELOCK}
{a1}
{REDEFINE DONE}
NOTE
Be sure that you return the parameters to their original conditions for a1, b1,
a2, and b2. Use the redefine function to achieve this, or push the instrument
TEST switch to restore factory default conditions.
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Troubleshooting the Test Set
Troubleshooting Procedures
HP 8517B, Option 007
Unratioed Power Test
for the unratioed power tests on HP 8517B, Option 007 model test sets.
Figure 5-13 RF Path 1 through Path 4, HP 8517B Option 007 Test Set
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Troubleshooting the Test Set
Troubleshooting Procedures
Finding the Faulty
Assembly
There are 32 possible combinations, twelve of which point to probable
Table 5-6 Test Results for Path 1 through Path 6
a1
Path1
a2
Path2
b1
Path 3
b2
Path 4
b1 thru
Path5
b2 thru
Path6
Sample Diagnostics
Suppose you have determined that paths 3 and 5 are bad. Paths 1, 2, 4, and 6
is the b1 sampler.
Table 5-7 Most Probable Failures (
B
indicates Bad;
—
indicates Good)
Path
Most Probable Failure
a1
Path1
a2
Path2
b1
Path 3
b2
Path 4
b1 thru
Path5
b2 thru
Path6
Assembly, or Description of Condition
—
B
—
B
—
B
—
B
—
B
—
B
The HP 8517B test set is not the problem
The source, source cable, VTO, cables from rear
panel to switch splitter
—
B
B
—
B
B
—
—
—
—
B
B
—
B
—
B
The switch splitter
—
—
—
B
The switch splitter
—
B
B
—
—
—
B
b1 sampler
—
—
—
B
—
—
—
B
a1 sampler
—
—
—
—
—
—
a2 sampler
—
—
—
—
—
b2 sampler
—
—
B
B
Port 1 connector or directional coupler
B
B
B
A1, T1
—
—
B
—
B
A2, T2
B
B
Port 2 connector or directional coupler
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Troubleshooting the Test Set
Troubleshooting Procedures
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6
HP 8517B Test Set Replacement Procedures
The replacement procedures in this chapter are listed below:
1
2
3
4
5
6
7
8
9
CAUTION
To prevent electrostatic discharge (ESD) damage, earth ground the work area
and yourself. Some of the assemblies being handled in the following
procedures are very sensitive to damage resulting from static discharges.
Assemblies exposed to ESD may or may not continue to operate properly.
ESD-safe workstation recommendations.
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HP 8517B Test Set Replacement Procedures
Figure 6-1 ESD-Safe Workstation Configuration
Performance Tests
Performance test information and procedures are located in Chapter 8 of the
HP 8510C On-Site Service Manual.
Note that the HP 8510C performance test software (shipped with the test set)
is required to test the test set. The results generated during the HP 8517B
performance-test are based on its operation as part of the HP 8510C system.
The HP 8510C includes the test set, cables, calibration kit, and so forth.
Adjustments
The HP 8517B Test Set has no adjustments. Specifically, no attempt should
be made to adjust the samplers.
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HP 8517B Test Set Replacement Procedures
Equipment Needed But Not Supplied
Table 6-1 lists the equipment needed to replace the assemblies documented
Table 6-1 Replacement-Procedure Tools Needed
Tools
Used for Procedure:
HP Part Number
8710-0900
2 point Pozidriv screwdriver
all components
all components
1 point Pozidriv screwdriver
8710-0899
8710-1765
5/16 inch torque wrench, 90 N-cm (8 in-lb)
all components and 3.5 mm semi-rigid cables, 2.4/1.85
mm cables
5/16 inch torque wrench, 112 N-cm (10 in-lb)
1/2 inch torque wrench, 280 N-cm (25 in-lb)
9/16 inch torque wrench, 470 N-cm (42 in-lb)
20 mm torque wrench, 90 N-cm (8 in-lb)
2.9 mm gage kit
HP 8516A 2.4 mm semi-rigid cables
7 mm, 2.4 mm, 1.85 mm test port connectors
HP 8517B rear panel 2.4 mm connectors
2.4 mm and 1.85 mm test port connectors
port connectors
8710-1655
8710-1581
8710-1580
8710-1764
Part of HP 85056A Cal Kit
9300-0797
anti-static mat
all components
wrist strap
all components
9300-1257
clip lead
C1-C4 capacitors
any supplier
any supplier
any supplier
8710-1623
needle nose pliers
couplers
wire cutters
couplers, B1 fan
T-10 Torx screwdriver
all components
T-15 Torx screwdriver
all components
8710-1622
9/16 inch 50 in-lb torque wrench
9/16 inch nut driver
test ports
8710-1948
connector repair
8720-0008
1/2 inch torque wrench, 280 N-cm (25 in-lb)
connector repair
8710-1581
100
Ω
, 20 watt resistor
C1-C4 capacitor removal
coupler removal and test port connector flange removal
fan replacement and test port connector removal
RF input connector
0819-0019
1 inch torque wrench, 800 N-cm (72 in-lb)
5/16 inch open end wrench
1/2 inch open-end wrench
MTB 100 72 lb-in E1
any supplier
any supplier
8710-1770
1/2 x 9/16 inch thin wrench, fixed
5/16 inch thin wrench
Test port connector removal
3.5 mm, 2.4 mm, 1.85 mm semi-rigid connector
removal
8710-2079
1. Order from Mountz Company, 1080 North 11th Street, San Jose, CA 95112, phone (408) 292-2214, or contact Mountz through the
internet at http://www.mountztorque.com/html/home.htm
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
Assembly Replacement Procedures
Initial Precautions
Before beginning any of the procedures in this chapter, do the following:
1. Turn off the HP 8517B test set.
2. Disconnect the test set’s power cord.
3. Remove the top- and side-covers, trim strips, and handles.
4. Do not exceed the maximum torque necessary to secure a connector.
5. Exercise caution with semi-rigid cables; they can be bent very easily.
6. Reverse an assembly’s removal procedure for reinstallation, unless
otherwise instructed.
