Technical Reference
TDS5000B Series
Digital Phosphor Oscilloscopes
Specifications and Performance Verification
071-1420-03
This document applies to firmware version 1.00
and above.
Warning
The servicing instructions are for use by qualified
personnel only. To avoid personal injury, do not
perform any servicing unless you are qualified to
do so. Refer to all safety summaries prior to
performing service.
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Table of Contents
General Safety Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
v
Specifications
Product and Feature Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Acquisition Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Signal Processing Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Display Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Measurement Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Trigger Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Convenience Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specification Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1-1
1-2
1-3
1-3
1-3
1-4
1-4
1-5
Performance Verification
Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2-2
Brief Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Self Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Verify Internal Adjustment, Self Compensation, and Diagnostics . . . . . . .
Functional Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Verify All Input Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Verify the Time Base . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Verify the A (Main) and B (Delayed) Trigger Systems . . . . . . . . . . . . . . .
Verify the File System . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Verify the Internal Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--5
2-5
2-5
2-6
2-7
2-9
2-11
2-12
2-14
Performance Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Prerequisites . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Equipment Required . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TDS5000B Series Test Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Signal Acquisition System Checks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Check DC Voltage Measurement Accuracy . . . . . . . . . . . . . . . . . . . . . . . .
Check Analog Bandwidth . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Check Delay Between Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Check Channel Isolation (Crosstalk) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Time Base System Checks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Check Long-Term Sample Rate and Delay Time Accuracy . . . . . . . . . . .
Check Delta Time Measurement Accuracy . . . . . . . . . . . . . . . . . . . . . . . .
Trigger System Checks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Check Time Accuracy for Pulse, Glitch, Timeout, and Width Triggering .
Check Sensitivity, Edge Trigger, DC Coupled . . . . . . . . . . . . . . . . . . . . . .
Output Signal Checks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Check Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Check Probe Compensation Output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Sine Wave Generator Leveling Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--17
2-17
2-18
2-20
2-24
2-24
2-28
2-33
2-37
2-39
2-39
2-41
2-44
2-44
2-47
2-53
2-53
2-56
2-60
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Table of Contents
List of Figures
Figure 2--1: Toolbar and menu bar . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--3
Figure 2--2: Universal test hookup for functional tests --
CH 1 shown . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--7
2--8
Figure 2--3: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--4: Setup for time base test . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--5: Setup for trigger test . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--6: Setup for the file system test . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--7: Example test page from the internal printer . . . . . . . . .
Figure 2--8: Initial test hookup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--9
2--11
2--13
2--15
2--25
Figure 2--9: Measurement of DC accuracy at maximum offset
and position . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--27
2--29
2--29
2--32
2--34
2--36
2--37
2--39
Figure 2--10: Initial test hookup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--11: Optional initial test hookup . . . . . . . . . . . . . . . . . . . . . .
Figure 2--12: Measurement of analog bandwidth . . . . . . . . . . . . . . . .
Figure 2--13: Initial test hookup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--14: Measurement of channel delay . . . . . . . . . . . . . . . . . . .
Figure 2--15: Initial test hookup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--16: Initial test hookup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--17: Measurement of accuracy --
long-term and delay time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--41
2--42
2--45
Figure 2--18: Delta time accuracy test hookup . . . . . . . . . . . . . . . . . .
Figure 2--19: Initial test hookup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--20: Measurement of time accuracy for pulse and
glitch triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--46
2--48
Figure 2--21: Initial test hookup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--22: Measurement of trigger sensitivity showing
50 MHz results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--50
2--53
2--55
2--56
2--57
2--58
2--59
Figure 2--23: Initial test hookup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--24: Measurement of main trigger out limits . . . . . . . . . . . .
Figure 2--25: Initial test hookup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--26: Measurement of probe compensator frequency . . . . . .
Figure 2--27: Subsequent test hookup . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 2--28: Measurement of probe compensator amplitude . . . . . .
Figure 2--29: Sine wave generator leveling equipment setup
(Method A) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--60
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Table of Contents
Figure 2--30: Sine wave generator leveling equipment
setup (Method B) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2--62
List of Tables
Table 1--1: TDS5000B Series models . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 1--2: Channel input and vertical specifications . . . . . . . . . . . .
Table 1--3: Horizontal and acquisition system specifications . . . . . .
Table 1--4: Trigger specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 1--5: Display specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 1--6: Input/output port specifications . . . . . . . . . . . . . . . . . . . .
Table 1--7: Data storage specifications . . . . . . . . . . . . . . . . . . . . . . . .
Table 1--8: Power source specifications . . . . . . . . . . . . . . . . . . . . . . . .
Table 1--9: Mechanical specifications . . . . . . . . . . . . . . . . . . . . . . . . .
Table 1--10: Environmental specifications . . . . . . . . . . . . . . . . . . . . .
Table 1--11: Certifications and compliances . . . . . . . . . . . . . . . . . . . .
1--1
1--5
1--12
1--13
1--18
1--18
1--19
1--20
1--20
1--21
1--22
Table 2--1: Test equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 2--2: DC Voltage measurement accuracy . . . . . . . . . . . . . . . . .
Table 2--3: Analog bandwidth . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 2--4: Delta time measurement . . . . . . . . . . . . . . . . . . . . . . . . . .
2--18
2--26
2--30
2--43
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Table of Contents
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General Safety Summary
Review the following safety precautions to avoid injury and prevent damage to
this product or any products connected to it. To avoid potential hazards, use this
product only as specified.
Only qualified personnel should perform service procedures.
While using this product, you may need to access other parts of the system. Read
the General Safety Summary in other system manuals for warnings and cautions
related to operating the system.
To Avoid Fire or
Personal Injury
Use Proper Power Cord. Use only the power cord specified for this product and
certified for the country of use.
Connect and Disconnect Properly. Do not connect or disconnect probes or test
leads while they are connected to a voltage source.
Ground the Product. This product is grounded through the grounding conductor
of the power cord. To avoid electric shock, the grounding conductor must be
connected to earth ground. Before making connections to the input or output
terminals of the product, ensure that the product is properly grounded.
Observe All Terminal Ratings. To avoid fire or shock hazard, observe all ratings
and markings on the product. Consult the product manual for further ratings
information before making connections to the product.
Do Not Operate Without Covers. Do not operate this product with covers or panels
removed.
Use Proper Fuse. Use only the fuse type and rating specified for this product.
Avoid Exposed Circuitry. Do not touch exposed connections and components
when power is present.
Do Not Operate With Suspected Failures. If you suspect there is damage to this
product, have it inspected by qualified service personnel.
Do Not Operate in Wet/Damp Conditions.
Do Not Operate in an Explosive Atmosphere.
Keep Product Surfaces Clean and Dry.
Provide Proper Ventilation. Refer to the manual’s installation instructions for
details on installing the product so it has proper ventilation.
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General Safety Summary
Symbols and Terms
Terms in this Manual. These terms may appear in this manual:
WARNING. Warning statements identify conditions or practices that could result
in injury or loss of life.
CAUTION. Caution statements identify conditions or practices that could result in
damage to this product or other property.
Terms on the Product. These terms may appear on the product:
DANGER indicates an injury hazard immediately accessible as you read the
marking.
WARNING indicates an injury hazard not immediately accessible as you read the
marking.
CAUTION indicates a hazard to property including the product.
Symbols on the Product. The following symbols may appear on the product:
Protective Ground
(Earth) Terminal
CAUTION
Refer to Manual
WARNING
High Voltage
Standby
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Specifications
This chapter contains specifications for the TDS5000B Series Digital Phosphor
Oscilloscopes. All specifications are guaranteed unless labeled “typical.” Typical
specifications are provided for your convenience but are not guaranteed.
Specifications marked with the n symbol are verified in the Performance
Verification section.
The specifications in this section apply to all TDS5000B Series models unless
noted otherwise. To meet specifications, the following conditions must be met:
H
H
H
H
H
The oscilloscope must have been calibrated in an ambient temperature
between 20 °C and 30 °C (68 °F and 86 °F).
The oscilloscope must be operating within the environmental limits listed in
Table 1--10 on page 1--22.
The oscilloscope must be powered from a source that meets the specifica-
tions listed in Table 1--8 on page 1--21.
The oscilloscope must have been operating continuously for at least 20
minutes within the specified operating temperature range.
You must perform the Signal Path Compensation procedure after the
20-minute warm-up period and the ambient temperature must not change
more than 5 °C (9 °F) without first repeating the procedure. See Run the
signal-path compensation routine on page 2--6 for instructions on how to
perform this procedure.
H
You must perform the Signal Path Compensation procedure after the
20-minute warm-up period, and the ambient temperature must not change
more than 5 °C without first repeating the procedure. See Optimizing
Measurement Accuracy on page NO TAG for instructions to perform this
procedure.
Product and Feature Description
The TDS5000B Series Digital Phosphor Oscilloscope family consists of the
models shown in Table 1--1.
1-1
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Specifications
Table 1-1: TDS5000B Series models
Number of
channels
Maximum sample
rate (real time)
Model
Bandwidth
350 MHz
350 MHz
500 MHz
500 MHz
500 MHz
1 GHz
TDS5032B
TDS5034B
TDS5052B
TDS5054B
TDS5054BE
TDS5104B
2
4
2
4
4
4
5 GS/s
5 GS/s
5 GS/s
5 GS/s
1 GS/s
5 GS/s
Acquisition Features
Separate Digitizers. Ensure accurate timing measurements with separate digitizers
for each channel. Acquisition on multiple channels is always concurrent and
supports full bandwidth for single-shot acquisitions on each channel. The
digitizers can also be combined to yield a higher sample rate on a single channel.
NOTE. Full bandwidth single-shot acquisition is not available for TDS5104B
Series oscilloscopes, except in one or two channel mode.
Digitizers cannot be combined to yield a higher sample rate for a single channel
when using TDS5054BE Series oscilloscopes.
Fast Acquisition. Acquire up to 100,000 waveforms per second to see rapidly
changing signals or intermittent signal irregularities.
Long Record Lengths. Choose record lengths from 500 points to up to 2,000,000
points per channel (up 8,000,000 points on a single channel). Extend the
maximum record length up to a maximum of 16,000,000 points with memory
options.
Peak Detect Acquisition Mode. See pulses as narrow as 400 ps, even at the slower
time base settings. Peak detect helps you see noise and glitches in your signal.
Acquisition Control. Acquire continuously or set up to capture single shot
acquisitions. Enable or disable optional acquisition features such as equivalent
time or roll mode.
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Specifications
Horizontal Delay. Use delay when you want to acquire a signal at a significant
time interval after the trigger point. Toggle delay on and off to quickly compare
the signal at two different points in time.
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Specifications
Signal Processing
Features
Average, Envelope, and Hi Res Acquisition. Use Average acquisition mode to
remove uncorrelated noise from your signal. Use Envelope to capture and
display the maximum variation of the signal. Use Hi Res to increase vertical
resolution for lower bandwidth signals.
Waveform Math. Set up simple math waveforms using the basic arithmetic
functions including FFT, or create more advanced math waveforms using the
optional math expression editor. Waveform expressions can even contain
measurement results and other math waveforms.
Spectral Analysis. Display spectral magnitude and phase waveforms based on
your time-domain acquisitions. Control the oscilloscope using the traditional
spectrum analyzer controls such as span and center frequency.
Color LCD Display. Identify and differentiate waveforms easily with color coding.
Waveforms, readouts, and inputs are color matched to increase productivity and
reduce operating errors.
Display Features
Digital Phosphor. A Digital Phosphor Oscilloscope can clearly display intensity
modulation in your signals. The oscilloscope automatically overlays subsequent
acquisitions and then decays them to simulate the writing and decay of the
phosphor in an analog oscilloscope CRT (cathode-ray tube). The feature results
in an intensity-graded or color-graded waveform display that shows the
information in the intensity modulation.
Fit to Screen. The Digital Phosphor technology performs the compression
required to represent all record points on the screen, even at the maximum record
length settings.
Zoom. To take advantage of the full resolution of the oscilloscope you can zoom
in on a waveform to see the fine details. Both vertical and horizontal zoom
functions are available.
Measurement Features
Cursors. Use cursors to take simple voltage, time, and frequency measurements.
Automatic Measurements. Choose from a large palette of amplitude, time, and
histogram measurements. You can customize the measurements by changing
reference levels or by adding measurement gating.
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Specifications
Trigger Features
Simple and Advanced Trigger Types. Choose simple edge trigger or choose from
many advanced trigger types to help you capture a specific signal fault or event.
Dual Triggers. Use the A (main) trigger system alone or add the B trigger to
capture more complex events. You can use the A and B triggers together to set
up a delay-by-time or delay-by-events trigger condition.
Convenience Features
Autoset. Use Autoset to quickly set up the vertical, horizontal, and trigger
controls for a usable display.
Touch Screen Interface. (Optional) You can operate all oscilloscope functions
(except the power switch) from the touch screen interface. You can also install a
mouse and keyboard to use the interface.
Toolbar or Menu Bar. You can choose a toolbar operating mode that is optimized
for use with the touch screen, or a PC-style menu-bar operating mode that is
optimized for use with a mouse.
Open Desktop. The oscilloscope is built on a Microsoft Windows software
platform; the oscilloscope application program starts automatically when you
apply power to the instrument. You can minimize the oscilloscope application
and take full advantage of the built-in PC to run other applications. Moving
waveform images and data into other applications is as simple as a copy/paste
operation.
Dedicated Front Panel Controls. The front panel contains knobs and buttons to
provide immediate access to the most common oscilloscope controls. Separate
vertical controls are provided for each channel. The same functions are also
available through the screen interface.
Data Storage and I/O. The oscilloscope has a standard floppy disk drive and
CD-R/W drive or optional removable hard disk drive, that can be used for
storage and retrieval of data. The oscilloscope has GPIB, USB, Parallel, RS232,
and Ethernet ports for input and output to other devices.
Online Help. The oscilloscope has a complete online help system that covers all
its features. The help system is context sensitive; help for the displayed control
window is automatically shown if you touch the help button. Graphical aids in
the help windows assist you in getting to the information you need. You can also
access the help topics through a table of contents or index.
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Specifications
Specification Tables
Table 1-2: Channel input and vertical specifications
Characteristic
Input coupling
Input channels
Description
AC, DC, and GND
TDS5034B, TDS5054B,
Four identical channels
TDS5054BE, TDS5104B
TDS5032B, TDS5052B
Two identical channels
Input impedance selection
50 Ω or 1 MΩ.
TDS5104B bandwidth limited to 500 MHz, 1 MΩ selected
Input impedance, DC coupled
Product
Limits
50 Ω, typical
TDS5032B, TDS5052B,
TDS5034B, TDS5054B,
TDS5054BE
1.0%
TDS5104B
2.5%
VSWR
TDS5032B, TDS5034B
≤1.6:1 typical from DC to
350 MHz
TDS5052B, TDS5054B,
TDS5054BE
≤1.6:1 typical from DC to
500 MHz
TDS5104B
≤1.5:1 typical from DC to
1 GHz
1 MΩ
TDS5032B, TDS5052B,
TDS5034B, TDS5054B,
TDS5054BE
1.0% in parallel with
15.5 pF 2 pF
TDS5104B
1.0% in parallel with
18 pF 2 pF
Maximum voltage at input BNC
AC, DC, or GND coupled
1 MΩ
150 VRMS CAT I, and ≤400 peak
For steady state sinusoidal waveforms, derate at
20 dB/decade above 200 kHz to 9 VRMS at ≥3 MHz
50 Ω
TDS5032B, TDS5052B,
TDS5034B, TDS5054B,
TDS5054BE
5 VRMS with peaks less
than 30 V
TDS5104B
<1 Vrms for settings be-
low 100mV/div
<5 Vrms for 100 mV/div
settings and above
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Specifications
Table 1-2: Channel input and vertical specifications (Cont.)
