CY7C1041DV33
4 Mbit (256K x 16) Static RAM
Features
Functional Description
■ Pin and function compatible with CY7C1041CV33
■ High speed
The CY7C1041DV33 is a high performance CMOS Static RAM
organized as 256K words by 16 bits. To write to the device, take
Chip Enable (CE) and Write Enable (WE) inputs LOW. If Byte
LOW Enable (BLE) is LOW, then data from IO pins (IO to IO )
❐ t = 10 ns
AA
0
7
is written into the location specified on the address pins (A to
0
■ Low active power
A
). If Byte HIGH Enable (BHE) is LOW, then data from IO pins
17
❐ I
= 90 mA at 10 ns (industrial)
■ Low CMOS standby power
❐ I = 10 mA
CC
(IO to IO ) is written into the location specified on the address
8
15
pins (A to A ).
0
17
To read from the device, take Chip Enable (CE) and Output
Enable (OE) LOW while forcing the Write Enable (WE) HIGH. If
BLE is LOW, then data from the memory location specified by
SB2
■ 2.0V data retention
■ Automatic power down when deselected
■ TTL compatible inputs and outputs
■ Easy memory expansion with CE and OE features
the address pins appears on IO to IO . If BHE is LOW, then data
0
7
8
15
The input and output pins (IO to IO ) are placed in a high
0
15
impedance state when the device is deselected (CE HIGH),
outputs are disabled (OE HIGH), BHE and BLE are disabled
(BHE, BLE HIGH), or during a write operation (CE LOW and WE
LOW).
■ Available in Pb-free 48-ball VFBGA, 44-pin (400-mil) molded
SOJ, and 44-pin TSOP II packages
The CY7C1041DV33 is available in a standard 44-pin 400-mil
wide SOJ and 44-pin TSOP II package with center power and
ground (revolutionary) pinout and a 48-ball fine-pitch ball grid
array (FBGA) package.
Logic Block Diagram
INPUT BUFFER
A
0
A
1
A
2
IO –IO
0
7
A
3
A
256K × 16
4
IO –IO
A
6
5
8
15
A
A
7
A
8
COLUMN
DECODER
BHE
WE
CE
OE
BLE
Note
Cypress Semiconductor Corporation
Document #: 38-05473 Rev. *E
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised July 17, 2008
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CY7C1041DV33
Current into Outputs (LOW) ........................................ 20 mA
Static Discharge Voltage............. ...............................>2001V
(MIL-STD-883, Method 3015)
Maximum Ratings
Exceeding maximum ratings may shorten the useful life of the
device. These user guidelines are not tested.
Storage Temperature ................................. –65°C to +150°C
Latch Up Current..................................................... >200 mA
Ambient Temperature with
Power Applied ............................................ –55°C to +125°C
Operating Range
Supply Voltage on V Relative to GND ....–0.3V to +4.6V
CC
Ambient
Temperature
in High-Z State .................................... –0.3V to V +0.3V
Range
V
Speed
CC
CC
Industrial
–40°C to +85°C
3.3V ± 0.3V
10 ns
12 ns
DC Input Voltage ................................ –0.3V to V +0.3V
CC
Automotive
–40°C to +125°C 3.3V ± 0.3V
DC Electrical Characteristics
Over the Operating Range
–10 (Industrial) –12 (Automotive)
Parameter
Description
Test Conditions
= Min, I = –4.0 mA
Unit
Min
Max
Min
Max
V
V
V
V
I
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Leakage Current
V
V
2.4
2.4
V
V
OH
CC
OH
= Min, I = 8.0 mA
0.4
0.4
OL
IH
CC
OL
2.0
–0.3
–1
V
+ 0.3
2.0
–0.3
–1
V
+ 0.3
V
V
CC
CC
[5]