Switch/Splitter
Replacement
A18 Switch/Splitter Assembly
2. Remove the five semi-rigid cables and the three flexible cables from the
switch/splitter. (Reposition cables as required to ease removal.)
3. Remove the two fixed attenuators from the switch/splitter (note that
there are three fixed attenuators in Option 007, and in Option 004 “plus”
007).
4. Remove the two screws that attach the switch/splitter to the bracket.
5. Remove the switch/splitter from the test set.
Frequency Converter
Replacement
A14, A10 to A13 Frequency Converter Assembly
The frequency converter consists of the A14 VTO (voltage-tuned oscillator)
component locations.
1. Remove the semi-rigid cable attached to each of the four samplers.
2. Remove the four in-line attenuators from the samplers (only in Options
007, Option 002 “plus” 007, and Option 004 “plus” 007).
3. Remove the six flexible cables from the frequency converter by pulling
gently on the gold connector.
4. Remove the four frequency converter mounting plate screws and the
bracket screw that fastens the frequency converter to the chassis.
5. Unplug the ribbon cable near the front panel.
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
6. Unplug the four harnessed (multi-colored) wire and socket assemblies.
7. Lift the frequency converter out of the test set.
8. Remove the frequency converter bracket by removing the two Pozidriv
screws.
Regulator Board
Replacement
A15 Regulator Board Assembly
2. Unplug the transformer socket from the regulator board.
3. Unplug the amplifier socket from the regulator board (only in Options
007, Option 002 “plus” 007, and Option 004 “plus” 007).
4. Remove the three mounting screws from the top edge of the regulator
board.
5. Remove the regulator board. (You may need to partially back out one of
the transformer mounting screws for clearance.)
Filter Capacitor
Replacement
C1 to C4 Filter Capacitors
1. With the test set in an upright position, pull the metal and plastic cover
capacitors.
2. Turn the test set over and remove the bottom cover.
3. To discharge the capacitors, do the following:
a. Attach one end of an insulated clip lead to the chassis of the
instrument.
b. Attach the other end of the clip lead to a 100 ÞΩ 20-watt resistor.
c. Use the resistor to discharge each capacitor terminal (the large
Pozidriv screw on the bottom side of the test set). Each capacitor has
two terminals.
d. Discharge all capacitor terminals. It takes approximately six seconds
per capacitor to discharge.
4. To remove a capacitor, remove the corresponding pair of screws and pull
the capacitor out of the test set.
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
Test Port Connector
Replacement
2.4 mm Test Port Connectors
1. Incline the rear of the test set approximately four inches and support it
with a stable, solid object (such as a thick book).
2. Using a 9/16-inch open-end wrench, unscrew the test port connector nut.
3. Pull out the center conductor assembly and replace it with a new
assembly. Do not touch either end of the new assembly. Part numbers for
the test port connector components are located on page 7-16.
4. Replace the test port connector nut and torque it to 562 N-cm (50 in-lb).
5. Measure the pin depth of each port using a 2.4 mm female pin-depth
gage. Refer to the connector care information in the calibration kit
manual for more information about using the gage.
NOTE
If the center pin protrudes, or if the depth is less than 0.0001 inch, remove
the connector assembly and increase or decrease shims to adjust the pin
depth to between 0.0001 and 0.0007 inch. When measuring the pin depth be
sure to include the uncertainty calculation of your gage.
6. If you added or removed shims, regage the test port connector assembly.
Figure 6-3 Diagram of 2.4 mm Test Port Connector
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
Fan Assembly
Replacement
B1 Fan Assembly
Turn off the test set and disconnect the power cord from the ac-power mains.
WARNING
Electrocution can result if ac power remains connected to the test set during
this procedure. Disconnect the ac power cord before starting.
To replace the B1 fan assembly, remove T1 transformer to expose the ends of
the fan wires which must be de-soldered from the line module, FL1. Refer to
Chapter 7, “Replaceable Parts” in this manual for a detailed view of the fan
and transformer hardware.
2. Position the test set on its right-hand side.
3. Using a 5/16-inch open-end wrench, remove the hard-line cables
connected between the couplers A7 and A9 and the bulkhead connectors
J2 and J5.
4. Unplug the transformer connector at J2 on the A15 regulator board.
5. Using a large Pozidriv screwdriver, remove the four screws and washers
that hold the transformer onto the rear panel.
6. Using a large Pozidriv screwdriver, remove the screw that holds the
transformer angle bracket to the main deck.
NOTE
The transformer wires soldered to the line module are short, so do not pull
the transformer out too far.
7. Carefully remove the transformer from the test set and place it on the
bench near the test set.
8. Strip the heat shrink tubing off the two fan wires, then de-solder the
wires from the line module. Cut any cable ties restraining the fan wires.
9. Using a small Pozidriv screwdriver, remove the screw and lockwasher
that secure the green/yellow fan ground wire to the top of the rear panel
frame.
10. Using a small Pozidriv screwdriver, remove the four screws that hold the
fan to the rear panel. Remove the fan assembly.
Power Transformer
Replacement
T1 Power Transformer
Turn off the test set and disconnect the power cord from the mains.
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
WARNING
Electrocution can result if ac power remains connected to the test set during
this procedure. Disconnect the ac power cord before starting.
2. Position the test set onto its right-hand side.
3. Using a 5/16-inch open-end wrench, remove the hard-line cables
connected between the coupler A7 and the bulkhead connector J2.