Characteristic
Description
n Differential delay, DC 50 Ω
input
≤100 ps between any two channels with DC input
coupling and the same V/div scale settings at or above
10 mV/div
Deskew range, typical
75.0 ns
n Channel-to-channel crosstalk
≥100:1 at ≤100 MHz
≥30:1 at >100 MHz up to the rated bandwidth for any two
channels with equal V/div settings
Digitizers
8-bit resolution
TDS5032B, TDS5052B
Two separate digitizers,
each channel sampled
simultaneously
TDS5034B, TDS5054B,
TDS5054BE, TDS5104B
Four separate digitizers,
each channel sampled
simultaneously
Sensitivity range
1 MΩ
Fine adjustment available with ≤1% resolution
1 mV/div to 10 V/div, in a 1-2-5 sequence
1 mV/div to 1 V/div, in a 1-2-5 sequence
50 Ω
n Analog bandwidth
TDS5032B, TDS5034B
SCALE range
Bandwidth
1 mV/div to 1.99 mV/div
2 mV/div to 4.98 mV/div
5 mV/div to 1 V/div
DC to 150 MHz
DC to 250 MHz
DC to 350 MHz
DC 50 Ω coupling; bandwidth limit set to Full; operating
ambient ≤30 °C; derated by 2.5 MHz/°C above 30 °C
TDS5052B, TDS5054B,
TDS5054BE
1 mV/div to 1.99 mV/div
DC to 175 MHz
2 mV/div to 4.98 mV/div
5 mV/div to 1 V/div
DC to 300 MHz
DC to 500 MHz
DC 50 Ω coupling; bandwidth limit set to Full; operating
ambient ≤30 °C; derated by 2.5 MHz/°C above 30 °C
TDS5104B
1 mV/div to 1.99 mV/div
2 mV/div to 1 V/div
DC to 175 MHz
DC to 1 GHz
DC 50 Ω coupling; bandwidth limit set to Full; operating
ambient ≤30 °C; derated by 5 MHz/°C above 30 °C
Analog bandwidth selections
20 MHz, 150 MHz, or Full
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Specifications
Table 1-2: Channel input and vertical specifications (Cont.)
Characteristic
Description
Analog Bandwidth Limit
Low frequency, AC coupled 50 Ω: <200 kHz
1 MΩ: <10 Hz, reduced by a factor of ten when using a
10X probe
High frequency, typical
Calculated rise time, typical
TDS5032B, TDS5034B
20 MHz: with 20 MHz bandwidth limit turned on
150 MHz: with 150 MHz bandwidth limit turned on
DC 50 Ω coupling, bandwidth limit set to Full
SCALE range
Rise time
2.67 ns
1.6 ns
1 mV/div to 1.99 mV/div
2 mV/div to 4.98 mV/div
5 mV/div to 1 V/div
1.15 ns
2.29 ns
TDS5052B, TDS5054B,
TDS5054BE
1 mV/div to 1.99 mV/div
2 mV/div to 4.98 mV/div
5 mV/div to 1 V/div
1.33 ns
800 ps
2.29 ns
300 ps
TDS5104B
1 mV/div to 1.99 mV/div
2 mV/div to 1 V/div
Step response settling errors,
typical
Bandwidth limit set to Full
SCALE range
Settling error at time after
step
≤2 V step amplitude
≤20 V step amplitude
≤200 V step amplitude
Position range
1 mV/div to 99.5 mV/div
100 mV/div to 1.0 V/div
1.01 V/div to 10 V/div
5 divisions
20 ns: ≤0.5%
100 ns: ≤0.2%
20 ms: ≤0.1%
20 ns: ≤1.0%
100 ns: ≤0.5%
20 ms: ≤0.2%
20 ns: ≤1.0%
100 ns: ≤0.5%
20 ms: ≤0.2%
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Specifications
Table 1-2: Channel input and vertical specifications (Cont.)
Characteristic
Description
Peak Detect or Envelope Mode
Pulse Response
Capture of single event pulses
Number of channels
1 or 2
Minimum pulse width
400 ps
800 ps
3 or 4
Offset range
User-adjustable input offset voltages
TDS5032B, TDS5034B,
TDS5052B, TDS5054B,
TDS5054BE
SCALE range
Offset range
1 MΩ coupling
1 mV/div to 99.5 mV/div
100 mV/div to 1 V/div
1.01 V/div to 10 V/div
1 mV/div to 99.5 mV/div
100 mV/div to 1 V/div
SCALE range
1 V
10 V
100 V
1 V
50 Ω coupling
10 V
TDS5104B
Offset range
1 V
1 MΩ coupling
1 mV/div to 99.5 mV/div
100 mV/div to 1 V/div
1.01 V/div to 10 V/div
1 mV/div to 50 mV/div
50.5 mV/div to 99.5 mV/div
100 mV/div to 500 mV/div
505 mV/div to 1 V/div
10 V
100 V
0.5 V
0.25 V
5 V
50 Ω coupling
2.5 V
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Specifications
Table 1-2: Channel input and vertical specifications (Cont.)
Characteristic
Description
Offset accuracy
SCALE range
Offset range
1 mV/div to 9.95 mV/div
[(0.2% ×| net offset |) +
1.5 mV + (0.1 div ×V/div
setting)]
10 mV/div to 99.5 mV/div
100 mV/div to 1.0 V/div
1.01 V/div to 10 V/div
Temperatures >40 °C
[(0.35% ×| net offset |) +
1.5 mV + (0.1 div ×V/div
setting)]
[(0.35% ×| net offset |) +
15 mV + (0.1 div ×V/div
setting)]
[(0.25% ×| net offset |) +
150 mV + (0.1 div ×V/div
setting]
[(0.75% ×| net offset |) +
150 mV + (0.1 div ×V/div
setting)]
where, net offset = offset - (position × volts/division)
DC gain accuracy, Sample or
Average acquisition mode
1.5% + 1.0% × |net offset /offset range|
TDS5104B: 3% + 1.0% × |net offset /offset range| for
2 mV/div - 3.98 mV/div
Refer to Offset Range specifications
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Specifications
Table 1-2: Channel input and vertical specifications (Cont.)
Characteristic
Description
DC voltage measurement accuracy Measurement type
DC accuracy (in volts)
Sample acquisition mode,
typical
Any sample
[(1.5% + 1.0% × |net
offset /offset range|)×
|reading - net offset| +
offset accuracy + (0.13 div
× V/div setting) + 0.6 mV]
TDS5104B: 2 mV/div -
3.98 mV/div
[(1.5% + 3.0% × |net
offset /offset range|)×
|reading - net offset| +
offset accuracy + 0.13 div
×V/div setting + 0.6 mV]
Delta voltage measurement [1.5% + 1.0% × |net
between any two points
acquired under the same
setup and ambient condi-
tions
offset /offset range|×
|reading - net offset| +
(0.26 div × V/div setting) +
1.2 mV]
TDS5104B: 2 mV/div -
3.98 mV/div
[1.5% + 3.0% × |net
offset /offset range|×
|reading - net offset| + 0.26
div ×V/div setting
+ 1.2 mV]
where, net offset = offset - (position × volts/division)
n Average acquisition
mode
Average of ≥16 waveforms
[1.5% + 1.0% × |net
offset /offset range|×
|reading - net offset| +
offset accuracy + 0.06 div
× V/div]
TDS5104B: 2 mV/div -
3.98 mV/div
[1.5% + 3.0% ×
|net offset /offset range|×
|reading - net offset| +
offset accuracy + 0.06 div
× V/div]
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Specifications
Table 1-2: Channel input and vertical specifications (Cont.)
Characteristic
Description
Delta voltage measurement [1.5% + 1.0% × |net
between any two averages offset /offset range|×
of ≥16 waveforms acquired |reading - net offset| +
under the same setup and (0.1 div × V/div setting) +
ambient conditions
0.3 mV]
TDS5104B: 2 mV/div -
3.98 mV/div
[1.5% + 3.0% × |net
offset /offset range|×
|reading - net offset|
+ 0.1 div × V/div
+ 0.3 mV]
Where, net offset = offset - (position × volts/division)
Nonlinearity, typical
Effective bits, typical
<1 LSB differential, <1 LSB integral, independently
based
Sine wave input at the indicated frequency and pk-pk
amplitude, 50 mV/div and 25 °C
Signal and input conditions Effective bits
TDS5032B, TDS5034B,
1 MHz, 9.2 div, 5 GS/s
sample rate, Sample
acquisition mode
6.8 bits
9.1 bits
6.5 bits
6.5 bits
6.6 bits
9.0 bits
4.7 bits
TDS5052B, TDS5054B,
TDS5054BE
1 MHz, 9.2 div, 10 MS/s
sample rate, HiRes acquisi-
tion mode
TDS5032B, TDS5034B
350 MHz, 6.5 div, 5 GS/s
sample rate, Sample
acquisition mode
TDS5052B, TDS5054B,
TDS5054BE
500 MHz, 6.5 div, 5 GS/s
sample rate, Sample
acquisition mode
TDS5104B
1 MHz, 9.2 div, 5 GS/s
sample rate, Sample
acquisition mode
1 MHz, 9.2 div, 10 MS/s
sample rate, HiRes acquisi-
tion mode
1 GHz, 6.5 div, 5 GS/s
sample rate, Sample
acquisition mode
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Specifications
Table 1-3: Horizontal and acquisition system specifications
Characteristic
Description
Acquisition modes
Sample, Peak detect, Hi Res, Average, and Envelope
Fast acquisition rate
Up to 100,000 waveforms-per-second with Fast
Acquisition mode on
Up to 130 waveforms-per-second with Fast Acquisition
mode off
Minimum record length
Maximum record length
500 points
Depends on number of active channels and amount of
memory installed
Standard
2,000,000 points (3 or 4 channels)
4,000,000 points (2 channels)
8,000,000 points (1 channel)
Option 3M installed
4,000,000 points (3 or 4 channels)
8,000,000 points (2 channels)
16,000,000 points (1 channel)
Sample rate range, real-time
Number acquired channels Sample rate range
TDS5032B, TDS5034B,
TDS5052B, TDS5054B,
TDS5104B
1
1.25 S/s to 5 GS/s
2
1.25 S/s to 2.5 GS/s
1.25 S/s to 1.25 GS/s
1.00 S/s to 1.00 GS/s
3 or 4
1,2,3, or 4
TDS5054BE
Equivalent-time sample rate or
interpolated waveform rate range
Listed values depend on the number of channels in use,
horizontal scale, and resolution settings.
Equivalent-time acquisition can be enabled or disabled.
When disabled, waveforms are interpolated at the fastest
time base settings.
TDS5032B, TDS5034B,
TDS5052B, TDS5054B,
TDS5104B
2.5 GS/s to 250 GS/s
TDS5054BE
Seconds/division range
Horizontal delay range
2 GS/s to 200 GS/s
(s/div x 10) to 1,000 s
16 ns to 250 s
n Long term sample rate and
delay time accuracy
15 ppm over any ≥1 ms interval
RMS aperture uncertainty, typical
≤ [3 ps + (0.1 ppm × record duration)] for real-time or
interpolated records with a duration ≥1 minute
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Specifications
Table 1-3: Horizontal and acquisition system specifications (Cont.)
Characteristic
Description
n Delta time measurement
accuracy
For a single channel, with signal amplitude > 5 div,
reference level set at 50%, interpolation set to sin(x)/x,
volts/division set to ≥ 5 mV/div, with (displayed
risetime)/(sample interval) ratio between 1.4 and 4, where
sample interval = 1/(real-time sample rate)
Conditions
Accuracy
Single shot signal, Sample, (15 ppm × | reading | +
or Hi Res acquisition mode, 0.3 sample intervals)
Full bandwidth
Average acquisition mode,
(15 ppm × | reading | +
≥100 averages, Full band- 20 ps)
width
Table 1-4: Trigger specifications
Characteristic
Description
Auxiliary trigger input resistance,
typical
≥1.5 kΩ
Maximum trigger input voltage,
typical
20 V (DC or peak AC)
n Edge trigger sensitivity, Main
and Delayed trigger
Trigger Source
Sensitivity
TDS5032B, TDS5034B
Any channel, DC coupled
0.35 div from DC to
50 MHz, increasing to 1 div
at 350 MHz
Auxiliary input
400 mV from DC to
50 MHz, increasing to
750 mV at 100 MHz
TDS5052B, TDS5054B,
TDS5054BE
Any channel, DC coupled
0.35 div from DC to
50 MHz, increasing to 1 div
at 500 MHz
Auxiliary input
400 mV from DC to
50 MHz, increasing to
750 mV at 100 MHz
TDS5104B
Any channel, DC coupled
0.35 div from DC to
50 MHz, increasing to 1 div
at 1 GHz
Auxiliary input
400 mV from DC to
50 MHz, increasing to
750 mV at 100 MHz
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Specifications
Table 1-4: Trigger specifications (Cont.)
Characteristic
Description
All sources, for vertical scale settings ≥10 mV/div and
Edge trigger sensitivity, typical
≤1 V/div
Trigger coupling
NOISE REJ
AC
Sensitivity
3 × the DC-coupled limits
Same as DC-coupled limits
for frequencies ≥60 Hz;
attenuates signals <60 Hz
HF REJ
LF REJ
1.5 × the DC-coupled
limits from DC to 30 kHz;
attenuates signals >30 kHz
1.5 × the DC-coupled
limits for frequencies ≥80
kHz; attenuates signals
<80 kHz
Advanced trigger sensitivity, typical For all trigger types except Edge, with vertical scale
settings ≥10 mV/div and ≤1 V/div
1.0 div from DC to 500 MHz
Event count sensitivity, typical
For sequential trigger delayed by events, with vertical
scale settings ≥10 mV/div and ≤1 V/div
1.0 div, from DC to 500 MHz
Video trigger sensitivity, typical
For delayed and main triggers, with vertical scale settings
≥10 mV/div and ≤1 V/div
Any channel
0.6 to 2.5 divisions of video
sync tip
Video Trigger Format
Triggers from negative sync composite video, field 1 or
field 2 for interlaced systems, any field, specific line, or
any line for interlaced or noninterlaced systems
Supported systems include NTSC, PAL, SECAM, and
analog HDTV
Trigger level or threshold range
Trigger Source
Sensitivity
Any channel
10 divisions from center of
screen
Auxiliary input
Line
8 V
Fixed at zero volts
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Specifications
Table 1-4: Trigger specifications (Cont.)
Characteristic
Description
Trigger level or threshold accuracy, Edge trigger, DC coupling, for signals having rise and fall
typical
times ≤20 ns
Trigger Source
Any channel
Accuracy
[(2% ×| setting - net
offset |) + (0.3 div × volts/
div setting) + offset accu-
racy]
Auxiliary
Not calibrated or specified
Where, net offset = offset - (position × volts/division)
Set level to 50% function, typical
Trigger position error, typical
Operates with signals ≥30 Hz
Edge trigger, DC coupling, for signals having a slew rate
at the trigger point of ≤0.5 div/ns
Acquisition mode
Sample, Average
Envelope
Error
(1 displayed pt + 1 ns)
(2 displayed pts + 1 ns)
Trigger jitter, typical
B Event (Delayed) trigger
Range
σ = 8 ps RMS
Trigger After Time
Trigger on nth Event
Delay time = 16 ns to
250 s
Event count = 1 to 107
Minimum time between arm 2 ns from the end of the
2 ns between the A trigger
(A Event) and trigger
(B Event), typical
time period to the B trigger event and the first B trigger
event
event
Minimum pulse width,
typical
—
B event width ≥1 ns
Maximum frequency, typical —
B event frequency
≤500 MHz
Advanced trigger timing
For vertical scale settings ≥10 mV/div and ≤1 V/div
Minimum recognizable
event width or time
Minimum rearm time to
recognize next event
Glitch type
Minimum glitch width = 1 ns 2 ns + 5% of glitch width
setting
Runt or window type
Minimum runt width = 2 ns 2 ns
Runt or window type (time Minimum runt width = 2 ns 8.5 ns + 5% of runt width
qualified) setting
Runt or window type (logic Minimum runt width = 2 ns 8.5 ns + 5% of runt width
qualified)
setting
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Table 1-4: Trigger specifications (Cont.)
