Cypress Computer Hardware CY62128E User Manual

MoBL® CY62128E  
1-Mbit (128K x 8) Static RAM  
Features  
Functional Description  
Very high speed: 45 ns  
The CY62128E is a high performance CMOS static RAM  
organized as 128K words by 8 bits. This device features  
advanced circuit design to provide ultra low active current. This  
is ideal for providing More Battery Life™ (MoBL ) in portable  
Temperature ranges  
®
Industrial: –40°C to +85°C  
Automotive-A: –40°C to +85°C  
Automotive-E: –40°C to +125°C  
applications such as cellular telephones. The device also has an  
automatic power down feature that significantly reduces power  
consumption when addresses are not toggling. Placing the  
device into standby mode reduces power consumption by more  
than 99 percent when deselected (CE HIGH or CE LOW). The  
Voltage range: 4.5V to 5.5V  
Pin compatible with CY62128B  
1
2
eight input and output pins (IO through IO ) are placed in a high  
0
7
Ultra low standby power  
Typical standby current: 1 μA  
Maximum standby current: 4 μA (Industrial)  
impedance state when the device is deselected (CE HIGH or  
1
CE LOW), the outputs are disabled (OE HIGH), or a write  
2
operation is in progress (CE LOW and CE HIGH and WE LOW)  
1
2
To write to the device, take Chip Enable (CE LOW and CE  
Ultra low active power  
Typical active current: 1.3 mA at f = 1 MHz  
1
2
HIGH) and Write Enable (WE) inputs LOW. Data on the eight IO  
pins (IO through IO ) is then written into the location specified  
0
7
Easy memory expansion with CE , CE and OE features  
on the address pins (A through A ).  
1
2,  
0
16  
Automatic power down when deselected  
CMOS for optimum speed and power  
To read from the device, take Chip Enable (CE LOW and CE  
2
1
HIGH) and Output Enable (OE) LOW while forcing Write Enable  
(WE) HIGH. Under these conditions, the contents of the memory  
location specified by the address pins appear on the IO pins.  
Offered in standard Pb-free 32-pin STSOP, 32-pin SOIC, and  
32-pin TSOP I packages  
Logic Block Diagram  
IO  
0
INPUT BUFFER  
A
0
A
1
IO  
1
A
2
A
3
IO  
2
A
4
A
A
A
A
A
A
A
128K x 8  
ARRAY  
IO  
3
5
6
IO  
IO  
IO  
IO  
7
4
5
6
7
8
9
10  
11  
CE  
CE  
1
2
POWER  
DOWN  
COLUMN DECODER  
WE  
OE  
Note  
1. For best practice recommendations, refer to the Cypress application note “System Design Guidelines” at http://www.cypress.com.  
Cypress Semiconductor Corporation  
Document #: 38-05485 Rev. *F  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised August 4, 2008  
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MoBL® CY62128E  
Output Current into Outputs (LOW)............................. 20 mA  
Maximum Ratings  
Static Discharge Voltage...........................................> 2001V  
(MIL-STD-883, Method 3015)  
Exceeding maximum ratings may impair the useful life of the  
device. These user guidelines are not tested.  