4. Unplug the transformer connector from J2 on the A15 regulator board.
5. Using a large Pozidriv screwdriver, remove the four screws and washers
that hold the transformer onto the rear panel.
6. Using a large Pozidriv screwdriver, remove the screw that holds the
transformer angle bracket to the main deck.
NOTE
The transformer wires soldered to the line module are short, so do not pull
the transformer out too far.
7. Carefully remove the transformer from the test set and place it on the
bench near the test set.
8. Strip the heat shrink tubing off the transformer wires that are soldered to
the line module, and de-solder the wires.
9. De-solder the transformer ground wire connected to the chassis side rail.
10. Remove the transformer. When you replace the transformer, refer to
Figure 6-4 for the location of wires connected to the line module.
Figure 6-4 Wire Connections to FL1 Line Module
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
O-Ring Replacement
Anti-Rotation Clamp O-Ring Replacement
1. Pry the O-ring out of the clamp with fine tweezers or a similar tool.
2. To insert the new O-ring (HP part number 0900-0007), engage one side
3. Use your fingers to seat the O-ring into the groove within the clamp.
Figure 6-5 Positioning the O-Ring Within the Clamp
Front Panel and
Interface Board
Replacement
A1 Front Panel and Interface Board Assembly
2. Remove the four semi-rigid cables that connect to the coupler on the
front panel.
3. Remove the ten screws that secure the front panel assembly to the front
frame.
4. Grasp the test ports and pull the front panel assembly out, tilting the top
of the assembly toward you.
5. Unplug the ribbon cable attached to the board assembly on the front
panel.
6. Grasp the cable attached to the line switch and carefully pull it toward
the front of the instrument. This provides enough cable length for you to
tilt the front panel assembly the rest of the way out of the test set frame.
7. Carefully remove the front panel assembly.
8. Lay the front panel assembly face down on the work surface.
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
Bias Tees Replacement
A7 and A9 Bias Tees
2. Remove the two semi-rigid cables attached to the bias tee to be replaced.
3. De-solder the wires attached to the bias tee.
4. Remove the two screws that secure the bias tee to the bias-tee bracket.
5. Remove the bias tee.
NOTE
This procedure does not apply to Option 002 or Option 002 “plus” 007.
Test Port Coupler
Replacement
A6 and A8 Test Port Couplers
3. Remove the test port connector nut with a 1-inch wrench.
4. Remove the test port washer.
5. Remove the coupler from the front panel.
Test Port Attenuator
Replacement
A16 or A17 Port Attenuators
NOTE
This procedure does not apply to Option 002 or Option 002 “plus” 007.
2. Remove the two semi-rigid cables attached to the attenuator.
3. Unplug the ribbon cable from the attenuator.
4. Remove the two screws that secure the attenuator bracket to the
amplifier bracket.
5. Remove the attenuator/attenuator bracket from the instrument.
6. Remove the two screws that secure the attenuator to the attenuator
bracket.
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
Input Amplifier
Replacement
A22 Input Amplifier Assembly
NOTE
This procedure is for Option 007, Option 002 “plus” 007, and Option 004
“plus” 007, only.
amplifier.
2. Without disconnecting AT1 and AT2 fixed attenuators, remove the other
five semi-rigid cables attached to the A18 switch/splitter.
3. Remove the W45 semi-rigid cable between the A22 input amplifier and
J7 rear-panel RF input connector.
4. Remove the two screws holding the switch/splitter to the amplifier
mount bracket.
5. Remove the switch/splitter from the amplifier mount bracket.
6. Remove the four screws that secure the A22 input amplifier to the
amplifier-mount bracket.
Buffer Amplifier
Replacement
A23 to A26 Buffer Amplifiers
NOTE
This procedure is for Option 007, Option 002 “plus” 007, and Option 004
“plus” 007, only.
amplifiers.
2. Remove the two semi-rigid cables from the buffer amplifier to be
replaced.
3. Remove the four screws securing the buffer amplifier to the amplifier
mount bracket.
4. Remove the buffer amplifier.
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
Post Regulator Board
Replacement
A27 Post Regulator Board Assembly
NOTE
This procedure is for Option 007, Option 002 “plus” 007, and Option 004
“plus” 007, only.
amplifier bracket. The A27 board assembly is located beneath the A22
amplifier bracket.
2. Without removing the step attenuator from the bracket (this step is not
applicable to Option 002 “plus” 007), remove the four semi-rigid cables
attached to the attenuators at Port 1 and Port 2.
6. Remove the four screws attaching the amplifier bracket to the test set.
7. Flip the amplifier bracket over. Note the A27 board assembly mounted
to the underside of the bracket.
8. De-solder the two pins from the regulator to remove the A27 amplifier
regulator board assembly.
9. Remove the five screws holding the board assembly to the bracket.
10. Remove the two screws holding the voltage regulator to the bracket.
11. Remove the regulator board assembly from the amplifier mount bracket.
NOTE
Do not loosen the grommets (HP part number 3050-0003) located on the
regulator board assembly.
12. For reassembly, install two grommets on the underside of the mount
bracket. There are two cut-outs on the sheet metal for these grommet
insulators.
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HP 8517B Test Set Replacement Procedures
Assembly Replacement Procedures
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7
HP 8517B Replaceable Parts
Introduction
This section provides information about ordering replacement parts. Parts
that can be replaced include major assemblies and chassis hardware, but not
reference designations and abbreviations used in the parts lists.
Rebuilt-Exchange
Assemblies
Rebuilt-exchange assemblies (R-E assemblies) cost less than new
assemblies. They are available through the rebuilt-exchange program.
Factory rebuilt (repaired and tested) assemblies meet all factory
specifications required of a new assembly. They are available on an
exchange (trade-in) basis only. Defective assemblies must be returned for
figures in this chapter provide parts information. If you have any questions,
contact the HP Sales and Service office in your region.