Characteristic
Width type
Description
Minimum difference
between upper and lower
limits = 1 ns
2 ns + 5% of upper limit
setting
Timeout type
Minimum timeout time =
1 ns
2 ns + 5% of timeout set-
ting
Transition type
Pattern type, typical
Minimum transition time = 8.5 ns + 5% of transition
600 ps time setting
Minimum time the pattern is 1 ns
true = 1 ns
Logic
Not applicable
1 ns
Events Delay
State type, typical
1 ns (single channel)
Not applicable
1 ns
Minimum true time before
clock edge = 1 ns
Minimum true time after
clock edge = 1 ns
Setup/Hold type, typical
Minimum clock pulse width Minimum clock pulse width
from active edge to inactive from inactive edge to active
edge
edge
3 ns + hold time setting
2 ns
Setup and Hold parameters Limits
Setup time (time from data -100 ns minimum
transition to clock edge)
+100 ns maximum
Hold time (time from clock
edge to data transition)
-1 ns minimum
+102 ns maximum
Setup time + Hold time
(algebraic sum of the two
settings)
+2 ns minimum
+202 ns maximum
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Table 1-4: Trigger specifications (Cont.)
Characteristic
Description
Advanced trigger timer ranges
Glitch type
Limits
1 ns to 1 s
Runt or window type, wider 1 ns to 1 s
than
Runt or window type, time 1 ns to 1 s
qualified
Width type
1 ns to 1 s
Timeout type
Transition type
Pattern type
Setup/Hold type
1 ns to 1 s
1 ns to 1 s
1 ns to 1 s
Setup and Hold timers
Limits
Setup time (time from data -100 ns to +100 ns
transition to clock edge)
Hold time (time from clock
edge to data transition)
-1 ns to +100 ns
+2 ns to +200 ns
Setup time + Hold time
(algebraic sum of the two
settings)
n Advanced trigger timer accuracy For Glitch, Timeout, or Width types
Time range
Accuracy
1 ns to 500 ns
520 ns to 1 s
(20% of setting + 0.5 ns)
(0.01% of setting +
100 ns)
Trigger holdoff range
1.5 ꢀs to 12 s, minimum resolution is 8 ꢀs for settings
≤1.2 ms
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Table 1-5: Display specifications
Characteristic
Description
Display type
264 mm (10.4 in) diagonal, liquid crystal active-matrix
color display
Width: 211.2 mm (8.3 in)
Length:: 158.4 mm (6.2 in)
Display resolution
Pixel pitch
640 horizontal × 480 vertical pixels
0.33 mm horizontal, 0.33 mm vertical
150:1
Contrast ratio, typical
Response time, typical
Display refresh rate
Displayed intensity levels
50 ms, black to white
59.94 frames per second
Supports Windows SVGA high-color mode
(16-bit or 24-bit)
Table 1-6: Input/output port specifications
Characteristic
Description
n Probe Compensator Output
Front-panel terminals
Output voltage
Frequency
1.0 V (from base to top)
1 kHz 5%
1.0% into a ≥ 10 kΩ load
n Analog Signal Output
Rear-panel BNC connector, provides a buffered version of
the signal that is attached to the channel 3 signal input
50 mV/div 20% into a 1 MΩ load
25 mV/div 20% into a 50 Ω load
Bandwidth, typical
100 MHz into a 50 Ω load
n Auxiliary Output levels
Rear-panel BNC connector, provides a TTL-compatible,
negative-polarity pulse for each A or B trigger (selectable)
V
out
high
V
out
low (true)
≥2.5 V into open circuit,
≤0.7 V with ≤4 mA sink,
≥1.0 V into 50 Ω load
≤0.25 V into 50 Ω load
Auxiliary Output pulse width, typical Pulse width varies, 1 ꢀs minimum
External Reference Input
Rear-panel BNC connector
9.8 MHz to 10.2 MHz
200 mVp-p to 7 Vp-p
<1.5 kΩ in series with ~10 nF DC blocking capacitor
Ports located on the side panel
Side-panel I/O ports
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Table 1-6: Input/output port specifications (Cont.)
Characteristic
Parallel port (IEEE 1284)
Description
DB-25 connector, supports the following modes:
Standard, output only
Bidirectional, PS-2 compatible
Bidirectional Enhanced Parallel Port (IEEE 1284
standard, mode 1 or mode 2, v 1.7)
Bidirectional High-speed Extended Capabilities Port
Audio ports
Miniature phone jacks for stereo microphone input and
stereo line output
USB port (2)
Allows connection of USB keyboard/mouse and or other
devices while scope power is on
Supports USB 2.0 protocol
Keyboard port
Mouse port
PS-2 compatible, oscilloscope power must be off to make
connection
PS-2 compatible, oscilloscope power must be off to make
connection
LAN port
RJ-45 connector, supports 10 base-T and 100 base-T
Serial port (COM1)
DB-9 connector, uses NS16C550-compatible UARTS,
transfer speeds up to 115.2 kb/s
SVGA video port
Upper video port, DB-15 female connector, connect a
second monitor to use dual-monitor display mode,
supports Basic requirements of PC99 specifications
GPIB port
IEEE 488.2 standard interface
Scope VGA video port
Lower video port, DB-15 female connector, 31.6 kHz
sync, EIA RS-343A compliant, connect to show the
oscilloscope display, including live waveforms, on an
external monitor
Table 1-7: Data storage specifications
Characteristic
Description
CD-ROM
Side-panel CD-R/W drive; reads CD/CD-ROM, CD-R, and
CD-R/W disks
24X read speed; 24X write speed
Floppy disk
Hard disk
Front-panel 3.5 in USB floppy disk drive, 1.44 MB
capacity
Standard internal hard disk capacity: 80 GB
External hard disk capacity: refer to added options
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Table 1-8: Power source specifications
Characteristic
Description
Source voltage and frequency
Power consumption
Fuse rating
100 to 240 VRMS 10%, 47 Hz to 63 Hz
≤220 Watts
Internal to power supply; not serviceable by user
Nonvolatile memory retention
CMOS settings stored for a period of 3 years without
instrument connection to power mains
Calibration settings and error log entries stored for
1 million cycles or 20 years
Overvoltage Category
Overvoltage Category II (as defined in IEC61010-1/A2)
Table 1-9: Mechanical specifications
Characteristic
Description
Weight
Benchtop configuration
24.75 lbs (10.2 kg) oscilloscope only
56.5 lbs (25.6 kg) when packaged for domestic shipment
Rackmount kit
5 lbs (2.3 kg) rackmount conversion kit
8 lbs (3.6 kg) kit packaged for domestic shipment
Dimensions
Benchtop configuration
Height: 14.2 in (360.7 mm)
Height:, feet extended:14.25 in (362 mm)
Width: 17.6 in (447 mm)
Depth: 11.35 in (288.3 mm)
Rackmount configuration
(Option 1R)
Height: 10.5 in (267 mm)
Width: 19 in (483 mm)
Depth: 9.1 in (231 mm)
Cooling
Fan-forced air circulation with no air filter
Required clearances
Top
0 in (0 mm)
Bottom
0.25 in minimum or
0 in (0 mm) when standing
on the feet
Left side
3 in (76 mm)
Right side
0 in [5 in (126 mm) required
to access CD-ROM]
Front
Rear
0 in (0 mm)
0 in (0 mm)
1-21
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Table 1-9: Mechanical specifications (Cont.)
Characteristic
Description
Construction material
Chassis parts constructed of aluminum alloy; front-panel
constructed of plastic laminate; circuit boards constructed
of glass laminate; outer shell molded and textured from a
polycarbonate/ABS blend
Table 1-10: Environmental specifications
Characteristic
Description
Temperature
Operating
+5 °C to +45 °C (+41 °F to +113 °F)
+15 °C to +45 °C ⟨+59 °F to +113 °F) with integrated
printer, Option 1P, installed
Nonoperating
Humidity
- 2 0 °C to +60 °C (-4 °F to +140 °F)
Operating
20% to 80% relative humidity with a maximum wet bulb
temperature of +29 °C (84.2 °F) at or below +45 °C
(113 °F), noncondensing
Upper limit derated to 30% relative humidity at +45 °C
(113 °F)
Nonoperating
With no diskette in floppy disk drive
5% to 90% relative humidity with a maximum wet bulb
temperature of +29 °C (84.2 °F) at or below +60 °C
(+140 °F), noncondensing
Upper limit derated to 20% relative humidity at +60 °C
(+140 °F)
Altitude
Operating
10,000 ft (3,048 m)
40,000 ft (12, 190 m)
Nonoperating
Random vibration
Operating
0.1 gRMimesS from 5 Hz to 500 Hz, 10 minutes on each
axis
Nonoperating
Shock, nonoperating
2.0 gRMS from 5 Hz to 500 Hz, 10 minutes on each axis
30 g (11 ms half-sine wave) or less
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Table 1-11: Certifications and compliances
Category
Standards or description
Meets intent of Directive 89/336/EEC for Electromagnetic Compatibility. Compliance was
EC Declaration of Conformity -
EMC
demonstrated to the following specifications as listed in the Official Journal of the European Union:
EN 61326 Emissions 1, 3, 4 Class A Radiated and Conducted Emissions
EN 61326 Immunity 1, 4
IEC 61000-4-2
Electrostatic Discharge Immunity
4 kV contact discharge, 8 kV air discharge
RF field immunity
IEC 61000-4-3
3 V/m, 80 MHz to 1 GHz,
80% amplitude modulated with a 1 kHz sinewave 2
Electrical Fast Transient/Burst Immunity
1 kV on AC mains, 500 V on I/O
AC Surge Immunity
IEC 61000-4-4
IEC 61000-4-5
IEC 61000-4-6
500 V differential mode, 1 kV common mode
RF Conducted Immunity
3 V, 150 kHz to 80 MHz, amplitude modulated with a
1 kHz sinewave 2
IEC 61000-4-11 AC Mains Voltage Dips and Interruption Immunity
100% reduction for one cycle
EN 61000-3-2
Power Harmonic Current Emissions
EN 61000-3-3
Voltage Changes, Fluctuations, and Flicker
1
Use low-EMI shielded interconnect cables, equivalent to the following Tektronix cables:
GPIB cable: 012-0991-01, 012-0991-02, or 012-0991-03.
RS-232 cable: 012-1213-00 or CA part number 0294-9.
Centronics Cable: 012-1214-00 or LCOM part number CTL3VGAMM-5 VGA Cable.
2
Under theses conditions, the specifications are amended as follows:
1 mV/division to 1 V/division: ≤0.2 division waveform displacement or ≤0.4 division increase
in peak-to-peak noise.
3
4
Radiated emissions may exceed the levels specified in EN 61326 when this oscilloscope is
connected to a test object.
Tested in accordance with EN 61326 Annex D.
FCC
Radiated and conducted emissions do not exceed the levels specified in FCC47 CFR, Part 15,
Subpart B, for Class A equipment.
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Table 1-11: Certifications and compliances (cont.)
Category
Standards or description
EC Declaration of Conformity -
Low Voltage
Compliance was demonstrated to the following specification as listed in the Official Journal of the
European Union:
Low Voltage Directive 73/23/EEC, amended by 93/68/EEC
EN 61010-1/A2:1995
Safety requirements for electrical equipment for measurement
control and laboratory use.
U.S. Nationally Recognized
Testing Laboratory Listing
UL3111-1, First Edition
Standard for electrical measuring and test equipment.
Canadian Certification
Additional Compliance
CAN/CSA C22.2,
No. 1010.1-92
Safety requirements for electrical equipment for measurement,
control, and laboratory use.
IEC61010-1/A2
Safety requirements for electrical equipment for measurement,
control, and laboratory use.
Installation (Overvoltage)
Category
Terminals on this product may have different installation (overvoltage) category designations. The
installation categories are:
CAT III Distribution-level mains (usually permanently connected). Equipment at this level is
typically in a fixed industrial location.
CAT II Local-level mains (wall sockets). Equipment at this level includes appliances, portable
tools, and similar products. Equipment is usually cord-connected.
CAT I
Secondary (signal level) or battery operated circuits of electronic equipment.
Pollution Degree
A measure of the contaminates that could occur in the environment around and within a product.
Typically the internal environment inside a product is considered to be the same as the external.
Products should be used only in the environment for which they are rated.
Pollution Degree 2
Normally only dry, nonconductive pollution occurs. Occasionally a
temporary conductivity that is caused by condensation must be
expected. This location is a typical office/home environment.
Temporary condensation occurs only when the product is out of
service.
Safety Certification Compliance
Equipment Type
Test and measuring
Safety Class
Class 1 (as defined in IEC 61010-1/A2) - grounded product
Pollution Degree 2 as defined in IEC 61010-1/A2
Pollution Degree
Rated for indoor use only
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Performance Verification
Two types of Performance Verification procedures can be performed on this
product: Brief Procedures and Performance Tests. You may not need to perform
all of these procedures, depending on what you want to accomplish.
H
H
H
To rapidly confirm oscilloscope function and proper adjustment, perform the
procedures under Self Tests, which begin on page 2--5.
Advantages: These procedures are quick to do, require no external
equipment or signal sources, and perform extensive functional and accuracy
testing to provide high confidence that the oscilloscope will perform
properly. They can be used as a quick check before making a series of
important measurements.
To further check functionality, first perform the Self Tests just mentioned;
then perform the procedures under Functional Tests that begin on page 2--6.
Advantages: These procedures require minimal additional time to perform,
require no additional equipment other than a 10X probe such as a P5050, and
more completely test the internal hardware of the oscilloscope. They can be
used to quickly determine if the oscilloscope is suitable for putting into
service, such as when it is first received.
If more extensive confirmation of performance is desired, do the Perform-
ance Tests, beginning on page 2--17, after doing the Functional and Self Tests
mentioned above.
Advantages: These procedures add direct checking of the warranted
specifications marked with the n symbol in the Specifications section.
These procedures are fairly quick to execute but require specific test
equipment. (See Table 2--1: Test equipment on page 2--18).
If you are not familiar with operating this oscilloscope, read the oscilloscope
reference or user manuals or explore the online help.
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Performance Verification
Conventions
Throughout the performance verifications procedures the following conventions
apply:
H
Each test procedure uses the following general format:
H
H
H
H
Title of Test
Equipment Required
Prerequisites
Procedure
H
Each procedure consists of as many steps, substeps, and subparts as required
to perform the test. Steps, substeps, and subparts are sequenced as follows:
1. First Step
a. First Substep
H
H
First Subpart
Second Subpart
b. Second Substep
2. Second Step
H
H
In steps and substeps, the lead-in statement in italics instructs you what to
do, while the instructions that follow tell you how to do it, as in the example
step below:
Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.
Where instructed to use a control in the display or a front-panel button or
knob, the name of the control, button, or knob appears in boldface type.
Where instructed to make or verify a setting, the value of the setting also
appears in boldface type.
STOP. The STOP notation at the left is accompanied by information you must read
to do the procedure properly.
H
The term “toolbar” refers to a row of buttons at the top of the display. The
term “menu bar” refers to a row of menus at the top of the display. You can
switch between toolbar and menu bar operating modes by clicking the button
near the top right corner of the display. See Figure 2--1.
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Performance Verification
Toolbar
Click here to change to
menu bar mode
Menu bar
Click here to change to
toolbar mode
Figure 2-1: Toolbar and menu bar
H
The procedures to follow assume that you have connected a mouse to the
oscilloscope so that you can click on the screen controls. If you have not
connected a mouse, you can use the optional touch screen to operate all the
screen controls.
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Performance Verification
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Brief Procedures
The Self Tests use internal routines to confirm basic functionality and proper
adjustment. No test equipment is required to perform these test procedures.
The Functional Tests utilize the probe-compensation output at the front panel as
a test-signal source for further verifying that the oscilloscope functions properly.
A 10X probe, such as a P5050, is required to perform these test procedures.
Self Tests
This procedure uses internal routines to verify that the oscilloscope is adjusted
and functioning properly. No test equipment or hookups are required.
Verify Internal Adjustment,
Self Compensation, and
Diagnostics
Equipment
required
None
Prerequisites
Power on the oscilloscope and allow a 20 minute warm-up before
initiating this test procedure.
1. Verify that internal diagnostics pass: Perform the following substeps to
verify passing of internal diagnostics.
a. Display the System diagnostics menu:
H
If the oscilloscope is in toolbar mode, click the MENU button to put
the oscilloscope into menu bar mode.
