This product complies with the RoHS Directive (EU 2002/95/EC).
Transistors
2SC4835G
Silicon NPN epitaxial planar type
For UHF band low-noise amplification
■ Features
■ Package
•
• Low noise figure NF
Code
• High forward transfer gain S21e2
• High transition frequency fT
SMini3-F2
Marking Symbol: 3M
Pin Name
1: Base
•
•
• S-Mini type package, allowing downsizing of the equipment
and automatic insertion through the tape packing and the maga-
zine packing
2: Emitter
3: Collector
■ Absolute Maximum Ratings Ta = 25°C
Parameter
Symbol
Rating
Unit
V
Collector-base voltage (Emitter open) VCBO
Collector-emitter voltage (Base open) VCEO
Emitter-base voltage (Collector open) VEBO
15
10
V
2
80
V
Collector current
IC
PC
Tj
mA
mW
°C
°C
Collector power dissipation
Junction temperature
Storage temperature
150
150
Tstg
−55 to +150
■ Electrical Characteristics Ta = 25°C 3°C
Parameter
Symbol
VCBO
VCEO
ICBO
IEBO
hFE
Conditions
Min
15
Typ
Max
Unit
V
Collector-base voltage (Emitter open)
Collector-emitter voltage (Base open)
Collector-base cutoff current (Emitter open)
Emitter-base cutoff current (Collector open)
IC = 10 µA, IE = 0
IC = 100 µA, IB = 0
VCB = 10 V, IE = 0
VEB = 2 V, IC = 0
10
V
1
1
µA
µA
1, 2
Forward current transfer ratio *
VCE = 8 V, IC = 20 mA
50
5
200
Transition frequency
fT
VCE = 8 V, IC = 15 mA, f = 800 MHz
6
GHz
pF
Collector output capacitance
Cob
VCB = 10 V, IE = 0, f = 1 MHz
0.7
1.2
(Common base, input open circuited)
Forward transfer gain
Maximum unilateral power gain
Noise figure
S21e2 VCE = 8 V, IC = 15 mA, f = 800 MHz
11
14
15
dB
dB
dB
GUM
NF
VCE = 8 V, IC = 15 mA, f = 800 MHz
VCE = 8 V, IC = 7 mA, f = 800 MHz
1.3
2.0
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. 1: Pulse measurement
*
2: Rank classification
*
Rank
Q
R
S
hFE
50 to 100
80 to 130
100 to 200
Publication date: May 2007
SJC00368AED
1
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This product complies with the RoHS Directive (EU 2002/95/EC).
SMini3-F2
Unit: mm
2.00 0.20
0.30 +−00..0025
3
1
2
0.13 +−00..0025
(0.65)
(0.65)
1.30 0.10
(5°)
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semiconductors described in this book
(1) If any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and
regulations of the exporting country, especially, those with regard to security export control, must be observed.
(2) The technical information described in this book is intended only to show the main characteristics and application circuit examples
of the products, and no license is granted under any intellectual property right or other right owned by our company or any other
company. Therefore, no responsibility is assumed by our company as to the infringement upon any such right owned by any other
company which may arise as a result of the use of technical information described in this book.
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equipment, communications equipment, measuring instruments and household appliances).
Consult our sales staff in advance for information on the following applications:
– Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment, combustion equipment, life support
systems and safety devices) in which exceptional quality and reliability are required, or if the failure or malfunction of the prod-
ucts may directly jeopardize life or harm the human body.
– Any applications other than the standard applications intended.
(4) The products and product specifications described in this book are subject to change without notice for modification and/or im-
provement. At the final stage of your design, purchasing, or use of the products, therefore, ask for the most up-to-date Product
Standards in advance to make sure that the latest specifications satisfy your requirements.
(5) When designing your equipment, comply with the range of absolute maximum rating and the guaranteed operating conditions
(operating power supply voltage and operating environment etc.). Especially, please be careful not to exceed the range of absolute
maximum rating on the transient state, such as power-on, power-off and mode-switching. Otherwise, we will not be liable for any
defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure
mode, possible to occur to semiconductor products. Measures on the systems such as redundant design, arresting the spread of fire
or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products.
(6) Comply with the instructions for use in order to prevent breakdown and characteristics change due to external factors (ESD, EOS,
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