Latch up Current.....................................................> 200 mA  
Storage Temperature ................................. –65°C to +150°C  
Ambient Temperature with  
Power Applied ............................................ –55°C to +125°C  
Operating Range  
Ambient  
[7]  
V
CC  
Device  
Range  
Supply Voltage to Ground  
Potential............................... –0.5V to 6.0V (V  
Temperature  
+ 0.5V)  
CC(max)  
CY62128ELL Ind’l/Auto-A  
Auto-E  
–40°C to +85°C 4.5V to 5.5V  
–40°C to +125°C  
DC Voltage Applied to Outputs  
in High-Z State  
.............. –0.5V to 6.0V (V  
+ 0.5V)  
+ 0.5V)  
CC(max)  
........... –0.5V to 6.0V (V  
CC(max)  
DC Input Voltage  
Electrical Characteristics (Over the Operating Range)  
45 ns (Ind’l/Auto-A)  
55 ns (Auto-E)  
Parameter  
Description  
Test Conditions  
= –1 mA  
Unit  
[3]  
Min Typ  
Max  
Min Typ  
2.4  
Max  
V
Output HIGH  
Voltage  
I
I
2.4  
V
V
OH  
OH  
V
Output LOW  
Voltage  
= 2.1 mA  
0.4  
0.4  
OL  
OL  
V
V
I
Input HIGH Voltage V = 4.5V to 5.5V  
2.2  
–0.5  
–1  
V
+ 0.5 2.2  
V + 0.5  
CC  
V
V
IH  
CC  
CC  
Input LOW voltage V = 4.5V to 5.5V  
0.8  
+1  
–0.5  
–4  
0.8  
+4  
IL  
CC  
Input Leakage  
Current  
GND < V < V  
CC  
μA  
IX  
I
I
I
Output Leakage  
Current  
GND <V <V , Output Disabled –1  
+1  
–4  
+4  
μA  
OZ  
O
CC  
V
Operating  
f = f  
= 1/t  
V
= V  
CC(max)  
= 0 mA  
11  
16  
2
11  
35  
4
mA  
CC  
CC  
max  
RC CC  
Supply Current  
I
OUT  
f = 1 MHz  
1.3  
1.3  
CMOS levels  
I
Automatic CE  
Power down  
Current—CMOS  
Inputs  
CE > V – 0.2V or CE < 0.2V,  
1
4
1
30  
μA  
SB2  
1
CC  
2
V
> V – 0.2V or V < 0.2V,  
IN  
CC IN  
f = 0, V = V  
CC  
CC(max)  
[9]  
Capacitance (For all Packages)  
Parameter  
Description  
Test Conditions  
T = 25°C, f = 1 MHz,  
Max  
10  
Unit  
C
C
Input Capacitance  
Output Capacitance  
pF  
pF  
IN  
A
V
= V  
CC  
CC(typ)  
10  
OUT  
Notes  
5.  
6.  
V
V
= –2.0V for pulse durations less than 20 ns.  
IL(min)  
= V + 0.75V for pulse durations less than 20 ns.  
IH(max)  
CC  
7. Full device AC operation assumes a 100 μs ramp time from 0 to V (min) and 200 μs wait time after V stabilization.  
CC  
CC  
8. Only chip enables (CE and CE ) must be at CMOS level to meet the I  
/ I  
spec. Other inputs can be left floating.  
1
2
SB2 CCDR  
9. Tested initially and after any design or process changes that may affect these parameters.  
Document #: 38-05485 Rev. *F  
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MoBL® CY62128E  
Thermal Resistance[9]  
SOIC  
Package  
STSOP  
Package  
TSOP  
Unit  
Parameter  
Description  
Test Conditions  
Package  
Θ
Thermal Resistance  
(Junction to Ambient) two-layer printed circuit board  
Still Air, soldered on a 3 × 4.5 inch,  
48.67  
25.86  
32.56  
3.59  
33.01  
°C/W  
°C/W  
JA  
Θ
Thermal Resistance  
(Junction to Case)  
3.42  
JC  
AC Test Loads and Waveform  
R1  
ALL INPUT PULSES  
90%  
V
CC  
3.0V  
GND  
OUTPUT  
90%  
10%  
10%  
R2  
30 pF  
Rise Time = 1 V/ns  
Fall Time = 1 V/ns  
INCLUDING  
JIG AND  
SCOPE  
Equivalent to:  
THEVENIN EQUIVALENT  
R
TH  
OUTPUT  
V
Parameters  
Value  
1800  
990  
Unit  
Ω
R1  
R2  
Ω
R
639  
Ω
TH  
V
1.77  
V
TH  
Data Retention Characteristics (Over the Operating Range)  
Parameter  
Description  
Conditions  
Min Typ  
Max Unit  
V
V
for Data Retention  
2
V
DR  
CC  
I
Data Retention Current  
V
V
=V , CE > V 0.2V or CE < 0.2V, Ind’l/Auto-A  
4
μA  
μA  
ns  
CCDR  
CC  
IN  
DR  
1
CC  
2
> V - 0.2V or V < 0.2V  
CC  
IN  
Auto-E  
30  
t
t
Chip Deselect to Data  
Retention Time  
0
CDR  
Operation Recovery  
Time  
t
ns  
R
RC  
Data Retention Waveform[11]  
DATA RETENTION MODE  
> 2.0V  
V
V
CC(min)  
V
CC(min)  
VCC  
DR  
t
t
R
CDR  
CE  
Notes  
10. Full device AC operation requires linear V ramp from V to V  
> 100 μs or stable at V  
2
> 100 μs.  