Replaceable Parts List
Use the illustrations in this chapter to help locate and identify HP 8517B
replaceable parts. Each illustration is accompanied by a replaceable parts list
that includes the following information:
• Hewlett-Packard part number.
• Part quantity as shown in the corresponding figure. (There may or may
not be more of the same part located elsewhere in the instrument.)
NOTE
A typical manufacturer of the part is identified by a five-digit code (refer to
from an alternate supplier (other than Hewlett-Packard).
.
HP 8517B S-Parameter Test Set Manual 7-1
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HP 8517B Replaceable Parts
Ordering Information
To order parts listed in the replaceable parts table, record the following
information, then address the order to the nearest Hewlett-Packard Sales and
Service Office:
the Hewlett-Packard part number
the quantity required
To order parts not listed in the replaceable parts lists, record the following
information:
the instrument model number
the complete instrument serial number
the description and function of the part, and
the number of parts required
Address the order to the nearest Hewlett-Packard Sales and Service Office.
To Order Parts . . . . Fast!
• Telephone 1-(800) 227-8164
• Monday through Friday, 6 am to 5 pm (Pacific Standard Time)
Hewlett-Packard Parts specialists have direct on-line access to replacement
parts inventory corresponding to the replaceable parts list in this manual.
There is a charge for one day delivery service. The standard delivery time is
four days.
For after hours and holidays, phone (415) 968-2347. The fast-service applies
to United States customers, only. Outside the United States, contact your
nearest Hewlett-Packard Sales and Service Office.
Table 7-1
Reference Designation Abbreviations
A
Assembly
F
Fuse
Filter
S
T
Switch
AT
Attenuator, Isolator, Limiter,
Termination
FL
Transformer
B
Fan, Motor
Battery
HY Circulator
TB
TC
Terminal Block
Thermocouple
BT
J
Electrical Connector
(Stationary Portion),
Jack
C
Capacitor
Coupler
K
L
Relay
TP
U
Test Point
CP
Coil, Inductor
Integrated Circuit,
Microcircuit
CR
Diode, Diode Thyristor, Step
Recovery Diode, Varactor
M
Meter
V
Electron Tube
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HP 8517B Replaceable Parts
Table 7-1
Reference Designation Abbreviations (Continued)
DC
Directional Coupler
MP Miscellaneous
Mechanical Part
VR
Breakdown Diode
(Zener), Voltage
Regulator
DL
DS
Delay Line
P
Electrical Connector
W
X
Cable, Wire, Jumper
(Movable Portion), Plug
Annunciator, Lamp, Light
Emitting Diode (LED),
Signaling Device (visible)
Q
Silicon Controlled
Rectifier (SCR),
Transistor, Triode
Thyristor
Socket
E
Miscellaneous Electrical Part
R
Resistor
Y
Z
Crystal Unit
(Piezoelectric, Quartz)
RT Thermistor
Tuned Cavity, Tuned
Circuit
Table 7-2 Manufacturer Names and Addresses
Manufacturer
Code
Manufacturer Name
Manufacturer Address
00000
00853
24546
28480
56289
Any satisfactory supplier
N/A
Sangamo Elec Co. S. Carolina Div
Corning Glass Works (Bradford)
Hewlett-Packard Co. Corporate HQ
Sprague Electric Company
Pickens, SC 29671
Bradford, PA 16701
Palo Alto, CA 94304
North Adams, MA 01247
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HP 8517B Replaceable Parts
Table 7-3 Standard Abbreviations
A
A
Across Flats, Acrylic, Air (Dry Method), Ampere
ADJ
ANSI
ASSY
AWG
Adjust, Adjustment
American National Standards Institute (formerly USASI-ASA)
Assembly
American Wire Gage
B
BCD
BD
Binary Coded Decimal
Board, Bundle
BE-CU
BNC
BRG
BRS
BSC
BTN
Beryllium Copper
Type of Connector
Bearing, Boring
Brass
Basic
Button
C
C
Capacitance, Capacitor, Cold, Center Tapped, Cermet, Compression
CCP
Carbon Composition Plastic
CD
Cadmium, Card, Cord
CER
Ceramic
CHAM
CHAR
CMOS
CNDCT
CONT
CONV
CPRSN
CUP-PT
Chamfer
Character, Characteristic, Charcoal
Complementary Metal Oxide Semi-conductor
Conducting, Conductive, Conductivity, Conductor
Contact, Continuous, Control, Controller
Converter
Compression
Cup point
D
Deep, Depletion, Depth, Diameter, Direct Current
Darlington
D
DA
DAP-GL
DBL
Diallyl Phthalate Glass
Double
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HP 8517B Replaceable Parts
Table 7-3 Standard Abbreviations (Continued)
DCDR
DEG
Decoder
Degree
D-HOLE
DIA
D-Shaped hole
Diameter
DIP
Dual In-Line Package
DIP Solder
DIP-SLDR
DO
Package Type Designation
Deep, Depth, Diametric Pitch, Dip
Depletion Mode
DP
D-MODE
DP3T
DPDT
Double Pole Triple Throw
Double Pole Double
Throw
DWL
Dowel
E
E-R
E-Ring
EXT
Extended, Extension, External, Extinguish
F
F
Fahrenheit, Farad, Female, Fixed, Flange, Frequency, Film (Resistor)
FC
Carbon Film/Composition, Edge of Cut-off Frequency, Face
FDTHRU