H
Pull down the Utility menu and select Instrument Diagnostics. . . .
This displays the diagnostics control window.
b. Run the System Diagnostics:
H
H
First disconnect all input signals from the instrument.
Click the Run button in the diagnostics control window.
c. Wait: The internal diagnostics do an exhaustive verification of proper
oscilloscope function. This verification may take several minutes. When
the verification is complete, the resulting status will appear in the
diagnostics control window.
d. Verify that no failures are found and reported on-screen. All tests should
pass. If any failures occur, you can use the GPIB command DIAG:RE-
SULTS:VERBOSE? to query for details on the errors.
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Brief Procedures
e. Run the signal-path compensation routine:
H
Pull down the Utilities menu and select Instrument Calibra-
tion. . . . This displays the instrument calibration control window.
NOTE. Signal Path Compensation is not valid until the oscilloscope reaches a
valid temperature. Calibration Status must be Pass.
H
Click the Calibrate button to start the routine.
f. Wait: Signal-path compensation may take ten minutes to run.
g. Confirm signal-path compensation returns passed status: Verify that the
word Pass appears in the instrument calibration control window.
2. Return to regular service: Click the Close button to exit the instrument
calibration control window.
Functional Tests
The purpose of these procedures is to confirm that the oscilloscope functions
properly. The only equipment required is a 10X probe, such as a P5050.
To check the file system, a 3.5 inch, 720 K or 1.44 Mbyte, formatted floppy disk
is required.
NOTE. If your instrument includes Option FHD (Front-Panel Removable Hard
Disk Drive) you do not have a floppy disk drive. If you need to store settings
during these procedures, access the local C:drive and store them in the TekScope
> Setups directory.
STOP. The following procedures verify instrument functionality; that is, they
verify that oscilloscope features operate properly. They do not verify that they
operate within limits.
For example, when the instructions in the following functional tests request that
you verify that a signal appears on-screen “that is about five divisions in
amplitude” or “has a period of about six horizontal divisions,” do NOT
interpret these quantities as given limits. Operation within limits is checked in
Performance Tests, which begin on page 2--17.
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Brief Procedures
STOP. In the following procedures, do not make changes to front-panel settings
that are not specifically called out. Each verification procedure requires that you
to set the oscilloscope to certain default settings before verifying functions. If
you make changes to settings other than those called out in a procedure, you
may obtain invalid results. In such cases, repeat the procedure starting over from
step 1.
If you are instructed to press a front-panel or screen button, the button may
already be selected (its label will be highlighted). If this is the case, it is not
necessary to press the button.
Verify All Input Channels
Equipment
required
One 10X oscilloscope probe, such as Tektronix P5050
Prerequisites
None
1. Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.
2. Hook up the signal source: Connect the probe to the probe compensation
connector and the channel input that you want to test (beginning with CH 1)
as shown in Figure 2--2.
TDS5000B Series oscilloscope
Probe from PROBE
COMPENSATION
output to CH 1 input
Figure 2-2: Universal test hookup for functional tests - CH 1 shown
3. Turn off all channels:If any of the front-panel channel buttons are lighted,
push those buttons to turn off the displayed channels. See Figure 2--3.
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Brief Procedures
Channel buttons
Figure 2-3: Channel button location
4. Select the channel to test: Push the channel button for the channel that you
are currently testing. The button lights, and the channel display comes on.
5. Set up the oscilloscope: Push the front panel AUTOSET button. This sets
the horizontal and vertical scale for a usable display and also sets the trigger
source to the channel that you are testing.
6. Verify that the channel is operational: Confirm that the following statements
are true.
H
The vertical scale readout for the channel under test shows a setting of
500 mV, and a square-wave probe-compensation signal about 2 divisions
in amplitude is on-screen.
H
H
The front-panel vertical POSITION knob (for the channel that you are
testing) moves the signal up and down the screen when rotated.
Turning the vertical SCALE knob counterclockwise (for the channel that
you are testing) decreases the amplitude of the waveform on-screen,
turning the knob clockwise increases the amplitude, and returning the
knob to 500 mV returns the amplitude to about 2 divisions.
7. Verify that the channel acquires in all acquisition modes: Pull down the
Horiz/Acq menu to select Horizontal/Acquisition Setup. . . . Click the
Acquisition tab in the control window that displays. Click each of the six
acquisition modes and confirm that the following statements are true.
H
H
H
Sample mode displays an actively acquiring waveform on-screen. (Note
that there is a small amount of noise present on the square wave).
Peak Detect mode displays an actively acquiring waveform on-screen
with the noise present in Sample mode “peak detected.”
Hi Res mode displays an actively acquiring waveform on-screen with the
noise that was present in Sample mode reduced.
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Brief Procedures
H
H
H
Average mode displays an actively acquiring waveform on-screen with
the noise reduced.
Envelope mode displays an actively acquiring waveform on-screen with
the noise displayed.
WMFDB Mode displays an actively acquiring waveform on-screen with
noise. All channels will change to a red color.
8. Test all channels: Repeat steps 2 through 7 until all input channels are
verified.
9. Remove the test hookup: Disconnect the probe from the channel input and
the probe compensation output.
Verify the Time Base
Equipment
required
One 10X oscilloscope probe, such as Tektronix P5050
Prerequisites
None
1. Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.
2. Hook up the signal source: Connect the probe to the probe compensation
output and to the CH 1 input as shown in Figure 2--4.
TDS5000B Series oscilloscope
Probe from PROBE
COMPENSATION
output to CH 1 input
Figure 2-4: Setup for time base test
3. Set up the oscilloscope: Push the front panel AUTOSET button.
4. Set the time base: Set the horizontal SCALE to 200 ꢀs/div. The time-base
readout is displayed at the bottom of the graticule.
5. Verify that the time base operates: Confirm the following statements.
H
One period of the square-wave probe-compensation signal is about five
horizontal divisions on-screen for the 200 ꢀs/div horizontal scale setting.
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Brief Procedures
H
H
Rotating the horizontal SCALE knob clockwise expands the waveform
on-screen (more horizontal divisions per waveform period), counter-
clockwise rotation contracts it, and returning the horizontal scale to
200 ꢀs/div returns the period to about five divisions.
The horizontal POSITION knob positions the signal left and right
on-screen when rotated.
6. Verify horizontal delay:
a. Center a rising edge on screen:
H
Set the horizontal POSITION knob so the rising edge, where the
waveform is triggered, lines up with the center horizontal graticule.
H
Change the horizontal SCALE to 20 ꢀs/div. The rising edge of the
waveform should remain near the center graticule and the falling
edge should be off screen.
b. Turn on and set horizontal delay:
H
Pull down the Horiz/Acq menu to select Horizontal/Acquisition
Setup. . . .
H
H
H
Click the Horizontal tab in the control window that displays.
Click the Delay Mode button to turn delay on.
Double click the Horiz Delay control in the control window to
display the pop-up keypad. Click the keypad buttons to set the
horizontal delay to 500 ꢀs, and then click the ENTER key.
c. Verify the waveform: Verify that a falling edge of the waveform is within
a few divisions of center screen.
d. Adjust the horizontal delay: Rotate the upper multipurpose knob to
change the horizontal delay setting. Verify that the falling edge shifts
horizontally. Rotate the front-panel horizontal POSITION knob. Verify
that this knob has the same effect (it also adjusts delay, but only when
delay mode is on).
e. Verify the delay toggle function:
H
Rotate the front-panel horizontal POSITION knob to center the
falling edge horizontally on the screen.
H
Change the horizontal SCALE to 40 ns/div (50 ns/div for
TDS5054BE). The falling edge of the waveform should remain near
the center graticule. If not, readjust the delay setting to center the
falling edge.
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Brief Procedures
H
Push the front-panel DELAY button several times to toggle delay off
and on and back off again. Verify that the display switches quickly
between two different points in time (the rising and falling edges of
this signal).
7. Remove the test hookup: Disconnect the probe from the channel input and
the probe compensation output.
Verify the A (Main) and B
(Delayed) Trigger Systems
Equipment
required
One 10X oscilloscope probe, such as Tektronix P5050
Prerequisites
None
1. Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.
2. Hook up the signal source: Connect the probe to the probe compensation
output and to the CH 1 input as shown in Figure 2--5.
TDS5000B Series oscilloscope
Probe from PROBE
COMPENSATION
output to CH 1 input
Figure 2-5: Setup for trigger test
3. Set up the oscilloscope: Push the front-panel AUTOSET button.
4. Verify that the main trigger system operates: Confirm that the following
statements are true.
H
H
H
The trigger level readout for the A (main) trigger system changes with
the trigger-LEVEL knob.
The trigger-LEVEL knob can trigger and untrigger the square-wave
signal as you rotate it. (Leave the signal untriggered).
Pushing the front-panel trigger LEVEL knob sets the trigger level to the
50% amplitude point of the signal and triggers the signal that you just
left untriggered. (Leave the signal triggered.)
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Brief Procedures
5. Verify that the delayed trigger system operates:
a. Set up the delayed trigger:
H
Pull down the Trig menu and select A→B Trigger Sequence. . . .
This displays the A→B Sequence tab of the trigger setup control
window.
H
H
H
Click the Trig After Time button under A Then B.
Click the B Trig Level control in the control window.
Set the Trigger MODE to NORM.
b. Confirm that the following statements are true:
H
The trigger-level readout for the B trigger system changes as you
turn the lower multipurpose knob.
H
As you rotate the lower multipurpose knob, the square-wave
probe-compensation signal can become triggered and untriggered.
(Leave the signal triggered.)
c. Verify the delayed trigger counter:
H
H
H
Double-click the Trig Delay control to pop up a numeric keypad for
that control.
Click on the keypad to enter a trigger delay time of 1 second, and
then click Enter.
Verify that the TRIG’D indicator on the front panel flashes about
once every second as the waveform is updated on-screen.
6. Remove the test hookup: Disconnect the probe from the channel input and
the probe compensation output.
Verify the File System
Equipment
required
One 10X oscilloscope probe, such as Tektronix P5050
One 720 K or 1.44 Mbyte, 3.5 inch DOS-compatible formatted disk. If
your instrument does not include a floppy disk drive, see the Note on
page 2-6.
Prerequisites
None
1. Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.
2. Hook up the signal source: Connect the probe to the probe compensation
output and the CH 1 input as shown in Figure 2--6.
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Brief Procedures
TDS5000B Series oscilloscope
Probe from PROBE
COMPENSATION
output to CH 1 input
Figure 2-6: Setup for the file system test
3. Insert the test disk: Insert the floppy disk in the floppy disk drive at the top
of the front panel. If your instrument does not include a floppy disk drive,
see the Note on page 2--6.
4. Set up the oscilloscope: Push the front panel AUTOSET button.
5. Set the time base: Set the horizontal SCALE to 1 ms/div. The time-base
readout is displayed at the bottom of the graticule.
6. Save the settings:
a. From the File menu select Save As. This displays the Save As dialog
box.
b. In the Save What field click Waveform.
c. In the Source drop-down list box select CH1.
d. In the Save in drop-down list box select 31/2 Floppy.
e. Note the default file name.
f. Click the Save button to save the waveform to the floppy disk.
7. Change the settings again: Set the horizontal SCALE to 200 ꢀs/div.
8. Verify the file system works:
a. From the File menu select Recall. This displays the Recall dialog box.
b. In the Recall What field click Waveform.
c. In the Look in drop-down list box select 31/2 Floppy. If your instrument
does not include a floppy disk drive, see the Note on page 2--6.
d. Locate and select the waveform file name you previously stored.
e. Click the Recall button to display the stored waveform on screen.
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Brief Procedures
f. Verify that the oscilloscope retrieved the saved waveform from the disk.
Do this by noticing the horizontal SCALE is again 1 ms and the
waveform shows ten cycles just as it did when you saved the setup.
9. Remove the test hookup:
a. Disconnect the probe from the channel input and the probe compensation
output.
b. Remove the floppy disk from the floppy disk drive, if present.
Verify the Internal Printer
(Optional)
Equipment
required
Integrated Thermal Printer (Option 1P)
Prerequisites
None
1. From the Windows desktop, select Start > Settings > Control Panel.
2. Open the Printers file.
3. Right-click on the Integrated Thermal Printer icon; then select Properties.
4. Click the General tab.
5. Click Print Test Page.
6. Verify that the test page advances through the printer and prints clearly.
Refer to Figure 2--7 on page 2--15 for a sample of the test page.
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Brief Procedures
Figure 2-7: Example test page from the internal printer
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Brief Procedures
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Performance Tests
This section contains a collection of manual procedures for checking that the
TDS5000B Series Oscilloscopes performs as warranted. The preceding
procedures are faster to complete, and should be done first if you intend to
perform the performance tests.
The procedures are arranged in four logical groupings: Signal Acquisition System
Checks, Time Base System Checks, Triggering System Checks, and Output Ports
Checks. They verify all characteristics designated as checked in the Specifica-
tions section. (The characteristics that are checked appear with a n).
STOP. The following procedures extend the confidence level provided by the
basic procedures described on page 2--5. The basic procedures should be
completed first; then complete the procedures in this section, if desired.
Prerequisites
The tests in this section comprise an extensive, valid confirmation of perform-
ance and functionality when the following requirements are met:
H
H
The cover is not removed from the oscilloscope.
You have performed and passed the procedures under Self Tests, found on
page 2--5, and those under Functional Tests, found on page 2--6.
H
You have completed a signal-path compensation within the recommended
calibration interval and at a temperature within 5 _C ( 9 _F) of the present
operating temperature. (If at the time you did the prerequisite Self Tests, the
temperature was within the limits just stated, consider this prerequisite met).
H
The oscilloscope was last adjusted at an ambient temperature between 20 _C
(68 _F) and 30 _C (86 _F), has been warmed-up for a period of at least
20 minutes, and is operating within the ambient temperature described in
Table 1--10 on page 1--22. (The warm-up requirement is usually met in the
course of meeting the Self Tests and Functional Tests prerequisites listed
above).
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Performance Tests
Equipment Required
The procedures starting on page 2--24 use external, traceable, signal sources to
check warranted characteristics. Table 2--1 lists recommended equipment.
Table 2-1: Test equipment
Item number and
description
Minimum requirements
Ratio: 10X; impedance 50 Ω; connec- Tektronix part number
tors: female BNC input, male BNC 011-0059-02
Example
Purpose
1. Attenuator,10X
(two required)
Signal Attenuation
output
2. Attenuator, 5X
Ratio: 5X; impedance 50 Ω; connec- Tektronix part number
tors: female BNC input, male BNC 011-0060-02
output
Signal Attenuation
3. Termination, 50 Ω
Impedance 50 Ω; connectors: female Tektronix part number
BNC input, male BNC output
Signal Termination for
Channel Delay Test
011-0049-01
4. Cable, Precision 50 Ω
Coaxial (three required) connectors
50 Ω, 36 in, male-to-male BNC
Tektronix part number
012-0482-00
Signal Interconnection
Various Accuracy Tests
Checking Trigger Sensitivity
5. Connector, Dual-Banana Female BNC-to-dual banana
(two required)
Tektronix part number
103-0090-00
6. Connector, BNC “T”
7. Coupler, Dual-Input
8. Probe, 10X
Male BNC-to-dual female BNC
Female BNC-to-dual male BNC
A P5050, P6243, or P6245 probe3
Tektronix part number
103-0030-00
Tektronix part number
067-0525-02
Checking Delay Between
Channels
Tektronix part number P5050 Signal Interconnection
or P6245
9. Floppy disk
3.5 inch, 720 K or 1.44 Mbyte,
DOS-compatible floppy disk
Standard IBM PC-compatible Checking File System Basic
disk
Functionality
10. Generator, DC Calibra-
tion
Variable amplitude to 104 V; accura- Wavetek 95001
cy to 0.1%
Checking DC Offset, Gain,
and Measurement Accuracy
11. Generator, Calibration
500 mV square wave calibrator
amplitude; accuracy to 0.25%
Wavetek 95001
To check accuracy of Signal
Out
12. Generator, Time Mark
(optional)
Variable marker frequency from 10 ms Wavetek 95001
to 10 ns; accuracy within 2 ppm
Checking Sample-Rate and
Delay-time Accuracy
13. Generator, Sine Wave
250 kHz to ≥500 MHz (higher for
higher-bandwidth oscilloscopes).