CC  
DR  
CC(min)  
CC(min)  
11. CE is the logical combination of CE and CE . When CE is LOW and CE is HIGH, CE is LOW; when CE is HIGH or CE is LOW, CE is HIGH.  
1
2
1
1
2
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MoBL® CY62128E  
Switching Characteristics (Over the Operating Range)  
45 ns (Ind’l/Auto-A)  
55 ns (Auto-E)  
Parameter  
Read Cycle  
Description  
Unit  
Min  
Max  
Min  
Max  
t
t
t
t
t
t
t
t
t
t
t
Read Cycle Time  
45  
55  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
RC  
Address to Data Valid  
45  
55  
AA  
Data Hold from Address Change  
CE LOW and CE HIGH to Data Valid  
10  
10  
OHA  
ACE  
DOE  
LZOE  
HZOE  
LZCE  
HZCE  
PU  
45  
22  
55  
25  
1
2
OE LOW to Data Valid  
OE LOW to Low-Z  
5
10  
0
5
10  
0
OE HIGH to High-Z  
18  
18  
45  
20  
20  
55  
CE LOW and CE HIGH to Low-Z  
1
2
CE HIGH or CE LOW to High-Z  
1
2
CE LOW and CE HIGH to Power Up  
1
2
CE HIGH or CE LOW to Power Down  
PD  
1
2
Write Cycle  
t
t
t
Write Cycle Time  
45  
35  
35  
55  
ns  
ns  
ns  
WC  
SCE  
AW  
CE LOW and CE HIGH to Write End  
40  
40  
1
2
Address Setup to Write End  
t
t
t
t
t
t
t
Address Hold from Write End  
Address Setup to Write Start  
WE Pulse Width  
0
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
0
0
HA  
SA  
35  
25  
0
40  
25  
0
PWE  
SD  
Data Setup to Write End  
Data Hold from Write End  
HD  
WE LOW to High-Z  
18  
20  
HZWE  
LZWE  
WE HIGH to Low-Z  
10  
10  
Notes  
12. Test conditions for all parameters other than tri-state parameters assume signal transition time of 3ns (1V/ns) or less, timing reference levels of 1.5V, input pulse  
levels of 0 to 3V, and output loading of the specified I /I as shown in the “” on page 4.  
OL OH  
13. At any given temperature and voltage condition, t  
is less than t  
, t  
is less than t  
, and t  
is less than t  
for any given device.  
HZCE  
LZCE HZOE  
LZOE  
HZWE  
LZWE  
14. t  
, t  
, and t  
transitions are measured when the outputs enter a high impedance state.  
HZOE HZCE  
HZWE  
15. The internal Write time of the memory is defined by the overlap of WE, CE = V . All signals must be ACTIVE to initiate a write and any of these signals can  
IL  
terminate a write by going INACTIVE. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write.  
Document #: 38-05485 Rev. *F  
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MoBL® CY62128E  
Switching Waveforms  
Figure 1. Read Cycle 1 (Address Transition Controlled)  
tRC  
ADDRESS  
t
AA  
t
OHA  
DATA OUT  
PREVIOUS DATA VALID  
DATA VALID  
]
Figure 2. Read Cycle No. 2 (OE Controlled)  
ADDRESS  
CE  
t
RC  
t
ACE  
OE  
t
HZOE  
t
DOE  
t
HZCE  
t
LZOE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
DATA VALID  
DATA OUT  
t
LZCE  
t
PD  
ICC  
t
V
CC  
PU  
50%  
SUPPLY  
CURRENT  
50%  
ISB  
Figure 3. Write Cycle No. 1 (WE Controlled)  
t
WC  
ADDRESS  
CE  
t
SCE  
t
t
HA  
AW  
t
SA  
t
PWE  
WE  
OE  
t
t
SD  
HD  
DATA IO  
NOTE  
DATA VALID  
t
HZOE  
Notes:  