FEM
FIL-HD
FL
Feed-through
Female
Fillister Head
Flash, Flat, Fluid
FLAT-PT
FR
Flat Point
Front
RFEQ
FT
Frequency
Current Gain Bandwidth Product (Transition Frequency), Feet, Foot
FXD
Fixed
G
GEN
GND
GP
General, Generator
Ground
General Purpose, Group
H
H
Henry
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HP 8517B Replaceable Parts
Table 7-3 Standard Abbreviations (Continued)
HDW
HEX
HLCL
HP
Hardware
Hexadecimal, Hexagon, Hexagonal
Helical
Hewlett-Packard Company, High Pass
I
IIC
ID
Collector Current, Integrated Circuit
Identification, Inside Diameter
IF
Intermediate Frequency, Forward Current
IN
Inch
INCL
INT
Including
Integral, Intensity, Internal
J
Junction Field Effect Transistor
Junction Field Effect Transistor
K
J-FET
JFET
K
Kelvin, Key, Kilo, Potassium
Knurled
KNRLD
KVDC
Kilovolts Direct Current
L
LED
LG
Light Emitting Diode
Length, Long
LIN
LK
Linear, Linearity
Link, Lock
LKG
LUM
Leakage, Locking
Luminous
M
M
Male, Maximum, Mega, Mi, Milli, Mode
Milliampere
MA
MACH
MAX
MC
Machined
Maximum
Molded Carbon Composition
Metal, Metallized
Mega Hertz
MET
MHZ
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HP 8517B Replaceable Parts
Table 7-3 Standard Abbreviations (Continued)
MINTR
MIT
Miniature
Miter
MLD
MM
Mold, Molded
Magnetized Material, Millimeter
Momentary
MOM
MTG
MTLC
MW
Mounting
Metallic
Milliwatt
N
N
Nano, None
N_CHAN
NH
N-Channel
Nano Henry
NM
Nanometer, nonmetallic
Normally Open, Number
Nominal
NO
NOM
NPN
NS
Negative Positive Negative (Transistor)
Nanosecond, Non-Shorting, Nose
Numeric
NUM
NYL
Nylon (Polyamide)
O
OA
Over-All
OD
Outside Diameter
Operational Amplifier
Optical, Option, Optional
P
OP AMP
Opt
PA
Picoampere, Power Amplifier
Pan Head
PAN-HD
PAR
PB
Parallel, Parity
Lead (Metal), Push-button
Printed Circuit
PC
PCB
P-CHAN
PD
Printed Circuit Board
P-Channel
Pad, Power Dissipation
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HP 8517B Replaceable Parts
Table 7-3 Standard Abbreviations (Continued)
PF
Pico Farad, Power Factor
PKG
PLSTC
PNL
Package
Plastic
Panel
PNP
Positive Negative Positive (Transistor)
POLYC
POLYE
POT
Polycarbonate
Polyester
Potentiometer
POZI
PREC
PRP
Pozidriv Recess
Precision
Purple, Purpose
PSTN
PT
Piston
Part, Point, Pulse Time
PW
Pulse Width
Q
Q
Figure of Merit
R
R
Range, Red, Resistance, Resistor, Right, Ring
REF
RES
RF
Reference
Resistance, Resistor
Radio Frequency
RGD
RND
RR
Rigid
Round
Rear
RVT
Rivet, Riveted
S
Surface Acoustic Wave Resonator
Segment
SAWR
SEG
SGL
SI
Single
Silicon, Square Inch
Slide Slow
SL
SLT
SMA
Slot, Slotted
Subminiature, A-Type (Threaded Connector)
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HP 8517B Replaceable Parts
Table 7-3 Standard Abbreviations (Continued)
SMB
SMC
SPCG
SPDT
SPST
SQ
Subminiature, B-Type (Slip-on Connector)
Subminiature, C-Type (Threaded Connector)
Spacing
Single Pole Double Throw
Single Pole SIngle Throw
Square
SST
Stainless Steel
STL
Steel
SUBMIN
SZ
Subminiature
Size
T
T
Teeth, temperature, Thickness, Time, Timed, Tooth, Typical
TA
Ambient Temperature, Tantalum
Temperature Coefficient
Thread, Threaded
Thick
TC
THD
THK
TO
Package Type Designation
Tapping
TPG
TR-HD
TRMR
TRN
TRSN
Truss Head
Trimmer
Turn, Turns
Torsion
U
UCD
Microcandela
(or
µCD)
UF
(or
Micro Farad
µF)
UH
(or
Micro Henry
µH)
UL
(or
Microliter, Underwriters’ Laboratories, Inc.
µCD)
UNHDND
Unhardened
V
Variable, Violet, Volt, Voltage
Vacuum, Volt—Alternating Current
V
VAC
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HP 8517B Replaceable Parts
Table 7-3 Standard Abbreviations (Continued)
VAR
VDC
Variable
Volts—Direct Current
W
W
Watt, Wattage, White, Wide, Width
W/SW
WW
With, Switch
Wire Wound
X
X
By (as used with dimensions), Reactance
Y
YIG
ZNR
Yttrium-Iron-Garnet
Z
Zener Diode
Table 7-4 Multipliers, Abbreviation and Description
Abbreviation
Prefix
Multiple
T
tera
1012
109
G
M
k
giga
mega
kilo
106
103
da
d
deka
deci
centi
milli
102
10-1
10-2
10-3
10-6
10-9
10-12
10-15
10-18
c
m
µ
n
micro
nano
pico
femto
atto
p
f
a
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HP 8517B Replaceable Parts
Table 7-5 Instrument Fuses
Fuse
Name
Location
Amps for 100 to 120 Vac
Amps for 220 to 250 Vac
(part number)
(part number)
2110-0002
2110-0043
2110-0001
2110-0043
2110-0001
2110-0012
ac Line
F1
Rear Panel
2.0
1.5
1.0
1.5
1.0
0.5
1.0
1.5
1.0
1.5
1.0
0.5
2110-0001
2110-0043
2110-0001
2110-0043
2110-0001
2110-0012
+5 Vdc
- 5 Vdc
+15 Vdc
- 15 Vdc
Bias
F1
Regulator Board
Regulator Board
Regulator Board
Regulator Board
Front Panel
F2
F3
F4
Bias Fuses
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HP 8517B Replaceable Parts
Use this fast, efficient economical
method to keep your Hewlett-
Packard instrument in service.