Variable amplitude from 60 mV to
2 Vp-p into 50 Ω. Frequency error
>2.0%
Wavetek 95001
Checking Analog Bandwidth,
Trigger Sensitivity, Sample-
rate, External Clock, and
Delay-Time Accuracy
14. Meter, Level and Power Frequency range: 10 MHz to the
Wavetek 95001
Checking Analog Bandwidth
and Trigger Sensitivity
Sensor
oscilloscope bandwidth. Amplitude
range: 6 mVp-p to 2 Vp-p
15. Splitter, Power
Frequency range: DC to 4 GHz.
Tracking: >2.0%
Wavetek 95001
Checking Analog Bandwidth
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Performance Tests
Table 2-1: Test equipment (Cont.)
Item number and
description
Minimum requirements
Example
Purpose
16. Adapter (three required) SMA female-to-female
Tektronix part number
015-1012-00
Checking the delay between
channels
17. Adapter (three required) SMA male-to-female BNC
Tektronix part number
015-1018-00
Checking the delay between
channels
18. Pulse Generator
250 MHz, ≤1 ns rise time, 5 V out
Wavetek 95001,2
Used to Test Delta Time
Measurement Accuracy
19. Cable, Coaxial
(two required)
50 Ω, 20 in, male-to-male SMA
connectors
Tektronix part number
174-1427-00
Used to Test Delta Time
Measurement Accuracy
20. Adapter (four required)
Male N-to-female BNC
Tektronix part number
103-0045-00
Checking Analog Bandwidth
Checking Analog Bandwidth
21. Adapter
Female N-to-male BNC
Tektronix part number
103-0058-00
22. Adapter
SMA “T”, male to 2 SMA female
SMA female to BNC male
BNC male to female elbow
BNC female to clip lead
Tektronix part number
015-1016-00
Used to Test Delta Time
Measurement Accuracy
23. Adapter
Tektronix part number
015-0572-00
Used to Test Delta Time
Measurement Accuracy
24. Adapter
Tektronix part number
103-0031-00
Used to Test Delta Time
Measurement Accuracy
25. Adapter
Tektronix part number
013-0076-00
Used to Test Probe
Compensation Output
26. Termination
27. Attenuator, 2X
Short circuit, SMA connector
Tektronix part number
015-1021-00
Used to Test Delta Time
Measurement Accuracy
Ratio: 2X; impedance 50 Ω; connec- Tektronix part number
tors: female BNC input, male BNC
Used to Test Delta Time
Measurement Accuracy
011-0069-02
output
28. Mouse or keyboard
Tektronix part numbers:
119-6298-xx (mouse)
119-6297-xx (keyboard)
Used to input test selections
1
Wavetek 9500/Option 100 and output head appropriate for the bandwidth of the oscilloscope under test (9520, 9530, 9550).
Warning: This generator can output dangerous voltages. Set the generator to Off or 0 volts before connecting, discon-
necting, or changing any test hookup during all procedures to follow. Also read the Warning statement on page 2-24.
2
3
For Delta Time Measurement Accuracy, use a Wavetek 9500 or a pulse generator with a rise time as shown in Table 2-4
on page 2-44.
Warning: The P6243 and P6245 probes that may be used with this oscilloscope provide an extremely low loading
capacitance (<1 pF) to ensure the best possible signal reproduction. These probes should not be used to measure
signals exceeding 8 V, or errors in signal measurement will be observed. Above 40 V, damage to the probe may result.
To make measurements beyond 8 V, use either the P5050 probe (good to 500 V), or refer to the catalog for a recom-
mended probe.
2-19
TDS5000B Series Specifications and Performance Verification
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Performance Tests
TDS5000B Series Test Record
Photocopy this table and use it to record the performance test results for your
TDS5000B Series Oscilloscope.
TDS 5000B Series Test Record
Instrument Serial Number:
Temperature:
Certificate Number:
RH %:
Date of Calibration:
Technician:
TDS5000B Series performance test
Minimum
Incoming
Outgoing
Maximum
DC voltage measurement accuracy (averaged)
CH1
CH1
CH1
CH1
CH1
CH1
CH2
CH2
CH2
CH2
CH2
CH2
CH3
CH3
CH3
5 mV Vert scale setting,
+ 1.0353 V
- 1.0447 V
+ 11.4989 V
- 11.7011 V
+ 17.602 V
- 18.398 V
+ 1.0353 V
- 1.0447 V
+ 11.4989 V
- 11.7011 V
+ 17.602 V
- 18.398 V
+ 1.0353 V
- 1.0447 V
+ 11.4989 V
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
+ 1.0447 V
- 1.0353 V
+ 11.7011 V
- 11.4989 V
+ 18.398 V
- 17.602 V
+ 1.0447 V
- 1.0353 V
+ 11.7011 V
- 11.4989 V
+ 18.398 V
- 17.602 V
+ 1.0447 V
- 1.0353 V
+ 11.7011 V
-5 Div position setting, +1 V offset
5 mV Vert scale setting,
+5 Div position setting, -1 V offset
200 mV Vert scale setting,
-5 Div position setting, +10 V offset
200 mV Vert scale setting,
+5 Div position setting, -10 V offset
1.01 V Vert scale setting,
-5 Div position setting, +10 V offset
1.01 V Vert scale setting,
+5 Div position setting, -10 V offset
5 mV Vert scale setting,
-5 Div position setting, +1 V offset
5 mV Vert scale setting,
+5 Div position setting, -1 V offset
200 mV Vert scale setting,
-5 Div position setting, +10 V offset
200 mV Vert scale setting,
+5 Div position setting, -10 V offset
1.01 V Vert scale setting,
-5 Div position setting, +10 V offset
1.01 V Vert scale setting,
+5 Div position setting, -10 V offset
5 mV Vert scale setting,
-5 Div position setting, +1 V offset
5 mV Vert scale setting,
+5 Div position setting, -1 V offset
200 mV Vert scale setting,
-5 Div position setting, +10 V offset
2-20
TDS5000B Series Specifications and Performance Verification
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Performance Tests
TDS 5000B Series Test Record (cont.)
Instrument Serial Number:
Temperature:
Certificate Number:
RH %:
Date of Calibration:
Technician:
TDS5000B Series performance test
Minimum
Incoming
Outgoing
Maximum
CH3
CH3
CH3
CH4
CH4
CH4
CH4
CH4
CH4
200 mV Vert scale setting,
- 11.7011 V
__________
__________
- 11.4989 V
+5 Div position setting, -10 V offset
1.01 V Vert scale setting,
+ 17.602 V
- 18.398 V
+ 1.0353 V
- 1.0447 V
+ 11.4989 V
- 11.7011 V
+ 17.602 V
- 18.398 V
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
+ 18.398 V
- 17.602 V
+ 1.0447 V
- 1.0353 V
+ 11.7011 V
- 11.4989 V
+ 18.398 V
- 17.602 V
-5 Div position setting, +10 V offset
1.01 V Vert scale setting,
+5 Div position setting, -10 V offset
5 mV Vert scale setting,
-5 Div position setting, +1 V offset
5 mV Vert scale setting,
+5 Div position setting, -1 V offset
200 mV Vert scale setting,
-5 Div position setting, +10 V offset
200 mV Vert scale setting,
+5 Div position setting, -10 V offset
1.01 V Vert scale setting,
-5 Div position setting, +10 V offset
1.01 V Vert scale setting,
+5 Div position setting, -10 V offset
Analog bandwidth
CH1
CH2
CH3
CH4
100 mV
100 mV
100 mV
100 mV
424 mV
424 mV
424 mV
424 mV
N/A
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
N/A
N/A
N/A
N/A
Delay between channels
100 ps
2-21
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Performance Tests
TDS 5000B Series Test Record (cont.)
Instrument Serial Number:
Temperature:
Certificate Number:
RH %:
Date of Calibration:
Technician:
TDS5000B Series performance test
Minimum
Incoming
Outgoing
Maximum
Channel isolation: 100 MHz
Input to CH 1
N/A
N/A
N/A
N/A
__________
__________
__________
__________
__________
__________
__________
__________
8.00 divisions
0.08 divisions
0.08 divisions
0.08 divisions
CH 2
CH 3
CH 4
Channel isolation: 100 MHz
CH 1
Input to CH 2
CH 3
N/A
N/A
N/A
N/A
__________
__________
__________
__________
__________
__________
__________
__________
0.08 divisions
8.00 divisions
0.08 divisions
0.08 divisions
CH 4
Channel isolation: 100 MHz
CH 1
CH 2
N/A
N/A
N/A
N/A
__________
__________
__________
__________
__________
__________
__________
__________
0.08 divisions
0.08 divisions
8.00 divisions
0.08 divisions
Input to CH 3
CH 4
Channel isolation: 100 MHz
CH 1
CH 2
N/A
N/A
N/A
N/A
__________
__________
__________
__________
__________
__________
__________
__________
0.08 divisions
0.08 divisions
0.08 divisions
8.00 divisions
CH 3
Input to CH 4
Channel isolation: Full Bandwidth
Input to CH 1
N/A
N/A
N/A
N/A
__________
__________
__________
__________
__________
__________
__________
__________
8.00 divisions
0.16 divisions
0.16 divisions
0.16 divisions
CH 2
CH 3
CH 4
Channel isolation: Full Bandwidth
CH 1
Input to CH 2
CH 3
N/A
N/A
N/A
N/A
__________
__________
__________
__________
__________
__________
__________
__________
0.16 divisions
8.00 divisions
0.16 divisions
0.16 divisions
CH 4
Channel isolation: Full Bandwidth
CH 1
N/A
N/A
N/A
N/A
__________
__________
__________
__________
__________
__________
__________
__________
0.16 divisions
0.16 divisions
8.00 divisions
0.16 divisions
CH 2
Input to CH 3
CH 4
Channel isolation: Full Bandwidth
CH 1
N/A
N/A
N/A
N/A
__________
__________
__________
__________
__________
__________
__________
__________
0.16 divisions
0.16 divisions
0.16 divisions
8.00 divisions
CH 2
CH 3
Input to CH 4
2-22
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Performance Tests
TDS 5000B Series Test Record (cont.)
Instrument Serial Number:
Temperature:
Certificate Number:
RH %:
Date of Calibration:
Technician:
TDS5000B Series performance test
Minimum
Incoming
Outgoing
Maximum
Time base system
Long-term sample rate and delay time accuracy @
100 ns/10.0 ms
-1.5 divisions
N/A
__________
__________
+1.5 divisions
Pass/Fail
Delta time measurement
Trigger system accuracy
Time accuracy for pulse, glitch, timeout, and
Width, Hor. scale ≤ 1 ꢀs
Lower Limit
3.5 ns
3.5 ns
__________
__________
__________
__________
6.5 ns
6.5 ns
Upper Limit
Time accuracy for pulse, glitch, timeout, and
width, Hor. scale > 1 ꢀs
Lower Limit
1.9 ꢀs
1.9 ꢀs
__________
__________
__________
__________
2.1 ꢀs
2.1 ꢀs
Upper Limit
CH1 trigger sensitivity, 50 MHz
Pass/Fail
Pass/Fail
Pass/Fail
Pass/Fail
Pass/Fail
Pass/Fail
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
__________
Pass/Fail
Pass/Fail
Pass/Fail
Pass/Fail
Pass/Fail
Pass/Fail
CH1 delayed trigger sensitivity, 50 MHz
CH1 AUX trigger input, 50 MHz
CH1 trigger sensitivity, full bandwidth
CH1 delayed trigger sensitivity, full bandwidth
CH1 AUX trigger input, 100 MHz
Output signal checks
Auxiliary trigger output, open circuit
High
Low
High ≥2.5 V
__________
__________
__________
__________
Low ≤0.7 V
Auxiliary trigger output, 50 Ω
High
High ≥1.0 V
__________
__________
__________
__________
Low
Low ≤0.25 V
p-p ≤300 mV
p-p ≤150 mV
Analog signal output, 1 MΩ
Analog signal output, 50 Ω
Probe compensation output signal
Frequency
p-p ≥200 mV
__________
__________
__________
__________
p-p ≥100 mV
950 Hz
990 mV
__________
__________
__________
__________
1.050 kHz
1010 mV
Voltage (difference)
2-23
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Performance Tests
Signal Acquisition System Checks
The following procedures verify those characteristics that relate to the signal-ac-
quisition system and are listed as checked under Warranted Characteristics in
the Specifications section. Refer to Table 2--1 on page 2--18 for test equipment
specifications.
NOTE. References to CH 3 and CH 4 apply to the TDS5034B, TDS5054B,
TDS5054BE, and TDS5104B models only.
Check DC Voltage
Measurement Accuracy
WARNING. The generator is capable of outputting dangerous voltages. Be sure to
set the DC calibration generator to off or 0 volts before connecting, disconnect-
ing, and/or moving the test hookup during the performance of this procedure.
Also, verify that the calibrator does not have shorting straps installed between
the DC and sense outputs or grounds.
Equipment
required
Two dual-banana connectors (Item 5)
One BNC T connector (Item 6)
One DC calibration generator (Item 10)
Two precision 50 Ω coaxial cables (Item 4)
The oscilloscope must meet the prerequisites listed on page 2-17.
Prerequisites
1. Install the test hookup and preset the instrument controls:
a. Hook up the test-signal source:
H
H
Set the output of a DC calibration generator to off or 0 volts.
Connect the output of a DC calibration generator through a
dual-banana connector followed by a 50 Ω precision coaxial cable to
one side of a BNC T connector. See Figure 2--8.
H
Connect the Sense output of the generator through a second
dual-banana connector followed by a 50 Ω precision coaxial cable to
the other side of the BNC T connector. Now connect the BNC T
connector to CH 1. See Figure 2--8.
2-24
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Performance Tests
TDS5000B Series oscilloscope
Output Sense
DC calibrator
Dual banana to
BNC adapters
BNC T
connector
50 Ω coaxial cables
Figure 2-8: Initial test hookup
b. Initialize the oscilloscope: Press DEFAULT SETUP.
c. Modify the default settings:
H
H
From the toolbar bar, click Horiz and select the Acquisition tab.
Click Average and set the number of averages to 16.
2. Confirm input channels are within limits for DC accuracy at maximum offset
and position: Perform the following substeps — test CH 1 first, skipping
substep 2a, since CH 1 is already selected from step 1.
a. Select an unchecked channel:
H
H
H
From the toolbar bar, click MEAS and then Clear to remove the
previous measurement.
Press the Vertical button of the channel just confirmed to remove
the channel from the display.
Press the front-panel Vertical button that corresponds to the channel
that you are to confirm.
H
H
Set the generator output to 0 V.
Move the test hookup to the channel that you selected.
b. Turn on the measurement Mean for the channel:
H
From the toolbar bar, click MEAS and select the Ampl tab, and then
click Mean to measure the mean of the current channel.
H
Press Close.
2-25
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Performance Tests
c. Set the vertical scale: Set the vertical SCALE to one of the settings
listed in Table 2--2 that is not yet checked. (Start with the first setting
listed.)
Table 2-2: DC Voltage measurement accuracy
Scale Position setting
setting (Divs)
Offset Generator
setting setting
Accuracy limits
5 mV
- 5
+1 V
+1.040 V
-1.040 V
+11.6 V
- 11 . 6 V
+18 V
+1.0353 V to +1.0447 V
-1.0447 V to -1.0353 V
+11.4989 V to +11.7011 V
-11.7011 V to -11.4989 V
+17.602 V to +18.398 V
-18.398 V to -17.602 V
+5
- 1 V
200 mV - 5
+10 V
- 1 0 V
+10 V
- 1 0 V
+5
1.01 V - 5
+5
- 1 8 V
d. Display the test signal:
H
H
From the toolbar bar click VERT, and then click Position.
Use the keypad to set vertical position to --5 divisions (press CLR,
5, -- , and then ENTER, on the keypad). The baseline level will move
off screen.
H
H
Click Offset.
Use the keypad to set vertical offset to the positive-polarity setting
listed in the table for the current vertical scale setting. The baseline
level will remain off screen.