16. The device is continuously selected. OE, CE = V , CE = V .  
1
IL  
2
IH  
17. WE is HIGH for read cycle.  
18. Address valid before or similar to CE transition LOW and CE transition HIGH.  
1
2
19. Data IO is high impedance if OE = V  
.
IH  
20. If CE goes HIGH or CE goes LOW simultaneously with WE HIGH, the output remains in high impedance state.  
1
2
21. During this period, the IOs are in output state and input signals must not be applied.  
Document #: 38-05485 Rev. *F  
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MoBL® CY62128E  
Switching Waveforms (continued)  
Figure 4. Write Cycle No. 2 (CE1 or CE2 Controlled)  
t
WC  
ADDRESS  
CE  
t
SCE  
t
SA  
t
t
AW  
HA  
t
PWE  
WE  
t
t
HD  
SD  
DATA IO  
DATA VALID  
Figure 5. Write Cycle No. 3 (WE Controlled, OE LOW)  
t
WC  
ADDRESS  
CE  
t
SCE  
t
t
HA  
AW  
t
SA  
t
PWE  
WE  
t
t
HD  
SD  
NOTE  
DATA VALID  
DATA IO  
t
t
LZWE  
HZWE  
Truth Table  
CE  
H
X
CE  
X
WE  
X
OE  
X
Inputs/Outputs  
High-Z  
Mode  
Power  
1
2
Deselect/Power down  
Deselect/Power down  
Read  
Standby (I  
Standby (I  
)
SB  
SB  
L
X
X
High-Z  
)
L
H
H
L
Data Out  
Data In  
High-Z  
Active (I  
Active (I  
Active (I  
)
)
)
CC  
CC  
CC  
L
H
L
X
Write  
L
H
H
H
Selected, Outputs Disabled  
Document #: 38-05485 Rev. *F  
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MoBL® CY62128E  
Ordering Information  
Speed  
(ns)  
Package  
Diagram  
Operating  
Range  
Ordering Code  
Package Type  
45  
CY62128ELL-45SXI  
CY62128ELL-45ZAXI  
CY62128ELL-45ZXI  
CY62128ELL-45SXA  
CY62128ELL-45ZXA  
CY62128ELL-55SXE  
CY62128ELL-55ZAXE  
51-85081 32-pin 450-Mil SOIC (Pb-free)  
51-85094 32-pin STSOP (Pb-free)  
Industrial  
51-85056 32-pin TSOP Type I (Pb-free)  
51-85081 32-pin 450-Mil SOIC (Pb-free)  
51-85056 32-pin TSOP Type I (Pb-free)  
51-85081 32-pin 450-Mil SOIC (Pb-free)  
51-85094 32-pin STSOP (Pb-free)  
45  
55  
Automotive-A  
Automotive-E  
Contact your local Cypress sales representative for availability of these parts.  