*Hewlett-Packard pays postage on boxes mailed in the U.S.A.
Figure 7-2 The Low Cost Rebuilt-Exchange Procedure
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HP 8517B Replaceable Parts
Table 7-6 Major Assembly Reference Designator and Parts Information
Ref Des
A1
HP Part Number
QTY
Description
08513-60005
1
2
Front Panel Interface Board Assembly
A6, A8
5086-7518
5086-6518
50 GHz Coupler, (NEW)
50 GHz Coupler, (R-E)
A7, A9
A16, A17
A18
5086-7484
5086-6484
2
2
1
Bias Tee (NEW)
Bias Tee (R-E)
33325-60004
33325-69004
60 dB Step Attenuator (NEW)
60 dB Step Attenuator (R-E)
5086-7570
5086-6570
Switch/Splitter (NEW)
Switch/Splitter (R-E)
AT1, AT2
AT3
33340-60006
5063-0691
2
1
1
20-7 dB Tapered Pad
DC Return
A2
08513-60004
08513-69004
IF-MUX Used for Option 001 (R-E)
A3
08517-60002
08517-69002
1
VTO Summing Amplifier Board Assembly (NEW)
VTO Summing Amplifier Board Assembly (R-E)
A4
A5
08517-60003
08517-60001
5086-6501
1
1
4
HP-IB Board Assembly (NEW)
Attenuator/Switch Driver Board Assembly
Frequency Converter Assembly
A10, A11, A12,
and A13
A14
5086-7501
5086-6501
1
Frequency Converter 50 GHz (Samplers and VTO) (NEW)
Frequency Converter 50 GHz (Samplers and VTO) (R-E)
A15
A19
A20
A27
B1
08516-60002
08513-60001
08513-60006
08517-60044
08513-20031
9100-4723
1
1
1
1
1
1
Regulator Board Assembly
Motherboard Assembly
HP-IB Interface Board Assembly
Post Regulator Board Assembly
Fan-TBAX 34-CFM 115 V 50/60 Hz 1.5kV DIEL
Power Transformer
T1
7-14 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-7 Semi-Rigid Cable Assemblies in the Standard HP 8517B Test Set
*Components not visible
Ref Des
W10
W31
W32
W33
W34
W35
W36
W37
W38
W39
W40
HP Part Number
08517-20039
08517-20042
08517-20041
08517-20038
08517-20038
08517-20028
08517-20031
08517-20027
08517-20032
08517-20056
08517-20040
Quantity
Description
Cable Assembly AT1 to A10J2
1
1
1
1
1
1
1
1
1
1
1
Cable Assembly A8J3 to A11J2
Cable Assembly A6J3 to A12J2
Cable Assembly A8J2 to A9J2
Cable Assembly A6J2 to A7J2
Cable Assembly A17J2 to A18J7
Cable Assembly A7J1 to A16J1
Cable Assembly A16J2 to A18J1
Cable Assembly A9J1 to A17J1
Cable Assembly AT3 to Rear Panel J7
Cable Assembly AT2 to A13J2
7-16 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-8 Flexible Cable Assemblies in the Standard HP 8517B Test Set
Ref Des
W1
HP Part Number
08513-60121
08513-60122
08513-60123
08513-60124
08513-60133
08513-60134
08513-60136
08513-60138
Quantity
Description
Cable Assembly A12J3 to A1J11
1
1
1
1
1
1
1
1
W2
Cable Assembly A13J3 to A4J11
Cable Assembly A10J3 to A2J11
Cable Assembly A11J3 to A3J11
Cable Assembly A3J1 to A14J1
Cable Assembly A3J2 to A7J11
Cable Assembly A3J5 to A5J11
Cable Assembly A3J7 to A6J11
W3
W4
W13
W14
W16
W18
HP 8517B S-Parameter Test Set Manual 7-17
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HP 8517B Replaceable Parts
Table 7-8 Flexible Cable Assemblies in the Standard HP 8517B Test Set (Continued)
W20
W21
W22
W23
W28
W29
W30
W42
W43
W44
08513-60140
08513-60141
08513-60142
08513-60143
08517-60014
85102-60226
08513-60014
08513-60036
08513-60013
08517-60015
1
1
1
1
1
1
1
1
1
1
Cable Assembly A3J4 to A14J2
Cable Assembly A5J2 to A18J4
Cable Assembly A5J1 to A18J3
Cable Assembly A5J3 to A18J6
Ribbon Cable Assembly A16 through A19
Cable Assembly Line Switch
Cable Assembly J10 to J11
Cable Assembly A4 to A20
Cable Assembly A1 to A19
Cable Assembly A17 through A19
7-18 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-9 Miscellaneous Parts, Front Panel HP 8517B Test Set
Ref Des
DS1,DS2
E33,E34
F1,F2
J13,J141
43
HP Part Number
1990-0858
2110-0797
2110-0012
–
Quantity
Description
LED Lamp 25 MA, Maximum
2
2
Fuse Holder
2
Fuse 0.5 A 250 V
Front Bezel
1 ea
1
5021-8747
1450-0615
08340-40002
08517-00002
08517-00003
48
2
Retainer LED
Mount LED
65
2
75
1
Front Dress Panel
Front Sub-Panel
76
1
HP 8517B S-Parameter Test Set Manual 7-19
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HP 8517B Replaceable Parts
Table 7-10 Test Port Connector Assembly Components
Item
1
HP Part Number
Quantity
Description
5062-7274
1
Test Port Connector
2
5001-3930
5001-3904
5001-3905
5001-3906
.0002 IN SHIM
.0005 IN SHIM
.001 IN SHIM
.002 IN SHIM
3
4
5