H
Set the generator to the level and polarity indicated in the table for
the vertical scale, position, and offset settings that you have made.
The DC test level should appear on the screen. (If it doesn’t return,
the DC accuracy check has failed for the current vertical scale setting
of the current channel.)
e. Measure the test signal: Press Close. Read the measurement results at
the Mean measurement readout. See Figure 2--9.
2-26
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Performance Tests
Turn on the
measurement called
mean and read the
results here.
Figure 2-9: Measurement of DC accuracy at maximum offset and position
f. Check against limits:
H
CHECK that the Mean readout on the screen is within the limits
listed for the current vertical scale and position/offset/generator
settings. Enter the value in the test record.
H
H
Repeat substep d, reversing the polarity of the position, offset, and
generator settings as is listed in the Table 2--2 on page 2--26.
CHECK that the Mean measurement readout on the screen is within
the limits listed for the current vertical scale setting and position/off-
set/generator settings. Enter the value in the test record.
H
Repeat substeps c through f until all vertical scale settings, listed in
Table 2--2, are checked for the channel under test.
g. Test all channels: Repeat substeps a through f for all channels.
3. Disconnect the hookup:
a. Set the generator output to 0 V.
b. Disconnect the cable from the generator output at the input connector of
the channel last tested.
2-27
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Performance Tests
Check Analog Bandwidth
Equipment
required
One sine wave generator (Item 13)
One level meter and power sensor (Item 14)
One power divider (Item 15)
One female N to male BNC adapter (Item 21)
Four male N to female BNC adapters (Item 20)
Two 50 Ω precision cables (Item 4)
Attenuators (Items 1 and 2)
Optional: One high-frequency leveled sine wave generator and its
leveling head - replaces items 13, 14, 15, 20, and 21
Prerequisites
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
1. Install the test hookup and preset the instrument controls:
a. Initialize the oscilloscope:
H
Press DEFAULT SETUP.
b. Modify the default settings:
H
H
H
H
H
Turn the horizontal SCALE knob to 40 ns (50 ns for TDS5054BE).
From the toolbar bar, click Horiz and select the Acquisition tab.
Click Average and set the number of averages to 16.
Click ET (Equivalent Time).
From the toolbars, click MEAS. Click Setup Ref Levs; then click
the Determine Base, Top From Min-Max button.
NOTE. The sine wave generator output amplitude must be leveled to within
0.35 db of the reference frequency (10 MHz) through the bandwidth frequency
listed in Table 2--3 on page 2--30. The 0.35 db requirement is necessary to ensure
a bandwidth that meets Tektronix specifications.
You can perform bandwidth Performance Verification using an unleveled sine
wave generator (with amplitude error >0.35 db). Under these conditions, the
bandwidth PV is subject to the flatness errors associated with the generator
used.
Refer to the Sine Wave Generator Leveling Procedure on page 2--61 if your sine
wave generator does not have automatic output amplitude leveling.
2-28
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Performance Tests
c. Hook up the test-signal source: Connect the sine wave output of a
leveled sine wave generator to CH 1. Set the output of the generator to a
reference frequency of 10 MHz or less. See Figure 2--10.
For the optional setup using a leveled sine wave generator with a
leveling head, see Figure 2--11 and, if using this optional setup with the
example Tektronix SG504, set the generator output to 6 MHz.
TDS5000B Series oscilloscope
Sine wave
generator
Output
50 Ω coaxial cable
Figure 2-10: Initial test hookup
TDS5000B Series oscilloscope
High frequency sine
wave generator
Output
Leveling head
50 Ω coaxial cables
Figure 2-11: Optional initial test hookup
2. Confirm the input channels are within limits for analog bandwidth: Do the
following substeps — test CH 1 first, skipping substeps a and b since CH 1
is already set up for testing from step 1.
a. Select an unchecked channel:
H
From the toolbar bar, click MEAS and then Clear to remove the
previous measurement.
H
Press the Vertical button of the channel just confirmed to remove
the channel from the display.
2-29
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Performance Tests
H
H
Press the front-panel Vertical button that corresponds to the channel
that you are to confirm.
Move the leveling output of the sine wave generator to the channel
that you selected.
b. Match the trigger source to the channel selected:
H
Press the Trigger SOURCE button until the source that corresponds
to the channel that you are to confirm is on.
c. Set its input impedance:
H
From the toolbar, click the VERT button and select the tab for the
channel that you are to confirm. Click the Termination 50 Ω button.
d. Set the vertical scale: Set the vertical SCALE that corresponds to the
channel that you are to confirm to one of the settings listed in Table 2--3
not yet checked. (Start with the 100 mV setting.)
e. Set the triggering coupling:
H
Click the Coupling DC button.
Table 2-3: Analog bandwidth
Test frequency
TDS5052B
TDS5054B
TDS50504BE
Reference
amplitude
(6 division)
TDS5032B
TDS5034B
Vertical
scale
Horizontal
scale
TDS5104B
175 MHz
1 GHz
-3 db Limits
≥4.24 mV
≥8.48 mV
≥21.2 mV
≥42.4 mV
≥84.8 mV
≥212 mV
≥424 mV
≥848 mV
≥2.12 V1
≥4.24 V1
1 mV
6 mV
1 ns
1 ns
1 ns
1 ns
1 ns
1 ns
1 ns
1 ns
1 ns
1 ns
150 MHz
250 MHz
350 MHz
350 MHz
350 MHz
350 MHz
350 MHz
350 MHz
350 MHz
350 MHz
175 MHz
300 MHz
500 MHz
500 MHz
500 MHz
500 MHz
500 MHz
500 MHz
500 MHz
500 MHz
2 mV
12 mV
30 mV
60 mV
120 mV
300 mV
600 mV
1.2 V
5 mV
1 GHz
10 mV
20 mV
50 mV
100 mV
200 mV
500 mV
1 GHz
1 GHz
1 GHz
1 GHz
1 GHz
3 V1
1 GHz
1 V
6 V1
1 GHz
1
If your generator cannot output 6 divisions of amplitude, determine its maximum output at the Test
frequency, and use this for the reference amplitude. The -3 db limit can be calculated as: 0.707 ×
reference amplitude.
2-30
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Performance Tests
f. Display the test signal: Do the following subparts to first display the
reference signal and then the test signal.
H
H
From the toolbar click MEAS; then select the Time tab.
Click the Freq button to measure the frequency of the current
channel.
H
H
H
Select the Ampl tab. Click the Pk-Pk button.
Click Close button.
Set the generator output so the CH<x> Pk-Pk readout equals the
reference amplitude in Table 2--3 that corresponds to the vertical
scale set in substep d.
H
Press the front-panel PUSH TO SET 50% as necessary to trigger a
stable display. At full bandwidth, you may also want to make small,
manual adjustments to the trigger level. You can use the Trigger
LEVEL knob to do this. (Full bandwidth varies with TDS model as
is shown in Table 2--3.)
g. Measure the test signal:
H
H
H
Set the frequency of the generator, as shown on the screen, to the test
frequency in Table 2--3 that corresponds to the vertical scale set in
substep d. See Figure 2--12.
Set the horizontal SCALE to the horizontal scale setting in
Table 2--3 that corresponds to the vertical scale set in substep d.
Press PUSH TO SET 50% as necessary to trigger the signal.
Read the results at the CH<x> Pk-Pk readout, which will automati-
cally measure the amplitude of the test signal. See Figure 2--12.
2-31
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Performance Tests
Set the generator
(reference) frequency
to the test frequency
from Table 2-3.
1
3
Read results.
Set the horizontal scale
from Table 2-3.
2
Figure 2-12: Measurement of analog bandwidth
h. Check against limits:
H
CHECK that the Pk-Pk readout on the screen is within the limits
listed in Table 2--3 for the current vertical scale setting.
H
H
Enter the voltage in the test record.
When finished checking, set the horizontal SCALE back to the
40 ns (50 ns for TDS5054BE) setting.
STOP. Checking the bandwidth of each channel at all vertical scale settings is
time consuming and unnecessary. You can skip checking the remaining vertical
scale settings in Table 2--3 (that is, skip the following substep, i) if this oscillo-
scope has performed as follows:
H
H
Passed the 100 mV vertical scale setting just checked in this
procedure.
Passed the Verify Internal Adjustment, Self Compensation, and
Diagnostics procedure found under Self Tests on page 2--5.
NOTE. Passing the Signal Path Compensation confirms the signal path for all
vertical scale settings for all channels. Passing the Internal Diagnostics ensures
that the factory-set adjustment constants that control the bandwidth for each
vertical scale setting have not changed.
2-32
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Performance Tests
i. Check remaining vertical scale settings against limits (optional):
H
If desired, finish checking the remaining vertical scale settings for
the channel under test by repeating substeps d through h for each of
the remaining scale settings listed in Table 2--3 for the channel under
test.
H
H
H
Before doing substep f, click the Clear button to remove the
previous channel measurements.
When doing substep f, skip the subparts that turn on the CH<x>
Pk-Pk measurement until you check a new channel.
Install/remove attenuators between the generator leveling head and
the channel input as needed to obtain the six division reference
signals listed in the table.
j. Test all channels: Repeat substeps a through h for all channels.
3. Disconnect the hookup: Disconnect the test hook up from the input
connector of the channel last tested.
Check Delay Between
Channels
Equipment
required
One sine wave generator (Item 13)
Three precision 50 Ω coaxial cables (Item 4)
One power divider (Item 15) or dual input coupler (item 7)
3 SMA female to female adapter connector (Item 16)
3 SMA male-to-female BNC adapter connector (Item 17)
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
Prerequisites
STOP. Do not use the vertical position knob to reposition any channel while
doing this check. To do so invalidates the test.
1. Install the test hookup and preset the instrument controls:
a. Initialize the front panel: Press the DEFAULT SETUP button.
b. Modify the initialized front-panel control settings:
H
Do not adjust the vertical position of any channel during this
procedure.
H
H
From the toolbar, click the Vert button.
Set the termination of each channel to 50 Ω by selecting each
channel tab and clicking the Termination 50 Ω button.
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Performance Tests
H
H
H
Set the horizontal SCALE to 400 ps (500 ps for TDS5054BE).
From the toolbar bar, click Horiz, and select the Acquisition tab.
Click Average, and set the number of averages to 16.
c. Hook up the test-signal source:
H
Connect the sine wave output of a sine wave generator to a 50 Ω
precision coaxial cable.
H
Connect the cable to either a coupler or power divider and two 50 Ω
precision coaxial cables, as shown in Figure 2--13. (See note below.)
NOTE. To ensure that you do not introduce errors into the delay measurements,
use cables that have a delay difference of less than 10 ps between each other.
You can check the variance in delay between cables by connecting the cables to
CH 1 and CH 2. and, using the V bar cursors, measure the delay. Reverse the
cables and repeat the measurement. Divide the difference between the two delay
measurements by 2. If the result is less than 10 ps, you can proceed with the test.
H
Connect the coupler or cables to CH 1 and CH 2. See Figure 2--13.
TDS5000B Series oscilloscope
Sine wave
generator
Output
50 Ω precision coaxial cables
Power divider
Male SMA to
female BNC
3 places
SMA female-
to-female
Figure 2-13: Initial test hookup
2. Confirm all four channels are within limits for channel delay:
a. Set up the generator: Set the generator frequency to 250 MHz and the
amplitude at six to eight divisions for CH 1.
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Hint: As you adjust the generator amplitude, push PUSH TO SET 50%
often to speed up the updating of the waveform amplitude on screen.
b. Set the horizontal SCALE to 200 ps.
c. Save a CH 2 waveform:
H
H
H
Press the CH 2 Vertical button.
From the toolbar, click Save to open the Save As dialog box.
In the Save What field, click Waveform. The Save as Type is
Tektronix Waveform Data (*.wfm).
H
H
In the Source drop-down list box, select CH 2.
In the Save in: Oscilloscope Memory field, select Ref 2; then click
the Save button.
d. Save CH 3 waveform:
H
Press the CH 2 Vertical button to turn CH 2 off; then press the CH 3
Vertical button to turn CH 3 on.
H
Move the coupler or cable from CH 2 to CH 3, so that CH 1 and
CH 3 are driven.
H
H
From the toolbar, click Save to open the Save As dialog box.
In the Save What field, click Waveform. The Save as Type is
Tektronix Waveform Data (*.wfm).
H
H
In the Source drop-down list box, select CH 3.
In the Save in: Oscilloscope Memory field, select Ref 3; then click
the Save button.
e. Display all test signals:
H
H
Press the CH 3 Vertical button to remove CH 3 from the display.
To display the live waveform, move the coupler or cable from CH 3
to CH 4, so CH 1 and CH 4 are driven. Press the Vertical CH 4
button to activate the display. See Figure 2--14 on page 2--36.
H
To display reference waveforms, select Ref 3 from the Source
drop-down list box; then click the Ref 3 Display Off button to toggle
it to On and display the reference.
Hint: To control reference waveforms, use the Reference Waveform
Controls menu on the right side of the screen.
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H
H
Select Ref 2 from the Source drop-down list box; then click the
Display Off button to toggle it to On. You may notice their
overlapping waveform handle icons. See Figure 2--14 on page 2--36.
Click the Close button.
f. Measure the test signal:
H
Locate the time reference points for these waveforms by first
identifying the point where the rising edge of the left-most wave-
form crosses the center horizontal graticule line, then note the
corresponding time reference point for the right-most waveform. See
Figure 2--14.
H
H
Press CURSORS and select the V Bars Cursors Type; then click the
Close button.
Align one V bar cursor to the time reference point of the left-most
waveform edge and the other cursor to the time reference point of the
right-most waveform edge by rotating the multipurpose knobs (if
necessary, press the FINE buttons). See Figure 2--14.
H
Read the measurement results at the ∆: cursor readout on the screen.
Display the waveforms.
1
2
3
4
Locate the time reference
points for these waveforms.
Align each cursor to the time
reference points.
Read results.
Figure 2-14: Measurement of channel delay
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g. Check against limits: CHECK that the cursor readout is ≤100 ps.
h. Enter the time in the test record.
3. Disconnect the hookup: Disconnect the coupler or cables from the input
connectors of the channels.
Check Channel Isolation
(Crosstalk)
Equipment
required
One leveled sine-wave generator (Item 13)
One 50 Ω, precision coaxial cable (Item 4)
Prerequisites
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
Leveled
sine wave
generator
TDS5000B Series oscilloscope
Output
50 Ω precision coaxial cable
Figure 2-15: Initial test hookup
1. Install the test hookup and preset the instrument controls:
a. Hook up the test-signal source: Connect, through a 50 Ω precision
coaxial cable, the output of the generator to CH 1. See Figure 2--15.
b. Initialize the oscilloscope: Press the DEFAULT SETUP button.
c. Modify the initialized control settings:
H
Turn on all vertical channels (press the Vertical button of any off
channels: CH 1, CH 2, and, if equipped, CH 3, and CH 4).
H
From the toolbar, click the Vert button. Set the termination of each
channel to 50 Ω by selecting each channel tab and clicking its
Termination 50 Ω button.
H
H
H
Set the Vertical SCALE of CH 1, CH 2, CH 3, and CH 4 to 100 mV.
Set the Trigger SOURCE to CH 1.
Set the Horizontal SCALE to 20 ns (25 ns for TDS5054BE).
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H
H
From the toolbar, click the Horiz button. In the Horizontal menu,
open the Acquisition tab and set the instrument to E.T. mode.
Click the Close button.