Package Diagrams  
Figure 6. 32-pin (450 Mil) Molded SOIC (51-85081)  
Document #: 38-05485 Rev. *F  
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MoBL® CY62128E  
Figure 7. 32-pin Shrunk Thin Small Outline Package (8 x 13.4 mm) (51-85094)  
51-85094-*D  
Document #: 38-05485 Rev. *F  
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MoBL® CY62128E  
Figure 8. 32-pin Thin Small Outline Package Type I (8 x 20 mm) (51-85056)  
Document #: 38-05485 Rev. *F  
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MoBL® CY62128E  
Document History Page  
®
Document Title: CY62128E MoBL 1-Mbit (128K x 8) Static RAM  
Document Number: 38-05485  
Submission Orig. of  
Revision  
ECN  
Description of Change  
Date  
Change  
**  
203120  
299472  
See ECN  
See ECN  
AJU New data sheet  
*A  
SYT Converted from Advance Information to Preliminary  
Changed t  
Changed t  
Changed t  
from 6 ns to 10 ns for both 35 ns and 45 ns, respectively  
from 15 ns to 18 ns for 35 ns speed bin  
OHA  
DOE  
, t  
from 12 and 15 ns to 15 and 18 ns for the 35 and 45 ns  
HZOE HZWE  
speed bins, respectively  
Changed t from 12 and 15 ns to 18 and 22 ns for the 35 and 45 ns speed  
HZCE  
bins, respectively  
Changed t from 25 and 40 ns to 30 and 35 ns for the 35 and 45 ns speed  
SCE  
bins, respectively  
Changed t from 15 and 20 ns to 18 and 22 ns for the 35 and 45 ns speed bins,  
SD  
respectively  
Added Pb-free package information  
Added footnote #9  
Changed operating range for SOIC package from Commercial to Industrial  
Modified signal transition time from 5 ns to 3 ns in footnote #11  
Changed max of I  
, I  
and I  
from 1.0 μA to 1.5 μA  
SB1 SB2  
CCDR  
*B  
461631  
See ECN  
NXR Converted from Preliminary to Final  
Included Automotive Range and 55 ns speed bin  
Removed 35 ns speed bin  
Removed “L” version of CY62128E  
Removed Reverse TSOP I package from Product offering  
Changed I  
from 8 mA to 11 mA and I  
from 12 mA to 16 mA for f  
CC (Typ)  
CC (max)  
= f  
max  
Changed I  
Removed I  
Changed I  
Changed I  
Changed I  
from 1.5 mA to 2.0 mA for f = 1 MHz  
DC Specs from Electrical characteristics table  
from 1.5 μA to 4 μA  
CC (max)  
SB1  
SB2 (max)  
SB2 (Typ)  
from 0.5 μA to 1 μA  
from 1.5 μA to 4 μA  
CCDR (max)  
Changed the AC Test load Capacitance value from 100 pF to 30 pF  
Changed t  
Changed t  
Changed t  
Changed t  
from 3 to 5 ns  
from 6 to 10 ns  
from 22 to 18 ns  
from 30 to 35 ns  
LZOE  
LZCE  
HZCE  
PWE  
Changed t from 22 to 25 ns  
SD  
Changed t  
from 6 to 10 ns  
LZWE  
Updated the Ordering Information Table  
NXR Updated the Block Diagram on page # 1  
AJU Added footnote 4 on page 2  
*C  
*D  
*E  
464721  
563144  
1024520  
See ECN  
See ECN  
See ECN  
VKN Added Automotive-A information  
Converted Automotive-E specs to final  
Added footnote #9 related to I  
and I  
SB2  
CCDR  
Updated Ordering Information table  
*F  
2548575  
08/05/08  
NXR Corrected typo error in Ordering Information table  
Document #: 38-05485 Rev. *F  
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MoBL® CY62128E  
Sales, Solutions, and Legal Information  
Worldwide Sales and Design Support  
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office  
closest to you, visit us at cypress.com/sales.  
Products  
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General  
psoc.cypress.com  
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image.cypress.com  
psoc.cypress.com/solutions  
psoc.cypress.com/low-power  
psoc.cypress.com/precision-analog  
psoc.cypress.com/lcd-drive  
psoc.cypress.com/can  
Clocks & Buffers  
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psoc.cypress.com/usb  
© Cypress Semiconductor Corporation, 2004-2008. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of  
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for  
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as  
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems  
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),  
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,  
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress  
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without  
the express written permission of Cypress.  
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES  
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not  
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where  
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer  
assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Use may be limited by and subject to the applicable Cypress software license agreement.  
Document #: 38-05485 Rev. *F  
Revised August 4, 2008  
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MoBL is a registered trademark, and More Battery Life is a trademark, of Cypress Semiconductor. All product and company names mentioned in this document are the  
trademarks of their respective holders. All products and company names mentioned in this document may be the trademarks of their respective holders.  
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