5062-7276
5021-3428
5021-3427
1
2
2
Test Port Center Conductor
Test Port Connector Nut
Test Port Washer
7-20 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-11 Miscellaneous Parts, Rear Panel HP 8517B Test Set
Ref Des
E10
FL1
J10
J11
1
HP Part Number
5062-7243
9135-0217
1251-2197
1251-2204
0380-0643
0400-0010
0380-0926
1251-7812
0380-0002
2510-0322
2510-0270
3050-0139
3050-0152
3050-0227
3160-0309
08517-00001
2190-0017
08513-00002
Quantity
Description
1
1
1
1
2
4
4
6
4
4
4
12
4
4
1
1
4
1
2.4 mm RF Connector Assembly
Line Module-Filtered
Connector R&P 24F (Part of W30)
Connector R&P 24M (Part of W30)
Standoff-Hex 0.255-IN-LG 6-32 THD
Grommet-Round 0.188-IN-ID .312-IN-GRV-OD
Threaded Insert-STDF 6-32 0.188-IN-LG SST
Connector Jackscrew
21
31
42
61
Screw-Mach 6-32 0.625-IN-LG PAN-HD-POZI
Nut-HEX-W/LKWR 6-32-THD 0.109-IN-THK
Screw-Mach 8-32 3.25-IN-LG PAN-HD-POZI
Washer-FL MTLC NO.8 0.172-IN-ID
Washer-Shoulder NO.8 0.172-IN-ID .438-IN-OD
Washer-FL MTLC NO.6 0.149-IN-ID
Finger Guard
71
103
123
131
141
16
17
Rear Panel
213
361
Washer-LK INTL NO. 10 0.195-IN-ID
Transformer Bracket
HP 8517B S-Parameter Test Set Manual 7-21
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HP 8517B Replaceable Parts
Table 7-11 Miscellaneous Parts, Rear Panel HP 8517B Test Set
49
50
5021-0906
5001-3907
2190-0016
2190-0104
2950-0001
2950-0132
7121-2380
08513-20032
0590-0663
14
2
Teflon™ Cable Sleeve
Line Module Retainer Clips
51
2
Washer-LK INTL T 3/8 IN 0.377-IN-ID
Washer-LK INTL T 7/16 IN 0.439-IN-ID
Nut-HEX-DBL-CHAM 3/8-32-THD 0.094-IN-THK
Nut-HEX-DBL-CHAM 7/16-28-THD 0.094-IN-THK
Serial Number Label
52
1
593
60
2
1
61
1
933
962
2
Transformer Support Bracket
6
Nut-HEX 4/40
7-22 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-12 Miscellaneous Parts, Top Internal View
Item
1
HP Part Number
0360-0031
Quantity
Description
1
5
1
1
1
1
2
1
–
Terminal Crimp
Machine Screw
RFI Gasket
2
2360-0115
3
08512-20005
08513-00001
08513-00002
08513-00015
2200-0109
4
Top Deck
5
Transformer Bracket
Capacitor Plate
Machine Screw
Mounting Plate
6
7
8
08514-00007
9
numbers and locations
C1 through C4 and R1 through R4
10
0513-00037
1
Enclosure Bracket
7-24 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-12 Miscellaneous Parts, Top Internal View
11
2200-0107
3
Machine Screws
Table 7-13 Miscellaneous Parts, Motherboard
bottom.pcx
Ref Des
HP Part Number
0180-2671
Quantity
4
Description
Manufacturer
Code
Manufacturer Part
Number
C1 - C4
Capacitor-FXD .012F+75-10% 30VDC AL
00853
500123U030AC2A
HP 8517B S-Parameter Test Set Manual 7-25
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HP 8517B Replaceable Parts
Table 7-13 Miscellaneous Parts, Motherboard (Continued)
C5 - C6
J1
0160-4834
1251-574
2
Capacitor-FXD .047
µF ±10% 100VDC CER
Connector 20-PIN M Post Type
(A19J1) DOES NOT INCLUDE A19MP1 and
A19MP2
Ref Des
HP Part Number
Quantity
Description
Manufacturer
Code
Manufacturer Part
Number
J2
J3
1251-6868
1251-7939
4
1
Connector 5-PIN M Post Type
Connector - Post Type 0.100-PIN-SPCG 14-CONT
(A19J3 DOES NOT INCLUDE A19MP3)
J4, J5, and J6
J7
1251-6868
1251-3825
1200-0508
0764-0015
0764-0016
0757-0394
1251-7882
Connector 5-PIN M Post Type
Connector 5-PIN M Post Type
Socket - IC 14-CONT DIP-SLDR
1
J8 and J9
R1 and R2
R3 and R4
R5 and R6
1 ea.
1 ea.
1 ea.
1 ea.
1 ea.
Resistor 560
Ω
5% 2W MO TC = 0±200
5% 2W MO TC = 0±200
1% 0.125W F TC = 0±100
Resistor 1 k
Ω
Resistor 51.1
Ω
24546
C4-1/8-T0-51R1-F
XA2, XA3, XA4,
and XA5
Connector-PC Edge 2-Rows
XA6 to XA14
XA15
Not Assigned
1251-7882
1
Connector-PC Edge 2-Rows
7-26 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-14 Parts Unique to HP 8517B Option 001 Test Set
Ref Des
A2
HP Part Number
08513-60004
08513-69004
Quantity
1
Description
Board Assembly, IF Multiplexer (NEW)
Board Assembly, IF Multiplexer (R-E)
Cable Assemblies Unique to Option 001
Cable Assembly, A2J2 to J11A1
Cable Assembly, A2J8 to J11A4
Cable Assembly, A2J5 to J11A2
Cable Assembly, A2J11 to J11A3
Cable Assembly, A2J3 to J10A1
W5
W6
W7
W8
W9
08513-60125
08513-60126
08513-60127
08513-60128
08513-60129
1
1
1
1
1
HP 8517B S-Parameter Test Set Manual 7-27
Download from Www.Somanuals.com. All Manuals Search And Download.