2. Check channel isolation against limits:
a. Display the test signal: Set the generator frequency to 100 MHz and
adjust the output level for an 8-division display.
b. Check — Amplitude of each trace other than CH 1 is 0.08 division or
less (discount trace width). Enter the amplitude in the test record.
c. Move the signal to the CH 2 input connector, and then change the
Trigger SOURCE to CH 2.
d. Check — Amplitude of each trace other than CH 2 is 0.08 division or
less (discount trace width). Enter the amplitude in the test record.
e. Move the signal to the CH 3 input connector, and then change the
Trigger SOURCE to CH 3 (TDS5034B, TDS5054B, TDS5054BE, or
TDS5104B). If you are checking a TDS5032B or TDS5052B, proceed to
step i below.
f. Check — Amplitude of each trace other than CH 3 is 0.08 division or
less (discount trace width). Enter the amplitude in the test record.
g. Move the signal to the CH 4 input connector, and then change the
Trigger SOURCE to CH 4. (TDS5034B, TDS5054B, TDS5054BE, or
TDS5104B)
h. Check — Amplitude of each trace other than CH 4 is 0.08 division or
less (discount trace width). Enter the amplitude in the test record.
i. Move the signal to the CH 1 input connector, and then change the
Trigger SOURCE to CH 1.
j. Set the generator output frequency to 350 MHz for the TDS5032B and
TDS5034B, 500 MHz for the for the TDS5052B, TDS5054B, and
TDS5054BE, or 1 GHz for the TDS5104B. Adjust the generator output
level for an 8-division display.
k. Check — Amplitude of each trace other than CH 1 is 0.16 division or
less (discount trace width). Enter the amplitude in the test record.
l. Move the signal to the CH 2 input connector, and then change the
Trigger SOURCE to CH 2.
m. Check — Amplitude of each trace other than CH 2 is 0.16 division or
less (discount trace width). Enter the amplitude in the test record.
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n. Move the signal to the CH 3 input connector, and then change the
Trigger SOURCE to CH 3 (TDS5034B, TDS5054B, TDS5034BE, or
TDS5104B).
o. Check — Amplitude of each trace other than CH 3 is 0.16 division or
less (discount trace width). Enter the amplitude in the test record.
p. Move the signal to the CH 4 input connector, and then change the
Trigger SOURCE to CH 4 (TDS5034B, TDS5054B, TDS5054BE, or
TDS5104B).
q. Check — Amplitude of each trace other than CH 4 is 0.16 division or
less (discount trace width). Enter the amplitude in the test record.
3. Disconnect the hookup: Disconnect the cable from the generator output at
the input connector of the channel.
Time Base System Checks
The following procedures verify those characteristics that relate to the time base
system and are listed as checked under Warranted Characteristics in the
Specifications section.
Check Long-Term Sample
Rate and Delay Time
Accuracy
Equipment
required
One time-mark generator (Item 12), or
Sine wave generator (Item 13)
One 50 Ω, precision coaxial cable (Item 4)
Prerequisites
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
Time Mark or
Sine Wave
Generator
TDS5000B Series oscilloscope
Output
50 Ω coaxial cable
Figure 2-16: Initial test hookup
1. Install the test hookup and preset the instrument controls:
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a. Hook up the test-signal source: Connect, through a 50 Ω precision
coaxial cable, the output of the generator to CH 1. See Figure 2--16.
H
H
If using a time-mark generator, set the output for 10 ms markers.
If using a sine wave generator, set the output for 1.2 V and 500 kHz.
b. Initialize the oscilloscope: Press the DEFAULT SETUP button.
c. Modify the initialized front-panel control settings:
H
Set the Vertical SCALE to 200 mV (or 500 mV with the optional
Tektronix TG501A Time Mark Generator).
H
H
Set the Horizontal SCALE to 80 ns (100 ns for TDS5054BE).
From the toolbar, click the Vert button; then click the Termination
50 Ω button.
H
H
H
Press PUSH TO SET 50%.
Click the Close button.
Use the Vertical POSITION knob to center the test signal on the
screen.
H
Press the Trigger MODE button to toggle it to NORMAL.
2. Confirm that the time base is within limits for accuracies:
a. Measure the test signal:
H
H
If using a time-mark generator, align the trigger T to the center
vertical graticule line by adjusting the Horizontal POSITION. See
Figure 2--17 on page 2--41.
If using a sine wave generator, align the rising edge of the sine wave
on the center graticule crosshairs by adjusting the Horizontal
POSITION.
H
H
H
From the toolbar, click the Horiz button, and select the HORIZON-
TAL tab.
Press the Horizontal DELAY Mode button to toggle it on. See
Figure 2--17 on page 2--41.
Set the delay time to 10 ms. (Do this by clicking Horiz Delay and
on the keypad press 10, then m followed by ENTER.)
b. Check long-term sample rate and delay time accuracies against limits:
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H
H
CHECK that the rising edge of the marker (or sine wave) crosses
the center horizontal graticule line at a point within 1.5 divisions of
the center graticule. See Figure 2--17 on page 2--41.
Enter the number of divisions in the test record.
Align the trigger T
to the center
1
graticule line.
Check long-term
sample rates and
delay time accuracies
against limits.
4
Set horizontal mode.
2
3
Set horizontal scale
and delayed time.
Figure 2-17: Measurement of accuracy - long-term and delay time
3. Disconnect the hookup: Disconnect the cable from the generator output at
the input connector of CH 1.
Check Delta Time
Measurement Accuracy
Equipment
required
One 50 Ω, precision coaxial cable (Item 4)
One Connector, BNC “T”, male BNC-to-dual female BNC (Item 6)
One Pulse Generator, Wavetek 9500 or equivalent (Item 18)
Two 50 Ω, coaxial cable, male-to-male SMA connectors (Item 19)
One SMA female to BNC male connector (Item 23)
One BNC elbow connector (Item 24)
One SMA “T”, male to two SMA female connectors (Item 22)
Two SMA termination connectors, short circuit (Item 26)
One 2X attenuator, 50 Ω, female BNC-to- male BNC (Item 28)
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
Prerequisites
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This procedure checks the sample rate portion of the Delta Time Measurement
Accuracy as listed in the Specifications section. The previous procedure, Check
Long-Term Sample Rate and Delay Time Accuracy, on page 2--39, verified the
“PPM” portion of the delta time specification.
1. Install the test hookup and preset the instrument controls:
a. Initialize the oscilloscope: Press the DEFAULT SETUP button.
b. Hook up the pulse generator as shown in Figure 2--18.
TDS5000B Series oscilloscope
Pulse
generator
SMA male
to male
Output
SMA
short
20I 50 Ω cable
SMA male
to male
BNC 90° female
to male adapter
SMA T
connector
SMA
short
BNC T
connector
20I 50 Ω cable
50 Ω cable
2X attenuator
BNC to SMA
adapter
Figure 2-18: Delta time accuracy test hookup
H
H
Set the pulse generator output for a positive-going pulse with a
280 ps - 800 ps rise-time, as shown in Table 2--4 on page 2--44, and
for the fastest possible rep rate (at least 1 kHz).
Set the pulse generator output for about 500 mV. (This amplitude
can be adjusted later to get a 5-division pulse on the screen.)
c. Modify the initialized front-panel control settings:
H
From the toolbar, click the Vert button. Set the termination of the
channel to 50 Ω by selecting the channel tab and clicking the
Termination 50 Ω button.
H
Press AUTOSET. You may see both positive and negative pulses.
Adjust the Trigger LEVEL knob so that the trigger level is about
50% of the rising edge of the positive pulse.
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H
If you are testing a TDS5054BE instrument, set the Bandwidth to
150 MHz on all channels. (All other models are tested at full
bandwidth.)
H
H
From the toolbar, click the Horiz button, and select the Acquisition
tab. Under Sampling Mode, press the RT (Real Time Only) button.
Set the horizontal SCALE to 10 ns/division. The pulse width should
be approximately 6 ns. For the TDS5054BE, set the horizontal scale
to 50 ns/division, and press the ZOOM button.
H
Adjust the pulse amplitude and the vertical scale and position of the
instrument as necessary to obtain about 5 divisions of positive pulse
amplitude. Ensure that the positive pulse amplitude is greater than
200 mV.
d. Set up for statistics measurements:
H
Readjust the Trigger LEVEL knob so that the trigger level is about
50% of the rising edge of the positive pulse. Note the voltage of the
trigger level—this voltage will be used in the following steps.
H
H
Press RUN/STOP button to freeze the display.
Click MEAS, and then select the Time tab to bring up the Time
Measurements menu.
H
H
Click the Positive Width button.
Click Setup Statistics. Click the Measurement Statistics All button,
and then click Reset to reset the statistics.
H
Click Weight n=. On the keypad press 1000 and ENTER; then click
Setup.
H
H
H
Click Setup Ref Levs.
Click Units Absolute.
Set Mid Ref to the voltage of the trigger level noted previously in
this step. (This level is about 50% of the rising edge of the positive
pulse.)
H
H
H
H
H
Click Setup, and then click Close.
Press the RUN/STOP button to start the acquisitions.
Wait approximately 30 seconds.
Press the RUN/STOP button to freeze the display.
Record all statistics values.
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H
H
H
Calculate the difference of the Maximum (M) minus the mean (ꢀ).
Calculate the difference of the mean (ꢀ) minus the Minimum (m).
Both differences must be less than or equal to the Delta-time
accuracy limit shown in Table 2--4 for your oscilloscope.
H
Enter the pass/fail result for delta time in the test record.
Table 2-4: Delta time measurement
Delta time accuracy
limit
Instrument Model
Pulse rise time range
280 ps - 800 ps
TDS5104B, TDS5054B,
TDS5034B, TDS5052B,
TDS5032B
≤0.060 ns
TDS5054BE
1.4 ns - 4 ns (The internal ≤0.300 ns
150 MHz bandwidth filter
will slow pulse rising edges
to this range.)
e. Repeat for all other channels:
H
H
Note the vertical scale setting of the channel just confirmed.
Press the Vertical channel button for the channel just confirmed to
remove the channel from display.
H
H
Click MEAS, and then Clear to remove the measurement.
Press the front-panel button that corresponds to the channel that you
are to confirm.
H
H
Set vertical SCALE to the setting noted in step e, first bullet.
Press the Trigger Source button to toggle the source to the channel
selected.
H
H
Move the test hookup to the channel that you selected.
From the toolbar, click the Vert button. Set the termination of the
channel to 50 Ω by selecting the channel tab and clicking the
Termination 50 Ω button. (If you are testing a TDS5054BE model,
make sure the 150 MHz bandwidth limit has been turned on. All
other models are tested at full bandwidth.)
H
H
Press the RUN/STOP button to start the display.
Repeat step d.
2. Disconnect all test equipment from the oscilloscope.
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Trigger System Checks
The following procedures check those characteristics that relate to the trigger
system and are listed as checked in the Specifications section.
Check Time Accuracy for
Pulse, Glitch, Timeout,
and Width Triggering
Equipment
required
One sine wave generator (Item 13)
One 10X attenuator (Item 1)
One 50 Ω, precision coaxial cable (Item 4)
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
Prerequisites
1. Install the test hookup and preset the instrument controls:
a. Initialize the instrument: Press the DEFAULT SETUP button.
b. Modify the default setup:
H
H
Set the horizontal SCALE to 10 ns.
From the toolbar, click the Vert button; then click the Termination
50 Ω button.
c. Hook up the test-signal source: Connect the output of the sine wave
generator (Item 13) to CH 1 as shown in Figure 2--18.
Use a 50 Ω precision coaxial cable, followed by a 10X attenuator. The
10X attenuator is optional if the SG503 is used.
TDS5000B Series oscilloscope
Sine wave generator
Output
10X Attenuator
50 Ω coaxial cable
Figure 2-18: Initial test hookup
2. Confirm that the trigger system is within the time-accuracy limits for
pulse-glitch or pulse-width triggering (time range ≤500 ns):
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a. Display the test signal: Set the output of the sine wave generator for a
100 MHz, five-division sine wave on the screen; then press PUSH TO
SET 50%.
b. Set the trigger mode: Press the Trigger MODE button to toggle it to
NORMAL.
c. Set upper and lower limits that ensure triggering: See Figure 2--19 on
page 2--47.
H
Press the front-panel ADVANCED button, and select the A Event
tab; then select width triggering by clicking the Width button.
H
H
Click the Trig When button, and select Inside limits.
Click Upper Limit, and use the keyboard to set the upper limit to
10 ns: press 10, then n, and ENTER.
H
Click Lower Limit, and use the keypad to set the lower limit to
2 ns.
d. Change limits until triggering stops:
H
H
Press PUSH TO SET 50%.
While implementing the following substeps, monitor the display (it
will stop acquiring) and the front-panel light TRIG’D (it will
extinguish) to determine when triggering is lost. Click Close.
H
H
Click Lower Limit.
Use the multipurpose knob to increase the Lower Limit readout until
triggering is lost.
H
CHECK that the Lower Limit readout, after the oscilloscope loses
triggering, is within 3.5 ns to 6.5 ns, inclusive.
H
H
Enter the time in the test record.
Use the keypad to return the Lower Limit to 2 ns and reestablish
triggering.
H
H
H
Click Upper Limit; then use the multipurpose knob to slowly
decrease the Upper Limit readout until triggering is lost.
CHECK that the Upper Limit readout, after the oscilloscope loses
triggering, is within 3.5 ns to 6.5 ns, inclusive.
Enter the time in the test record.
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Set upper
and lower
limits that
ensure
triggering.
Then change
limits until
triggering
stops.
Figure 2-19: Measurement of time accuracy for pulse and glitch triggering
3. Confirm that the trigger system is within the time-accuracy limits for
pulse-glitch or pulse-width triggering (time range >520 ns):
a. Set the upper and lower limits that ensure triggering at 250 kHz:
H
H
Click Upper Limit. Use the keyboard to set the upper limit to 4 ꢀs.
Click Lower Limit. Use the keypad to set the lower limit to 500 ns.
b. Display the test signal:
H
H
Set the Horizontal SCALE to 4 ꢀs (5 ꢀs for TDS5054BE).
Set the output of the sine wave generator for a 250 kHz,
five-division sine wave on the screen. Set the Vertical SCALE to
20 mV (the waveform will overdrive the display).
H
Press PUSH TO SET LEVEL 50%.
c. Check against limits: Do the following subparts in the order listed.
H
Use the multipurpose knob to increase the Lower Limit readout until
triggering is lost.
H
CHECK that the Lower Limit readout, after the oscilloscope stops
triggering, is within 1.9 ꢀs to 2.1 ꢀs, inclusive.
H
H
Enter the time in the test record.
Use the keypad to return the Lower Limit to 500 ns and re-establish
triggering.
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H
H
H
Click Upper Limit; then use the multipurpose knob to slowly
decrease the Upper Limit readout until triggering stops.
CHECK that the Upper Limit readout, after the oscilloscope loses
triggering, is within 1.9 ꢀs to 2.1 ꢀs, inclusive.
Enter the time in the test record.
4. Disconnect the hookup: Disconnect the cable from the generator output at
the input connector of CH 1.
Check Sensitivity, Edge
Trigger, DC Coupled
Equipment
required
One sine wave generator (Item 13)
One precision 50 Ω coaxial cable (Item 4)
One 50 Ω termination (Item 4)
One 10X attenuator (Item 1)
One 5X attenuator (Item 2)
Prerequisites
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
1. Install the test hookup and preset the instrument controls:
a. Initialize the oscilloscope: Press the DEFAULT SETUP button.
b. Modify the initialized front-panel control settings:
H
H
H
H
Set the Horizontal SCALE to 20 ns (25 ns for TDS5054BE).
Press the Trigger MODE button to toggle it to Normal.
From the toolbar, click Horiz, and select the Acquisition tab.
Click Average, and set the number of averages to 16.
c. Hook up the test-signal source:
H
Connect one end of a precision 50 Ω coaxial cable to the signal
output of the generator. Connect the other end of the coaxial cable to
CH 1 through a 50 Ω termination. See Figure 2--20.
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TDS5000B Series oscilloscope
Sine wave
generator
50 Ω Termination
Precision 50 Ω coaxial cable
Figure 2-20: Initial test hookup
2. Confirm the trigger system is within sensitivity limits (50 MHz):
a. Display the test signal:
H
H
H
H
Set the generator frequency to 50 MHz.
From the toolbar, click MEAS.
Click Setup Ref Levs; then click the Min-Max button.
Click the Setup button and select the Ampl tab; then click the
Amplitude button.
H
H
H
Click Close.
Press PUSH TO SET 50%.
Set the test signal amplitude for about three and a half divisions on
the screen. Fine-adjust the generator output until the CH 1 Ampli-
tude readout indicates that the amplitude is 350 mV. The readout
may fluctuate around 350 mV.