0.8
+1
+1
0.8
+1
+1
IL
GND < V < V
μA
μA
IX
I
CC
I
Output Leakage
Current
GND < V
< V , Output Disabled
–1
–1
OZ
OUT
CC
I
V
Operating
V
= Max, f = f
= 1/t
RC
100 MHz
83 MHz
66 MHz
40 MHz
90
80
70
60
20
-
mA
mA
mA
mA
mA
CC
CC
CC
MAX
Supply Current
95
85
75
25
I
I
Automatic CE Power Down Max V , CE > V
Current—TTL Inputs
SB1
SB2
CC
IH
V
> V or
IN
IN
IH
V
< V , f = f
IL
MAX
Automatic CE Power Down Max V
,
10
15
mA
CC
Current—CMOS Inputs
CE > V – 0.3V,
CC
V
> V – 0.3V,
CC
IN
or V < 0.3V, f = 0
IN
Note
5. Minimum voltage is –2.0V and V (max) = V + 2V for pulse durations of less than 20 ns.
IH
CC
Document #: 38-05473 Rev. *E
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CY7C1041DV33
Capacitance[6]
Parameter
Description
Input Capacitance
IO Capacitance
Test Conditions
Max
8
Unit
pF
C
C
T = 25°C, f = 1 MHz, V = 3.3V
IN
A
CC
8
pF
OUT
Thermal Resistance[6]
FBGA
Package
SOJ
Package
TSOP II
Unit
Parameter
Description
Test Conditions
Package
Θ
Thermal Resistance (Junction Still Air, soldered on a 3 × 4.5 inch,
27.89
57.91
50.66
°C/W
°C/W
JA
to Ambient)
four layer printed circuit board
Θ
Thermal Resistance (Junction
to Case)
14.74
36.73
17.17
JC
AC Test Loads and Waveforms
The AC test loads and waveform diagram follows.
10 ns device
ALL INPUT PULSES
Z = 50Ω
3.0V
GND
OUTPUT
90%
10%
90%
10%
50Ω
30 pF*
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
1.5V
(b)
Fall Time: 1 V/ns
Rise Time: 1 V/ns
(a)
High-Z Characteristics
R 317Ω
3.3V
OUTPUT
5 pF
R2
351Ω
(c)
Notes
6. Tested initially and after any design or process changes that may affect these parameters.
7. AC characteristics (except High-Z) are tested using the load conditions shown in AC Test Loads and Waveforms (a). High-Z characteristics are tested for all speeds
using the test load shown in (c).
Document #: 38-05473 Rev. *E
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CY7C1041DV33
[8]
AC Switching Characteristics Over the Operating Range
–10 (Industrial)
–12 (Automotive)
Parameter
Description
Unit
Min
Max
Min
Max
Read Cycle
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
V
(Typical) to the First Access
100
10
100
12
μs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
power
RC
CC
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE LOW to Data Valid
OE LOW to Data Valid
OE LOW to Low-Z
10
12
AA
3
3
OHA
ACE
DOE
LZOE
10
5
12
6
0
3
0
0
3
0
OE HIGH to High-Z
5
5
6
6
HZOE
LZCE
HZCE
PU
CE LOW to Low-Z
CE HIGH to High-Z
CE LOW to Power Up
CE HIGH to Power Down
Byte Enable to Data Valid
Byte Enable to Low-Z
Byte Disable to High-Z
10
5
12
6
PD
DBE
LZBE
HZBE
0
0
6
6
Write Cycle
t
t
t
t
t
t
t
t
t
t
t
Write Cycle Time
10
7
12
8
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
WC
CE LOW to Write End
Address Setup to Write End
Address Hold from Write End
Address Setup to Write Start
WE Pulse Width
SCE
AW
7
8
0
0
HA
0
0
SA
7
8
PWE
SD
Data Setup to Write End
5
6
Data Hold from Write End
0
0
HD
WE HIGH to Low-Z
3
3
LZWE
HZWE
BW
WE LOW to High-Z
5
6
Byte Enable to End of Write
7
8
Notes
8. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified I /I
OL OH
and 30-pF load capacitance.
9. t
gives the minimum amount of time that the power supply should be at typical V values until the first memory access is performed.
POWER
CC
10. t
, t
, t
and t
are specified with a load capacitance of 5 pF as in part (c) of AC Test Loads and Waveforms. Transition is measured when the outputs enter
HZOE HZCE HZBE,
HZWE
a high impedance state.
11. At any given temperature and voltage condition, t
is less than t
, t
is less than t
, t
is less than t
, and t
is less than t
for any given
HZCE
LZCE HZOE
LZOE HZBE
LZBE
HZWE
LZWE
device.