HP 8517B Replaceable Parts
Table 7-14 Parts Unique to HP 8517B Option 001 Test Set
W10
Ref Des
W11
W12
W15
W17
W19
W24
W25
W26
W27
W45
W46
08513-60130
HP Part Number
08513-60131
08513-60132
08513-60135
08513-60137
08513-60139
08513-60144
08513-60145
08513-60146
08513-60147
08517-20017
08517-20018
1
Cable Assembly, A2J9 to J10A4
Quantity
Description
1
1
1
Cable Assembly, A2J6 to J10A2
Cable Assembly, A2J12 to J10A3
Cable Assembly, A3J3 to J10A7
Cable Assembly, A3J6 to J10A5
Cable Assembly, A3J8 to J10A6
Cable Assembly, A12J3 to A2J1
Cable Assembly, A13J3 to A2J7
Cable Assembly, A10J3 to A2J4
Cable Assembly, A11J3 to A2J10
Cable Assembly, A8 to A18
1
1
1
1
1
1
1
Cable Assembly, A6 to A18
7-28 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-15 Parts Unique to HP 8417B Option 002 Test Set
Ref Des
W59
HP Part Number
08517-20743
08517-20737
Quantity
Description
Cable Assembly, A12J3 to Port 1 J13
Cable Assembly, A13J3 to Port 2J14
1
1
W60
HP 8517B S-Parameter Test Set Manual 7-29
Download from Www.Somanuals.com. All Manuals Search And Download.
HP 8517B Replaceable Parts
Table 7-16 Parts Unique to HP 8517B Option 004 Test Set
Ref Des
W55
HP Part Number
08517-20051
08517-20052
08517-20050
08517-60020
Quantity
Description
1
1
1
1
Cable Assembly, AT7 to A9J1
Cable Assembly, A8J3 to A17J2
Cable Assembly, A17J1 to A11J2
3 dB Attenuator
W57
W58
AT7
7-30 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-17 Parts Unique to HP 8517B Option 007 Test Set
Ref Des
AT8 and AT9
A22
HP Part Number
08516-60021
5086-7650
Quantity
Description
2
1
4
3 dB Attenuators
Input Amplifier
A23, A24,
5086-7649
Buffer Amplifiers
A25, and A26
A27
08517-60045
1
Post Regulator Board Assembly (Beneath A22 Input Amplifier)
HP 8517B S-Parameter Test Set Manual 7-31
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HP 8517B Replaceable Parts
Table 7-17 Parts Unique to HP 8517B Option 007 Test Set (Continued)
Ref Des
HP Part Number
Quantity
Description
Cable Assemblies Unique to Option 007
Front Panel J7 to A22 Input Amplifier
A22 Input Amplifier to A18J5
A6 Coupler to A23
AT1 to A24
W45
W46
W47
W48
W49
W50
W51
W52
W53
W54
AT3
08517-20023
08517-20024
08517-2003
08517-20061
08517-20036
08517-20062
08517-20034
08517-20029
08517-20034
08517-20030
33340-60004
08516-60004
33340-60004
08516-60007
1
1
1
1
1
1
1
1
1
1
1
1
1
1
A8 Coupler to A25
AT2 to A26
A23 to AT3
A24 to AT4
A25 to AT5
AT6 to A26
13 dB to 5 dB Attenuator
10 dB Attenuator
AT4
AT5
13 dB to 5 dB Attenuator
10 dB Attenuator
AT6
7-32 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-18 Parts Unique to Option 002 “plus” Option 007
There are no unique parts to Option 002 “plus” Option 007. All other parts are included in Option 002 or Option 007.
HP 8517B S-Parameter Test Set Manual 7-33
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HP 8517B Replaceable Parts
Table 7-19 Parts Unique to Option 004 “plus” Option 007
Ref Des
W56
HP Part Number
08517-20049
Quantity
1
Description
A17J1 to A25
All other parts are included in Option 004 or Option 007.
7-34 HP 8517B S-Parameter Test Set Manual
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HP 8517B Replaceable Parts
Table 7-20 Instrument Chassis Replaceable Parts
Item Number
HP Part Number
Quantity
Description
1
2
3
4
5
6
08513-00040
08513-00041
5021-8403
5062-3747
5062-3799
5021-8496
1
1
1
1
1
1
Top Cover
Side Cover, Perforated
Front Frame
Bottom Cover
Handle Assembly
Trim, Front Handle
HP 8517B S-Parameter Test Set Manual 7-35
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HP 8517B Replaceable Parts
Table 7-20 Instrument Chassis Replaceable Parts (Continued)
7
5041-8821
5062-3757
HP Part Number
5021-5837
5021-5804
5041-8802
5041-8821
5021-8538
5021-8540
4
Bottom Foot
Side Cover
8
1
Item Number
Quantity
Description
9
1
1
1
2
1
1
18-inch Corner Strut
Rear Frame
Trim Strip
10
11
12
13
14
Back Panel Foot
Lock Foot
Lock Foot
7-36 HP 8517B S-Parameter Test Set Manual
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Index
A
E
F
B
H
C
I
J
L
D
M
HP 8517B S-Parameter Test Set Manual Index-1
Download from Www.Somanuals.com. All Manuals Search And Download.
N
S
O
P
T
U
R
V
W
Index-2 HP 8517B S-Parameter Test Set Manual
Download from Www.Somanuals.com. All Manuals Search And Download.
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