H
Disconnect the 50 Ω termination (with the 50 Ω precision coaxial
cable attached) from CH 1, and reconnect it to CH 1 through a 10X
attenuator.
b. Check the Main trigger system for stable triggering at limits:
H
Read the following definition: A stable trigger is one that is
consistent, that is, one that results in a uniform, regular display
triggered on the selected slope (positive or negative). This display
should not have its trigger point alternating between opposite slopes,
nor should it roll across the screen. At horizontal scale settings of
2 ms/division and faster, TRIG’D will remain constantly lit. It will
flash for slower settings.
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H
H
Press the Trigger Slope button to select the positive slope.
Adjust the Trigger LEVEL knob to produce a stable trigger. CHECK
that the trigger is stable for the test waveform on the positive slope.
H
Press the Trigger Slope button to select the negative slope. Adjust
the Trigger LEVEL knob so that there is a stable trigger. CHECK
that the trigger is stable for the test waveform on the negative slope.
H
H
Enter the pass/fail result for trigger in the test record.
Leave the trigger system triggered on the positive slope of the
waveform before continuing to the next step.
Check if stable trigger.
Figure 2-21: Measurement of trigger sensitivity showing 50 MHz results
c. Check Delayed trigger system for stable triggering at limits: Do the
following subparts in the order listed.
H
H
H
From the toolbar click Trig, select the A Event tab, and set the
Source to Line.
Select the A-->B Seq tab, and then click the A then B Trig After
Time button.
Select the B Event tab, and then click the Set 50% button.
CHECK that a stable trigger is obtained for the test waveform for
both the positive and negative slopes of the waveform. Use the
TRIGGER LEVEL knob to stabilize the Main trigger. Click B Trig
Level, and use the keypad or the multipurpose knob/FINE button to
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stabilize the Delayed trigger. Click one of the Slope buttons to
switch between trigger slopes. See Figure 2--21 on page 2--50.
H
H
Enter the pass/fail result for delayed trigger in the test record.
Leave the Delayed trigger system triggered on the positive slope of
the waveform before continuing to the next step. Also, return to the
main trigger: select the A-->B Seq tab and click the A-->B Sequence
A Only button.
H
Select the A Event tab; then press Close.
3. Confirm the AUX Trigger input:
a. Display the test signal:
H
Remove the 10X attenuator; then reconnect the 50 Ω termination
and precision 50 Ω cable to CH 1.
H
H
Press the Trigger SOURCE button to select CH 1.
Set the test signal amplitude for approximately 4 divisions on the
screen.
H
Fine-adjust the generator output until the CH 1 Amplitude readout
indicates that the amplitude is 400 mV.
b. Check the AUX trigger source for stable triggering at 50 MHz: Do the
following in the order listed.
H
Move the 50 Ω termination and precision 50 Ω cable from CH 1 to
AUX IN.
H
H
H
Press the Trigger SOURCE button to set the source to EXT.
Adjust the Trigger LEVEL knob in the positive direction.
CHECK for a stable trigger. When a stable trigger is obtained, the
TRIG’D indicator is lighted.
NOTE. You will not see the signal on the display.
H
H
H
Press the Trigger SLOPE button to toggle it to NEG.
Adjust the Trigger LEVEL knob in the negative direction.
CHECK for a stable trigger. When a stable trigger is obtained, the
TRIG’D indicator is lighted.
H
Enter the pass/fail results in the test record.
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H
Set the trigger system to trigger on the positive slope of the
waveform before proceeding to the next check.
H
H
H
Press the Trigger SOURCE button to set the trigger source to CH 1.
Click Vert in the toolbar. Click Termination 50 Ω. Click Close.
Disconnect the hookup installed in step 1.
4. Confirm that the trigger system is within sensitivity limits (full bandwidth):
a. Hook up the test-signal source: Connect the signal output of a high-fre-
quency sine wave generator to CH 1 through a precision 50 Ω coaxial
cable. To test some TDS models, a high frequency (>1 GHz) generator is
required; see footnote 1 in Table 2--1 on page 2--19.
b. Set the Horizontal Scale: Set the Horizontal SCALE to 400 ps (500 ps
for TDS5054BE).
c. Display the test signal:
H
Set the generator frequency to full bandwidth as follows:
TDS5032B, TDS5034B
TDS5052B, TDS5054B, TDS5054BE
TDS5104B
350 MHz
500 MHz
1 GHz
Note: For the TDS5054BE, set the instrument to E.T. mode.
Set the test signal amplitude for approximately five divisions
on-screen; then fine-adjust the generator output until the CH 1
Amplitude readout indicates the amplitude is 500 mV. The readout
may fluctuate around 500 mV.
H
H
Disconnect the leveling head at CH 1 and reconnect it to CH 1
through a 5X attenuator. Check that a stable trigger is obtained.
d. Repeat step 2, substeps b and c only, for the full bandwidth selected.
Press the Trigger SOURCE button to toggle it to CH 1.
e. Display the test signal:
H
H
H
H
H
H
Set the generator frequency to 100 MHz.
Set the Horizontal SCALE to 10 ns.
Remove the 5X attenuator and reconnect the cable to CH 1.
Set the generator amplitude on the screen for 7.5 divisions.
Fine-adjust the generator output until the CH 1 Amplitude readout
indicates the amplitude is 750 mV.
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f. Repeat step 1, substep c and step 3, substep b only, to check the full
bandwidth of the Aux Trigger source. Set the frequency to 100 MHz.
NOTE. You just checked the trigger sensitivity. If desired, you can repeat steps 1
through 4d for the other channels (CH 2, and, if equipped, CH 3 and CH 4).
5. Disconnect the hookup: Disconnect the cables from AUX IN and from the
channel last tested.
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Performance Tests
Output Signal Checks
The following procedures verify characteristics of the output signals that are
listed as checked under Warranted Characteristics in the Specifications section.
The oscilloscope outputs these signals at its front and rear panels.
Check Outputs:
CH 3 Signal Out
Equipment
required
Two precision 50 Ω coaxial cables (Item 4)
One calibration generator (Item 11)
(TDS5034B, TDS5054B,
TDS5054BE TDS5104B)
and Aux Trigger Out
Prerequisites
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
Also, the oscilloscope must have passed Check DC Voltage
Measurement Accuracy on page 2-24.
1. Install the test hookup and preset the instrument controls:
TDS5000B Series oscilloscope
Calibration
generator
To AUX OUT
(located on the back
of the instrument)
50 Ω coaxial cables
Figure 2-22: Initial test hookup
a. Hook up test-signal source 1:
H
Connect the standard amplitude output of a calibration generator
through a 50 Ω precision coaxial cable to CH 3. See Figure 2--22.
H
Set the calibration generator to output a 0.500 V square wave.
b. Hook up test-signal source 2: Connect the Aux Out at the rear panel to
CH 2 through a 50 Ω precision cable.
c. Initialize the oscilloscope: Press the DEFAULT SETUP button.
d. Modify the initialized front-panel control settings:
H
H
Press the Vertical CH 1 button to toggle it off.
Press the Vertical CH 3 button to display that channel.
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H
H
H
Push Trigger Source to toggle the source to CH 3.
Set the Horizontal SCALE to 200 ꢀs.
If necessary, adjust the calibration generator output for an amplitude
of 5 divisions. For oscilloscopes with 50 Ω inputs, you may need to
double the output of the generator.
H
H
H
From the toolbar bar, click Horiz, and select the Acquisition tab.
Click Average, and set the number of averages to 64.
Click the Close button.
2. Confirm AUX OUT is within limits for logic levels:
a. Display the test signal:
H
H
H
H
Press the Vertical CH 3 button to turn off CH 3.
Press the Vertical CH 2 button to display that channel.
Set the CH 2 Vertical SCALE to 1 V.
Use the Vertical POSITION knob to center the display on-screen.
b. Measure logic levels:
H
H
H
From the toolbar, click MEAS, and select the Ampl tab.
Click the High and Low buttons.
Click the Close button.
c. Check AUX OUT output against limits:
H
CHECK that the CH 2 High readout is ≥2.5 volts and that the CH 2
Low readout is ≤0.7 volts. See Figure 2--23.
H
H
Enter the high and low voltages in the test record.
From the toolbar, click the Vert button. Click the Termination 50 Ω
button.
H
H
Click the Close button.
CHECK that the CH 2 High readout is ≥1.0 volt and that the CH 2
Low readout ≤0.25 volts.
H
Enter the high and low voltages in the test record.
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Check output
Figure 2-23: Measurement of main trigger out limits
3. Confirm SIGNAL OUT is within limits for gain:
a. Measure gain:
H
Move the precision 50 Ω cable from the AUX OUT BNC to the
SIGNAL OUT BNC.
H
H
H
H
H
Set CH 2 Vertical SCALE to 100 mV.
Press PUSH TO SET 50%.
From the toolbar, click MEAS, and select the Ampl tab.
Click the Pk-Pk button.
Click Close.
b. Check against limits:
H
From the toolbar, click the Vert button, then click the Termination
1 MΩ button.
H
H
Click Close.
CHECK that the readout CH2 Pk-Pk is between 200 mV and
300 mV, inclusive.
H
H
Enter the voltage in the test record.
From the toolbar, click the Vert button; then click the Termination
50 Ω button.
H
Click Close.
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H
H
CHECK that the readout CH 2 Pk-Pk is between 100 mV and
150 mV, inclusive.
Enter the voltage in the test record.
4. Disconnect the hookup: Disconnect the cables from the channel inputs and
the rear panel outputs.
Check Probe
Compensation Output
Equipment
required
One 10X oscilloscope probe, such as Tektronix P5050
Prerequisites
See page 2-17. Also, the oscilloscope must have passed Check
Long-Term Sample Rate and Delay Time Accuracy on page 2-39.
1. Install the test hookup and preset the instrument controls:
a. Hook up test-signal: See Figure 2--24.
H
H
Connect the probe to CH 1.
Connect the probe leads to the PROBE COMP output.
TDS5000B Series oscilloscope
Passive probe from PROBE COMP output
to CH 1 input
Figure 2-24: Initial test hookup
b. Initialize the oscilloscope: Press the DEFAULT SETUP button.
c. Modify the initialized front-panel control settings:
H
H
H
H
Set the Vertical SCALE to 200 mV.
Set the Horizontal SCALE to 200 ꢀs.
Press PUSH TO SET 50%.
Use the Vertical POSITION knob to center the display on the
screen.
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H
H
From the toolbar bar, click Horiz and select the Acquisition tab.
Click Average and set the number of averages to 128.
2. Confirm that the Probe Compensator signal is within limits for frequency:
a. Measure the frequency of the probe compensation signal:
H
H
From the toolbar, click MEAS and select the Time tab.
Click the Freq button.
b. Check against limits:
H
CHECK that the CH 1 Freq readout is within 950 Hz to 1.050 kHz,
inclusive. See Figure 2--25.
H
H
Enter the frequency in the test record.
Click Clear to remove the measurement.
Figure 2-25: Measurement of probe compensator frequency
c. Save the probe compensation signal in reference memory:
H
H
H
H
From the toolbar, click Save.
In the Save What field, click Waveform.
In the Source drop-down list box, select CH 1.
In the Save in: Oscilloscope Memory field, select Ref 1.
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H
H
Click the Save button.
Disconnect the adapter from CH 1 and the probe compensation
connector.
H
To view the stored waveform on screen, verify that the display On
button (in the control window) is toggled to On.
d. Hook up the DC standard source:
H
H
Set the output of a DC calibration generator to off or 0 volts.
Connect the output of the DC calibration generator, through a
dual-banana connector, followed by a 50 Ω precision coaxial cable,
to one side of a BNC T connector. See Figure 2--26.
H
Connect the Sense output of the generator, through a second
dual-banana connector, followed by a 50 Ω precision coaxial cable,
to the other side of the BNC T connector. Connect the BNC T
connector to CH 1. See Figure 2--26.
TDS5000B Series oscilloscope
DC calibrator
Dual banana to
BNC adapters
BNC T
connector
50 Ω coaxial cables
Figure 2-26: Subsequent test hookup
e. Measure amplitude of the probe compensation signal:
H
H
From the toolbar bar, click Horiz, and select the Acquisition tab.
Click Average and set the number of averages to 16 using the
keypad or the multipurpose knob.
H
H
Adjust the output of the DC calibration generator until it precisely
overlaps the top (upper) level of the stored probe compensation
signal. (This value will be near 1000 mV.)
Record the setting of the DC generator.
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H
H
Adjust the output of the DC calibration generator until it precisely
overlaps the base (lower) level of the stored probe compensation
signal. (This value will be near zero volts.)
Record the setting of the DC generator.
f. Press Close to remove the menus from the display. See Figure 2--27.
Figure 2-27: Measurement of probe compensator amplitude
g. Check against limits:
H
H
H
Subtract the value just obtained (base level) from that obtained
previously (top level).
CHECK that the difference obtained is within 990 mV to 1010 mV,
inclusive.
Enter the voltage difference in test record.
3. Disconnect the hookup: Disconnect the cable from CH 1.
This completes the performance verification of the oscilloscope.
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Performance Tests
Sine Wave Generator Leveling Procedure
Some procedures in this manual require a leveled sine wave generator to produce
the necessary test signals. If you do not have a leveled sine wave generator, use
one of the following procedures to level the output amplitude of your sine wave
generator.
Method A
If you have a power divider, use this setup to monitor the generator output
simultaneously with the level meter and the oscilloscope.
Equipment
required
Sine wave generator (Item 13)
Level meter and power sensor (Item 14)
Power divider (Item 15)
Two male N to female BNC adapters (Item 20)
One precision coaxial cable (Item 4)
Prerequisites
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
1. Install the test hookup: Connect the equipment as shown in Figure 2--28.
TDS5000B Series oscilloscope
Sine wave
generator
Level meter
Input
Power divider
Output
Attenuators
(if necessary)
Power sensor
Figure 2-28: Sine wave generator leveling equipment setup (Method A)
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2. Set the Generator:
H
H
Set the sine wave generator to a reference frequency of 10 MHz.
Adjust the sine wave generator amplitude to the required number of
divisions as measured by the oscilloscope.
3. Record the reference level: Note the reading on the level meter.
4. Set the generator to the new frequency and reference level:
H
H
H
Change the sine wave generator to the desired new frequency.
Input the correction factor and/or the new frequency into the level meter.
Adjust the sine wave generator amplitude until the level meter again
reads the value noted in step 3. The signal amplitude is now correctly set
for the new frequency for your specific test procedure.
Proceed with the test instructions that require a leveled sine wave generator at
the frequency you set in step 4.
Method B
Use this setup if you do not have a power divider.
Equipment
required
Sine wave generator (Item 13)
Level meter and power sensor (Item 14)
Two male N to female BNC adapters (Item 20)
Two precision coaxial cables (Item 4)
Prerequisites
Read Prerequisites on page 2-17 and footnote warnings on page 2-19.
1. Install the test hookup: Connect the equipment as shown in Figure 2--29
(start with the sine wave generator connected to the oscilloscope).
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TDS5000B Series oscilloscope
Sine wave
generator
Output
Level meter
Connect the sine wave
Power sensor
generator to the
oscilloscope and the
power sensor as
directed in the text.
Input
Figure 2-29: Sine wave generator leveling equipment setup (Method B)
2. Set the Generator:
H
H
Set the sine wave generator to a reference frequency of 10 MHz.
Adjust the sine wave generator amplitude to the required number of
divisions as measured by the oscilloscope.
3. Record the reference level:
H
H
H
Disconnect the sine wave generator from the oscilloscope.
Connect the sine wave generator to the power sensor.
Note the level meter reading.
4. Set the generator to the new frequency and reference level:
H
H
H
Change the sine wave generator to the desired new frequency.
Input the correction factor and/or the new frequency into the level meter.
Adjust the sine wave generator amplitude until the level meter again
reads the value noted in step 3. The signal amplitude is now correctly set
for the new frequency for your specific test procedure.
H
Disconnect the sine wave generator from the power sensor.
Connect the sine wave generator to the oscilloscope and proceed with the test
instructions that require a leveled sine wave generator at the frequency you set in
step 4.
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