Document #: 38-05473 Rev. *E
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CY7C1041DV33
Data Retention Characteristics Over the Operating Range
Parameter
Description
Conditions
Min
Max
Unit
V
V
V
for Data Retention
2.0
DR
CC
I
Data Retention Current
V
= V = 2.0V,
Ind’l
10
15
mA
CCDR
CC
DR
CE > V – 0.3V,
V
CC
Auto
mA
> V – 0.3V or V < 0.3V
CC IN
IN
[6]
t
t
Chip Deselect to Data Retention Time
Operation Recovery Time
0
ns
ns
CDR
t
R
RC
Data Retention Waveform
DATA RETENTION MODE
> 2V
3.0V
3.0V
V
VCC
CE
DR
t
t
R
CDR
Switching Waveforms
Figure 4. Read Cycle No. 1
t
RC
ADDRESS
t
AA
t
OHA
DATA OUT
PREVIOUS DATA VALID
DATA VALID
Notes
12. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. CE and WE must be LOW to initiate a write and the transition of either of
these signals can terminate the write. The input data setup and hold timing should be referenced to the leading edge of the signal that terminates the write.
13. The minimum write cycle time for Write Cycle No. 4 (WE controlled, OE LOW) is the sum of t
and t
.
HZWE
SD
14. No input may exceed V + 0.3V.
CC
15. Full device operation requires linear V ramp from V to V
> 50 μs or stable at V
> 50 μs.
CC(min.)
CC
DR
CC(min.)
16. Device is continuously selected. OE, CE, BHE, and BHE = V .
IL
17. WE is HIGH for read cycle.
Document #: 38-05473 Rev. *E
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CY7C1041DV33
Switching Waveforms (continued)
Figure 5. Read Cycle No. 2 (OE Controlled)
ADDRESS
CE
t
RC
t
ACE
OE
t
HZOE
t
DOE
BHE, BLE
t
LZOE
t
HZCE
t
DBE
t
LZBE
t
HZBE
HIGH
IMPEDANCE
HIGH IMPEDANCE
DATA OUT
VCC
SUPPLY
CURRENT
DATA VALID
t
LZCE
t
PD
I
CC
t
PU
50%
50%
I
SB
Figure 6. Write Cycle No. 1 (CE Controlled)
t
WC
ADDRESS
t
SA
t
SCE
CE
t
AW
t
HA
t
PWE
WE
t
BW
BHE, BLE
t
t
SD
HD
DATAIO
Notes
18. Address valid prior to or coincident with CE transition LOW.
19. Data IO is high impedance if OE or BHE and BLE = V
IH.
20. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.
Document #: 38-05473 Rev. *E
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CY7C1041DV33
Switching Waveforms (continued)
Figure 7. Write Cycle No. 2 (BLE or BHE Controlled)
t
WC
ADDRESS
BHE, BLE
t
SA
t
BW
t
AW
t
HA
t
PWE
WE
CE
t
SCE
t
t
HD
SD
DATAIO
Figure 8. Write Cycle No. 3 (WE Controlled, OE HIGH During Write)
t
WC
ADDRESS
CE
t
SCE
t
t
HA
AW
t
t
PWE
SA
WE
OE
BHE, BLE
t
SD
t
HD
DATA IO
NOTE 21
DATAIN VALID
t
HZOE
Note
21. During this period the IOs are in the output state and input signals should not be applied.
Document #: 38-05473 Rev. *E
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CY7C1041DV33
Switching Waveforms (continued)
Figure 9. Write Cycle No. 4 (WE Controlled, OE LOW)
t
WC
ADDRESS
CE
t
SCE
t
AW
t
HA
t
SA
t
PWE
WE
t
BW
BHE, BLE
t
HZWE
t
t
SD
HD
DATA IO
NOTE 21
t
LZWE
Truth Table
IO –IO
IO –IO
15
Mode
Power
CE
OE WE BLE
BHE
0
7
8
H
X
L
X
H
H
H
L
X
L
X
High-Z
High-Z
Power Down
Read All Bits
Standby (I
)
SB
L
L
L
L
L
L
L
L
H
L
Data Out
Data Out
High-Z
Data Out
High-Z
Active (I
Active (I
Active (I
Active (I
Active (I
Active (I
Active (I
)
)
)
)
)
)
)
CC
CC
CC
CC
CC
CC
CC
L
L
Read Lower Bits Only
Read Upper Bits Only
Write All Bits
L
H
L
Data Out
Data In
High-Z
Data In
High-Z
X
X
X
H
L
Data In
Data In
High-Z
L
L
H
L
Write Lower Bits Only
Write Upper Bits Only
Selected, Outputs Disabled
L
H
X
H
X
High-Z
Document #: 38-05473 Rev. *E
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CY7C1041DV33
Ordering Information
Speed
(ns)
Package
Diagram
Operating
Range
Ordering Code
Package Type
10
CY7C1041DV33-10BVI
CY7C1041DV33-10BVXI
CY7C1041DV33-10BVJXI
CY7C1041DV33-10VXI
CY7C1041DV33-10ZSXI
CY7C1041DV33-12BVXE
CY7C1041DV33-12VXE
CY7C1041DV33-12ZSXE
51-85150
48-Ball VFBGA
Industrial
48-Ball VFBGA (Pb-Free) Pinout - 1
48-Ball VFBGA (Pb-Free) Pinout - 2
51-85082
51-85087
51-85150
51-85082
51-85087
44-Pin (400-mil) Molded SOJ (Pb-Free)
44-Pin TSOP II (Pb-Free)
12
48-Ball VFBGA (Pb-Free)
Automotive
44-Pin (400-mil) Molded SOJ (Pb-Free)
44-Pin TSOP II (Pb-Free)
Please contact your local Cypress sales representative for availability of these parts
Package Diagrams
Figure 10. 48-Ball VFBGA (6 x 8 x 1 mm) (51-85150)
BOTTOM VIEW
A1 CORNER
TOP VIEW
Ø0.05 M C
Ø0.25 M C A B
Ø0.30 0.05(48X)
A1 CORNER
1
2
3
4
5
6
6
5
4
3
2
1
A
A
B
C
D
B
C
D
E
E
F
F
G
G
H
H
1.875
A
A
0.75
B
6.00 0.10
3.75
B
6.00 0.10
0.15(4X)
51-85150-*D
SEATING PLANE
C
a
Document #: 38-05473 Rev. *E
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CY7C1041DV33
Package Diagrams(continued)
Figure 11. 44-Pin (400-mil) Molded SOJ (51-85082)
51-85082-*B
Figure 12. 44-Pin TSOP II (51-85087)
51-85087-*A
Document #: 38-05473 Rev. *E
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CY7C1041DV33
Document History Page
Document Title: CY7C1041DV33 4 Mbit (256K x 16) Static RAM
Document Number: 38-05473
Orig. of
Change
Submission
Date
Rev.
ECN No.
Description of Change
**
201560
233729
SWI
RKF
See ECN Advance Data sheet for C9 IPP
*A
See ECN 1.AC, DC parameters are modified as per EROS(Spec # 01-2165)
2.Pb-free offering in the ‘Ordering information’
*B
351117
PCI
See ECN Changed from Advance to Preliminary
Removed 15 and 20 ns Speed bin
Corrected DC voltage (min) value in maximum ratings section from - 0.5 to
- 0.3V
Redefined I values for Com’l and Ind’l temperature ranges
CC
I
(Com’l): Changed from 100, 80 and 67 mA to 90, 80 and 75 mA for 8, 10
CC
and 12ns speed bins respectively
(Ind’l): Changed from 80 and 67 mA to 90 and 85 mA for 10 and 12ns speed
I
CC
bins respectively
Added Static Discharge Voltage and latch-up current spec
Added V
) spec in Note# 2
IH(max
Changed Note# 4 on AC Test Loads
Changed reference voltage level for measurement of Hi-Z parameters from
±500 mV to ±200 mV
Added Data Retention Characteristics/Waveform and footnote # 11, 12
Added Write Cycle (WE Controlled, OE HIGH During Write) Timing Diagram
Changed Package Diagram name from 44-Pin TSOP II Z44 to 44-Pin TSOP II
ZS44 and from 44-Pin (400-mil) Molded SOJ V34 to 44-Pin (400-mil) Molded
SOJ V44
Changed part names from Z to ZS in the Ordering Information Table
Added 8 ns Product Information
Added Pin-Free Ordering Information
Shaded Ordering Information Table
*C
446328
480177
NXR
VKN
See ECN Converted from Preliminary to Final
Removed -8 speed bin
Removed Commercial Operating Range product information
Included Automotive Operating Range product information
Updated Thermal Resistance table
Updated footnote #8 on High-Z parameter measurement
Updated the ordering information and replaced Package Name column with
Package Diagram in the Ordering Information Table
*D
*E
See ECN Added -10BVI product ordering code in the Ordering Information table
2541850 VKN/PYRS
07/22/08
Added -10BVJXI part
Document #: 38-05473 Rev. *E
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CY7C1041DV33
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at cypress.com/sales.
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© Cypress Semiconductor Corporation, 2004-2008. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used
for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use
as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support
systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document #: 38-05473 Rev. *E
Revised July 17, 2008
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